JPH0215873A - Liquid purifying device for soldering device - Google Patents
Liquid purifying device for soldering deviceInfo
- Publication number
- JPH0215873A JPH0215873A JP16414988A JP16414988A JPH0215873A JP H0215873 A JPH0215873 A JP H0215873A JP 16414988 A JP16414988 A JP 16414988A JP 16414988 A JP16414988 A JP 16414988A JP H0215873 A JPH0215873 A JP H0215873A
- Authority
- JP
- Japan
- Prior art keywords
- liquid
- contaminated
- reflow
- inactive liquid
- section
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000007788 liquid Substances 0.000 title claims abstract description 41
- 238000005476 soldering Methods 0.000 title claims abstract description 12
- 229920006395 saturated elastomer Polymers 0.000 claims abstract description 8
- 238000000746 purification Methods 0.000 claims description 16
- 239000012535 impurity Substances 0.000 claims description 10
- 229910000679 solder Inorganic materials 0.000 claims description 7
- 238000001816 cooling Methods 0.000 claims description 6
- 238000011084 recovery Methods 0.000 claims description 2
- 239000000155 melt Substances 0.000 claims 1
- 239000000758 substrate Substances 0.000 abstract description 11
- 230000004907 flux Effects 0.000 abstract description 6
- 238000000034 method Methods 0.000 abstract description 4
- 238000011109 contamination Methods 0.000 abstract description 2
- 238000002834 transmittance Methods 0.000 description 5
- 238000001514 detection method Methods 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 239000012442 inert solvent Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Abstract
Description
【発明の詳細な説明】
産業上の利用分野
本発明は、不活性溶剤を使用する半田付装置の液浄化装
置に関するものである。DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a liquid purification device for a soldering device using an inert solvent.
従来の技術
近年、電子部品をプリント基板へ自動装着する装置は目
覚しいものがある。それと共に、プリント基板上の電子
部品を半田付する装置もよシ速くより確実に出来るよう
に要求されてきた。その中で、半田付けする装置での不
活性液体を用い、これを加熱して飽和蒸気にし、その熱
でハンダを溶―する方法において、この不活性液体がフ
ラックスなどの不純物により汚れていた。2. Description of the Related Art In recent years, there have been some remarkable devices that automatically attach electronic components to printed circuit boards. At the same time, there has been a demand for devices that solder electronic components on printed circuit boards to be faster and more reliable. Among them, in the method of using an inert liquid in the soldering equipment, heating it to saturated steam, and melting the solder with the heat, this inert liquid was contaminated with impurities such as flux.
そこで従来では、第4図に示すように浄化装置16を用
い、液の汚れを目視し、手動で循環させていたが、手動
では不便なので(イ)に示すように、タイマー28等に
よυ一定時間をセットすることにより定期的に浄化装置
16へ循環させ液を浄化していた。他に(ロ)に示すよ
うに浄化装置16に常に循環させ浄化する方法もあった
。又、基板22の処理枚数を計数して、一定時間だけ定
期的に浄化装置16へ循・環させ浄化する装置がある。Conventionally, as shown in Fig. 4, a purifier 16 was used to visually check the liquid for dirt and circulate it manually. By setting a certain period of time, the liquid was periodically circulated to the purifying device 16 to purify the liquid. There is also a method of purifying the water by constantly circulating it in the purifier 16 as shown in (b). There is also a device that counts the number of processed substrates 22 and periodically circulates and purifies them to the purifying device 16 for a certain period of time.
なお、第4図において、6は電子部品が装着された基板
22を搬送するコンベア、13および14は配管、27
はポンプ、11はリフロータンク、32は加熱部、33
は冷却部、29は光学センサ、3oは計数装置、31は
ポンプ駆動指令装置である。In addition, in FIG. 4, 6 is a conveyor that conveys the board 22 on which electronic components are mounted, 13 and 14 are piping, and 27
is a pump, 11 is a reflow tank, 32 is a heating section, 33
29 is a cooling unit, 29 is an optical sensor, 3o is a counting device, and 31 is a pump drive command device.
発明が解決しようとする課題
しかしながら、従来の方法では、不活性液体自身の濃度
、汚れには関係なく浄化装置が作動を行なう為無駄が生
じ、又、液管理が不適当となり、又、コストも上がる問
題を生じていた。Problems to be Solved by the Invention However, in the conventional method, the purification device operates regardless of the concentration or contamination of the inert liquid itself, resulting in waste, inappropriate liquid management, and high cost. This was causing a growing problem.
課題を解決するための手段
そして、前記問題を解決する本発明の手段は、不活性液
体を加熱ヒーターで加熱し、不活性飽和蒸気で基板上の
ハンダを溶融し、ノ1ンダ付けをするリフロー部と、こ
の不活性液体をストックするリフロータンクと、このリ
フロータンクと連結された浄化装置を備え、前記リフロ
ータンク内の不活性液体の不純物濃度を検出する制御装
置が浄化装置へ循環させるものである。Means for Solving the Problems The means of the present invention for solving the above problems is a reflow process in which an inert liquid is heated with a heater, the solder on the board is melted with inert saturated steam, and solder is applied. A reflow tank for stocking the inert liquid, and a purification device connected to the reflow tank, and a control device for detecting the impurity concentration of the inert liquid in the reflow tank circulates it to the purification device. be.
作 用
前記手段によシ、リフロータンク内の不活性液体の濃度
、汚れにより制御装置が判断を行ない浄化装置を作動し
、リフロータンクと浄化装置を不活性液体が循環するよ
うに行なう。Operation: According to the above-mentioned means, the control device makes a judgment based on the concentration and dirt of the inert liquid in the reflow tank, operates the purification device, and circulates the inert liquid through the reflow tank and the purification device.
実施例
第1図は、本発明の実施例としての半田付装置の全体図
を示し、第2図は、同半田付装置の断面詳細を示す。以
下、第1図において、半田付装置の構成を述べる。Embodiment FIG. 1 shows an overall view of a soldering device as an embodiment of the present invention, and FIG. 2 shows a detailed sectional view of the same soldering device. The configuration of the soldering device will be described below with reference to FIG.
1は半田付装置全体を示し、搬入部17.予熱部18と
、リフロー部19及び冷却、搬出部2゜とに分かれてお
りコンベア5により、基板22は搬送される。2は基板
22の入口を示し、基板22はへ方向(矢印)のように
搬入される。予熱部18には、上部予熱ヒーター3と、
下部予熱ヒーター4が設けられ、下部に電気盤16が置
かれている。1 shows the entire soldering apparatus, and includes a loading section 17. The substrate 22 is divided into a preheating section 18, a reflow section 19, and a cooling/unloading section 2°, and the substrate 22 is conveyed by a conveyor 5. 2 indicates the entrance of the substrate 22, and the substrate 22 is carried in in the direction (arrow). The preheating section 18 includes an upper preheating heater 3;
A lower preheating heater 4 is provided, and an electric panel 16 is placed at the lower part.
リフロー部19では、入口に排気口6と、出口に排気口
dが設けられ、中央下部にリフロータンク11と、加熱
ヒーター12が装着され、この中に不活性液体が投入さ
れている。The reflow section 19 is provided with an exhaust port 6 at the inlet and an exhaust port d at the outlet, and a reflow tank 11 and a heater 12 are installed at the lower center, into which an inert liquid is charged.
そして、蒸気吹出口21の両側に冷却器7が設けられ、
冷却し凝縮した液体中に含まれた不純物を取り除き、浄
化装置がリフロー部19の左側下部に設けられている。A cooler 7 is provided on both sides of the steam outlet 21,
A purification device is provided at the lower left side of the reflow section 19 to remove impurities contained in the cooled and condensed liquid.
そして、前記排気口6及び6′と排気回収部1゜に連結
され矢印B方向に吸引されるようになっている。搬出部
20は、基板22を冷却する冷却ファン8が設けられ、
コンベア6を駆動する駆動モーター9が設けられている
。The exhaust ports 6 and 6' are connected to the exhaust gas recovery section 1° so that the exhaust gas is sucked in the direction of arrow B. The unloading section 20 is provided with a cooling fan 8 that cools the substrate 22.
A drive motor 9 for driving the conveyor 6 is provided.
リフロータンク11には赤外線検出装置23゜23′を
設け、次に制御装置24が設けられ、制御装置24にあ
らかじめ任意に設定された波長と透過率により出力が行
なわれる。前記出力によシスイッチ26が入切され、ポ
ンプ26が運転、停止する。前記リフロータンク11よ
り配管14.13が設けられ、浄化装置16に連結され
ている。この浄化装置16には、フィルター28が内蔵
され、ポンプ27が設けられている。The reflow tank 11 is provided with an infrared detection device 23°, 23', and then a control device 24, and output is performed according to a wavelength and transmittance arbitrarily set in the control device 24 in advance. Depending on the output, the switch 26 is turned on and off, and the pump 26 is operated and stopped. Pipes 14 and 13 are provided from the reflow tank 11 and connected to a purification device 16. This purifying device 16 has a built-in filter 28 and a pump 27.
次に作用について、第1図及び第2図を参照して述べる
。Next, the operation will be described with reference to FIGS. 1 and 2.
電子部品が基板22へ装着された後、本装置1の搬入部
17にへ方向へ移載された予熱部18へ搬送され、上部
予熱ヒーター3及び下部予熱ヒーター4により基板22
が予熱される。更に基板22は、リフロー部19へ搬送
される。リフロータンク11内の不活性液体が加熱ヒー
ター12により加熱され不活性飽和蒸気が発生し、蒸気
吹出口21より吹き出す。基板22は、ここで加熱され
半田付けが行なわれる。After the electronic components are mounted on the board 22, they are transferred to the preheating section 18, which is transferred in the forward direction to the loading section 17 of the device 1, and the board 22 is heated by the upper preheating heater 3 and the lower preheating heater 4.
is preheated. Furthermore, the substrate 22 is transported to the reflow section 19. The inert liquid in the reflow tank 11 is heated by the heater 12 to generate inert saturated steam, which is blown out from the steam outlet 21. The board 22 is heated here and soldered.
そして、リフロー部19よシ搬送され、搬出部26にて
冷却ファン8より基板22は冷却され、A′方向へ搬出
される。The substrate 22 is then transported through the reflow section 19, cooled by the cooling fan 8 at the unloading section 26, and unloaded in the A' direction.
前記リフロータンク11内の不活性液体が加熱され、不
活性飽和蒸気となり基板22の半田付けを行なう際、ハ
ンダ中のフラックス等が、不活性液体中に入り、液が汚
れていく。第3図は、縦軸が透過率を示し、横軸が波長
を示しだもので、この図において、フラックス等は、a
−b間の波長で、図のような特性を示し、通常はb −
c間の波長グラフのように平衡を保ち、c −d間の波
長においては、不安定領域を示している。この作用にて
、第2図に示すように、このリフロータンク11に装着
された赤外線検出器23及び23′により、この不活性
液体の濃度を波長と透過率により制御装置24が判断を
行ない、その信号が出力され、スイッチ25を動作する
。そして、ポンプ27が動作を行ない、リフロータンク
11内の液は、配管14よりポンプ27を通り、浄化装
置16のフィルター26を通シ、フラックス等の不純物
を除去し、矢印Cのように流れ、配管13を通シ、リフ
ロータンク11内へ戻り循環する。そして、前記赤外線
検出装置23及び23′により、不純物が無くなり、濃
度が一定値まで下がると、前記赤外線検出装置23及び
23′が検出を行ない、アンプによシスイッチ25を切
る。この時、装置全体は停止し、浄化完了後、運転を自
動的に開始する。When the inert liquid in the reflow tank 11 is heated and turned into inert saturated vapor to solder the board 22, flux and the like in the solder enters the inert liquid and the liquid becomes contaminated. In Figure 3, the vertical axis shows transmittance and the horizontal axis shows wavelength. In this figure, flux etc.
At wavelengths between -b, it exhibits the characteristics shown in the figure, and usually b -
As shown in the wavelength graph between c and d, equilibrium is maintained, and the wavelength between c and d shows an unstable region. As a result of this action, as shown in FIG. 2, the control device 24 determines the concentration of the inert liquid based on the wavelength and transmittance using the infrared detectors 23 and 23' attached to the reflow tank 11. The signal is output and operates the switch 25. Then, the pump 27 operates, and the liquid in the reflow tank 11 passes through the pump 27 from the pipe 14, passes through the filter 26 of the purification device 16, removes impurities such as flux, and flows as shown by arrow C. It passes through the piping 13 and returns to the reflow tank 11 for circulation. Then, when the impurities are eliminated and the concentration drops to a certain value, the infrared detection devices 23 and 23' perform detection and turn off the amplifier switch 25. At this time, the entire device stops, and after completion of purification, operation automatically starts.
又、一定時間内循環を行ない運転を自動的に開始をする
こともできる。It is also possible to perform circulation within a certain period of time and automatically start operation.
発明の効果
以上のように、本発明によれば、従来のように液の汚れ
に関係なく浄化を行なわないでいい為、経費のコストダ
ウン又は、浄化袋・置の確動率を上げることが出来、又
、赤外線の波長及び透過率による為、不活性液体の中の
不純物を確実に検出でき、よりよい液の管理が行なうこ
とが出来る。Effects of the Invention As described above, according to the present invention, there is no need to perform purification regardless of whether the liquid is contaminated, as in the past, so it is possible to reduce costs and increase the reliability of purification bags and placement. Moreover, since it is based on the wavelength and transmittance of infrared rays, impurities in the inert liquid can be reliably detected, allowing better liquid management.
第1図は本発明の一実施例の全体正面図、第2図は同要
部の断面図、第3図は赤外線の波長と透過率の特性図、
第4図は従来例の正面図である。
1・・・・・・半田付装置、3,4・・・・・・予熱ヒ
ーター6・・・・・・コンベア、8・・・・・・冷却フ
ァン、11・・・・・・リフロータンク、12・・・・
・・7111熱ヒーター、15・・・・・・浄化装置、
23・・・・・・検出装置、26・・・・・・フィルり
代理人の氏名 弁理士 粟 野 重 孝 ほか1名第
図
2り
第
図
宕
ト家
ジFIG. 1 is an overall front view of an embodiment of the present invention, FIG. 2 is a cross-sectional view of the essential parts, and FIG. 3 is a characteristic diagram of infrared wavelength and transmittance.
FIG. 4 is a front view of the conventional example. 1... Soldering device, 3, 4... Preheating heater 6... Conveyor, 8... Cooling fan, 11... Reflow tank , 12...
...7111 thermal heater, 15...purification device,
23... Detection device, 26... Name of filling agent, patent attorney Shigetaka Awano, and one other person.
Claims (1)
基板上の半田を溶融し半田付をするリフロー部と、不活
性飽和蒸気を冷却して不活性液体を回収する冷却部と、
リフロー部に設けた排気口より排出された蒸気を吸引し
回収する排気回収部と、回収された不活性液体中の不純
物を除去する浄化装置と、前記リフロー部に設けられた
リフロータンク内の不活性液体を不純物濃度を検出し、
不純物濃度が所定値より高い場合に不活性液体を前記浄
化装置へ循環させるように制御する制御装置とを備えて
なる半田付装置の液浄化装置。a reflow section that heats an inert liquid with a heater and melts the solder on the board with inert saturated vapor to perform soldering; a cooling section that cools the inert saturated vapor and recovers the inert liquid;
An exhaust recovery section that sucks and recovers steam discharged from an exhaust port provided in the reflow section, a purification device that removes impurities from the recovered inert liquid, and an impurity in the reflow tank provided in the reflow section. Detects impurity concentration in active liquids,
A liquid purification device for a soldering device, comprising: a control device that controls the inert liquid to be circulated to the purification device when an impurity concentration is higher than a predetermined value.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16414988A JP2625918B2 (en) | 1988-06-30 | 1988-06-30 | Liquid purification equipment for soldering equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16414988A JP2625918B2 (en) | 1988-06-30 | 1988-06-30 | Liquid purification equipment for soldering equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0215873A true JPH0215873A (en) | 1990-01-19 |
JP2625918B2 JP2625918B2 (en) | 1997-07-02 |
Family
ID=15787673
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16414988A Expired - Lifetime JP2625918B2 (en) | 1988-06-30 | 1988-06-30 | Liquid purification equipment for soldering equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2625918B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001243245A (en) * | 2000-03-01 | 2001-09-07 | Nippon Telegr & Teleph Corp <Ntt> | Similar sentence retrieving method, its device and recording medium storing similar sentence retrieval program |
US6476151B1 (en) | 1997-12-26 | 2002-11-05 | Daikin Industries, Ltd. | Heat-resistant material and coating material for OA equipments having flexibility |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1345481B1 (en) | 2000-12-21 | 2009-09-16 | Fujitsu Limited | Reflow soldering apparatus and reflow soldering method |
-
1988
- 1988-06-30 JP JP16414988A patent/JP2625918B2/en not_active Expired - Lifetime
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6476151B1 (en) | 1997-12-26 | 2002-11-05 | Daikin Industries, Ltd. | Heat-resistant material and coating material for OA equipments having flexibility |
US6838139B2 (en) | 1997-12-26 | 2005-01-04 | Daikin Industries, Ltd. | Heat-resistant material and coating material for OA equipments having flexibility |
USRE41110E1 (en) * | 1997-12-26 | 2010-02-09 | Daikin Industries, Ltd. | Heat-resistant material and coating material for OA equipments having flexibility |
JP2001243245A (en) * | 2000-03-01 | 2001-09-07 | Nippon Telegr & Teleph Corp <Ntt> | Similar sentence retrieving method, its device and recording medium storing similar sentence retrieval program |
Also Published As
Publication number | Publication date |
---|---|
JP2625918B2 (en) | 1997-07-02 |
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