JPH07201082A - Optical disk inspecting device - Google Patents
Optical disk inspecting deviceInfo
- Publication number
- JPH07201082A JPH07201082A JP35055593A JP35055593A JPH07201082A JP H07201082 A JPH07201082 A JP H07201082A JP 35055593 A JP35055593 A JP 35055593A JP 35055593 A JP35055593 A JP 35055593A JP H07201082 A JPH07201082 A JP H07201082A
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- optical disk
- optical disc
- optical
- inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Landscapes
- Testing Of Optical Devices Or Fibers (AREA)
- Manufacturing Optical Record Carriers (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、光ディスクの各種特性
を評価するための検査装置に係り、その測定結果の信頼
性向上のための技術に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an inspection device for evaluating various characteristics of an optical disc, and more particularly to a technique for improving the reliability of the measurement result.
【0002】[0002]
【従来の技術】コンピュータの外部記憶や音楽用の録音
媒体として、光ディスクが使用されており、この光ディ
スクの様々な特性、すなわち、反射率、信号強度、エラ
ーレート、記録感度などを評価するための装置として、
光ディスク検査装置がある。一般に、光ディスク検査装
置は、光学ヘッドから光ディスクにレーザ光を照射し
て、信号の記録・再生を行うことによって、光ディスク
の特性を評価する。光ディスクへの信号の記録はレーザ
光の熱を利用して行われるので、光ディスクの記録感度
は極めて重要な評価項目である。2. Description of the Related Art Optical discs are used as external recording media for computers and recording media for music. For evaluating various characteristics of the optical discs, such as reflectance, signal strength, error rate, and recording sensitivity. As a device
There is an optical disk inspection device. In general, an optical disk inspection apparatus evaluates the characteristics of an optical disk by irradiating the optical disk with laser light from the optical head to record and reproduce signals. The recording sensitivity of an optical disk is an extremely important evaluation item because the recording of a signal on an optical disk is performed by utilizing the heat of laser light.
【0003】ところが、環境温度が変わって光ディスク
の温度が変化すると、記録感度の測定結果に大きな誤差
を生じる。図3は光磁気ディスクの場合の周囲環境温度
と記録感度の特性の一例を示すもので、ディスク温度が
1℃変わるだけで記録感度が約0.04mWも変化して
いる。従来の光ディスク検査装置においては、検査ドラ
イブ内の放熱・冷却のために外気を吸入する手段は設け
られているが、検査ドライブ内の温度を一定に保ち、検
査されるディスクの温度を制御する機能は設けられてい
ない。However, if the ambient temperature changes and the temperature of the optical disk changes, a large error occurs in the measurement result of the recording sensitivity. FIG. 3 shows an example of the characteristics of the ambient environment temperature and the recording sensitivity in the case of a magneto-optical disk. The recording sensitivity changes by about 0.04 mW when the disk temperature changes by 1 ° C. The conventional optical disc inspection apparatus is provided with a means for sucking the outside air to dissipate and cool the inside of the inspection drive, but the function to keep the temperature inside the inspection drive constant and control the temperature of the disc to be inspected Is not provided.
【0004】また、光学ヘッドから出射されるレーザ光
の強度が規定値からずれた場合にも、記録感度や反射率
などの測定結果は正しい結果が得られない。通常の使用
環境において、光学ヘッドから出射されるレーザ光の強
度は、光学ヘッド内の対物レンズやビームスプリッタな
どの光学素子の汚れによって使用時間とともに低下する
傾向がある。従来の光ディスク検査装置においては、光
学ヘッド内の光学素子の汚れを防ぐ手段は設けられてい
ない。Further, even if the intensity of the laser beam emitted from the optical head deviates from the specified value, the measurement results such as recording sensitivity and reflectance cannot be obtained correctly. In a normal use environment, the intensity of laser light emitted from the optical head tends to decrease with use time due to contamination of optical elements such as an objective lens and a beam splitter in the optical head. In the conventional optical disc inspection apparatus, there is no means for preventing the optical element in the optical head from being soiled.
【0005】[0005]
【発明が解決しようとする課題】上記のように従来の光
ディスク検査装置においては、検査装置周囲の環境温度
の変化や、光学ヘッド内の光学素子の汚れによる出射レ
ーザパワーの強化低下のために、記録感度や反射率など
の測定結果に誤差を生じた場合、光ディスクの特性を誤
った方向に調整してしまう。その結果、光ディスク装置
で光ディスクに情報を記録・再生するときに、信号の記
録もしくは再生不良といったトラブルが発生することが
ある。As described above, in the conventional optical disc inspection apparatus, the environmental temperature around the inspection apparatus is changed and the emission laser power is reduced due to the contamination of the optical element in the optical head. If an error occurs in the measurement result such as recording sensitivity or reflectance, the characteristics of the optical disc are adjusted in the wrong direction. As a result, when information is recorded / reproduced on / from the optical disc by the optical disc device, a trouble such as signal recording or reproduction failure may occur.
【0006】本発明は、上記問題を解決するためになさ
れたものであり、光学ヘッド内の光学素子の汚れを防
ぎ、検査される光ディスクの温度を所定の温度に保つこ
とによって、正確な測定結果を得ることができる光ディ
スク検査装置を提供することを目的とする。The present invention has been made to solve the above problems, and prevents contamination of the optical elements in the optical head and keeps the temperature of the optical disc to be inspected at a predetermined temperature to obtain accurate measurement results. It is an object of the present invention to provide an optical disc inspection device capable of obtaining the following.
【0007】[0007]
【課題を解決するための手段】上記目的を達成するため
に本発明は、光ディスクに光ビームを照射して信号の記
録・再生を行い、光ディスクの様々な特性を評価する光
ディスク検査装置において、検査される光ディスクがセ
ットされ、光学ヘッドから出射される光ビームを該光デ
ィスクに照射して信号の記録・再生を行う検査用区画室
と、前記検査用区画室内の雰囲気温度を所定温度に調整
する温度調整手段と、前記検査用区画室内の空気を清浄
に保持するための空気清浄手段と、前記光学ヘッドで再
生した信号を処理して光ディスクの特性データを得る計
測手段とを備えたものである。In order to achieve the above object, the present invention provides an optical disc inspection apparatus for irradiating a light beam on an optical disc to record / reproduce signals to evaluate various characteristics of the optical disc. An optical disc to be set is set, and an inspection compartment for irradiating the optical beam emitted from the optical head onto the optical disc to record / reproduce signals, and a temperature for adjusting the ambient temperature in the inspection compartment to a predetermined temperature It is provided with an adjusting means, an air cleaning means for keeping the air in the inspection compartment clean, and a measuring means for processing the signal reproduced by the optical head to obtain characteristic data of the optical disk.
【0008】[0008]
【作用】上記の構成によれば、検査される光ディスクが
セットされる検査用区画室内の雰囲気温度が所定温度に
調整され、光ディスクの温度が所定温度に保持され、か
つ、同雰囲気の空気が清浄に保たれるので、光ディスク
の記録感度測定値に環境温度変化による誤差がなくな
り、しかも、光学ヘッドが汚染したりすることがなくな
り、長期間にわたって安定した光ビーム出力が得られ
る。これにより、光ディスクの計測データは正確なもの
となる。According to the above construction, the atmosphere temperature in the inspection compartment in which the optical disk to be inspected is set is adjusted to a predetermined temperature, the temperature of the optical disk is maintained at a predetermined temperature, and the air in the atmosphere is cleaned. Therefore, the measured value of the recording sensitivity of the optical disc does not have an error due to the environmental temperature change, and the optical head is not contaminated, and a stable light beam output can be obtained for a long period of time. As a result, the measurement data of the optical disc becomes accurate.
【0009】[0009]
【実施例】以下、本発明の一実施例を図面を参照して説
明する。図1は、本発明の一実施例における光ディスク
検査装置の概略構成図である。図1において、検査ドラ
イブ1は、検査される光ディスク2がセットされる検査
用区画室であり、光ディスク2を回転駆動させるスピン
ドルモータ3、光ディスク2に光ビームを出射して信号
の記録又は再生を行う光学ヘッド4などを備えている。
計測機器5は、光学ヘッド4で再生した信号を処理し
て、信号強度、エラーレート、反射率などの特性データ
値を計算するものである。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is a schematic configuration diagram of an optical disc inspection apparatus according to an embodiment of the present invention. In FIG. 1, an inspection drive 1 is an inspection compartment in which an optical disc 2 to be inspected is set, and a spindle motor 3 that drives the optical disc 2 to rotate and a light beam is emitted to the optical disc 2 to record or reproduce a signal. It is provided with an optical head 4 and the like.
The measuring device 5 processes the signal reproduced by the optical head 4 and calculates characteristic data values such as signal strength, error rate, and reflectance.
【0010】検査ドライブ1には、その内部の雰囲気温
度を所定温度に調整するための機構が付設されている。
その機構は、温調機6、送風ファン7及びフィルタ8な
どからなり、温調機6は、送風ファン7により吸引した
外気を温度調整し、その温度調整された空気をフィルタ
8を通して吸気口9から検査ドライブ1内に送り込み、
検査ドライブ1内の放熱・冷却を行う。検査ドライブ1
に送り込まれた外気は排気口10から排出される。温度
センサ11は検査ドライブ1内の温度を検出し、温調機
6に検出信号を帰還する。吸気口9及び排気口10は検
査ドライブ1の相対向する側壁に設けられている。The inspection drive 1 is provided with a mechanism for adjusting the internal ambient temperature to a predetermined temperature.
The mechanism is composed of a temperature controller 6, a blower fan 7, a filter 8 and the like. The temperature controller 6 controls the temperature of the outside air sucked by the blower fan 7, and the temperature-controlled air is passed through a filter 8 to an intake port 9 Sent into the inspection drive 1 from
Dissipates heat and cools the inspection drive 1. Inspection drive 1
The outside air sent to the air is discharged from the exhaust port 10. The temperature sensor 11 detects the temperature inside the inspection drive 1 and returns the detection signal to the temperature controller 6. The intake port 9 and the exhaust port 10 are provided on opposite side walls of the inspection drive 1.
【0011】上記構成において、検査ドライブ1内に設
置された温度センサ11は検査ドライブ1内の温度を検
知し、この検知温度信号に基づいて温調機6は検査ドラ
イブ1内の温度が常に所定の温度になるように、検査ド
ライブ1に送り込む空気の温度を調整する。これによ
り、検査ドライブ1の周囲の環境温度が変化しても、光
ディスク2の記録感度などの検査結果に誤差を生じるこ
とがない。また、検査ドライブ1内の放熱・冷却のため
に送り込まれる空気は、フィルタ8を通ることによって
清浄化され、空気のクリーン度が保てるため、光学ヘッ
ド4内の対物レンズなどの光学素子が汚染されることが
なく、出射レーザパワーの経時低下が大きく改善され
る。なお、検査ドライブ1内に通風される空気が光ディ
スク2平面と略平行に流れることで、スピンドルモータ
3や光学ヘッド4からの放熱が光ディスク2の雰囲気に
影響を与え難くしている。In the above structure, the temperature sensor 11 installed in the inspection drive 1 detects the temperature in the inspection drive 1, and the temperature controller 6 always determines the temperature in the inspection drive 1 based on the detected temperature signal. The temperature of the air sent into the inspection drive 1 is adjusted so that the temperature becomes. As a result, even if the environmental temperature around the inspection drive 1 changes, the inspection result such as the recording sensitivity of the optical disk 2 does not have an error. Further, the air sent for heat dissipation and cooling in the inspection drive 1 is cleaned by passing through the filter 8 and the cleanliness of the air can be maintained, so that optical elements such as the objective lens in the optical head 4 are contaminated. And the decrease in emitted laser power with time is greatly improved. Since the air ventilated in the inspection drive 1 flows substantially parallel to the plane of the optical disc 2, the heat radiation from the spindle motor 3 and the optical head 4 is less likely to affect the atmosphere of the optical disc 2.
【0012】図2は本発明の一実施例における出射レー
ザパワーの検査装置使用時間に対する変化を示す。同図
からも、本実施例によれば、従来の光ディスク検査装置
に比べて経時低下が小さく抑えられていることが分か
る。なお、本発明は上記実施例構成に限られず種々の変
形が可能であり、例えば、検査ドライブ1内を所定温度
に保つために任意の空調手段を使用することができる。FIG. 2 shows the change of the output laser power with respect to the operating time of the inspection apparatus in one embodiment of the present invention. From the figure, it can be seen that according to the present embodiment, the deterioration with time is suppressed to be smaller than that of the conventional optical disc inspection apparatus. The present invention is not limited to the configuration of the above-described embodiment, and various modifications can be made. For example, any air conditioning means can be used to keep the inside of the inspection drive 1 at a predetermined temperature.
【0013】[0013]
【発明の効果】以上のように本発明によれば、検査され
る光ディスクの雰囲気温度が所定温度に制御され、か
つ、同雰囲気の空気が清浄に保たれるので、光ディスク
の記録感度測定値に誤差がなくなり、また、長期間にわ
たって安定した光ビームパワーが得られることから、正
確な光ディスクの測定結果が得られる。また、従来の光
ディスク検査装置に、温度制御と空気清浄化の簡単な構
成を付加するだけで、光ディスク検査装置の測定結果の
信頼性を大きく向上させることができ、安定かつ高品質
の光ディスクを作成することが可能になる。As described above, according to the present invention, the atmospheric temperature of the optical disk to be inspected is controlled to a predetermined temperature, and the air in the same atmosphere is kept clean. Since there is no error and a stable light beam power can be obtained for a long period of time, an accurate optical disc measurement result can be obtained. Moreover, the reliability of the measurement results of the optical disc inspection device can be greatly improved by simply adding a simple configuration of temperature control and air cleaning to the conventional optical disc inspection device, and a stable and high-quality optical disc is created. It becomes possible to do.
【図1】本発明の一実施例による光ディスク検査装置の
概略構成図である。FIG. 1 is a schematic configuration diagram of an optical disc inspection apparatus according to an embodiment of the present invention.
【図2】本実施例と従来例による光ディスク検査装置の
出射レーザパワーの経時変化を比較して示す特性図であ
る。FIG. 2 is a characteristic diagram showing changes over time in emitted laser power of the optical disc inspection apparatus according to the present embodiment and the conventional example.
【図3】従来例における光ディスク検査装置の周囲環境
温度と記録感度の測定結果を示す特性図である。FIG. 3 is a characteristic diagram showing measurement results of ambient temperature and recording sensitivity of an optical disc inspection device in a conventional example.
1 検査ドライブ(検査用区画室) 2 光ディスク 4 光学ヘッド 5 計測機器 6 温調機 7 送風ファン 8 フィルタ 1 Inspection drive (compartment for inspection) 2 Optical disk 4 Optical head 5 Measuring equipment 6 Temperature controller 7 Blower fan 8 Filter
Claims (1)
記録・再生を行い、光ディスクの様々な特性を評価する
光ディスク検査装置において、 検査される光ディスクがセットされ、光学ヘッドから出
射される光ビームを該光ディスクに照射して信号の記録
・再生を行う検査用区画室と、 前記検査用区画室内の雰囲気温度を所定温度に調整する
温度調整手段と、 前記検査用区画室内の空気を清浄に保持するための空気
清浄手段と、 前記光学ヘッドで再生した信号を処理して光ディスクの
特性データを得る計測手段とを備えたことを特徴とする
光ディスク検査装置。1. An optical disc inspection apparatus for irradiating an optical disc with a light beam to record / reproduce signals to evaluate various characteristics of the optical disc. An optical disc to be inspected is set and a light beam emitted from an optical head. An inspection compartment for irradiating the optical disc to record / reproduce signals, temperature adjusting means for adjusting the ambient temperature in the inspection compartment to a predetermined temperature, and clean air in the inspection compartment. An optical disk inspecting apparatus comprising: an air cleaning unit for performing the above operation; and a measuring unit for processing a signal reproduced by the optical head to obtain characteristic data of the optical disk.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP35055593A JPH07201082A (en) | 1993-12-28 | 1993-12-28 | Optical disk inspecting device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP35055593A JPH07201082A (en) | 1993-12-28 | 1993-12-28 | Optical disk inspecting device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH07201082A true JPH07201082A (en) | 1995-08-04 |
Family
ID=18411289
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP35055593A Withdrawn JPH07201082A (en) | 1993-12-28 | 1993-12-28 | Optical disk inspecting device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH07201082A (en) |
Cited By (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004107347A1 (en) * | 2003-05-30 | 2004-12-09 | Fujitsu Limited | Optical information storage device and optical information storage system |
US8964361B2 (en) | 2010-07-21 | 2015-02-24 | Teradyne, Inc. | Bulk transfer of storage devices using manual loading |
US9001456B2 (en) | 2010-08-31 | 2015-04-07 | Teradyne, Inc. | Engaging test slots |
US9459312B2 (en) | 2013-04-10 | 2016-10-04 | Teradyne, Inc. | Electronic assembly test system |
US9779780B2 (en) | 2010-06-17 | 2017-10-03 | Teradyne, Inc. | Damping vibrations within storage device testing systems |
US10725091B2 (en) | 2017-08-28 | 2020-07-28 | Teradyne, Inc. | Automated test system having multiple stages |
US10775408B2 (en) | 2018-08-20 | 2020-09-15 | Teradyne, Inc. | System for testing devices inside of carriers |
US10845410B2 (en) | 2017-08-28 | 2020-11-24 | Teradyne, Inc. | Automated test system having orthogonal robots |
US10948534B2 (en) | 2017-08-28 | 2021-03-16 | Teradyne, Inc. | Automated test system employing robotics |
US10983145B2 (en) | 2018-04-24 | 2021-04-20 | Teradyne, Inc. | System for testing devices inside of carriers |
US11226390B2 (en) | 2017-08-28 | 2022-01-18 | Teradyne, Inc. | Calibration process for an automated test system |
US11754596B2 (en) | 2020-10-22 | 2023-09-12 | Teradyne, Inc. | Test site configuration in an automated test system |
US11754622B2 (en) | 2020-10-22 | 2023-09-12 | Teradyne, Inc. | Thermal control system for an automated test system |
US11867749B2 (en) | 2020-10-22 | 2024-01-09 | Teradyne, Inc. | Vision system for an automated test system |
US11899042B2 (en) | 2020-10-22 | 2024-02-13 | Teradyne, Inc. | Automated test system |
US11953519B2 (en) | 2020-10-22 | 2024-04-09 | Teradyne, Inc. | Modular automated test system |
US12007411B2 (en) | 2021-06-22 | 2024-06-11 | Teradyne, Inc. | Test socket having an automated lid |
-
1993
- 1993-12-28 JP JP35055593A patent/JPH07201082A/en not_active Withdrawn
Cited By (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004107347A1 (en) * | 2003-05-30 | 2004-12-09 | Fujitsu Limited | Optical information storage device and optical information storage system |
JPWO2004107347A1 (en) * | 2003-05-30 | 2006-07-20 | 富士通株式会社 | Optical information storage device and optical information storage system |
US7353526B2 (en) | 2003-05-30 | 2008-04-01 | Fujitsu Limited | Optical information storage apparatus and optical information storage system |
US9779780B2 (en) | 2010-06-17 | 2017-10-03 | Teradyne, Inc. | Damping vibrations within storage device testing systems |
US8964361B2 (en) | 2010-07-21 | 2015-02-24 | Teradyne, Inc. | Bulk transfer of storage devices using manual loading |
US9001456B2 (en) | 2010-08-31 | 2015-04-07 | Teradyne, Inc. | Engaging test slots |
US9459312B2 (en) | 2013-04-10 | 2016-10-04 | Teradyne, Inc. | Electronic assembly test system |
US11226390B2 (en) | 2017-08-28 | 2022-01-18 | Teradyne, Inc. | Calibration process for an automated test system |
US10845410B2 (en) | 2017-08-28 | 2020-11-24 | Teradyne, Inc. | Automated test system having orthogonal robots |
US10948534B2 (en) | 2017-08-28 | 2021-03-16 | Teradyne, Inc. | Automated test system employing robotics |
US10725091B2 (en) | 2017-08-28 | 2020-07-28 | Teradyne, Inc. | Automated test system having multiple stages |
US10983145B2 (en) | 2018-04-24 | 2021-04-20 | Teradyne, Inc. | System for testing devices inside of carriers |
US10775408B2 (en) | 2018-08-20 | 2020-09-15 | Teradyne, Inc. | System for testing devices inside of carriers |
US11754596B2 (en) | 2020-10-22 | 2023-09-12 | Teradyne, Inc. | Test site configuration in an automated test system |
US11754622B2 (en) | 2020-10-22 | 2023-09-12 | Teradyne, Inc. | Thermal control system for an automated test system |
US11867749B2 (en) | 2020-10-22 | 2024-01-09 | Teradyne, Inc. | Vision system for an automated test system |
US11899042B2 (en) | 2020-10-22 | 2024-02-13 | Teradyne, Inc. | Automated test system |
US11953519B2 (en) | 2020-10-22 | 2024-04-09 | Teradyne, Inc. | Modular automated test system |
US12007411B2 (en) | 2021-06-22 | 2024-06-11 | Teradyne, Inc. | Test socket having an automated lid |
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Date | Code | Title | Description |
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A300 | Withdrawal of application because of no request for examination |
Free format text: JAPANESE INTERMEDIATE CODE: A300 Effective date: 20010306 |