JPH0392884U

JPH0392884U -

Info

Publication number: JPH0392884U
Application number: JP1990001742U
Authority: JP
Priority date: 1990-01-12
Filing date: 1990-01-12
Publication date: 1991-09-20

Description

[Brief explanation of drawings]

第１図は本考案の第１の実施例のブロツク図、
第２図は本考案の第２実施例のブロツク図、第３
図は従来の固体撮像素子の試験装置の一例のブロ
ツク図である。１，１ａ……露光部、２，２ａ……ＬＥＤ、３
……ＤＵＴ、４，４ａ，４ｂ……テストヘツド、
５，５ａ，５ｂ……ドライバ回路、６……電源回
路、７……信号処理回路、８，８ａ……テスタ、
９……光源、１０……減光フイルタ、１１……機
械的シヤツタ、１２，１２ａ……暗箱、１３……
光量制御信号、１４……出力制御信号、１４，１
４ａ……抵抗。 FIG. 1 is a block diagram of the first embodiment of the present invention.
Figure 2 is a block diagram of the second embodiment of the present invention;
The figure is a block diagram of an example of a conventional solid-state image sensor testing apparatus. 1, 1a...Exposure section, 2, 2a...LED, 3
...DUT, 4, 4a, 4b...Test head,
5, 5a, 5b... Driver circuit, 6... Power supply circuit, 7... Signal processing circuit, 8, 8a... Tester,
9...Light source, 10...Dimension filter, 11...Mechanical shutter, 12, 12a...Dark box, 13...
Light amount control signal, 14...Output control signal, 14,1
4a...Resistance.

Claims

[Scope of utility model registration request]

A tester that can independently set conditions for each phase of a polyphase, a power supply circuit that generates an output according to the settings of the tester, and a first pulse signal that generates a first pulse signal according to the first timing data of the tester. a test head including a driver circuit that generates a signal, a light source that irradiates a device under test that is driven in response to the output of the power supply circuit and the first pulse signal, and a dark box that accommodates the device under test and the light source. A testing device for a solid-state image sensor having an exposure section, characterized in that the light source is a light emitting diode that is turned on by a second pulse signal generated in accordance with second timing data set in the driver circuit. Test equipment for solid-state image sensors.