[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

JPH02128963U - - Google Patents

Info

Publication number
JPH02128963U
JPH02128963U JP3681989U JP3681989U JPH02128963U JP H02128963 U JPH02128963 U JP H02128963U JP 3681989 U JP3681989 U JP 3681989U JP 3681989 U JP3681989 U JP 3681989U JP H02128963 U JPH02128963 U JP H02128963U
Authority
JP
Japan
Prior art keywords
conductive contact
contact pins
contacts
pin
pin body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3681989U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3681989U priority Critical patent/JPH02128963U/ja
Publication of JPH02128963U publication Critical patent/JPH02128963U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案の一実施例における一方の導
電接触ピンを示す縦断側面図、第2図はその平面
図、第3図は測定例を示す説明図である。 図面において、1は導電接触ピン、2,3は接
触ピン本体、4,5はヘツド、6,7は傾斜面、
8は絶縁材、9はスリーブ、12,13はスペー
サ、18,19はコイルスプリングである。
FIG. 1 is a longitudinal sectional side view showing one conductive contact pin in an embodiment of the invention, FIG. 2 is a plan view thereof, and FIG. 3 is an explanatory diagram showing a measurement example. In the drawing, 1 is a conductive contact pin, 2 and 3 are contact pin bodies, 4 and 5 are heads, 6 and 7 are inclined surfaces,
8 is an insulating material, 9 is a sleeve, 12 and 13 are spacers, and 18 and 19 are coil springs.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 4本の導電接触ピンを試料に接触させ、特定の
2本の前記導電接触ピンを電流端子とし、残りの
2本の前記導電接触ピン間に現れる電位差によつ
て前記試料の抵抗値を測定する4端子測定に用い
られる導電接触ピンにおいて、前記各導電接触ピ
ンはピン本体と、このピン本体の先端に取付けら
れた尖端を有する接触子とで構成され、電流用と
電位差用の2本の前記接触子が互いに接触しない
ように並列的にかつ摺動自在に保持する保持部材
を有し、前記接触子と前記保持部材間の前記ピン
本体には前記接触子と上方に弾性的に押圧するス
プリング部材が介在されていることを特徴とする
4端子測定用導電接触ピン。
Four conductive contact pins are brought into contact with the sample, two specific conductive contact pins are used as current terminals, and the resistance value of the sample is measured based on the potential difference that appears between the remaining two conductive contact pins. In a conductive contact pin used for four-terminal measurement, each of the conductive contact pins is composed of a pin body and a contact having a tip attached to the tip of the pin body, and two of the conductive contact pins are used for current and potential difference. It has a holding member that holds the contacts in a parallel and slidable manner so that they do not come into contact with each other, and a spring that elastically presses the contacts upward is provided in the pin body between the contacts and the holding member. A conductive contact pin for four-terminal measurement, characterized in that a member is interposed therebetween.
JP3681989U 1989-03-30 1989-03-30 Pending JPH02128963U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3681989U JPH02128963U (en) 1989-03-30 1989-03-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3681989U JPH02128963U (en) 1989-03-30 1989-03-30

Publications (1)

Publication Number Publication Date
JPH02128963U true JPH02128963U (en) 1990-10-24

Family

ID=31543386

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3681989U Pending JPH02128963U (en) 1989-03-30 1989-03-30

Country Status (1)

Country Link
JP (1) JPH02128963U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010008132A (en) * 2008-06-25 2010-01-14 Kiyota Seisakusho:Kk Two-probe kelvin probe

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS603474B2 (en) * 1976-04-12 1985-01-28 モンサント・カンパニ− Cell culture method and reactor

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS603474B2 (en) * 1976-04-12 1985-01-28 モンサント・カンパニ− Cell culture method and reactor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010008132A (en) * 2008-06-25 2010-01-14 Kiyota Seisakusho:Kk Two-probe kelvin probe

Similar Documents

Publication Publication Date Title
JPH02128963U (en)
JPH0611464Y2 (en) Resistance measurement probe
JPS6333472U (en)
JPH032265U (en)
JPS613473U (en) Contact for low resistance measurement
JPS63187064U (en)
JPH0342575U (en)
JPS6157867U (en)
JPS62115674U (en)
JPS61165466U (en)
JPH02131272U (en)
JPH0365973U (en)
JPS6214388U (en)
JPS63100839U (en)
JPS63145171U (en)
JPS6450371U (en)
JPS5866368U (en) electrical measurement jig
JPS6329748U (en)
JPH01179285U (en)
JPS608877U (en) electrical measuring instrument probe
JPS629174U (en)
JPS6083968U (en) Simple surface resistance measuring device
JPS5889867U (en) Contactor for IC testing machine
JPH0378282U (en)
JPS6128063U (en) Continuity test probe