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JPH09318427A - Electronic force balance - Google Patents

Electronic force balance

Info

Publication number
JPH09318427A
JPH09318427A JP13532396A JP13532396A JPH09318427A JP H09318427 A JPH09318427 A JP H09318427A JP 13532396 A JP13532396 A JP 13532396A JP 13532396 A JP13532396 A JP 13532396A JP H09318427 A JPH09318427 A JP H09318427A
Authority
JP
Japan
Prior art keywords
load
mass body
weighing pan
reference mass
span
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13532396A
Other languages
Japanese (ja)
Inventor
Akira Kawamoto
晟 河本
Akira Nishio
章 西尾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP13532396A priority Critical patent/JPH09318427A/en
Publication of JPH09318427A publication Critical patent/JPH09318427A/en
Pending legal-status Critical Current

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  • Sampling And Sample Adjustment (AREA)

Abstract

PROBLEM TO BE SOLVED: To obtain an electronic force balance in which a span factor can be computed by a method wherein an addition or exclusion mechanism which adds or excludes a weighing pan is installed, the weighing pan is separated from a load sensitive part when a span calibration instruction is generated, a reference mass body is loaded and the output of the sensitive part is found when the reference mass body is separated and loaded. SOLUTION: A reference-mass-body addition or exclusion mechanism 7 adds or excludes a reference mass body 5 for span calibration to or from a load sensitive part 4, and a weighing-pan addition or exclusion mechanism 8 adds or excludes a weighing pan 1, on which a sample to be measured is placed, to or from the load sensitive part 4. A control part 14 separates the weighing pan 1 from the sensitive part 4 when a span calibration instruction is generated, and, in this state, the mass body 5 is loaded on the sensitive part 4. A computing part 11 computes a span factor by using the output of the sensitive part 4 when the mass body 5 is loaded and by using the output of the sensitive part 4 in a state that the weighing pan 1 is separated. Thereby, even when a tare or an arbitrary load is loaded on the weighing pan 1, a span calibration operation is executed in a state that the load is not transmitted to the sensitive part 4, and it not required to remove the load every time.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は電子天びんに関し、
更に詳しくは、スパン校正用の基準質量体を内蔵した電
子天びんに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electronic balance,
More specifically, the present invention relates to an electronic balance having a reference mass body for span calibration.

【0002】[0002]

【従来の技術】電子天びんにおいては、一般に、秤量皿
に載せた試料の荷重が荷重感応部に伝達され、そのとき
の荷重感応部の出力Wと、あらかじめ記憶しているスパ
ン係数K、および秤量皿上に試料が載っていない状態、
つまり無負荷状態にあるときの荷重感応部の出力WT
用いて、秤量皿上の試料の質量Mを、例えば、 M=K(W−WT ) ・・(1) によって算出し、表示器に表示する。
2. Description of the Related Art Generally, in an electronic balance, the load of a sample placed on a weighing pan is transmitted to a load sensitive section, the output W of the load sensitive section at that time, a span coefficient K stored in advance, and a weighing quantity. When the sample is not placed on the plate,
That is, using the output W T of the load-sensitive section when there is no load, the mass M of the sample on the weighing pan is calculated by, for example, M = K (W−W T ). Display on the container.

【0003】スパン係数Kは、スパン校正用の基準質
量、例えば基準となる分銅等を荷重感応部に負荷した状
態における荷重感応部の出力Wと、その分銅等の既知質
量値Aとから、同じく無負荷状態にあるときの荷重感応
部の出力をWT としたとき、例えば K=A/(W−WT ) ・・(2) によって算出され、記憶される。
The span coefficient K is the same as the reference mass for span calibration, for example, from the output W of the load-sensing portion when a reference weight or the like is loaded on the load-sensing portion and the known mass value A of the weight. when the output of the load sensitive part when in the unloaded state was W T, for example, is calculated by K = a / (W-W T) ·· (2), it is stored.

【0004】ところで、スパン校正用の基準質量体、例
えば分銅や適当な錘、を内蔵するとともに、その質量体
を荷重感応部に対して負荷/負荷解除する加除機構を備
えた電子天びんにおいては、内蔵する基準質量体の質量
値を記憶しているとともに、スパン校正指令の発生時に
その基準質量体を自動的に荷重感応部に負荷し、そのと
きの荷重感応部の出力と、記憶している基準質量体の質
量値を用いて、(2)式に準じてスパン係数Kを算出
し、その算出結果によってそれまで用いていたスパン係
数を更新する。
By the way, in an electronic balance having a built-in reference mass body for span calibration, for example, a weight or an appropriate weight, and a loading / unloading mechanism for loading / unloading the mass body to / from the load-sensitive section, The mass value of the built-in reference mass body is stored, and when the span calibration command is generated, the reference mass body is automatically loaded on the load sensitive section, and the output of the load sensitive section at that time is stored. Using the mass value of the reference mass body, the span coefficient K is calculated according to the equation (2), and the span coefficient used until then is updated according to the calculation result.

【0005】ここで、スパン校正指令は、例えば付設の
スイッチを操作することによって発生するように構成さ
れたもののほか、所定の温度変化があったとき、あるい
は所定の時刻に達したとき、もしくは所定の時間が経過
するなど、あらかじめ設定されたスパン校正開始条件が
満たされた時点で自動的に発生するように構成されたも
のもある。
Here, the span calibration command is, for example, configured to be generated by operating an attached switch, and also when a predetermined temperature change or a predetermined time is reached or a predetermined time is reached. There is also a configuration that is automatically generated when a preset span calibration start condition is satisfied, such as when the time of is elapsed.

【0006】また、以上のようなスパン校正動作は、秤
量皿上に試料や風袋等が載っていない、いわゆる無負荷
状態において行われる。
The span calibration operation as described above is carried out in a so-called no-load state in which the sample, tare, etc. are not placed on the weighing pan.

【0007】[0007]

【発明が解決しようとする課題】ところで、基準質量体
とその加除機構を内蔵した電子天びんにおいては、ある
条件が満たされたときに自動的に、あるいはスイッチ操
作することによって後は自動的にスパン校正動作が実行
されるために、良好な操作性のもとに正確な計量値を得
ることができるが、以下に示すような使い方にあって
は、スパン校正動作の完全自動化は不可能である。
By the way, in an electronic balance having a reference mass body and an adding / removing mechanism for the reference mass body, a span is automatically set when a certain condition is satisfied or a switch is operated. Since the calibration operation is performed, accurate weighing values can be obtained with good operability, but in the following usages, the span calibration operation cannot be fully automated. .

【0008】すなわち、例えば常に風袋を秤量皿上に載
せた状態で使用される電子天びんや、あるいは試料の質
量変化を測定すべく、秤量皿上に試料を長時間にわたっ
て載せたまま刻々のデータを採取するような使い方にあ
っては、スパン校正時において秤量皿を無負荷状態とす
る必要があるが故に、秤量皿上から風袋や試料を降ろす
という行為が必要となる。
That is, for example, an electronic balance that is always used with the tare placed on the weighing pan, or in order to measure the mass change of the sample, the momentary data is kept while the sample is placed on the weighing pan for a long time. In the case of using for sampling, it is necessary to make the weighing pan unloaded at the time of span calibration, and therefore it is necessary to unload the tare or sample from the weighing pan.

【0009】本発明の目的は、基準質量体とその加除機
構を内蔵した電子天びんにおいて、秤量皿上に風袋や試
料等が載っていても、スパン校正指令の発生によって自
動的にスパン校正を行うことのできる電子天びんを提供
することにある。
An object of the present invention is to automatically perform span calibration by generating a span calibration command in an electronic balance having a reference mass body and a mechanism for adding and removing the mass, even if a tare or sample is placed on the weighing pan. It is to provide an electronic balance that can do the work.

【0010】[0010]

【課題を解決するための手段】上記の目的を達成するた
めの構成を、実施の形態を表す図1,図2を参照しつつ
説明すると、本発明の電子天びんは、スパン校正用の質
量既知の基準質量体5を内蔵するとともに、その基準質
量体5を荷重感応部4に対して加除する基準質量体加除
機構7と、基準質量体5を負荷したときの荷重感応部4
の出力と当該基準質量体5の質量値を用いてスパン係数
を求める演算手段11を備えた電子天びんにおいて、被
測定試料を載置するための秤量皿1を荷重感応部4に対
して加除する秤量皿加除機構8と、この秤量皿加除機構
8および基準質量体加除機構7を駆動制御する制御手段
14を備え、この制御手段14は、スパン校正指令の発
生時に荷重感応部4から秤量皿1を切り離した後、その
状態で荷重感応部4に基準質量体5を負荷する。そし
て、演算手段11は、基準質量体5の負荷状態における
荷重感応部の出力と、秤量皿を切り離した状態での荷重
感応部の出力を用いて、スパン係数を算出する。
A structure for achieving the above object will be described with reference to FIGS. 1 and 2 showing an embodiment. The electronic balance of the present invention has a known mass for span calibration. Of the reference mass body 5, the reference mass body adding / removing mechanism 7 for adding / removing the reference mass body 5 to / from the load sensitive section 4, and the load sensitive section 4 when the reference mass body 5 is loaded.
In the electronic balance equipped with the calculation means 11 for obtaining the span coefficient by using the output of 1 and the mass value of the reference mass body 5, the weighing pan 1 for mounting the sample to be measured is added to or removed from the load sensitive part 4. A weighing pan adjusting mechanism 8 and a control means 14 for driving and controlling the weighing pan adding and removing mechanism 8 and the reference mass adding and removing mechanism 7 are provided. The control means 14 controls the load sensitive part 4 to move the weighing pan 1 to the weighing pan 1 when a span calibration command is issued. After separating, the reference mass body 5 is loaded on the load sensitive section 4 in that state. Then, the calculation means 11 calculates the span coefficient by using the output of the load sensitive part in the loaded state of the reference mass body 5 and the output of the load sensitive part in the state in which the weighing pan is separated.

【0011】以上の本発明の構成によれば、スパン校正
指令の発生時に秤量皿1が荷重感応部4から切り離され
るため、秤量皿1上に風袋や試料などの任意荷重が負荷
されていても、その荷重が荷重感応部4に伝達されてい
ない状態でスパン校正動作が実行され、従って秤量皿1
から試料等を降ろすことなくスパン校正を実行すること
ができる。
According to the configuration of the present invention described above, since the weighing pan 1 is separated from the load sensitive section 4 when the span calibration command is generated, even if an arbitrary load such as a tare or sample is loaded on the weighing pan 1. , The span calibration operation is executed in a state where the load is not transmitted to the load sensitive unit 4, and therefore the weighing pan 1
The span calibration can be executed without dropping the sample and so on.

【0012】ここで、スパン係数は、天びんのリニアリ
ティが正しく調整されている限り、荷重感応部に対して
既知質量を負荷したときに、その負荷前後における荷重
感応部の出力の増加量と既知質量とから算出することが
できる。
As long as the linearity of the balance is properly adjusted, the span coefficient means that when a known mass is applied to the load sensitive part, the amount of increase in the output of the load sensitive part before and after the load and the known mass. It can be calculated from

【0013】従来の電子天びんにおいて、秤量皿を無負
荷状態としてスパン校正を行う主たる理由は、秤量皿上
の荷重と基準質量体とを同時に荷重感応部に対して負荷
したときに、その合計質量が電子天びんの秤量を越え、
荷重感応部の出力がオーバースケール状態となってしま
う可能性があるためである。本発明の構成によれば、ス
パン校正指令の発生により、基準質量体を荷重感応部に
負荷する前に、秤量皿が荷重感応部から切り離されるた
め、上記のような可能性は全くなくなる。
In a conventional electronic balance, the main reason for performing span calibration with the weighing pan in an unloaded state is that when the load on the weighing pan and the reference mass are simultaneously applied to the load sensitive section, the total mass Exceeds the weighing capacity of the electronic balance,
This is because the output of the load sensitive section may be in an overscaled state. According to the configuration of the present invention, the generation of the span calibration command causes the weighing pan to be separated from the load-sensitive portion before the reference mass body is loaded on the load-sensitive portion.

【0014】[0014]

【発明の実施の形態】図1は本発明の実施の形態の構成
図で、要部のメカニズムを示す模式図と、電気的構成を
併記して示す図である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 is a configuration diagram of an embodiment of the present invention, which is a schematic diagram showing a mechanism of a main part and a diagram showing an electrical configuration together.

【0015】秤量皿1は、皿受け2および皿受け軸3を
介して荷重感応部4に支承されている。荷重感応部4
は、例えば電磁力発生装置と皿受け軸3の変位を検出す
るための変位センサ等によって構成された公知のもの
で、皿受け軸3の変位が常に0となるような電磁力を発
生して、その電磁力を発生するのに要した電流が精密抵
抗等によって電圧信号に変換され、その変換信号が荷重
検出出力となる。
The weighing pan 1 is supported by the load sensitive portion 4 via a pan receiver 2 and a pan receiving shaft 3. Load sensitive part 4
Is a well-known device including, for example, an electromagnetic force generator and a displacement sensor for detecting the displacement of the dish receiving shaft 3, and generates an electromagnetic force such that the displacement of the dish receiving shaft 3 is always zero. , The current required to generate the electromagnetic force is converted into a voltage signal by a precision resistor or the like, and the converted signal becomes a load detection output.

【0016】基準質量体5はこの例においてリング状を
しており、皿受け軸3には、その基準質量体5を支承す
るための受け部6が形成されている。基準質量体加除機
構7は、例えば偏心カムと、その偏心カムを回動させる
ためのモータ、および偏心カムによって揺動されるレバ
ー(いずれも図示せず)等によって構成された公知の機
構であり、そのレバーの先端には基準質量体5を支承し
て上下動させるための支持部材71が設けられている。
通常の測定状態においては、基準質量体5は、図1に示
すように基準質量体加除機構7の支持部材71によって
支持された状態となり、荷重感応部4に対して負荷され
ない状態となっている。
The reference mass body 5 has a ring shape in this example, and a receiving portion 6 for supporting the reference mass body 5 is formed on the dish receiving shaft 3. The reference mass adding / removing mechanism 7 is a known mechanism including, for example, an eccentric cam, a motor for rotating the eccentric cam, and a lever (none of which is shown) swung by the eccentric cam. A supporting member 71 for supporting the reference mass 5 and moving it up and down is provided at the tip of the lever.
In a normal measurement state, the reference mass body 5 is in a state of being supported by the support member 71 of the reference mass body adding / removing mechanism 7 as shown in FIG. .

【0017】秤量皿1は秤量皿加除機構8によって上下
動される。秤量皿加除機構8は、基準質量体加除機構7
と同等の機構、つまり、偏心カム、モータおよびレバー
(いずれも図示せず)等によって構成することができ、
そのレバーの先端には、皿受け2に穿たれた複数(3個
以上)の貫通孔21をそれぞれ下から貫通して秤量皿1
の裏面側に臨む複数本の棒状の皿持ち上げ部材81が設
けられている。通常の測定状態においては、秤量皿1は
図1に示すように皿受け2に支持された状態となり、皿
持ち上げ部材81は秤量皿1並びに皿受け2等には一切
接触しない状態となっている。
The weighing dish 1 is moved up and down by a weighing dish adding / removing mechanism 8. The weighing pan adding / removing mechanism 8 is the reference mass adding / removing mechanism 7.
Can be configured by a mechanism equivalent to, that is, an eccentric cam, a motor, a lever (neither is shown),
At the tip of the lever, a plurality of (three or more) through holes 21 formed in the dish receiver 2 are penetrated from below, respectively, and the weighing dish 1
A plurality of rod-shaped dish lifting members 81 facing the back surface side of the plate are provided. In a normal measurement state, the weighing dish 1 is supported by the dish receiver 2 as shown in FIG. 1, and the dish lifting member 81 does not contact the weighing dish 1 and the dish receiver 2 at all. .

【0018】この秤量皿加除機構8および上記した基準
質量体加除機構7は、スパン校正指令の発生時に制御部
14から供給される信号によって、後述する手順のもと
に駆動制御される。
The weighing plate adding / removing mechanism 8 and the reference mass adding / removing mechanism 7 are driven and controlled by a signal supplied from the control unit 14 when a span calibration command is generated, according to a procedure described later.

【0019】前記した荷重感応部4からの荷重検出出力
は演算部11に取り込まれ、通常の測定状態において演
算部11では、その荷重検出出力を記憶部12に記憶さ
れたスパン係数を用いて質量値に換算して表示器13に
表示する。
The load detection output from the load sensing unit 4 is taken into the calculation unit 11, and in the normal measurement state, the calculation unit 11 uses the span detection coefficient stored in the storage unit 12 as the load detection output. The value is converted and displayed on the display unit 13.

【0020】記憶部12は、スパン係数のほか、あらか
じめ精密に測定された基準質量体5の質量値を記憶して
いるとともに、後述するスパン校正動作時におけるゼロ
荷重出力等を記憶するエリアを備えている。
The storage unit 12 stores not only the span coefficient but also the mass value of the reference mass body 5 precisely measured in advance, and an area for storing a zero load output at the time of a span calibration operation described later. ing.

【0021】上記した制御部14、演算部11、並びに
記憶部12は、実際にはCPU,ROM,RAMを主体
とするコンピュータとその周辺機器によって構成され
る。従って記憶部12は、実際にはROMおよびRA
M、あるいはこれに加えて外部記憶装置等によって構成
され、この記憶部12に記憶すべき内容は、これらの記
憶装置のうち、記憶すべき個々の内容に適した機器が割
当てられてそこに記憶される。また、スパン校正指令
は、天びんに付設されたスイッチ操作等によって人為的
に発生するほか、ROMに書き込まれたプログラムに従
い、一定の温度変化や一定の時間経過、あるいは所定の
時刻に達した時点において、制御部14から自発的に発
生する場合もある。
The control unit 14, the arithmetic unit 11, and the storage unit 12 described above are actually constituted by a computer mainly composed of a CPU, a ROM, and a RAM, and its peripheral devices. Therefore, the storage unit 12 is actually a ROM and RA.
M, or in addition to this, an external storage device or the like, and the contents to be stored in the storage unit 12 are stored in the storage device to which devices suitable for the individual contents to be stored are allocated. To be done. The span calibration command is generated artificially by operating the switches attached to the balance, etc., and also according to the program written in the ROM, when a certain temperature change, a certain time elapses, or when a predetermined time is reached. In some cases, it may be spontaneously generated from the control unit 14.

【0022】次に、以上の実施の形態のスパン校正時に
おける動作について述べる。図2はその動作の説明図で
ある。スパン校正指令が発生すると、まず、秤量皿加除
機構8の皿持ち上げ部材81が上方に移動し、図2
(A)に示すように秤量皿1が持ち上げられて皿受け2
に対する接触が絶たれる。この状態での荷重感応部4か
らの荷重検出出力が、ゼロ荷重出力W0 として記憶部1
2に記憶される。
Next, the operation of the above embodiment during span calibration will be described. FIG. 2 is an explanatory diagram of the operation. When the span calibration command is issued, first, the plate lifting member 81 of the weighing plate adding / removing mechanism 8 moves upward,
As shown in (A), the weighing pan 1 is lifted and the pan receiver 2
Lost contact with. The load detection output from the load sensing unit 4 in this state is stored as the zero load output W 0 in the storage unit 1.
2 is stored.

【0023】次に、基準質量体加除機構7の支持部材7
1が下方に移動し、図2(B)に示すように基準質量体
5が皿受け軸3の受け部6上に載った状態となる。演算
部11は、この状態での荷重感応部4からの荷重検出出
力WF と、先に記憶しているゼロ荷重出力W0 を用い
て、以下の式(3)によってスパン係数Kを算出する。
Next, the supporting member 7 of the reference mass adding / removing mechanism 7
1 moves downward, and the reference mass body 5 is placed on the receiving portion 6 of the dish receiving shaft 3 as shown in FIG. The calculation unit 11 calculates the span coefficient K by the following equation (3) using the load detection output W F from the load sensing unit 4 in this state and the zero load output W 0 stored in advance. .

【0024】すなわち、基準質量体5の質量値をAとす
ると、 K=A/(WF −W0 ) ・・(3) このようにして算出されたスパン係数Kは、記憶部12
に記憶される。
That is, assuming that the mass value of the reference mass body 5 is A, K = A / (W F −W 0 ) ·· (3) The span coefficient K thus calculated is stored in the storage unit 12.
Is stored.

【0025】以上のスパン校正動作が終了した後、制御
部14からの指令により、上記の動作と逆に、まず基準
質量体加除機構7の支持部材71が上方に移動して基準
質量体5が持ち上げられ、次いで秤量皿加除機構8の皿
持ち上げ部材81が下方に移動して秤量皿1が皿受け2
上に載った状態、つまり図1に示す状態に戻される。
After the above span calibration operation is completed, in response to a command from the control unit 14, the support member 71 of the reference mass body adding / removing mechanism 7 is moved upward to move the reference mass body 5 in reverse. Then, the dish lifting member 81 of the weighing dish adding / removing mechanism 8 is moved downward to move the weighing dish 1 to the dish tray 2
It is returned to the state of being placed on top, that is, the state shown in FIG.

【0026】そして、以後、試料Sが秤量皿1に載せら
れた状態での荷重感応部4の出力をWS としたとき、そ
の試料Sの質量Mは、秤量皿上に試料が載っていない状
態での荷重感応部の出力をWT (ゼロアジャスト時に記
憶される)としたとき、その試料Sの質量Mは、 M=K(WS −WT ) ・・(4) によって算出され、表示器13に表示される。
After that, when the output of the load-sensing section 4 with the sample S placed on the weighing dish 1 is W S , the mass M of the sample S is such that the sample is not placed on the weighing dish. When the output of the load sensitive part in the state is W T (stored at the time of zero adjustment), the mass M of the sample S is calculated by M = K (W S −W T ) ·· (4), It is displayed on the display 13.

【0027】以上の本発明の実施の形態によると、秤量
皿1上に試料Sが載っている状態でも、スパン校正指令
の発生によってその試料Sは秤量皿1とともに荷重感応
部4から切り離されるため、スパン校正時に試料Sを秤
量皿1から試料Sを降ろすことなく、正確なスパン校正
を行うことができる。
According to the above-described embodiment of the present invention, even when the sample S is placed on the weighing pan 1, the sample S is separated from the load sensing unit 4 together with the weighing pan 1 by the generation of the span calibration command. An accurate span calibration can be performed without lowering the sample S from the weighing dish 1 during span calibration.

【0028】ここで、ある種の天びんにおいては、秤量
皿1を皿受け2から切り離した状態では、荷重感応部4
により発生する電磁力が天びん機構をバランスさせ得な
い構成のものがある(例えば秤量皿1のみの負荷状態を
ゼロ荷重としたとき、マイナス側にバランスコントロー
ルできない構成の天びん等がこれに相当する)。このよ
うな天びんに対して本発明を適用する場合には、図3に
その要部のメカニズムを例示するような構成を採用すれ
ばよい。
Here, in a certain type of balance, when the weighing dish 1 is separated from the dish receiver 2, the load sensitive section 4 is used.
There is a configuration in which the electromagnetic force generated due to the balance mechanism cannot balance the balance mechanism (for example, when the load state of only the weighing pan 1 is set to zero load, a balance or the like in which balance control cannot be performed on the negative side corresponds to this). . When the present invention is applied to such a balance, it is only necessary to adopt a configuration in which the mechanism of the main part is illustrated in FIG.

【0029】すなわち、図3の例においては、上記した
実施の形態の構成に加えて、皿相当錘30と、その錘3
0を荷重感応部4に対して加除する加除機構31を設
け、スパン校正指令の発生時に秤量皿1を切り離したと
きに、この皿相当錘30を荷重感応部4に負荷すればよ
い。この皿相当錘30の質量は、秤量皿1の質量と略同
等とされる。ただし、これらは厳密に等しい必要はな
く、要は荷重感応部4に対する負荷が、この荷重感応部
4が天びん機構をバランスさせ得る範囲内となれば足
り、従って皿相当錘30の質量は、例えば秤量皿1の質
量よりも僅かに重くすることが望ましい。そして、秤量
皿1を切り離して皿相当錘30を負荷した状態での荷重
感応部4の出力をゼロ荷重出力として記憶し、その状態
から基準質量体5を負荷した後の出力を用いて、前記
(3)式に準じてスパン係数を算出すれば、先の実施の
形態と同等の作用効果を奏することができる。
That is, in the example of FIG. 3, in addition to the configuration of the above-described embodiment, the plate equivalent weight 30 and the weight 3 thereof.
An addition / removal mechanism 31 for adding / removing 0 to / from the load sensitive section 4 is provided, and when the weighing dish 1 is separated when the span calibration command is issued, the weight 30 equivalent to the dish may be loaded on the load sensitive section 4. The mass of the plate equivalent weight 30 is substantially equal to the mass of the weighing pan 1. However, these do not have to be exactly equal, and the point is that the load on the load sensitive unit 4 is within the range in which the load sensitive unit 4 can balance the balance mechanism, and therefore the mass of the plate equivalent weight 30 is, for example, It is desirable to make it slightly heavier than the mass of the weighing dish 1. Then, the output of the load sensitive section 4 in a state in which the weighing dish 1 is separated and the dish equivalent weight 30 is loaded is stored as a zero load output, and the output after loading the reference mass body 5 from that state is used to If the span coefficient is calculated according to the equation (3), it is possible to obtain the same operational effect as that of the previous embodiment.

【0030】なお、以上の実施の形態におけるスパン係
数Kの算出式、並びに試料Sの質量の算出式について
は、特に前記した式(3),(4)に限定されず、他の
公知の式を用い得ることは勿論である。
The formula for calculating the span coefficient K and the formula for calculating the mass of the sample S in the above embodiment are not particularly limited to the formulas (3) and (4) described above, and other known formulas can be used. Of course, can be used.

【0031】また、基準質量体加除機構7および秤量皿
加除機構8の具体的なメカニズムについては、上記した
ものに限定されることなく、皿相当錘加除機構31とと
もに、これらの機能を全うし得る他の任意のメカニズム
を採用し得ることは言うまでもない。
Further, the specific mechanisms of the reference mass body adding / removing mechanism 7 and the weighing plate adding / removing mechanism 8 are not limited to those described above, and the functions corresponding to the plate equivalent weight adding / removing mechanism 31 can be fulfilled. It goes without saying that any other mechanism can be adopted.

【0032】[0032]

【発明の効果】以上のように、本発明によれば、秤量皿
上に試料や風袋等が載っていても、スパン校正指令の発
生時に秤量皿とともに荷重感応部から切り離されてその
荷重が伝達されない状態とされ、その状態で基準質量体
が荷重感応部に負荷されてスパン係数が算出されるか
ら、特に、例えば風袋を常に秤量皿上に載せた状態で使
用される電子天びんや、質量変化測定のために長時間に
わたって試料を秤量皿上に載せた状態で使用される電子
天びんにおいても、スパン校正時に風袋ないしは試料を
秤量皿から降ろすという手間を省くことができ、また、
このような使用状態にある電子天びんで、かつ、一定時
間の経過や一定の温度変化等によって自動的にスパン校
正指令を発生する機能を持つものにあっては、スパン校
正を実質的に完全自動化することが可能となる。
As described above, according to the present invention, even when a sample, tare, or the like is placed on the weighing pan, when the span calibration command is issued, the load is separated from the load sensing section together with the weighing pan and the load is transmitted. In this state, the reference mass is loaded on the load sensitive part and the span coefficient is calculated.In particular, for example, an electronic balance that is used with the tare always placed on the weighing pan, or the mass change Even for electronic balances that are used with the sample placed on the weighing pan for a long time for measurement, it is possible to save the time and effort of lowering the tare or sample from the weighing pan during span calibration.
For electronic balances that are in such a usage state and that have a function that automatically generates a span calibration command when a certain period of time elapses or a certain temperature change occurs, span calibration is virtually fully automated. It becomes possible to do.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施の形態の構成図で、要部のメカニ
ズムを示す模式図と、電気的構成を併記して示す図
FIG. 1 is a configuration diagram of an embodiment of the present invention, which is a schematic diagram showing a mechanism of a main part and a diagram showing an electrical configuration together.

【図2】そのスパン校正時における動作説明図[Fig. 2] Operation explanatory diagram at the time of span calibration

【図3】本発明の他の実施の形態の要部のメカニズムを
示す模式図
FIG. 3 is a schematic diagram showing a mechanism of a main part of another embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 秤量皿 2 皿受け 21 貫通孔 3 皿受け軸 4 荷重感応部 5 基準質量体 6 受け部 7 基準質量体加除機構 71 支持部材 8 秤量皿加除機構 81 皿持ち上げ部材 11 演算部 12 記憶部 14 制御部 DESCRIPTION OF SYMBOLS 1 Weighing pan 2 Dish tray 21 Through hole 3 Dish receiving shaft 4 Load sensing part 5 Reference mass body 6 Receiving part 7 Reference mass body adding / removing mechanism 71 Supporting member 8 Weighing pan adding / removing mechanism 81 Dish lifting member 11 Computing part 12 Memory part 14 Control Department

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 スパン校正用の質量既知の基準質量体を
内蔵するとともに、その基準質量体を荷重感応部に対し
て加除する基準質量体加除機構と、上記基準質量体を負
荷したときの荷重感応部の出力と当該基準質量体の質量
値を用いてスパン係数を求める演算手段を備えた電子天
びんにおいて、被測定試料を載置するための秤量皿を上
記荷重感応部に対して加除する秤量皿加除機構と、この
秤量皿加除機構および上記基準質量体加除機構を駆動制
御する制御手段を備え、この制御手段は、スパン校正指
令の発生時に荷重感応部から秤量皿を切り離した後、そ
の状態で荷重感応部に基準質量体を負荷するとともに、
上記演算手段は、その基準質量体負荷状態における荷重
感応部の出力と、秤量皿を切り離した状態での荷重感応
部の出力を用いて、スパン係数を算出することを特徴と
する電子天びん。
1. A reference mass body adding and removing mechanism for incorporating a reference mass body of known mass for span calibration, and adding and removing the reference mass body to and from a load sensitive section, and a load when the reference mass body is loaded. In an electronic balance equipped with a calculation means for obtaining the span coefficient using the output of the sensitive part and the mass value of the reference mass body, a weighing pan for adding and removing a weighing pan for mounting the sample to be measured from the load sensitive part. It is provided with a pan addition / removal mechanism and a control means for driving and controlling the weighing pan addition / removal mechanism and the reference mass body addition / removal mechanism, and this control means separates the weighing pan from the load-sensitive section when a span calibration command is generated, While loading the reference mass on the load sensitive part with,
An electronic balance characterized in that the calculating means calculates a span coefficient by using the output of the load sensitive section in the reference mass body loaded state and the output of the load sensitive section in the state in which the weighing pan is separated.
JP13532396A 1996-05-29 1996-05-29 Electronic force balance Pending JPH09318427A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13532396A JPH09318427A (en) 1996-05-29 1996-05-29 Electronic force balance

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13532396A JPH09318427A (en) 1996-05-29 1996-05-29 Electronic force balance

Publications (1)

Publication Number Publication Date
JPH09318427A true JPH09318427A (en) 1997-12-12

Family

ID=15149079

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13532396A Pending JPH09318427A (en) 1996-05-29 1996-05-29 Electronic force balance

Country Status (1)

Country Link
JP (1) JPH09318427A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1098177A2 (en) * 1999-11-05 2001-05-09 Secretary of Agency of Industrial Science and Technology Automatic submultiple and multiple test weight calibration apparatus
CN108072442A (en) * 2017-11-17 2018-05-25 长沙开元仪器股份有限公司 The electronic balance that can be calibrated automatically

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1098177A2 (en) * 1999-11-05 2001-05-09 Secretary of Agency of Industrial Science and Technology Automatic submultiple and multiple test weight calibration apparatus
EP1098177A3 (en) * 1999-11-05 2002-01-16 Secretary of Agency of Industrial Science and Technology Automatic submultiple and multiple test weight calibration apparatus
CN108072442A (en) * 2017-11-17 2018-05-25 长沙开元仪器股份有限公司 The electronic balance that can be calibrated automatically

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