JPH06186324A - Light source means - Google Patents

Abstract

PURPOSE:To provide optimum measurement light for a light wave range finder by causing multiple semiconductor light sources to emit light beams, whose center wavelength intervals in respective emission areas are not constant in multiple special areas, and by combining emitted light beams, so that the problem of narrowness and coherency of emission spectrum is solved. CONSTITUTION:By driving a light source 1 consisting of semiconductor lasers 101-103, reference modulation light whose central wavelengths are lambda1-lambda3 is combined at the end of optical fibers 811-813 through condenser lenses 1011-1013. The modulated light, combined together by an optical fiber 81 is sent to a division prism 41 through a condenser lens 2 and an emission side fiber 82, and the modulated light that passes through a half mirror 411 is inputted into an external range-finding light path or an internal range-finding light path through a light path switching chopper 5. If the modulated light is inputted into a range-finding light path, the modulated light is outputted outside through a prism 9 and an objective lens 10, and the reflected light from a corner cubs 11 is combined into PAD 71 through the lens 10, prism 9, division prism 42 and a photo-detection side fiber 83, and then converted into electric current pulses by a photo-detection element.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a light source means constituted so that a light source section emits light in a plurality of spatial light emitting regions.
By making the center wavelength interval of each light emitting region non-uniform,
The present invention relates to a light source means that can reduce coherence and is most suitable for a light distance meter.

[0002]

2. Description of the Related Art A conventional lightwave distance meter uses a light emitting diode, receives an echo pulse reflected from a corner cube as an object to be measured, and measures the distance from the reception time of the light pulse. Therefore, the maximum measurable distance of the lightwave rangefinder is determined by the brightness of the light source unit, and the maximum measurable distance of the lightwave rangefinder using the light emitting diode is 2-3 km.
It was about.

In order to extend the maximum measurable distance,
It is conceivable to employ a semiconductor laser with high brightness. The continuous-emitting semiconductor laser has a size and power consumption that are comparable to those of a conventional light-emitting diode, can be directly modulated by a drive current, and can be easily replaced with a light-emitting diode. Further, since the continuous emission semiconductor laser has a faster light emission response speed than the light emitting diode, there is a possibility that a highly accurate lightwave distance meter with a higher modulation frequency can be realized.

Further, the semiconductor pulse laser has a different distance measuring method from the conventional light wave range finder using a continuous wave semiconductor laser, but since it has a large peak power, it increases the maximum measurable distance and does not use a corner cube. The feature is that prism measurement can be performed.

[0005]

However, the above-mentioned conventional light-wave rangefinder, whichever type using a continuous oscillation semiconductor laser or a semiconductor pulse laser, is compared with a light-wave rangefinder using a light emitting diode. There are problems that the emission spectrum is narrow and the coherence is high.

[0006] Here, the light wave distance meter has a high required resolution of 1 mm or less with respect to the modulation frequency of the light source section or the emission pulse width. Converting a distance of 1 mm into the time difference of a lightwave rangefinder,

1 mm / C * 2 = 6.6 psec (1)

However, C is the speed of light.

[0009] On the other hand, the light emission pulse width of the light source section is such that the oscillation frequency is 15 MHz and the continuous modulation duty is 50
% Is

1/15 MHz * 0.5 = 33 nsec (2)

[0011]

In the case of the pulse drive system which employs the semiconductor pulse laser, the practical level is about 20 nsec due to the limitations of the drive circuit, element characteristics and the like.

For the above reasons, the conventional optical distance meter is
It was necessary to interpolate the fundamental wave component of the modulated light or the barycentric position of the emission pulse.

Further, if the coherence of the light source section is high, there is a problem that unnecessary interference occurs in various places. For example, speckle in a multimode optical fiber, unevenness of near field pattern and far field pattern due to speckle at the exit end of the multimode optical fiber, fluctuation of speckle due to mode jump of emission wavelength, and further intensity modulation. And the fluctuation of the modulation waveform.

Particularly in a light wave range finder, waveform unevenness occurs due to speckles in the light-emitting side optical system, speckle fluctuations due to mode jump of the light source unit, and the interference state of the emitted light due to atmospheric fluctuations. There is a problem in that the waveform fluctuates and spatial waveform unevenness occurs. Then, when these waveform irregularities occur, the position of the center of gravity of the modulated waveform fluctuates, which causes the deterioration of measurement accuracy.

Therefore, although it is necessary to reduce the coherence of the light source section, the emission spectrum width of the semiconductor laser is almost determined from the structure thereof, so that the coherence of the light source cannot be simply lowered. there were.

[0017]

According to the present invention constructed as described above, the light source means mixes the light source section which emits light in a plurality of spatial light emitting areas and the light emitted by the light source section. The light emitted from the light source unit has non-uniform center wavelength intervals in the respective light emitting regions.

[0018]

According to the present invention configured as described above, the light source section emits light in a plurality of spatial light emitting regions, and the mixing section mixes the light emitted by the light source section. The light emitted by is such that the central wavelength intervals of the respective light emitting regions are non-uniform.

[0019]

【Example】

The case where the light source means of the present invention is applied to a light wave range finder will be described with reference to the drawings.

As shown in FIG. 1, the optical distance meter according to the present embodiment has a light source unit 1, a first condenser lens 2, a second condenser lens 3, and a pair of split prisms 41, 42.
, Optical path switching chopper 5, internal optical path 6, and APD
71, a light source side optical fiber 81, a light emitting side optical fiber 82, a light receiving side optical fiber 83, a prism 9,
It is composed of the objective lens 10. The corner cube 11 corresponds to an object to be measured which is arranged at a position away from the main body of the optical distance meter, and has a function of reflecting light.

The light source section 1 is composed of a plurality of semiconductor lasers. In this embodiment, the first semiconductor laser 10 is used.
It is composed of a first semiconductor laser 102, a second semiconductor laser 102, and a third semiconductor laser 103. The first semiconductor laser 101 emits light with a central wavelength λ ₁ ,
The semiconductor laser 102 emits light with a central wavelength λ ₂ and
This semiconductor laser 103 emits light with a central wavelength λ ₃ . And these first semiconductor lasers 1
01, the second semiconductor laser 102, and the third semiconductor laser 103 are designed to receive the same driving by the same driving means, and respectively emit the reference modulated light. The light source unit 1 of this embodiment is composed of three semiconductor lasers, but the number is not limited to three, and an appropriate number can be adopted.

The first semiconductor laser 101 is provided with a light source condenser lens 1011.
The modulated light emitted from the semiconductor laser 101 is coupled to the end of the optical fiber 811 on the light source side. Similarly, the second semiconductor laser 102 is provided with a light source condenser lens 1021 so that the modulated light emitted from the second semiconductor laser 102 is coupled to the end of the light source side optical fiber 812. There is. The third semiconductor laser 103 is provided with a light source condenser lens 1031 so that the modulated light emitted from the third semiconductor laser 103 is coupled to the end of the light source side optical fiber 813. .

The light source side optical fiber 81 is constructed so as to bundle the emission ends of the light source side optical fiber 811, the light source side optical fiber 812 and the light source side optical fiber 813, and emitted from the three semiconductor lasers of the light source section 1. A low-coherence secondary light source mixed with modulated light is emitted by the first condenser lenses 21 and 22 from the optical fiber 8 on the light emitting side.
It is adapted to be coupled to the second light receiving end 82a. The light source side optical fiber 81 corresponds to an optical guide.

The light source section 1 and the light source condenser lens 1
011, 1021, 1022 and the optical fiber 81 on the light source side
1, 812 and 813, condenser lenses 21 and 22, light emitting side optical fiber 82, split prism 41 and prism 9
The objective lens 10 and the objective lens 10 correspond to optical means. Further, the light source section 1 corresponds to a light source means, and the light source side optical fiber 81 corresponds to a mixing section.

The light source unit 1 is composed of three semiconductor lasers, and has an emission spectrum width of a light emitting diode (L
It is narrower than ED) and has high interference. The optical path switching chopper 5 switches the luminous flux. A
The PD 71 corresponds to a light receiving unit, and a light receiving element 7 that can receive the light beam emitted from the light source unit 1 is sufficient.

The split prism 41 is composed of a first half mirror 411 and a second half mirror 412, and the split prism 42 is composed of a first half mirror 421 and a second half mirror 422. There is. Light source 1
Between the side and the split prism 41, the light emitting side optical fiber 82
Tied with. Further, the split prism 42 and the light receiving element 7 side are connected by a light receiving side optical fiber 83.

The modulated light emitted from the plurality of semiconductor lasers of the light source section 1 is first transmitted through the optical fiber 81 on the light source side.
The condenser lenses 21 and 22 are coupled to the light receiving end 82a of the light emitting side optical fiber 82 by the first condenser lenses 21 and 22. The modulated light emitted from the emission end 82b of the light emitting side optical fiber 82 is sent to the split prism 41. Split prism 41
The modulated light transmitted through the first half mirror 411 can be emitted to the external distance measuring optical path via the optical path switching chopper 5. The pulse reflected by the first half mirror 411 of the split prism 41 and further reflected by the second half mirror 412 passes through the optical path switching chopper 5,
It can be emitted to the internal distance measuring optical path 6. The optical path switching chopper 5 is for switching between the internal distance measuring optical path 6 and the external distance measuring optical path. Therefore, when the optical path switching chopper 5 selects the external distance measuring optical path, the modulated light is reflected by the prism 9 and then emitted to the outside by the objective lens 10.

The modulated light emitted from the objective lens 10 is
The light is reflected by the corner cube 11, is again received by the objective lens 10, and is sent to the prism 9. The received modulated light is
The received pulsed light reflected by the prism 9 and sent to the split prism 42 and transmitted through the first half mirror 421 of the split prism 42 is the light receiving end 83 of the light receiving side optical fiber 83.
bound to a.

When the optical path switching chopper 5 selects the internal distance measuring optical path 6, the modulated light is sent to the split prism 42 through the internal distance measuring optical path 6. And the modulated light is
First half mirror 42 built in the split prism 42
The light is reflected by the first and second half mirrors 422 and is coupled to the light receiving end 83a of the light receiving side optical fiber 83.

The exit end 8 of the light receiving side optical fiber 83
The modulated light emitted from 3b is coupled to the APD 71 by the second condenser lenses 31 and 32, and is converted into a current pulse by the light receiving element 7.

The first half mirror 411, the prism 9, the objective lens 10, the corner cube 11,
The optical path composed of the objective lens 10, the prism 9 and the first half mirror 421 corresponds to the external distance measuring optical path. Further, the optical path composed of the first half mirror 411, the second half mirror 412, the condenser lenses 43 and 44, the second half mirror 422, and the first half mirror 421 is the internal distance measuring optical path. It corresponds to 6.

Next, the configuration of the electric circuit of this embodiment will be described in detail.

In the embodiment shown in FIG. 2, the crystal oscillator 100, the first frequency divider 110, the synthesizer 120, the second frequency divider 130, the light source section 1, and the semiconductor laser driver 15 are provided.
0, APD 71, amplifier 160, waveform shaping circuit 170, counter 180, peak hold circuit 190, level determination circuit 200, band pass filter 210, sample hold (S / H) 220, AD converter 300, memory 400, and CPU 500. It is configured.

The crystal oscillator 100 is one of the reference signal generating means and generates a 15 MHz reference signal.
This reference signal is supplied to the first frequency divider 110, the synthesizer 120, the bandpass filter 210, and the counter 180. The reference signal supplied to the first frequency divider 110 is divided into 1/100 by the first frequency divider 110 and becomes 150 KHz, which is sent to the synthesizer 120. The synthesizer 130 creates 15.15 MHz from 150 KHz supplied from the first frequency divider 110 and 15 MHz supplied from the crystal oscillator 100, and sends it to the second frequency divider 130. Second frequency divider 13
0 is 15.15 supplied from synthesizer 120
The frequency is divided into 1/5000 to generate 3030 KHz, which is sent to the driver circuit 140. In addition,
The output signals of the first frequency divider 110, the second frequency divider 130, and the synthesizer 120 are binarized signals.

The semiconductor laser driver 150
Is for driving the first semiconductor laser 101, the second semiconductor laser 102, and the third semiconductor laser 103 in the same manner.

The modulated light emitted from the semiconductor lasers 101, 102 and 103 passes through the optical system and is received by the APD 71. This APD 71 is one of the light receiving elements 7,
It is a diode that can obtain a gain by applying a deep bias to the pn junction to induce a sagging multiplication. APD
Reference numeral 71 receives the modulated light that has passed through the internal reference optical path and the modulated light that has passed through the external distance measuring optical path. The modulated light is converted into an electric signal by the APD 71 and sent to the amplification amplifier 160.

The amplifier 160 amplifies the electric signal input from the APD 71, and the amplified detection signal is supplied to the waveform shaping circuit 170 and the peak poled circuit 190.

The waveform shaping circuit 170 supplies the received signal to the sample hold (S / H) 220 and the counter 180. The counter 180 displays the time until the modulated light is received at 15 MHz from the crystal oscillator 100.
It is supposed to count.

15 MHz sent from the crystal oscillator 100 to the bandpass filter 210 becomes a sine wave and is sent to the sample hold circuit 220. The sample and hold circuit 220 samples and holds the received signal output from the waveform shaping circuit 170, and after AD conversion by the AD converter 300, the converted digital data is stored in a predetermined memory 400. It has become. When the AD conversion is completed, a conversion end signal is output to the CPU 500.

The processing from the light emission of the light source unit 1 to the storage of the AD-converted data in the memory 400, which is executed as described above, is performed for the external distance measuring optical path and the internal reference optical path.
That is, the phase difference φ between the waveforms of the AD converted data of the internal reference optical path and the AD converted data of the external distance measuring optical path corresponds to the optical path difference. Fourier transform is applied to each waveform, phase information of the fundamental component wave is obtained, and a precision measurement distance of 10 m unit or less can be obtained from the phase difference. Note that the rough measurement distance can also be obtained with an accuracy of 10 m from the counter difference between the counter 180 in the external distance measuring optical path and the internal reference optical path. Then, by combining the rough measurement distance and the fine measurement distance, the actual distance from the lightwave rangefinder to the measurement object can be obtained. The configuration for performing these operations corresponds to the distance measuring means.

Next, the light source unit 1 of this embodiment will be described in detail. The light source unit 1 is composed of three semiconductor lasers, the emission spectrum width is narrower than that of a light emitting diode (LED), and the coherence is high. Therefore, speckles due to interference occur in each part of the optical system. There is a problem that it occurs.

FIG. 3 shows the speckle intensity distribution at the exit end 82b of the light emitting side optical fiber 82. Here, the speckle is a speckled pattern that appears when a laser beam is projected onto the surface of plastic, metal, or the like. That is, it occurs because the laser beams reflected at various places on the surface interfere with each other. The speckle of an optical fiber is a standing wave of light in the diameter direction of the optical fiber, and its size changes depending on the fiber diameter, the numerical aperture NA of the fiber, the wavelength of light, and the like. Here, the numerical aperture NA is represented by numerical aperture NA = nsin θ, where θ is an angle of an optical axis of a ray having a maximum opening among rays emitted from an object point on the axis. Here, n is the refractive index of a substance having an object point. The numerical aperture NA of the fiber is used to determine the objective lens that most efficiently enters light into the optical fiber.

FIG. 3A is an enlarged view of the emission end 82b of the light emitting side fiber 82, and FIG. 3B shows only the modulated light having the central wavelength λ ₁ emitted from the first semiconductor laser 101. It was the focus of attention and shows the speckle. The horizontal axis represents the light intensity I and the vertical axis represents the position in the diameter direction of the fiber. Similarly, FIG. 3C focuses only on the modulated light having the central wavelength λ ₂ emitted from the second semiconductor laser 102, and FIG. 3D shows the emission from the third semiconductor laser 103. Only the modulated light having the center wavelength λ ₃ is focused and the respective speckles are shown.

As shown in FIGS. 3B to 3D, the individual speckles of each semiconductor laser have a strong intensity pattern (contrast) because the emission spectrum of each semiconductor laser is narrow.

However, the speckle at the exit end 82b of the light emitting side fiber 82 is the sum of the speckle patterns created by the respective semiconductor lasers.
In the present embodiment, the first semiconductor laser 101, the second semiconductor laser 102, and the third semiconductor laser 10
3 and 3 have different center wavelengths and different intensity pattern pitches, so that the speckle contrast can be reduced as a whole as shown in FIG. 3 (e).

Since the semiconductor lasers, which are the light sources, are spatially independent light emitting regions, the speckle contrast may decrease without changing the emission wavelength of each light source. By intentionally shifting the emission wavelength, the speckle contrast can be surely lowered.

In the semiconductor laser, a mode jump (also referred to as a mode hop) in which the oscillation mode momentarily hops to another mode may occur, but the mode may be changed to any one of the three semiconductor lasers. Even when a jump occurs, the influence of the change in the speckle pattern of the semiconductor laser on the entire speckle pattern can be reduced.

In the light distance meter of this embodiment, the objective lens 10 is not limited to the exit end 82b of the light emitting side fiber 82.
Speckle is also observed in the light flux emitted from the corner cube 11 toward the corner cube 11. FIG. 4A is an enlarged view of the light emitting optical system, and FIG. 4B is a view focusing only on the modulated light having the central wavelength λ ₁ emitted from the first semiconductor laser 101, and its specifications. Is showing. Similarly, FIG. 4C focuses only on the modulated light having the central wavelength λ ₂ emitted from the second semiconductor laser 102, and FIG. 4D shows the emission from the third semiconductor laser 103. Only the modulated light having the center wavelength λ ₃ is focused and the respective speckles are shown. Emitting fiber 8
Similar to the emission end 82b of No. 2, the entire speckle is considered to be the sum of the speckle patterns formed by the respective semiconductor lasers in the light emission optical system, and by adopting the light source unit 1 including a plurality of semiconductor lasers. , Fig. 4
As shown in (e), the speckle contrast can be reduced.

FIG. 5 shows the influence of the luminous flux emitted from the optical distance meter when propagating to the atmosphere. The refractive index of the atmosphere changes depending on the temperature, atmospheric pressure, humidity and the like. Especially in the daytime, due to the influence of sunlight, the refractive index of the atmosphere becomes uneven, and the refractive index fluctuates with time, resulting in a heat haze. This change in the refractive index of the atmosphere affects the speed of light and therefore appears as a change in the optical distance with respect to the emission wavelength. Corner cube 11
There is a problem that the influence becomes large in the case of long-distance measurement in which is placed at a distance.

Of the luminous flux emitted from the optical distance meter, FIG.
Consider a light flux 1100 in a portion reflected by the corner cube 11 as shown in FIG. Light flux 1 due to atmospheric fluctuations
If the optical distance of a part of the light flux of 100 changes,
This light flux 1100 causes an interference state when it is received by the main body of the optical distance meter. Since the fluctuation of the atmosphere fluctuates with time, the interference at the light receiving stage also fluctuates with time, which affects the ranging accuracy as a fluctuation of the modulation waveform.

However, in this embodiment, the central wavelengths of the first semiconductor laser 101, the second semiconductor laser 102, and the third semiconductor laser 103 are different from each other. Therefore, the influence of the change in the optical distance due to heat haze or the like on the interference pattern is also different for each semiconductor laser, so that the overall waveform fluctuation at the light receiving stage can be reduced.

In this embodiment, as shown in FIG. 1, the first semiconductor laser 101, the second semiconductor laser 102, and the third semiconductor laser 103 are arranged independently, and the light source condenser lens corresponding to them is arranged. 1011 and 102
1, 1031 are installed, and light source side optical fibers 811 and 8
Coupled via 12, 813 and bundled together into a first
The condenser lenses 21 and 22 are configured to be coupled to the light receiving end 82a of the light emitting side optical fiber 82.
On the other hand, as shown in FIG. 6A, the light source unit 1 has a stack structure in which semiconductor lasers are stacked, and a pair of first
Alternatively, the condenser lenses 21 and 22 may be directly coupled to the light receiving end 82a of the light emitting side optical fiber 82.

Further, as shown in FIG. 6B, a semiconductor laser having a plurality of light emitting regions may be incorporated in one wafer.

As described above, the structure of the light source section 1 shown in FIG.
The drive electric circuit and the optical parts can be omitted, and the brightness of the light source can be improved.

Next, the first semiconductor laser 101 and the second semiconductor laser 101
Semiconductor laser 102 and third semiconductor laser 103
Center wavelengths λ ₁ , λ ₂ and λ ₃ of the
The relationship with the coherence of the secondary light source at the exit end 82b of is considered. The LED is suitable as the light source of the optical distance meter because its emission spectrum width is very wide and its coherence is low. Therefore, the occurrence of waveform fluctuations due to fluctuations in the atmosphere inside the light emitting side fiber 82 and outside the lightwave rangefinder becomes negligibly small in terms of the accuracy of the lightwave rangefinder.

Generally, an interferogram is observed by Fourier spectroscopy as an index of coherence due to the width of the spectrum. The Michelson interferometer 2000 shown in FIG. 7 is used for these measurements. The Michelson interferometer 2000 includes a beam splitter 2001, a movable plane mirror 2002, a detector 2003, and a fixed plane mirror 2004.
And a measurement light source 2005.

The light from the measurement light source 2005 is split by the beam splitter 2001 into an optical path a and an optical path b. The light on the optical path a is reflected by the fixed plane mirror 2004, passes through the beam splitter 2001, and enters the detector 2003.
The light on the optical path b is reflected by the movable plane mirror 2002, reflected by the beam splitter 2001, and incident on the detector 2003. The intensity of light detected by the detector 2003 when the movable plane mirror 2002 is moved is called an interferogram and has a shape as shown in FIG. 7B. The horizontal axis of FIG. 7B is the change in the optical path length due to the movement of the movable plane mirror 2002, and the vertical axis is the intensity of the light detected by the detector 2003. Then, the spectrum of the measurement light source 2005 shown in FIG. 7C can be obtained by Fourier-transforming the waveform of FIG. 7B. It is Fourier spectroscopy that obtains an index of coherence due to the breadth of the spectrum by these methods.

Therefore, the relationship between the spread of the spectrum of the light source and the interferogram is shown in FIGS.
(C). When the measurement light source 2005 is a monochromatic light, the interferogram has a cosine function shape, and has a sinc function shape as it approaches white light.

As described above, since the emission spectrum of the light source and the interferogram have a clear relationship and the interferogram represents the coherence of the light source, the coherence of the light source is evaluated from the interferogram. can do.

Then, the coherence length Lc and the emission center wavelength λ
And the spectral width (delta λ), as shown in FIGS. 7B and 7C, when the spread of the spectrum has a Gaussian distribution,

Lc = (2 * λ ² ) / (π * (delta λ) ² ) ... (3)

It is represented by the relational expression

Here, in the case of an LED, the center wavelength λ
= 850 nm and the spectral width (delta λ) = 50 nm, substitute in the third equation,

Lc = 9 μm ... (4)

In the case of a semiconductor laser, the central wavelength λ = 850 nm and the spectral width (delta λ) = 5n
If it is m, substitute it into the third equation,

Lc = 90 μm ... (5)

It becomes

Further, the relationship between the spectrum of the light source and the interferogram will be shown with reference to FIG. Figure 8
FIG. 8A is a relationship in the case of a single LED, FIG. 8B is a relationship in the case where a plurality of semiconductor lasers are adopted, and the central wavelengths of the respective semiconductor lasers are all the same, and FIG.
Shows the case where a plurality of semiconductor lasers are used and the central wavelengths of the respective semiconductor lasers are separated by the extent of the wavelength spread of the respective semiconductor lasers (light sources). FIG. The center wavelength of the semiconductor laser is
It shows the relationship when the distances are not equal.

In the interferogram, only its envelope is drawn.

As described above, referring to FIG. 8, as compared with the case of a single LED (FIG. 8A), when a plurality of semiconductor lasers are adopted and the central wavelengths of the respective semiconductor lasers are all the same. (FIG. 8 (b)) can interfere in a fairly wide range.

Further, as compared with the case where the central wavelengths of the respective semiconductor lasers are all the same (FIG. 8B), a plurality of semiconductor lasers are adopted, and the central wavelength of each semiconductor laser is the respective semiconductor laser (light source). When the distance is as wide as the wavelength spread (Fig. 8 (c)), secondary interference occurs,
The range of the primary interference is a small range, which is about one fifth of the case where the central wavelengths of the respective semiconductor lasers are all the same.

When a plurality of semiconductor lasers are used and the central wavelengths of the respective semiconductor lasers are unequally spaced (FIG. 8 (d)), the range of interference is further reduced and 1
The next range of interference is about 1/10 of the case where the center wavelengths of the semiconductor lasers are all the same.

Next, based on FIG. 9, when a secondary light source consisting of three light sources is used and the center wavelength interval of each light source is equal to or less than the wavelength spread of each light source (spectrums partially overlap each other). If there is), it will be explained.

Similar to FIG. 8B, FIG. 9A shows a case where the central wavelengths of the respective light sources are the same. Figure 9
(B) is a case where the center wavelength intervals of the respective light sources are evenly separated by about ½ of the wavelength spread of the respective light sources. And FIG.9 (c) is the case where the center wavelength of each light source is unequally spaced.

As a result, compared with the case where the central wavelengths of the respective light sources are the same, when the spectra partially overlap, there is a partial interference peak, but the coherence is reduced. . Further, the center wavelengths are evenly spaced, as shown in FIG.
Compared to the case of (b), in the case of FIG. 9 (c), which is unequal, the coherence is further reduced.

The number of light sources is not limited to three, and light from five light sources can be mixed as shown in FIG. 10, for example. FIG. 10A shows a case where the center wavelength intervals of the light sources are evenly separated by about ½ of the wavelength spread of the light sources. And FIG. 10 (b)
Is the case where the central wavelengths of the respective light sources are unequally separated.

As is apparent from the comparison between FIGS. 10 and 9, the coherence can be further reduced by increasing the number of light sources. Further, the coherence can be further reduced by unequally distributing the center wavelength intervals.

In the optical distance meter, there is almost no optical path difference in the same mode in the optical fiber, and the optical path difference during propagation in the atmosphere cannot be specified. Therefore, it is advantageous to make the first-order coherence range as small as possible, and further, when there is an optical path difference that causes secondary interference, it means that there are many optical path differences. As a result, it becomes possible to average them.

In the present embodiment configured as described above, even when the emission spectrum is narrow as in a semiconductor laser,
By separating the central wavelengths of a plurality of semiconductor lasers by the extent of the light source wavelengths of the respective semiconductor lasers and making the central wavelength intervals unequal, the coherence can be effectively reduced. Can be used as.

Although the light source 1 of this embodiment is described as a semiconductor laser, the light source 1 is not limited to the semiconductor laser and can be applied to other light sources.

[0082]

According to the present invention having the above-described structure, the light source unit emits light in a plurality of spatial light emitting regions, and the mixing unit mixes the light emitted by the light source unit. Since the center wavelength intervals of the light emitting regions of the light emitted from the section are non-uniform, there is an excellent effect that it is possible to provide a light source means that is low in coherence and is optimal for a light distance meter.

[0083]

[Brief description of drawings]

FIG. 1 is a diagram showing a configuration of an exemplary embodiment of the present invention.

FIG. 2 is a diagram showing an electrical configuration of the present embodiment.

FIG. 3 is a diagram showing a speckle intensity distribution at an exit end 82b of a light emitting side optical fiber 82.

FIG. 4 is a diagram showing a speckle intensity distribution in a light emitting optical system.

FIG. 5 is a diagram illustrating an influence of a light flux emitted from a light distance meter when propagating to the atmosphere.

FIG. 6 is a diagram illustrating a modified example of the light source unit 1.

FIG. 7 is a diagram illustrating a Michelson interferometer 2000.

FIG. 8 is a diagram showing a relationship between a spectrum of a light source and an interferogram.

FIG. 9 is a diagram showing a relationship between spectra and interferograms obtained by three light sources.

FIG. 10 is a diagram showing a relationship between spectra by five light sources and an interferogram.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 Light source part 101 1st semiconductor laser 102 2nd semiconductor laser 103 3rd semiconductor laser 2 1st condenser lens 3 2nd condenser lens 41 Split prism 42 Split prism 5 Optical path switching chopper 71 APD 81 Light source side optical fiber 82 Light emitting side optical fiber 83 Light receiving side optical fiber 9 Prism 10 Objective lens 11 Corner cube 100 Crystal oscillator 110 First frequency divider 120 Synthesizer 130 Second frequency divider 150 Semiconductor laser driver 160 Amplifier 170 Waveform shaping circuit 180 Counter 190 Peak hold circuit 200 level determination circuit 210 band pass filter 220 sample hold circuit 300 AD converter 400 memory 500 CPU 10000 phase measuring device

 ─────────────────────────────────────────────────── ─── Continued Front Page (72) Inventor Kazuaki Kimura 75-1 Hasunumacho, Itabashi-ku, Tokyo Topcon Co., Ltd. (72) Inventor Masaaki Yabe 75-1 Hasunuma-cho, Itabashi-ku, Tokyo To In Pucon (72) Inventor Yasutaka Katayama 75-1 Hasunumacho, Itabashi-ku, Tokyo Topcon Co., Ltd. (72) Inventor Kazushige Koshikawa 75-1 Hasunuma-cho, Itabashi-ku, Tokyo In Topcon Co., Ltd. (72) Inventor Takeshige Saito 75-1 Hasunuma-cho, Itabashi-ku, Tokyo Topcon Inc. (72) Inventor Hirofumi Suga 1126-1126 Nomachi, Hamamatsu City, Shizuoka Prefecture Hamamatsu Photonics Co., Ltd. (72) Inventor Hisao Naito Shizuoka Hamamatsu Photonics Co., Ltd. 1 at 1126 Ichinomachi, Hamamatsu City, Japan

Claims (1)

[Claims] 1. A light source unit that emits light in a plurality of spatial light emitting regions, and a mixing unit that mixes the light emitted by the light source unit. Light source means characterized in that the central wavelength intervals of the regions are non-uniform.