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JPH0922978A - Semiconductor device and lead frame used for its manufacture - Google Patents

Semiconductor device and lead frame used for its manufacture

Info

Publication number
JPH0922978A
JPH0922978A JP7169421A JP16942195A JPH0922978A JP H0922978 A JPH0922978 A JP H0922978A JP 7169421 A JP7169421 A JP 7169421A JP 16942195 A JP16942195 A JP 16942195A JP H0922978 A JPH0922978 A JP H0922978A
Authority
JP
Japan
Prior art keywords
semiconductor chip
lead
electrode
semiconductor device
leads
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7169421A
Other languages
Japanese (ja)
Inventor
Akira Kurosawa
晃 黒沢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Akita Electronics Systems Co Ltd
Original Assignee
Hitachi Ltd
Akita Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Akita Electronics Co Ltd filed Critical Hitachi Ltd
Priority to JP7169421A priority Critical patent/JPH0922978A/en
Publication of JPH0922978A publication Critical patent/JPH0922978A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32245Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/4826Connecting between the body and an opposite side of the item with respect to the body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48463Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • H01L2224/48465Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73215Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Lead Frames For Integrated Circuits (AREA)

Abstract

PROBLEM TO BE SOLVED: To obtain a semiconductor device of an LOC structure, which uses a semiconductor chip on which electrodes are formed along the peripheral edge by a method wherein holes to which a wire bonding operation can be performed are formed in lead parts on the electrodes. SOLUTION: Holes 9 through which wires 10 are passed are made in respective inner leads 6 at a lead 2. The holes 9 are situated just above electrodes (bonding pads) 4 which are arranged along both sides of a semiconductor chip 3. Tip ends of the wires 10 are fixed to the electrodes 4 under the holes 9 which have been formed in the inner leads 6. Thereby, the electrodes 4 at the semiconductor chip 3 can be connected to the lead 2, and a semiconductor device of an LOC structure which uses the semiconductor chip 3 comprising the electrodes 4 along the peripheral edge can be obtained. Consequently, the area of the semiconductor chip 3 can be made large, and a package 1 can be miniaturized.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は半導体装置、特にLOC
(lead on chip)と呼称される半導体装置およびこの半
導体装置の製造に使用されるリードフレームに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device, especially LOC.
The present invention relates to a semiconductor device called "lead on chip" and a lead frame used for manufacturing the semiconductor device.

【0002】[0002]

【従来の技術】リードフレームを用いた半導体装置の構
造の一つとして、半導体チップの上に絶縁テープ(絶縁
体)を介してリード内端部を取り付けるとともに、これ
らリード内端部と半導体チップの上面に設けられた電極
(ボンディングパッド;パッド)をワイヤで接続し、か
つ半導体チップ,ワイヤ,リード内端部をレジンパッケ
ージで封止してなるLOC構造の半導体装置が開発され
ている。LOC構造については、日経BP社発行「日経
マイクロデバイス」1991年2月号、同年2月1日発行、
P89〜P97や特開平2-246125号公報に記載されている。
2. Description of the Related Art As one of the structures of a semiconductor device using a lead frame, inner ends of leads are mounted on a semiconductor chip via an insulating tape (insulator), and the inner ends of the leads and the semiconductor chip are connected to each other. A semiconductor device having a LOC structure has been developed in which electrodes (bonding pads; pads) provided on the upper surface are connected by wires, and the semiconductor chip, wires, and inner ends of leads are sealed with a resin package. Regarding the LOC structure, Nikkei BP's "Nikkei Microdevice" February 1991 issue, February 1st,
P89 to P97 and JP-A-2-246125.

【0003】LOC構造では、半導体チップの中央に沿
ってボンディングパッドが配列されるとともに、このボ
ンディングパッド列の両側にそれぞれ電源線および接地
線としてのバス・バー・リードが絶縁テープを介して配
置されている。また、バス・バー・リードの外側の半導
体チップ上に信号線等となるリードの内端部分が並び絶
縁テープで半導体チップに固定された構造となってい
る。また、前記ボンディングパッドとバス・バー・リー
ドやリード内端部が導電性のワイヤで接続されている。
前記バス・バー・リードやその他のリード内端部は絶縁
テープを介して半導体チップの上面に接着されている。
In the LOC structure, bonding pads are arranged along the center of the semiconductor chip, and bus bar leads as power supply lines and ground lines are arranged on both sides of this bonding pad row via insulating tapes. ing. Also, the inner end portions of the leads, which will be signal lines, are aligned on the semiconductor chip outside the bus bar leads, and are fixed to the semiconductor chip with an insulating tape. The bonding pad is connected to the bus bar lead and the inner end of the lead by a conductive wire.
The bus bar leads and other inner ends of the leads are adhered to the upper surface of the semiconductor chip via an insulating tape.

【0004】[0004]

【発明が解決しようとする課題】リードフレームを用い
た半導体装置の多くは、中央の支持板上に半導体チップ
を固定するとともに、前記半導体チップの近傍に先端
(内端)を臨ませるリードの先端部分と前記半導体チッ
プの電極とをワイヤで電気的に接続し、その後、支持
板,半導体チップ,ワイヤおよびリード内端部分をレジ
ンからなるパッケージで覆う構造となっている。このた
め、半導体チップの電極は半導体チップの周縁に沿って
延在するようになり、パッケージが大きくなる。
Most of the semiconductor devices using a lead frame fix a semiconductor chip on a central support plate and make the tip (inner end) of the lead face near the semiconductor chip. The portion and the electrode of the semiconductor chip are electrically connected with a wire, and then the support plate, the semiconductor chip, the wire and the inner end portion of the lead are covered with a package made of a resin. For this reason, the electrodes of the semiconductor chip extend along the peripheral edge of the semiconductor chip, and the package becomes large.

【0005】LOC構造の半導体装置は、パッケージの
小型化に対処するために、リードの先端部分を絶縁テー
プを介して半導体チップ上に重ねる構造となっている。
The semiconductor device having the LOC structure has a structure in which the tip portions of the leads are stacked on the semiconductor chip via an insulating tape in order to cope with the miniaturization of the package.

【0006】しかし、半導体チップの周縁に沿って電極
を配置した半導体チップに従来構造のLOC用リードフ
レームを採用した場合、半導体チップの電極の多くがリ
ードの下に位置し、ワイヤボンディングが不可能となっ
てしまう。
However, when the conventional LOC lead frame is adopted for the semiconductor chip in which the electrodes are arranged along the periphery of the semiconductor chip, most of the electrodes of the semiconductor chip are located under the leads, and wire bonding is impossible. Will be.

【0007】一方、中央部に電極を配列した従来のLO
C構造の半導体装置では、電極とリードの数が限定され
る。たとえば、ワンチップマイコン等の多ピン(多リー
ド)の半導体装置の製造において、設計自由度が得られ
ないという問題がある。
On the other hand, a conventional LO having electrodes arranged in the center
In the C structure semiconductor device, the number of electrodes and leads is limited. For example, in manufacturing a multi-pin (multi-lead) semiconductor device such as a one-chip microcomputer, there is a problem that the degree of freedom in design cannot be obtained.

【0008】本発明の目的は、周縁に沿って電極が設け
られた半導体チップを使用したLOC構造の半導体装置
を提供することにある。
It is an object of the present invention to provide a semiconductor device having a LOC structure using a semiconductor chip having electrodes provided along the periphery.

【0009】本発明の他の目的は、半導体チップにおけ
る電極配置位置設計の自由度が高いLOC構造の半導体
装置を提供することにある。
Another object of the present invention is to provide a semiconductor device having a LOC structure, which has a high degree of freedom in designing the electrode arrangement position on a semiconductor chip.

【0010】本発明の他の目的は、多ピン化に対処でき
るLOC構造の半導体装置を提供することにある。
Another object of the present invention is to provide a semiconductor device having a LOC structure which can cope with an increase in the number of pins.

【0011】本発明の前記ならびにそのほかの目的と新
規な特徴は、本明細書の記述および添付図面からあきら
かになるであろう。
[0011] The above and other objects and novel features of the present invention will become apparent from the description of the present specification and the accompanying drawings.

【0012】[0012]

【課題を解決するための手段】本願において開示される
発明のうち代表的なものの概要を簡単に説明すれば、下
記のとおりである。すなわち、 (1)主面に電極を有する半導体チップと、前記半導体
チップの主面に絶縁体を介して取り付けられる複数のリ
ードと、前記リードと前記半導体チップの電極とを電気
的に接続する接続手段(ワイヤ)と、前記リードの外端
を除くとともに前記半導体チップ, リード内端部分, ワ
イヤを覆う樹脂からなる封止体とを有する半導体装置で
あって、少なくとも一部のリードは前記電極上方にあ
り、前記電極の真上のリード部分にはワイヤが通過する
孔が設けられている。前記半導体チップの電極は半導体
チップの少なくとも二辺の周縁に沿って設けられてい
る。
The following is a brief description of an outline of typical inventions disclosed in the present application. That is, (1) a semiconductor chip having an electrode on the main surface, a plurality of leads attached to the main surface of the semiconductor chip via an insulator, and a connection for electrically connecting the lead and the electrode of the semiconductor chip. A semiconductor device comprising a means (wire) and a semiconductor chip, an inner end portion of the lead, and a sealing body made of a resin covering the wire, excluding the outer end of the lead, at least a part of the lead being above the electrode. And a hole through which a wire passes is provided in the lead portion just above the electrode. The electrodes of the semiconductor chip are provided along at least two peripheral edges of the semiconductor chip.

【0013】(2)主面に電極を有する半導体チップの
主面に絶縁体を介して貼り付けられるリードフレームで
あって、前記リードフレームの半導体チップ上に位置す
る少なくとも一部のリードには前記半導体チップの電極
に対応した位置に半導体チップの電極とリードを電気的
に接続するワイヤが延在する孔が設けられている。
(2) A lead frame which is attached to the main surface of a semiconductor chip having an electrode on the main surface via an insulator, wherein at least a part of the leads located on the semiconductor chip of the lead frame has the above-mentioned structure. A hole through which a wire electrically connecting the electrode of the semiconductor chip and the lead extends is provided at a position corresponding to the electrode of the semiconductor chip.

【0014】[0014]

【作用】前記(1)の手段によれば、(a)リードが半
導体チップの電極上に位置しても、前記電極上のリード
部分には、ワイヤボンディングが行える孔が設けられて
いることから、半導体チップの電極とリードとの接続が
実現できることになり、周縁に沿って電極を有する半導
体チップを使用したLOC構造の半導体装置を提供する
ことができる。
According to the above means (1), even if the lead (a) is located on the electrode of the semiconductor chip, the lead portion on the electrode is provided with a hole for wire bonding. Since the electrodes of the semiconductor chip and the leads can be connected, it is possible to provide a semiconductor device having a LOC structure using the semiconductor chip having electrodes along the periphery.

【0015】(b)半導体チップの電極位置はリードの
真下であってもよいことから、電極配置位置設計の自由
度が高いLOC構造の半導体装置を提供できる。
(B) Since the electrode position of the semiconductor chip may be directly under the lead, it is possible to provide a semiconductor device having a LOC structure with a high degree of freedom in designing the electrode arrangement position.

【0016】(c)半導体チップの電極位置はリードの
真下であってもよく、また、他の位置でも良いことか
ら、多ピン化に対処できるLOC構造の半導体装置を提
供することができる。
(C) Since the electrode position of the semiconductor chip may be directly under the lead or at another position, it is possible to provide a semiconductor device having a LOC structure which can cope with the increase in the number of pins.

【0017】(d)前記リードに設けられる孔は半導体
チップの対面する二辺の周縁に沿って設けらるため、デ
ュアルライン構造の半導体装置もLOC構造として提供
できる。
(D) Since the holes provided in the leads are provided along the peripheral edges of two facing sides of the semiconductor chip, a semiconductor device having a dual line structure can also be provided as an LOC structure.

【0018】前記(2)の手段によれば、電極に対応す
るリード部分にワイヤが通過する孔を設けているため、
半導体チップの周縁に沿って電極を有する半導体装置組
み立て用のリードフレームとなる。
According to the above-mentioned means (2), since the lead portion corresponding to the electrode is provided with the hole through which the wire passes,
A lead frame for assembling a semiconductor device having electrodes along the periphery of the semiconductor chip.

【0019】以下図面を参照して本発明の実施例につい
て説明する。なお、実施例を説明するための全図におい
て、同一機能を有するものは同一符号を付け、その繰り
返しの説明は省略する。
Embodiments of the present invention will be described below with reference to the drawings. In all the drawings for describing the embodiments, components having the same function are denoted by the same reference numerals, and their repeated description will be omitted.

【0020】[0020]

【実施例】図1は本発明の一実施例による半導体装置の
要部を示す断面図、図2は本実施例の半導体装置の一部
を切り欠いた状態の平面図、図3は本実施例の半導体装
置のワイヤボンディング部分を示す斜視図、図4は本実
施例の半導体装置の製造に使用するリードフレームの平
面図、図5は本実施例の半導体装置の製造状態を示すリ
ードフレーム等の平面図である。
1 is a cross-sectional view showing a main part of a semiconductor device according to an embodiment of the present invention, FIG. 2 is a plan view showing a semiconductor device of the present embodiment with a part cut away, and FIG. FIG. 4 is a perspective view showing a wire bonding portion of an example semiconductor device, FIG. 4 is a plan view of a lead frame used for manufacturing the semiconductor device of this embodiment, and FIG. 5 is a lead frame showing a manufacturing state of the semiconductor device of this embodiment. FIG.

【0021】本発明では、たとえば、DRAM(Dynami
c Random Access Memory)が組み込まれたLOC構造の
半導体装置について説明する。
In the present invention, for example, a DRAM (Dynami
A semiconductor device having a LOC structure in which a c Random Access Memory) is incorporated will be described.

【0022】本発明の半導体装置は、図1および図2に
示すように、レジンからなる矩形体状の封止体(パッケ
ージ)1の両側から、複数のリード2をそれぞれ突出さ
せる構造となっている。また、パッケージ1の内部には
矩形体からなる半導体チップ3が封止されている。この
半導体チップ3は、図示はしないがDRAMが形成され
ている。前記半導体チップ3は、図3に示すように、周
縁に沿って電極(ボンディングパッド;パッド)4が複
数(図3では一つのみ示す)並んで設けられている。電
極4の表面はワイヤボンディング性能を良好とするため
に、図示はしないが銀メッキが施されている。
As shown in FIGS. 1 and 2, the semiconductor device of the present invention has a structure in which a plurality of leads 2 are respectively projected from both sides of a rectangular-shaped sealing body (package) 1 made of a resin. There is. A semiconductor chip 3 having a rectangular shape is sealed inside the package 1. Although not shown, a DRAM is formed on the semiconductor chip 3. As shown in FIG. 3, the semiconductor chip 3 is provided with a plurality of electrodes (bonding pads; pads) 4 (only one is shown in FIG. 3) arranged side by side along the periphery. Although not shown, the surface of the electrode 4 is silver-plated in order to improve the wire bonding performance.

【0023】前記リード2は、図1および図2に示され
るように、パッケージ1の両側に延在している。リード
2のパッケージ1から突出した部分はアウターリード5
となり、J−ベンド構造となっている。
The leads 2 extend on both sides of the package 1 as shown in FIGS. The part of the lead 2 protruding from the package 1 is the outer lead 5.
And has a J-bend structure.

【0024】リード2のパッケージ1内に入った部分
(インナーリード6)は、その先端部分が平行に延在す
るとともに、絶縁体、すなわち、接着性の絶縁テープ7
を介して半導体チップ3に貼り付けられている。
The portions of the leads 2 (the inner leads 6) that enter the package 1 have their tip portions extending in parallel, and an insulator, that is, an adhesive insulating tape 7 is provided.
It is attached to the semiconductor chip 3 via.

【0025】また、前記インナーリード6は、半導体チ
ップ3の各電極4上を延在する構造となっている。そし
て、前記電極4の真上のリード部分には、図3に示すよ
うに、前記電極4と同じ大きさの孔9が設けられてい
る。すなわち、本実施例で使用する半導体チップ3は、
一般に言うところのLOC構造用の半導体チップではな
く、半導体チップ3の両側に沿って電極4を配列した従
来の半導体チップである。
The inner leads 6 are structured to extend over the respective electrodes 4 of the semiconductor chip 3. Then, as shown in FIG. 3, a hole 9 having the same size as that of the electrode 4 is provided in the lead portion just above the electrode 4. That is, the semiconductor chip 3 used in this embodiment is
It is not a general semiconductor chip for LOC structure but a conventional semiconductor chip in which electrodes 4 are arranged along both sides of the semiconductor chip 3.

【0026】前記リード2は、鉄−ニッケル合金板や銅
合金板をエッチングや精密プレスによって形成される。
たとえば、リード2の幅は200μm、孔9の大きさは
90μm程度であり、熱圧着法によるワイヤボンディン
グが可能な大きさとなっている。
The lead 2 is formed by etching or precision pressing an iron-nickel alloy plate or a copper alloy plate.
For example, the width of the lead 2 is 200 μm and the size of the hole 9 is about 90 μm, which is a size capable of wire bonding by the thermocompression bonding method.

【0027】また、図3に示すように、前記半導体チッ
プ3の電極4と絶縁テープ7上のリード2部分は、電気
的接続手段、すなわち、ワイヤ10で接続されている。
ワイヤ10の一端は固いAl等からなる電極4に一端を
固定されるとともに、他端は絶縁テープ7上のリード2
(インナーリード6)の先端部分に固定されるため、ワ
イヤボンディングの信頼性が高くなる。ワイヤ10は、
前記孔9部分で曲がり、リード2に接触しても、ワイヤ
ボンディングされるリード部分であることから問題はな
い。
Further, as shown in FIG. 3, the electrode 4 of the semiconductor chip 3 and the lead 2 portion on the insulating tape 7 are connected by an electrical connecting means, that is, a wire 10.
One end of the wire 10 is fixed to the electrode 4 made of hard Al or the like, and the other end is the lead 2 on the insulating tape 7.
Since it is fixed to the tip portion of the (inner lead 6), the reliability of wire bonding is increased. Wire 10
Even if it bends at the hole 9 portion and comes into contact with the lead 2, there is no problem because it is a lead portion that is wire-bonded.

【0028】つぎに、図4および図5を参照しながら本
実施例のLOC構造の半導体装置の製造(組立)方法に
ついて説明する。
Next, a method of manufacturing (assembling) the semiconductor device having the LOC structure of this embodiment will be described with reference to FIGS.

【0029】最初に図4に示すようなリードフレーム1
5が用意される。このリードフレーム15は、0.1m
m前後の厚さのFe−Ni系合金あるいはCu合金等か
らなる金属板をエッチングまたは精密プレスによってパ
ターニングすることによって形成される。リードフレー
ム15は複数の単位リードパターンを一方向に直列に並
べた形状となっている。単位リードパターンは、一対の
平行に延在する外枠16と、この一対の外枠16を連結
しかつ外枠16に直交する方向に延在する一対の内枠1
7とによって形成される枠18内に形成されている。
First, the lead frame 1 as shown in FIG.
5 is prepared. This lead frame 15 is 0.1 m
It is formed by etching or patterning a metal plate made of a Fe-Ni alloy or Cu alloy having a thickness of about m by etching or precision pressing. The lead frame 15 has a shape in which a plurality of unit lead patterns are arranged in series in one direction. The unit lead pattern includes a pair of outer frames 16 extending in parallel with each other, and a pair of inner frames 1 connecting the pair of outer frames 16 and extending in a direction orthogonal to the outer frame 16.
It is formed in a frame 18 formed by 7 and 7.

【0030】一方、前記枠18の内枠17の内側から複
数のリード2が枠18の中央に向かって延在している。
これらリード2は、途中まで相互に平行となって延在し
てその殆どはアウターリードを形成するが、途中から枠
18の中心線方向にそれぞれ屈曲して片持梁構造のイン
ナーリード6を形成している。
On the other hand, a plurality of leads 2 extend from the inside of the inner frame 17 of the frame 18 toward the center of the frame 18.
These leads 2 extend in parallel to each other partway and most of them form outer leads, but they are bent from the middle in the direction of the center line of the frame 18 to form the inner leads 6 of a cantilever structure. doing.

【0031】前記各インナーリード6には、ワイヤが通
過する孔9が設けられている。孔9は、半導体チップ3
の両側に沿って配置される電極(ボンディングパッド)
4の真上に位置している。この孔9は、一辺が90μm
の貫通孔である。リード2の幅は約200μmである。
前記半導体チップ3の電極4も一辺が90μmとなって
いる。
Each inner lead 6 has a hole 9 through which a wire passes. The hole 9 is the semiconductor chip 3
Electrodes (bonding pads) arranged along both sides of
It is located just above 4. This hole 9 has a side of 90 μm
Through hole. The width of the lead 2 is about 200 μm.
The side of the electrode 4 of the semiconductor chip 3 is also 90 μm.

【0032】前記アウターリード5は、前記内枠17に
平行に延在するダム19によって連結されている。前記
ダム19は後工程のレジンモールド時、溶けたレジンの
流出を阻止するダムとして、また強度部材として作用す
る。なお、前記外枠16には、ガイド孔20,21が設
けられている。これらガイド孔20,21は、リードフ
レーム15の移送や位置決め等のガイドとして利用され
る。
The outer leads 5 are connected to each other by a dam 19 extending in parallel with the inner frame 17. The dam 19 functions as a dam that prevents the melted resin from flowing out at the time of resin molding in a later step and also as a strength member. The outer frame 16 is provided with guide holes 20 and 21. These guide holes 20 and 21 are used as guides for transferring and positioning the lead frame 15.

【0033】つぎに、このようなリードフレーム15
は、図5に示すように、半導体チップ3の主面に重ねら
れて絶縁テープ(絶縁体)7を介して貼り付けられる。
絶縁テープ7は、たとえば、厚さ80μm程度の両面接
着テープからなり、両内枠17から延在するリード2の
先端、すなわち、インナーリード6の先端部分が半導体
チップ3に貼り付けられる。この場合、各リード2に設
けられた孔9の中心が半導体チップ3の電極4の中心に
位置するように組み立てられる。
Next, the lead frame 15
As shown in FIG. 5, is superposed on the main surface of the semiconductor chip 3 and attached via an insulating tape (insulator) 7.
The insulating tape 7 is, for example, a double-sided adhesive tape having a thickness of about 80 μm, and the tips of the leads 2 extending from both inner frames 17, that is, the tips of the inner leads 6 are attached to the semiconductor chip 3. In this case, the assembly is performed such that the center of the hole 9 provided in each lead 2 is located at the center of the electrode 4 of the semiconductor chip 3.

【0034】つぎに、熱圧着ワイヤボンディング装置に
よって、リード2に設けられた孔9の下方の電極4にワ
イヤ10の先端が固定される。その後、ワイヤを保持す
るボンディングツールは、ボンディングツールの先端か
らワイヤ10を繰り出しながら上昇して前記孔9から抜
ける。孔9から抜けたボンディングツールはインナーリ
ード6の先端側に移動するとともに、下降し、絶縁テー
プ7上のリード部分にワイヤ10の途中を熱圧着してワ
イヤを切断する(図3参照)。前記ワイヤボンディング
は超音波熱圧着装置でワイヤボンディングを行っても良
い。
Next, the tip of the wire 10 is fixed to the electrode 4 below the hole 9 provided in the lead 2 by the thermocompression bonding device. After that, the bonding tool holding the wire rises while pulling out the wire 10 from the tip of the bonding tool and comes out of the hole 9. The bonding tool removed from the hole 9 moves to the tip side of the inner lead 6 and descends, and the wire 10 is thermocompression bonded to the lead portion on the insulating tape 7 to cut the wire (see FIG. 3). The wire bonding may be performed by an ultrasonic thermocompression bonding device.

【0035】各電極4とインナーリード6の先端との接
続が完了した後は、図5の二点鎖線および実線で示すよ
うに、トランスファモールドによる成形によってパッケ
ージ1を形成する。
After the connection between each electrode 4 and the tips of the inner leads 6 is completed, the package 1 is formed by transfer molding as shown by the two-dot chain line and the solid line in FIG.

【0036】つぎに、ダム19等不要なリードフレーム
部分を切断除去するとともに、パッケージ1から突出し
たリード2部分、すなわち、アウターリード5を所望の
形状に形成して、たとえば、図1に示すようなJ−ベン
ド構造として半導体装置を製造する。
Next, unnecessary lead frame portions such as the dam 19 are cut and removed, and the lead 2 portions protruding from the package 1, that is, the outer leads 5 are formed into a desired shape. For example, as shown in FIG. A semiconductor device is manufactured as a J-bend structure.

【0037】本実施例のリードフレームを使用して製造
したLOC構造の半導体装置によれば以下のような効果
を奏する。
The LOC structure semiconductor device manufactured using the lead frame of this embodiment has the following effects.

【0038】(1)リード2が半導体チップ3の電極
(ボンディングパッド)4上に位置しても、前記電極4
上のリード部分には、ワイヤボンディングが行える孔9
が設けられていることから、半導体チップ3の電極4と
リード2との接続が実現できることになり、周縁に沿っ
て電極4を有する半導体チップ3を使用したLOC構造
の半導体装置を提供することができる。したがって、周
縁に沿って電極4を有する半導体チップ3の場合も、L
OC構造となることから、半導体チップの大型化あるい
はパッケージの小型化が図れる。
(1) Even if the lead 2 is located on the electrode (bonding pad) 4 of the semiconductor chip 3, the electrode 4
A hole 9 for wire bonding is provided on the upper lead portion.
Since the electrodes are provided, the connection between the electrode 4 of the semiconductor chip 3 and the lead 2 can be realized, and it is possible to provide the semiconductor device of the LOC structure using the semiconductor chip 3 having the electrode 4 along the peripheral edge. it can. Therefore, even in the case of the semiconductor chip 3 having the electrodes 4 along the periphery, L
With the OC structure, the size of the semiconductor chip or the size of the package can be reduced.

【0039】(2)半導体チップ3の電極4の位置はリ
ード2の真下であってもよいことから、電極配置位置設
計の自由度が高いLOC構造の半導体装置を提供でき
る。
(2) Since the position of the electrode 4 of the semiconductor chip 3 may be right under the lead 2, it is possible to provide a semiconductor device of LOC structure having a high degree of freedom in designing the electrode arrangement position.

【0040】(3)半導体チップ3の電極4の位置はリ
ード2の真下であってもよく、また、他の位置でも良い
ことから、多ピン化に対処できるLOC構造の半導体装
置を提供することができる。
(3) Since the position of the electrode 4 of the semiconductor chip 3 may be directly under the lead 2 or at another position, it is possible to provide a semiconductor device having a LOC structure capable of coping with an increase in the number of pins. You can

【0041】(4)前記リード2に設けられる孔9は半
導体チップ3の対面する二辺の周縁に沿って設けらるた
め、デュアルライン構造の半導体装置もLOC構造とし
て提供できる。
(4) Since the holes 9 provided in the leads 2 are provided along the peripheral edges of two facing sides of the semiconductor chip 3, a semiconductor device having a dual line structure can also be provided as an LOC structure.

【0042】以上本発明者によってなされた発明を実施
例に基づき具体的に説明したが、本発明は上記実施例に
限定されるものではなく、その要旨を逸脱しない範囲で
種々変更可能であることはいうまでもない。
Although the invention made by the present inventor has been specifically described based on the embodiments, the invention is not limited to the above embodiments, and various modifications can be made without departing from the scope of the invention. Needless to say.

【0043】図6は本発明の他の実施例であるLOC構
造の半導体装置におけるリードと半導体チップの電極と
の関係を示す模式図である。同図に示すように、一部の
リード2には孔9を設けない構造となっている。また、
リード2とリード2との間に電極4を配置したり、半導
体チップ3の中心に沿って電極4を配置した例である。
FIG. 6 is a schematic view showing the relationship between the leads and the electrodes of the semiconductor chip in the semiconductor device having the LOC structure which is another embodiment of the present invention. As shown in the figure, some of the leads 2 are not provided with holes 9. Also,
This is an example in which the electrode 4 is arranged between the leads 2 and the electrode 4 is arranged along the center of the semiconductor chip 3.

【0044】すなわち、本実施例では、主面に電極4を
有する半導体チップ3と、前記半導体チップ3の主面に
絶縁体(点々を施して示した絶縁テープ7)を介して取
り付けられる複数のリード2と、前記リード2と前記半
導体チップ3の電極4とを電気的に接続する接続手段
(ワイヤ10)と、前記リード2の外端を除くとともに
前記半導体チップ3, リード2の内端部分, ワイヤ10
を覆う樹脂からなる封止体(パッケージ)1とを有する
半導体装置であって、少なくとも一部のリード2は前記
電極4の上方にあり、前記電極4の真上のリード2部分
にはワイヤ10が通過する孔9が設けられている構成と
なっている。本実施例でも前記実施例同様な効果が得ら
れる。
That is, in this embodiment, the semiconductor chip 3 having the electrode 4 on the main surface thereof and a plurality of semiconductor chips 3 mounted on the main surface of the semiconductor chip 3 via an insulator (insulating tape 7 shown by dots) are attached. The lead 2, the connecting means (the wire 10) for electrically connecting the lead 2 and the electrode 4 of the semiconductor chip 3, and the semiconductor chip 3, the inner end portion of the lead 2 except the outer end of the lead 2. , Wire 10
And a sealing body (package) 1 made of a resin for covering at least some of the leads 2 above the electrode 4, and the wire 10 is provided on the lead 2 portion directly above the electrode 4. Is provided with a hole 9 through which In this embodiment, the same effect as the above embodiment can be obtained.

【0045】また、他の実施例として、ワイヤが通過す
る孔を円形等の他の形状としても前記実施例同様な効果
が得られる。
Further, as another embodiment, the same effect as the above embodiment can be obtained even if the hole through which the wire passes has another shape such as a circle.

【0046】また、前記孔の部分に半田等導電性の物質
を充填して半導体チップの電極とリードとを電気的に接
続してもよい。
The holes may be filled with a conductive substance such as solder to electrically connect the electrodes of the semiconductor chip to the leads.

【0047】さらに、前記実施例では、パッケージの対
面する2辺からリードを突出させる構造としたが、他の
例、たとえばパッケージの4辺からリードを突出させる
構造としても前記実施例同様な効果が得られる。
Further, in the above-described embodiment, the structure is such that the leads are projected from the two opposite sides of the package. However, the same effect as in the above-described embodiments can be obtained by another example, for example, the structure in which the leads are projected from four sides of the package. can get.

【0048】以上の説明では主として本発明者によって
なされた発明をその背景となった利用分野であるDRA
Mに適用した場合について説明したが、それに限定され
るものではなく、たとえば、他のICの製造技術等に適
用できる。本発明は少なくともワイヤボンディング等電
気的接続手段で半導体チップの電極とリードとを接続す
る技術には適用できる。
In the above description, the invention made by the present inventor is the field of application which is the background of the invention.
Although the case of application to M has been described, the present invention is not limited to this, and can be applied to, for example, another IC manufacturing technology. The present invention can be applied at least to a technique for connecting electrodes and leads of a semiconductor chip by an electrical connection means such as wire bonding.

【0049】[0049]

【発明の効果】本願において開示される発明のうち代表
的なものによって得られる効果を簡単に説明すれば、下
記のとおりである。
The effects obtained by the representative ones of the inventions disclosed in the present application will be briefly described as follows.

【0050】(1)リードが半導体チップの電極上に位
置しても、前記電極上のリード部分には、ワイヤボンデ
ィングが行える孔が設けられていることから、半導体チ
ップの電極とリードとの接続が実現できることになり、
周縁に沿って電極を有する半導体チップを使用したLO
C構造の半導体装置を提供することができる。したがっ
て半導体チップの大面積化,パッケージの小型化に対処
できることになる。
(1) Even if the lead is located on the electrode of the semiconductor chip, the lead portion on the electrode is provided with a hole for wire bonding, so that the electrode of the semiconductor chip is connected to the lead. Will be realized,
LO using a semiconductor chip having electrodes along the periphery
A semiconductor device having a C structure can be provided. Therefore, it is possible to cope with the large area of the semiconductor chip and the miniaturization of the package.

【0051】(2)半導体チップの電極位置はリードの
真下であってもよいことから、電極配置位置設計の自由
度が高いLOC構造の半導体装置を提供できる。
(2) Since the electrode position of the semiconductor chip may be right under the lead, it is possible to provide a semiconductor device having a LOC structure with a high degree of freedom in designing the electrode arrangement position.

【0052】(3)半導体チップの電極位置はリードの
真下であってもよく、また、他の位置でも良いことか
ら、多ピン化に対処できるLOC構造の半導体装置を提
供することができる。
(3) Since the electrode position of the semiconductor chip may be directly under the lead or may be at another position, it is possible to provide a semiconductor device having a LOC structure capable of coping with an increase in the number of pins.

【0053】(4)前記リードに設けられる孔は半導体
チップの対面する二辺の周縁に沿って設けらるため、デ
ュアルライン構造の半導体装置もLOC構造として提供
できる。
(4) Since the holes provided in the leads are provided along the peripheral edges of two facing sides of the semiconductor chip, a semiconductor device having a dual line structure can be provided as the LOC structure.

【0054】(5)電極に対応するリード部分にワイヤ
が通過する孔を設けているため、半導体チップの周縁に
沿って電極を有する半導体装置組み立て用のリードフレ
ームを提供できる。
(5) Since the lead portion corresponding to the electrode is provided with the hole through which the wire passes, it is possible to provide a lead frame for assembling a semiconductor device having the electrode along the periphery of the semiconductor chip.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例による半導体装置の要部を示
す断面図である。
FIG. 1 is a sectional view showing a main part of a semiconductor device according to an embodiment of the present invention.

【図2】本実施例の半導体装置の一部を切り欠いた状態
の平面図である。
FIG. 2 is a plan view showing a state in which a part of the semiconductor device of this embodiment is cut away.

【図3】本実施例の半導体装置のワイヤボンディング部
分を示す斜視図である。
FIG. 3 is a perspective view showing a wire bonding portion of the semiconductor device of this embodiment.

【図4】本実施例の半導体装置の製造に使用するリード
フレームの平面図である。
FIG. 4 is a plan view of a lead frame used for manufacturing the semiconductor device of this embodiment.

【図5】本実施例の半導体装置の製造状態を示すリード
フレーム等の平面図である。
FIG. 5 is a plan view of a lead frame or the like showing a manufacturing state of the semiconductor device of this embodiment.

【図6】本発明の他の実施例であるLOC構造の半導体
装置におけるリードと半導体チップの電極との関係を示
す模式図である。
FIG. 6 is a schematic view showing a relationship between leads and electrodes of a semiconductor chip in a semiconductor device having a LOC structure which is another embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1…パッケージ、2…リード、3…半導体チップ、4…
電極、5…アウターリード、6…インナーリード、7…
絶縁テープ、9…孔、10…ワイヤ、15…リードフレ
ーム、16…外枠、17…内枠、18…枠、19…ダ
ム、20,21…ガイド孔。
1 ... Package, 2 ... Lead, 3 ... Semiconductor chip, 4 ...
Electrodes, 5 ... Outer leads, 6 ... Inner leads, 7 ...
Insulating tape, 9 ... Hole, 10 ... Wire, 15 ... Lead frame, 16 ... Outer frame, 17 ... Inner frame, 18 ... Frame, 19 ... Dam, 20, 21 ... Guide hole.

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 主面に電極を有する半導体チップと、前
記半導体チップの主面に絶縁体を介して取り付けられる
複数のリードと、前記リードと前記半導体チップの電極
とを電気的に接続する接続手段と、前記リードの外端を
除くとともに前記半導体チップ, リード内端部分, 接続
手段を覆う樹脂からなる封止体とを有する半導体装置で
あって、少なくとも一部のリードは前記電極上方にあ
り、前記電極の真上のリード部分には接続手段が通過す
る孔が設けられていることを特徴とする半導体装置。
1. A semiconductor chip having an electrode on a main surface, a plurality of leads attached to the main surface of the semiconductor chip via an insulator, and a connection for electrically connecting the lead and the electrode of the semiconductor chip. And a semiconductor encapsulant excluding the outer ends of the leads and covering the semiconductor chip, the inner end portions of the leads, and a connecting means, wherein at least some of the leads are above the electrodes. A semiconductor device characterized in that a hole through which a connecting means passes is provided in a lead portion directly above the electrode.
【請求項2】 前記孔には導電性のワイヤが通過する孔
が設けられていることを特徴とする請求項1記載の半導
体装置。
2. The semiconductor device according to claim 1, wherein the hole is provided with a hole through which a conductive wire passes.
【請求項3】 前記半導体チップの電極は半導体チップ
の少なくとも二辺の周縁に沿って設けられていることを
特徴とする請求項1または請求項2記載の半導体装置。
3. The semiconductor device according to claim 1, wherein the electrodes of the semiconductor chip are provided along at least two peripheral edges of the semiconductor chip.
【請求項4】 主面に電極を有する半導体チップの主面
に絶縁体を介して貼り付けられるリードフレームであっ
て、前記リードフレームの半導体チップ上に位置する少
なくとも一部のリードには前記半導体チップの電極に対
応した位置に半導体チップの電極とリードを電気的に接
続する接続手段が延在する孔が設けられていることを特
徴とするリードフレーム。
4. A lead frame which is attached to a main surface of a semiconductor chip having an electrode on the main surface via an insulator, wherein at least some of the leads located on the semiconductor chip of the lead frame have the semiconductor. A lead frame, characterized in that a hole is provided at a position corresponding to the electrode of the chip, and a connecting means for electrically connecting the electrode of the semiconductor chip and the lead is provided.
【請求項5】 前記孔には導電性のワイヤが通過する孔
が設けられていることを特徴とする請求項4記載の半導
体装置。
5. The semiconductor device according to claim 4, wherein the hole is provided with a hole through which a conductive wire passes.
JP7169421A 1995-07-05 1995-07-05 Semiconductor device and lead frame used for its manufacture Pending JPH0922978A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7169421A JPH0922978A (en) 1995-07-05 1995-07-05 Semiconductor device and lead frame used for its manufacture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7169421A JPH0922978A (en) 1995-07-05 1995-07-05 Semiconductor device and lead frame used for its manufacture

Publications (1)

Publication Number Publication Date
JPH0922978A true JPH0922978A (en) 1997-01-21

Family

ID=15886286

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7169421A Pending JPH0922978A (en) 1995-07-05 1995-07-05 Semiconductor device and lead frame used for its manufacture

Country Status (1)

Country Link
JP (1) JPH0922978A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019153752A (en) * 2018-03-06 2019-09-12 トヨタ自動車株式会社 Semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019153752A (en) * 2018-03-06 2019-09-12 トヨタ自動車株式会社 Semiconductor device

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