JPH0818271A - Electronic device and noise suppressing method - Google Patents
Electronic device and noise suppressing methodInfo
- Publication number
- JPH0818271A JPH0818271A JP14496594A JP14496594A JPH0818271A JP H0818271 A JPH0818271 A JP H0818271A JP 14496594 A JP14496594 A JP 14496594A JP 14496594 A JP14496594 A JP 14496594A JP H0818271 A JPH0818271 A JP H0818271A
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- lsi
- soft magnetic
- electronic device
- board
- electromagnetic wave
- Prior art date
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- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
- Soft Magnetic Materials (AREA)
- Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、電子装置およびそのノ
イズ抑制方法に関し、特に配線基板上に半導体素子等の
誘導性ノイズを放射する能動素子が実装された電子装置
およびその電子装置において、不要電磁波の干渉によっ
て生じる電磁波障害を抑制する方法に関するものであ
る。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electronic device and a noise suppressing method therefor, and in particular, it is unnecessary in an electronic device in which an active element for radiating inductive noise such as a semiconductor element is mounted on a wiring board and the electronic device. The present invention relates to a method for suppressing electromagnetic interference caused by electromagnetic interference.
【0002】[0002]
【従来の技術】近年、デジタル電子機器をはじめ高周波
を利用する電子機器類の小型化が著しい。特に配線基板
への部品実装密度が高いデジタル電子機器においては、
中央演算処理装置(CPU)や画像プロセッサ算術論理
演算装置(IPALU)等のLSI、ICが配線基板上
に実装されている。周知のように、LSIやICは多数
の半導体素子で構成されている。半導体素子は、外部よ
りエネルギの供給を得て、増幅や発振などの作用を行う
ので、能動素子と呼ばれる。これら半導体素子等の能動
素子は一般に誘導性ノイズを放射する。この誘導性ノイ
ズにより、配線基板の素子実装面と同一面および反対面
には、高周波磁界が誘導される。この誘導高周波磁界に
よって、電磁結合による線間結合が増大したり、放射ノ
イズが発生する。発生した放射ノイズは、装置内部での
誤動作を招くだけでなく、外部接続端子を経て外部へ放
射し、伝導して他の機器に悪影響を及ぼす。このような
誤動作や他の機器への悪影響は、いわゆる電磁波障害と
呼ばれる。2. Description of the Related Art In recent years, electronic devices such as digital electronic devices that utilize high frequencies have been remarkably miniaturized. Especially in digital electronic devices with a high density of parts mounted on wiring boards,
LSIs and ICs such as a central processing unit (CPU) and an image processor arithmetic logic unit (IPALU) are mounted on a wiring board. As is well known, LSIs and ICs are composed of many semiconductor elements. A semiconductor element is called an active element because it receives an energy supply from the outside and acts such as amplification and oscillation. Active devices such as these semiconductor devices generally radiate inductive noise. Due to this inductive noise, a high frequency magnetic field is induced on the same surface as the element mounting surface of the wiring board and the opposite surface. This induced high frequency magnetic field increases line coupling due to electromagnetic coupling and causes radiation noise. The generated radiation noise not only causes a malfunction inside the device, but also radiates to the outside through the external connection terminal and is conducted and adversely affects other devices. Such malfunctions and adverse effects on other devices are called electromagnetic interference.
【0003】従来、このような電磁波障害に対しては、
次のような対策を施していた。即ち、回路にローパス
フィルタを接続する。問題となる回路を影響を及ぼす
回路から遠ざける。シールディングを行う。グラウ
ンディングを行う。このような手段を講じることによっ
て、従来は電磁波障害の原因となる電磁結合、不要輻射
や伝導ノイズを抑制していた。Conventionally, with respect to such electromagnetic interference,
The following measures were taken. That is, a low pass filter is connected to the circuit. Move the circuit in question away from the circuit that affects it. Shield. Perform grounding. By taking such measures, conventionally, electromagnetic coupling, unnecessary radiation, and conduction noise that cause electromagnetic interference have been suppressed.
【0004】[0004]
【発明が解決しようとする課題】しかしながら、能動素
子が高密度実装された配線基板において上述した問題を
効率的に処置する場合、従来のノイズ抑制方法では、次
に述べるような欠点がある。即ち、ノイズ対策の専門
的知識と経験を必要とする。ノイズ対策に要する時間
がかかる。使用するフィルタが高価である。フィル
タを実装するスペースに制約がある場合が多い。フィ
ルタの実装作業が容易でない。電子装置を組み立てる
ために所要工数が多くなり所要費用が多額である。However, in order to efficiently deal with the above-mentioned problems in a wiring board in which active elements are mounted at a high density, the conventional noise suppression method has the following drawbacks. That is, it requires specialized knowledge and experience in noise countermeasures. It takes time to take measures against noise. The filters used are expensive. There are often restrictions on the space for implementing filters. Filter mounting is not easy. The number of man-hours required for assembling the electronic device is large and the cost is large.
【0005】特に、同一回路内の部品間で発生する信号
線間の電磁誘導や不要電磁波による相互干渉を抑制する
場合には、特に充分な対策が必要である。更に、電子装
置の小型化、軽量化を図るには、フィルタおよびその実
装スペースを排除することが必須である。Particularly, in the case of suppressing electromagnetic induction between signal lines generated between components in the same circuit and mutual interference due to unnecessary electromagnetic waves, particularly sufficient measures are required. Furthermore, in order to reduce the size and weight of the electronic device, it is essential to eliminate the filter and its mounting space.
【0006】したがって、本発明の課題は、フィルタ等
を用いる代わりに、電子装置そのものを改良して、容易
に配線基板から外部へ放射するノイズや配線基板内部で
の部品間の相互干渉や信号線間の電磁誘導による誤動作
を抑制することにある。Therefore, an object of the present invention is to improve the electronic device itself instead of using a filter or the like to easily radiate noise from the wiring board to the outside, mutual interference between components inside the wiring board, and signal lines. It is to suppress malfunction due to electromagnetic induction between.
【0007】[0007]
【課題を解決するための手段】上記課題を解決するため
に、本発明の第1の態様によれば、誘導性ノイズを放射
する能動素子が実装された配線基板を含む電子装置にお
いて、配線基板と能動素子との間に挟み込んで設けられ
る電磁波干渉抑制体を有し、この電磁波干渉抑制体は導
電性支持体とこの導電性支持体の少なくとも一方面に設
けられた絶縁性軟磁性体層とを有することを特徴とする
電子装置が得られる。In order to solve the above problems, according to a first aspect of the present invention, in an electronic device including a wiring board on which an active element that radiates inductive noise is mounted, a wiring board is provided. And an active element, the electromagnetic wave interference suppressor being sandwiched between the electromagnetic wave interference suppressor and the active element. The electromagnetic wave interference suppressor includes a conductive support and an insulating soft magnetic material layer provided on at least one surface of the conductive support. An electronic device is obtained which has:
【0008】上記第1の態様による電子装置において、
絶縁性軟磁性体層が、有機結合剤とこの有機結合剤中に
分散される偏平状及び/または針状の軟磁性体粉末とか
ら成ることが好ましい。In the electronic device according to the first aspect,
It is preferable that the insulating soft magnetic material layer comprises an organic binder and flat and / or acicular soft magnetic powder dispersed in the organic binder.
【0009】本発明の第2の態様によれば、誘導性ノイ
ズを放射する能動素子が実装された配線基板を含む電子
装置における誘導性ノイズを抑制する方法であって、配
線基板と能動素子との間に、導電性支持体と絶縁性軟磁
性体層とを有する電磁波干渉抑制体を挟み込むことを特
徴とする電子装置のノイズ抑制方法が得られる。According to a second aspect of the present invention, there is provided a method for suppressing inductive noise in an electronic device including a wiring board on which an active element for radiating inductive noise is mounted, the method comprising: A method for suppressing noise in an electronic device is obtained, in which an electromagnetic wave interference suppressor having a conductive support and an insulating soft magnetic material layer is sandwiched between them.
【0010】[0010]
【作用】電磁波干渉抑制体は、導電性支持体の片面もし
くは両面に絶縁性の軟磁性体層が設けられたものを基本
構成としている。即ち、導電性支持体は、ノイズ源とな
る一方の配線導体及び電子回路に対向する他方の配線導
体及び電子回路に対してシールド効果を呈し、電磁波干
渉を抑制する。一方、不要輻射の反射による電磁結合の
増大化は、絶縁性軟磁性体層により抑制される。絶縁性
軟磁性体層は、例えば、軟磁性粉末と有機結合剤からな
る。この絶縁性軟磁性体層は、本来、伝導性物質である
軟磁性金属を微細粉末化し、絶縁性の有機結合剤と混練
・分散することにより絶縁層となっている。また、軟磁
性体粉末の形状を偏平状もしくは針状とすると、形状磁
気異方向性が出現し、高周波領域にて磁気共鳴に基づく
複素透磁率の増大化が生じ、不要輻射成分を効率的に吸
収、抑制できる。尚、電磁波干渉抑制体は、本出願人が
平成6年1月20日に出願した、特願平6−4864号
に記載されている。The electromagnetic interference suppressor basically has a conductive support having an insulating soft magnetic layer provided on one or both sides thereof. That is, the conductive support exhibits a shielding effect with respect to the other wiring conductor and the electronic circuit facing the one wiring conductor and the electronic circuit which are noise sources, and suppresses electromagnetic wave interference. On the other hand, increase in electromagnetic coupling due to reflection of unnecessary radiation is suppressed by the insulating soft magnetic material layer. The insulating soft magnetic layer is made of, for example, soft magnetic powder and an organic binder. This insulating soft magnetic material layer is essentially an insulating layer formed by finely powdering a soft magnetic metal that is a conductive material and kneading and dispersing it with an insulating organic binder. When the soft magnetic powder is flat or needle-shaped, magnetic anisotropy of shape appears and complex permeability increases due to magnetic resonance in a high frequency region, which effectively eliminates unnecessary radiation components. Can be absorbed and suppressed. The electromagnetic wave interference suppressor is described in Japanese Patent Application No. 6-4864 filed by the present applicant on January 20, 1994.
【0011】[0011]
【実施例】次に、本発明について図面を参照して詳細に
説明する。The present invention will be described in detail with reference to the drawings.
【0012】図1に本発明の一実施例による電子装置の
断面を示す。配線基板1上にLSI2が実装され、この
LSI2の下の配線基板1の裏面に配線導体3が配線さ
れている。さらにLSI2と配線基板1との間に、LS
I2と同じ大きさの約半分の電磁波干渉抑制体Aを実装
している。FIG. 1 shows a cross section of an electronic device according to an embodiment of the present invention. The LSI 2 is mounted on the wiring board 1, and the wiring conductor 3 is wired on the back surface of the wiring board 1 below the LSI 2. Further, between the LSI 2 and the wiring board 1, the LS
About half the electromagnetic wave interference suppressor A having the same size as I2 is mounted.
【0013】電磁波干渉抑制体Aは、LSI2を実装す
る前に、LSI2もしくは配線基板1のどちらか一方に
固着している。電磁波干渉抑制体Aは、LSI2が発生
する高周波電磁界の磁束を集束するので、LSI2と配
線導体1との誘導結合を微弱にして、配線導体3に生ず
るノイズを効率的に抑制する。The electromagnetic wave interference suppressor A is fixed to either the LSI 2 or the wiring board 1 before mounting the LSI 2. Since the electromagnetic wave interference suppressor A focuses the magnetic flux of the high-frequency electromagnetic field generated by the LSI 2, it weakens the inductive coupling between the LSI 2 and the wiring conductor 1 and efficiently suppresses the noise generated in the wiring conductor 3.
【0014】図2に図1に示した電磁波干渉抑制体Aの
断面を示す。電磁波干渉抑制体Aは、導電性支持体4
と、この導電性支持体4の少なくとも一方の面(図2で
は両面)に設けられた絶縁性軟磁性体層5とを有してい
る。導電性支持体4の代わりに軟磁性を呈する導電性軟
磁性支持体を使用しても良い。絶縁性軟磁性体層5は軟
磁性体粉末6と有機結合剤7とを含む。すなわち、有機
結合剤7中に軟磁性粉末6が均一に分散されている。軟
磁性体粉末6の形状は偏平状または/及び針状である。FIG. 2 shows a cross section of the electromagnetic wave interference suppressor A shown in FIG. The electromagnetic wave interference suppressor A is a conductive support 4
And an insulating soft magnetic material layer 5 provided on at least one surface (both surfaces in FIG. 2) of the conductive support 4. Instead of the conductive support 4, a conductive soft magnetic support exhibiting soft magnetism may be used. The insulating soft magnetic material layer 5 contains the soft magnetic material powder 6 and the organic binder 7. That is, the soft magnetic powder 6 is uniformly dispersed in the organic binder 7. The soft magnetic powder 6 has a flat shape and / or a needle shape.
【0015】導電性支持体4としては、導電体板、網目
状導電体板、もしくは導電性繊維の織物のうちの一つを
選択できる。また、導電性軟磁性支持体としては、軟磁
性金属板、網目状軟磁性金属板、もしくは軟磁性金属繊
維の織物のうちの一つを選択できる。As the conductive support 4, one of a conductive plate, a mesh-shaped conductive plate, and a woven fabric of conductive fibers can be selected. Further, as the conductive soft magnetic support, one of a soft magnetic metal plate, a mesh soft magnetic metal plate, or a soft magnetic metal fiber woven fabric can be selected.
【0016】導電性支持体4の具体的な例としては、銅
薄板、ステンレス薄板、アルミニウム薄板等の金属板、
およびそれらに微細な穴開け加工を施した、いわゆる、
パンチングメタル、或いは薄板に微細な切れ目を施した
後に、延伸加工を施した、いわゆる、エキスパンドメタ
ル、或いは細線状の導線を網目状に加工した金網などで
ある。また、導電性軟磁性支持体の具体的な例として
は、同様の形態にて、材質のみが軟磁性を呈するパーマ
ロイ或いは鉄−珪素鋼等に代えれば良い。この場合、比
較的低い周波数での高い電磁波干渉抑制効果を期待でき
る。いずれにしても、用途に応じて選択するのが望まし
い。Specific examples of the conductive support 4 include a metal plate such as a copper thin plate, a stainless thin plate and an aluminum thin plate,
And so-called,
A punching metal, or a so-called expanded metal in which a thin plate is finely cut and then stretched, or a wire mesh in which a thin wire is processed into a mesh shape is used. As a specific example of the conductive soft magnetic support, in the same form, only the material may be replaced with permalloy or iron-silicon steel exhibiting soft magnetism. In this case, a high electromagnetic wave interference suppressing effect at a relatively low frequency can be expected. In any case, it is desirable to select it according to the application.
【0017】偏平状(もしくは針状)の軟磁性体粉末6
としては、高周波透磁率の大きな鉄アルミ珪素合金(セ
ンダスト)、鉄ニッケル合金(パーマロイ)をその代表
的素材として挙げることができる。尚、軟磁性体粉末6
のアスペクト比は十分に大きい(おおよそ5:1以上)
ことが望ましい。Flat (or acicular) soft magnetic powder 6
As typical examples of such materials, iron-aluminum-silicon alloy (Sendust) and iron-nickel alloy (Permalloy) having high high-frequency permeability can be cited. Soft magnetic powder 6
Aspect ratio is large enough (approximately 5: 1 or more)
Is desirable.
【0018】有機結合剤7としては、ポリエステル系樹
脂、ポリ塩化ビニル系樹脂、ポリビニルブチラール樹
脂、ポリウレタン樹脂、セルロース系樹脂、ニトリル−
ブタジエン系ゴム、スチレン−ブタジエン系ゴム等の熱
可塑性樹脂あるいはそれらの共重合体、エポキシ樹脂、
フェノール樹脂、アミド系樹脂、イミド系樹脂等の熱硬
化性樹脂等を挙げることができる。Examples of the organic binder 7 include polyester resin, polyvinyl chloride resin, polyvinyl butyral resin, polyurethane resin, cellulose resin, nitrile-based resin.
Thermoplastic resins such as butadiene rubber and styrene-butadiene rubber or their copolymers, epoxy resins,
Examples thereof include thermosetting resins such as phenol resins, amide resins, and imide resins.
【0019】図3(a)及び図3(b)は、本発明の効
果を検証するにあたって図1に示した電磁環境を想定し
た電磁波干渉抑制体Aの特性評価系を示す。図3(a)
は、透過レベル[dB]を測定するための評価系であ
り、図3(b)は、結合レベル[dB]を測定するため
の評価系である。各々の場合とも、電磁界波源用発振器
8及び電磁界強度測定器(受信用素子)9には、ループ
系2mm以下の電磁界送信用微小ループアンテナ10、
電磁界受信用微小ループアンテナ11を用いている。透
過レベルもしくは結合レベルの測定には測定器としてス
ペクトラムアナライザ(図示せず)を使用した。尚、前
述した先願(特願平6−4864号)に係る発明では測
定器としてネットワークアナライザを使用している。し
たがって、本発明と先願に係る発明とは測定結果が相違
していることに注意されたい。3 (a) and 3 (b) show a characteristic evaluation system of the electromagnetic wave interference suppressor A assuming the electromagnetic environment shown in FIG. 1 for verifying the effect of the present invention. FIG. 3 (a)
Is an evaluation system for measuring the transmission level [dB], and FIG. 3B is an evaluation system for measuring the binding level [dB]. In each case, the electromagnetic field wave source oscillator 8 and the electromagnetic field intensity measuring device (reception element) 9 include an electromagnetic field transmitting minute loop antenna 10 having a loop system of 2 mm or less,
A small loop antenna 11 for electromagnetic field reception is used. A spectrum analyzer (not shown) was used as a measuring instrument for measuring the transmission level or the coupling level. In the invention according to the above-mentioned prior application (Japanese Patent Application No. 6-4864), a network analyzer is used as a measuring instrument. Therefore, it should be noted that the measurement results of the present invention and the invention of the prior application are different.
【0020】[検証例1]導電性支持体4として120
メッシュのステンレス網を用い、この導電性支持体4の
両面に乾燥、硬化後の全厚寸法が0.5mmとなるよう
に、下記の〈組成1〉の配合からなる軟磁性体ペースト 〈組成1〉 偏平状軟磁性体微粉末 …… 90重量部 組 成:Fe−Al−Si合金 平均 粒径 :10μm アスペクト比:>5 有機結合剤 ポリウレタン樹脂 …… 8重量部 硬化剤(イソシアネート化合物) …… 2重量部 溶 剤(シクロヘキサノンとトルエンとの化合物) …… 40重量部 をドクターブレード法により塗工し、85℃にて24時
間キュアリングを行い、評価用試料を得た。尚、得ら
れた評価用試料を振動型磁力計並びに走査型電子顕微
鏡を用いて解析したところ、磁化容易軸及び磁性粒子配
向方向は試料面内方向であった。[Verification Example 1] 120 as the conductive support 4
Using a stainless steel mesh, a soft magnetic paste comprising the following composition <composition 1> such that the total thickness after drying and curing of the conductive support 4 is 0.5 mm. > Flat soft magnetic fine powder ...... 90 parts by weight Composition: Fe-Al-Si alloy Average particle size: 10 μm Aspect ratio:> 5 Organic binder Polyurethane resin ...... 8 parts by weight Curing agent (isocyanate compound) ...... 2 parts by weight Solvent (compound of cyclohexanone and toluene) ... 40 parts by weight was applied by the doctor blade method and cured at 85 ° C. for 24 hours to obtain a sample for evaluation. When the obtained evaluation sample was analyzed using a vibration magnetometer and a scanning electron microscope, the easy axis of magnetization and the orientation direction of the magnetic particles were in the in-plane direction of the sample.
【0021】[検証例2]導電性支持体4として75μ
mのポリイミドフィルムの両面に厚さが3μmのアルミ
ニウムをスパッタ成膜したものを用いた以外は、[検証
例1]と同様にして評価用試料を得た。[Verification Example 2] 75 μ as the conductive support 4
A sample for evaluation was obtained in the same manner as in [Verification example 1] except that an aluminum film having a thickness of 3 μm was sputter-deposited on both sides of a polyimide film of m.
【0022】[検証例3]導電性支持体4として75μ
mのポリイミドフィルムの両面に下記の〈組成2〉の銀
ペースト 〈組成2〉 銀微粉末 …… 95重量部 平均 粒径 : 3μm 有機結合剤 ポリビニルブチラール樹脂 …… 4重量部 硬化剤(イソシアネート化合物) …… 1重量部 溶 剤(エチルセルソルブ) …… 35重量部 を乾燥、硬化後の厚さが6μmとなるようにドクターブ
レード法にて成膜したものを用いた以外は、[検証例
1]と同様にして評価用試料を得た。[Verification Example 3] 75 μ as the conductive support 4
Silver paste of <composition 2> below on both sides of the polyimide film of m <composition 2> Fine silver powder: 95 parts by weight Average particle size: 3 μm Organic binder polyvinyl butyral resin: 4 parts by weight Curing agent (isocyanate compound) …… 1 part by weight Solvent (ethyl cellosolve) …… 35 parts by weight, except that a film was formed by the doctor blade method so that the thickness after drying and curing would be 6 μm [Verification Example 1 ] The sample for evaluation was obtained like the above.
【0023】[比較例1]厚さが100μmの銅板を比
較用試料とした。Comparative Example 1 A copper plate having a thickness of 100 μm was used as a comparative sample.
【0024】[比較例2]略球状の形状を有し、平均粒
径が30μmの鉄粉80重量部をニトリルゴム20重量
部に練り込み、厚さ0.5mmのシート状を形成し、こ
れを比較用試料とした。Comparative Example 2 80 parts by weight of iron powder having a substantially spherical shape and an average particle size of 30 μm was kneaded into 20 parts by weight of nitrile rubber to form a sheet having a thickness of 0.5 mm. Was used as a comparative sample.
【0025】評価用試料〜及び比較用試料および
の透過レベル及び結合レベルを図3(a)及び図3
(b)に示す評価系にて測定した結果を図4(a)及び
図4(b)、図5(a)及び図5(b)に示す。The transmission level and the binding level of the evaluation sample and the comparative sample are shown in FIGS.
The results measured by the evaluation system shown in (b) are shown in FIGS. 4 (a) and 4 (b), 5 (a) and 5 (b).
【0026】図4(a)及び図4(b)は、比較用試料
及びの電磁波干渉抑制効果の周波数特性を示す。図
4(a)は透過レベル[dB]の周波数f[GHz]特
性である。ここで、透過レベルの基準は電磁波干渉抑制
体がない状態の電磁界強度とした。図4(b)は結合レ
ベル[dB]の周波数f[GHz]特性である。ここ
で、結合レベルの基準は電磁波干渉抑制体がない状態の
電磁界強度とした。4 (a) and 4 (b) show the frequency characteristics of the electromagnetic interference suppression effect of the comparative sample. FIG. 4A shows the frequency f [GHz] characteristic of the transmission level [dB]. Here, the reference of the transmission level is the electromagnetic field strength in the state where there is no electromagnetic wave interference suppressor. FIG. 4B shows the frequency f [GHz] characteristic of the coupling level [dB]. Here, the standard of the coupling level was the electromagnetic field strength without the electromagnetic wave interference suppressor.
【0027】図5(a)及び図5(b)は、評価用試料
〜の電磁波干渉抑制効果の周波数特性を示す。図5
(a)は透過レベル[dB]の周波数f[GHz]特性
である。ここで、透過レベルの基準は電磁波干渉抑制体
がない状態の電磁界強度とした。図5(b)は結合レベ
ル[dB]の周波数f[GHz]特性である。ここで、
結合レベルの基準は電磁波干渉抑制体がない状態の電磁
界強度とした。5 (a) and 5 (b) show the frequency characteristics of the electromagnetic wave interference suppressing effect of the evaluation samples to. Figure 5
(A) is the frequency f [GHz] characteristic of the transmission level [dB]. Here, the reference of the transmission level is the electromagnetic field strength in the state where there is no electromagnetic wave interference suppressor. FIG. 5B shows the frequency f [GHz] characteristic of the coupling level [dB]. here,
The standard of the coupling level was the electromagnetic field strength without the electromagnetic wave interference suppressor.
【0028】図4(a)及び図4(b)からも判るよう
に、導体(銅箔)のみ[比較例1]の場合では、透過レ
ベルは大幅に低下(−50dB以下)するものの、結合
レベルが増大(約+7db)してしまい問題である。一
方、軟磁性で形状異方性のほとんどない球状鉄粉をゴム
に分散させたもの[比較例2]では、結合レベルが低下
(約−0dB)する傾向を示しているものの、透過減衰
がほとんどなく(透過レベルが約−1dB)、干渉抑制
の効果がほとんどない。As can be seen from FIGS. 4 (a) and 4 (b), when the conductor (copper foil) only [Comparative Example 1] was used, although the transmission level was significantly lowered (-50 dB or less), This is a problem because the level increases (about + 7db). On the other hand, in the case of the comparative example 2 in which spherical iron powder having soft magnetism and almost no shape anisotropy is dispersed in rubber, the binding level tends to decrease (about −0 dB), but the transmission attenuation is almost zero. None (transmission level is about -1 dB), there is almost no effect of suppressing interference.
【0029】これら従来の電磁波干渉抑制体の効果に対
して、本発明に係る電磁波干渉抑制体([検証例3]〜
[検証例3])においては、図5(a)及び図5(b)
からも明らかなように、透過レベルが十分低く(−39
dB以下)なっているとともに、結合レベルも増大する
ことがない(+1dB以下)。したがって、図1に示し
たような電子機器において、不要輻射による反射の影響
を受けることなく、電磁波干渉を効果的に抑制すること
が可能となる。With respect to the effects of these conventional electromagnetic wave interference suppressors, the electromagnetic wave interference suppressor according to the present invention ([verification example 3] to
[Verification Example 3]), FIG. 5 (a) and FIG. 5 (b)
As is clear from the above, the transmission level is sufficiently low (-39
(less than dB), the coupling level does not increase (less than +1 dB). Therefore, in the electronic device as shown in FIG. 1, it is possible to effectively suppress electromagnetic wave interference without being affected by reflection due to unnecessary radiation.
【0030】以上、本発明についていくつかの実施例を
挙げて説明したが、本発明は上述した実施例に限定せ
ず、本発明の要旨を逸脱しない範囲内で種々の変更が可
能なのはいうまでもない。Although the present invention has been described with reference to some embodiments, it is needless to say that the present invention is not limited to the above embodiments and various modifications can be made without departing from the gist of the present invention. Nor.
【0031】[0031]
【発明の効果】以上説明したように本発明は、ノイズ源
になる半導体素子などのような能動素子とそれに近接す
る配線導体との間に、導電性支持体と絶縁性軟磁性体層
とを有する電磁波干渉抑制体を実装することで、不要電
磁波の反射を増大させることなく、相互干渉の抑制が可
能となる。また、電磁波干渉抑制体は薄板のため、ノイ
ズを抑制するための部品を含めた装置全体として考える
と、従来より小型かつ軽量で、安価な電子装置が得られ
る。なお、本発明に係る電磁波干渉抑制体は、その構成
要素からわかるように、容易に可撓性をもたせることが
可能であり、複雑な形状への対応や厳しい耐振動や衝撃
要求への対応が可能である。As described above, according to the present invention, a conductive support and an insulating soft magnetic material layer are provided between an active element such as a semiconductor element which becomes a noise source and a wiring conductor adjacent to the active element. By mounting the electromagnetic wave interference suppressor, it is possible to suppress mutual interference without increasing reflection of unnecessary electromagnetic waves. Further, since the electromagnetic wave interference suppressor is a thin plate, when considering the entire device including parts for suppressing noise, an electronic device that is smaller and lighter in weight and cheaper than conventional ones can be obtained. The electromagnetic wave interference suppressor according to the present invention can easily have flexibility, as can be seen from its constituent elements, and can respond to complicated shapes and to meet severe vibration resistance and shock requirements. It is possible.
【図1】本発明の一実施例による電子機器を示す概略断
面図である。FIG. 1 is a schematic cross-sectional view showing an electronic device according to an embodiment of the present invention.
【図2】図1に示す電子機器に使用される電磁波干渉抑
制体を示す一部断面図である。FIG. 2 is a partial cross-sectional view showing an electromagnetic wave interference suppressor used in the electronic device shown in FIG.
【図3】電磁波干渉抑制体の特性評価に用いた評価系を
示し、(a)は透過レベルを測定するための評価系概略
図、(b)は結合レベルを測定するための評価系概略図
である。FIG. 3 shows an evaluation system used for evaluating the characteristics of an electromagnetic wave interference suppressor, (a) is a schematic view of an evaluation system for measuring a transmission level, and (b) is a schematic view of an evaluation system for measuring a binding level. Is.
【図4】比較用試料及びを図3(a)及び図3
(b)の評価系にて測定した電磁波干渉抑制効果の周波
数依存性を示し、(a)は透過レベルの周波数特性グラ
フ、(b)は結合レベルの周波数特性グラフである。FIG. 4 shows a comparative sample and FIGS.
The frequency dependence of the electromagnetic wave interference suppression effect measured by the evaluation system of (b) is shown, (a) is a frequency characteristic graph of a transmission level, (b) is a frequency characteristic graph of a coupling level.
【図5】評価用試料〜を図3(a)及び図3(b)
の評価系にて測定した電磁波干渉抑制効果の周波数依存
性を示し、(a)は透過レベルの周波数特性グラフ、
(b)は結合レベルの周波数特性グラフである。FIG. 5 shows evaluation samples 1 to 3 (a) and 3 (b).
Shows the frequency dependence of the electromagnetic interference suppression effect measured by the evaluation system of (a) is a frequency characteristic graph of the transmission level,
(B) is a frequency characteristic graph of the coupling level.
1 配線基板 2 LSI 3 配線導体 4 導電性支持体 5 絶縁性軟磁性体層 6 軟磁性体粉末 7 有機結合剤 8 電磁界波源用発振器 9 電磁界強度測定器 10 電磁界送信用微小ループアンテナ 11 電磁界受信用微小ループアンテナ A 電磁波干渉抑制体 1 Wiring Board 2 LSI 3 Wiring Conductor 4 Conductive Support 5 Insulating Soft Magnetic Layer 6 Soft Magnetic Powder 7 Organic Binder 8 Electromagnetic Field Wave Source Oscillator 9 Electromagnetic Field Strength Measuring Device 10 Electromagnetic Field Transmitting Micro Loop Antenna 11 Micro loop antenna for electromagnetic field reception A Electromagnetic wave interference suppressor
Claims (3)
された配線基板を含む電子装置において、前記配線基板
と前記能動素子との間に挟み込んで設けられる電磁波干
渉抑制体を有し、該電磁波干渉抑制体は導電性支持体と
該導電性支持体の少なくとも一方面に設けられた絶縁性
軟磁性体層とを有することを特徴とする電子装置。1. An electronic device including a wiring board on which an active element that radiates inductive noise is mounted, comprising an electromagnetic wave interference suppressor sandwiched between the wiring board and the active element. The electronic device, wherein the interference suppressor has a conductive support and an insulating soft magnetic material layer provided on at least one surface of the conductive support.
該有機結合剤中に分散される偏平状及び/または針状の
軟磁性体粉末とから成る、請求項1記載の電子装置。2. The electronic device according to claim 1, wherein the insulating soft magnetic material layer is composed of an organic binder and flat and / or acicular soft magnetic powder dispersed in the organic binder. .
された配線基板を含む電子装置における前記誘導性ノイ
ズを抑制する方法であって、前記配線基板と前記能動素
子との間に、導電性支持体と絶縁性軟磁性体層とを有す
る電磁波干渉抑制体を挟み込むことを特徴とする電子装
置のノイズ抑制方法。3. A method for suppressing the inductive noise in an electronic device including a wiring board on which an active element for radiating inductive noise is mounted, comprising: A method for suppressing noise in an electronic device, comprising sandwiching an electromagnetic wave interference suppressor having a support and an insulating soft magnetic material layer.
Priority Applications (10)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14496594A JPH0818271A (en) | 1994-06-27 | 1994-06-27 | Electronic device and noise suppressing method |
FI950182A FI117224B (en) | 1994-01-20 | 1995-01-16 | Electromagnetic interference suppression piece, applied by electronic device and hybrid integrated circuit element |
MYPI95000100A MY120407A (en) | 1994-01-20 | 1995-01-17 | Electromagnetic interference suppressing body having low electromagnetic transparency and reflection, and electronic device having the same. |
CN95100245A CN1075339C (en) | 1994-01-20 | 1995-01-18 | Electromagnetic interference supressing body having low electromagnetic transparency and reflection, and electronic device having the same |
US08/374,825 US5864088A (en) | 1994-01-20 | 1995-01-19 | Electronic device having the electromagnetic interference suppressing body |
DE69504377T DE69504377T2 (en) | 1994-01-20 | 1995-01-20 | Medium with low electromagnetic transparency and reflection for suppressing electromagnetic interference and electronic device provided therewith |
EP95100779A EP0667643B1 (en) | 1994-01-20 | 1995-01-20 | Electromagnetic interference suppressing body having low electromagnetic transparency and reflection, and electronic equipment having the same |
TW84101723A TW263650B (en) | 1994-06-27 | 1995-02-24 | An electronic apparatus and method suppressing its noise |
US09/159,965 US6448491B1 (en) | 1994-01-20 | 1998-09-24 | Electromagnetic interference suppressing body having low electromagnetic transparency and reflection, and electronic device having the same |
CNB011169109A CN1199545C (en) | 1994-01-20 | 2001-04-27 | Electromagnetic interference rejection body of low electromagnetic penetrability and reflectivity and its electronic device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14496594A JPH0818271A (en) | 1994-06-27 | 1994-06-27 | Electronic device and noise suppressing method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0818271A true JPH0818271A (en) | 1996-01-19 |
Family
ID=15374315
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14496594A Pending JPH0818271A (en) | 1994-01-20 | 1994-06-27 | Electronic device and noise suppressing method |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPH0818271A (en) |
TW (1) | TW263650B (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1997004469A1 (en) * | 1995-07-20 | 1997-02-06 | Tokin Corporation | Composite magnetic material and product for eliminating electromagnetic interference |
US6545212B1 (en) | 1998-10-27 | 2003-04-08 | Murata Manufacturing Co., Ltd. | Radiation noise suppressing component attachment structure |
JP2008047800A (en) * | 2006-08-21 | 2008-02-28 | Sharp Corp | Electromagnetic wave shielding sheet |
JP2008181938A (en) * | 2007-01-23 | 2008-08-07 | Fuji Electric Holdings Co Ltd | Conductive sheet and electronic apparatus using this conductive sheet |
JP2016219466A (en) * | 2015-05-14 | 2016-12-22 | トヨタ紡織株式会社 | Electromagnetic wave shield material |
JP2018085391A (en) * | 2016-11-21 | 2018-05-31 | 大同特殊鋼株式会社 | Electromagnetic field shielding sheet |
-
1994
- 1994-06-27 JP JP14496594A patent/JPH0818271A/en active Pending
-
1995
- 1995-02-24 TW TW84101723A patent/TW263650B/en not_active IP Right Cessation
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1997004469A1 (en) * | 1995-07-20 | 1997-02-06 | Tokin Corporation | Composite magnetic material and product for eliminating electromagnetic interference |
US6545212B1 (en) | 1998-10-27 | 2003-04-08 | Murata Manufacturing Co., Ltd. | Radiation noise suppressing component attachment structure |
JP2008047800A (en) * | 2006-08-21 | 2008-02-28 | Sharp Corp | Electromagnetic wave shielding sheet |
JP2008181938A (en) * | 2007-01-23 | 2008-08-07 | Fuji Electric Holdings Co Ltd | Conductive sheet and electronic apparatus using this conductive sheet |
JP2016219466A (en) * | 2015-05-14 | 2016-12-22 | トヨタ紡織株式会社 | Electromagnetic wave shield material |
JP2018085391A (en) * | 2016-11-21 | 2018-05-31 | 大同特殊鋼株式会社 | Electromagnetic field shielding sheet |
Also Published As
Publication number | Publication date |
---|---|
TW263650B (en) | 1995-11-21 |
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