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JPH10134695A - Chip fuse and its manufacture - Google Patents

Chip fuse and its manufacture

Info

Publication number
JPH10134695A
JPH10134695A JP28874396A JP28874396A JPH10134695A JP H10134695 A JPH10134695 A JP H10134695A JP 28874396 A JP28874396 A JP 28874396A JP 28874396 A JP28874396 A JP 28874396A JP H10134695 A JPH10134695 A JP H10134695A
Authority
JP
Japan
Prior art keywords
fuse element
substrate
electrode pads
insulating substrate
fuse
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP28874396A
Other languages
Japanese (ja)
Inventor
Mutsuaki Hirota
睦明 廣田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP28874396A priority Critical patent/JPH10134695A/en
Publication of JPH10134695A publication Critical patent/JPH10134695A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01HELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H85/00Protective devices in which the current flows through a part of fusible material and this current is interrupted by displacement of the fusible material when this current becomes excessive
    • H01H85/02Details
    • H01H85/04Fuses, i.e. expendable parts of the protective device, e.g. cartridges
    • H01H85/041Fuses, i.e. expendable parts of the protective device, e.g. cartridges characterised by the type
    • H01H85/0411Miniature fuses
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01HELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H85/00Protective devices in which the current flows through a part of fusible material and this current is interrupted by displacement of the fusible material when this current becomes excessive
    • H01H85/02Details
    • H01H85/04Fuses, i.e. expendable parts of the protective device, e.g. cartridges
    • H01H85/041Fuses, i.e. expendable parts of the protective device, e.g. cartridges characterised by the type
    • H01H85/0411Miniature fuses
    • H01H2085/0414Surface mounted fuses

Landscapes

  • Fuses (AREA)

Abstract

PROBLEM TO BE SOLVED: To stabilize the insulating property after fusion, miniaturize a fuse, and improve mass productivity by sealing a fuse element made of a soluble fine wire conductor, suspended between two electrode pads on an insulating substrate, and having a space around it with a resin. SOLUTION: Conductive members are filled in recesses penetrated in the thickness direction on both long side faces of a heat-resistant insulating substrate 2 made of an alumina ceramic or the like to form terminal electrodes 4a, 4b, and they are suitable for surface packaging. Two electrode pads 3a, 3b are formed in both width directions on the surface of the substrate 2, and they are connected to the terminal electrodes 4a, 4b. The terminal electrodes 4a, 4b and the electrode pads 3a, 3b are formed by the baking of a silver paste. A fuse element 5 made of a fusible conductor fine wire of aluminum having the prescribed size is suspended astride the electrode pads 3a, 3b. A fusion space 6 is formed around the fuse element 5, and it is covered with a seal body 7 such as a thermosetting porous resin. The fused fuse element 5 is scattered in the space 6 for complete insulation, and it is unnecessary to connect two substrates 2 with the seal body 7.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明が属する技術分野】本発明は、表面実装型に適し
たチップヒューズ及びその製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a chip fuse suitable for a surface mount type and a method of manufacturing the same.

【0002】[0002]

【従来の技術】チップヒューズは、各種電子回路の異常
電流に対する保護素子として広汎に使用されている。
2. Description of the Related Art Chip fuses are widely used as protection elements against abnormal currents in various electronic circuits.

【0003】一般にチップヒューズは、ヒューズ素子が
導体の細線または導体膜から成り、いずれの場合にで
も、溶断させたい異常電流、ヒューズ素子を構成する導
体材料の融点を考慮して、ヒューズ素子の導体部分が所
定抵抗となるように設定されていた。即ち、ヒューズ素
子に異常電流が通電されると、ヒューズ素子がジュール
熱によって発熱し、その熱によって、ヒューズ素子自身
の導体材料を溶断するものである。
In general, in a chip fuse, a fuse element is formed of a thin conductor wire or a conductive film, and in any case, the conductor of the fuse element is considered in consideration of an abnormal current to be blown and a melting point of a conductive material constituting the fuse element. The portion was set to have a predetermined resistance. That is, when an abnormal current is applied to the fuse element, the fuse element generates heat due to Joule heat, and the heat melts the conductor material of the fuse element itself.

【0004】このようなヒューズにおいて、異常電流に
対して定格時間で溶断され、しかも、溶断した後に高い
絶縁性を維持して、スパークなどの発生を防止すること
が重要である。例えば、ヒューズ素子の構造を所定金属
の導体膜を用いる場合には、導体膜の融点よりも低い融
点のガラス材料で被覆する必要がある。また、ヒューズ
素子に細線を用いた場合、細線の周囲に充分な空間を形
成する必要がある。
[0004] In such a fuse, it is important to blow out an abnormal current for a rated time, maintain high insulation properties after blowing, and prevent the occurrence of sparks and the like. For example, when using a conductor film of a predetermined metal for the structure of the fuse element, it is necessary to cover the fuse element with a glass material having a melting point lower than the melting point of the conductor film. When a thin wire is used for the fuse element, it is necessary to form a sufficient space around the thin wire.

【0005】近時、チップヒューズは、他の電子部品と
ともに、一括的に半田リフロー方法によって、所定プリ
ント配線基板に実装できるように、表面実装に対応した
構造のチップヒューズが求められている。
Recently, there has been a demand for a chip fuse having a structure corresponding to surface mounting so that it can be mounted on a predetermined printed wiring board by a solder reflow method together with other electronic components.

【0006】このような表面実装型のチップヒューズの
構造は、ヒューズ素子に導体薄膜を用いる場合には、従
来のチップ抵抗器に近似した構造となり、また、ヒュー
ズ素子に細線を用いた場合、2分割できる2つの基板の
接合表面の中央に凹部を形成しておき、細線を2つの基
板で挟持して接合した後、細線の両端に接続する2つの
基板の端部に端子電極を形成していた。
[0006] The structure of such a surface mount type chip fuse is similar to a conventional chip resistor when a conductor thin film is used for a fuse element, and 2 mm when a thin wire is used for a fuse element. A concave portion is formed at the center of the joining surface of the two substrates that can be divided, and a thin wire is sandwiched between the two substrates and joined, and then terminal electrodes are formed at the ends of the two substrates connected to both ends of the thin wire. Was.

【0007】[0007]

【発明が解決しようとする課題】後者のヒューズ素子に
細線を用いた表面実装型のチップヒューズは、溶断後の
絶縁特性の維持から、凹部によって形成される細線周囲
の空間を充分に大きくしなくてはならず、同時に、外観
形状を小型化し、しかも低コスト化することが求められ
ている。
The surface mount type chip fuse using a fine wire for the fuse element does not make the space around the fine wire formed by the concave portion sufficiently large in order to maintain the insulation characteristics after fusing. At the same time, there is a demand for a smaller external shape and lower cost.

【0008】しかしながら、従来の2つの基板を用いて
接合する構造では、2つの基板で細線を挟持する際、そ
の位置決めによっては、細線周囲の空間の中心部分に細
線が位置せずに、溶断飛散した導体材料と細線の残存分
との間に充分に間隔が維持できず、スパークなどの絶縁
破壊が発生することがある。
However, in the conventional structure in which two substrates are joined to each other, when a thin line is sandwiched between two substrates, the thin line is not positioned at the center of the space around the thin line depending on the positioning, and the melt is scattered. Insufficient spacing can be maintained between the conductive material and the remaining portion of the fine wire, and dielectric breakdown such as sparks may occur.

【0009】また、2つの基板で細線を挟持することに
なるため、小型化が困難となってしまう。
In addition, since a thin wire is sandwiched between two substrates, it is difficult to reduce the size.

【0010】さらに、部品点数が多く、また、製造が非
常に煩雑となり、量産性に適さず、その結果、低コスト
が達成できなかった。
Furthermore, the number of parts is large, and the production becomes very complicated, which is not suitable for mass production. As a result, low cost cannot be achieved.

【0011】本発明は上述の問題点に鑑みて案出された
ものであり、その目的は、ヒューズ素子の周囲を空間を
確実に形成でき、溶断後の絶縁特性が安定し、小型化が
可能で、量産性に優れた表面実装対応のチップヒューズ
及びその製造方法を提供するものである。
The present invention has been devised in view of the above-mentioned problems, and has as its object the purpose of being able to reliably form a space around a fuse element, to stabilize insulation characteristics after fusing, and to reduce the size. Accordingly, it is an object of the present invention to provide a surface mounting chip fuse excellent in mass productivity and a method of manufacturing the chip fuse.

【0012】[0012]

【課題を解決するための手段】第1の発明は、ヒューズ
素子に可溶導体細線を用いたチップヒューズであり、絶
縁基板の表面に形成した2つの電極パッドと、該電極パ
ッドに接続し、側面の厚み方向に延びる凹部内に形成し
た端子電極とを有する絶縁基板と、前記2つの電極パッ
ド間に架設され、可溶細線導体から成るヒューズ素子
と、前記ヒューズ素子の周囲に空間を設けて、絶縁基板
表面に形成された樹脂封止体とから成るものである。
According to a first aspect of the present invention, there is provided a chip fuse using a fusible conductor thin wire for a fuse element. The chip fuse includes two electrode pads formed on a surface of an insulating substrate, and is connected to the electrode pads. An insulating substrate having a terminal electrode formed in a concave portion extending in a thickness direction of a side surface, a fuse element bridged between the two electrode pads and formed of a fusible thin wire conductor, and a space provided around the fuse element. And a resin sealing body formed on the surface of the insulating substrate.

【0013】また、第2の発明は、第1の発明のチップ
ヒューズ素子の製造方法であり、複数の絶縁基板領域を
有し、各絶縁基板領域内の表面に2つの電極パッドと、
隣接する絶縁縁基板領域に跨がって形成された貫通孔に
導電性部材を充填して形成され、且つ該電極パッドに接
続しているビアホール導体とを有する大型絶縁基板を用
意する工程と、前記各絶縁基板領域の電極パッド間に、
可溶細線導体から成るヒューズ素子をボンディング接続
によって架設する工程と、前記ヒューズ素子をワックス
で被覆する工程と、前記大型絶縁基板上に、前記ワック
スで被覆されたヒューズ素子を覆うように熱硬化性多孔
質樹脂を塗布する工程と、前記熱硬化多孔質樹脂を加熱
硬化させるとともに、前記ワックスを熱硬化性多孔質樹
脂内に吸収させてヒューズ素子の周囲に空間を形成する
工程と、前記大型絶縁基板及び前記ワックスを吸収し、
硬化した樹脂を切断し、個々のチップヒューズ素子に分
割する工程とから成る。
Further, a second invention is a method of manufacturing a chip fuse element according to the first invention, which has a plurality of insulating substrate regions, and has two electrode pads on a surface in each of the insulating substrate regions.
A step of preparing a large-sized insulating substrate having a via-hole conductor formed by filling a conductive member into a through-hole formed over an adjacent insulating edge substrate region and having a via-hole conductor connected to the electrode pad; Between the electrode pads of each of the insulating substrate regions,
A step of bridging a fuse element made of a fusible wire conductor by bonding connection, a step of coating the fuse element with wax, and a step of forming a thermosetting resin on the large-sized insulating substrate so as to cover the fuse element coated with wax. A step of applying a porous resin; a step of heating and curing the thermosetting porous resin; and a step of absorbing the wax into the thermosetting porous resin to form a space around a fuse element; Absorb the substrate and the wax,
Cutting the cured resin and dividing it into individual chip fuse elements.

【0014】[0014]

【作用】第1の発明のチップヒューズは、絶縁基板の側
面に端子電極が形成されているため、表面実装に非常に
適した構造である。
The chip fuse according to the first invention has a structure very suitable for surface mounting since terminal electrodes are formed on the side surfaces of the insulating substrate.

【0015】また、基板の表面に、この端子電極と接続
する電極パッドが形成されており、電極パッド間には、
可溶導体細線からなるヒューズ素子が直接架設され、し
かも、この周囲に溶断空間が形成されている。従って、
可溶導体細線からヒューズ素子が溶断すると、ヒューズ
素子が溶断空間内に飛び散り、完全な絶縁特性が得られ
ることになる。
An electrode pad connected to the terminal electrode is formed on the surface of the substrate.
A fuse element composed of a fusible conductor thin wire is directly provided, and a fusing space is formed around the fuse element. Therefore,
When the fuse element is blown from the fusible conductive wire, the fuse element scatters in the blown space, and complete insulation characteristics are obtained.

【0016】さらに、樹脂封止体は、絶縁基板上に樹脂
の塗布、硬化で形成されるため、従来のように2つの基
板を接合する必要がないため、小型化が可能で、非常に
生産性が向上することになる。
Furthermore, since the resin sealing body is formed by applying and curing a resin on an insulating substrate, there is no need to join two substrates as in the conventional case, so that miniaturization is possible and very production is possible. Performance will be improved.

【0017】従って、溶断後の絶縁特性が安定し、小型
化が可能で、量産性に優れた表面実装対応のチップヒュ
ーズとなる。
Accordingly, a chip fuse for surface mounting which has stable insulation characteristics after fusing, can be miniaturized, and has excellent mass productivity.

【0018】第2の発明は、第1の発明(チップヒュー
ズ)を達成するための製造方法であり、特に、複数の絶
縁基板が抽出される大型基板をベースに製造することが
できるため、生産性が非常に優れたものとなる。
The second invention is a manufacturing method for achieving the first invention (chip fuse). In particular, since it can be manufactured based on a large substrate from which a plurality of insulating substrates are extracted, the production method The properties are very good.

【0019】また、端子電極は、大型基板の状態で形成
されており、最終工程で切断することにより、絶縁基板
の側面に現れることになる。従って、基板の側面に現れ
る端子電極が樹脂などによって汚されることがないた
め、表面実装の信頼性が非常に向上する。
Further, the terminal electrodes are formed in a state of a large-sized substrate, and appear on the side surface of the insulating substrate by being cut in the final step. Therefore, since the terminal electrodes appearing on the side surfaces of the substrate are not contaminated by the resin or the like, the reliability of surface mounting is greatly improved.

【0020】また、可溶導体細線であるヒューズ素子
は、基板表面の電極パッドをボンディングによって架設
されるため、安定した構造で、簡単に形成することがで
きる。
Further, the fuse element, which is a fusible conductor thin wire, has a stable structure and can be easily formed because the electrode pad on the substrate surface is erected by bonding.

【0021】さらに、ヒューズ素子の周囲の溶断空間
は、ワックスを塗布しておき、樹脂封止体の熱硬化時
に、樹脂封止体に吸収されるため、簡単かつ確実に溶断
空間を形成することができる。
Furthermore, since the fusing space around the fuse element is coated with wax and absorbed by the resin sealing body during thermosetting of the resin sealing body, the fusing space can be easily and reliably formed. Can be.

【0022】さらに、樹脂封止体は、大型基板上に一括
的に塗布し、熱硬化させることができるため、非常に生
産性に優れ、且つ簡単に形成することができる。
Further, since the resin sealing body can be applied on a large-sized substrate at a time and cured by heat, it can be formed with very high productivity and easily.

【0023】以上のように、本発明の製造方法では、溶
断後の絶縁特性が安定し、小型化が可能で、低コストの
表面実装対応したチップヒューズの製造方法となる。
As described above, according to the manufacturing method of the present invention, a method for manufacturing a chip fuse which has stable insulation characteristics after fusing, can be miniaturized, and is compatible with surface mounting at low cost.

【0024】[0024]

【発明の実施の形態】以下、本発明のチップヒューズ及
びその製造方法を図面に基づいて説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a chip fuse and a method of manufacturing the same according to the present invention will be described with reference to the drawings.

【0025】図1は、本発明のチップヒューズの縦断面
図である。図2は樹脂封止体を省略した状態の平面図で
ある。
FIG. 1 is a longitudinal sectional view of the chip fuse of the present invention. FIG. 2 is a plan view in a state where the resin sealing body is omitted.

【0026】図1、図2のチップヒューズ1において、
2は例えばアルミナセラミック基板などの耐熱性の絶縁
基板であり、3a、3bは基板2の上面の電極パッド、
4a、4bは端子電極、5は可溶導体細線からなるヒュ
ーズ素子、6は溶断空間、7は樹脂封止体である。尚、
基板2の裏面には、端子電極4a、4bと接続する下面
端子電極8a、8bを形成してもよい。
In the chip fuse 1 shown in FIGS. 1 and 2,
Reference numeral 2 denotes a heat-resistant insulating substrate such as an alumina ceramic substrate, and reference numerals 3a and 3b denote electrode pads on the upper surface of the substrate 2,
4a and 4b are terminal electrodes, 5 is a fuse element made of a fusible conductive wire, 6 is a fusing space, and 7 is a resin sealing body. still,
On the back surface of the substrate 2, lower surface terminal electrodes 8a, 8b connected to the terminal electrodes 4a, 4b may be formed.

【0027】絶縁基板2は、基板2の長辺側の両側面に
は基板2の厚み方向を貫く凹部41が形成され、この凹
部41内に導電性部材が充填された端子電極4a、4b
が形成されている。また、基板1の表面には、端子電極
4a、4bと接続する2つの電極パッド3a、3bが形
成されている。
The insulating substrate 2 has concave portions 41 formed on both sides of the long side of the substrate 2 in the thickness direction of the substrate 2, and terminal electrodes 4 a, 4 b filled with a conductive material in the concave portions 41.
Are formed. On the surface of the substrate 1, two electrode pads 3a, 3b connected to the terminal electrodes 4a, 4b are formed.

【0028】2つの電極パッド3a、3bは、例えば、
基板2の幅方向の両方向に広がるように形成されて、端
子電極4a、4bに接続している。尚、基板2には4つ
の端子が形成されているが、同一機能を有する端子電極
を同一符号を付している。また、端子数は、少なくとも
2端子あればよく、この場合に、基板2の長手方向の側
面に形成してもよい。
The two electrode pads 3a and 3b are, for example,
It is formed so as to spread in both directions in the width direction of the substrate 2 and is connected to the terminal electrodes 4a and 4b. Although four terminals are formed on the substrate 2, terminal electrodes having the same function are denoted by the same reference numerals. The number of terminals may be at least two, and in this case, the terminals may be formed on the side surface in the longitudinal direction of the substrate 2.

【0029】電極パッド3a、3b、端子電極4a、4
bは、銀(Ag)等の導電性ペーストを焼きつけて形成
されている。この端子電極4a、4bの表面は、基板2
の側面と同一面を成している。例えば凹部41の形状が
大きい場合には、その内壁面にAgなどの導体膜を付着
して、さらに半田などの導電部材で充填してもよい。
The electrode pads 3a, 3b, the terminal electrodes 4a, 4
b is formed by baking a conductive paste such as silver (Ag). The surfaces of the terminal electrodes 4a and 4b are
Is the same as the side surface. For example, when the shape of the concave portion 41 is large, a conductive film such as Ag may be attached to the inner wall surface, and may be further filled with a conductive member such as solder.

【0030】可溶導体細線からなるヒューズ素子5は、
アルミニウム等の細線からなり、その太さは、例えば1
0μmであり、電流容量に応じて選択されるものであ
り、2つの電極パッド3a、3b上に跨がるように架設
されている。具体的には、ワイヤボンディング方法を用
いて架設される。また、細線となるヒューズ素子5を2
つの電極パッド3a、3b間に、複数架設しても構わな
い。
The fuse element 5 composed of a fusible conductive wire is
It is made of a thin wire such as aluminum and has a thickness of, for example, 1
0 μm, which is selected according to the current capacity, and is provided so as to extend over the two electrode pads 3a and 3b. Specifically, it is installed using a wire bonding method. Further, the fuse element 5 which is a thin wire is 2
More than one electrode pad 3a, 3b may be provided.

【0031】このような可溶導体細線からなるヒューズ
素子5の周囲には、溶断空間6が形成されて、樹脂封止
体7で被覆されている。溶断空間6は、可溶導体細線か
らなるヒューズ素子5が発熱・溶断した際、この細線が
飛び散る領域を確保するものである。この溶断空間6
は、ヒューズ素子5の周囲にワックスを塗布し、製造工
程中で樹脂封止体7内に吸収させて形成する。
A fusing space 6 is formed around the fuse element 5 composed of such a fusible conductor, and is covered with a resin sealing body 7. The fusing space 6 secures an area where the thin wire scatters when the fuse element 5 made of the fusible conductive wire is heated and blown. This fusing space 6
Is formed by applying wax around the fuse element 5 and absorbing it in the resin sealing body 7 during the manufacturing process.

【0032】樹脂封止体7は、フェノール系樹脂などの
熱硬化性樹脂をベースに、多孔質となるようにアルミナ
セラミックの粉末が添加されている。これによって、樹
脂封止体7は熱硬化性の多孔質の樹脂体となる。
The resin sealing body 7 is based on a thermosetting resin such as a phenolic resin, and has alumina ceramic powder added thereto so as to be porous. Thereby, the resin sealing body 7 becomes a thermosetting porous resin body.

【0033】樹脂封止体7は、後述の製造方法でも詳細
に説明するが、基板2になるように分割して抽出できる
大型基板上に、一括的に塗布し、熱硬化するため、溶断
空間6を除く基板2の表面に、即ち基板2の表面に現れ
る端子電極4a、4bの表面側露出部にも一体的に付着
する。
The resin sealing body 7 will be described in detail in a later-described manufacturing method. However, since the resin sealing body 7 is applied collectively on a large substrate which can be divided and extracted so as to become the substrate 2 and is thermally cured, a fusing space is provided. 6 are adhered integrally to the surface of the substrate 2 except for the surface electrodes of the terminal electrodes 4a and 4b which appear on the surface of the substrate 2.

【0034】以上のような構造のチップヒューズ1は、
可溶導体細線からなるヒューズ素子5を、溶断空間6を
有する樹脂封止体7で被覆しているので、ヒューズ素子
5が発熱溶断し、細線が飛び散った後でも、安定した絶
縁特性が維持できる。しかも、ヒューズ素子5と溶断空
間6との関係において、溶断空間6の略中央にヒューズ
素子5の周囲を有する樹脂封止体7で被覆しているの
で、ヒューズ素子5が発熱溶断(素子5の飛散)した場
合、飛散物が飛び散る領域を確保するものである。
The chip fuse 1 having the above structure is
Since the fuse element 5 composed of the fusible conductor thin wire is covered with the resin sealing body 7 having the fusing space 6, stable insulation characteristics can be maintained even after the fuse element 5 is melted by heat and the thin wire scatters. . In addition, in the relationship between the fuse element 5 and the fusing space 6, since the resin sealing body 7 having the periphery of the fusing element 5 covers almost the center of the fusing space 6, the fusing element 5 is thermally blown (the fusing of the element 5). In the case of scattering, a region where the flying object scatters is secured.

【0035】また、端子電極4a、4bが基板2の側面
から良好に露出し、且つ該側面と同一面を成しているた
め、プリント配線基板上にチップヒューズ1を表面実装
する際、安定して実装することができる。
Further, since the terminal electrodes 4a and 4b are well exposed from the side surfaces of the substrate 2 and are flush with the side surfaces, the chip fuses 1 can be stably mounted on the printed wiring board. Can be implemented.

【0036】しかも、可溶導体細線からなるヒューズ素
子を挟持して、2つの基板を接合した構造ではなく、基
板2上に樹脂の塗布、硬化によって直接形成される樹脂
封止体7を用いているため、組立に要する部品点数が少
なくて済み、また、樹脂封止体7の形状を可溶導体細線
からなるヒューズ素子5及び溶断空間6を含めた形状に
まで近似させることができるため、非常に小型化するこ
とができる。
In addition, instead of using a structure in which a fuse element formed of a thin line of a fusible conductor is sandwiched and two substrates are joined, a resin sealing body 7 formed directly by applying and curing a resin on the substrate 2 is used. Therefore, the number of components required for assembly is small, and the shape of the resin sealing body 7 can be approximated to the shape including the fuse element 5 made of a fusible conductor fine wire and the fusing space 6. Can be downsized.

【0037】尚、基板2の下面には、プリント配線基板
への表面実装信頼性を向上させるために、端子電極4
a、4bと接続する下面端子電極8a、8bを形成して
もよい。また、基板2の側面の凹部41の形状を、平面
視概略半円形状に限ることはなく、半長円形、矩形状な
どであっても構わない。端子電極4a、4bで重要なこ
とは、凹部41内に導電性部材が充填配置されており、
端子電極4a、4bの表面が基板2の側面と同一面を形
成していることである。
In order to improve the reliability of surface mounting on the printed wiring board, the terminal electrodes 4
The lower surface terminal electrodes 8a and 8b connected to a and 4b may be formed. Further, the shape of the concave portion 41 on the side surface of the substrate 2 is not limited to a substantially semicircular shape in plan view, and may be a semi-elliptical shape, a rectangular shape, or the like. What is important in the terminal electrodes 4a and 4b is that the conductive member is filled and arranged in the concave portion 41,
The surface of the terminal electrodes 4a and 4b forms the same plane as the side surface of the substrate 2.

【0038】次に、本発明のチップヒューズの製造方法
を説明する。
Next, a method for manufacturing the chip fuse of the present invention will be described.

【0039】本発明のチップヒューズの製造方法は、図
3に示すような大型基板をベースに用いる。
The method for manufacturing a chip fuse of the present invention uses a large substrate as shown in FIG. 3 as a base.

【0040】図3において100は大型基板であり、大
型基板100には、複数の絶縁基板2・・・が抽出され
るように形成されている。尚、図において、点線部分
は、最終的に分割又は切断される部分を示すとともに、
各チップヒューズの領域(素子領域)を区画するもので
ある。
In FIG. 3, reference numeral 100 denotes a large-sized substrate. The large-sized substrate 100 is formed so as to extract a plurality of insulating substrates 2. In addition, in the figure, while the dotted line part shows the part which is finally divided or cut,
The area (element area) of each chip fuse is partitioned.

【0041】大型基板100は、例えば、各領域の境界
部分に凹部41となる貫通孔を形成したアルミナなどの
セラミック基板であり、この該貫通孔にAgなどの導電
性ペーストを印刷・焼きつけして成るビアホール導体4
0が形成されている。同時に、各領域内に電極パッド3
a、3b、必要に応じて下面電極8a、8bを印刷し、
焼付けして形成される。尚、このような大型基板100
の部分断面図を図4(a)に示す。ここで、ビアホール
導体40とは、Agなどの導電性部材が基板100の上
面側に形成した電極パッド3a、3bと基板100の下
面側の下面電極8a、8bとを接続するように、貫通孔
に充填されている状態をいう。尚、また、端子電極4
a、4bの基板2の側面において比較的広い露出面積と
するために、貫通孔の開口径を大きくすることが有利で
あり、例えば1.0mm×2.0mm程度の長円形状な
どとすることがある。この場合、導体部材は、貫通孔の
内壁面にしか形成することができないが、さらに、貫通
孔の空洞部分に半田などの導電性部材を充填する。これ
により、大型基板100において、貫通孔が完全に閉塞
されたビアホール導体40となる。
The large-sized substrate 100 is, for example, a ceramic substrate made of alumina or the like having a through-hole serving as a concave portion 41 at a boundary portion of each region. A conductive paste such as Ag is printed and baked in the through-hole. Via hole conductor 4
0 is formed. At the same time, electrode pads 3
a, 3b, if necessary, the lower surface electrodes 8a, 8b are printed,
It is formed by baking. In addition, such a large substrate 100
FIG. 4A is a partial cross-sectional view of FIG. Here, the via-hole conductor 40 is a through-hole such that a conductive member such as Ag connects the electrode pads 3 a and 3 b formed on the upper surface of the substrate 100 to the lower electrodes 8 a and 8 b on the lower surface of the substrate 100. Refers to the state of being filled in. In addition, the terminal electrode 4
In order to obtain a relatively large exposed area on the side surfaces of the substrate 2a and 4b, it is advantageous to increase the opening diameter of the through hole. There is. In this case, the conductor member can be formed only on the inner wall surface of the through-hole, and further, the hollow portion of the through-hole is filled with a conductive member such as solder. As a result, the via-hole conductor 40 in the large-sized substrate 100 has the through-hole completely closed.

【0042】尚、大型基板100の各素子領域に、電極
パッド3a、3bの形成と同時に、コンデンサや抵抗な
どの他の回路素子を搭載するため電極を形成し、続い
て、厚膜手法によってコンデンサ、抵抗を形成してもよ
い。
In addition, simultaneously with the formation of the electrode pads 3a and 3b, electrodes for mounting other circuit elements such as capacitors and resistors are formed in each element region of the large-sized substrate 100, and then the capacitor is formed by a thick film method. , A resistor may be formed.

【0043】次に、図4(b)に示すように、大型基板
100の各領域の電極パッド3a、3b間に可溶導体細
線からなるヒューズ素子5を配置・接合する。具体的に
は、可溶導体細線からなるヒューズ素子5の両端を、各
々対応する電極パッド3a、3bにボンディング接合を
行う。
Next, as shown in FIG. 4B, a fuse element 5 composed of a fusible conductive wire is arranged and bonded between the electrode pads 3a and 3b in each area of the large-sized substrate 100. Specifically, both ends of the fuse element 5 made of a fine soluble wire are bonded to the corresponding electrode pads 3a and 3b.

【0044】次に、図4(c)に示すように、大型基板
100の各領域の可溶導体細線からなるヒューズ素子5
上、特に、可溶導体細線からなるヒューズ素子5の少な
くとも溶断部分にワックス61を供給する。具体的に
は、デスペンサーなどを用いてワックス61をヒューズ
素子5である可溶導体細線の周囲に付着するように滴下
・供給する。
Next, as shown in FIG. 4C, the fuse element 5 composed of the fusible conductor thin wire in each region of the large substrate 100 is formed.
The wax 61 is supplied to at least the blown portion of the fuse element 5 made of a fine conductive wire. Specifically, the wax 61 is dropped and supplied using a dispenser or the like such that the wax 61 adheres to the periphery of the fusible conductor thin wire that is the fuse element 5.

【0045】さらに、大型基板100の外周に樹脂溜ま
り用治具(図示せず)を取付け、大型基板100の上面
の各領域に一括的に樹脂封止体7となる樹脂70を充填
する。具体的には、この樹脂70は、少なくともワック
ス61が付着されているヒューズ素子5が完全に埋没さ
せる程度にまで充填する。この樹脂70は、熱硬化性を
有する例えばフエノール系樹脂に、さらに多孔質特性を
もたせるために、アルミナなどの耐熱性無機物フィラー
を添加したものである。
Further, a jig (not shown) for collecting the resin is attached to the outer periphery of the large-sized substrate 100, and the resin 70 which becomes the resin sealing body 7 is collectively filled in each region on the upper surface of the large-sized substrate 100. Specifically, the resin 70 is filled to such an extent that at least the fuse element 5 to which the wax 61 is attached is completely buried. The resin 70 is obtained by adding a heat-resistant inorganic filler such as alumina to a phenolic resin having a thermosetting property, for example, to further impart a porous property.

【0046】次に、図4(d)に示すように、充填した
樹脂70を熱処理、例えば200℃で加熱する。これよ
って、樹脂70は、硬化するとともに、同時に可溶導体
細線からなるヒューズ素子5の周囲に塗布したワックス
61は溶融し、樹脂70の多孔質の微細孔に吸収され
る。その結果、樹脂70が硬化した状態の樹脂71とな
るとともに、可溶導体細線からなるヒューズ素子5の周
囲に溶断空間6が形成されることになる。
Next, as shown in FIG. 4D, the filled resin 70 is heat-treated, for example, heated at 200.degree. As a result, the resin 70 is hardened, and at the same time, the wax 61 applied around the fuse element 5 composed of the fusible conductor thin wire is melted and absorbed by the porous micropores of the resin 70. As a result, the resin 70 becomes the resin 71 in a cured state, and the fusing space 6 is formed around the fuse element 5 formed of the fusible conductor thin wire.

【0047】最後に、図4(e)に示すように、スライ
スやワイヤカットなどによって、大型基板100及び硬
化した樹脂を個々の可溶導体細線からなるヒューズ1の
形状に応じて、切断分離を行う。
Finally, as shown in FIG. 4E, the large substrate 100 and the cured resin are cut and separated by slicing or wire cutting according to the shape of the fuse 1 composed of individual soluble conductor fine wires. Do.

【0048】この時、大型基板100の切断面から、2
分されたビアホール導体40の一方が現れ、基板2の側
面と同一平面を有する端子電極4a、4bが形成される
ことになる。切断後、端子電極4a、4b、下面電極8
a、8bに必要に応じてNiやSnの無電解メッキを一
括的に施してもよい。
At this time, from the cut surface of the large substrate 100, 2
One of the divided via-hole conductors 40 appears, and the terminal electrodes 4a and 4b having the same plane as the side surface of the substrate 2 are formed. After cutting, terminal electrodes 4a, 4b, lower surface electrode 8
Electroless plating of Ni or Sn may be collectively applied to a and 8b as needed.

【0049】上述の製造方法においては、まず、大型基
板100を用いて、チップヒューズ1の構成部材は、2
つの基板で挟持することがなく、しかも、一括的に製造
できるため、非常に生産性に優れたものとなる。
In the above-described manufacturing method, first, using the large substrate 100, the constituent members of the chip fuse 1 are
Since there is no need to hold the substrate between two substrates, and the substrates can be manufactured collectively, the productivity is extremely excellent.

【0050】また、端子電極4a、4bは、平板の大型
基板100においては、貫通孔に導電性部材を完全に充
填した状態であり、端子電極4a、4bは、最終の切断
工程における切断によって現れることになる。従って、
図4(c)のように、樹脂70などを大型基板100の
全体に塗布しても、端子電極4a、4bの表面に全く付
着することが一切ないため、プリント配線基板上に半田
を用いて表面実装する場合、その実装信頼性が飛躍的に
向上するとともに、特に樹脂封止体7の形成が非常に簡
単に行える。
The terminal electrodes 4a and 4b are in a state in which the conductive members are completely filled in the through holes in the large-sized flat substrate 100, and the terminal electrodes 4a and 4b appear by cutting in the final cutting step. Will be. Therefore,
As shown in FIG. 4C, even if the resin 70 or the like is applied to the entire large substrate 100, it does not adhere to the surfaces of the terminal electrodes 4a and 4b at all. In the case of surface mounting, the mounting reliability is dramatically improved, and the formation of the resin sealing body 7 can be particularly easily performed.

【0051】また、ヒューズ素子5を被覆する樹脂封止
体7が、封止樹脂の塗布・硬化、全体の切断によって形
成されるため、従来のように、中央に凹部が形成された
基板を接合封止する必要がなく、しかも、樹脂封止体7
中の溶断空間6や端子電極4a、4bの形成のため、基
板2に余裕寸法をとる必要がなく、チップヒューズ1の
全体形状を非常に小さくすることができる。
Further, since the resin sealing body 7 covering the fuse element 5 is formed by applying and curing the sealing resin and cutting the whole, the substrate having the concave portion formed at the center is joined as in the conventional case. There is no need for sealing, and the resin sealing body 7
Since the inside fusing space 6 and the terminal electrodes 4a and 4b are formed, there is no need to provide a marginal dimension for the substrate 2, and the overall shape of the chip fuse 1 can be made very small.

【0052】[0052]

【発明の効果】以上詳述したように本発明のチップヒュ
ーズによれば、基板の側面に凹部を設けて、その凹部内
に予め端子電極となる導電性部材を充填したため、端子
電極の個別形成が不要となる。
As described above in detail, according to the chip fuse of the present invention, a concave portion is provided on the side surface of the substrate, and the conductive member serving as the terminal electrode is previously filled in the concave portion. Becomes unnecessary.

【0053】しかも、樹脂封止体が、基板の平面形状と
同一形状であり、製造方法とあいまって、樹脂が基板の
端端子電極に流れることが一切ないため、プリント配線
基板上への表面実装の信頼性が非常に向上する。
Further, since the resin sealing body has the same shape as the planar shape of the substrate, and the resin does not flow to the terminal electrodes of the substrate at all in accordance with the manufacturing method, the surface mounting on the printed wiring board is not performed. The reliability is greatly improved.

【0054】また、設計上、端子電極形成、溶断空間の
形成、封止構造に対する寸法上の余裕を必要とせず、小
型のチップヒューズとすることができる。
In addition, a small chip fuse can be obtained without requiring a dimensional margin for the formation of the terminal electrode, the formation of the fusing space, and the sealing structure.

【0055】また、樹脂封止体を個々に切断する前の大
型基板上に、チップヒューズを構成する部分が複数のチ
ップヒューズ素子領域に共通的に且つ一括的に形成する
ことができるため、生産性の高いチップヒューズ素子の
製造方法となる。
Further, since a portion constituting a chip fuse can be formed in a plurality of chip fuse element regions in common and collectively on a large substrate before the resin sealing body is individually cut. This is a method of manufacturing a chip fuse element having high reliability.

【0056】また、大型基板に既に導電性部材で貫通孔
を充填した端子電極となるビアホール導体が形成されて
おり、個々のチップヒューズ素子の形状に切断した時
に、初めて端子電極となるため、端子電極の形成が非常
に容易で、製造し易く、且つ実装信頼性が大きく向上す
る製造方法となる。
In addition, a via-hole conductor which is a terminal electrode having a through-hole filled with a conductive material is already formed on a large-sized substrate, and becomes a terminal electrode for the first time when cut into the shape of an individual chip fuse element. This is a manufacturing method in which the formation of the electrodes is very easy, the manufacturing is easy, and the mounting reliability is greatly improved.

【0057】可溶導体細線からなるヒューズ素子の封止
の信頼性が高く、かつプリント配線基板への表面実装時
の信頼性も高く、さらに生産性が非常に高いチップヒュ
ーズ素子及びその製造方法となる。
A chip fuse element having high reliability in sealing a fuse element made of a fusible conductor fine wire, high reliability in surface mounting on a printed wiring board, and extremely high productivity, and a method of manufacturing the same. Become.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明のチップヒューズ素子の例を示す縦断面
図である。
FIG. 1 is a longitudinal sectional view showing an example of a chip fuse element of the present invention.

【図2】本発明のチップヒューズ素子の樹脂封止体を省
略した状態の平面図である。
FIG. 2 is a plan view of the chip fuse element of the present invention in a state where a resin sealing body is omitted.

【図3】本発明のチップヒューズ素子の製造方法に用い
る大型基板の平面図である。
FIG. 3 is a plan view of a large substrate used in the method for manufacturing a chip fuse element of the present invention.

【図4】(a)〜(e)は、本発明のチップヒューズ素
子の製造方法を説明するための部分断面図である。
FIGS. 4A to 4E are partial cross-sectional views illustrating a method for manufacturing a chip fuse element of the present invention.

【符号の説明】[Explanation of symbols]

1・・・チップヒューズ 2・・・・・基板 3a、3b・・・電極パッド 4a、4b・・・端子電極 5・・・・・可溶導体細線からなるヒューズ素子 6・・・・・溶断空間 7・・・・・樹脂封止体 8a、8b・下面電極 100・・・大型基板 DESCRIPTION OF SYMBOLS 1 ... Chip fuse 2 ... Substrate 3a, 3b ... Electrode pad 4a, 4b ... Terminal electrode 5 ... Fuse element made of fusible conductor thin wire 6 ... Fusing Space 7 ···· Resin sealing body 8a, 8b · Lower electrode 100 ··· Large substrate

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 表面に形成した2つの電極パッドと、該
電極パッドに接続し、側面の厚み方向に延びる凹部内に
形成した端子電極とを有する絶縁基板と、 前記2つの電極パッド間に架設され、可溶細線導体から
成るヒューズ素子と、 前記ヒューズ素子の周囲に空間を設けて、絶縁基板表面
に形成された樹脂封止体とから成るチップヒューズ。
1. An insulating substrate having two electrode pads formed on a surface thereof, a terminal electrode connected to the electrode pads, and a terminal electrode formed in a concave portion extending in a thickness direction of a side surface, and a bridge between the two electrode pads. A chip fuse comprising: a fuse element made of a fusible thin wire conductor; and a resin sealing body formed on the surface of the insulating substrate by providing a space around the fuse element.
【請求項2】複数の絶縁基板領域を有し、各絶縁基板領
域内の表面に2つの電極パッドと、隣接する絶縁縁基板
領域に跨がって形成された貫通孔に導電性部材を充填し
て形成され、且つ該電極パッドに接続しているビアホー
ル導体とを有する大型絶縁基板を用意する工程と、 前記各絶縁基板領域の電極パッド間に、可溶細線導体か
ら成るヒューズ素子をボンディング接続によって架設す
る工程と、 前記ヒューズ素子をワックスで被覆する工程と、 前記大型絶縁基板上に、前記ワックスで被覆されたヒュ
ーズ素子を覆うように熱硬化性多孔質樹脂を塗布する工
程と、 前記熱硬化多孔質樹脂を加熱硬化させるとともに、前記
ワックスを熱硬化性多孔質樹脂内に吸収させてヒューズ
素子の周囲に空間を形成する工程と、 前記大型絶縁基板及び前記ワックスを吸収し、硬化した
樹脂を切断し、個々のチップヒューズ素子に分割する工
程とから成るチップヒューズの製造方法。
2. A semiconductor device comprising a plurality of insulating substrate regions, two electrode pads on a surface in each of the insulating substrate regions, and a conductive member filled in a through hole formed over an adjacent insulating edge substrate region. Preparing a large-sized insulating substrate having a via-hole conductor connected to the electrode pad and formed, and bonding a fuse element made of a fusible thin-wire conductor between the electrode pads in each of the insulating substrate regions. Erection, a step of covering the fuse element with wax, a step of applying a thermosetting porous resin on the large-sized insulating substrate so as to cover the fuse element covered with the wax, A step of heating and curing the cured porous resin and absorbing the wax into the thermosetting porous resin to form a space around the fuse element; It absorbs wax, cured resin was cut, a manufacturing method of the chip fuse comprising a step of dividing into individual chips fuse element.
JP28874396A 1996-10-30 1996-10-30 Chip fuse and its manufacture Pending JPH10134695A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28874396A JPH10134695A (en) 1996-10-30 1996-10-30 Chip fuse and its manufacture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28874396A JPH10134695A (en) 1996-10-30 1996-10-30 Chip fuse and its manufacture

Publications (1)

Publication Number Publication Date
JPH10134695A true JPH10134695A (en) 1998-05-22

Family

ID=17734130

Family Applications (1)

Application Number Title Priority Date Filing Date
JP28874396A Pending JPH10134695A (en) 1996-10-30 1996-10-30 Chip fuse and its manufacture

Country Status (1)

Country Link
JP (1) JPH10134695A (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20020047722A (en) * 2000-12-14 2002-06-22 홍정표 Pico-Fuse And Method of Making Thereof
US6462925B2 (en) 1998-06-02 2002-10-08 Omron Corporation Excess current interrupting structure
FR2842698A1 (en) * 2002-07-18 2004-01-23 Siemens Vdo Automotive Electronic circuit overvoltage protection having substrate with electrical conductor track each end and central section connected.
KR100712548B1 (en) 2006-01-27 2007-05-02 삼성전자주식회사 Wafer level package having floated metal line and method thereof
JP2009510708A (en) * 2005-10-03 2009-03-12 リッテルフューズ,インコーポレイティド Fuses with cavities forming the enclosure
KR101058946B1 (en) * 2010-09-07 2011-08-26 에스씨테크닉스 주식회사 Process for manufacturing time-delay micro-fuse with multi layer molding and a micro-fuse manufactured therefrom
KR101533996B1 (en) * 2014-10-23 2015-07-06 주식회사 에스엠하이테크 Smd type micro mixed fuse with thermal fuse function and mathod for manufacturing the same
FR3067871A1 (en) * 2017-06-19 2018-12-21 Zodiac Aero Electric PROTECTIVE DEVICE FOR AN ELECTRICAL DISTRIBUTION SYSTEM OF AN AIRCRAFT ELECTRICAL SYSTEM
KR101985499B1 (en) * 2017-12-28 2019-06-03 삼화콘덴서공업 주식회사 Over-current protected metal oxide varistor

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6462925B2 (en) 1998-06-02 2002-10-08 Omron Corporation Excess current interrupting structure
US6563684B2 (en) 1998-06-02 2003-05-13 Omron Corporation Method of manufacturing excess current interrupting structure
KR20020047722A (en) * 2000-12-14 2002-06-22 홍정표 Pico-Fuse And Method of Making Thereof
FR2842698A1 (en) * 2002-07-18 2004-01-23 Siemens Vdo Automotive Electronic circuit overvoltage protection having substrate with electrical conductor track each end and central section connected.
JP2009510708A (en) * 2005-10-03 2009-03-12 リッテルフューズ,インコーポレイティド Fuses with cavities forming the enclosure
KR100712548B1 (en) 2006-01-27 2007-05-02 삼성전자주식회사 Wafer level package having floated metal line and method thereof
KR101058946B1 (en) * 2010-09-07 2011-08-26 에스씨테크닉스 주식회사 Process for manufacturing time-delay micro-fuse with multi layer molding and a micro-fuse manufactured therefrom
KR101533996B1 (en) * 2014-10-23 2015-07-06 주식회사 에스엠하이테크 Smd type micro mixed fuse with thermal fuse function and mathod for manufacturing the same
WO2016064105A1 (en) * 2014-10-23 2016-04-28 주식회사 에스엠하이테크 Smd type complex micro fuse having temperature fuse function, and manufacturing method therefor
US9847202B2 (en) 2014-10-23 2017-12-19 Sm Hi-Tech Co., Ltd. SMD micro mixed fuse having thermal fuse function and method for manufacturing the same
FR3067871A1 (en) * 2017-06-19 2018-12-21 Zodiac Aero Electric PROTECTIVE DEVICE FOR AN ELECTRICAL DISTRIBUTION SYSTEM OF AN AIRCRAFT ELECTRICAL SYSTEM
WO2018234679A1 (en) * 2017-06-19 2018-12-27 Zodiac Aero Electric Protection device for an electrical distribution system of an aircraft electrical network
CN111052293A (en) * 2017-06-19 2020-04-21 Zodiac航空电器 Protection device for an electrical distribution system of an aircraft electrical network
KR101985499B1 (en) * 2017-12-28 2019-06-03 삼화콘덴서공업 주식회사 Over-current protected metal oxide varistor

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