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JPS54143668A - Continuous environment testing apparatus - Google Patents

Continuous environment testing apparatus

Info

Publication number
JPS54143668A
JPS54143668A JP5200978A JP5200978A JPS54143668A JP S54143668 A JPS54143668 A JP S54143668A JP 5200978 A JP5200978 A JP 5200978A JP 5200978 A JP5200978 A JP 5200978A JP S54143668 A JPS54143668 A JP S54143668A
Authority
JP
Japan
Prior art keywords
curtains
conveyor
opened
whose
units
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5200978A
Other languages
Japanese (ja)
Inventor
Saburo Ogawara
Ikuo Nibari
Takeshi Yoneyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP5200978A priority Critical patent/JPS54143668A/en
Publication of JPS54143668A publication Critical patent/JPS54143668A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE: To make possible continuous processing by using the test units whose both ends are opened and are closed by curtains and a conveyor.
CONSTITUTION: A high temperature unit 11h whose both ends are opened and a low temperature unit 11l whose both ends are opened and are dispposed with the gate units 11l', 11l" disposed with curtains 110 such as Teflon or the like and nozzles 111 blowing out dry air or dry nitrogen are connected, to which a conveyor 12, test handling part 13 and classifying part 14 are assembled. As a result, the printed substrates 1 which are placed at one end of the conveyor 12 subsequently pass the low temperature units 11l and high temperature unit 11h having been maintained of the inside atmosphere by the curtains 110 and air curtain and subsequently undergo the specified tests by the operations of the test handling part 13 and classifying part 14, after which they are subjected to specified classification, thus the measurement and inspection are automatically accomplished in the continuous atmosphere as compared to hermetically closed ovens.
COPYRIGHT: (C)1979,JPO&Japio
JP5200978A 1978-04-28 1978-04-28 Continuous environment testing apparatus Pending JPS54143668A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5200978A JPS54143668A (en) 1978-04-28 1978-04-28 Continuous environment testing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5200978A JPS54143668A (en) 1978-04-28 1978-04-28 Continuous environment testing apparatus

Publications (1)

Publication Number Publication Date
JPS54143668A true JPS54143668A (en) 1979-11-09

Family

ID=12902809

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5200978A Pending JPS54143668A (en) 1978-04-28 1978-04-28 Continuous environment testing apparatus

Country Status (1)

Country Link
JP (1) JPS54143668A (en)

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59176950U (en) * 1983-05-13 1984-11-27 オリオン機械株式会社 Automatic test piece transport device for environmental testing equipment
JPS59211845A (en) * 1983-05-16 1984-11-30 Hideyuki Honda Environment testing apparatus
JPS59183649U (en) * 1983-05-23 1984-12-06 オリオン機械株式会社 Test piece condensation prevention device for environmental testing equipment
US4491734A (en) * 1982-11-02 1985-01-01 Yokogawa Hokushin Electric Corporation X-ray detector and method of making same
JPS61133837A (en) * 1984-12-04 1986-06-21 Kusumoto Kasei Kk Continuous operation system for environment tester
JPS6222563U (en) * 1985-07-24 1987-02-10
JPS6254176A (en) * 1985-09-02 1987-03-09 Tabai Esupetsuku Kk Continuous automatic environmental test equipment
JPS6254144A (en) * 1985-09-02 1987-03-09 Tabai Esupetsuku Kk Environment testing method
JPS6276678U (en) * 1985-10-31 1987-05-16
JPS6276679U (en) * 1985-10-31 1987-05-16
JPS6316272A (en) * 1986-07-08 1988-01-23 Toyota Motor Corp Fitting jig for ic burn-in test work
JPS63142772U (en) * 1987-03-10 1988-09-20
JPS63142771U (en) * 1987-03-10 1988-09-20
JPS63145187U (en) * 1987-03-15 1988-09-26
JPS63193375U (en) * 1987-03-10 1988-12-13
JPH0320886A (en) * 1989-06-17 1991-01-29 Dainippon Printing Co Ltd Tester for ic card
WO1996026428A1 (en) * 1995-02-21 1996-08-29 Qualmark Corporation Apparatus for thermal and vibrational stress screening

Cited By (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4491734A (en) * 1982-11-02 1985-01-01 Yokogawa Hokushin Electric Corporation X-ray detector and method of making same
JPH032840Y2 (en) * 1983-05-13 1991-01-25
JPS59176950U (en) * 1983-05-13 1984-11-27 オリオン機械株式会社 Automatic test piece transport device for environmental testing equipment
JPS59211845A (en) * 1983-05-16 1984-11-30 Hideyuki Honda Environment testing apparatus
JPH0321061B2 (en) * 1983-05-16 1991-03-20 Hideyuki Honda
JPS59183649U (en) * 1983-05-23 1984-12-06 オリオン機械株式会社 Test piece condensation prevention device for environmental testing equipment
JPH0336915Y2 (en) * 1983-05-23 1991-08-05
JPS61133837A (en) * 1984-12-04 1986-06-21 Kusumoto Kasei Kk Continuous operation system for environment tester
JPH0453251B2 (en) * 1984-12-04 1992-08-26 Kusumoto Chemicals
JPS6222563U (en) * 1985-07-24 1987-02-10
JPH0478141B2 (en) * 1985-09-02 1992-12-10 Tabai Espec Corp
JPS6254144A (en) * 1985-09-02 1987-03-09 Tabai Esupetsuku Kk Environment testing method
JPS6254176A (en) * 1985-09-02 1987-03-09 Tabai Esupetsuku Kk Continuous automatic environmental test equipment
JPS6276679U (en) * 1985-10-31 1987-05-16
JPH0527014Y2 (en) * 1985-10-31 1993-07-08
JPS6276678U (en) * 1985-10-31 1987-05-16
JPS6316272A (en) * 1986-07-08 1988-01-23 Toyota Motor Corp Fitting jig for ic burn-in test work
JPS63142772U (en) * 1987-03-10 1988-09-20
JPS63142771U (en) * 1987-03-10 1988-09-20
JPS63193375U (en) * 1987-03-10 1988-12-13
JPS63145187U (en) * 1987-03-15 1988-09-26
JPH0320886A (en) * 1989-06-17 1991-01-29 Dainippon Printing Co Ltd Tester for ic card
WO1996026428A1 (en) * 1995-02-21 1996-08-29 Qualmark Corporation Apparatus for thermal and vibrational stress screening

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