JPH10116402A - Production of magnetic head - Google Patents
Production of magnetic headInfo
- Publication number
- JPH10116402A JPH10116402A JP26963096A JP26963096A JPH10116402A JP H10116402 A JPH10116402 A JP H10116402A JP 26963096 A JP26963096 A JP 26963096A JP 26963096 A JP26963096 A JP 26963096A JP H10116402 A JPH10116402 A JP H10116402A
- Authority
- JP
- Japan
- Prior art keywords
- film
- frame
- photoresist
- layer
- magnetic pole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B2005/3996—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects large or giant magnetoresistive effects [GMR], e.g. as generated in spin-valve [SV] devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/31—Structure or manufacture of heads, e.g. inductive using thin films
- G11B5/3163—Fabrication methods or processes specially adapted for a particular head structure, e.g. using base layers for electroplating, using functional layers for masking, using energy or particle beams for shaping the structure or modifying the properties of the basic layers
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Magnetic Heads (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は磁気ディスク装置用
薄膜磁気ヘッドの製造方法に関する。The present invention relates to a method for manufacturing a thin-film magnetic head for a magnetic disk drive.
【0002】[0002]
【従来の技術】磁気ディスク装置用薄膜磁気ヘッドは高
速回転するディスク上で保持されたスライダ上に形成さ
れる。記録ヘッドは強磁性材料の薄膜である磁極層を有
し、エアベアリング面でギャップ層の上下に下部磁極層
と上部磁極層がある。記録ヘッドの上下の磁極層は後部
のギャップで接触する。記録密度を高めるためには磁気
ディスクの表面に多くのデータを書き込む必要がある。
このためには、トラック幅を狭くして記録密度を高める
方法がある。薄膜磁気ヘッドで磁極端の幅、すなわち、
トラック幅が2μm以下のヘッドを提供する方法が特願
平7−12264号明細書に記載されている。この例には磁性
膜をめっき法で形成する際に二酸化ケイ素層をめっきフ
レームとして用いている。またこの磁気ヘッド二酸化ケ
イ素層を磁極端部周辺で残している。二酸化ケイ素以外
にシリコン,シリコン窒化物及びカーボンを含む材料が
ノッチ構造体を作るものとして挙げられている。これら
の材料は耐摩耗性の点でアルミナよりも劣るということ
と、レジスト等のフレーム材料と比較してフレーム材料
形成用の装置を必要とし、プロセス工程が多くなる。2. Description of the Related Art A thin-film magnetic head for a magnetic disk drive is formed on a slider held on a disk which rotates at a high speed. The recording head has a pole layer which is a thin film of a ferromagnetic material, and has a lower pole layer and an upper pole layer above and below the gap layer on the air bearing surface. The top and bottom pole layers of the recording head contact at the rear gap. In order to increase the recording density, it is necessary to write a lot of data on the surface of the magnetic disk.
For this purpose, there is a method of increasing the recording density by narrowing the track width. The width of the pole tip in a thin film magnetic head,
A method for providing a head having a track width of 2 μm or less is described in Japanese Patent Application No. 7-12264. In this example, a silicon dioxide layer is used as a plating frame when a magnetic film is formed by a plating method. The magnetic head silicon dioxide layer is left around the magnetic pole tip. Materials including silicon, silicon nitride and carbon besides silicon dioxide are mentioned as materials for forming the notch structure. These materials are inferior to alumina in terms of abrasion resistance, and require an apparatus for forming a frame material as compared with a frame material such as a resist, so that the number of process steps is increased.
【0003】[0003]
【発明が解決しようとする課題】本発明の目的は基板上
にホトレジストやPMGI等からなるフレームを形成す
る工程とフレームにアンダーカットを形成する工程と、
フレームを用いて上下磁極層とギャップ層を形成する工
程とフレームを除去する工程を含むことを特徴とする薄
膜磁気ヘッドの製造方法を提供することにある。SUMMARY OF THE INVENTION An object of the present invention is to form a frame made of photoresist, PMGI, or the like on a substrate, and to form an undercut on the frame.
An object of the present invention is to provide a method of manufacturing a thin-film magnetic head, which includes a step of forming an upper and lower magnetic pole layer and a gap layer using a frame and a step of removing the frame.
【0004】[0004]
【課題を解決するための手段】フォトレジストとポリジ
メチルグルタルイミドを用いた2層膜に紫外線および遠
紫外線の照射と2回の現像の組合せで、アンダーカット
をもつフレーム材料を作製し、フォトレジスト層の間に
ギャップ膜を形成し、下部磁極膜をアンダーカット部に
形成する。本発明では二酸化珪素等のフレーム材料を使
用しないため上記耐摩耗性やフレーム材料の形成装置を
必要としない。図1に示すようにフォトレジストの現像
液に溶ける樹脂1を塗布し、その上にフォトレジスト2
を塗布して2層膜を作り、他のマスク材料3を用い
(c)のようにフォトレジストを露光,現像あるいはR
IE(反応性イオンエッチング)により加工するとフォ
トレジストの露光部が現像液に溶解した後(d)、下層
の樹脂1が現像液に溶解し始める(e)。この時、上の
フォトレジストの露光部以外の部分よりも下層が早い速
度で溶解し、サイドエッチングが進むことにより、アン
ダーカットが(e)のように形成される。下層の材料に
はポリジメチルグルタルイミド(PMGI)がある。P
MGIはフォトレジスト剥離液によって剥離が可能であ
る。このようなアンダーカットを作製する方法としてフ
ォトレジスト現像液に溶解するダミー材料を図2(b)
のようにあらかじめ露光現像し、その上にフォトレジス
トを塗布し(c)、マスク材3を用いてフォトレジスト
2を露光現像あるいはRIEによりエッチングし、トラ
ック部を形成することが可能である。このように形成し
た薄膜磁気ヘッドのトラック幅は2μm以下であり、R
IE条件を最適化することにより0.5μm のトラック
幅まで形成できる。Means for Solving the Problems A frame material having an undercut is produced by a combination of irradiation of ultraviolet rays and far ultraviolet rays and development twice on a two-layer film using a photoresist and polydimethylglutarimide, and A gap film is formed between the layers, and a lower pole film is formed in the undercut portion. In the present invention, since a frame material such as silicon dioxide is not used, the wear resistance and the apparatus for forming the frame material are not required. As shown in FIG. 1, a resin 1 soluble in a photoresist developer is applied, and a photoresist 2 is
Is applied to form a two-layer film, and using another mask material 3, the photoresist is exposed and developed as shown in FIG.
When processed by IE (Reactive Ion Etching), the exposed portion of the photoresist is dissolved in the developing solution (d), and then the lower resin 1 starts to be dissolved in the developing solution (e). At this time, the lower layer dissolves at a higher speed than the portion other than the exposed portion of the upper photoresist and the side etching proceeds, so that an undercut is formed as shown in FIG. The lower layer material is polydimethylglutarimide (PMGI). P
The MGI can be peeled off with a photoresist stripper. As a method for producing such an undercut, a dummy material dissolved in a photoresist developer is used as shown in FIG.
It is possible to form a track portion by exposing and developing in advance as described above, applying a photoresist thereon (c), and exposing and developing the photoresist 2 using a mask material 3 by exposure or RIE. The track width of the thin-film magnetic head thus formed is 2 μm or less, and R
By optimizing the IE conditions, a track width of up to 0.5 μm can be formed.
【0005】本発明では薄膜磁気ヘッドの記録ヘッドの
磁極端部をフレームめっきで作製する場合、サブミクロ
ンのトラック幅を実現させるためにフレームをアンダー
カットをもつフォトレジストを含む現像可能な材料と
し、アンダーカットの上のフォトレジストの間隔がトラ
ック幅になる。めっき膜は図1や図2の密着膜5の上に
形成された下地膜4の上に下部磁極膜6,ギャップ膜
7,上部磁性膜8の順に形成され、ギャップ膜には導電
性非磁性膜を用い下部磁性膜から上部磁性膜をめっき法
で形成する。In the present invention, when the pole tip of the recording head of the thin-film magnetic head is formed by frame plating, the frame is made of a developable material including a photoresist having an undercut in order to realize a submicron track width. The space between the photoresist above the undercut is the track width. The plating film is formed on the lower magnetic film 6, the gap film 7, and the upper magnetic film 8 in this order on the base film 4 formed on the adhesion film 5 of FIGS. Using the film, an upper magnetic film is formed from the lower magnetic film by a plating method.
【0006】[0006]
【発明の実施の形態】以下に記録ヘッドを作製するプロ
セスについて説明する。図1はPMGI/フォトレジス
ト/二酸化珪素をフレームに用いてPMGIのアンダー
カットを作成し、ギャップ膜をフォトレジストの間にめ
っき法で作成する方法である。また図2はアンダーカッ
トを作成するためにフォトレジスト層2の現像液に溶解
可能で露光現像できるポリジメチルグルタルイミド(P
MGI)等をダミー層9に用いてフォトレジストフレー
ムを作成し、フォトレジストのフレーム間隔に下部磁極
6,ギャップ膜7及び上部磁極8をめっき法によって作
製する。DESCRIPTION OF THE PREFERRED EMBODIMENTS A process for producing a recording head will be described below. FIG. 1 shows a method in which an undercut of PMGI is formed using PMGI / photoresist / silicon dioxide as a frame, and a gap film is formed between the photoresists by a plating method. FIG. 2 shows a polydimethyl glutarimide (P
A photoresist frame is formed using MGI) or the like for the dummy layer 9, and the lower magnetic pole 6, the gap film 7, and the upper magnetic pole 8 are formed by plating at the intervals of the photoresist frame.
【0007】図1では基板あるいはGMRヘッドの上
に、密着層5(Cr等の金属膜)を介して下部磁極あるい
はGMRヘッドの場合シールド膜4をスパッタリング法
や真空蒸着法あるいはめっき法で作製する。この上に
0.1 ないし5μmの厚さのPMGIを塗布し、130
℃以上でベーキングした。フォトレジスト2のフレーム
間隔を小さくするために二酸化珪素膜等をマスクにして
フォトレジストをRIE(リアクティブイオンエッチン
グ)法によって加工することができる。フォトレジスト
2の厚さは3ないし10μmである。またフォトレジス
トフレーム幅は5ないし20μmである。フォトレジス
トの現像溶解速度は小さく、PMGIの溶解速度は大き
いのでPMGI層にはアンダーカットが(e)のように
形成される。アンダーカット量はフォトレジストとPM
GIの現像液に対する溶解速度の差で決定されるので、
溶解速度の小さいフォトレジストを用いる必要がある。
溶解速度差を大きくし、アンダーカット量を0.3μm
以上とすることができる。次に(e)のようなフレーム
を用いてめっき法によりNiFeあるいはNiFeCo
等の合金膜6を作製し、その上にCr,Au,Pt等の
非磁性導電膜7をギャップ膜としてめっきする。さらに
ギャップ膜の上に上部磁極膜(NiFeやNiFeCo
合金膜)をめっき法で作製する。In FIG. 1, a lower magnetic pole or a shield film 4 in the case of a GMR head is formed on a substrate or a GMR head via an adhesion layer 5 (metal film such as Cr) by a sputtering method, a vacuum evaporation method, or a plating method. . On this, PMGI having a thickness of 0.1 to 5 μm is applied and
Baking was carried out at a temperature of at least ℃. In order to reduce the frame interval of the photoresist 2, the photoresist can be processed by RIE (reactive ion etching) using a silicon dioxide film or the like as a mask. The thickness of the photoresist 2 is 3 to 10 μm. The width of the photoresist frame is 5 to 20 μm. Since the photoresist dissolution rate is low and the PMGI dissolution rate is high, undercuts are formed in the PMGI layer as shown in FIG. Undercut amount is photoresist and PM
Since it is determined by the difference in the dissolution rate of the GI in the developer,
It is necessary to use a photoresist having a low dissolution rate.
Increase the dissolution rate difference and reduce the undercut amount to 0.3 μm
The above can be considered. Next, NiFe or NiFeCo is formed by plating using a frame as shown in FIG.
An alloy film 6 is formed, and a nonmagnetic conductive film 7 of Cr, Au, Pt or the like is plated thereon as a gap film. Further, an upper magnetic pole film (NiFe or NiFeCo) is formed on the gap film.
Alloy film) by a plating method.
【0008】図2は図1のアンダーカットを形成するP
MGI層1の変わりにダミー層9を形成し、ダミー層を
除去してアンダーカットを作製する方法であり、めっき
する材料や方法は図1と等しい。この場合もダミー層と
して露光現像可能でダミー層の上に形成したフォトレジ
ストよりも早い現像液溶解速度を有する有機材料が用い
られる。FIG. 2 is a view showing the P which forms the undercut shown in FIG.
This is a method in which a dummy layer 9 is formed instead of the MGI layer 1 and the dummy layer is removed to produce an undercut. The plating material and method are the same as those in FIG. Also in this case, an organic material which can be exposed and developed and has a faster dissolution rate of a developing solution than a photoresist formed on the dummy layer is used as the dummy layer.
【0009】このように磁極端部を形成すると記録ヘッ
ドの断面形状は図3のようになり、下部磁極4と絶縁層
14を介してコイル11がめっきで形成され、コイルの
上部にはレジスト12で絶縁が保たれている。レジスト
12の上には上部磁極13があり、上部磁極13が磁極
端部の上部磁極8の上に形成されている場合(a)と上
部磁極8の端部に形成することが可能である。When the magnetic pole tip is formed in this manner, the sectional shape of the recording head becomes as shown in FIG. 3, the coil 11 is formed by plating with the lower magnetic pole 4 and the insulating layer 14 interposed therebetween, and the resist 12 Insulation is maintained. An upper magnetic pole 13 is provided on the resist 12, and when the upper magnetic pole 13 is formed on the upper magnetic pole 8 in the magnetic pole end portion (a), it can be formed at an end of the upper magnetic pole 8.
【0010】[0010]
【発明の効果】本発明では基板上にホトレジストやPM
GI等からなるフレームを形成する工程とフレームにア
ンダーカットを形成する工程と、フレームを用いて上下
磁極層とギャップ層を形成する工程とフレームを除去す
る工程を含み面記録密度が1Gb/in2以上の磁気ディ
スク装置に用いる薄膜磁気ヘッドの製造方法を提供する
ことができる。According to the present invention, a photoresist or PM on a substrate is provided.
A step of forming a frame made of GI or the like, a step of forming an undercut in the frame, a step of forming upper and lower magnetic pole layers and a gap layer using the frame, and a step of removing the frame, and the areal recording density is 1 Gb / in 2 or more. And a method for manufacturing a thin-film magnetic head used in the magnetic disk drive of the present invention.
【図1】アンダーカットをもつフレームを用いた記録ヘ
ッド作製プロセスの一実施例の説明図。FIG. 1 is an explanatory diagram of one embodiment of a recording head manufacturing process using a frame having an undercut.
【図2】第二実施例の説明図。FIG. 2 is an explanatory diagram of a second embodiment.
【図3】第三実施例の説明図。FIG. 3 is an explanatory diagram of a third embodiment.
1…PMGI層、2…フォトレジスト層、3…酸化物
層、4…下部磁極層、5…密着層、6…めっき下部磁極
層、7…ギャップ層、8…上部磁極層。DESCRIPTION OF SYMBOLS 1 ... PMGI layer, 2 ... photoresist layer, 3 ... oxide layer, 4 ... lower magnetic pole layer, 5 ... adhesion layer, 6 ... plating lower magnetic pole layer, 7 ... gap layer, 8 ... upper magnetic pole layer.
───────────────────────────────────────────────────── フロントページの続き (72)発明者 府山 盛明 東京都国分寺市東恋ケ窪一丁目280番地 株式会社日立製作所中央研究所内 (72)発明者 福井 宏 東京都国分寺市東恋ケ窪一丁目280番地 株式会社日立製作所中央研究所内 (72)発明者 芳田 伸雄 東京都国分寺市東恋ケ窪一丁目280番地 株式会社日立製作所中央研究所内 ──────────────────────────────────────────────────の Continuing on the front page (72) Inventor, Moriaki Fuyama 1-280, Higashi-Koigakubo, Kokubunji-shi, Tokyo Inside the Central Research Laboratory, Hitachi, Ltd. (72) Inventor Nobuo Yoshida 1-280 Higashi-Koigakubo, Kokubunji-shi, Tokyo In-house Hitachi, Ltd.
Claims (4)
ムにアンダーカットを形成する工程と、前記フレームを
用いて上下磁極層とギャップ層を形成する工程と前記フ
レームを除去する工程を含むことを特徴とする薄膜磁気
ヘッドの製造方法。The method includes the steps of forming a frame on a substrate, forming an undercut in the frame, forming upper and lower pole layers and a gap layer using the frame, and removing the frame. A method for manufacturing a thin film magnetic head.
れたアンダーカットをもつフレームを用いてメッキ法で
ギャップ層を含む上下磁極層を作製することを特徴とす
る薄膜磁気ヘッドの製造方法。2. A method of manufacturing a thin-film magnetic head, wherein upper and lower magnetic pole layers including a gap layer are formed by plating using a frame having an undercut formed of a two-layer film of photoresist and PMGI.
れたアンダーカットをもつフレームを用いて下部磁性膜
をアンダーカット部にメッキ法で形成し、PMGI上の
ホトレジストのフレーム間隔でトラック幅を決定するこ
とを特徴とする薄膜磁気ヘッドの製造方法。3. A lower magnetic film is formed on an undercut portion by plating using a frame having an undercut formed of a two-layer film of a photoresist and a PMGI, and a track width is determined by a frame interval of the photoresist on the PMGI. A method for manufacturing a thin-film magnetic head.
にアンダーカットを形成し、メッキ法でフレーム内にギ
ャップ層を含む上下磁極層を作製することを特徴とする
薄膜磁気ヘッドの製造方法。4. A method for manufacturing a thin-film magnetic head, comprising: forming an undercut in a photoresist frame using a dummy layer; and forming upper and lower magnetic pole layers including a gap layer in the frame by plating.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26963096A JPH10116402A (en) | 1996-10-11 | 1996-10-11 | Production of magnetic head |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26963096A JPH10116402A (en) | 1996-10-11 | 1996-10-11 | Production of magnetic head |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH10116402A true JPH10116402A (en) | 1998-05-06 |
Family
ID=17475034
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP26963096A Pending JPH10116402A (en) | 1996-10-11 | 1996-10-11 | Production of magnetic head |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH10116402A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6916597B2 (en) | 2000-10-05 | 2005-07-12 | Tdk Corporation | Method for fabricating a resist pattern, a method for patterning a thin film and a method for manufacturing a micro device |
US7111387B2 (en) | 2000-01-24 | 2006-09-26 | Alps Electric Co., Ltd. | Method of manufacturing a thin film magnetic head comprising an insulating layer provided between a core and coil |
US7655282B2 (en) | 2002-07-31 | 2010-02-02 | Tdk Corporation | Method of forming patterned film |
US8470189B2 (en) | 2008-06-03 | 2013-06-25 | Tdk Corporation | Method of forming mask pattern, method of forming thin film pattern and method of forming magnetoresistive element |
-
1996
- 1996-10-11 JP JP26963096A patent/JPH10116402A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7111387B2 (en) | 2000-01-24 | 2006-09-26 | Alps Electric Co., Ltd. | Method of manufacturing a thin film magnetic head comprising an insulating layer provided between a core and coil |
US6916597B2 (en) | 2000-10-05 | 2005-07-12 | Tdk Corporation | Method for fabricating a resist pattern, a method for patterning a thin film and a method for manufacturing a micro device |
US7655282B2 (en) | 2002-07-31 | 2010-02-02 | Tdk Corporation | Method of forming patterned film |
US8470189B2 (en) | 2008-06-03 | 2013-06-25 | Tdk Corporation | Method of forming mask pattern, method of forming thin film pattern and method of forming magnetoresistive element |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6451514B1 (en) | Method for formation of upper magnetic pole layer of thin film magnetic head, method of forming miniature block pattern with high aspect ratio on bottom part of step on surface with step, and thin film magnetic head | |
US5404635A (en) | Method of making a narrow track thin film head | |
US6877213B2 (en) | Feature size reduction in thin film magnetic head using low temperature deposition coating of photolithographically-defined trenches | |
JP2000040208A5 (en) | Manufacturing method of thin film magnetic head and magnetic head | |
JPS6142714A (en) | Manufacture of multilayer conductor film structure | |
JPH10116402A (en) | Production of magnetic head | |
JP2000099914A (en) | Production of thin-film magnetic head | |
US6521335B1 (en) | Method of fabricating a submicron narrow writer pole | |
JP3440225B2 (en) | Frame plating method and method of forming magnetic pole of thin film magnetic head | |
JP2613876B2 (en) | Method for manufacturing thin-film magnetic head | |
JP2000314963A (en) | Optical processing solution and methods for forming antireflection film, pattern plating and thin film magnetic head | |
JP3428905B2 (en) | Metal film forming method and pole forming method for thin film magnetic head | |
US6345435B1 (en) | Method to make laminated yoke for high data rate giant magneto-resistive head | |
JP3867017B2 (en) | Pattern formation method, micro device manufacturing method, thin film magnetic head manufacturing method, magnetic head slider manufacturing method, magnetic head device manufacturing method, magnetic recording / reproducing apparatus manufacturing method | |
JP2002363730A (en) | Method of forming patterned thin film and method of manufacturing micro-device | |
US7129177B2 (en) | Write head fabrication by inverting order of process steps | |
JPH10340426A (en) | Thin film magnetic head and its production | |
JPH103613A (en) | Thin-film magnetic head and its production | |
JP3164050B2 (en) | Manufacturing method of magnetoresistive composite head | |
JP2693171B2 (en) | Method for manufacturing thin-film magnetic head | |
JPH0644526A (en) | Production of thin-film magnetic head | |
JP2656064B2 (en) | Method for manufacturing thin-film magnetic head | |
JP2000207709A (en) | Manufacture of thin film magnetic head | |
JPH10312063A (en) | Forming method of photoresist pattern for lift-off process | |
JP3015546B2 (en) | Resist coating method |