JPH10221370A - Contact probe and its manufacture, and probe apparatus having contact probe - Google Patents

Abstract

PROBLEM TO BE SOLVED: To improve contact accuracy by uniforming tips of contact pins in height without grinding and making the contact pins touch a pad at the same time. SOLUTION: Contact pins 3a are integrally molded with the use of a mask exposure technique in a state with tip parts (tungsten balls in this case) 3T projecting perpendicularly downward from main body parts 3K. Therefore, the tip parts 3T are highly accurate in size and uniform in height, eliminating conventional grinding. When a pad is formed of, e.g. soft gold, it is enough to set a contact probe in parallel to a pad face and carry out overdriving, whereby the tip parts 3T remove only an oxidization film on the pad face and surely touch an undercoat of the pad. Since tips of the pins are not required to be ground and the contact probe is not required to be inclined when arranged, parts, jigs, etc., for fitting the contact probe are simplified in structure as compared with the prior art.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of manufacturing a contact probe which is used as a probe pin, a socket pin, or the like, and performs an electrical test by contacting each terminal of a semiconductor IC chip or a liquid crystal device.

[0002]

2. Description of the Related Art In general, a contact pin is used to conduct an electrical test by contacting a semiconductor chip such as an IC chip or an LSI chip or each terminal of an LCD (liquid crystal display). In recent years, as the integration and miniaturization of IC chips and the like have increased, the pitch of contact pads, which are electrodes, has been reduced, and the pitch of contact pins has been required to be narrower. However, with a tungsten needle contact probe used as a contact pin, it has been difficult to cope with a multi-pin narrow pitch due to the limitation of the diameter of the tungsten needle.

On the other hand, as shown in FIG. 29, a plurality of pattern wirings 3 are formed on a resin film 2 and the tips of these pattern wirings 3 are arranged so as to protrude from the resin film 2 and contact pins are formed. The technology of the contact probe 1 referred to as 3a has been proposed (for example, Japanese Patent Publication No. 7-82027). In this technology example, the tip of the plurality of pattern wirings 3 is used as a contact pin 3a, thereby achieving a narrow pitch of the multi-pin.

Generally, each terminal (pad) of an IC chip or the like formed of an Al (aluminum) alloy or the like is oxidized in the air to be covered with a thin surface oxide film of aluminum. I have. Therefore, in order to conduct an electrical test on the pad, it is necessary to secure the conductivity by exfoliating the surface oxide film of the aluminum and exposing the aluminum inside. Therefore, in the contact probe 1, the contact pin 3a is brought into contact with the surface of the pad while the overdrive is applied to scrape off the surface oxide film of aluminum on the pad surface at the tip of the contact pin 3a, thereby removing the aluminum inside. Is exposed. This operation is called scrub.

The manufacture of the contact probe 1 is performed through the following steps. Copper plating is applied to the upper surface of the stainless steel plate. A resist mask (mask) is formed on the copper layer, and exposure and development are performed via a photomask. The pattern wiring 3 is formed by applying nickel plating to a portion where the resist mask is not provided. Of the pattern wirings 3, the contact pins 3a
The resin film 2 is adhered to the upper surface of the portion excluding the leading end. The portion composed of the resin film 2, the pattern wiring 3, and the copper layer is separated from the stainless steel plate. The copper layer is removed from a part of the resin film 2 and the pattern wiring 3 to manufacture the contact probe 1.

According to the above manufacturing method, the lower surface 3b of the contact pin 3a is formed flat. For this reason,
If the contact pins 3a are arranged so that their axes are parallel to the pad surface, even if overdriven, the pad surface and the flat lower surface 3b only abut in parallel, and aluminum The surface oxide film cannot be scraped off satisfactorily. For this reason, as shown in FIG. 30, the contact pins 3a are arranged so as to be inclined so as to have a constant contact angle θ with respect to the pad surface Pa.

In order to arrange the contact pins 3a while maintaining the contact angle θ, various parts 30, 50 for assembling the contact probe 1 at a predetermined angle θ.
And jigs are required. These various parts 30, 50
Since the contact probe and the jig are configured to be incorporated in a state where the contact probe 1 is inclined, for example, the structure is more complicated than that in which the contact probe 1 is simply placed horizontally. Further, the contact angle θ greatly affects the scrub distance (the length of shaving the film along the pad surface) and the depth during scrubbing, and depending on the contact angle θ, the tip of the contact pin 3a during scrubbing. The parts 30 and 50 are required to have sufficient precision to ensure the accuracy of the contact angle θ, and are difficult to process because the parts protrude from the pad P or damage the pad P itself.

[0008]

In performing scrubbing, it is necessary to prevent the contact pins from damaging not only the surface oxide film of aluminum on the pad surface but also the pad itself (underlying layer) thereunder. is there. In order to prevent the base of the pad from being damaged during scrubbing, it is necessary to ensure that the contact angle of the contact pin with the pad is sufficiently large. The reason is that when the contact angle is small, the amount of aluminum removed from the surface is significantly increased, which affects the pad base. Therefore, as shown in FIG. 31, a jig (not shown) is used to move the tip 3
Folding T so as to be substantially perpendicular to the contact surface P is being studied.

However, since the height and the interval of the bent tip portions of the contact pins are inevitably varied, that is, irregularities are generated at the lower ends of the pins, the terminals of a semiconductor chip such as a chip or an LSI chip or each terminal of a liquid crystal panel are not provided. At the time of contact, a non-conduction state occurs, resulting in poor contact accuracy. In addition, when the overdrive amount is increased, there is a problem that the pad base is damaged, particularly when the pad is formed of a material (eg, gold) that is softer than aluminum. In addition, although the tips of the contact pins can be made uniform by polishing, this requires time and a long time and lowers the inspection efficiency. Furthermore, although the contact pins are formed of the same material throughout, the contact pins are particularly apt to wear, especially when the amount of wear exceeds a specified amount, the entire contact probe must be replaced. In addition, the running cost increases.

The present invention has been made in view of the above circumstances, does not require polishing, and the height of the tip of each contact pin is made uniform so that each contact pin simultaneously contacts the pad during overdrive. And the contact accuracy is high
It is another object of the present invention to provide a contact probe in which the running cost is reduced by reducing the wear of the tip of the contact pin, a method of manufacturing the same, and a probe device.

[0011]

In order to achieve the above object, a contact probe according to the present invention comprises a plurality of pattern wirings formed on a film, and the tips of these pattern wirings are arranged so as to protrude from the film. A contact probe serving as a contact pin, wherein the contact pin is integrally formed with a tip portion of the contact pin protruding vertically downward with respect to a main body portion thereof, and the tip end portion is larger than the main body portion. It is characterized by being formed of a hard and conductive material. The tip has a shape whose cross-sectional area gradually decreases toward its lower end. Further, the tip is a tungsten ball or needle. The film may be provided with a metal film directly attached thereto, or the metal film may be provided with a second film directly attached thereon.

The method for manufacturing a contact probe according to the present invention includes a metal layer forming step of forming a first metal layer made of a material to be attached to or bonded to a tip of a contact pin on a substrate layer; Applying a first mask on the metal layer,
A first pattern forming step of forming an opening for inserting the tip of the contact pin into the first mask; and a tip made of a conductive material harder than the main body of the contact pin. Inserting a tip into the opening and pressing against the first metal layer; applying a second mask on the first metal layer;
A second pattern forming step of forming an opening for forming a main body of the contact pin so that one end thereof overlaps the opening of the first mask;
In each opening of the mask and each opening of the second mask,
A plating step of forming a second metal layer provided for the contact pins by plating, and a film covering a portion other than the portion provided for the contact pins on the second metal layer excluding the second mask And a separating step of separating a portion consisting of the substrate layer, the first metal layer and the first mask from a portion consisting of the film and the second metal layer. It is characterized by having. The tip is a ball or a needle.
Furthermore, the step of forming a second metal layer in each opening of the first mask may be performed after the step of inserting the tip. Then, the surface of the ball or the needle is roughened in advance.

[0013] The probe device of the present invention is a probe device in which the contact probe is connected to a circuit having terminals connected to respective base ends of the pattern wiring, and the probe device is provided on the film. A ferroelastic film protruding from the film shorter than the contact pins, and a contact probe holding body for holding the ferroelastic film and the contact probe. Further, the film is formed to be longer on the tip side than the ferroelastic film so that the ferroelastic film acts as a buffer when the contact pin is pressed.

According to the operation of the present invention, the contact pins are integrally formed by using, for example, a mask exposure technique in a state where the contact pins are vertically projected from the lower surface of the main body, so that the conventional bending process is not performed. In addition, the dimensions of the tips of the contact pins can be made highly accurate, and the heights of the tips can be made uniform, eliminating the need for conventional polishing. Also,
When the pad is made of a material softer than aluminum (for example, gold), even if the contact pins are arranged in parallel to the pad surface, each contact can be formed only by overdriving without scrubbing. The lower surface of the tip of the pin removes only the oxide film of the pad and makes sure contact with the base without damaging it. As described above, since it is not necessary to arrange the contact probe obliquely, the structure of components, jigs, and the like for incorporating the contact probe is simplified, and the processing is facilitated. further,
Since the tip portion of the contact pin is formed of a material harder than the main body portion, the wear resistance of the tip portion is improved, the service life of the contact pin as a whole is extended, and the contact pin is more likely to bite into the pad. Since the tip has a shape in which the cross-sectional area gradually decreases toward the lower end thereof, even when, for example, a contact pin is arranged in parallel to the pad surface, the tip is overdriven. Has a high local stylus pressure and easily bites against the pad, so that the surface oxide film of aluminum can be satisfactorily broken.

In the contact probe manufactured by the manufacturing method of the present invention, the contact pins can be arranged in parallel to the pad surface. By forming the contact pins protruding from the front end of the film in accordance with the respective pad distances, it is possible to cover all pads. Moreover, in that case, the contact angle of each contact pin with respect to each pad can be made equal.

In this contact probe, even if the film is, for example, a resin film which easily absorbs moisture and stretches, a metal film is directly attached to the film. Thereby, the elongation of the film is suppressed. Therefore, the pitch of the contact pins does not shift due to the extension of the film, and reliable contact with each pad can be obtained.

In this contact probe, since the second film is directly adhered to the metal film, an effect is obtained that it acts as a buffer against tightening when the contact probe is assembled by various components. . Therefore, it is possible to reduce damage to the wiring pattern at the time of assembling. Also, LCD
In such a case, a short circuit between the metal film and the terminal of the TABIC can be prevented.

In this probe device, the ferroelastic film is provided, and the ferroelastic film presses the tip of the contact pin from above, so that even if the tip of the pin is curved upward, it can reliably contact the pad. And a uniform contact pressure can be obtained for each pin, so that measurement errors due to poor contact can be eliminated. In this case, when the contact pin having the convex portion is disposed, for example, in parallel with the pad surface, there is no angle between the contact pin and the pad surface. If there is such a thing, it is conceivable that the contact will be uncertain even if overdriven, but this probe apparatus does not have the fear.

Since the film is formed longer on the distal end side than the ferroelastic film and serves as a cushioning material when the ferroelastic film presses the contact pin, even if overdrive is repeatedly performed, the ferroelastic film may be in contact with the ferroelastic film. The contact pin is not distorted and bent due to friction, and stable contact with the pad can be maintained. In this case, when the contact pins are arranged, for example, in parallel to the pad surface, there is no angle between the contact pins and the pad surface. Although it is conceivable that the contact may become uncertain even if the overdrive is performed, there is no danger with the present probe apparatus.

[0020]

Next, an embodiment of the present invention will be described with reference to the drawings. Hereinafter, a first embodiment of a method for manufacturing a contact probe according to the present invention will be described with reference to FIGS.
This will be described with reference to FIG.

As shown in FIG. 29, the basic structure of the contact probe 1 of this embodiment has a structure in which a pattern wiring 3 made of metal is attached to one surface of a polyimide resin film 2. The end of the pattern wiring 3 protrudes from the end of the second pattern wiring 2 to form a contact pin 3a. Here, a feature of the present embodiment is that, as shown in FIG. 9, a tip portion (a tungsten ball in this example) 3T of the contact pin 3a projects vertically downward with respect to the main body 3K. .

Next, with reference to FIGS. 1 to 9, the steps of manufacturing the contact probe 1 will be described in the order of steps.

[Support Metal Plate and Metal Layer Forming Step] First, as shown in FIG. 1, a support metal plate (substrate layer) 5 made of stainless steel is plated with Cu (copper) to form a base metal layer (first metal layer). Layer 6 is formed. This base metal layer 6
Is formed on the upper surface of the supporting metal plate 5 with a uniform thickness.

[First Pattern Forming Step, First Exposure Step] Next, a first photoresist layer (first mask) 7 is formed on the base metal layer 6 and then photolithography is performed. Is used to form a first pattern of a predetermined pattern having a plurality of portions 8a that do not transmit light on the first photoresist layer 7.
Is applied. These portions 8a that do not transmit light (five in FIG. 1 are shown, but not limited thereto) are arranged at equal intervals to form the tip 3T of the contact pin 3a.

Here, exposure is performed, and as shown in FIG.
Is developed, and openings 7a are formed in portions of the first photoresist layer 7 which are covered with the portions 8a that do not transmit light. Thereafter, the first photomask 8 is removed.

In the present embodiment, the first photoresist layer 7 is formed of a negative photoresist, but the desired opening 7a is formed by employing a positive photoresist.
May be formed. In the present embodiment,
The first photoresist layer 7 corresponds to a “first mask” in the present invention. However, the “first mask” in the claims of the present application means that the opening 7 a is formed through an exposure / development process using the first photomask 8 like the first photoresist layer 7 of the present embodiment. It is not limited to what is done. For example, a film or the like in which holes are formed in advance in a portion to be plated (that is, formed in advance in a state indicated by reference numeral 7 in FIG. 2) may be used. In the claims of the present application, when such a film or the like is used as the “first mask”, the pattern forming step in the present embodiment is unnecessary. The same applies to a second mask 9 described later. The position where the opening 7a is formed depends on the tip (contact portion) of the contact pin 3a formed by the Ni or Ni alloy layer N (second metal layer) with respect to the pad (measurement target) P in a subsequent step. The position corresponds to 3T.

[Tip Inserting Step] Then, as shown in FIG. 3A, by performing Cu half etching,
A portion of the base metal layer 6 corresponding to the opening 7a of the first photoresist layer 7 is partially removed to form a recess 6a. As shown in FIG. 3B, a tungsten ball B is inserted into each opening 7a and pressed against the recess 6a. The size of the ball B is set so as to fit tightly into the opening 7a, and the surface is rough. The material of the ball B is not limited to tungsten, but may be any material as long as it is harder (has a smaller degree of wear) than the material of the main body 3K of the contact pin 3a and is conductive. As shown in FIG. 3 (c), the openings 7a, a second metal layer N ₁ to be subjected to the contact pin 3a is formed by plating. Here, the second metal layer N ₁ does not go under the ball B, and
Since the surface roughness of the ball B is set roughly, the ball B along with being stably supported on the base metal layer 6, the adhesive strength between the metal layer N ₁ of the ball B and the second is high.
In this plating step, a second photoresist layer 9 described later is formed of a film as in the present embodiment.
When the resist layer 9 does not enter the opening 7a, it is not always necessary to perform the process. Further, instead of performing the ball inserting step of FIG. 3B, a needle H made of tungsten may be inserted into the base metal layer 6 as shown in FIG.

[Second Pattern Forming Step, Second Exposure Step] As shown in FIGS. 4A and 4B, a second photoresist layer (the second photoresist layer) is formed on the first photoresist layer 7. 2) and 9 using photolithography.
On the second photoresist layer 9, a second photomask 10b having a predetermined pattern and having a plurality of portions 10a that do not transmit light is applied. These portions 10a that do not transmit light
Extend in parallel at equal intervals to form a main body 3K of the contact pin 3a. In addition,
One end of the portion 10a through which light does not pass is formed at a position overlapping the opening 7a of the first photoresist layer 7. Then, by exposing, FIG.
As shown in (b), openings (grooves) 9a are formed in portions of the second photoresist layer 9 which are covered with the portions 10a that do not transmit light, and the second photomask 10a is removed. I do. Each opening 9 is formed at a position where one end thereof overlaps with the opening 7 a of the first photoresist layer 7.

[Electroplating Step] As shown in FIG. 6, a second metal layer N provided for the contact pins 3a is formed in each opening 9a of the second photoresist layer 9 by plating. That is, a Ni or Ni alloy layer N serving as the pattern wiring 3 is formed in each opening 9a by plating. As a result, in the pattern wiring 3 (contact pin 3a) made of the Ni or Ni alloy layer N, the tip 3T (ball B) projects vertically downward from the main body 3K, and the tip 3T is in contact with the pad. Becomes
Thereafter, as shown in FIG. 7, a second photoresist layer 9 is formed.
Is removed.

[Film Adhering Step] Next, as shown in FIG.
In addition to the tip of the pattern wiring 3 shown in FIG.
Are adhered by the adhesive 2a. This resin film 2
This is a two-layer tape in which a metal film (copper foil) 500 is integrally provided on a polyimide resin PI. Before this film attaching step, the copper surface 500 of the two-layer tape is copper-etched and then gold-plated depending on the use to form a ground plane. The resin surface PI of the tape is bonded to the N by an adhesive 2a.
It is deposited on the i or Ni alloy layer N. The metal film 500 may be made of Ni, Ni alloy or the like in addition to the copper foil.

[Separation Step] FIGS. 9A and 9B
As shown in the figure, after separating the supporting metal plate 5 from the portion composed of the resin film 2, the pattern wiring 3, and the base metal layer 6, only the pattern wiring 3 was bonded to the resin film 2 through Cu etching. State.

[Gold Coating Step] Next, Au plating is applied to the exposed pattern wiring 3 to form an Au plating layer A on the surface. At this time, the Au layer A is formed on the entire surface of the contact pins 3a protruding from the resin film 2 over the entire circumference.

Through the above steps, the contact probe 1 in which the pattern wiring 3 is adhered to the resin film 2 as shown in FIGS. 11 and 12 is manufactured.

FIG. 11 shows that the contact probe 1 is
FIG. 12 is a diagram showing a C probe cut out into a predetermined shape, and FIG. 12 is a cross-sectional view taken along line CC of FIG. 11. FIG.
As shown in FIG. 12 and FIG. 12, the resin film 2 is provided with a window 11 for transmitting a signal obtained from the pattern wiring 3 to a printed board 20 (see FIG. 10) via a lead wiring 10.

As shown in FIG.
00 is provided up to the vicinity of the contact pin 3a, and the contact pin 3a has an amount of protrusion L from the tip of the metal film 500 of 5 mm or less. The metal film 500 can be used as a ground, thereby enabling impedance matching to be performed near the tip of the probe device (probe card) 70, and adversely affected by reflection noise even when performing a test in a high frequency range. Can be prevented.

The resin film 2 (polyimide resin P
The metal film 500 attached to I) has the following advantages. That is, when there is no metal film 500, since the resin film 2 is made of a polyimide resin, it absorbs moisture and elongates, and as shown in FIG. 13, the interval t between the contact pins 3a changes. There was something. Therefore, there is a problem that the contact pin 3a cannot contact a predetermined position of the pad and an accurate electrical test cannot be performed. In the present embodiment, by attaching the metal film 500 to the resin film 2, the change in the interval t is reduced even if the humidity changes, so that the contact pin 3a can be reliably brought into contact with a predetermined position of the pad. I have.

As shown in FIG. 10, the contact pin 3a has a tip 3T at a contact portion with the pad.
Is formed, for example, even when the contact probe 1 is arranged in parallel to the pad surface Pa, the tip portion 3T reliably contacts the pad P only by applying overdrive. . This simplifies the structure of components 31 and jigs for incorporating the contact probe 1 and simplifies the processing, as compared with the related art in which the contact probe 1 has to be disposed obliquely. Specifically, it is possible to incorporate the contact probe 1 by a simple configuration such as bonding the contact probe 1 to the component 31, for example.

The probe device 70 configured as described above
When a probe test or the like of an IC chip is performed using the IC chip, the probe device 70 is mounted on a prober and electrically connected to a tester, and a predetermined electric signal is transmitted from the contact pin 3a of the pattern wiring 3 to the IC chip on the wafer. , The output signal from the IC chip is transmitted from the contact pin 3a to the tester through the substrate, and the electrical characteristics of the IC chip are measured.

In this case, since the contact pin 3a is integrally formed with its distal end 3T projecting vertically from the lower surface of the main body 3K, the dimensions of each distal end 3T are made highly accurate, and the height of each distal end 3T is increased. And the need for time-consuming and time-consuming polishing as in the prior art is not required. In addition, since the height and the interval of the tip 3T of the contact pin 3a are uniform, even when the overdrive amount is small, conduction is ensured even when the terminal is brought into contact with a semiconductor chip such as a chip or LSI chip or a terminal of a liquid crystal panel. And the contact accuracy is high. Further, when the pad is formed of a material softer than aluminum (for example, gold), even if the contact pins 3a are arranged in parallel to the pad surface, only overdrive is performed without scrubbing. , Making sure contact without damaging the substrate. As described above, since it is not necessary to arrange the contact probe obliquely, the structure of components, jigs, and the like for incorporating the contact probe is simplified, and the processing is facilitated. Even if the contact probe is arranged in parallel to the pad surface, the needle pressure can be increased by increasing the amount of overdrive, and the contact probe cuts into the pad, so that a good contact can be obtained. That is, when the pad is formed of a relatively hard material such as aluminum, only the aluminum oxide film can be removed by increasing the stylus pressure during overdrive. Since the tip 3T of the contact pin 3a is formed of a material (tungsten in this example) harder than the body 3K, the wear resistance of the tip 3T is improved, and the life of the contact pin 3a as a whole is extended. , It becomes easier to cut into the pad. Since the tip portion 3T is shaped so that the cross-sectional area gradually decreases toward the lower end thereof, even when the contact pins 3a are arranged in parallel to the pad surface Pa, the tip portion 3T may be overdriven. The portion 3T has a high local stylus pressure and easily bites the pad P. As a result, the surface oxide film of aluminum can be satisfactorily broken.

Further, since the lower surface 3b of the contact probe manufactured by the above-mentioned conventional manufacturing method is flat as shown in FIG. 30, a scrub is required to obtain a good contact, and the contact pin 3a However, according to the conventional configuration in which the contact pins 3a protrude obliquely downward, the distances from the film tip 2k to the pads P are equally arranged (for example, a plane). Although it can correspond to the pad P group which is arranged in a straight line parallel to the film tip 2k when viewed, the distances from the film tip 2k to the pads P and P2 are different (for example, in a staggered lattice shape in plan view). It was not possible to respond to the pads P and P2 (arranged).

Since the contact pins 3a protrude from the film tip 2k along the film surface 2e (parallel to the film surface 2e), the conventional arrangement in which the film 2 (contact probe 1) is disposed at an angle is provided. In the configuration, if the distance from the film tip 2k to each pad P is equal, the contact angle θ between each contact pin 3a and each pad P can be constant, but if the distance is different, all the pads P, This is because the structure in which each contact pin 3a # is brought into contact with P2 # is structurally difficult, and in that case, the contact angle θ with each pad P, P2 # cannot be kept constant.

On the other hand, in the contact probe 1 manufactured by the manufacturing method of the present embodiment, as shown in FIG. 10, since the contact pins 3a can be arranged in parallel to the pad surface Pa, Even for the pads P and P2 having different distances from the leading end 2k to the pads P and P2, the contact pins 3a and
By forming the protrusion amount of 3a2 in accordance with the distance between the pads P and P2, all the pads P and P2 # can be handled. Moreover, in this case, the contact angles of the respective contact pins 3a, 3a2 with respect to the respective pads P, P2 can be made the same (vertical in the present embodiment).

In the first embodiment, the contact probe 1 is connected to the probe device 7 which is a probe card.
Although it was applied to 0, it may be adopted for other measuring jigs and the like. For example, an IC chip is held inside to protect
The present invention may be applied to an IC chip test socket or the like mounted on a chip burn-in test device or the like. Although the contact probes are arranged in a horizontal state, the present invention is not limited to this. Scrubbing may be performed with the contact probes arranged obliquely as shown in FIGS.

Next, referring to FIG. 14 to FIG.
An embodiment will be described. In the present embodiment, the contact probe 1 (see FIG. 11) cut out into a predetermined shape for an IC probe in the first embodiment is cut out into a predetermined shape of an LCD probe and used instead. The contact probe cut into the LCD probe is indicated by reference numeral 200 in FIGS. 14 to 16, and reference numeral 201 is a resin film.

As shown in FIG. 17, an LCD probe device (probe device) 100 has a structure in which a contact probe holding member 110 and the contact probe holding member 110 are fixed to a frame frame 120. (A plurality of contact probe holding bodies 110 are actually attached, but only one is shown here.) The ends of the contact pins 3 a protruding from the contact probe holding body 110 are connected to terminals of an LCD (liquid crystal display) 90. (Not shown).

As shown in FIG. 16, the contact probe holding body 110 has a top clamp 111 and a bottom clamp 115. The top clamp 111 includes a first projection 112 for holding the tip of the contact pin 3a,
It has a second projection 113 for holding the terminal 301 on the TABIC (circuit) 300 side, which is a driver IC, and a third projection 114 for holding the lead.

The contact probe 200 is placed on the bottom clamp 115, and the terminal 301 of the TABIC 300 is connected to the resin film 20 of the contact probe 200.
It is placed so as to be located between 1,201. After that, the first protrusion 112 is attached to the top clamp 111 by the resin film 2.
The first projection 113 and the first projection 113 are assembled with bolts so as to contact the terminals 301.

As shown in FIG. 18, a contact probe holding body 110 is manufactured by incorporating a contact probe 200 and combining a top clamp 111 and a bottom clamp 115 with bolts 130.

LC using LCD probe device 100
The electrical test of the D90 is performed by using the LCD probe device 100.
While the tip of the contact pin 3a is in contact with the terminal (not shown) of the LCD 90, the TABIC 300 is driven to send various test signals, and a signal obtained from the contact pin 3a in response to the signal is transmitted. This is performed by taking out the device through the TABIC 300. Note that LC
In the case of D90, since only ON-OFF is tested, the high-frequency characteristics are not particularly problematic as compared with the IC test.

In the above-described LCD probe device 100, for example, as shown in FIG. 19, even when the contact probe 200 is arranged in parallel to the terminal surface of the LCD 90, only the overdrive is applied. The tip 3T surely contacts the terminal. From this,
Compared with the related art, the structure such as a component (for example, the bottom clamp 115) for incorporating the contact probe 200 and a jig is simplified, and processing is facilitated. When the contact probe 200 is incorporated, it can be performed with a simple configuration such as bonding to a component (for example, the top clamp 111).

Next, referring to FIG. 20 to FIG.
An embodiment will be described. As shown in FIG.
The contact pin 3a of the contact probe 200 described in the second embodiment may have an upwardly curved distal end S1 or a downwardly curved distal end S2 in addition to the normal distal end S. . in this case,
As shown in FIG. 21, even when the resin film 201 is sandwiched between the first protrusion 112 and the bottom clamp 115 and the contact pin 3a is pressed against the terminal of the LCD 90, the normal tip S1 and the tip S2 curved downward are LCD
The tip S1 that contacts the terminal 90, but is curved upward,
Even if the contact is made, a sufficient contact pressure may not be obtained. From this, the LCD 9 of the contact pin 3a
In some cases, an electrical test could not be performed accurately due to a contact failure with respect to 0. In addition, the pressing amount of the contact pin 3a is increased or decreased in order to obtain a desired contact pressure at the time of the test, but a large pressing amount is required to obtain a large contact pressure, but the amount is limited due to the shape of the needle. Yes,
In some cases, a large contact pressure could not be obtained.

Therefore, in the third embodiment, as shown in FIGS. 20 to 22, the tip S1 curved upward and the tip S2 curved downward of the contact pin 3a are aligned with the normal tip S. A ferroelastic film 400 made of an organic or inorganic material is provided on the resin film 201, and the resin film 201 on the side from which the contact pins 3a protrude.
The contact probe 200 and the ferroelastic film 400 are then overlapped with each other so as to protrude shorter than the contact pins 3a.
The contact probe holding body 110 sandwiched between the protrusion 112 and the bottom clamp 115 is employed. In this case, the distal end side of the ferroelastic film 400 is bent downward to press the upwardly curved distal end S1.

The ferroelastic film 400 is made of an organic material such as polyethylene terephthalate.
As long as the material is an inorganic material, it is preferable that the material is made of ceramics, particularly an alumina film. When the contact pins 3a are arranged in parallel with the terminal surface of the LCD 90 as in the present embodiment, the tip side of the ferroelastic film 400 is turned downward so that the tip S1 curved upward can be appropriately pressed. When the contact pins 3a are arranged to be inclined with respect to the terminal surface, the tip S1 can be pressed without bending the ferroelastic film 400.

When the contact probe holding body 110 is fixed to the frame-shaped frame 120 (see FIG. 17) and the contact pins 3a are pressed against the terminals of the LCD 90, the ferroelastic film 400 presses the contact pins 3a from above. Even if the tip S1 is curved, the LCD 90
Make sure to contact the terminal of Thereby, a uniform contact pressure is obtained for each contact pin 3a, and measurement errors due to poor contact can be eliminated.

Further, by changing the amount of protrusion of the contact pin 3a from the ferroelastic film 400, the contact pin 3a is pressed when the contact pin 3a is pressed.
Can be changed at the time of pressing from above, and a desired contact pressure can be obtained with a desired pressing amount.

In the case of the LCD probe device 100 according to the third embodiment, the contact pin 3a is
As shown in the figure, for example, when the contact pins 3a are arranged in parallel to the terminal surface, there is no angle between the contact pin 3a and the terminal surface. In this case, the contact may be uncertain even if the overdrive is performed.
At 0, there is no fear.

Next, a fourth embodiment will be described with reference to FIGS. As shown in FIG.
A configuration in which a metal film 500 is adhered on the resin film 201 and a second resin film 202 is further adhered on the metal film 500 is adopted, and as shown in FIG. Film 40
0 is provided. Here, the second resin film 2
02 is provided by contact probe 200 and TAB
When the terminal 301 is pressed by the protrusion 113 of the top clamp 111 to connect the terminal 301 of the IC 300, the metal film 500 and the terminal 30 of the TABIC 300 are pressed.
This is to prevent a short circuit with 1. In addition, by providing the second resin film 202, the surface of the metal film 500 is covered, and the progress of oxidation in the atmosphere can be effectively suppressed.

Next, a fifth embodiment will be described with reference to FIGS. In the embodiment described above, the ferroelastic film 400 is in pressure contact with the contact pins 3a, and the ferroelastic film 4
When the friction between the contact pin 3a and the contact pin 3a is repeated, and the distortion caused by the friction is accumulated, the contact pin 3a may bend right and left, and the contact point may be shifted.

Therefore, in the fifth embodiment, as shown in FIG. 25, the resin film 201 is formed into a wider film 201a than the conventional one and the contact pins 3a are formed.
X1> X2, where X1 is the protruding length from the metal film 500 and X2 is the protruding length of the wide resin film 201a from the metal film 500. Then, as shown in FIG.
Are used so as to project shorter than the wide resin film 201a, the ferroelastic film 400 comes into contact with the soft wide resin film 201a and the contact pins 3
Since the contact pin 3a does not directly contact the contact pin 3a, the contact pin 3a can be prevented from bending left and right.

In the LCD probe device 100 according to the fifth embodiment, the wide film 201a is formed longer on the tip side than the ferroelastic film 400 so that the ferroelastic film 400 cushions when pressing the contact pin 3a. As a result, even if overdrive is repeatedly applied, the contact pins 3a are not distorted and bent due to friction with the ferroelastic film 400, and stable contact with the terminal can be maintained. In this case, FIG.
As shown in the figure, when the contact pin 3a is arranged in parallel with the terminal surface, for example, there is no angle between the contact pin 3a and the terminal surface, and in particular, the pin 3a is curved. Is present, it is conceivable that the contact will be uncertain even if overdriven, but in the present probe apparatus 100, there is no danger.

Next, a sixth embodiment will be described with reference to FIGS. Metal film 500
In this case, if the length of the contact pins 3a protruding from the metal film 500 is X1, and the length of the wide resin film 201a protruding from the metal film 500 is X2, X1> It is configured so as to have a relationship of X2. Then, as shown in FIG. 28, the ferroelastic film 400 provided on the second resin film 202 may be overlapped so as to project shorter than the wide resin film 201a.

[0062]

Since the present invention is configured as described above, it has the following effects. In the contact probe and the method of manufacturing the same according to the present invention, since the contact pin is integrally formed with its tip end vertically protruding from the lower surface of the main body, the dimension of the tip is made highly accurate, and the height of the tip is increased Can be aligned at each pin, and the conventional polishing is not required. As a result, the contact accuracy is improved and the amount of overdrive is reduced. When the pad is made of a material softer than aluminum (for example, gold), the contact probe is arranged in parallel to the pad surface, and only the overdrive is applied. Good conductivity can be ensured without contacting the pad and damaging the base. This simplifies the structure of components, jigs, and the like for incorporating the contact probe as compared with the related art, and facilitates processing. Further, even if the lower surface of the tip portion of the contact pin is flat, the needle pressure can be increased by increasing the overdrive amount, and the contact pin bites into the pad, so that a good contact can be obtained. Since the tip of the contact pin is formed of a material harder than the body, the wear resistance of the tip is improved, and the life of the entire contact pin is extended.
Since the tip has a shape in which the cross-sectional area gradually decreases toward the lower end thereof, even when, for example, a contact pin is arranged in parallel to the pad surface, the tip is overdriven. Has high local stylus pressure,
It is easy to bite against the pad, and as a result, the surface oxide film of aluminum can be broken well. The height of the tip of the contact pin can be easily adjusted by the thickness of the first metal layer. By roughening the surface of the ball or the needle in advance, the ball (or the needle) is stably supported by the base metal layer, and the bonding strength between the ball (or the needle) and the second metal layer is increased.

Further, since a metal film is directly attached to the film, even if the film is, for example, a resin film which easily absorbs moisture and stretches, the metal film is used for the film. Is suppressed. Therefore, the pitch of the contact pins does not shift due to the extension of the film, and reliable contact with each pad can be obtained.

Further, since the second film is provided directly on the metal film, the second film can serve as a cushioning material against tightening when the contact probe is assembled by various components. Therefore,
Damage to the wiring pattern during assembling can be reduced. Further, in the case of the LCD, it is possible to prevent a short circuit between the metal film and the terminal of the TABIC.

According to the probe device of the present invention, since the ferroelastic film presses the tip of the contact pin from above, even if the pin tip is curved upward, it can be reliably brought into contact with the pad. Since a uniform contact pressure is obtained for each pin, measurement errors due to poor contact can be eliminated. In this case, when the contact pins are arranged, for example, in parallel to the pad surface, there is no angle between the contact pins and the pad surface, and in particular, there are those in which the pin tips are curved upward. In such a case, the contact may be uncertain even if the overdrive is performed. However, in the present probe apparatus, there is no danger.

Further, since the film is formed longer on the distal end side than the ferroelastic film and serves as a buffer when the contact pin is pressed, the ferroelastic film can be repeatedly applied even if overdrive is applied. The contact pin is not distorted and curved due to friction with the pad, and stable contact with the pad can be maintained.
In this case, when the contact pins are arranged, for example, in parallel to the pad surface, there is no angle between the contact pins and the pad surface. Although it is conceivable that the contact becomes uncertain even if the overdrive is performed, there is no danger in the present probe device.

[Brief description of the drawings]

FIG. 1 is a perspective view of a main part showing a first exposure step and the like in a first embodiment of a method for manufacturing a contact probe according to the present invention.

2A is a perspective view after a first exposure step in a first embodiment of a method for manufacturing a contact probe according to the present invention, and FIG. 2B is a cross-sectional view taken along line XX of FIG. .

FIG. 3 shows a ball inserting step in the first embodiment of the method for manufacturing a contact probe according to the present invention,
(A) shows a half etching step, (b) shows a ball pushing step, (c) shows a plating step, and (d) shows a case where a needle is used instead of a ball.

FIG. 4A is a perspective view showing a state before a second exposure step in the first embodiment of the method for manufacturing a contact probe according to the present invention, and FIG. 4B is a sectional view taken along line YY of FIG. is there.

FIG. 5A is a perspective view showing a state after a second exposure step in the first embodiment of the method for manufacturing a contact probe according to the present invention, and FIG. 5B is a cross-sectional view taken along line ZZ of FIG. is there.

FIG. 6 is a cross-sectional view after an electrolytic plating step in the first embodiment of the method for manufacturing a contact probe according to the present invention.

7 is a cross-sectional view showing a state where the second photoresist layer 9 has been removed from the state of FIG.

FIG. 8 is a cross-sectional view after a film bonding step in the first embodiment of the method for manufacturing a contact probe according to the present invention.

9A is a schematic perspective view of a main part at a final stage in a first embodiment of a method for manufacturing a contact probe according to the present invention, and FIG. 9B is a cross-sectional view.

FIG. 10 is a side view showing an example of a probe device incorporating the contact probe manufactured according to the first embodiment of the method for manufacturing a contact probe according to the present invention.

FIG. 11 is a plan view showing a contact probe manufactured according to the first embodiment of the method for manufacturing a contact probe according to the present invention.

FIG. 12 is a sectional view taken along line CC of FIG. 11;

FIG. 13 is a front view for explaining a metal film in the first embodiment of the contact probe according to the present invention.

FIG. 14 is a perspective view showing a contact probe in a second embodiment of the probe device according to the present invention.

FIG. 15 is a sectional view taken along line AA of FIG. 14;

FIG. 16 is an exploded perspective view showing a contact probe holding body in a second embodiment of the probe device according to the present invention.

FIG. 17 is a perspective view showing a probe device according to a second embodiment of the probe device according to the present invention.

FIG. 18 is a perspective view showing a contact probe holding body in a probe device according to a second embodiment of the present invention.

FIG. 19 is a sectional view taken along line BB of FIG. 17;

FIG. 20 is a side view showing a conventional drawback of a contact probe with respect to the third embodiment of the probe device according to the present invention.

FIG. 21 is a side view showing a conventional disadvantage of the probe device with respect to the third embodiment of the probe device according to the present invention.

FIG. 22 is a side view showing a probe device according to a third embodiment of the probe device according to the present invention.

FIG. 23 is a side view showing a contact probe in a fourth embodiment of the contact probe according to the present invention.

FIG. 24 is a side view showing a probe device in a fourth embodiment of the probe device according to the present invention.

FIG. 25 is a side view showing a contact probe in a fifth embodiment of the probe device according to the present invention.

FIG. 26 is a side view showing a probe device according to a fifth embodiment of the probe device according to the present invention.

FIG. 27 is a side view showing a contact probe in a sixth embodiment of the probe device according to the present invention.

FIG. 28 is a side view showing a probe device in a sixth embodiment of the probe device according to the present invention.

FIG. 29 is a perspective view of a main part showing a conventional contact probe.

FIG. 30 is a side view showing an example of a probe device incorporating a conventional contact probe.

FIG. 31 is a view showing an example in which the tip of a contact pin is bent in a conventional contact probe.

[Explanation of symbols]

DESCRIPTION OF SYMBOLS 1 Contact probe 2 Film (resin film) 2a Adhesive 2e Film surface 2k Film tip 3 Pattern wiring 3a, 3a2 Contact pin 3b Lower surface 3K Body 3T Tip (contact part) 5 Substrate layer (support metal plate) 6 First Metal layer (base metal layer) 6a opening 7 first photoresist layer (first mask) 7a unmasked portion (opening) 8a first photomask 9 second photoresist layer (second 9a opening 10 lead-out wiring 10b second photomask 11 window 20 substrate (printed circuit board) 30, 31, 50 component 70 probe device (probe card) 90 LCD 100 probe device 110 contact probe holding body 111 top clamp 112 first protrusion 113 second protrusion 114 third Start 115 Bottom clamp 120 Picture frame 130 Bolt 200 Contact probe 201 Film 201a Film (wide film) 202 Second film 300 Circuit (TABIC) 301 Terminal 400 Strong elastic film 500 Metal film N Second metal layer (Ni or Ni) Alloy layer) P, P2 Pad Pa Pad surface S, S1, S2 Tip θ Contact angle

Claims (12)

[Claims] 1. A plurality of pattern wirings (3) are formed on a film (2, 201, 201a), and the tips of these pattern wirings (3) are connected to the film (2, 201, 201a).
01a) and the contact pins (3
a) a contact probe (1, 200), wherein the contact pin (3a) is integrally formed with its tip (3T) vertically projecting downward with respect to its main body (3K). A contact probe, wherein the tip (3T) is made of a conductive material that is harder than the main body (3K). 2. The contact probe according to claim 1, wherein the tip portion (3T) has a shape whose sectional area gradually decreases toward a lower end thereof. 3. The contact probe according to claim 1, wherein the tip (3T) includes a ball or needle made of tungsten. 4. The film (2, 201, 201a)
The contact probe according to any one of claims 1 to 3, wherein a metal film (500) is directly attached to the contact probe. 5. The metal film (500) has a second
The contact probe according to claim 4, wherein the film (202) is directly attached. 6. A metal layer forming step of forming, on a substrate layer (5), a first metal layer (6) made of a material to be attached to or bonded to a tip portion (3T) of a contact pin (3a). A first mask (7) is applied on the first metal layer (6), and the tip (3T) of the contact pin (3a) is inserted into the first mask (7). Opening (7
a) forming a first pattern forming step, and inserting a tip (3T) made of a conductive material harder than the main body (3K) of the contact pin (3a) into the opening (7a). A tip insertion step of pressing against the first metal layer (6); and applying a second mask (9) on the first metal layer (6) to form a second mask (9). An opening (9) for forming a main body (3K) of the contact pin (3a) is formed.
a) forming one end of the first mask (7) so as to overlap the opening (7a) of the first mask (7); and each opening (1) of the first mask (7). 7a) and the second
A plating process of forming a second metal layer (N ₁ , N) to be provided to the contact pin (3a) by plating in each opening (9a) of the mask (9); An application step of applying a film (2, 201, 201a) covering a portion other than a portion provided for the contact pin (3a) on the second metal layer (N) excluding 9); (2, 201, 201a) and the portion composed of the second metal layer (N) from the portion composed of the substrate layer (5), the first metal layer (6) and the first mask (7) A method for manufacturing a contact probe, comprising: a separating step of separating. 7. The method according to claim 6, wherein the tip (3T) is a ball (B) or a needle. 8. Each opening (7) of said first mask (7).
The method for manufacturing a contact probe according to claim 6 or 7, wherein the step of forming a second metal layer (N ₁ ) on a) is performed after the step of inserting the distal end portion. 9. The method for manufacturing a contact probe according to claim 6, wherein a surface of said tip portion (3T) is roughened in advance. 10. A circuit (300) having a terminal (301) connected to each base end of a pattern wiring (3) by using the contact probe (200) according to any one of claims 1 to 5. A probe device (100) connected to the film (20);
, 201a) and the film (201,20).
1a) a ferroelastic film (400) projecting shorter than the contact pin (3a), and a contact probe holding body (110) for holding the ferroelastic film (400) and the contact probe (200). A probe device. 11. A terminal (301) connected to each base end of a pattern wiring (3) using a contact probe (200) manufactured by the manufacturing method according to claim 6. A probe device (100) connected to a circuit (300) having the film (20).
, 201a) and the film (201,20).
1a) a ferroelastic film (400) projecting shorter than the contact pin (3a), and a contact probe holding body (110) for holding the ferroelastic film (400) and the contact probe (200). A probe device. 12. The probe device (100) according to claim 10, wherein the film (20) is provided.
1a) is characterized in that the ferroelastic film (400) is formed longer on the tip side than the ferroelastic film (400) so as to serve as a buffer when pressing the contact pin (3a). Probe device.