JPH0211789Y2 - - Google Patents
Info
- Publication number
- JPH0211789Y2 JPH0211789Y2 JP14030784U JP14030784U JPH0211789Y2 JP H0211789 Y2 JPH0211789 Y2 JP H0211789Y2 JP 14030784 U JP14030784 U JP 14030784U JP 14030784 U JP14030784 U JP 14030784U JP H0211789 Y2 JPH0211789 Y2 JP H0211789Y2
- Authority
- JP
- Japan
- Prior art keywords
- contact
- piece
- partition wall
- socket
- package
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005192 partition Methods 0.000 claims description 45
- 230000003014 reinforcing effect Effects 0.000 claims description 29
- 239000011295 pitch Substances 0.000 description 8
- 239000000919 ceramic Substances 0.000 description 4
- 230000001105 regulatory effect Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 239000002131 composite material Substances 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000002787 reinforcement Effects 0.000 description 2
- 229920003002 synthetic resin Polymers 0.000 description 2
- 239000000057 synthetic resin Substances 0.000 description 2
- 238000005299 abrasion Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Connecting Device With Holders (AREA)
Description
【考案の詳細な説明】
産業上の利用分野
本考案はICパツケージの検査用若しくは実装
用等に用いられるICソケツトに関し、殊にICソ
ケツトのICパツケージ搭載部に並設した隔壁間
にICパツケージの側面に並設されたIC接片を介
入しつつ、該隔壁間に配置したコンタクトと上記
IC接片との接触を得るようにしたICソケツトに
係る。[Detailed description of the invention] Industrial application field The present invention relates to an IC socket used for inspecting or mounting an IC package, and in particular, the invention relates to an IC socket used for inspecting or mounting an IC package. While intervening the IC contact pieces arranged in parallel on the side, the contacts placed between the partition walls and the above
This invention relates to an IC socket that makes contact with an IC contact piece.
従来の技術
従来よりデユアルインラインICパツケージの
如きはIC接片をICソケツトのコンタクトで挾持
し接触を図る挾接形態を採り、又フラツト形IC
パツケージあるいはリードレス形ICパツケージ
の如きはIC接片をICソケツトのコンタクトの上
に載せ接触を図る載接形態を採るのが普通であ
る。Conventional technology Conventionally, dual in-line IC packages have adopted a clamping type in which the IC contact piece is held between the contacts of an IC socket to make contact, and flat type ICs have also been used.
A package or a leadless IC package usually adopts a mounting configuration in which an IC contact piece is placed on top of the contact of an IC socket to make contact.
而して後者の場合には通常第1図に示すよう
に、ICソケツト基盤1のIC搭載部の二辺乃至四
辺にコンタクト隔壁2を櫛歯状に並設し、該隔壁
端面でICパツケージ3の搭載スペース4を画成
し、ICパツケージ3をこのスペース4へ受け入
れつつ、ICパツケージ3の側部に並設されたIC
接片5を上記コンタクト隔壁2間に植込配置した
コンタクト6上に載接する接触手段が採られる。
然るにこの場合、IC接片5がコンタクト隔壁2
間に介入(換言すれば隔壁2がIC接片5間に介
入)されるとIC接片5の側縁と隔壁2内側面と
の間に摩擦が生ずる。 In the latter case, as shown in FIG. 1, contact partition walls 2 are usually arranged in a comb-like shape on two to four sides of the IC mounting portion of the IC socket board 1, and the IC package 3 is connected to the end surface of the partition walls. A mounting space 4 is defined for the IC package 3, and while the IC package 3 is received in this space 4, the ICs installed in parallel on the side of the IC package 3 are
A contact means is employed in which the contact piece 5 is placed on the contact 6 implanted between the contact partition walls 2.
However, in this case, the IC contact piece 5 is connected to the contact partition wall 2.
When the partition wall 2 intervenes between the IC contact pieces 5 (in other words, the partition wall 2 intervenes between the IC contact pieces 5), friction occurs between the side edge of the IC contact piece 5 and the inner surface of the partition wall 2.
殊に検査用ICソケツトの場合にはICパツケー
ジ3の着脱頻度、即ちこの摩擦頻度が非常に高
く、一体成形による合成樹脂隔壁では早期摩耗を
生じがちであり、ガタ、位置決作用の喪失等を招
来する。 In particular, in the case of IC sockets for testing, the frequency of attachment and detachment of the IC package 3, that is, the frequency of this friction, is extremely high, and synthetic resin bulkheads that are integrally molded tend to wear out prematurely, resulting in looseness, loss of positioning function, etc. Invite.
例えば、IC接片5のICパツケージ3の側面か
らの突出量が小さい場合にはIC接片5が隔壁2
の端面付近に介入されるのでICパツケージ側面
を規制する隔壁2縁部の極部減損を生ずる。 For example, if the amount of protrusion of the IC contact piece 5 from the side surface of the IC package 3 is small, the IC contact piece 5 may be attached to the partition wall 2.
Since it intervenes near the end face of the IC package, the edge of the partition wall 2 that restricts the side surface of the IC package is damaged.
又近年高密度接触、小形化等の要請からIC接
片5の並設ピツチが益々狭小化してきている。し
かもこの場合、IC接片5の強度を保持するため、
同接片を細くせずに並設ピツチのみを縮小したい
との要望がある。 Furthermore, in recent years, due to demands for high-density contact, miniaturization, etc., the pitch in which the IC contacts 5 are arranged side by side has become narrower and narrower. Moreover, in this case, in order to maintain the strength of the IC contact piece 5,
There is a desire to reduce only the parallel pitch without making the tangent pieces thinner.
従つて必然的にIC接片間の間隔も小さくなる
から接片間に介入されるコンタクト隔壁2の厚み
も可及的に薄くせねばならないことになるが、成
形技術的な問題からコンタクト隔壁2の薄肉化に
は限界があり、又余り薄くすると通常の使用に耐
え得る壁強度を保ち得ないとの問題もある。 Therefore, the interval between the IC contact pieces inevitably becomes smaller, so the thickness of the contact partition wall 2 interposed between the contact pieces must be made as thin as possible. However, due to molding technology problems, the contact partition wall 2 There is a limit to how thin the wall can be made, and there is also the problem that if it is made too thin, it will not be able to maintain wall strength that can withstand normal use.
考案が解決しようとする問題点
本考案は上記IC接片の微小ピツチ化、従つて
接片間隔の狭小化によつて生ずる課題、即ちIC
ソケツトにおけるコンタクト隔壁の薄肉化の限界
を効果的に打開せんとするものである。Problems to be Solved by the Invention This invention solves the problems caused by the miniaturization of the pitch of the IC contact pieces and the narrowing of the interval between the contact pieces.
This is an attempt to effectively overcome the limitations of thinning contact partition walls in sockets.
又本考案は頻度の高いICパツケージに対して
もコンタクト隔壁に充分な強度を保有させ、摩耗
を効果的に防止し得るようにしたICソケツトを
提供せんとするものである。 Further, the present invention aims to provide an IC socket in which the contact partition wall has sufficient strength to effectively prevent wear even in the case of frequently used IC packages.
コンタクトに供されるIC接片自身をその側縁
と前縁の同時規制により、コンタクトに対する
IC接片の相対位置を適正に保ち微小ピツチ下で
の接触を確保するICソケツトを提供するもので
ある。 By simultaneously regulating the side edges and front edges of the IC contact piece itself that is used for the contact, it is possible to
The present invention provides an IC socket that maintains proper relative position of IC contact pieces and ensures contact under minute pitches.
問題点を解決するための手段
本考案は上記問題を解決するため、従来一体成
形樹脂で形成されていたコンタクト隔壁におい
て、該コンタクト隔壁にセラミツク等の補強片を
一体に設け、該補強片を上記コンタクト隔壁の端
面より突出させ、該突出部の側位にコンタクト隔
壁端面によりIC接片の前縁と対峙する段部を形
成し、該補強片突出部を上記IC接片間に介入さ
せ、換言すればIC接片を隣接する補強片突出部
間へ介入し位置規制しつつ、上記段部によりIC
接片の前縁を規制し、コンタクトとの接触を得る
ように構成したものである。Means for Solving the Problems In order to solve the above-mentioned problems, the present invention aims to solve the above-mentioned problems by integrally providing a reinforcing piece of ceramic or the like on the contact partition wall, which has conventionally been formed of integrally molded resin. Protruding from the end face of the contact partition wall, forming a step portion facing the front edge of the IC contact piece by the contact partition end face on the side of the projecting part, and intervening the reinforcing piece protrusion part between the IC contact pieces, in other words. Then, while intervening the IC contact piece between the adjacent reinforcing piece protrusions and regulating the position, the IC contact piece is
The front edge of the contact piece is regulated so as to make contact with the contact.
作 用
上記によつてICソケツトへのICパツケージ着
脱に際し、そのIC接片はコンタクト隔壁端面よ
り突出せる上記補強片に規制されつつ、同補強片
突出部間に介入されコンタクトとの対応せる接触
が果される。該補強片の付加によつてコンタクト
隔壁のIC接片が介入する端縁部を可及的に薄肉
化し、微小ピツチ且つ狭小間隔のIC接片の配列
に効果的に対処し、なお且つICパツケージの繰
り返し着脱に伴なう摩耗防止を図る。As a result of the above, when the IC package is attached to or removed from the IC socket, the IC contact piece is restrained by the reinforcing piece that protrudes from the end face of the contact bulkhead, and is interposed between the protruding parts of the reinforcing piece to make corresponding contact with the contact. fulfilled. By adding the reinforcing piece, the edge portion of the contact partition wall where the IC contact piece intervenes can be made as thin as possible, effectively dealing with the arrangement of IC contact pieces with minute pitches and narrow intervals, and further improving the thickness of the IC package. To prevent wear caused by repeated attachment and detachment.
実施例
以上説明した本考案の実施例を更に図面(第2
図以降)に基いて、詳細に説明する。Embodiment The embodiment of the present invention explained above is further illustrated in the drawings (second
This will be explained in detail based on the following figures.
同実施例において、11はソケツト基盤を示
し、該ソケツト基盤11のIC搭載部の四辺にコ
ンタクト隔壁12を櫛歯状に並設し、該隔壁12
でICパツケージ13の搭載スペース14を画成
する。 In the same embodiment, reference numeral 11 denotes a socket board, and contact partition walls 12 are arranged in parallel in a comb-like shape on the four sides of the IC mounting portion of the socket board 11.
A mounting space 14 for the IC package 13 is defined.
IC接片15はICパツケージ側面から同下縁へ
延ばし、同下縁部において略J形に曲げ形成され
たJベンド形タイプを示す。 The IC contact piece 15 is of a J-bend type, extending from the side surface of the IC package to the lower edge, and bent into a substantially J shape at the lower edge.
上記コンタクト隔壁12間にはコンタクト16
が植込配置せられ、その上下弾性変位可になされ
た端部が隔壁12前方のIC搭載スペース14内
へ突出され、ICパツケージ下縁部においてIC接
片15の曲げ端部が載接される。19は同載接状
態を保持するためのIC押えカバー、20は同カ
バーのロツクレバーである。 A contact 16 is provided between the contact partition walls 12.
is implanted, and its vertically elastically displaceable end protrudes into the IC mounting space 14 in front of the bulkhead 12, and the bent end of the IC contact piece 15 is placed on the lower edge of the IC package cage. . Reference numeral 19 represents an IC holding cover for maintaining the IC mounting state, and reference numeral 20 represents a lock lever of the cover.
上記の如くなされたICソケツトのコンタクト
隔壁12に好ましくはその全壁に同隔壁端面より
突出せる補強片17を具備させる。 The contact partition wall 12 of the IC socket constructed as described above is preferably provided with a reinforcing piece 17 on the entire wall thereof that can protrude from the end face of the partition wall.
該コンタクト隔壁端面より突出せる補強片部分
をIC接片15間に介入させ、換言すれば補強片
突出部17a間にIC接片15を介入させ、該介
入下で上記コンタクト16との載接を得る。 A reinforcing piece portion that can protrude from the end face of the contact partition wall is interposed between the IC contact pieces 15, in other words, the IC contact piece 15 is interposed between the reinforcing piece protrusions 17a, and the contact 16 is placed in contact with the above-mentioned contact 16 under this intervention. obtain.
上記補強片17は別部品で構成され、上記コン
タクト隔壁12に一体に取付けられる。 The reinforcing piece 17 is constructed as a separate part and is integrally attached to the contact partition wall 12.
該補強片17の適材として耐摩耗性の高いセラ
ミツクの薄板が使用される。 A suitable material for the reinforcing piece 17 is a thin ceramic plate with high wear resistance.
該セラミツク薄板は0・3〜0・5mm程度の非
常に薄いものが適用可である。 A very thin ceramic plate of about 0.3 to 0.5 mm can be used.
上記セラミツク薄板等から成る補強片17を第
3図に詳示するように、コンタクト隔壁12の肉
厚内に複層構造となるように埋付け、その端縁を
コンタクト隔壁端縁面より突出させる。 As shown in detail in FIG. 3, the reinforcing piece 17 made of the ceramic thin plate or the like is embedded in the thickness of the contact partition wall 12 so as to form a multilayer structure, and its edge is made to protrude from the edge surface of the contact partition wall. .
より具体例を述べれば、コンタクト隔壁12の
壁厚の中心線上にスリツト18を予じめ成形して
置き、該スリツト18内に別部品で構成した補強
片17を差し付けし、その端縁をコンタクト隔壁
端面より突出させる。 To give a more specific example, a slit 18 is preformed and placed on the center line of the wall thickness of the contact partition wall 12, a reinforcing piece 17 made of a separate part is inserted into the slit 18, and the edge of the slit 18 is inserted. Make the contact protrude from the end face of the partition wall.
好ましくはコンタクト隔壁12の基部が連結す
るソケツト基盤部分まで上記スリツト18を延設
し、該後部スリツト延設部において補強片17を
圧入し一体となす。17bは該補強片17の圧入
部を示す。 Preferably, the slit 18 is extended to the socket base portion to which the base of the contact partition wall 12 is connected, and the reinforcing piece 17 is press-fitted into the rear slit extension portion to form an integral structure. 17b indicates a press-fitted portion of the reinforcing piece 17.
上記によつて補強片17の突出部17aは第
4,第5図に示す(第5図はコンタクトを除去し
て示す)ようにコンタクト隔壁12の端面中心よ
り突出され、該補強片突出部17aの両側に上記
コンタクト隔壁12の端面による段部12aが形
成される。第5図に示すようにIC接片15は補
強片突出部17aの側面に近接する位置まで巾広
とされ、該補強片突出部17aを境にする上記コ
ンタクト隔壁端面たる段部12aIC接片15の前
縁とをと対峙される。 As a result of the above, the protruding portion 17a of the reinforcing piece 17 is protruded from the center of the end face of the contact partition wall 12 as shown in FIGS. 4 and 5 (FIG. 5 is shown with the contacts removed). A stepped portion 12a is formed by the end face of the contact partition wall 12 on both sides. As shown in FIG. 5, the IC contact piece 15 is widened to a position close to the side surface of the reinforcing piece protrusion 17a, and the IC contact piece 15 has a stepped portion 12a, which is the end face of the contact partition, bordering on the reinforcing piece protrusion 17a. It is confronted with the leading edge of.
これによつてIC接片15の前縁を規制し、且
つ補強片突出部17aでIC接片15の側縁を規
制することができる。 Thereby, the front edge of the IC contact piece 15 can be restricted, and the side edges of the IC contact piece 15 can be restricted by the reinforcing piece protrusion 17a.
上記補強片17と、コンタクト隔壁12の複合
化構造の他例として、第6図は薄板化したセラミ
ツク等から成る上記補強片17をコンタクト隔壁
12の側面に添接し複層構造としつつ、その端部
を前記と同様コンタクト隔壁12の端面より突出
させ、片側構造の段部12aを形成する。この添
接においても前記圧入取付け手段を採ることがで
きる。 As another example of a composite structure of the reinforcing piece 17 and the contact partition wall 12, FIG. Similarly to the above, the contact partition wall 12 is made to protrude from the end surface of the contact partition wall 12 to form a stepped portion 12a having a one-sided structure. The above-mentioned press-fitting means can also be used for this attachment.
第4図に拡大示するようにコンタクト隔壁12
の端面下部に補強片突出端面と同レベルか又は同
端面を超えICパツケージ下縁に至る段部12b
を形成する。この段部12bでIC接片15の下
端面又はICパツケージの基盤下縁部を規制させ
ることができる。 As shown in an enlarged view in FIG.
At the bottom of the end face, there is a stepped portion 12b that is at the same level as the protruding end face of the reinforcing piece or extends beyond the same end face and reaches the lower edge of the IC package cage.
form. This stepped portion 12b can restrict the lower end surface of the IC contact piece 15 or the lower edge of the base of the IC package.
第6図の実施例においてもこれと同様の構造と
することができる。 The embodiment shown in FIG. 6 can also have a similar structure.
考案の効果
本考案によれば以上詳述したように、コンタク
ト隔壁を合成樹脂成形壁と補強片の複合構造と
し、補強片によつてIC接片間を隔絶するように
IC接片間に介入させる機構とすることにより、
同IC接片への介入部分において同部分の可及的
薄肉化を図ることが可能となり、強度を損なわず
にIC接片の微小ピツチ化に対処でき、より高い
耐摩耗強度を付与することができた。Effects of the invention According to the invention, as detailed above, the contact partition wall has a composite structure of a synthetic resin molded wall and a reinforcing piece, and the reinforcing piece isolates the IC contact pieces.
By using a mechanism that intervenes between the IC contacts,
This makes it possible to make the intervening part of the IC contact piece as thin as possible, making it possible to cope with minute pitches of the IC contact piece without sacrificing strength, and providing higher wear resistance. did it.
換言すればIC接片をより微細化せずにあるい
は逆に巾広にして変形し易いIC接片に充分な強
度を保有させることを可能とし、又上記薄肉化に
応じてIC接片間隔をより狭めることをも可能と
した。 In other words, it is possible to make the easily deformable IC contact piece have sufficient strength without making the IC contact piece smaller or, conversely, to make it wider, and also to increase the interval between the IC contact pieces in accordance with the thinning mentioned above. It also made it possible to narrow it down further.
又上記のように薄肉化しながら耐摩耗性をも確
保でき、検査用ICソケツトの如きICパツケージ
の頻繁な着脱を要する場合においても、位置決効
果を喪失しない長期使用に耐え得るソケツトを提
供できる。 Further, as described above, it is possible to ensure wear resistance while being thin, and to provide a socket that can withstand long-term use without losing its positioning effect even in cases where frequent attachment and detachment of an IC package is required, such as an IC socket for inspection.
又本考案はコンタクト隔壁端面からの突出部を
IC接片間に介入してその側縁を規制しつつ、該
突出部の側位にコンタクト隔壁端面によつて形成
された段部によりIC接片の前縁を規制し、上記
突出部介入と段部によるIC接片の側縁及び前縁
の同時規制により、コンタクトに対するIC接片
の相対位置を適正に保ち、両者が微小ピツチであ
つても高信頼の接触を確保する。又上記突出部を
補強片で形成することにより、前記した耐摩耗性
を得て成形上の困難性を伴なわない隔壁の薄肉化
を達成しながら、上記位置決効果も長期に亘つて
維持できる等、IC接片の微小ピツチ化に有効に
対処し得るICソケツトを提供できた。 In addition, the present invention eliminates the protrusion from the end surface of the contact partition wall.
While intervening between the IC contact pieces and regulating their side edges, the front edge of the IC contact pieces is controlled by a step formed by the end face of the contact partition on the side of the protrusion, and the protrusion intervenes and regulates the front edge of the IC contact piece. By simultaneously restricting the side edges and front edges of the IC contact piece by the stepped portion, the relative position of the IC contact piece to the contact is maintained appropriately, and highly reliable contact is ensured even if there is a minute pitch between the two. Furthermore, by forming the protrusion with a reinforcing piece, the above-mentioned abrasion resistance can be obtained and the partition wall can be thinned without any difficulty in forming, while the positioning effect can be maintained for a long period of time. Thus, we were able to provide an IC socket that can effectively deal with the miniaturization of the pitch of the IC contacts.
第1図は本考案と対比される従来ICソケツト
の斜視図、第2図以降は本考案の実施例を示し、
第2図はICソケツトの斜視図、第3図は同ソケ
ツト基盤部の拡大斜視図、第4図は更に同コンタ
クト隔壁部の拡大斜視図、第5図は同隔壁部にお
けるIC接片間への介入状態を示す同平面図、第
6図は補強片の他の取付構造例を示す拡大平面図
である。
11……ソケツト基盤、12……コンタクト隔
壁、13……ICパツケージ、14……IC搭載ス
ペース、15……IC接片、16……コンタクト、
17……補強片、17a……補強片の突出部、1
8……スリツト。
Fig. 1 is a perspective view of a conventional IC socket in comparison with the present invention, and Fig. 2 and subsequent figures show embodiments of the present invention.
Fig. 2 is a perspective view of the IC socket, Fig. 3 is an enlarged perspective view of the socket base, Fig. 4 is an enlarged perspective view of the contact partition, and Fig. 5 is a view between the IC contacts in the partition. FIG. 6 is an enlarged plan view showing another example of the mounting structure of the reinforcing piece. 11...Socket base, 12...Contact bulkhead, 13...IC package, 14...IC mounting space, 15...IC contact piece, 16...Contact,
17...Reinforcement piece, 17a...Protrusion of reinforcement piece, 1
8... Slits.
Claims (1)
設されたコンタクト隔壁12に補強片17を一体
に設け、該補強片17の端部を該コンタクト隔壁
12の端面より突出させ、該補強片の突出部17
aの側位にコンタクト隔壁12の端面による段部
12aを形成し、該補強片17の突出部17aを
ICパツケージの側部に並設されたIC接片15間
に介入させ、該突出部17aの介入によりIC接
片15の側縁を規制すると共に、上記段部12a
をIC接片15の前縁と対峙させて同前縁を規制
し、上記突出部17aの介入による規制と段部1
2aによる規制下で上記コンタクト隔壁12間に
配置されたコンタクト16と上記IC接片15と
の接触を図る構成としたことを特徴とするICソ
ケツト。 A reinforcing piece 17 is integrally provided on the contact partition wall 12 arranged in parallel with the IC package mounting portion of the socket board 11, and the end of the reinforcing piece 17 is made to protrude from the end surface of the contact partition wall 12, so that the protruding portion 17 of the reinforcing piece
A step 12a is formed by the end face of the contact partition wall 12 on the side of a, and the protrusion 17a of the reinforcing piece 17 is
The protrusion 17a is inserted between the IC contact pieces 15 arranged in parallel on the side of the IC package, and the side edges of the IC contact pieces 15 are restricted by the intervention of the protrusion 17a.
is opposed to the front edge of the IC contact piece 15 to regulate the front edge, and the regulation by the intervention of the protruding portion 17a and the stepped portion 1
2a. An IC socket characterized in that the contact 16 arranged between the contact partition walls 12 and the IC contact piece 15 are brought into contact with each other under the regulation of the IC socket 2a.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14030784U JPH0211789Y2 (en) | 1984-09-14 | 1984-09-14 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14030784U JPH0211789Y2 (en) | 1984-09-14 | 1984-09-14 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6155345U JPS6155345U (en) | 1986-04-14 |
JPH0211789Y2 true JPH0211789Y2 (en) | 1990-04-03 |
Family
ID=30698661
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14030784U Expired JPH0211789Y2 (en) | 1984-09-14 | 1984-09-14 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0211789Y2 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0218547Y2 (en) * | 1986-05-02 | 1990-05-23 | ||
JP5687112B2 (en) * | 2011-03-31 | 2015-03-18 | 株式会社エンプラス | IC socket |
-
1984
- 1984-09-14 JP JP14030784U patent/JPH0211789Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS6155345U (en) | 1986-04-14 |
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