JPH01203916A - Processing method for abnormality time of measuring instrument - Google Patents
Processing method for abnormality time of measuring instrumentInfo
- Publication number
- JPH01203916A JPH01203916A JP2763988A JP2763988A JPH01203916A JP H01203916 A JPH01203916 A JP H01203916A JP 2763988 A JP2763988 A JP 2763988A JP 2763988 A JP2763988 A JP 2763988A JP H01203916 A JPH01203916 A JP H01203916A
- Authority
- JP
- Japan
- Prior art keywords
- data
- measurement
- measured
- difference
- constant value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005856 abnormality Effects 0.000 title claims abstract description 12
- 238000003672 processing method Methods 0.000 title abstract description 4
- 238000005259 measurement Methods 0.000 claims abstract description 30
- 230000002159 abnormal effect Effects 0.000 claims abstract description 5
- 238000000034 method Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
- 239000000523 sample Substances 0.000 description 3
- 238000004364 calculation method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000007257 malfunction Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
Landscapes
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Abstract
Description
【発明の詳細な説明】
〈産業上の利用分野〉
本発明は、複数の同種ワークを連続して計測する計測装
置の異常判定に適用される処理方法に関する。DETAILED DESCRIPTION OF THE INVENTION <Industrial Application Field> The present invention relates to a processing method applied to abnormality determination of a measuring device that continuously measures a plurality of similar workpieces.
〈従来の技術〉
従来の計測装置では装置自体の動作不良や装置に供給さ
れる空気圧の異常低下など様々な異常判定が行われてい
るが、装置が正しく動作して計測を行った後、その計測
データから異常を判断する方法はなかった。<Conventional technology> Conventional measuring devices make various abnormality judgments, such as a malfunction of the device itself or an abnormal drop in the air pressure supplied to the device. There was no way to determine abnormalities from measurement data.
〈発明が解決しようとする課題〉
計測装置の測定子とワークとの間に小さなゴミ等がはさ
まっていた場合、計測装置自体の動作不良は起こさない
が、計測装置は誤った計測データを入力してしまう。<Problem to be solved by the invention> If a small piece of dirt is caught between the probe of the measuring device and the workpiece, the measuring device itself will not malfunction, but the measuring device will input incorrect measurement data. It ends up.
従来の方法では、この様な場合の異常を判断できなかっ
た為、誤ったデータを正しいデータとして処理してしま
っていた。この様なトラブルをなくす方法は、計測前に
人が測定子やワークを完全に清掃する以外になく、自動
化が困難であった。Conventional methods were unable to determine the abnormality in such cases, so incorrect data was treated as correct data. The only way to eliminate such troubles is for people to thoroughly clean the probe and workpiece before measurement, which is difficult to automate.
本発明は、誤ったデータを計測した場合に、そのまま出
力するのではなく、再度計測をやり直して正しい計測を
行なわせることのできる処理方法を提供することを特徴
とする特許である。The present invention is a patent that is characterized in that it provides a processing method that allows correct measurement to be performed by redoing the measurement, rather than outputting it as is, when incorrect data is measured.
〈課題を解決するための手段〉
斯かる目的を達成する本発明の構成は、複数の同種ワー
クを連続して計測する計測装置ニオいて、前回計測した
ワークの計測データを記憶させておき、今回計測したワ
ークの計測データと前回のそれとの差を計算し、この差
がある一定値を越えた場合には異常と判断して、今回の
ワークを再度計測する一方、前記差がある一定値息下の
場合には正常と判断して次回のワークを計測させること
を特徴とする。<Means for Solving the Problems> The configuration of the present invention that achieves the above object includes a measuring device that continuously measures a plurality of workpieces of the same type, stores the measurement data of the workpieces measured last time, and stores the measurement data of the workpieces measured last time. The difference between the measurement data of the measured workpiece and the previous one is calculated, and if this difference exceeds a certain value, it is judged as abnormal and the current workpiece is measured again. In the following cases, it is determined to be normal and the next workpiece is measured.
〈実 施 例〉 す下、本発明の一実施例を詳細に説明する。<Example> An embodiment of the present invention will now be described in detail.
第1図に本発明の一実施例のブロック図を示す。同図中
計測データ入力部1は計測データを演算処理部2に入力
し、演算処理部2は計測データ処理部1から受は取った
データを記憶部3に保存されているデータと比較して、
判定を下す。記憶部3は次回の計測データの判定の為に
必要なデータを保存し、判定結果出力部4は異常か正常
かの判定結果を出力する。FIG. 1 shows a block diagram of an embodiment of the present invention. In the figure, the measurement data input section 1 inputs the measurement data to the calculation processing section 2, and the calculation processing section 2 compares the data received from the measurement data processing section 1 with the data stored in the storage section 3. ,
make a judgment. The storage unit 3 stores data necessary for next determination of measurement data, and the determination result output unit 4 outputs the determination result of abnormality or normality.
ここで、演算処理部2は第2図に示すフローチャートに
従って作動する。即ち、計測データ入力部1より今回の
計測データXを取り込むと共に記憶部3から前回の計測
データyを取込み、それらの計測データの差の絶対値1
x−ylを演算して、これをある一定値と比較する。そ
して、1x−ylがある一定値以下の場合には正常と判
断して、その結果を判定結果出力部4で表示する一方、
今回の計測データXを次回の判定に用いるため記憶部3
へ出力する。Here, the arithmetic processing section 2 operates according to the flowchart shown in FIG. That is, the current measurement data
Calculate x-yl and compare it with a certain constant value. If 1x-yl is less than a certain value, it is determined to be normal, and the result is displayed on the determination result output section 4, while
Storage unit 3 to use current measurement data X for next judgment
Output to.
反対に、1x−ylが一定値を越えるときは、異常のた
め再度の計測しなければならないと判断し、その結果を
判定結果出力部4へ出力する。そして、再度計測によっ
ても1x−ylが一定値を越えるときは、再度の計測に
よっても正常なデータが得られないと判断し、異常と判
定結果出力部4へ出力する。この表示を確認した作業員
は、計測を中断して、計測装置の異常原因を取り除く。On the other hand, when 1x-yl exceeds a certain value, it is determined that there is an abnormality and measurement must be performed again, and the result is output to the determination result output section 4. If 1x-yl exceeds a certain value even after re-measurement, it is determined that normal data cannot be obtained even after re-measurement, and an abnormality is outputted to the determination result output section 4. After confirming this display, the worker interrupts the measurement and eliminates the cause of the abnormality in the measuring device.
異常原因としては、測定子にゴミ等が付着していたため
悪影響が出る場合がある。The cause of the abnormality may be the presence of dust or the like on the probe, which may have an adverse effect.
尚、上記実施例で使用した前回の計測データとしては複
数のデータを平均したものを用いると信頼性が良くなる
。また、比較されるある一定値とは、特に限定されるも
のではないが製造誤差に安全率を乗じたものを基準とし
、これを経験則によって多少増減すると良い。It should be noted that the reliability will be improved if the average of a plurality of pieces of data is used as the previous measurement data used in the above embodiment. Further, the certain constant value to be compared is not particularly limited, but is based on a value obtained by multiplying the manufacturing error by a safety factor, and it is preferable to increase or decrease this value to some extent based on a rule of thumb.
〈発明の効果〉
以上、実施例に基づいて具体的に説明したように、本発
明によれば誤ったデータを計測した場合には、異常であ
ると判断して再計測を行なわせるので、誤ったデータが
出力されることはない。このため、計測装置付の生産ラ
インの自動化が容易となる。<Effects of the Invention> As specifically explained above based on the embodiments, according to the present invention, when incorrect data is measured, it is determined that it is abnormal and re-measurement is performed. No data will be output. Therefore, it becomes easy to automate a production line equipped with a measuring device.
第1図は本発明の一実施例にかかるブロック図、第2図
は第1図の演算処理部のフ四−チヤードである。
図面中、
1は計測データ入力部、
2は演算処理部、
3は記憶部、
4は判定結果出力部である。FIG. 1 is a block diagram according to an embodiment of the present invention, and FIG. 2 is a diagram of the fourth embodiment of the arithmetic processing section shown in FIG. In the drawings, 1 is a measurement data input section, 2 is an arithmetic processing section, 3 is a storage section, and 4 is a determination result output section.
Claims (1)
、前回計測したワークの計測データを記憶させておき、
今回計測したワークの計測データと前回のそれとの差を
計算し、この差がある一定値を越えた場合には異常と判
断して、今回のワークを再度計測する一方、前記差があ
る一定値以下の場合には正常と判断して次回のワークを
計測させることを特徴とする計測装置異常時の処理方法
。In a measuring device that continuously measures multiple workpieces of the same type, the measurement data of the previously measured workpiece is stored.
The difference between the measurement data of the workpiece measured this time and that of the previous one is calculated, and if this difference exceeds a certain value, it is judged as abnormal and the current workpiece is measured again. A method for handling an abnormality in a measuring device, characterized in that in the following cases, it is determined to be normal and the next workpiece is measured.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2763988A JPH01203916A (en) | 1988-02-10 | 1988-02-10 | Processing method for abnormality time of measuring instrument |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2763988A JPH01203916A (en) | 1988-02-10 | 1988-02-10 | Processing method for abnormality time of measuring instrument |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01203916A true JPH01203916A (en) | 1989-08-16 |
Family
ID=12226509
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2763988A Pending JPH01203916A (en) | 1988-02-10 | 1988-02-10 | Processing method for abnormality time of measuring instrument |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01203916A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2014109495A (en) * | 2012-12-03 | 2014-06-12 | Mitsutoyo Corp | Surface property measurement device, surface property measurement method, and program |
-
1988
- 1988-02-10 JP JP2763988A patent/JPH01203916A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2014109495A (en) * | 2012-12-03 | 2014-06-12 | Mitsutoyo Corp | Surface property measurement device, surface property measurement method, and program |
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