JPH03265820A - Liquid crystal display and production thereof - Google Patents
Liquid crystal display and production thereofInfo
- Publication number
- JPH03265820A JPH03265820A JP2064220A JP6422090A JPH03265820A JP H03265820 A JPH03265820 A JP H03265820A JP 2064220 A JP2064220 A JP 2064220A JP 6422090 A JP6422090 A JP 6422090A JP H03265820 A JPH03265820 A JP H03265820A
- Authority
- JP
- Japan
- Prior art keywords
- liquid crystal
- crystal panel
- void
- mask
- production
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 36
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 12
- 239000000758 substrate Substances 0.000 claims abstract description 19
- 238000000034 method Methods 0.000 claims abstract description 11
- 238000007788 roughening Methods 0.000 claims abstract description 11
- 238000005488 sandblasting Methods 0.000 claims abstract description 4
- 230000007547 defect Effects 0.000 claims description 27
- 239000011521 glass Substances 0.000 abstract description 14
- 238000012937 correction Methods 0.000 abstract description 6
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 abstract description 3
- 229910001220 stainless steel Inorganic materials 0.000 abstract description 3
- 239000010935 stainless steel Substances 0.000 abstract description 3
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 abstract description 2
- 239000000843 powder Substances 0.000 abstract description 2
- 239000011800 void material Substances 0.000 abstract 5
- 230000003247 decreasing effect Effects 0.000 abstract 1
- 229910052757 nitrogen Inorganic materials 0.000 abstract 1
- 229910010271 silicon carbide Inorganic materials 0.000 abstract 1
- 230000002950 deficient Effects 0.000 description 8
- 239000003086 colorant Substances 0.000 description 4
- 238000009966 trimming Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 238000010884 ion-beam technique Methods 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- 239000011324 bead Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000003365 glass fiber Substances 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Landscapes
- Liquid Crystal (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は液晶パネルにおける白欠陥の修正構成及びその
製造方法に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a structure for correcting white defects in a liquid crystal panel and a manufacturing method thereof.
液晶ディスプレイ用液晶パネルの欠陥対策として、製造
プロセスにおける欠陥の発生を貼止したり、プロセス欠
陥が発生しても冗長方式によりディスプレイの画像とし
ては見えなく又は見難くする各種の方法が知られている
。As countermeasures against defects in liquid crystal panels for liquid crystal displays, various methods are known, such as pasting defects that occur during the manufacturing process, or using redundant methods to make process defects invisible or difficult to see as images on the display. There is.
一方、製造後に検出される欠陥に対しては修正法、例え
ば欠陥部分の電極配線のトリミンク等かある。On the other hand, there are correction methods for defects detected after manufacturing, such as trimming the electrode wiring in the defective area.
これに類似した製品としてホトマスクがあり、その修正
装置の1つに集束イオンビーム照躬により基板表面の白
欠陥部分をスパッタして不透明化する装置がある。この
装置については日経マイクロデバイス1985年7月(
創刊)号241ペシのニュースレターに紹介されている
。A similar product is a photomask, and one of its repair devices is a device that uses focused ion beam illumination to sputter white defect areas on the substrate surface to make them opaque. Regarding this device, Nikkei Microdevice July 1985 (
It was introduced in the newsletter of issue 241 of the first issue.
」二記従来技術における製造プロセスにおける欠陥対策
は、製造後に検出された欠陥に対しては対応できない。2. Countermeasures against defects in the manufacturing process in the prior art cannot deal with defects detected after manufacturing.
製造後に検出される欠陥修正としてのレーザ1〜リミン
グは、予め液晶パネル内のバタ−ンにトリミング位置を
設定しておかなければならず画素設計上制約があったり
、また基板上のトリミング位置な層が限定されるため、
基板上の全ての層に適用することはてきない。更に、ト
リミング後の切削が液晶パネル内に含有され、液晶パネ
ルの信頼性を劣化させる要因になる可能性がある。Laser 1 - Rimming, which is used to correct defects detected after manufacturing, requires setting the trimming position on the pattern in the liquid crystal panel in advance, and there are constraints on the pixel design, and there are also restrictions on the trimming position on the substrate. Because the layers are limited,
It cannot be applied to all layers on the substrate. Furthermore, the cutting after trimming may be included in the liquid crystal panel, which may cause deterioration of the reliability of the liquid crystal panel.
ホトマスクの集束イオンビーム修正法は液晶パネルの修
正にも適用できるが、真空排気系を設けた高価な装置を
要し実用的でない。これはホ1−マスクの修正は液晶パ
ネルの修正に比へで1〜2桁微細加工を要するためであ
る。Although the focused ion beam repair method for photomasks can also be applied to repair liquid crystal panels, it requires expensive equipment equipped with an evacuation system and is not practical. This is because the correction of the mask requires one to two orders of magnitude finer processing than the correction of the liquid crystal panel.
本発明の目的は、液晶パネルの製造後検出される欠陥を
極めて容易に修正する方法を提供することにある。An object of the present invention is to provide a method for extremely easily correcting defects detected after manufacturing a liquid crystal panel.
一]二記1」的を遠戚するために、液晶パネルを組立て
画像を表示させて検出される白欠陥(本来黒く表示すべ
き部分が白又はカラーフィルタ通した色を表示してしま
う欠陥)の発生した部分の基板表面を粗面化したもので
ある。この粗面化は画素サイズと同等の大きさ(例えば
100μm口)でよく、ホトマスクの修正の場合の様に
微細化は必要としないため、空気中でレーザビームを照
射したり、サンドブラスト法を用いることができる。1] White defect detected by assembling a liquid crystal panel and displaying an image (a defect where an area that should originally be displayed as black is displayed as white or the color passed through a color filter) is a defect that is detected by assembling a liquid crystal panel and displaying an image in order to make a distant relative of the target of 2.1. The surface of the substrate is roughened in the area where this occurs. This surface roughening can be done in a size equivalent to the pixel size (for example, 100 μm opening), and does not require finer refinement like in the case of photomask modification, so irradiation with a laser beam in the air or sandblasting is used. be able to.
液晶ディスプレイにおいて、ノーマリブラックモードに
おける白欠陥は、たとえ点欠陥で全体の表示面積におけ
る割合は小さくても、非常に眼に付きやすく、見苦しい
。これはあたかも夜空に輝く星の如く輝いて見え、ディ
スプレイの製品としては不合格である。しかし、この白
欠陥部分の基板表面を粗面化することにより、バックラ
イ1への光は粗面部分で屈折散乱され、眼の見える輝度
を1〜2桁以上小さくすることができ、見苦さを防止で
きる。In a liquid crystal display, a white defect in normally black mode is very noticeable and unsightly, even if it is a point defect and occupies a small proportion of the entire display area. This looks like a shining star in the night sky, and is unacceptable as a display product. However, by roughening the substrate surface in this white defect area, the light to the backlight 1 is refracted and scattered at the rough surface area, reducing the visible luminance by one to two orders of magnitude or more, making it unsightly. can be prevented.
以下、本発明の実施例を第1図により説明する。 Embodiments of the present invention will be described below with reference to FIG.
第1図は本発明の液晶ディスプレイの模式図を示す。1
0は液晶パネルで、2枚のガラス基板11゜12、液晶
13及び駆動回路14より成る。ガラス基板には図面で
は省略したが、薄膜トランジスタによる液晶素子及び透
明電極、配向膜、偏光膜。FIG. 1 shows a schematic diagram of a liquid crystal display of the present invention. 1
0 is a liquid crystal panel, which consists of two glass substrates 11 and 12, a liquid crystal 13, and a drive circuit 14. Although not shown in the drawing, the glass substrate includes a liquid crystal element using a thin film transistor, a transparent electrode, an alignment film, and a polarizing film.
カラーフィルタ並びにガラス基板間の間隔を調節するた
めのガラスピーズ又はガラスファイバーが付設しである
。20はバックライトで2本のU字型蛍光ランプ21と
反射板22より戊る。ここまでは通常の液晶ディスプレ
イと同様である。Glass beads or glass fibers are attached for adjusting the distance between the color filter and the glass substrate. Reference numeral 20 denotes a backlight, which is comprised of two U-shaped fluorescent lamps 21 and a reflector plate 22. Up to this point, it is the same as a normal liquid crystal display.
図中液晶]−3中の×印30は欠陥部分を示す。In the figure, the x mark 30 in [liquid crystal]-3 indicates a defective portion.
これは点灯試験により白欠陥が検出された場所を示して
いる。欠陥部分30に対応するガラス基板の表面部分3
1を粗面化することによりバックライ1〜光は屈折散乱
して、外部へ投写される光33を極めて弱くすることが
できる。This shows the location where a white defect was detected by the lighting test. Surface portion 3 of the glass substrate corresponding to the defective portion 30
By roughening the surface of the backlight 1, the light from the backlight 1 is refracted and scattered, and the light 33 projected to the outside can be made extremely weak.
ガラス基板の欠陥部分の粗面化は次の様にして実施した
。バックライl−20を液晶パネル10の裏面(図面で
はガラス基板上1の側)から投光する。次に液晶パネル
10に画像を表示させ、欠陥の位置を明確にする。液晶
パネルの↑画素のサイズと同し大きさの開ロバターンを
イアするステンレス製マスクをガラス基板]2に密着さ
せる。この時、欠陥部分31とステンレス製マスクの開
ロバターンを一致させる。このアライメン1−は肉眼で
対応できる大きさである。次にマスク面に4000メツ
シユのアルミナ又はカーポランダム粉をサンドブラスト
法により5気圧の窒素ガスで吹きつけ、マスクの間ロバ
ターンに相対するガラス表面を粗面化することができる
。この後、粗面化部分にインク等の着色剤をしみ込ませ
ることもできる。粗面化されているため着色剤の付着力
は平滑面に比へで非常に大きく、長寿命である。粗面化
の深さは、透過光を散乱を大きくするため欠陥サイズの
3倍以上が好ましい。The surface roughening of the defective portion of the glass substrate was carried out as follows. Light is emitted from the backlight l-20 from the back surface of the liquid crystal panel 10 (the side on the glass substrate 1 in the drawing). Next, an image is displayed on the liquid crystal panel 10 to clarify the location of the defect. A stainless steel mask with an open pattern of the same size as the ↑ pixel of the liquid crystal panel is brought into close contact with the glass substrate]2. At this time, the defective portion 31 and the opening pattern of the stainless steel mask are made to coincide. This alignment 1- has a size that can be viewed with the naked eye. Next, 4000 mesh of alumina or carporundum powder is blown onto the mask surface using a sandblasting method with nitrogen gas at 5 atmospheres, so that the glass surface facing the lobe pattern between the masks can be roughened. After this, a coloring agent such as ink may be impregnated into the roughened portion. Because the surface is roughened, the adhesion force of the colorant is much greater than that on a smooth surface, resulting in a long life. The depth of the surface roughening is preferably three times or more the defect size in order to increase the scattering of transmitted light.
また粗面化の他の方法として、レーザビー11照射法が
ある。、XeCQエキシマレーザを欠陥画素サイズに集
光してパネル照射することにより、ガラス基板表面を粗
面化する。エネルギー密度0.3J/−のビームを20
0μm口に絞って3パルス照射することにより、ガラス
表面は約4. O0μm深さの粗面を形成できる。レー
ザビー13照射の場合はマスクを用いる必要となる。そ
の後着色剤を付着させることは前述と同様である。Another method for roughening the surface is the laser beam 11 irradiation method. , the surface of the glass substrate is roughened by focusing a XeCQ excimer laser to the size of a defective pixel and irradiating the panel. 20 beams with an energy density of 0.3 J/-
By focusing on the 0 μm aperture and irradiating 3 pulses, the glass surface can be heated to about 4. A rough surface with a depth of 0 μm can be formed. In the case of laser beam 13 irradiation, it is necessary to use a mask. The coloring agent is then applied in the same manner as described above.
バックライI〜20を通常の位置に設置して液晶ディス
プレイを組立てる。Assemble the liquid crystal display by installing backlights I to 20 in their normal positions.
尚、欠陥部の光透過率は粗面化により17〜4%に減少
できた。この程度の減少率は欠陥を目立なくし、一方○
N時(画像を表示する場合)の識別もできる。着色剤を
付着させた場合の光透過率は6〜1%でバックライトが
約10’12ux以上の強い場合に適している。Incidentally, the light transmittance of the defective portion could be reduced to 17 to 4% by roughening the surface. This level of reduction makes defects less noticeable, while
It is also possible to identify the N time (when displaying an image). The light transmittance when the colorant is attached is 6 to 1%, which is suitable for cases where the backlight is strong at about 10'12 ux or more.
」−記記載では、白欠陥の修正を中心に記述したが、黒
欠陥についても上記修正を施こすことも可能である。ま
た、表面の粗面化等により光の散乱を行う箇所としては
、光源から、眼に到るまでの光路の途中であればよい。Although the description above focuses on correction of white defects, it is also possible to perform the above correction on black defects. Moreover, the location where light is scattered due to roughening of the surface or the like may be any part of the optical path from the light source to the eye.
本発明によれば、液晶パネルの欠陥、特に白欠陥を容易
に修正でき、液晶ディスプレイのコストダウンに効果的
である。According to the present invention, defects in a liquid crystal panel, particularly white defects, can be easily corrected, which is effective in reducing the cost of liquid crystal displays.
第1図は本発明の液晶ディスプレイの模式図を示す。 0 部分。 ・液晶パネル、 0 欠陥部分、 表面 FIG. 1 shows a schematic diagram of a liquid crystal display of the present invention. 0 part. ・LCD panel, 0 defective part, surface
Claims (1)
して不透明にしたことを特徴とする液晶ディスプレイ。 2、液晶パネルにおける白欠陥部分の基板表面を粗面化
して不透明にすることを特徴とする液晶ディスプレイの
製造方法。 3、請求項第2項において、基板表面の粗面化は、レー
ザビーム照射、サンドブラストによることを特徴とする
液晶ディスプレイの製造方法。 4、請求項第1項において、液晶パネルはノーマリブラ
ツクモードであり、白欠陥は点欠であることを特徴とす
る液晶ディスプレイ。[Scope of Claims] 1. A liquid crystal display characterized in that the substrate surface of the white defect portion of the liquid crystal panel is roughened to make it opaque. 2. A method for manufacturing a liquid crystal display, which comprises roughening the substrate surface of the white defect portion of the liquid crystal panel to make it opaque. 3. The method of manufacturing a liquid crystal display according to claim 2, wherein the roughening of the substrate surface is performed by laser beam irradiation or sandblasting. 4. The liquid crystal display according to claim 1, wherein the liquid crystal panel is in a normally black mode, and the white defects are dots.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2064220A JP2796398B2 (en) | 1990-03-16 | 1990-03-16 | LCD display |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2064220A JP2796398B2 (en) | 1990-03-16 | 1990-03-16 | LCD display |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH03265820A true JPH03265820A (en) | 1991-11-26 |
JP2796398B2 JP2796398B2 (en) | 1998-09-10 |
Family
ID=13251802
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2064220A Expired - Lifetime JP2796398B2 (en) | 1990-03-16 | 1990-03-16 | LCD display |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2796398B2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04353821A (en) * | 1991-05-31 | 1992-12-08 | Sharp Corp | Liquid crystal display device and its defect correcting method |
JPH0980476A (en) * | 1995-09-12 | 1997-03-28 | Nec Corp | Active matrix substrate and its manufacture |
US6239856B1 (en) | 1998-04-28 | 2001-05-29 | Matsushita Electric Industrial Co., Ltd. | Liquid crystal panel and its manufacturing method |
-
1990
- 1990-03-16 JP JP2064220A patent/JP2796398B2/en not_active Expired - Lifetime
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04353821A (en) * | 1991-05-31 | 1992-12-08 | Sharp Corp | Liquid crystal display device and its defect correcting method |
JPH0980476A (en) * | 1995-09-12 | 1997-03-28 | Nec Corp | Active matrix substrate and its manufacture |
US6239856B1 (en) | 1998-04-28 | 2001-05-29 | Matsushita Electric Industrial Co., Ltd. | Liquid crystal panel and its manufacturing method |
Also Published As
Publication number | Publication date |
---|---|
JP2796398B2 (en) | 1998-09-10 |
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