JPH0827307B2 - Printed wiring board test equipment - Google Patents
Printed wiring board test equipmentInfo
- Publication number
- JPH0827307B2 JPH0827307B2 JP62328384A JP32838487A JPH0827307B2 JP H0827307 B2 JPH0827307 B2 JP H0827307B2 JP 62328384 A JP62328384 A JP 62328384A JP 32838487 A JP32838487 A JP 32838487A JP H0827307 B2 JPH0827307 B2 JP H0827307B2
- Authority
- JP
- Japan
- Prior art keywords
- printed wiring
- wiring board
- insulation resistance
- terminal
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Description
【発明の詳細な説明】 〔概要〕 短い測定時間で、精度よく絶縁抵抗を測定するプリン
ト配線板の試験装置（布線試験機）に関し、 250Vの印加電圧をもって、比較的大きな静電容量を有
する半導体装置の絶縁抵抗を測定する場合にも、測定時
間が増大せず、しかも、精度よく測定することが可能な
プリント配線板の試験装置（布線試験機）を提供するこ
とを目的とし、 電圧印加手段と、この電圧印加手段の一方の端子に直
列に接続され、回路を並列に二分する回路切り替え手段
と、この回路切り替え手段の一方の出力端子に接続さ
れ、100Ω程度の小さな抵抗値を有する高速充電用抵抗
器と、前記回路切り替え手段の他方の出力端子に接続さ
れ、100KΩ〜1MΩ程度の大きな抵抗値を有する、絶縁抵
抗測定用抵抗器と、この絶縁抵抗測定用抵抗器と前記高
速充電用抵抗器と、の並列回路に接続され、プリント配
線板の一方の端子に接続される、プリント配線試験用端
子と、前記電圧印加手段の他方の端子に接続される端子
に接続され、プリント配線板の他方の端子に接続され
る、プリント配線板試験用端子と、前記試験用端子と試
験用端子との間に発生する電圧の時間に対する変化率が
所定の値になったことを検出し、前記回路切り替え手段
の前記高速充電用抵抗器側から前記絶縁抵抗測定用抵抗
器側に切り替える切り替え信号を送出する印加電圧検出
手段と、前記絶縁抵抗測定用抵抗器に発生する電圧を測
定して、前記プリント配線板の絶縁抵抗を算出する絶縁
抵抗算出手段とをもって構成される。DETAILED DESCRIPTION OF THE INVENTION [Outline] A printed wiring board tester (wiring tester) for accurately measuring insulation resistance in a short measurement time, having a relatively large capacitance with an applied voltage of 250V. The purpose of the present invention is to provide a printed wiring board testing device (wiring tester) that does not increase the measurement time even when measuring the insulation resistance of a semiconductor device, and that enables accurate measurement. The voltage applying means is connected in series to one terminal of the voltage applying means, and is connected to one of the output terminals of the circuit switching means for dividing the circuit into two in parallel, and has a small resistance value of about 100Ω. A resistor for high-speed charging, an insulation resistance measuring resistor connected to the other output terminal of the circuit switching means and having a large resistance value of about 100 KΩ to 1 MΩ, and this insulation resistance measuring resistor and the front A high-speed charging resistor, connected to a parallel circuit, connected to one terminal of a printed wiring board, a printed wiring test terminal, and connected to a terminal connected to the other terminal of the voltage applying means, Detects that the rate of change with time of the voltage generated between the printed wiring board test terminal connected to the other terminal of the printed wiring board and the test terminal and the test terminal has reached a predetermined value. Then, the applied voltage detecting means for sending a switching signal for switching from the fast charging resistor side of the circuit switching means to the insulation resistance measuring resistor side and the voltage generated in the insulation resistance measuring resistor are measured. And an insulation resistance calculation means for calculating the insulation resistance of the printed wiring board.
短い測定時間で、精度よく絶縁抵抗を測定するプリン
ト配線板の試験装置（布線試験機）に関する。The present invention relates to a printed wiring board testing device (wiring tester) that accurately measures insulation resistance in a short measurement time.
従来技術に係るプリント配線板の試験装置（布線試験
機）は、第２図に示すように、電圧印加手段Ｅが発生す
る電圧V1を、100KΩ〜1MΩの抵抗を有する絶縁抵抗測定
用抵抗器RSを介して、プリント配線板Ｐに印加し、絶縁
抵抗測定用抵抗器RS（抵抗値rS）中に発生する電圧降下
V2を測定し、 の関係からプリント配線板Ｐに流れる電流Ｉを算出し、 の関係からプリント配線板Ｐの絶縁抵抗Ｒを算出するも
のである。As shown in FIG. 2, a printed wiring board testing apparatus (wiring tester) according to the prior art uses a voltage V 1 generated by a voltage applying means E as a resistance for insulation resistance measurement having a resistance of 100 KΩ to 1 MΩ. through the vessel R S, it is applied to the printed wiring board P, the voltage drop occurring in the insulation resistance measuring resistor R S (resistance value r S)
Measure V 2 , The current I flowing through the printed wiring board P is calculated from the relationship The insulation resistance R of the printed wiring board P is calculated from the above relationship.
ところで、かつては、電圧印加手段Ｅの印加電圧V1と
して10Vが使用されており、プリント配線板Ｐの絶縁抵
抗は1MΩ以上あれば良いとされてきた。ところが、10V
の印加電圧に対しては、十分な絶縁が保たれているが、
印加電圧を更に上げると、絶縁が破壊されるような微小
な欠陥が、しばしば検出されるようになったので、プリ
ント配線板の信頼性を高めるため、印加電圧V1を250Vに
高め、100MΩという高絶縁抵抗まで測定することが必要
になった。By the way, in the past, 10V was used as the applied voltage V 1 of the voltage applying means E, and it has been considered that the insulation resistance of the printed wiring board P should be 1 MΩ or more. However, 10V
Sufficient insulation is maintained for the applied voltage of
When the applied voltage was further increased, minute defects such as insulation breakdown were often detected.In order to improve the reliability of the printed wiring board, the applied voltage V 1 was increased to 250 V, which was 100 MΩ. It became necessary to measure up to high insulation resistance.
プリント配線板Ｐに250Vを印加して、プリント配線板
Ｐの絶縁抵抗100MΩを測定する場合、絶縁抵抗測定用抵
抗器RSの抵抗値rSを０と仮定しても、プリント配線板Ｐ
に流れる電流は、2.5×10-6Aと極めて小さな値となる。
この小電流を精度よく測定するにば、絶縁抵抗測定用抵
抗器RSの抵抗値をrSを大きくする必要があるが、例えば
絶縁抵抗測定用抵抗器RSの抵抗値をrSを1MΩとすれば絶
縁抵抗測定用抵抗器RSに発生する電圧は2.5Vとなり、精
度よく測定することができる。前記のように、この電圧
からプリント配線板Ｐに流れる電流Ｉを算出し、プリン
ト配線板Ｐの絶縁抵抗Ｒを算出することができる。When 250 V is applied to the printed wiring board P and the insulation resistance of the printed wiring board P is 100 MΩ, the printed wiring board P is assumed to have a resistance value r S of 0 for the insulation resistance measuring resistor R S.
The current that flows through is a very small value of 2.5 × 10 -6 A.
If this small current to be measured accurately, 1 M.OMEGA but the resistance value of the insulation resistance measuring resistor R S it is necessary to increase the r S, for example, the resistance value of the insulation resistance measuring resistor R S a r S Then, the voltage generated in the insulation resistance measuring resistor R S is 2.5 V, which enables accurate measurement. As described above, the current I flowing through the printed wiring board P can be calculated from this voltage, and the insulation resistance R of the printed wiring board P can be calculated.
一方、集積回路の集積度が著しく向上してきたため、
プリント配線板内の配線相互間のキャパシタンスが増大
してきた。On the other hand, because the degree of integration of integrated circuits has improved significantly,
The capacitance between wirings in a printed wiring board has increased.
この結果、大きなキャパシタンスを有するプリント配
線板に、大きな抵抗値を有する絶縁抵抗測定用抵抗器RS
を介して250Vの電圧を印加すると、キャパシタンスに充
電電流が流れるため、プリント配線板試験用端子T1とT2
の間に発生する電圧は、ゆっくり上昇して飽和値に達す
る。換言すれば、第３図のタイムチャートに示すよう
に、電圧が印加されてから、電流はゆっくり上昇し、し
ばらくして、図にＸをもって示す時点において、はじめ
て、プリント配線板の絶縁抵抗の測定が可能になること
から、測定に時間を要し、支障をきたすようになった。As a result, a printed wiring board having a large capacitance has an insulation resistance measuring resistor R S having a large resistance value.
When a voltage of 250 V is applied through the capacitor, a charging current flows through the capacitance, so the printed wiring board test terminals T 1 and T 2
The voltage developed during this rises slowly to reach the saturation value. In other words, as shown in the time chart of FIG. 3, the current slowly rises after the voltage is applied, and after a while, the insulation resistance of the printed wiring board is measured for the first time at the time indicated by X in the figure. Since it becomes possible, it takes time to perform the measurement, which causes trouble.
本発明の目的は、この欠点を解消することにあり、25
0Vの印加電圧をもって絶縁抵抗を測定する場合にも、測
定時間が増大せず、しかも、精度よく測定可能なプリン
ト配線板の試験装置（布線試験機）を提供することにあ
る。The purpose of the present invention is to overcome this drawback.
It is an object of the present invention to provide a printed wiring board testing device (wiring tester) that does not increase the measurement time even when the insulation resistance is measured with an applied voltage of 0 V and can perform accurate measurement.
上記の目的は、電圧印加手段（Ｅ）と、この電圧印加
手段（Ｅ）の一方の端子に直列に接続され、回路を並列
に二分する回路切り替え手段（Ｓ）と、この回路切り替
え手段（Ｓ）を一方の出力端子に接続され、100Ω程度
に小さな抵抗値を有する高速充電用抵抗器（RC）と、前
記回路切り替え手段（Ｓ）の他方の出力端子に接続さ
れ、100KΩ〜1MΩ程度の大きな抵抗値を有する、絶縁抵
抗測定用抵抗器（RS）と、この絶縁抵抗測定用抵抗器
（RS）と前記高速充電用抵抗器（RC）との並列回路に接
続され、プリント配線板（Ｐ）の一方の端子に接続され
る、プリント配線板試験用端子（T1）と、前記電圧印加
手段（Ｅ）の他方の端子に接続される端子に接続され、
プリント配線板（Ｐ）の他方の端子に接続される、プリ
ント配線板試験用端子（T2）と、前記試験用端子（T1）
と試験用端子（T2）との間に発生する電圧の時間に対す
る変化率が所定の値になったことを検出し、前記回路切
り替え手段（Ｓ）の前記高速充電用抵抗器（RC）側から
前記絶縁抵抗測定用抵抗器（RS）側に切り替える切り替
え信号を送出する印加電圧検出手段（VD）と、前記絶縁
抵抗測定用抵抗器（RS）に発生する電圧を測定して、前
記プリント配線板（Ｐ）の絶縁抵抗を算出する絶縁抵抗
算出手段（Ｖ）とを設けたプリント配線板の試験装置
（布線試験機）とによって達成される。The above-mentioned object is to apply the voltage applying means (E), the circuit switching means (S) that is connected in series to one terminal of the voltage applying means (E) and divides the circuit into two in parallel, and the circuit switching means (S). ) Is connected to one output terminal and is connected to a high-speed charging resistor (R C ) having a small resistance value of about 100Ω, and the other output terminal of the circuit switching means (S), and is connected to about 100KΩ to 1MΩ. Insulation resistance measuring resistor (R S ) having a large resistance value and a parallel circuit of the insulation resistance measuring resistor (R S ) and the high-speed charging resistor (R C ) are connected, and a printed wiring is connected. A printed wiring board test terminal (T 1 ) connected to one terminal of the board (P) and a terminal connected to the other terminal of the voltage applying means (E),
A printed wiring board test terminal (T 2 ) connected to the other terminal of the printed wiring board (P) and the test terminal (T 1 ).
It is detected that the rate of change of the voltage generated between the test terminal (T 2 ) and the test terminal (T 2 ) has reached a predetermined value, and the high-speed charging resistor (R C ) of the circuit switching means (S) is detected. Applied voltage detection means (VD) for sending a switching signal to switch from the insulation resistance measuring resistor (R S ) to the insulation resistance measuring resistor (R S ) and measuring the voltage generated in the insulation resistance measuring resistor (R S ), This is achieved by a printed wiring board testing device (wiring tester) provided with an insulation resistance calculation means (V) for calculating the insulation resistance of the printed wiring board (P).
絶縁抵抗測定開始にあたっては、まず、回路切り替え
手段Ｓを高速充電用抵抗器RC側に接続して、電圧印加手
段Ｅの電圧を100Ω程度の低抵抗を有する高速充電用抵
抗器RCを介して、抵抗とキャパシタンスとからなるプリ
ント配線板Ｐに電圧印加手段Ｅが発生する電250Vを印加
するので、第４図のタイムチャートに示すように、短時
間にプリント配線板Ｐの充電が完了する（第４図にＹを
もって示す）。充電が完了したことを印加電圧検出手段
VDによって検出し、回路切り替え手段Ｓを高速充電用抵
抗器RCから100K〜1MΩの高抵抗を有する絶縁抵抗測定用
抵抗器RS側に切り替え、電圧印加手段Ｅの電圧を絶縁抵
抗測定用抵抗器RS側に印加して、プリント配線板Ｐの絶
縁抵抗を測定するので、短時間に、しかも、高精度の絶
縁抵抗測定が可能である。換言すれば、図にＺをもって
示す時点において、絶縁抵抗測定が可能となる。In order to start the insulation resistance measurement, first, the circuit switching means S is connected to the fast charging resistor RC side, and the voltage of the voltage applying means E is passed through the fast charging resistor RC having a low resistance of about 100Ω. Then, since the voltage of 250 V generated by the voltage applying means E is applied to the printed wiring board P composed of the resistance and the capacitance, the charging of the printed wiring board P is completed in a short time as shown in the time chart of FIG. (Indicated by Y in FIG. 4). Applied voltage detection means that charging is completed
Detected by VD, the circuit switching means S is switched from the high-speed charging resistor R C to the insulation resistance measuring resistor R S side having a high resistance of 100 K to 1 MΩ, and the voltage of the voltage applying means E is the insulation resistance measuring resistance. Since the insulation resistance of the printed wiring board P is measured by applying it to the device R S side, it is possible to measure the insulation resistance with high accuracy in a short time. In other words, the insulation resistance can be measured at the time indicated by Z in the figure.
以下、図面を参照しつゝ、本発明の一実施例に係るプ
リント配線板の試験装置について説明する。Hereinafter, a test apparatus for a printed wiring board according to an embodiment of the present invention will be described with reference to the drawings.
第１図参照 Ｅは電圧印加手段であり、250Vの直流電源と開閉器と
よりなる。Refer to FIG. 1. E is a voltage applying means, which is composed of a DC power source of 250V and a switch.
RCは高速充電用抵抗器であり、100Ω程度の低い抵抗
値を有する。R C is a high-speed charging resistor and has a low resistance value of about 100Ω.
RSは絶縁抵抗測定用抵抗器であり、100KΩ〜1MΩの高
い抵抗値を有する。R S is a resistor for measuring insulation resistance, and has a high resistance value of 100 KΩ to 1 MΩ.
Ｓは回路切り替え手段である。 S is a circuit switching means.
VDは印加電圧検出手段であり、図にT1・T2をもって示
すプリント配線板試験用端子間の電圧を検出し、時間に
対する電圧の変化率dV/dtが０になったことを検出し、
回路切り替え手段Ｓに切り替え信号を出力する。VD is an applied voltage detection means, detects the voltage between terminals for printed wiring board test shown by T 1 and T 2 in the figure, and detects that the rate of change of voltage dV / dt with time becomes 0,
A switching signal is output to the circuit switching means S.
Ｐは被測定体であるプリント配線板である。 P is a printed wiring board which is a measured object.
プリント配線板Ｐの絶縁抵抗を測定するにあたり、第
４図のタイムチャートに示すように、まず、プリント配
線板Ｐの被測定回路の両端を、それぞれ試験用端子T1と
T2とに接続し、回路切り替え手段Ｓを高速充電用抵抗器
RC側に接続し、電圧印加手段Ｅが発生する電圧V1（250
V）をプリント配線板Ｐに印加する。プリント配線板Ｐ
はキャパシタンスと抵抗とよりなっているため、充電に
時間を要するが、高速充電要抵抗器RCの抵抗値が上記の
とおり100Ω程度と小さいので、充電時間が短く、プリ
ント配線板試験用端子T1とT2との間の電圧は第４図に示
すように比較的早く上昇する。In measuring the insulation resistance of the printed wiring board P, as shown in the time chart of FIG. 4, first, both ends of the circuit under test of the printed wiring board P are connected to the test terminals T 1 respectively.
Connect to T 2 and connect the circuit switching means S to a fast charging resistor.
Connected to the R C side, the voltage V 1 (250
V) is applied to the printed wiring board P. Printed wiring board P
Since it consists of capacitance and resistance, it takes time to charge, but since the resistance value of the high-speed charging required resistor R C is as small as about 100Ω as described above, the charging time is short and the printed wiring board test terminal T The voltage between 1 and T 2 rises relatively quickly, as shown in FIG.
印加電圧検出手段VDによって、前記プリント配線板試
験用端子T1とT2との間に発生する電圧の変化率dV/dtが
０になった時点、すなわち、第４図にＹをもって示す時
点を検出し、その出力信号に応答して、回路切り替え手
段Ｓを、高速充電用抵抗器RC側から絶縁抵抗測定用抵抗
器RS側に切り替える。When the rate of change dV / dt of the voltage generated between the printed wiring board test terminals T 1 and T 2 becomes 0 by the applied voltage detection means VD, that is, the time indicated by Y in FIG. In response to the detection signal, the circuit switching means S is switched from the fast charging resistor R C side to the insulation resistance measuring resistor R S side.
前記回路切り替え手段Ｓの切り替え時に、プリント配
線板Ｐの試験用端子T1とT2との間の電圧は、第４図に示
すように、瞬時低下するが、切り替え後直ちに第４図に
Ｚをもって示す時点で飽和状態に復帰する。Ｚの時点以
降において、絶縁抵抗測定用抵抗器RSの両端の電圧V2を
電圧測定手段Ｖを使用して測定し、 の関係からプリント配線板Ｐに流れる電流Ｉを算出し、 の関係からプリント配線板Ｐの絶縁抵抗Ｒを算出する。At the time of switching the circuit switching means S, the voltage between the test terminals T 1 and T 2 of the printed wiring board P momentarily drops as shown in FIG. It returns to the saturated state at the time point indicated by. After the time point Z, the voltage V 2 across the insulation resistance measuring resistor R S is measured using the voltage measuring means V, The current I flowing through the printed wiring board P is calculated from the relationship The insulation resistance R of the printed wiring board P is calculated from the relationship.
絶縁抵抗測定用抵抗器RSの抵抗値rSは十分大きいの
で、絶縁抵抗測定用抵抗器RSの両端に発生する電圧V2も
十分大きくなり電圧V2を精度よく策定することができ、
したがって、プリント配線板Ｐを流れる電流Ｉを精度よ
く測定することができ、その結果、プリント配線板Ｐの
絶縁抵抗Ｒを精度よく、しかも、短時間に、測定するこ
とができる。Since the resistance value r S of the insulation resistance measuring resistor R S is sufficiently large, it is possible to voltage V 2 generated at both ends of the insulation resistance measuring resistor R S is also to develop good enough increases and the voltage V 2 accuracy,
Therefore, the current I flowing through the printed wiring board P can be measured accurately, and as a result, the insulation resistance R of the printed wiring board P can be measured accurately and in a short time.
以上説明せるとおり、本発明に係るプリント配線板の
試験装置（布線試験機）においては、低抵抗の高速充電
用抵抗器を介してプリント配線板を短時間に充電し、そ
の後、高抵抗の絶縁抵抗測定用抵抗器に切り替えて、プ
リント配線板の絶縁抵抗を測定することゝされているた
め、250Vの印加電圧をもって100MΩ程度の高絶縁抵抗を
測定する場合にも、短時間に、しかも、精度よく絶縁抵
抗を測定することができる。As described above, in the printed wiring board test apparatus (wiring tester) according to the present invention, the printed wiring board is charged in a short time through the low-resistance high-speed charging resistor, and then the high resistance Since it is known that the insulation resistance of the printed wiring board is measured by switching to the insulation resistance measuring resistor, even when measuring a high insulation resistance of about 100 MΩ with an applied voltage of 250 V, in a short time, Insulation resistance can be measured accurately.
第１図は、本発明の一実施例に係るプリント配線板の試
験装置の回路図である。 第２図は、従来技術に係るプリント配線板の試験装置
（布線試験機）の回路図である。 第３図は、従来技術に係るプリント配線板の試験装置
（布線試験機）を使用して絶縁抵抗を測定する時に、プ
リント配線板試験用端子T1とT2との間に発生する電圧の
時間経過を示す曲線である。 第４図は、本発明の一実施例に係るプリント配線板の試
験装置（布線試験機）を使用して絶縁抵抗を測定する時
に、プリント配線板試験用端子T1とT2との間に発生する
電圧の時間経過を示す曲線である。 Ｅ……電圧印加手段、 Ｓ……回路切り替え手段、 RC……高速充電用抵抗器（抵抗値rC）、 RS……絶縁抵抗測定用抵抗器（抵抗値rS）、 Ｖ……電圧測定手段、 VD……印加電圧検出手段、 Ｐ……プリント配線板、 V1……印加電圧、 V2……絶縁抵抗測定用抵抗器RSに発生する電圧、 Ｉ……プリント配線板に流れる電流、 T1……プリント配線板試験用端子、 T2……プリント配線板試験用端子。FIG. 1 is a circuit diagram of a printed wiring board testing apparatus according to an embodiment of the present invention. FIG. 2 is a circuit diagram of a conventional printed wiring board testing apparatus (wiring tester). FIG. 3 shows the voltage generated between the printed wiring board test terminals T 1 and T 2 when measuring the insulation resistance using the conventional printed wiring board tester (wiring tester). 3 is a curve showing the passage of time. FIG. 4 shows the relationship between the printed wiring board test terminals T 1 and T 2 when the insulation resistance is measured using the printed wiring board testing apparatus (wiring tester) according to one embodiment of the present invention. 3 is a curve showing the time course of the voltage generated at E ...... voltage applying means, S ...... circuit switching means, R C ...... fast charging resistor (resistance value r C), R S ...... insulation resistance measuring resistor (resistance value r S), V ...... voltage measuring means, VD ...... applied voltage detecting means, P ...... printed wiring board, V 1 ...... the applied voltage, V 2 ...... insulation resistance measuring resistor voltage generated in the R S, the I ...... printed circuit board Current flowing, T 1 …… Terminal for printed wiring board test, T 2 …… Terminal for printed wiring board test.
Claims (1)
回路を並列に二分する回路切り替え手段（Ｓ）と、 該回路切り替え手段（Ｓ）の一方の出力端子に接続さ
れ、小さな抵抗値を有する高速充電用抵抗器（Rc）と、 前記回路切り替え手段（Ｓ）の他方の出力端子に接続さ
れ、大きな抵抗値を有する、絶縁抵抗測定用抵抗器（R
s）と、 該絶縁抵抗測定用抵抗器（Rs）と前記高速充電用抵抗器
（Rc）との並列回路に接続され、プリント配線板（Ｐ）
の一方の端子に接続される、プリント配線板試験用端子
（T1）と、 前記電圧印加手段（Ｅ）の他方の端子に接続される端子
に接続され、プリント配線板（Ｐ）の他方の端子に接続
される、プリント配線板試験用端子（T2）と、 前記試験用端子（T1）と試験用端子（T2）との間に発生
する電圧の時間に対する変化率が所定の値になったこと
を検出し、前記回路切り替え手段（Ｓ）の前記高速充電
用抵抗器（Rc）側から前記絶縁抵抗測定用抵抗器（Rs）
側に切り替える切り替え信号を送出する印加電圧検出手
段（VD）と、 前記絶縁抵抗測定用抵抗器（Rs）に発生する電圧を測定
して、前記プリント配線板（Ｐ）の絶縁抵抗を算出する
絶縁抵抗算出手段（Ｖ）と を具備してなることを特徴とするプリント配線板の試験
装置。1. A voltage applying means (E), which is connected in series to one terminal of the voltage applying means (E),
A circuit switching means (S) for dividing the circuit in parallel, a fast charging resistor (Rc) having a small resistance value, which is connected to one output terminal of the circuit switching means (S), and the circuit switching means (S). S) is connected to the other output terminal and has a large resistance value.
s) and a parallel circuit of the insulation resistance measuring resistor (Rs) and the high-speed charging resistor (Rc), and a printed wiring board (P).
The printed wiring board test terminal (T 1 ) connected to one terminal of the printed wiring board and the other terminal of the printed wiring board (P) connected to the other terminal of the voltage applying means (E). The printed wiring board test terminal (T 2 ) connected to the terminal and the rate of change with time of the voltage generated between the test terminal (T 1 ) and the test terminal (T 2 ) have a predetermined value. Is detected, and the insulation resistance measuring resistor (Rs) is connected from the high-speed charging resistor (Rc) side of the circuit switching means (S).
Insulation for calculating the insulation resistance of the printed wiring board (P) by measuring the voltage generated in the applied voltage detection means (VD) for transmitting a switching signal for switching to the side and the insulation resistance measuring resistor (Rs). A test device for a printed wiring board, comprising: a resistance calculating means (V).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62328384A JPH0827307B2 (en) | 1987-12-26 | 1987-12-26 | Printed wiring board test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62328384A JPH0827307B2 (en) | 1987-12-26 | 1987-12-26 | Printed wiring board test equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01170860A JPH01170860A (en) | 1989-07-05 |
| JPH0827307B2 true JPH0827307B2 (en) | 1996-03-21 |
Family
ID=18209645
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62328384A Expired - Fee Related JPH0827307B2 (en) | 1987-12-26 | 1987-12-26 | Printed wiring board test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0827307B2 (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010066050A (en) * | 2008-09-09 | 2010-03-25 | Hioki Ee Corp | Apparatus and method for insulation test |
| JP5819602B2 (en) * | 2010-11-29 | 2015-11-24 | Ｊｘ日鉱日石エネルギー株式会社 | Ground fault detection device, ground fault detection method, solar power generation system, and ground fault detection program |
| JP6221281B2 (en) | 2013-03-19 | 2017-11-01 | 日本電産リード株式会社 | Insulation inspection method and insulation inspection apparatus |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61100664A (en) * | 1984-10-23 | 1986-05-19 | Nec Corp | Insulation resistance tester for automatically changing over instantaneous charge measuring mode |
-
1987
- 1987-12-26 JP JP62328384A patent/JPH0827307B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01170860A (en) | 1989-07-05 |
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| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |