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JPH0653113A - Scanning projection aligner - Google Patents

Scanning projection aligner

Info

Publication number
JPH0653113A
JPH0653113A JP4204638A JP20463892A JPH0653113A JP H0653113 A JPH0653113 A JP H0653113A JP 4204638 A JP4204638 A JP 4204638A JP 20463892 A JP20463892 A JP 20463892A JP H0653113 A JPH0653113 A JP H0653113A
Authority
JP
Japan
Prior art keywords
scanning
mask
substrate
mirror
optical system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4204638A
Other languages
Japanese (ja)
Inventor
Toshiyuki Watanabe
利幸 渡辺
Masaki Suzuki
正樹 鈴木
Yoshio Mochida
省郎 持田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP4204638A priority Critical patent/JPH0653113A/en
Publication of JPH0653113A publication Critical patent/JPH0653113A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70358Scanning exposure, i.e. relative movement of patterned beam and workpiece during imaging
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70791Large workpieces, e.g. glass substrates for flat panel displays or solar panels

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Sustainable Development (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

PURPOSE:To expose a large substrate easily and to eliminate a pattern distortion caused by yawing and rolling in scanning, in a scanning projection aligner which is used for manufacturing a semiconductor and a substrate of a liquid crystal display. CONSTITUTION:This equipment is constituted of a device for casting light from a light source 8 on a mask 11, two concave mirrors 13 and 15, one plane mirror 12, one convex mirror 14 and one right and left reversal mirror 16. This equipment has a 1:1 erect projection optical system which projects a pattern of the mask 11 on a substrate 17, a mechanism for holding the mask 11 and the substrate 17 without changing a relative position of the two, and a scanning device for letting this holding device make a scanning as one body.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体や液晶表示装置
基板の製造などに用いられる走査投影露光装置に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a scanning projection exposure apparatus used for manufacturing semiconductors or liquid crystal display device substrates.

【0002】[0002]

【従来の技術】一般に半導体や液晶表示装置基板などの
製造においては走査投影露光装置により露光処理をして
いる。
2. Description of the Related Art Generally, in manufacturing semiconductors, liquid crystal display substrates, etc., exposure processing is performed by a scanning projection exposure apparatus.

【0003】図7は、従来の走査投影露光装置の概略構
成を示すものである。図中の1は照明光学系であり、水
銀灯1aと各種の光学部品を備え、水銀灯1aより円弧
スリット1bを通してマスク2に、図8に示すような円
弧状照明光を照射するようにしている。
FIG. 7 shows a schematic structure of a conventional scanning projection exposure apparatus. Reference numeral 1 in the drawing is an illumination optical system, which is provided with a mercury lamp 1a and various optical parts, and the arc illumination light as shown in FIG. 8 is applied to the mask 2 from the mercury lamp 1a through the arc slit 1b.

【0004】円弧状に照明されたマスク2のパターン
は、台形ミラー3、凹面鏡4、および凸面鏡5で構成さ
れる投影光学系を経て、基板6植えに投影される。した
がって、基板6上に投影される像の領域は円弧状とな
る。前記マスク2はキャリッジ7の上端に、また基板6
はキャリッジ7の下端に保持されており、キャリッジ7
をB方向に走査することにより、マスク2上の全パター
ンを基板6上に露光するようなっている。
The pattern of the mask 2 illuminated in an arc shape is projected on the substrate 6 through a projection optical system composed of a trapezoidal mirror 3, a concave mirror 4 and a convex mirror 5. Therefore, the area of the image projected on the substrate 6 has an arc shape. The mask 2 is provided on the upper end of the carriage 7 and the substrate 6
Is held at the lower end of the carriage 7,
By scanning in the B direction, the entire pattern on the mask 2 is exposed on the substrate 6.

【0005】[0005]

【発明が解決しようとする課題】しかしながら、上記の
ような構成では、大型基板を露光する場合、露光エリア
全面をカバーするためにおおよそ基板幅の2倍程度の直
径を持つ大口径凹面鏡などの大型光学部品を必要とする
ため製作が難しく高価である。さらには、倒立光学系で
あるため、キャリッジの直線走査のヨーイングおよび横
振れが露光のパターン歪となってしまうという問題点を
有していた。
However, in the above structure, when exposing a large-sized substrate, a large-sized concave mirror such as a large-diameter concave mirror having a diameter of about twice the width of the substrate is necessary to cover the entire exposure area. Since optical parts are required, it is difficult to manufacture and expensive. Further, since it is an inverted optical system, there is a problem that the yawing and lateral shake of the linear scanning of the carriage cause the pattern distortion of the exposure.

【0006】本発明は、上記問題点に鑑み、製作が容易
で、低コストであり、大型基板の露光が簡単に行え、走
査のヨーイングや横振れがパターン歪とならない走査投
影露光装置を提供することを目的とするものである。
In view of the above problems, the present invention provides a scanning projection exposure apparatus which is easy to manufacture, low in cost, easy to expose a large substrate, and free from yawing of scanning and lateral shake causing pattern distortion. That is the purpose.

【0007】[0007]

【課題を解決するための手段】上記目的を達成するため
に本発明の走査投影露光装置は、光源と、その光をマス
クに照射する手段と、2個の凹面鏡と1個の平面鏡と1
個の凸面鏡と1個の左右反転鏡により構成され、前記マ
スクのパターンを基板に投影するに1正立投影光学系
と、前記マスクおよび基板を相対位置を変えずに保持す
る保持機構と、前記保持機構を一体的に走査運動させる
走査手段とを備えた構成とするものである。
To achieve the above object, a scanning projection exposure apparatus according to the present invention comprises a light source, a means for irradiating a mask with the light, two concave mirrors, and one plane mirror.
An upright projection optical system for projecting the pattern of the mask onto a substrate, a holding mechanism for holding the mask and the substrate without changing their relative positions, The holding mechanism is configured to include a scanning unit that integrally performs a scanning movement.

【0008】[0008]

【作用】上記した構成において、マスクおよび基板を相
対位置を変えずに走査運動させることにより、光を照射
されたマスクの部分パターンの像を基板全面にわたって
1:1に投影露光する。そして1:1正立投影光学系を
用いるため、走査のヨーイングや横振れがパターン歪と
ならないこととなる。
In the above structure, the mask and the substrate are moved in a scanning manner without changing their relative positions, so that the image of the partial pattern of the mask irradiated with light is projected and exposed at a ratio of 1: 1 over the entire surface of the substrate. Since the 1: 1 erecting projection optical system is used, scanning yawing and lateral shake do not cause pattern distortion.

【0009】[0009]

【実施例】以下、本発明の走査投影露光装置について、
図1〜図4を参照しながら説明する。
Embodiments of the scanning projection exposure apparatus of the present invention will be described below.
This will be described with reference to FIGS.

【0010】図1は、本発明の第1の実施例の走査投影
露光装置である。図中の8は光源である水銀灯であり、
この水銀灯8の光を反射するように熱線透過型の楕円面
反射鏡9を関係づけている。楕円面反射鏡9で反射され
た光は集光光学系10を介して、マスク11に投射され
るようになっている。マスクのパターン情報を含んだ光
は平面鏡12、凹面鏡13、凸面鏡14、凹面鏡15、
左右反転鏡16を介して基板17に投射されるようにな
っている。すなわち前記の12〜16で1:1正立投影
光学系を構成している。この1:1正立投影光学系は図
4に示すように、O2 は、凸面鏡14の光軸33上に位
置する凸面鏡14の曲率半径rの中心となっており、前
記凹面鏡13および15は、曲率半径Rが等しくかつ曲
率半径の中心がO1 の位置で一致するが、O1 は前記凸
面鏡の光軸33上からわずかだけずらした位置に配置さ
れている。
FIG. 1 shows a scanning projection exposure apparatus according to the first embodiment of the present invention. 8 in the figure is a mercury lamp as a light source,
A heat ray transmissive elliptical reflecting mirror 9 is associated so as to reflect the light of the mercury lamp 8. The light reflected by the elliptical reflecting mirror 9 is projected onto the mask 11 via the condensing optical system 10. The light including the mask pattern information is reflected by the plane mirror 12, the concave mirror 13, the convex mirror 14, the concave mirror 15,
The image is projected on the substrate 17 via the left / right reversing mirror 16. That is, the above 12 to 16 constitute a 1: 1 erecting projection optical system. In this 1: 1 erecting projection optical system, as shown in FIG. 4, O 2 is at the center of the radius of curvature r of the convex mirror 14 located on the optical axis 33 of the convex mirror 14, and the concave mirrors 13 and 15 are , The radii of curvature R are equal and the centers of the radii of curvature coincide at the position of O 1 , but O 1 is arranged at a position slightly displaced from the optical axis 33 of the convex mirror.

【0011】前記マスク11は支持部材18に支持固定
されており、前記基板17は支持部材19で支持固定さ
れている。そしてこれに支持部材18,19は回転軸2
0に一体的に固定されている。前記回転軸20は、キャ
リッジ23に回転軸受22により回転可能に取り付けら
れている。前記回転軸20はモータ21で回転させられ
るようになっており、前記キャリッジ23は別のモータ
24によりボールねじ34を介してX方向に直動駆動さ
れるようになっている。
The mask 11 is supported and fixed to a supporting member 18, and the substrate 17 is supported and fixed to a supporting member 19. The support members 18 and 19 are attached to the rotary shaft 2
It is fixed integrally to 0. The rotary shaft 20 is rotatably attached to a carriage 23 by a rotary bearing 22. The rotary shaft 20 is rotated by a motor 21, and the carriage 23 is directly driven in the X direction by another motor 24 via a ball screw 34.

【0012】なお図2は、図1のCC断面図であり、2
5は前記集光光学系10から照射された、マスク11上
の照明スポットである。図3は、前記左右反転鏡の作用
説明図であり、図2および図3におけるRは、光学系内
での像の向きを表現するための記号である。
2 is a sectional view taken along the line CC of FIG.
Reference numeral 5 is an illumination spot on the mask 11 irradiated from the condensing optical system 10. FIG. 3 is a diagram for explaining the action of the left-right inverting mirror, and R in FIGS. 2 and 3 is a symbol for expressing the direction of an image in the optical system.

【0013】以上のように構成された走査投影露光装置
についてその動作を説明する。水銀灯8から出た光は、
楕円面反射鏡9および集光光学系10により集光され、
マスク11の下面上に照明スポット25を形成する。照
明スポット25内のマスクパターン情報を含んだ光は、
次に平面鏡12で反射して凹面鏡13、凸面鏡14、凹
面鏡15、左右反転鏡16を経て、基板17の上面に前
記マスク11の部分パターンの像を結ぶ。このとき、図
2で示される照明スポット25内のマスクパターンは、
凹面鏡15で反射した後は図3で示されるように左右が
反転しており、左右反転鏡16により正立像に変換して
基板17上に投影される。前記マスク11および基板1
7は、支持部材18,19および回転軸20により相対
位置が変化しないよう一体的に支持されており、モータ
21によりθ方向に回転走査されると同時にモータ24
によりX方向に直線走査される。したがって、照明スポ
ット25はマスク11の全面を走査し、基板17上には
マスク11の全パターンが露光されることになる。ま
た、本実施例では図1、図2に示すように、マスク1
1、基板17を同時に複数処理できるよう構成されてい
る。
The operation of the scanning projection exposure apparatus configured as above will be described. The light emitted from the mercury lamp 8
The light is condensed by the elliptical reflecting mirror 9 and the condensing optical system 10,
An illumination spot 25 is formed on the lower surface of the mask 11. The light including the mask pattern information in the illumination spot 25 is
Next, the image of the partial pattern of the mask 11 is formed on the upper surface of the substrate 17 after being reflected by the plane mirror 12 and passing through the concave mirror 13, the convex mirror 14, the concave mirror 15, and the left / right reversing mirror 16. At this time, the mask pattern in the illumination spot 25 shown in FIG.
After being reflected by the concave mirror 15, the right and left are inverted as shown in FIG. 3, and the left and right reversing mirror 16 converts the image into an erect image and projects it on the substrate 17. The mask 11 and the substrate 1
7 is integrally supported by the supporting members 18 and 19 and the rotary shaft 20 so that the relative position does not change. The motor 21 is rotationally scanned in the θ direction at the same time as the motor 24.
Is scanned linearly in the X direction. Therefore, the illumination spot 25 scans the entire surface of the mask 11, and the entire pattern of the mask 11 is exposed on the substrate 17. In addition, in this embodiment, as shown in FIGS.
1. It is configured so that a plurality of substrates 17 can be processed at the same time.

【0014】また、図4に示すように、凹面鏡13,1
5の曲率半径の中心O1 を凸面鏡の光軸からわずかずら
すことにより、投影光学系の非点隔差を小さくでき、焦
点深度を大きくすることができる。
Further, as shown in FIG. 4, concave mirrors 13, 1
By slightly shifting the center O 1 of the radius of curvature 5 from the optical axis of the convex mirror, the astigmatic difference of the projection optical system can be reduced and the depth of focus can be increased.

【0015】以上のように、本実施例によれば、光源
と、その光をマスクに照射する手段と、2個の凹面鏡と
1個の平面鏡と1個の凸面鏡と1個の左右反転鏡よりな
り、前記マスクのパターンを基板に投影する1:1正立
投影光学系と、前記マスクおよび基板を相対位置を変え
ずに保持する保持機構と、前記保持機構を一体的に走査
運動させる回転走査機構および直線走査機構を備えたこ
とにより、以下のような優れた効果を有する。
As described above, according to this embodiment, the light source, the means for irradiating the light on the mask, the two concave mirrors, the one plane mirror, the one convex mirror, and the one left-right reversing mirror are used. 1: 1 erecting projection optical system for projecting the mask pattern onto the substrate, a holding mechanism for holding the mask and the substrate without changing their relative positions, and a rotary scan for integrally scanning the holding mechanism. The provision of the mechanism and the linear scanning mechanism has the following excellent effects.

【0016】1)投影光学系および照明光学系を構成す
る光学部品は、小さなものでよいので、製作が容易で安
価である。 2)露光の領域が光学系の大きさに制限されず、また、
非点隔差が小さく焦点深度が大きいので、大型基板の投
影露光が容易に行える。
1) Since the optical parts constituting the projection optical system and the illumination optical system may be small, they are easy to manufacture and inexpensive. 2) The exposure area is not limited to the size of the optical system, and
Since the astigmatic difference is small and the depth of focus is large, projection exposure of a large substrate can be easily performed.

【0017】3)1度に複数の基板を処理できるので、
生産性が高い。 4)1:1正立投影光学系であるため、走査のヨーイン
グおよび横振れが露光のパターン歪とならない。
3) Since a plurality of substrates can be processed at one time,
High productivity. 4) Since it is a 1: 1 erecting projection optical system, scanning yawing and lateral shake do not cause exposure pattern distortion.

【0018】次に本発明の第2の実施例について図5お
よび図6を参照しながら説明する。図5は、本発明の第
2の実施例における走査投影露光装置である。この実施
例において、照明光学系(8〜10)および1:1正立
投影光学系(12〜16)は第1の実施例と全く同様で
ある。そして、この実施例の特徴的構成は、マスク26
と基板27を相対位置を変えずに一体的に支持している
コ字状の支持部材を用いたこと、モーター30により図
6のY方向に直線駆動されるYステージ29と、モータ
32により図6のX方向に直線駆動されるXステージ3
1を設けたことにある。図中の25は前記マスク26の
下面上に照射された照明スポットである。
Next, a second embodiment of the present invention will be described with reference to FIGS. FIG. 5 shows a scanning projection exposure apparatus according to the second embodiment of the present invention. In this embodiment, the illumination optical system (8-10) and the 1: 1 erecting projection optical system (12-16) are exactly the same as those in the first embodiment. The characteristic structure of this embodiment is that the mask 26
Using a U-shaped support member that integrally supports the substrate 27 and the substrate 27 without changing their relative positions, a Y stage 29 that is linearly driven in the Y direction of FIG. X stage 3 which is linearly driven in the X direction of 6
1 is provided. Reference numeral 25 in the drawing denotes an illumination spot irradiated on the lower surface of the mask 26.

【0019】以上のように構成された走査投影露光装置
についてその動作を説明する。照明光学系(8〜10)
および1:1正立投影光学系(12〜16)について
は、第1の実施例と全く同様である。前記マスク26お
よび基板27は、支持部材28で、相対位置が変化しな
いよう一体的に支持されており、モータ30、ボールね
じ35およびモータ32、ボールねじ36によりY,X
方向に直線走査される。たとえば図6のように、X,Y
方向に交互に走査運動させれば渦巻状の走査となり、前
記照明スポット25はマスク26の全面を走査し、基板
27上にはマスク26の全パターンが露光されることに
なる。
The operation of the scanning projection exposure apparatus configured as above will be described. Illumination optical system (8-10)
The 1: 1 erecting projection optical system (12 to 16) is exactly the same as in the first embodiment. The mask 26 and the substrate 27 are integrally supported by a supporting member 28 so that their relative positions do not change. The motor 30, the ball screw 35 and the motor 32, and the ball screw 36 are used for Y, X.
Is scanned linearly in the direction. For example, as shown in FIG. 6, X, Y
When the scanning motion is alternately performed in the direction, a spiral scanning is performed, the illumination spot 25 scans the entire surface of the mask 26, and the entire pattern of the mask 26 is exposed on the substrate 27.

【0020】以上のように、本実施例によれば、光源8
と、その光をマスク26に照射する手段と、2個の凹面
鏡13,15と1個の平面鏡12と1個の凸面鏡14と
1個の左右反転鏡16により構成される1:1正立投影
光学系と、前記マスク26および基板27を相対位置を
変えずに保持する保持機構と、前記保持機構を一体的に
走査運動させる2つの直線走査機構を備えたことによ
り、本発明の第1の実施例とほぼ同様の効果が得られる
他に、大型基板の露光を行う場合でも装置が小さくす
み、安価で製作できるという特有の効果を有する。
As described above, according to this embodiment, the light source 8
And a means for irradiating the light to the mask 26, and a 1: 1 upright projection composed of two concave mirrors 13 and 15, one plane mirror 12, one convex mirror 14 and one left-right reversing mirror 16. The optical system, the holding mechanism that holds the mask 26 and the substrate 27 without changing their relative positions, and the two linear scanning mechanisms that integrally perform the scanning movement of the holding mechanism are provided. In addition to the effects similar to those of the embodiment, there is a peculiar effect that the device can be made small and can be manufactured at low cost even when exposing a large substrate.

【0021】なお第1、第2の実施例において、照明ス
ポット25を形成するのに楕円面反射鏡9と屈折光学系
よりなる集光光学系10を用いているが、要は光源であ
る水銀灯8の光をマスク11,26の下面上に集光させ
ればよく、他の光学部品を用いても同様の効果を奏す
る。
In the first and second embodiments, the converging optical system 10 including the elliptical reflecting mirror 9 and the refracting optical system is used to form the illumination spot 25. The point is that the mercury lamp which is the light source is used. The light of No. 8 may be condensed on the lower surfaces of the masks 11 and 26, and the same effect can be obtained by using other optical components.

【0022】また、第1、第2の実施例において、光源
は水銀灯としているが、たとえばエキシマレーザー光
源、キセノンランプ、太陽光など、他の光源でも全く同
様の効果を奏する。
Further, in the first and second embodiments, the light source is a mercury lamp, but other light sources such as an excimer laser light source, a xenon lamp, and sunlight can achieve the same effect.

【0023】また、第1、第2の実施例において、光学
系(8〜16)を固定してマスク11,26と基板1
7,27を一体的に走査運動させているが、逆にマスク
と基板を固定して光学系を走査運動させても全く同様の
効果を奏する。
In the first and second embodiments, the optical system (8 to 16) is fixed and the masks 11 and 26 and the substrate 1 are fixed.
Although 7 and 27 are integrally moved in a scanning manner, the same effect can be obtained even if the mask and the substrate are fixed and the optical system is moved in a scanning manner.

【0024】また、第1の実施例で、マスク11と基板
17を4組としているが、これは1組あるいは4以外の
複数でもよい。また、第1、第2の実施例において、マ
スク11,26と基板16,27は機械的に結合されて
一体的に走査運動しているが、これはたとえば複数の駆
動系により別々に走査運動させ、電気的に同期させても
同様の効果が得られる。
Further, in the first embodiment, the mask 11 and the substrate 17 are four sets, but this may be one set or a plurality other than four. In addition, in the first and second embodiments, the masks 11 and 26 and the substrates 16 and 27 are mechanically coupled and integrally perform the scanning movement. For example, the scanning movements are separately performed by a plurality of drive systems. Then, the same effect can be obtained even if they are electrically synchronized.

【0025】[0025]

【発明の効果】以上の実施例の説明より明らかなよう
に、本発明の走査投影露光装置は、光源と、その光をマ
スクに照射する手段と、2個の凹面鏡と1個の平面鏡と
1個の凸面鏡と1個の左右反転鏡により構成され、マス
クパターンを基板に投影する1:1正立投影光学系と、
前記マスクおよび基板を相対位置を変えずに保持する保
持機構と、前記保持機構または光学系を一体的に走査運
動させる走査手段とを備えたことにより、小型の光学部
品で構成でき、製作が容易で安価であり、大型基板の露
光が容易に行え、また、1:1正立投影光学系を用いる
ため、走査のヨーイングや横振れがパターン歪とならな
いという優れた効果が得られる。
As is apparent from the above description of the embodiments, the scanning projection exposure apparatus of the present invention includes a light source, a means for irradiating the mask with the light, two concave mirrors and one plane mirror. 1: 1 erecting projection optical system that is composed of one convex mirror and one left / right reversing mirror and projects the mask pattern onto the substrate,
Since the holding mechanism for holding the mask and the substrate without changing the relative position and the scanning means for integrally performing the scanning movement of the holding mechanism or the optical system, it is possible to configure with a small optical component and easy to manufacture. It is inexpensive and can easily expose a large substrate. Moreover, since a 1: 1 erecting projection optical system is used, an excellent effect that scanning yawing and lateral shake do not cause pattern distortion can be obtained.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1の実施例の走査投影露光装置の構
成図
FIG. 1 is a configuration diagram of a scanning projection exposure apparatus according to a first embodiment of the present invention.

【図2】図1のC−C断面矢視図FIG. 2 is a cross-sectional view taken along the line CC of FIG.

【図3】左右反転鏡の説明図FIG. 3 is an explanatory diagram of a left-right reversing mirror.

【図4】凹面鏡と凸面鏡の配置図FIG. 4 is a layout diagram of a concave mirror and a convex mirror.

【図5】本発明の第2の実施例の走査投影露光装置の構
成図
FIG. 5 is a configuration diagram of a scanning projection exposure apparatus according to a second embodiment of the present invention.

【図6】図5のD−D断面矢視図6 is a sectional view taken along the line DD in FIG.

【図7】従来の走査投影露光装置の1例を示す構成図FIG. 7 is a block diagram showing an example of a conventional scanning projection exposure apparatus.

【図8】同露光パターンを示す平面図FIG. 8 is a plan view showing the same exposure pattern.

【符号の説明】[Explanation of symbols]

8 水銀灯(光源) 11 マスク 12 平面鏡 13,15 凹面鏡 14 凸面鏡 16 左右反転鏡 17 基板 18,19 支持部材 23 キャリッジ 8 Mercury Lamp (Light Source) 11 Mask 12 Plane Mirror 13,15 Concave Mirror 14 Convex Mirror 16 Horizontal Inversion Mirror 17 Substrate 18,19 Supporting Member 23 Carriage

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 光源と、その光をマスクに照射する手段
と、2個の凹面鏡と1個の平面鏡と1個の凸面鏡と1個
の左右反転鏡により構成され、マスクのパターンを基板
に投影する1:1正立投影光学系と、前記マスクおよび
基板を相対位置を変えずに保持する保持機構と、前記保
持機構または光学系を一体的に走査運動させる走査手段
よりなる走査投影露光装置。
1. A light source, means for irradiating the light to a mask, two concave mirrors, one plane mirror, one convex mirror and one left-right reversing mirror, and the mask pattern is projected onto a substrate. A scanning projection exposure apparatus comprising a 1: 1 erecting projection optical system, a holding mechanism for holding the mask and the substrate without changing their relative positions, and a scanning means for integrally scanning the holding mechanism or the optical system.
【請求項2】 1:1正立投影光学系において、2つの
凹面鏡の曲率が等しく、かつ曲率中心が合致するように
配置され、前記2つの凹面鏡の曲率中心が凸面鏡の光軸
上に位置しないように配置された請求項1記載の走査投
影露光装置。
2. In a 1: 1 erecting projection optical system, two concave mirrors are arranged such that their curvatures are equal and their centers of curvature match, and the centers of curvature of said two concave mirrors are not located on the optical axis of the convex mirror. 2. The scanning projection exposure apparatus according to claim 1, wherein the scanning projection exposure apparatus is arranged as described above.
【請求項3】 走査手段が、回転運動系と直線運動系に
より構成された請求項1記載の走査投影露光装置。
3. The scanning projection exposure apparatus according to claim 1, wherein the scanning means comprises a rotary motion system and a linear motion system.
【請求項4】 走査手段が、直交する2つの直線運動系
により構成された請求項1記載の走査投影露光装置。
4. The scanning projection exposure apparatus according to claim 1, wherein the scanning means is composed of two orthogonal linear motion systems.
JP4204638A 1992-07-31 1992-07-31 Scanning projection aligner Pending JPH0653113A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4204638A JPH0653113A (en) 1992-07-31 1992-07-31 Scanning projection aligner

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4204638A JPH0653113A (en) 1992-07-31 1992-07-31 Scanning projection aligner

Publications (1)

Publication Number Publication Date
JPH0653113A true JPH0653113A (en) 1994-02-25

Family

ID=16493797

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4204638A Pending JPH0653113A (en) 1992-07-31 1992-07-31 Scanning projection aligner

Country Status (1)

Country Link
JP (1) JPH0653113A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5729331A (en) * 1993-06-30 1998-03-17 Nikon Corporation Exposure apparatus, optical projection apparatus and a method for adjusting the optical projection apparatus
US6157497A (en) * 1993-06-30 2000-12-05 Nikon Corporation Exposure apparatus
KR100374910B1 (en) * 1994-07-29 2003-05-09 가부시키가이샤 니콘 Exposure device
JP2008233932A (en) * 2003-06-30 2008-10-02 Asml Holding Nv Exposure system for manufacturing flat panel display, and unit magnification ring-shaped optical system for manufacturing flat panel display
CN104864241A (en) * 2015-05-28 2015-08-26 周子涵 Swinging moving displayer platform

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5729331A (en) * 1993-06-30 1998-03-17 Nikon Corporation Exposure apparatus, optical projection apparatus and a method for adjusting the optical projection apparatus
US6157497A (en) * 1993-06-30 2000-12-05 Nikon Corporation Exposure apparatus
US6351305B1 (en) 1993-06-30 2002-02-26 Nikon Corporation Exposure apparatus and exposure method for transferring pattern onto a substrate
US6480262B1 (en) 1993-06-30 2002-11-12 Nikon Corporation Illumination optical apparatus for illuminating a mask, method of manufacturing and using same, and field stop used therein
US6509954B1 (en) 1993-06-30 2003-01-21 Nikon Corporation Aperture stop having central aperture region defined by a circular ARC and peripheral region with decreased width, and exposure apparatus and method
US6556278B1 (en) 1993-06-30 2003-04-29 Nikon Corporation Exposure/imaging apparatus and method in which imaging characteristics of a projection optical system are adjusted
US6795169B2 (en) 1993-06-30 2004-09-21 Nikon Corporation Exposure apparatus, optical projection apparatus and a method for adjusting the optical projection apparatus
KR100374910B1 (en) * 1994-07-29 2003-05-09 가부시키가이샤 니콘 Exposure device
JP2008233932A (en) * 2003-06-30 2008-10-02 Asml Holding Nv Exposure system for manufacturing flat panel display, and unit magnification ring-shaped optical system for manufacturing flat panel display
CN104864241A (en) * 2015-05-28 2015-08-26 周子涵 Swinging moving displayer platform

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