JPH0266544U - - Google Patents
Info
- Publication number
- JPH0266544U JPH0266544U JP14524088U JP14524088U JPH0266544U JP H0266544 U JPH0266544 U JP H0266544U JP 14524088 U JP14524088 U JP 14524088U JP 14524088 U JP14524088 U JP 14524088U JP H0266544 U JPH0266544 U JP H0266544U
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- defect
- image signal
- image
- length
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 claims description 5
- 230000007547 defect Effects 0.000 claims 10
- 238000001514 detection method Methods 0.000 claims 1
- 238000007689 inspection Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 8
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Controlling Sheets Or Webs (AREA)
Description
第1図は本考案を自動選別装置に適用した構成
図、第2図は本考案の画像処理装置の処理手順を
示すフローチヤート図、第3図は本考案の処理手
順のなかで使用する差分フイルタの例を示す図、
第4図は本考案の処理手順のなかで使用するノイ
ズ除去の為の論理フイルタの例を示す図、第5図
は本考案の処理手順にそつて実際に処理した画像
の例を示す図、第6図は本考案の画像処理装置内
の構成を示すブロツク図、第7図は従来の装置を
示す図、第7,1図は従来の欠陥有無判断の処理
手順を示す図、第7,2図は従来の2値化処理画
像の例を示す図である。
Fig. 1 is a block diagram of the invention applied to an automatic sorting device, Fig. 2 is a flowchart showing the processing procedure of the image processing device of the invention, and Fig. 3 is a difference diagram used in the processing procedure of the invention. A diagram showing an example of a filter,
FIG. 4 is a diagram showing an example of a logical filter for noise removal used in the processing procedure of the present invention, and FIG. 5 is a diagram showing an example of an image actually processed according to the processing procedure of the present invention. FIG. 6 is a block diagram showing the internal configuration of the image processing device of the present invention, FIG. 7 is a diagram showing a conventional device, FIGS. FIG. 2 is a diagram showing an example of a conventional binarized image.
Claims (1)
置を有し、前記光源から走行するシート材に光を
照射し、その反射光または透過光による前記シー
ト材の画像を前記カメラにより2次元画像として
取込み、前記画像処理装置により前記画像から前
記シート材の欠陥をリアルタイムに検出する欠陥
検出装置において、 前記画像処理装置11は画像情報を同期パルス
に同期して取込みラツチする画像信号ラツチ回路
61と、前記ラツチ回路からの画像信号を差分フ
イルタ処理する差分フイルタ処理回路62と、前
記差分フイルタ回路からの画像信号を2値化処理
する2値化処理回路63と、前記2値化処理回路
からの画像信号からノイズを除去するために論理
フイルタ処理を行う論理フイルタ処理回路64と
、前記論理フイルタ処理回路からの画像信号から
欠陥の連結成分の長さを計算する欠陥長演算回路
67と欠陥長とする基準値を記憶する欠陥長メモ
リ68と、前記欠陥長演算回路からの画像信号と
前記欠陥長メモリ68からの基準長画像信号を比
較し、欠陥の有無を判断する比較回路69を具備
することを特徴とするシート材の欠陥処理装置。[Claims for Utility Model Registration] A light source, an inspection cylinder, a synchronization device, a camera, and an image processing device, which irradiates light from the light source onto a traveling sheet material, and images the sheet material using reflected or transmitted light. In a defect detection device that captures image information as a two-dimensional image using the camera, and detects defects in the sheet material from the image using the image processing device in real time, the image processing device 11 captures image information in synchronization with a synchronization pulse. an image signal latch circuit 61 that processes the image signal from the latch circuit, a differential filter processing circuit 62 that performs differential filter processing on the image signal from the latch circuit, a binarization processing circuit 63 that performs binarization processing on the image signal from the differential filter circuit, and a logical filter processing circuit 64 that performs logical filter processing to remove noise from the image signal from the binarization processing circuit; and a defect length that calculates the length of a connected component of a defect from the image signal from the logical filter processing circuit. An arithmetic circuit 67 and a defect length memory 68 that stores a reference value as a defect length compare the image signal from the defect length arithmetic circuit with the reference length image signal from the defect length memory 68 to determine the presence or absence of a defect. A sheet material defect processing device characterized by comprising a comparison circuit 69.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14524088U JPH0266544U (en) | 1988-11-07 | 1988-11-07 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14524088U JPH0266544U (en) | 1988-11-07 | 1988-11-07 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0266544U true JPH0266544U (en) | 1990-05-18 |
Family
ID=31413658
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14524088U Pending JPH0266544U (en) | 1988-11-07 | 1988-11-07 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0266544U (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62235551A (en) * | 1986-04-04 | 1987-10-15 | Mitsubishi Paper Mills Ltd | Defect position display of strip object |
JPS63222246A (en) * | 1987-03-11 | 1988-09-16 | Shokuhin Sangyo Onrain Sensor Gijutsu Kenkyu Kumiai | Defect inspector for bottle mouth thread part |
-
1988
- 1988-11-07 JP JP14524088U patent/JPH0266544U/ja active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62235551A (en) * | 1986-04-04 | 1987-10-15 | Mitsubishi Paper Mills Ltd | Defect position display of strip object |
JPS63222246A (en) * | 1987-03-11 | 1988-09-16 | Shokuhin Sangyo Onrain Sensor Gijutsu Kenkyu Kumiai | Defect inspector for bottle mouth thread part |
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