JPH0665804U - Contact detection probe - Google Patents

Abstract

(57) [Summary] [Object] To provide a highly accurate contact detection probe in which an error due to bending of a contactor is eliminated by restraining a movable element with respect to a fixed element not on a convergent surface but on a flat surface. [Structure] Movable pins 10, 11 and 12 extending from the center of a movable element 25 having a contactor at its tip to the outer peripheral side are provided. The fixed element 23, through which the movable element 25 is inserted, is orthogonal to the axis of the movable pin from the reference surface 27 of the fixed element to the movable pins 10, 1.
Positioning pins 13, 14 and 15 are provided so as to project from 1, 1 and 12. Further, contact pins 16, 17, 18 are provided on the reference surface to contact the movable pin to position the movable element.

Description

[Detailed description of the device]

[0001]

[Industrial applications]

 This device is a three-dimensional machine mounted on a spindle, a tool rest or a table, which makes it possible to bring the contactor into contact with the object to be detected and read its position to perform centering and dimension measurement. The present invention relates to a contact detection probe.

[0002]

[Prior art]

 Examples of this type of contact detection probe include those shown in FIGS. 5 to 8 (see Japanese Patent Publication No. 58-17402). In the contact probe main body 1, a needle-shaped body 4 extending along the central axis AA is attached to the disc portion 9, and a contactor 2 is further attached to the tip of the needle-shaped body 4. The movable element 25 is constituted by the contactor 2, the needle-shaped body 4, and the disc portion 9. As shown in FIG. 5, the contactor 2 is in the rest position when pressed by the pressing element (spring) 8 in the direction of the central axis AA of the main body 1, that is, in the direction I. Further, the contactor 2 is pressed in a direction (II direction) orthogonal to the central axis AA, or in a direction opposite to the previous I direction (I II direction), or a force generated by combining them is applied. When received, it is designed to be displaced from the rest position. The casing 6 of the fixed element 23 is attached to the main shaft 20 of the machine. Further, as shown in FIG. 8, three pins 28 extending radially from the center of the disc portion 9 of the movable element 25 are locked by two balls 24 as shown in FIG. . The fixing element 23 and the ball 24 are attached in an electrically insulated state via the insulating film 26, and when the needle-shaped body 4 is in the rest position, it is turned on to turn on the indicator lamp 30. The air circuit 29 is configured. Illumination of the indicator lamp indicates that all switches are in contact. Further, 31 is a power source.

In the conventional contact probe main body 1 illustrated above, assuming that a rigid body receives a pressing force such as gravity and is supported by, for example, three balls, a “dynamically restrained” state. Then, as shown in FIG. 10, there are 1 to 3 contact points at one place, and it is said that there are a total of 6 contact points as a result of being provided at 3 places in total. Two structures are known as a contact detection probe that applies this binding state to a positioning mechanism. That is, first, as shown as a schematic view in FIG. 6, a fixing element 23 having a converging surface 22 forming three sets of V-grooves, that is, 21a, 21b, and 21c, and a engaging element capable of engaging with each of the converging surfaces 22. A mechanism composed of a movable element (not shown) having a united body (ball) 24, and further, as shown in FIG. 7, from the converging surface 22 forming the triangular pyramid 26 and the converging surface 22 forming the V groove 21 and the reference surface 27. There is a mechanism composed of a fixed element 23 and a movable element having an engaging body (ball) 24 capable of engaging with the converging surface 22.

[0004]

[Problems to be solved by the device]

 Since the conventional contact detection probe 1 having the above structure has the converging surface 22, when the contactor 2 receives a force and starts moving from the rest position, a large force is required for the movement depending on the direction of the force received. become. For example, as shown in FIG. 8, when the movable element 25 moves in the direction perpendicular to the fixed element 23 via the pin 28, that is, in the A direction, the convergent surface 22 is not affected, but the convergent surface 22 is not affected. When moving in the direction of engaging with, that is, in the direction of B (see FIG. 10), a large force is required depending on the angle of the slope because the ball 24, which is the engaging body, slides on the slope of the converging surface 22. become. In the structure having the converging surface 22 as described above, since the force received by the contactor 2 when detecting contact is greatly different depending on the direction, the deflection of the contactor easily causes an error in the detection position.

Further, when the converging surface 22 is formed by the pin 28 or the ball 24 to determine the position of the contactor 2 as described above, the axis XX of the contactor 2 is fixed to the fixing element 23 as shown in FIG. In order to make a vertical contact with the reference plane 27 which has and to make a pause, the positions where the pins 28 and the balls 24 are fixed must be complemented each other, so that the machining accuracy of the mutual positions is strictly suppressed, or Therefore, an adjusting mechanism for the reference surface 27 is required, which complicates the structure. The present invention provides a highly accurate contact detection probe in which an error due to bending of a contactor is eliminated by restraining a movable element with respect to a fixed element not by a converging surface but by a flat surface.

[0006]

[Means for Solving the Problems]

 In the contact detection probe according to the present invention, first, a movable element having a contact at its tip is inserted into a through hole formed at the center of a fixed element incorporated in the probe body, and the movable element is attached to the movable element. Is urged in the direction of the axis of the movable element and is positioned at the contact point provided at the hole edge of the fixed element at rest, and when the contactor contacts the object to be measured, Regarding the contact detection probe that detects the deviation of the contactor by detecting the deviation of the contactor, the movable pin extending from the center of the movable element to the outer peripheral side and the movable pin protruding from the reference surface of the fixed element orthogonal to the axis of the movable pin. A contact point is provided which is provided with a positioning pin to be provided and a contact pin which is provided laterally on a flat surface of the fixed element and which abuts the movable pin to position the movable element. Further, the second consideration is to provide an electric circuit that communicates with the contacts of each set.

[0007]

[Action]

 Each contact point does not have a converging surface, but contacts the reference surface and a surface standing upright from the reference surface, and smoothly shifts from the rest state to the deviation state. In addition, the force that can detect the movement of the contactor does not vary greatly depending on the direction, and it operates smoothly in any direction.

[0008]

【Example】

 Next, an embodiment of this invention will be described with reference to FIGS. FIG. 1 shows a cross section of a contact detection probe according to the present invention, FIG. 2 shows a relationship between a fixed element 23 and a movable element 25 as seen from the line II-II of FIG. 1, and FIG. 3 shows a wiring state of FIG. Indicates. A screw portion 5 is provided at the rear end of the contact detection probe main body 1, and the screw portion 5 is screwed into the main shaft of a machine (not shown). The fixing element 23 incorporated in the casing 6 has a through hole 7 formed in the center thereof, and the movable element 25 integrated with the needle-shaped body 4 having the contactor 2 at the tip is inserted into the through hole 7. It The movable element 25 is biased outward (Z direction in FIG. 1) by the spring 8 built in the contact probe body 1.

The disk portion 9 provided at the rear end of the movable element 25 has a first movable portion extending radially outward along a straight line AA passing through the center O as shown in the schematic view of FIG. The pin 10 is projectingly provided, and on the other side, a second movable pin 11 and a third movable pin 12 are outwardly projecting along a line BB orthogonal to the straight line AA. At the hole edge portion 3 (see FIGS. 1 and 2) of the fixing element 23, there are three reference surfaces 27a defined in a U-shaped cross section (see FIG. 2B) facing the first to third movable pins. 27b and 27c are recessed. A first locating pin 13, a second locating pin 14, and a third locating pin 15 are provided so as to vertically project from the reference planes 27a, 27b, and 27c, respectively. The movable pins come into contact with the positioning pins to form three contacts 33a, 33b, 33c, which prevent the disc portion 9 from moving counterclockwise in FIG.

The three contacts 33a, 33b, 33c constrain the movable element 25 in a parallel direction by the rotation direction and the reference surfaces 27a, 27b, 27c. A spring 8 for urging the movable element 25 outward (Z direction shown in FIG. 1) is mounted so as to obtain a component force in the Y direction (radial direction shown in FIG. 2) and the Z direction. Therefore, the movable element 25 is restrained in the rest position with respect to the fixed element 23.

Further, on the reference surfaces 27 a, 27 b, 27 c of the fixing element 23, the first contact pin 16, the second contact pin 17, and the third contact pin 18 are arranged along the reference surfaces, respectively. Are provided laterally, and each contact pin maintains parallelism with the reference plane. Therefore, on each of the reference planes, the first to third movable pins 10, 11 and 12 have the first to third positioning pins 13, 14 and 15 and the first to third contact pins 16, respectively. 17 and 18 are contacted via the contact points 33a, 33b and 33c and the contact points 34a, 34b and 34c. As a result, there are a total of 6 contact points on the 3 reference planes.

Further, the first to third movable pins 10, 11, 12 and the first to third positioning pins 13, 14, 15 and the first to third contact pins 16, 17, 18 are provided. Each of them is attached to the fixed element 23 and the movable element 25 via an insulator (not shown). Then, as shown in FIG. 3, by connecting 19 to the power supply 31 and then connecting the contact parts 32a, 32b, 32c, the lamp 30 showing the conductive state is lit at the rest position (neutral position). I am doing it. A rubber seal 37 is attached between the circumferential groove 36 provided on the shaft 35 of the movable element 25 and the fixed element 23, and a lid biased by a spring 38 is attached to the outer peripheral surface of the shaft 35. The inner peripheral surface of the body 40 is in sliding contact with the casing 39 to close the opening 39 to prevent foreign matter such as water, oil and dust from entering from the outside. In addition, as shown in FIG. 4, in comparison with the embodiment shown in FIGS. 1 to 3, the fixing element 23 is replaced with a flat surface 41 instead of the abutment pins 16, 17, 18 and the positioning pins 13, 14, 15. An example in which the wall surface 42 is provided is shown.

When a force is applied to the contactor 2 provided at the tip of the needle-shaped body 4 from the outside and the contactor 2 is displaced, the force that can detect the contact is in the direction when the contact state shifts from the rest state to the displacement state. It does not differ much from the above and will move lightly. Any of the above 6 contacts will come out of contact. Therefore, the circuit constituted by the connection 29 is cut off, and the circuit state can be extracted and used as an electric signal.

[0014]

[Effect of device]

 According to this invention, since the six contacts forming the electric circuit have no converging surface and are composed of the reference surface and the surface standing upright from the reference surface as described above, the transition from the rest state to the deviation state is made. In this case, the force that can detect the contact does not vary greatly depending on the direction, and the user can move lightly. Therefore, the error in the detection position is small and it is possible to detect with a small error. Moreover, since the respective planes for restraining the movable element 25 in the rest position do not affect the mutual positions, they have excellent effects such as easy processing.

[Brief description of drawings]

FIG. 1 is a sectional view of an embodiment of the present invention.

FIG. 2A is a front view of a contact portion viewed from the line II-II in FIG. 1, and B is a partial side view of the contact portion viewed from the direction F in FIG.

FIG. 3 is a front view of a contact portion showing a case where electrical connection is performed in FIG.

FIG. 4 is a schematic view of a main part of the present invention, where A is a front view, B is a cross-sectional view seen from the direction of arrow L, and C is a cross-sectional view seen from the direction of arrow M.

FIG. 5 is a schematic view of a general contact detection probe.

6A and 6B show a conventional contact detection probe, in which A is a front view and B is a cross-sectional view taken along the line EE in FIG.

7A and 7B show another conventional contact detection probe, in which A is a front view and B is a cross-sectional view taken along the line A-B of FIG.

FIG. 8 is a cross-sectional view of a conventional contact detection probe.

9 is a sectional view taken along line IX-IX in FIG.

10 is a partial cross-sectional view taken along line XX of FIG.

[Explanation of symbols]

 1 Contact Probe Main Body 2 Contact Element 7 Through Hole 10 Movable Pin 11 Movable Pin 12 Movable Pin 13 Positioning Pin 14 Positioning Pin 15 Positioning Pin 16 Abutment Pin 17 Abutment Pin 18 Abutment Pin 23 Fixed Element 25 Movable Element 27 Reference Surface

Claims (2)

[Scope of utility model registration request] 1. A movable element having a contact at its tip is inserted into a through hole formed at the center of a fixed element incorporated in a probe body, and the movable element is biased in the direction of the axis of the probe body. At the same time, it is positioned at the contact provided on the edge of the hole of the fixed element at rest, and when the contactor comes into contact with the object to be measured, the detachment of the movable element from the fixed element is detected and In a contact detection probe that detects shake, a movable pin extending from the center of the movable element to the outer peripheral side, a positioning pin that is orthogonal to the axis of the movable pin and protrudes from the reference surface of the fixed element to the movable pin, and is further fixed. 1. A contact detection probe, which is provided laterally on a reference surface of an element, and which has a contact point protruding from an abutment pin that abuts the movable pin to position the movable element. 2. The contact detection probe according to claim 1, further comprising an electric circuit communicating with the contact portions of each set.