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JPH0773103B2 - Semiconductor heat treatment structure - Google Patents

Semiconductor heat treatment structure

Info

Publication number
JPH0773103B2
JPH0773103B2 JP19519393A JP19519393A JPH0773103B2 JP H0773103 B2 JPH0773103 B2 JP H0773103B2 JP 19519393 A JP19519393 A JP 19519393A JP 19519393 A JP19519393 A JP 19519393A JP H0773103 B2 JPH0773103 B2 JP H0773103B2
Authority
JP
Japan
Prior art keywords
quartz
heat
heat treatment
quartz glass
heating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP19519393A
Other languages
Japanese (ja)
Other versions
JPH076976A (en
Inventor
博至 木村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shin Etsu Quartz Products Co Ltd
Original Assignee
Shin Etsu Quartz Products Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shin Etsu Quartz Products Co Ltd filed Critical Shin Etsu Quartz Products Co Ltd
Priority to JP19519393A priority Critical patent/JPH0773103B2/en
Publication of JPH076976A publication Critical patent/JPH076976A/en
Publication of JPH0773103B2 publication Critical patent/JPH0773103B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体製造用の熱処理
装置の加熱域と非加熱域間に配設され、加熱域の保温及
び断熱を行う熱保持体、炉壁材その他の構造体に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a heat holder, a furnace wall material and other structures which are disposed between a heating zone and a non-heating zone of a heat treatment apparatus for semiconductor manufacturing and which keeps heat and heat in the heating zone. .

【0002】[0002]

【従来の技術】例えば図2に示す如く、周囲に加熱手段
1 を囲繞した石英ガラス製炉管2 内に、支持治具3 を介
して半導体ウエハ4 を収納可能に構成し、前記加熱手段
1 により支持治具3 上に戴設した半導体ウエハ4 を所定
温度域まで加熱し制御しながら、該半導体ウエハ4 表面
域に反応ガス又は不活性ガスを流し、半導体ウエハ4 表
面域の酸化、拡散、気相成長、アニール等の各種熱処理
を行う熱処理装置は公知であり、この種の熱処理装置に
おいては、前記ウエハ4 表面域に形成又は注入される薄
膜の厚さや不純物濃度分布のバラツキを防止する為に、
炉管2 内の加熱区域A と炉管2 開口端側間に石英ガラス
製の熱保持体5 を配して前記ウエハ4 熱処理用空間温度
の均等化を図るとともに、前記炉管2 周囲に囲繞した加
熱手段1 を熱保持体5 上方に位置せしめ、前記熱保持体
5 を断熱材として機能させる事により、炉管2 開口端側
に設けたOリング6 その他のシール部分に高温が伝搬す
るのを防いでいる。そしてこのような熱保持体5 は一般
に、密封された石英ガラス製の円筒体5a内に、長繊維状
の石英ガラスウール5bを封入して構成している。
2. Description of the Related Art For example, as shown in FIG.
A quartz glass furnace tube 2 surrounding 1 is configured so that a semiconductor wafer 4 can be housed via a supporting jig 3, and the heating means
While the semiconductor wafer 4 mounted on the support jig 3 is heated to a predetermined temperature range by 1 and controlled, a reaction gas or an inert gas is flown to the surface area of the semiconductor wafer 4 to oxidize and diffuse the surface area of the semiconductor wafer 4. A heat treatment apparatus for performing various heat treatments such as vapor phase growth and annealing is known, and in this kind of heat treatment apparatus, it is possible to prevent variations in thickness and impurity concentration distribution of a thin film formed or implanted in the surface region of the wafer 4. In order to
A quartz glass heat retainer 5 is arranged between the heating area A in the furnace tube 2 and the opening end side of the furnace tube 2 to equalize the space temperature for heat treatment of the wafer 4 and to surround the furnace tube 2 around it. The heating means 1 is placed above the heat holder 5 and
By making 5 function as a heat insulating material, high temperature is prevented from propagating to the O-ring 6 and other sealing parts provided on the open end side of the furnace tube 2. In addition, such a heat retaining body 5 is generally configured by enclosing a long-fiber-shaped quartz glass wool 5b in a sealed cylindrical quartz glass body 5a.

【0003】[0003]

【発明が解決しようとする課題】しかしながら前記構成
の熱保持体5 は、密閉空間内に単にガラスウール5bを封
入した構造である為に、該熱保持体5 を加熱炉に使用し
た場合、前記円筒体5a内に圧力負荷が加わり、而も該熱
保持体5 はその上方の炉管2 周囲に囲繞した加熱手段1
よりの輻射熱により、上面側が常に高温に曝されててい
る為に、密閉された円筒体5a内のガス(空気)が熱膨張
して前記圧力負荷が一層強まり、該円筒体5aが破壊して
しまう場合がある。
However, since the heat holder 5 having the above-mentioned structure has a structure in which the glass wool 5b is simply enclosed in the closed space, when the heat holder 5 is used in the heating furnace, A pressure load is applied to the inside of the cylindrical body 5a, and the heat holder 5 is surrounded by the heating tube 1 surrounding the furnace tube 2 above.
Since the upper surface side is always exposed to a high temperature by radiant heat from, the gas (air) in the sealed cylindrical body 5a is thermally expanded and the pressure load is further strengthened, and the cylindrical body 5a is destroyed. It may end up.

【0004】かかる欠点を解消する為に、従来より前記
円筒体5a内にリブやかすがいその他の補強棒を取付け、
耐圧強度の向上を図っているが、近年のようにウエハ4
の大口径化に伴ない炉管2 が大型化するに連れ、前記熱
保持体5 口径も大型化し、その分耐圧強度が低下する為
に、前記補強棒を等比級数的に数多く設けねばならず、
この事が熱保持体5 製造作業の煩雑化と製造コストの大
幅増加を招くとともに、特に前記熱保持体5 を150 〜20
0 mm程度に大口径化した場合、真空状態で且つ高温下に
おける耐圧を円滑に満足する程度に多数の補強棒を設け
る事は設計上及び製造上極めて困難であり、結果として
このような大口径の熱保持体5 を製作し得なかった。
In order to eliminate such drawbacks, conventionally, ribs, glazing and other reinforcing rods have been mounted in the cylindrical body 5a,
We are trying to improve the pressure resistance, but wafer 4
As the furnace tube 2 becomes larger due to the larger diameter, the heat holder 5 also becomes larger in diameter, and the pressure resistance decreases accordingly.Therefore, a large number of reinforcing rods must be provided in a geometric progression. No
This leads to a complicated manufacturing work of the heat carrier 5 and a large increase in the manufacturing cost.
When the diameter is increased to about 0 mm, it is extremely difficult in terms of design and manufacturing to provide a large number of reinforcing rods so that the pressure resistance under vacuum and at high temperature can be smoothly satisfied. It was not possible to manufacture the heat carrier 5 of.

【0005】この結果、ウエハ4 の大口径化に伴ない例
え炉管2 を大型化した場合においても、これに対応して
前記熱保持体5 を大口径化し得ず、これにより、炉管2
内のウエハ4 熱処理用空間よりの加熱温度が熱保持体5
と炉管2 内壁面間の空隙部より逃げ、該ウエハ4 熱処理
区域A の加熱温度が変動するとともに、炉管2 開口端側
のシール部分に高温が伝搬するのを完全に防止し得ない
という問題が派生していた。
As a result, even if the furnace tube 2 is increased in size due to the increase in the diameter of the wafer 4, the heat retaining member 5 cannot be increased in size correspondingly, and thus the furnace tube 2 is
Wafers inside 4 The heating temperature from the heat treatment space is
It escapes from the gap between the inner wall surface of the furnace tube 2 and the heating temperature of the wafer 4 heat treatment area A, and it cannot completely prevent the high temperature from propagating to the seal part on the opening end side of the furnace tube 2. The problem was derived.

【0006】本発明はかかる従来技術の欠点に鑑み、断
熱性と保温性を十分満足しつつ、大口径化に耐えられる
だけの高耐圧強度を有する熱保持体5 その他の構造体を
提供する事を目的とする。本発明の他の目的は、断熱
性、保温性及び高耐圧性を有し、前記熱保持体5 や加熱
炉の炉壁材として好適に使用される構造体を提供する事
にある。
In view of the above-mentioned drawbacks of the prior art, the present invention provides a heat retainer 5 and other structures having high pressure resistance enough to withstand a large diameter while sufficiently satisfying heat insulation and heat retention. With the goal. Another object of the present invention is to provide a structure having heat insulating properties, heat retaining properties and high pressure resistance, which is suitably used as the heat retaining member 5 or a furnace wall material of a heating furnace.

【0007】[0007]

【課題を解決する為の手段】本発明は、図1に示すよう
に前記熱保持体又は加熱炉の炉壁材として好適に使用さ
れる構造体30を、内部に多数の微小空間31a を有する石
英ガラス塑性体31、言い換えれば前記石英ガラス塑性体
31がガラスウール5b等の柔軟性を有する部材で形成され
ているのではなく、例えば石英微粉を真空炉中で加熱す
る事により、発泡ガラス体のように多数の微小空間31a
を内部に有し且つそれ自体は硬質な石英ガラス薄膜が網
目状に縦横に張りめぐらされている塑成体で形成し、該
塑成体を前記構造体の芯体として用いたものである。
According to the present invention, as shown in FIG. 1, a structure 30, which is preferably used as a heat retaining member or a furnace wall material of a heating furnace, has a large number of minute spaces 31a therein. Quartz glass plastic body 31, in other words, the quartz glass plastic body
31 is not formed of a flexible member such as glass wool 5b, but by heating quartz fine powder in a vacuum furnace, for example, a large number of minute spaces 31a such as a foam glass body.
And a hard quartz glass thin film, which is itself formed inside, is formed of a plastic body which is stretched in a mesh shape in the vertical and horizontal directions, and the plastic body is used as a core body of the structure.

【0008】この場合前記微小空間31a は独立気泡、連
続気泡又は連続空隙として存在するが、いずれもそのほ
とんどが少なくとも1300℃以下で減圧又は真空状態で存
在させる必要がある。
In this case, the minute space 31a exists as a closed cell, an open cell, or an open void, but most of them all need to exist under a reduced pressure or a vacuum at a temperature of 1300 ° C. or lower.

【0009】又前記構造体30は、前記微小空間31a が表
面に露出する塑性体31のままで使用する事も可能である
が、該石英ガラス塑性体31の表面側を透明ガラス層32で
隠蔽し、該透明ガラス層32が、前記加熱域A と石英ガラ
ス塑性体31間に介在しているように構成するのがよい。
The structure 30 can be used as the plastic body 31 in which the minute space 31a is exposed on the surface, but the surface side of the quartz glass plastic body 31 is concealed by the transparent glass layer 32. However, it is preferable that the transparent glass layer 32 is interposed between the heating region A and the quartz glass plastic body 31.

【0010】そしてこのような透明ガラス層32の形成
は、前記芯体の外周囲表面をバーナであぶるなどの後加
工により、表面層にのみ薄膜の透明石英ガラス層32を形
成して構造体としてもよく、又石英微粉を石英ガラス容
器に充填した状態で、真空炉中で加熱し、該石英容器と
一体的に溶着させて構造体を形成してもよい。
The transparent glass layer 32 is formed as a structure by forming a thin transparent quartz glass layer 32 only on the surface layer by post-processing such as rubbing the outer peripheral surface of the core with a burner. Alternatively, the structure may be formed by heating fine quartz powder in a quartz glass container in a vacuum furnace and integrally welding with the quartz container.

【0011】[0011]

【作用】本発明は、前記熱保持体5 や炉壁等の熱処理装
置用いられる構造体30を、内部に多数の微小空間31a を
有する石英ガラス塑性体31、言い換えれば図3に示すよ
うに多数の微小空間31a を内部に有する細かい網目状の
塑成体で形成した為に当然に保温性と断熱性を有すると
ともに、前記網目状の石英ガラス薄膜がリブ又はかすが
い様の補強材として機能し、高耐圧性を有する。
According to the present invention, the structure 30 used in the heat treatment apparatus such as the heat holder 5 and the furnace wall is made of the quartz glass plastic body 31 having a large number of minute spaces 31a therein, in other words, as shown in FIG. Since it is formed of a fine mesh-shaped plastic body having a minute space 31a inside, it naturally has heat retention and heat insulation properties, and the mesh-shaped quartz glass thin film functions as a rib-like or scuffing-like reinforcing material, Has high withstand voltage.

【0012】又本発明においては、前記微小空間31a が
表面に露出したまま使用すると、半導体ウエハ4 製造工
程中に前記微小空間31a 内に存在する不純物や不純ガス
が外部に導出し、製品欠陥が生じる場合がある。そこで
本発明の好ましい実施例においては、前記石英ガラス塑
性体31の表面を薄膜又は所定肉厚の透明ガラス層32で隠
蔽し、該透明ガラス層32により、前記加熱域A と石英ガ
ラス塑性体31間を遮断する事により、前記製品欠陥の恐
れを取除くとともに、該透明ガラス層32が補強層として
も機能し、耐圧性が一層向上する。又前記微小空間31a
を少なくとも1300℃以下で減圧又は真空状態で存在させ
る事により、断熱保温性を向上させると共に該微小空間
31a 内に存在するガスの熱膨張を防止し、耐圧性の一層
の向上と、不純ガスが外部に導出するのを防止出来る。
Further, in the present invention, if the minute space 31a is used while being exposed on the surface, impurities and impure gas existing in the minute space 31a during the manufacturing process of the semiconductor wafer 4 are led out to the outside, resulting in a product defect. May occur. Therefore, in a preferred embodiment of the present invention, the surface of the quartz glass plastic body 31 is covered with a thin film or a transparent glass layer 32 having a predetermined thickness, and the heating area A and the quartz glass plastic body 31 are covered by the transparent glass layer 32. By blocking the gap, the risk of product defects is eliminated, and the transparent glass layer 32 also functions as a reinforcing layer, further improving the pressure resistance. Also, the minute space 31a
Exists in a reduced pressure or vacuum state at least at 1300 ° C or lower to improve adiabatic heat retention and also
It is possible to prevent thermal expansion of the gas existing inside 31a, further improve the pressure resistance, and prevent the impure gas from being discharged to the outside.

【0013】[0013]

【実施例】以下、図面に基づいて本発明の実施例を例示
的に詳しく説明する。但しこの実施例に記載されている
構成部品の寸法、材質、形状、その相対配置などは特に
特定的な記載がない限りは、この発明の範囲をそれのみ
に限定する趣旨ではなく単なる説明例に過ぎない。図1
は図2の縦型構造の熱処理装置に本発明の熱保持体30が
組込まれた装置を示し、前記従来技術との差異を中心に
説明すると、前記炉管2 内の下方部分には基台7 上に戴
設した熱保持体30を位置せしめ、該熱保持体30上面に、
半導体ウエハ4 を列設配置した支持治具3 を戴置させる
とともに、該支持治具3 が位置する炉管2 周囲に加熱手
段1 を囲繞させ、公知の手段で前記半導体ウエハ4 が加
熱処理可能に構成する。
Embodiments of the present invention will now be illustratively described in detail with reference to the drawings. However, the dimensions, materials, shapes, relative positions and the like of the components described in this embodiment are not intended to limit the scope of the present invention thereto, but are merely examples, unless otherwise specified. Not too much. Figure 1
2 shows an apparatus in which the heat holder 30 of the present invention is incorporated in the heat treatment apparatus having the vertical structure of FIG. 2, and the difference from the prior art will be mainly described, the lower part of the furnace tube 2 will be a base. 7 Position the heat holder 30 installed on the top, and on the upper surface of the heat holder 30,
A supporting jig 3 in which semiconductor wafers 4 are arranged in a row is placed, and a heating means 1 is surrounded around a furnace tube 2 in which the supporting jig 3 is located, and the semiconductor wafer 4 can be heat-treated by a known means. To configure.

【0014】そして本発明の要旨たる熱保持体30は、内
部に形成された石英ガラス塑性体31と、その周囲を囲繞
する透明石英ガラス製の囲繞体32から形成されている。
次に前記石英ガラス塑性体31の製造手順について説明す
るに、先ず上方が開口し、前記囲繞体32と同形で且つ背
高のみが大なる石英製ルツボ内に石英微粉をカーボン粉
その他の発泡促進剤の混入などの発泡促進処理を行い投
入し、真空炉中で1300〜1800℃前後の温度で加熱する事
により、内部に多数の減圧微小空間31aを有し、石英薄
膜31b が縦横に張りめぐらされた、いわゆる発泡ガラス
状の石英ガラス塑性体31が形成される。(図3 (A)(B)
(C)参照)
The heat holder 30, which is the subject matter of the present invention, is formed of a quartz glass plastic body 31 formed inside and a surrounding body 32 made of transparent quartz glass surrounding the plastic body 31.
Next, the procedure for manufacturing the quartz glass plastic body 31 will be described. First, in the quartz crucible having an opening at the upper side and having the same shape as the surrounding body 32 and only a large height, quartz fine powder is mixed with carbon powder or other foaming promotion. By performing foaming acceleration treatment such as mixing of the agent and putting it in, and heating in a vacuum furnace at a temperature of around 1300 to 1800 ° C, there are many depressurized microspaces 31a inside, and quartz thin film 31b is stretched vertically and horizontally. The so-called foam glass-like quartz glass plastic body 31 is formed. (Fig. 3 (A) (B)
(See (C))

【0015】この際前記石英微粉内に例えばカーボン粉
とともに水を混入して泥状にした状態にするなど発泡促
進処理を施し、加熱させる事により更に多数の減圧微小
空間31a を有する発泡ガラス状の石英ガラス塑性体31が
形成出来、好ましい。そしてこのようにして形成された
石英ガラス塑性体31は前記加熱により、その表面が石英
製ルツボと一体的に溶着するとともに、体積が減少する
為に、その減少したルツボの上側部分を切断し、その上
面に蓋体32aを溶着して、前記石英ガラス塑性体31外周
囲を囲繞体32にて囲繞させる。
At this time, the quartz fine powder is subjected to a foaming accelerating treatment, for example, by mixing water together with carbon powder to make it into a mud state, and by heating it, a glass-like foam having a large number of depressurized fine spaces 31a is formed. The quartz glass plastic body 31 can be formed, which is preferable. Then, the quartz glass plastic body 31 formed in this way is heated by the heating, the surface thereof is integrally welded to the quartz crucible, and the volume is reduced, so that the upper portion of the reduced crucible is cut, A lid 32a is welded to the upper surface of the quartz glass plastic body 31, and the outer periphery of the quartz glass plastic body 31 is surrounded by a surrounding body 32.

【0016】このように前記実施例においてはルツボを
囲繞体32と兼用して用いているが、このような構成を採
らずに、カーボン製のルツボ内で前記石英ガラス塑性体
31を形成した後、該ルツボより取り出した石英ガラス塑
性体31の表面をバーナであぶるなどにより、後で表面層
にのみ薄膜の透明石英ガラス層を形成するようにして製
造する事も可能である。
As described above, in the above-described embodiment, the crucible is also used as the surrounding body 32. However, without adopting such a constitution, the quartz glass plastic body is formed in the carbon crucible.
After forming 31, the surface of the quartz glass plastic body 31 taken out from the crucible can be blown with a burner or the like to form a thin transparent quartz glass layer only on the surface layer later. .

【0017】かかる実施例によれば前記保温体30に内蔵
された発泡ガラス状の石英ガラス塑性体31自体に耐圧性
を有している為に、該保温体30が大径化した場合でも単
一の部材で形成出来、前記実施例に記載した効果が一層
円滑に達成し得る。尚、前記のような保温体30はその形
状を任意に形成出来る為に、熱保持体5 以外に、加熱炉
内壁面周囲に取付けられる炉壁として利用する事も可能
である。
According to such an embodiment, since the foam glass-like quartz glass plastic body 31 contained in the heat retaining body 30 itself has pressure resistance, even if the heat retaining body 30 has a large diameter, It can be formed by one member, and the effects described in the above-described embodiment can be achieved more smoothly. Since the heat retaining body 30 as described above can be formed in any shape, it can be used not only as the heat retaining body 5 but also as a furnace wall attached around the inner wall surface of the heating furnace.

【0018】[0018]

【効果】以上記載した如く本発明によれば、断熱性と保
温性を十分満足しつつ、大口径化に耐えられるだけの高
耐圧強度を有する熱保持体その他の構造体を提供する事
が出来るのみならず、更に前記熱保持体や加熱炉の炉壁
材として好適に使用される構造体を提供する事が出来
る。等の種々の著効を有する。
[Effect] As described above, according to the present invention, it is possible to provide a heat retainer or other structure having a high pressure resistance enough to withstand a large diameter while sufficiently satisfying heat insulation and heat retention. Not only can the structure be suitably used as the heat retainer and the furnace wall material of the heating furnace. It has various remarkable effects.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例に係る縦型構造の熱処理装置を
示す正面全体断面図である。
FIG. 1 is an overall front sectional view showing a heat treatment apparatus having a vertical structure according to an embodiment of the present invention.

【図2】従来公知の熱処理装置を示す正面全体断面図で
ある。
FIG. 2 is an overall front sectional view showing a conventionally known heat treatment apparatus.

【図3】本発明に使用される塑性体の内部構成を示す拡
大図である。
FIG. 3 is an enlarged view showing an internal configuration of a plastic body used in the present invention.

【符号の説明】[Explanation of symbols]

30 構造体 31 石英ガラス塑性体 31a 微小空間 32 透明ガラス層 A 加熱域 30 Structure 31 Quartz glass plastic 31a Micro space 32 Transparent glass layer A Heating area

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 半導体製造用熱処理装置の加熱域と非加
熱域間に配設され、加熱域の保温及び断熱を行う構造体
において、 石英微粉を真空炉中で加熱する事により、内部に多数の
減圧若しくは真空微小空間を有し、石英薄膜が縦横に張
りめぐらされた塑性体を形成し、該塑成体を前記構造体
の芯体として用いた事を特徴とする半導体熱処理装置用
構造体
1. A structure, which is arranged between a heating zone and a non-heating zone of a heat treatment apparatus for semiconductor manufacturing and performs heat insulation and heat insulation of the heating zone, by heating fine quartz powder in a vacuum furnace, a large number of quartz fine powders are internally provided. Structure for a semiconductor heat treatment apparatus, characterized in that it has a reduced pressure or vacuum micro space, forms a plastic body in which a quartz thin film is stretched vertically and horizontally, and uses the plastic body as a core body of the structure body.
【請求項2】 前記芯体の外周囲表面を、表面層にのみ
薄膜の透明石英ガラス層を形成して構造体とした事を特
徴とする請求項1記載の半導体熱処理用構造体
2. The structure for semiconductor heat treatment according to claim 1, wherein the outer peripheral surface of the core body is a structure body in which a thin transparent quartz glass layer is formed only on the surface layer.
【請求項3】 石英微粉を石英ガラス容器に充填した状
態で、真空炉中で加熱し、該石英容器と一体的に溶着さ
せて形成した事を特徴とする請求項1記載の半導体熱処
理用構造体
3. The structure for heat treatment of semiconductor according to claim 1, wherein the quartz fine powder is filled in a quartz glass container, heated in a vacuum furnace, and integrally fused with the quartz container. body
JP19519393A 1993-07-12 1993-07-12 Semiconductor heat treatment structure Expired - Fee Related JPH0773103B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19519393A JPH0773103B2 (en) 1993-07-12 1993-07-12 Semiconductor heat treatment structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19519393A JPH0773103B2 (en) 1993-07-12 1993-07-12 Semiconductor heat treatment structure

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP62203499A Division JPH063795B2 (en) 1987-08-18 1987-08-18 Heat treatment equipment for semiconductor manufacturing

Publications (2)

Publication Number Publication Date
JPH076976A JPH076976A (en) 1995-01-10
JPH0773103B2 true JPH0773103B2 (en) 1995-08-02

Family

ID=16337004

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19519393A Expired - Fee Related JPH0773103B2 (en) 1993-07-12 1993-07-12 Semiconductor heat treatment structure

Country Status (1)

Country Link
JP (1) JPH0773103B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1197446A (en) 1997-09-18 1999-04-09 Tokyo Electron Ltd Vertical heat treatment equipment
JP2002343789A (en) 2001-05-16 2002-11-29 Mitsubishi Electric Corp Auxiliary heat-retention jig, its manufacturing method, wafer boat with heat insulator in plate form, vertical heat treatment equipment, method for modifying the same and method for manufacturing semiconductor device

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
作花、境野、高橋、「ガラスハンドブック」、初版(1975−9−30)、株式会社朝倉書店、P.183−189

Also Published As

Publication number Publication date
JPH076976A (en) 1995-01-10

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