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JPH10214788A - Vapor growth device - Google Patents

Vapor growth device

Info

Publication number
JPH10214788A
JPH10214788A JP1604197A JP1604197A JPH10214788A JP H10214788 A JPH10214788 A JP H10214788A JP 1604197 A JP1604197 A JP 1604197A JP 1604197 A JP1604197 A JP 1604197A JP H10214788 A JPH10214788 A JP H10214788A
Authority
JP
Japan
Prior art keywords
exhaust
gas
reaction
gas supply
valve
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1604197A
Other languages
Japanese (ja)
Inventor
Satoshi Hattori
聡 服部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Furukawa Electric Co Ltd
Original Assignee
Furukawa Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Furukawa Electric Co Ltd filed Critical Furukawa Electric Co Ltd
Priority to JP1604197A priority Critical patent/JPH10214788A/en
Publication of JPH10214788A publication Critical patent/JPH10214788A/en
Pending legal-status Critical Current

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  • Chemical Vapour Deposition (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a vapor growth device with which the dismantling work of reaction furnaces other than one reaction furnace can be performed safely, even when vapor growth takes place in the reaction furnace. SOLUTION: A vapor growth device is provided with a gas supplying system 5, a plurality of reaction systems 9a and 9b, and an exhaust gas processing system 12 and the systems 5 and 12 can be connected to the reaction systems 9a or 9b by switching. The systems 5 and 9a are connected to a connecting pipe 17a for supplying a gaseous material through two stages of valves 30a and 31a, and a purge gas introducing pipe 61a for introducing a purge gas and an independent exhaust pipe 64a for discharging the purge gas are connected to the connecting pipe 17a between the valves 30a and 30b. Similarly, the gas supplying system 5, reaction system 9a, and reaction system 9b are respectively connected to the reaction system 9b, exhaust gas processing system 12, and processing system 12.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、気相成長装置の改
良に関し、特に、半導体薄膜の成膜など毒性ガス、可燃
性ガスを用いる気相成長の生産性を向上させることがで
きる気相成長装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an improvement in a vapor phase growth apparatus, and more particularly, to a vapor phase growth method capable of improving the productivity of vapor phase growth using a toxic gas or a flammable gas for forming a semiconductor thin film. Related to the device.

【0002】[0002]

【従来の技術】半導体気相成長装置は、制御性が良く、
大量生産に向いていることから、半導体産業のなかで重
要な位置を占めつつある。半導体気相成長装置の一般的
な構成を図3に示す。この半導体気相成長装置は、 (a)原料ガス供給源1a、1b、1c、1d、キャリ
アガス供給源2およびパージガス供給源3を有し、原料
ガスとキャリアガスとを混合して、反応炉4に導くガス
供給系5 (b)半導体基板6を載せるサセプタ7、加熱源のヒー
ター(図示されず)を備えた反応炉4と、サセプタ7を
下降させて基板6を出し入れする予備室8、さらに反応
炉4の外側近傍に設けられ、反応により発生した粉末を
集めるトラップ16を含む反応系9 (c)反応系からの排ガスを無害化処理する除害処理部
10と排気ポンプ11とを備えた排気ガス処理系12か
ら構成されている。なお、13は原料ガス供給ライン、
15は原料ガスを廃棄するベントラインである。
2. Description of the Related Art A semiconductor vapor deposition apparatus has good controllability,
Because it is suitable for mass production, it is becoming an important part of the semiconductor industry. FIG. 3 shows a general configuration of a semiconductor vapor deposition apparatus. This semiconductor vapor phase growth apparatus comprises: (a) a source gas supply source 1a, 1b, 1c, 1d, a carrier gas supply source 2 and a purge gas supply source 3; (B) a susceptor 7 on which the semiconductor substrate 6 is placed, a reaction furnace 4 equipped with a heater (not shown) as a heating source, and a preliminary chamber 8 for lowering the susceptor 7 to put the substrate 6 in and out. Further, a reaction system 9 is provided near the outside of the reaction furnace 4 and includes a trap 16 for collecting powder generated by the reaction. (C) A detoxification treatment section 10 for detoxifying exhaust gas from the reaction system and an exhaust pump 11 are provided. And an exhaust gas processing system 12. 13 is a source gas supply line,
Reference numeral 15 denotes a vent line for discarding the source gas.

【0003】また、薄膜を気相成長させる一般的な工程
は次の様になる。即ち、 (a)予備室8内の残留ガスを不活性ガスで置換した
後、予備室8を開き、基板6をサセプタ7上にセットす
る(前パージ工程)。 (b)次いで、予備室8の扉を閉じ、該予備室8内を不
活性ガスで置換した後、サセプタ7を反応炉4へ移動す
る(前パージ工程)。 (c)次いで、反応炉4を加熱しつつ、原料ガスをキャ
リアガスで反応炉4内に導入し、気相成長を行わせる
(気相成長工程)。 (d)再びサセプタ7を予備室8に移動し、反応炉4内
をキャリアガスで置換し、予備室8内を不活性パージガ
スで置換する(後パージ工程)。 (e)その後に基板6を予備室8から取り出す。
A general process for vapor-phase growing a thin film is as follows. (A) After replacing the residual gas in the preliminary chamber 8 with an inert gas, the preliminary chamber 8 is opened and the substrate 6 is set on the susceptor 7 (pre-purge step). (B) Next, the door of the preliminary chamber 8 is closed, the inside of the preliminary chamber 8 is replaced with an inert gas, and then the susceptor 7 is moved to the reaction furnace 4 (pre-purge step). (C) Next, while heating the reaction furnace 4, the source gas is introduced into the reaction furnace 4 with a carrier gas to cause vapor phase growth (vapor phase growth step). (D) The susceptor 7 is moved to the preliminary chamber 8 again, and the inside of the reaction furnace 4 is replaced with a carrier gas, and the inside of the preliminary chamber 8 is replaced with an inert purge gas (post-purging step). (E) Thereafter, the substrate 6 is taken out of the preliminary chamber 8.

【0004】そこで、気相成長の能率を上げるため、図
4に示すように、一系統のガス供給系5にキャリアガス
パージライン14a、14bを追加し、それらを複数の
反応炉4a、4bに連結させ、一方の反応系9aで気相
成長を行わせている間に他方の反応系9bで前パージや
後パージを行う方法がとられている。この際、原料ガス
供給ライン13は、バルブ30a、31aとバルブ30
b、31bで供給すべき反応炉4a、4bを切り換える
ことになる。また、設備費を小さくするため、排気ガス
処理系12についても一系統にして、複数の反応炉4
a、4bや予備室8a、8bからのパージガスや原料ガ
スを合流して、排気ライン19から排気する方法が用い
られている。この際、各反応炉4a、4bや各予備室8
a、8bからの排気ガスは、バルブ32a、33a、3
4aとバルブ32b、33b、34bとを通って排気ガ
ス処理系12に導入される。
In order to improve the efficiency of vapor phase growth, carrier gas purge lines 14a and 14b are added to one gas supply system 5 as shown in FIG. 4 and connected to a plurality of reactors 4a and 4b. A method is employed in which one reaction system 9a performs vapor phase growth while the other reaction system 9b performs pre-purging or post-purging. At this time, the source gas supply line 13 is connected to the valves 30a, 31a and the valve 30a.
The reactors 4a and 4b to be supplied in b and 31b are switched. Also, in order to reduce equipment costs, the exhaust gas treatment system 12 is also integrated into one
A method is used in which purge gases and source gases from the chambers a and 4b and the preliminary chambers 8a and 8b are combined and exhausted from the exhaust line 19. At this time, each reaction furnace 4a, 4b and each preliminary chamber 8
The exhaust gas from a, 8b is supplied to valves 32a, 33a, 3b.
4a and the valves 32b, 33b, 34b are introduced into the exhaust gas treatment system 12.

【0005】[0005]

【発明が解決しようとする課題】しかしながら、上述の
半導体気相成長装置においては、反応炉4a、4bの内
壁やサセプタ7、反応炉4a、4bからトラップ16
a、16bに至る排気管への反応生成物の付着や堆積が
多く、更にトラップ16a、16bへの粉末蓄積も多
い。そこで、気相成長膜の品質を維持するには、50か
ら100バッチ毎に定期的に反応炉4a、4bやサセプ
タ7の解体と交換、トラップ16a、16bのフィルタ
の交換、排気ライン19の掃除が必要である。上記のよ
うな複数の反応炉4a、4bを有する装置においては、
一方の反応炉の解体作業中でも他方の反応炉で成長可能
なように、原料ガス供給ライン13の切り換えバルブ3
0a、31aとバルブ30b、31bのように、原料ガ
ス流に対してバルブを二段にして、原料ガスの流出を止
めている。また、複数の反応炉4a、4bの排気管の合
流点Aの手前の排気バルブ32a、33a、34aと排
気バルブ32b、33b、34bのごとく、バルブを二
段にして、排気ガスの流出を止めている。それでも、バ
ルブの劣下などによる内部リークが発生した場合、解体
作業者が毒性ガスや可燃性ガスである原料ガスや排気ガ
スを浴びることになり、安全性に欠ける。このため、一
方の反応炉で成長中に他方の反応炉の解体作業を実施で
きないという問題があった。例え排気系であっても、そ
の圧力が大気圧よりも高い条件で気相成長を行う場合に
は、ガスが漏れる恐れがある。本発明の目的は、複数の
反応炉のうちの少なくとも一つの反応炉が気相成長中で
も、他の反応炉の解体作業などを安全に行える気相成長
装置を提供することを目的とする。
However, in the above-described semiconductor vapor deposition apparatus, the traps 16 from the inner walls of the reactors 4a and 4b, the susceptor 7, and the reactors 4a and 4b.
A large amount of reaction products adhere to and accumulate on the exhaust pipes extending to a and 16b, and a large amount of powder accumulates in the traps 16a and 16b. Therefore, in order to maintain the quality of the vapor-grown film, the reactors 4a and 4b and the susceptor 7 are periodically dismantled and exchanged every 50 to 100 batches, the filters of the traps 16a and 16b are exchanged, and the exhaust line 19 is cleaned. is required. In an apparatus having a plurality of reactors 4a and 4b as described above,
The switching valve 3 of the source gas supply line 13 so that the growth can be performed in the other reactor even during the dismantling operation of one reactor.
As in the case of 0a, 31a and the valves 30b, 31b, the valve is provided in two stages with respect to the source gas flow to prevent the source gas from flowing out. Further, the exhaust valves 32a, 33a, 34a and exhaust valves 32b, 33b, 34b before the junction A of the exhaust pipes of the plurality of reactors 4a, 4b are arranged in two stages to stop the exhaust gas from flowing out. ing. Nevertheless, if an internal leak occurs due to the inferiority of the valve or the like, the disassembly operator will be exposed to raw gas or exhaust gas, which is a toxic gas or a flammable gas, and lack safety. For this reason, there has been a problem that the dismantling operation of the other reactor cannot be performed during growth in one reactor. Even in the case of an exhaust system, if gas phase growth is performed under conditions where the pressure is higher than the atmospheric pressure, gas may leak. An object of the present invention is to provide a vapor phase growth apparatus that can safely disassemble other reactors while at least one of a plurality of reactors is in vapor phase growth.

【0006】[0006]

【課題を解決するための手段】本発明は上記問題点を解
決すべくなされたもので、請求項1記載の発明は、原料
ガス供給系と、複数の反応系と、排気ガス処理系を有
し、前記原料ガス供給系および排気ガス処理系は前記複
数の反応系に接続切替え可能である気相成長装置であっ
て、原料ガス供給系と反応系は、直列に配置された2段
のバルブを有する原料ガス供給接続管で接続され、ま
た、反応系と排気ガス処理系は、直列に配置された2段
のバルブを有する排気ガス排気接続管で接続され、前記
各接続管の2段のバルブ間には、パージガスを導入する
パージガス導入管および排気する独立した排気管が接続
していることを特徴とする気相成長装置である。ここ
で、独立した排気管とは、直接に排気ガス処理部などに
接続し、装置に組み込まれた他の排気管から分離してい
る排気管ということである。また、請求項2記載の発明
は、前記原料ガス供給接続管と排気ガス排気接続管の2
段のバルブ間には、真空引きする真空引き管が接続して
いることを特徴とする気相成長装置である。
SUMMARY OF THE INVENTION The present invention has been made to solve the above problems, and the invention according to claim 1 has a source gas supply system, a plurality of reaction systems, and an exhaust gas treatment system. The source gas supply system and the exhaust gas treatment system are a vapor phase growth apparatus that can be connected and switched to the plurality of reaction systems, wherein the source gas supply system and the reaction system are two-stage valves arranged in series. And a reaction system and an exhaust gas treatment system are connected by an exhaust gas exhaust connection pipe having two-stage valves arranged in series, and a two-stage exhaust gas connection pipe of each connection pipe is provided. A gas phase growth apparatus is characterized in that a purge gas introduction pipe for introducing a purge gas and an independent exhaust pipe for exhausting gas are connected between the valves. Here, the independent exhaust pipe is an exhaust pipe that is directly connected to an exhaust gas processing unit or the like and is separated from other exhaust pipes incorporated in the device. The invention according to claim 2 is characterized in that the source gas supply connection pipe and the exhaust gas exhaust connection pipe are connected to each other.
A vapor phase growth apparatus is characterized in that a vacuum tube for vacuuming is connected between the valves of the stages.

【0007】請求項1記載の発明では、複数の反応系の
うちの少なくとも一つの反応系で気相成長中に、他の反
応系の解体作業、トラップのフィルタの交換作業、排気
管の掃除を行う際、原料ガス供給系と解体作業などを行
う反応系との原料ガス供給接続管の2段のバルブを締
め、その間にパージガスを導入し、排気する。そうする
と、前記原料ガス供給接続管の原料ガス供給系側のバル
ブが劣化して原料ガスがリークしてきても、リークした
原料ガスは接続管内からパージガスとともに排気ガス処
理部に排気されるので、解体作業などに悪影響を与える
ことはない。同様に、反応系と排気ガス処理系を接続す
る排気ガス排気接続管の2段のバルブのうち、排気ガス
処理系側のバルブが劣化し、排気ガスがリークしても、
この排気ガスはパージガスとともに排気ガス処理部に直
接、排気されるので、解体作業などに悪影響を与えるこ
とはない。
According to the first aspect of the present invention, during vapor phase growth in at least one of the plurality of reaction systems, dismantling of other reaction systems, replacement of trap filters, and cleaning of exhaust pipes are performed. At this time, the two-stage valve of the source gas supply connection pipe between the source gas supply system and the reaction system for dismantling or the like is closed, and a purge gas is introduced and exhausted during that time. Then, even if the source gas supply system side valve of the source gas supply connection pipe is deteriorated and the source gas leaks, the leaked source gas is exhausted from the connection pipe together with the purge gas to the exhaust gas processing unit. It does not have any adverse effects. Similarly, of the two-stage valve of the exhaust gas exhaust connection pipe connecting the reaction system and the exhaust gas treatment system, even if the exhaust gas treatment system side valve deteriorates and the exhaust gas leaks,
Since this exhaust gas is directly exhausted to the exhaust gas processing section together with the purge gas, there is no adverse effect on the dismantling operation and the like.

【0008】また、請求項2記載の発明では、解体作業
などを行う反応系と原料ガス供給系の原料ガス供給接続
管の2段のバルブを締め、真空引きすることにより、原
料ガス供給系側のバルブが劣化して原料ガスがリークし
てきても、リークした原料ガスは真空ポンプで排気され
るので、解体作業などに悪影響を与えることはない。ま
た、反応系と排気ガス処理系との排気ガス排気接続管に
ついても同様である。
In the invention according to claim 2, the two-stage valve of the source gas supply connection pipe of the reaction system for performing dismantling work and the like and the source gas supply system are closed and evacuated, so that the source gas supply system side Even if the valve is deteriorated and the source gas leaks, the leaked source gas is exhausted by the vacuum pump, so that there is no adverse effect on the disassembly operation and the like. The same applies to the exhaust gas exhaust connection pipe between the reaction system and the exhaust gas treatment system.

【0009】[0009]

【発明の実施の形態】以下、図面に基づいて本発明の実
施の形態を詳細に説明する。 (実施形態1)図1は、本発明にかかる気相成長装置の
一実施形態の説明図である。図1において、図3および
図4と同一箇所には同一符号を用いている。本実施形態
の装置は、原料ガス供給系、キャリアガス供給系および
パージガス供給系を含む一系統のガス供給系5と、反応
炉4aを含む反応系9aと反応炉4bを含む反応系9b
の二系統の反応系、および排気系12から構成されてい
る。原料ガス供給系は原料ガス供給源1a、1b、1
c、1d、キャリアガス供給系はキャリアガス供給源
2、およびパージガス供給系はパージガス供給源3を備
えている。また、排気ガス処理系12は除害処理部10
と排気ポンプ11とを備えている。気相成長装置のガス
供給系5、反応系9a、9b、排気ガス処理系12は各
々独立のキャビネットで覆われ、そのキャビネット内部
は、換気ブロアで強制換気されている。従って、ガス配
管や反応炉4a、4bからガス漏れが生じても、キャビ
ネットの外にいる限りは、人体に暴露することは無いよ
うに安全に設計されている。
Embodiments of the present invention will be described below in detail with reference to the drawings. (Embodiment 1) FIG. 1 is an explanatory view of one embodiment of a vapor phase growth apparatus according to the present invention. In FIG. 1, the same parts as those in FIGS. 3 and 4 are denoted by the same reference numerals. The apparatus according to the present embodiment includes a gas supply system 5 including a source gas supply system, a carrier gas supply system, and a purge gas supply system, a reaction system 9a including a reaction furnace 4a, and a reaction system 9b including a reaction furnace 4b.
, And an exhaust system 12. The source gas supply system includes source gas supply sources 1a, 1b, 1
c, 1d, the carrier gas supply system includes a carrier gas supply source 2, and the purge gas supply system includes a purge gas supply source 3. Further, the exhaust gas treatment system 12 includes
And an exhaust pump 11. The gas supply system 5, the reaction systems 9a and 9b, and the exhaust gas treatment system 12 of the vapor phase growth apparatus are each covered by an independent cabinet, and the inside of the cabinet is forcibly ventilated by a ventilation blower. Therefore, even if gas leaks from the gas pipes or the reaction furnaces 4a and 4b, it is safely designed so as not to be exposed to the human body as long as it is outside the cabinet.

【0010】原料ガス供給ライン13と反応系9aは原
料ガス供給接続管17aで接続され、原料ガス供給接続
管17aには2段のバルブ30a、31aが原料ガス流
に対して直列に設置されている。また、原料ガス供給接
続管17aにはバルブ30a、31a間に不活性パージ
ガス導入管61aと、排気管64aが接続している。排
気管64aは他の配管と接続せず、除害処理部10に独
立して接続している。同様に、原料ガス供給ライン13
と反応系9bは原料ガス供給接続管17bで接続され、
原料ガス供給接続管17bには2段のバルブ30b、3
1bが原料ガス流に対して直列に設置されている。ま
た、原料ガス供給接続管17bにはバルブ30b、31
b間に不活性パージガス導入管61bと、排気管64b
が接続している。排気管64bは他の配管と接続せず、
除害処理部10に独立して接続している。
The source gas supply line 13 and the reaction system 9a are connected by a source gas supply connection pipe 17a, and two-stage valves 30a and 31a are installed in the source gas supply connection pipe 17a in series with respect to the source gas flow. I have. Further, an inert purge gas introduction pipe 61a and an exhaust pipe 64a are connected to the source gas supply connection pipe 17a between the valves 30a and 31a. The exhaust pipe 64a is not connected to other pipes, but is independently connected to the abatement unit 10. Similarly, the source gas supply line 13
And the reaction system 9b are connected by a source gas supply connection pipe 17b,
The two-stage valve 30b, 3
1b is installed in series with the feed gas stream. The source gas supply connection pipe 17b has valves 30b, 31
b, an inert purge gas introduction pipe 61b and an exhaust pipe 64b
Is connected. The exhaust pipe 64b is not connected to other pipes,
It is independently connected to the abatement unit 10.

【0011】反応系9aと排気ガス処理系12は、排気
ガス排気接続管18a、21aで接続され、排気ガス排
気接続管18aには2段のバルブ32a、34aが排気
ガスに対して直列に設置され、排気ガス排気接続管21
aには2段のバルブ33a、34aが排気ガス流に対し
て直列に設置されている。また、排気ガス排気接続管1
8aにはバルブ32a、34a間に不活性パージガス導
入管71aが接続され、排気ガス排気接続管21aには
バルブ33a、34a間に排気管74aが接続してい
る。排気管74aは他の配管と接続せず、除害処理部1
0に独立して接続している。同様に、反応系9bと排気
ガス処理系12は、排気ガス排気接続管18b、21b
で接続され、排気ガス排気接続管18bには2段のバル
ブ32b、34bが排気ガス流に対して直列に設置さ
れ、排気ガス排気接続管21bには2段のバルブ33
b、34bが排気ガス流に対して直列に設置されてい
る。また、排気ガス排気接続管18bにはバルブ32
b、34b間に不活性パージガス導入管71bが接続さ
れ、排気ガス排気接続管21bにはバルブ33b、34
b間に排気管74bが接続している。排気管74bは他
の配管と接続せず、除害処理部10に独立して接続して
いる。
The reaction system 9a and the exhaust gas processing system 12 are connected by exhaust gas exhaust connection pipes 18a and 21a, and two-stage valves 32a and 34a are installed in the exhaust gas exhaust connection pipe 18a in series with the exhaust gas. And the exhaust gas exhaust connection pipe 21
In a, two-stage valves 33a and 34a are installed in series with respect to the exhaust gas flow. Also, the exhaust gas exhaust connection pipe 1
An inert purge gas introduction pipe 71a is connected to the valve 8a between the valves 32a and 34a, and an exhaust pipe 74a is connected to the exhaust gas exhaust connection pipe 21a between the valves 33a and 34a. The exhaust pipe 74a is not connected to other pipes, and the abatement processing unit 1
0 is independently connected. Similarly, the reaction system 9b and the exhaust gas treatment system 12 are connected to the exhaust gas exhaust connection pipes 18b and 21b.
The exhaust gas exhaust connection pipe 18b has two-stage valves 32b and 34b installed in series with respect to the exhaust gas flow, and the exhaust gas exhaust connection pipe 21b has a two-stage valve 33
b, 34b are installed in series with the exhaust gas flow. A valve 32 is provided in the exhaust gas exhaust connection pipe 18b.
An inert purge gas introduction pipe 71b is connected between the exhaust gas exhaust connection pipe 21b and the valves 33b, 34.
An exhaust pipe 74b is connected between b. The exhaust pipe 74b is not connected to other pipes, but is independently connected to the abatement unit 10.

【0012】本実施形態において、反応炉4aで気相成
長が行われ、反応炉4bで解体作業が行われる場合につ
いて説明する。反応炉4aで気相成長が行われていると
き、原料ガス供給源1a、1b、1c、1dからの原料
ガスはバルブ1h、1i、1j、1kを通って、原料ガ
ス供給ライン13を流れるキャリアガス供給源2からの
キャリアガスと合流して、切り換えバルブ30a、バル
ブ31aを通って反応炉4a に導入される。その排気
は、トラップ16a、バルブ32a、バルブ33a、バ
ルブ34aを通って(バルブ34bは閉じている)、排
気ライン19に入り、除害処理部10、排気ポンプ11
を通って排出される。
In the present embodiment, a case will be described in which vapor phase growth is performed in the reactor 4a and dismantling is performed in the reactor 4b. When gas phase growth is being performed in the reaction furnace 4a, the source gas from the source gas supply sources 1a, 1b, 1c, and 1d passes through the valves 1h, 1i, 1j, and 1k and flows through the source gas supply line 13 through the carrier. The carrier gas merges with the carrier gas from the gas supply source 2 and is introduced into the reaction furnace 4a through the switching valve 30a and the valve 31a. The exhaust gas passes through the trap 16a, the valve 32a, the valve 33a, and the valve 34a (the valve 34b is closed), enters the exhaust line 19, and performs the detoxification processing unit 10, the exhaust pump 11
Is discharged through.

【0013】反応炉4bの解体やトラップ16b のフィ
ルタの交換作業を行うためには、先ず、反応系9bのキ
ャビネット内に入り、バルブ31bと反応炉4bとの
間、およびバルブ32bとトラップ16bとの間で配管
を取り外す。従って、原料供給ライン13を流れる原料
ガスは切り換えバルブ30b、バルブ31bで止められ
ている。また、排気ライン19を流れる反応系9aから
の排気ガスはバルブ32b、33b、34bで止められ
ている。解体、交換、組み立てなどの作業中は、不活性
パージガス導入管61bからバルブ62bを通して不活
性パージガスを切り換えバルブ30b、バルブ31bの
間に導入し、バルブ63bから排気管64bを通って除
外処理部10に流し込む。また、不活性ガスパージライ
ン71bからバルブ72bを通してバルブ32b、バル
ブ33b、バルブ34bの間にも不活性パージガスを導
入し、バルブ73bから排気管74bを通って除外処理
部10に流し込む。この場合、例え切り換えバルブ30
b、バルブ31b、バルブ32b、バルブ33b、バル
ブ34bがリークを起こしても、リークしたガスは不活
性パージガスとともに除去されるので、反応炉4bの解
体作業を安全に行うことができる。なお、この不活性ガ
スパージは反応系9aの気相成長のさまたげにはならな
い。
In order to disassemble the reactor 4b and replace the filter of the trap 16b, first, the operator enters the cabinet of the reaction system 9b and moves between the valve 31b and the reactor 4b, and between the valve 32b and the trap 16b. Remove the plumbing between. Therefore, the source gas flowing through the source supply line 13 is stopped by the switching valve 30b and the valve 31b. Exhaust gas from the reaction system 9a flowing through the exhaust line 19 is stopped by valves 32b, 33b, and 34b. During operations such as disassembly, replacement, and assembly, an inert purge gas is introduced from the inert purge gas introduction pipe 61b through the valve 62b through the valve 62b between the switching valve 30b and the valve 31b, and is removed from the valve 63b through the exhaust pipe 64b. Pour into Further, an inert purge gas is also introduced between the valve 32b, the valve 33b, and the valve 34b from the inert gas purge line 71b through the valve 72b, and flows into the exclusion processing unit 10 from the valve 73b through the exhaust pipe 74b. In this case, for example, the switching valve 30
Even if the valve b, the valve 31b, the valve 32b, the valve 33b, and the valve 34b leak, the leaked gas is removed together with the inert purge gas, so that the disassembling operation of the reaction furnace 4b can be performed safely. The inert gas purge does not hinder the vapor phase growth of the reaction system 9a.

【0014】(実施形態2)図2は他の実施形態の説明
図である。本実施形態は、原料ガス供給接続管17a、
17b、排気ガス排気接続管18a、18bの接続構造
が異なる以外は、前記実施形態と同一である。本実施形
態では、原料ガス供給接続管17aにはバルブ30a、
31a間に真空引き管81aが接続している。また、排
気ガス排気接続管18aにはバルブ32a、34a間に
真空引き管91aが接続している。真空引き管81a、
91aは他の配管と接続せず、真空ポンプ88に接続
し、さらに除害処理部10に接続している。同様に、原
料ガス供給接続管17bにはバルブ30b、31b間に
真空引き管81bが接続している。また、排気ガス排気
接続管18bにはバルブ32b、34b間に真空引き管
91bが接続している。真空引き管81b、91bは他
の配管と接続せず、真空ポンプ88に接続し、さらに除
害処理部10に接続している。
(Embodiment 2) FIG. 2 is an explanatory diagram of another embodiment. In the present embodiment, the source gas supply connection pipe 17a,
This embodiment is the same as the above-described embodiment except that the connection structure of the exhaust gas exhaust connection pipes 18a and 18b is different. In the present embodiment, the source gas supply connection pipe 17a has a valve 30a,
An evacuation tube 81a is connected between 31a. Further, a vacuum exhaust pipe 91a is connected to the exhaust gas exhaust connection pipe 18a between the valves 32a and 34a. Evacuation tube 81a,
91a is connected to the vacuum pump 88 without being connected to other pipes, and further connected to the detoxification processing unit 10. Similarly, an evacuation tube 81b is connected to the source gas supply connection tube 17b between the valves 30b and 31b. Further, a vacuum exhaust pipe 91b is connected to the exhaust gas exhaust connection pipe 18b between the valves 32b and 34b. The vacuum evacuation tubes 81b and 91b are not connected to other pipes, but are connected to a vacuum pump 88 and further to the detoxification processing unit 10.

【0015】本実施形態において、反応炉4aで気相成
長が行われ、反応炉4bで解体作業が行われる場合につ
いて説明する。解体、交換、組み立て作業中は、真空引
き管81bからバルブ82bを通して切り換えバルブ3
0b、バルブ31bの間を真空ポンプ88で引き、その
排気を除害処理部10に流し込む。また、真空引き管9
1bからバルブ92bを通してバルブ32b、バルブ3
3b、バルブ34bの間を真空ポンプ88で引き、その
排気を除害処理部10に流し込む。従って、例え切り換
えバルブ30b、バルブ31b、バルブ32b、バルブ
33bおよびバルブ34bがリークを起こしても、リー
クしたガスは真空引きにより除去されるので、反応炉4
bの解体作業を安全に行うことができる。なお、この真
空引きは反応系9aの気相成長のさまたげにはならな
い。なお、上記実施形態は本発明を具体化した一例であ
って、本願発明の技術的範囲を限定するものではない。
In this embodiment, a case will be described in which vapor phase growth is performed in the reactor 4a and dismantling is performed in the reactor 4b. During disassembly, replacement and assembly work, the valve 3 is switched from the vacuum pipe 81b to the valve 82b.
0b, the space between the valve 31b and the vacuum pump 88 is drawn, and the exhaust gas is flown into the detoxification processing unit 10. In addition, the evacuation tube 9
1b through valve 92b, valve 32b, valve 3
3b, the space between the valve 34b and the vacuum pump 88 is pulled, and the exhaust gas is flowed into the detoxification processing unit 10. Therefore, even if the switching valve 30b, the valve 31b, the valve 32b, the valve 33b, and the valve 34b leak, the leaked gas is removed by evacuation.
The dismantling work of b can be performed safely. This evacuation does not hinder the vapor phase growth of the reaction system 9a. The above embodiment is an example embodying the present invention, and does not limit the technical scope of the present invention.

【0016】[0016]

【発明の効果】本発明によれば、複数の反応炉のうちの
少なくとも一つの反応炉が気相成長中でも、他の反応炉
の解体作業などを安全に行えることができ、生産性が向
上するという優れた効果がある。
According to the present invention, while at least one of a plurality of reactors is in vapor phase growth, dismantling work of other reactors can be performed safely, and productivity is improved. There is an excellent effect.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の気相成長装置の一実施形態の説明図で
ある。
FIG. 1 is an explanatory diagram of one embodiment of a vapor phase growth apparatus of the present invention.

【図2】本発明の他の実施形態の説明図である。FIG. 2 is an explanatory diagram of another embodiment of the present invention.

【図3】気相成長装置の説明図である。FIG. 3 is an explanatory view of a vapor phase growth apparatus.

【図4】他の気相成長装置の説明図である。FIG. 4 is an explanatory diagram of another vapor phase growth apparatus.

【符号の説明】[Explanation of symbols]

1a、1b、1c、1d 原料ガス供給源 1h、1i、1j、1k バルブ 2 キャリアガス供
給源 3 パージガス供給
源 4a、4b 反応炉 5 ガス供給系 6 基板 7 サセプタ 8a、8b 予備室 9a、9b 反応系 10 除害処理部 11 排気ポンプ 12 排気ガス処理
系 13 原料ガス供給
ライン 14a、14b キャリアガス
パージライン 15 ベントライン 16a、16b トラップ 17a、17b 原料ガス供給
接続管 18a、18b、21a、21b 排気ガス排気
接続管 19 排気ライン 20a、20b 原料導入ライ
ン 30a〜34a、30b〜34b バルブ 62a、63a、62b、63b バルブ 72a、73a、72b、73b バルブ 82a、82b バルブ 92a、92b バルブ 61a、61b パージガス導
入管 64a、64b、74a、74b 排気管 71a、71b パージライン 81a、81b、91a、91b 真空引き管 88 真空ポンプ
1a, 1b, 1c, 1d Source gas supply source 1h, 1i, 1j, 1k Valve 2 Carrier gas supply source 3 Purge gas supply source 4a, 4b Reactor 5 Gas supply system 6 Substrate 7 Susceptor 8a, 8b Preparatory chamber 9a, 9b Reaction System 10 Detoxification unit 11 Exhaust pump 12 Exhaust gas treatment system 13 Source gas supply line 14a, 14b Carrier gas purge line 15 Vent line 16a, 16b Trap 17a, 17b Source gas supply connection pipe 18a, 18b, 21a, 21b Exhaust gas exhaust Connection pipe 19 Exhaust line 20a, 20b Raw material introduction line 30a-34a, 30b-34b Valve 62a, 63a, 62b, 63b Valve 72a, 73a, 72b, 73b Valve 82a, 82b Valve 92a, 92b Valve 61a, 61b Purge gas introduction pipe 64a , 4b, 74a, 74b exhaust pipe 71a, 71b purge line 81a, 81b, 91a, 91b evacuated tube 88 a vacuum pump

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 原料ガス供給系と、複数の反応系と、排
気ガス処理系を有し、前記原料ガス供給系および排気ガ
ス処理系は前記複数の反応系に接続切替え可能である気
相成長装置であって、原料ガス供給系と反応系は、直列
に配置された2段のバルブを有する原料ガス供給接続管
で接続され、また、反応系と排気ガス処理系は、直列に
配置された2段のバルブを有する排気ガス排気接続管で
接続され、前記各接続管の2段のバルブ間には、パージ
ガスを導入するパージガス導入管および排気する独立し
た排気管が接続していることを特徴とする気相成長装
置。
1. A gas phase growth system comprising a source gas supply system, a plurality of reaction systems, and an exhaust gas treatment system, wherein the source gas supply system and the exhaust gas treatment system can be connected to the plurality of reaction systems. In the apparatus, the source gas supply system and the reaction system are connected by a source gas supply connection pipe having two-stage valves arranged in series, and the reaction system and the exhaust gas treatment system are arranged in series. An exhaust gas exhaust connection pipe having two-stage valves is connected, and a purge gas introduction pipe for introducing a purge gas and an independent exhaust pipe for exhausting are connected between the two-stage valves of each of the connection pipes. Vapor growth apparatus.
【請求項2】 原料ガス供給系と、複数の反応系と、排
気ガス処理系を有し、前記原料ガス供給系および排気ガ
ス処理系は前記複数の反応系に接続切替え可能である気
相成長装置であって、原料ガス供給系と反応系は、直列
に配置された2段のバルブを有する原料ガス供給接続管
で接続され、また、反応系と排気ガス処理系は、直列に
配置された2段のバルブを有する排気ガス排気接続管で
接続され、前記各接続管の2段のバルブ間には、真空引
きする真空引き管が接続していることを特徴とする気相
成長装置。
2. A gas phase growth system comprising a source gas supply system, a plurality of reaction systems, and an exhaust gas processing system, wherein the source gas supply system and the exhaust gas processing system are switchable to the plurality of reaction systems. In the apparatus, the source gas supply system and the reaction system are connected by a source gas supply connection pipe having two-stage valves arranged in series, and the reaction system and the exhaust gas treatment system are arranged in series. A vapor-phase growth apparatus characterized in that it is connected by an exhaust gas exhaust connection pipe having a two-stage valve, and between the two-stage valves of each of the connection pipes, a vacuum tube is connected to evacuate.
JP1604197A 1997-01-30 1997-01-30 Vapor growth device Pending JPH10214788A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1604197A JPH10214788A (en) 1997-01-30 1997-01-30 Vapor growth device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1604197A JPH10214788A (en) 1997-01-30 1997-01-30 Vapor growth device

Publications (1)

Publication Number Publication Date
JPH10214788A true JPH10214788A (en) 1998-08-11

Family

ID=11905500

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1604197A Pending JPH10214788A (en) 1997-01-30 1997-01-30 Vapor growth device

Country Status (1)

Country Link
JP (1) JPH10214788A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007150138A (en) * 2005-11-30 2007-06-14 Shin Etsu Handotai Co Ltd Vapor phase epitaxial growth system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007150138A (en) * 2005-11-30 2007-06-14 Shin Etsu Handotai Co Ltd Vapor phase epitaxial growth system

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