JPH08147261A - Test mode executing device - Google Patents

Abstract

PURPOSE: To simplify the executing operation of a test mode by deciding order values stored in a non-volatile memory, updating these order values based on the executed result of test mode and successively executing the test mode. CONSTITUTION: Concerning a control program for executing the test mode of nine processes, for example, order values from '1' to '9' are set to test mode moving values and an order value '10' is initially set to an ordinary mode moving value in a non-volatile memory 2. When the power source of a product is turned on in a test process after the product is assembled, a microprocessor 1 decides the order values stored in the non-volatile memory 2, executes the test mode corresponding to the order value '1' and updates the order values in the non-volatile memory 2 when the tested result shows success. When the power source of this product in the successful test mode is turned on again, the test modes corresponding to the updated order values are successively executed and when the order value reaches '10', an ordinary mode is started. Therefore, no test mode is executed after the forwarding of product.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention is mounted on equipment equipped with a test mode control function by a microprocessor,
More particularly, it relates to a test mode execution device used in a test process of an assembly line, and more specifically, a non-volatile memory (EEP).
The present invention relates to a test mode execution device for automatically executing a test mode by a power-on operation by skillfully utilizing a ROM).

[0002]

2. Description of the Related Art In a device having a test mode control function by a microprocessor, for example, a microwave oven, a test mode is executed by operating a combination of a plurality of specific keys which are rarely used, The unknown user does not execute the test mode in normal operation.

[0003]

However, in the specific key combination method, if the operation for executing the test mode is simple (for example, pressing two keys at the same time), the test mode may be executed by a user's mistaken operation. There is.

On the other hand, in the microwave oven, since the number of keys is reduced and the number of keys existing on the operation panel is decreasing,
Despite the limited number of combination patterns,
The number of test modes is increasing.

For this reason, more complicated key combinations have to be set, and it is unavoidable to introduce an expensive robot that can cope with an increase in loss time due to a complicated key operation for entering the test mode and a complicated key operation. Has been done.

The present invention has been made in view of the above circumstances, and it is an object of the present invention to prevent the test mode from being executed after shipment and to simplify the test mode executing operation in the test process.

[0007]

According to a first aspect of the present invention, a non-volatile memory that stores a sequence value of a test mode and a sequence value stored in the non-volatile memory is a test mode transition value or a normal mode transition. A determination means for determining whether the value is a value and an order value updating means for updating the order value based on the execution result of the test mode are provided, and the test modes are sequentially executed corresponding to the number of power-on times after product assembly. To do so. The present invention is based on the premise that the sequential value of the test mode is initially set in the nonvolatile memory.

According to a second aspect of the present invention, first power-on detection means for detecting the first power-on after the product is assembled, and initial value setting means for setting the order value to an initial value based on the first power-on detection. The test mode execution device with and is added. As the first power-on detection means, a method of detecting the presence or absence of blown fuse may be considered besides the one described in the embodiment.

According to a third aspect of the present invention, there is provided a checksum value calculating means for adding the numerical data stored in the non-volatile memory to calculate a checksum value, and the non-volatile memory for storing the calculated checksum value. Specific memory area of
A match determination unit that determines whether the checksum value stored in the specific memory area matches the checksum value calculated by the checksum value calculation unit, and a match signal from the match determination unit. A first power-on detection for detecting the first power-on by a 0-judging means for judging whether or not the checksum value is 0 based on the non-coincidence signal of the coincidence-judging means or the 0-judgment signal from the 0-judging means. By means.

[0010]

According to the first aspect of the invention, the test mode can be executed by simply turning on the power after assembling the product, and when there are a plurality of test steps, simply turning on / off the power repeatedly allows a plurality of test modes. Can be performed sequentially.

According to the second aspect of the present invention, the order value of the test mode can be set to the initial value in the nonvolatile memory simply by turning on the power after the product is assembled.

According to the third aspect of the present invention, the first power-on can be detected only by the checksum value determination skillfully utilizing the non-volatile memory.

[0013]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of a test mode executing apparatus according to the present invention will be described in detail below with reference to the drawings.

FIG. 3 is a schematic block diagram of a device having a test mode control function by a microprocessor, for example, a microwave oven. Non-volatile memory (EEPROM)
As shown in FIG. 4, the checksum value, the test mode execution order value, and various data are rewritably stored. 3 is a microprocessor 1 which provides information necessary for automatic control
, Various relays for driving heating means or blower means based on commands from the microprocessor 1, 5 for rectifying and smoothing the commercial power source and supplying a predetermined DC power source to the microprocessor 1, 6 Is a display device for displaying instructions or error messages in the test mode, and 7 is an input means for giving a command to the microprocessor 1.

Next, one control operation of the test mode executing apparatus according to the present invention will be described with reference to the above-mentioned configuration and the flow chart shown in FIG. The nonvolatile memory 2 employs a memory area A1 in which the order value of the test mode is set to an initial value in advance (set to 1), and the control program of the present embodiment that executes the test mode of 9 steps is ordered. If the value is 9 or less, the test mode is set to 10 and the normal mode is designed to shift to the normal mode immediately after the power is turned on, and the sequence values 1 to 9 are set to the test mode shift value and 10 to the normal mode shift value.

After the product is assembled, when the product is powered on in the test process, the microprocessor 1 causes the nonvolatile memory 2 to operate.
It is determined whether the order value stored in the memory area A1 of 10 is the normal mode shift value 10 (S1).

If the normal mode shift value is 10, the mode shifts to the normal mode, but when the power is first turned on, the order value is 1.
Is set to, so test mode 1 is executed (S
2).

If the display device 6 indicates that the test data is normally taken in by the execution of the test mode 1 or the test result is acceptable, it is automatically or input from the input device 7 (S3). As a result, 1 is added to the memory area A1 of the nonvolatile memory 2 to update the order value 2 (S4), and the test mode 1 ends (S5). If the test device 1 does not normally receive the test data and an error message is displayed on the display device 6 or a failure input is made from the input device 7, the test mode 1 is stopped (S6). The test mode 1 will be executed again.

When the product which has passed the test mode 1 is turned off and then turned on again, the order value of the memory area A1 becomes 2
Therefore, the test mode 2 is immediately executed.
The test mode is executed one after another and the result is passed, and the memory area A1
If the order value of 10 has reached 10, the next time the power is turned on, it is determined in step S1 that the mode has shifted to the normal mode, and the mode shifts to the normal mode.

Next, another embodiment of the present invention will be described with reference to the flow chart shown in FIG. According to the present invention, even if the sequence value of the test mode is not set to the initial value (set to 1) in advance in the memory area A1 of the non-volatile memory 2, the test modes are sequentially executed by simply turning on / off the power supply. I have to.

After the product is assembled, when the power is turned on in the test process, the microprocessor 1 causes the nonvolatile memory 2 to operate.
The checksum value is calculated by adding the numerical data of the memory areas A1 to An (S1). Then, it is determined whether or not the calculated checksum value matches the numerical data stored in the checksum value storage memory area A0 (S2), and if they match, whether the numerical data in the memory area A0 is 0 or not. 0 is determined (S3), and the nonvolatile memory 2
Check if is innocent.

If there is no match in the match determination (S2) or if the result is 0 in the above 0 determination, it means that the power is turned on for the first time after the product is assembled, and the memory area A of the nonvolatile memory 2 is reached.
The sequence value 1 is set to 1 (S4), and the memory areas A1 to An are set.
Write the checksum value of S to the memory area A0 (S
5).

By the above control operation, the test mode order value when the power is turned on for the first time after the product is assembled is set to the initial value (set to 1), and the flow charts after S6 step are the same as those in the above-mentioned embodiment. They are basically the same, and the difference is the addition of step S10.

[0024]

According to the first aspect of the present invention, the test mode can be executed by simply turning on the power after assembling the product, and when there are a plurality of test steps, simply turning on / off the power can be repeated. Since the test modes can be sequentially executed, the work time of the test process can be reduced. Further, it becomes possible to introduce an inexpensive work robot.

According to the second aspect of the present invention, since the initial value of the test mode order value can be set in the non-volatile memory only by turning on the power after the product is assembled, the test mode order value is preset to the nonvolatile value. It is not necessary to use a volatile memory, and the cost can be reduced by using a pure and inexpensive memory.

According to the third aspect of the invention, the first power-on can be detected only by the checksum value determination skillfully utilizing the non-volatile memory. Therefore, the invention of the second aspect can be realized without increasing the cost.

[Brief description of drawings]

FIG. 1 is a flowchart illustrating an example of a test mode execution device according to the present invention.

FIG. 2 is a flowchart illustrating another example of the test mode execution device according to the present invention.

FIG. 3 is a schematic block diagram of a microwave oven adopting the present invention.

FIG. 4 is a diagram illustrating a memory outline of a nonvolatile memory according to the present invention.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 Microprocessor 2 Non-volatile memory (EEPROM) 6 Display device 7 Input means

Claims (3)

[Claims] 1. A non-volatile memory that stores a sequence value of a test mode, and a determination unit that determines whether the sequence value stored in the non-volatile memory is a test mode transition value or a normal mode transition value. A test mode execution device comprising: a sequence value updating means for updating the sequence value based on the execution result of the test mode, and sequentially executing the test modes corresponding to the number of power-on times after product assembly. 2. A first power-on detection means for detecting the first power-on after the product is assembled, and an initial value setting means for setting the order value to an initial value based on the first power-on detection. The test mode execution device according to claim 1, wherein: 3. A checksum value calculation means for calculating a checksum value by adding numerical data stored in the non-volatile memory, and a specific memory area in the non-volatile memory for storing the calculated checksum value. A match determination means for determining whether the checksum value stored in the specific memory area matches the checksum value calculated by the checksum value calculation means, and a match signal from the match determination means And 0 check means for judging whether the checksum value is 0 or not. Based on the non-match signal of the match judging means or the 0 judgment signal from the 0 judging means, the first power-on is detected. 3. The test mode execution device according to claim 2, further comprising detection means.