JPH0590448A - Hybrid integrated circuit - Google Patents

Abstract

PURPOSE:To prevent disconnection of a wire which connects a circuit element and a conductive path due to flow of silicon gel which is generated at the time of heat cycle of a hybrid integrated circuit where silicon gel is filled and humidity resistance treatment is performed. CONSTITUTION:A desired circuit element 5 which is mounted on two substrates 1 and 2 is sealed by a sealing member 8, is separated from a silicon gel 9 which is filled into a hybrid integrated circuit, and then the circuit element 5 is coated with a silicon resin film while leaving a hollow layer 15 within the sealed member 8.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a hybrid integrated circuit, and more particularly to a hybrid integrated circuit used in an external environment.

[0002]

2. Description of the Related Art FIG. 3 is a sectional view of a typical hybrid integrated circuit used in an external environment. Chip-shaped LS1 and VLS are mounted on the two hybrid integrated circuit boards (30) and (31).
Circuit elements (32) such as I, power transistors and chip resistors are fixedly mounted on a desired conductive path (not shown). The two substrates (30) and (31) are fixedly integrated with each other by a frame-shaped case member (33) so as to be separated from each other by a predetermined distance.

On the other hand, since the wire wire connecting the circuit element (32) such as LSI and VLSI chip and the conductive path is thin, it is hermetically sealed by the epoxy resin (34). By the way, in a hybrid integrated circuit used in an external environment, in order to improve moisture resistance, a silicone gel (3) is formed in a space formed between both substrates (30) and (31) and a case material (33).
5) is filled to protect the circuit patterns and circuit elements on the substrates (30) and (31) from water and moisture.

Silicone gel (35) on both substrates (30)
If filled between (31), the silicone gel (35) will flow during the heat cycle and the internal pressure will increase, which may break the fine wire wire connecting LSI, VLSI and the like. It is solved by hermetically sealing with 34). Further, since the coefficient of thermal expansion of the epoxy resin is adjusted to be approximately the same as the coefficient of thermal expansion of the substrate, the adhesion between the substrate and the epoxy resin is good, moisture does not easily enter, and the humidity resistance is high. Is improved. The applicant has already applied for matching the thermal expansion coefficients of both the epoxy resin and the substrate (Japanese Patent Application No.
No. 118812).

[0005]

As described above, in the conventional hybrid integrated circuit, it is possible to prevent the wire wire from breaking due to the flow of the silicone gel generated during the heat cycle. However, by matching the coefficient of thermal expansion of the epoxy resin with the coefficient of thermal expansion of the substrate, the adhesiveness between the two is improved, but the difference in coefficient of thermal expansion between the epoxy resin and the bare chip is significantly different, so the temperature change (temperature Cycle), stress is repeatedly applied to the bonding portion between the sealant and the bare chip, causing a problem that the wire bonding portion on the bare chip surface is broken or peeled from the electrode.

According to an experiment conducted by the present inventor, such defects are
It was found that the interface between the chip surface and the encapsulant was peeled off around the corner of the bare chip and where the wire disconnection failure occurred. This is because the maximum stress is applied to the corner portion by repeating the cooling / heating cycle. Therefore, it is considered that peeling occurs at the corner portion, and the presence or absence of the shearing direction, which is suppressed by the adhesive force, is applied to the wire bonding portion, resulting in disconnection.

This will be described with reference to FIGS. 4A and 4B. In A of FIG. 4, stress in the shearing direction is applied due to the difference in thermal expansion coefficient between the epoxy resin and the chip due to thermal shock, but the epoxy resin is bonded to the chip, so movement in the shearing direction is suppressed. is doing. On the other hand,
FIG. 4B shows that the epoxy resin is peeled off at the corner of the chip where the maximum stress is applied by repeating thermal shock (hatched area), and the presence or absence of the shearing direction is applied to the bonding portion of the wire, which eventually leads to disconnection. Is.

Further, FIG. 5 shows the result of a wire disconnection failure experiment conducted with different chip sizes. As experimental conditions, a bare chip was fixedly mounted on a copper foil formed on an aluminum substrate via an Ag paste, the bare chip and the copper foil were bonded with an Al wire wire, and the bare chip and the wire wire were sealed with an epoxy resin. -5
A thermal shock test was performed at 5 ° C / 5 min to 150 ° C / 5 min (liquid phase). In FIG. 5, (A) has a chip size of 5.47 × 8.05, and (B) has a chip size of 5.16.
× 6.2, and 10 chips were used for each.

As can be seen from FIG. 5, a small chip size (B) has a defect at 2000 cycles, and a large chip size (A) has a defect at 500 cycles. Since the occurrence rate of wire curve defects is low even in 2000 cycles even if the chip size is small to some extent, it is used in an external environment, and it cannot be used as a hybrid integrated circuit for in-vehicle or outdoor units of inverter air conditioners with severe environmental conditions. It is possible.

However, if the chip size is relatively large, a defect occurs after 500 cycles, and as described above, it is confirmed that the hybrid integrated circuit used in the external environment cannot be practically used because of its extremely low reliability. Was done.

[0011]

SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned problems, and includes first and second hybrid integrated circuit boards on which a plurality of circuit elements are mounted, and on both the boards. A case material in which circuit elements mounted on the substrate are disposed so as to face each other, and a silicone resin layer filled in a space formed by the both substrates and the case material, and at least one of the both substrates. Only a desired chip-shaped circuit element mounted on the substrate of (1) is sealed with a sealing member, and the chip-shaped circuit element arranged in the sealing member is covered with a silicone resin, and a space is provided in an upper layer in the sealing member. It is characterized in that a layer is formed.

Further, in such a hybrid integrated circuit,
An insulating resin film having a low coefficient of thermal expansion is formed on the chip-shaped circuit element. Further, in such a hybrid integrated circuit, the both substrates are aluminum substrates.

[0013]

As described above, in the hybrid integrated circuit of the present invention, since the insulating resin film having a low thermal expansion coefficient is formed on the chip-shaped circuit element, the difference in the thermal expansion coefficient between the insulating resin film and the chip-shaped element is large. Is remarkably alleviated and the fixing strength of the wire can be reinforced. As a result, peeling due to temperature change (temperature cycle) at the interface between the insulating resin film and the chip-shaped element is suppressed. Further, since the neck portion of the wire wire connected to the electrode on the chip element is reinforced by the insulating resin film, even if shearing force due to the temperature cycle is generated in the neck portion of the wire wire, there is no fear of disconnection.

Further, in the present invention, since the chip-shaped circuit element is sealed by the sealing member, even if the internal pressure due to the flow of the silicone gel generated during the heat cycle is increased, the chip-shaped circuit element and the conductive path are formed. It is possible to prevent disconnection of the wire wire connecting the. Further, in the present invention, since the chip-shaped circuit element arranged in the sealing member is covered with the silicone resin film, the waterproof resistance does not deteriorate.

Further, according to the present invention, since the space layer is formed in the sealing member, even if the silicone resin film covering the chip-shaped circuit element flows during the heat cycle, the sealing member is as described above. Since the space is formed inside, there is no risk of the internal pressure of the silicone gel increasing, and there is no wire breakage.

[0016]

DESCRIPTION OF THE PREFERRED EMBODIMENTS A hybrid integrated circuit of the present invention will be described below based on the embodiments shown in FIGS. FIG. 1 is a cross-sectional view of a hybrid integrated circuit of the present invention. (1) and (2) are hybrid integrated circuit boards, (3) and (4) are conductive paths, (5) is a chip-shaped circuit element, and (7). Is a case material, (8) is a sealing member,
(9) is a silicone resin layer, (10) is an insulating resin film,
(11) is a silicone resin film.

As the hybrid integrated circuit boards (1) and (2), metal substrates such as aluminum substrates are used. An aluminum oxide film is formed on the surface of such an aluminum substrate by a known anodic oxidation technique. Both boards (1)
Conductive paths (3) and (4) having a desired shape are formed on one main surface of (2) through an insulating resin layer (not shown) such as an epoxy resin. The conductive paths (3) and (4) are formed of copper foil, and the above-mentioned material in which the insulating resin layer and the copper foil are integrated in a clad shape is attached to the respective substrates (1) and (2). Then, it is patterned by a predetermined etching technique.

Although not clearly shown in FIG. 1, the conductive paths (3) and (4) are formed on the substantially entire surface area of the substrates (1) and (2), and the circuit elements are fixed at predetermined positions. A pad is formed, and a plurality of conductive paths (3) and (4) are formed to extend near the periphery of the pad. A plurality of circuit elements (5) are fixedly mounted on each pad. For example, circuit elements such as transistors and chip resistors, and LSI and VLSI
A chip-shaped circuit element (5) such as the above is fixed onto the pad via an adhesive such as Ag paste. On the other hand, LSI, VL
Electrodes on circuit elements (5) such as SI and conductive paths (3) (4)
The connection with the Al wire wire (6
According to A), the power system circuit element such as a power transistor is electrically connected by an Al wire wire (6B) having a diameter of about 200 to 300 μm by using a connecting means such as ultrasonic bonding.

LSI mounted on both substrates (1) and (2)
Circuit elements (5) such as chips, transistor chips and chip resistors are covered with epoxy resin (12). Further, external lead terminals (13) and (14) are fixed to the peripheral end portions of both substrates (1) and (2) for connection with an external circuit. By the way, a memory chip such as a VLSI having a relatively large chip size mounted on one of the substrates is not covered with the above-mentioned epoxy resin (12), and has an insulating resin thin film (10) (hereinafter referred to as a resin thin film) on the upper surface. ) Is formed. The coefficient of thermal expansion of the resin thin film (10) is adjusted to be low. That is, the resin thin film (1
The coefficient of thermal expansion of 0) is set to a value which is substantially the same as or close to the coefficient of thermal expansion of the circuit element (5).
Since the thermal expansion coefficient of the circuit element (5) is relatively low at about 3 to 4 × 10 ⁻⁶ / ° C., the resin thin film (1
The thermal expansion coefficient of 0) is adjusted to about 10 × 10 ⁻⁶ / ° C. by densely filling a filler such as silica.

The resin thin film (10) used in the present invention will be further described. As described above, since the resin thin film (10) needs to be thinly formed on the circuit element (5), solvent-based phenol curing is performed. A system epoxy resin is used.
Solvent-based phenol-curing resin is liquid, so it is approximately 100μ even though the filler is densely packed.
The resin thin film (10) having a thickness of about 500 μm can be easily formed on the circuit element. When the resin thin film (10) is formed on the circuit element (5), since the resin is solvent-based as described above, an appropriate amount of resin corresponding to the size of the circuit element (5) is bottled and heated. It can be formed only by processing. That is, since the above-mentioned resin thin film (10) is formed on substantially the entire surface of the circuit element (5), the neck portion of the wire line is reinforced by the resin thin film (10).

In this embodiment, a solvent-based phenol curable resin is used as the resin material of the resin thin film (10).
As the other material, an acid anhydride curing epoxy resin or an amine curing epoxy resin can be used. However, among these, the phenol-based curable resin has the highest moisture resistance, and therefore the phenol-cured system is used in this embodiment.

By the way, the above-mentioned resin is the circuit element (5).
Ensures moisture resistance reliability as it is coated directly on the surface
Highly purified resin is used for
There is. The resin used in this example is an impurity in the cured product.
Very low on concentration (Cl ^-10 ppm, Na⁺2-3
ppm), same as transfer mold resin for LSI
It is highly purified to the level. Therefore, the circuit element
(5) Adhesion is good and it is difficult for water to enter, so
High moisture resistance reliability is obtained. In addition, soft error due to α rays
Chip-like circuit elements such as DRAM that easily generate
There is no problem even if you do.

By thus forming the resin thin film (10) having a low coefficient of thermal expansion on the circuit element (5),
Since the thermal expansion coefficients of the circuit element (5) and the resin thin film (10) are matched, the interface between the element (5) and the resin thin film (10) does not peel off even during the thermal cycle. Therefore, even if a shearing force is applied to the corner portion of the circuit element (5) under a severe thermal cycle condition, the interface between the circuit element (5) and the resin thin film (10) does not peel off as described above,
Further, since the neck portion of the wire wire (6A) is reinforced by the resin thin film (10), the fixing strength of the wire wire (6A) is increased, and the wire wire disconnection defect during the heat cycle as in the conventional case is significantly suppressed. can do.

On the other hand, the relatively large circuit element (5) on which the resin thin film (10) is formed is completely sealed by the sealing member (8). The sealing member (8) is formed of an insulating resin such as an epoxy resin in a box shape, and a hole (8A) is formed in the upper surface thereof. The sealing member (8) and the substrate may be bonded by using a known bonding means such as an adhesive or an adhesive tape.

After sealing the large-sized circuit element (5) with the sealing member (8), a predetermined amount of silicone resin is poured through the hole (8A) to form the silicone resin film (11). The silicone resin film (11) covers the circuit element (5) and the wire line (6A) and also covers the peripheral conductive path (4) in the sealing member (8). That is, the silicone resin film (11) and the hollow layer (15) are formed in the sealing member (8). After forming the silicone resin film (11), the hole (8A) is sealed using a sealing means such as a tape.

Both boards (1) and (2) on which a predetermined circuit element (5) is mounted are separated by a predetermined distance by a frame-shaped case material (7) and fixedly integrated. A silicone resin is filled in the space area formed by both the substrates (1) and (2) and the case material (7) through the hole (7A) of the case material (7) to form a silicone resin layer (9). The silicone resin layer (9) makes the hybrid integrated circuit waterproof.

By the way, FIG. 5 shows the results of measuring the defect rate of wire breakage due to the heat cycle of the silicone gel full-filled (A) and the half-filled (hollow layer formed) (B). .. As heat cycle conditions,
-40 ℃ / 30 minutes ~ 125 ℃ / 30 minutes (gas phase),
Both are mounted with a bare chip of 5.16 × 6.2 size on an aluminum substrate and wire-bonded with an Al wire having a diameter of 40 μm.

As is apparent from FIG. 5, in the case of full filling of (A), defects occur at about 300 cycles, whereas in the case of semi-filling of (B) even at about 1500 cycles. No defects have occurred. That is, by providing the hollow layer, even if the silicone gel flows during the heat cycle, the hollow layer reduces the fluidity and the internal pressure does not increase.

Therefore, according to the present invention, even if the silicone resin layer (9) flows during the heat cycle, the LS
Since the relatively small circuit element (5) such as I or transistor is covered with the epoxy resin (12), the wire line is not broken. Further, since the relatively large-sized circuit element (5) such as VLSI is sealed by the sealing member (8), it is not affected by the flow of the silicone resin layer (9) and is formed in the sealing member (8). Although the silicone resin film (11) also flows during the heat cycle, since the hollow layer is formed in the sealing member (8) as described above, the wire wire is not broken.

[0030]

As described above in detail, according to the present invention,
Even if a relatively large chip-shaped circuit element is mounted on a hybrid integrated circuit that requires moisture resistance, it is necessary to improve the moisture resistance without breaking the wire line that connects the circuit element and the conductor during a thermal cycle. You can As a result, by using the present invention, a highly reliable hybrid integrated circuit can be provided.

Further, as described above, since a large chip-shaped circuit element can be die-bonded, high-density packaging of a hybrid integrated circuit which can be used in a harsh environment can be put into practice. As a result, it is possible to provide a hybrid integrated circuit which has high density and is extremely miniaturized and has excellent moisture resistance.

[Brief description of drawings]

FIG. 1 is a cross-sectional view of a hybrid integrated circuit illustrating the present invention.

FIG. 2 is a characteristic diagram showing a disconnection defect rate of a wire wire.

FIG. 3 is a cross-sectional view showing a conventional hybrid integrated circuit.

FIG. 4 is an explanatory diagram when a thermal shock is applied to a neck portion of a wire wire.

FIG. 5 is a characteristic diagram showing a disconnection defect rate of a wire wire.

[Explanation of symbols]

 (1) (2) Hybrid integrated circuit board (3) (4) Conductive path (5) Circuit element (7) Case material (8) Sealing member (9) Silicone resin layer (10) Insulating resin film (11) Silicone resin film

Claims (3)

[Claims] 1. A first and a second hybrid integrated circuit board on which a plurality of circuit elements are mounted, a case member on which the circuit elements mounted on the both boards are arranged so as to face each other, and the both boards. And a silicone resin layer filled in a space formed by the case material, and sealing only a desired chip-shaped circuit element mounted on at least one of the two substrates with a sealing member. A hybrid integrated circuit characterized in that a chip-shaped circuit element arranged in the sealing member is covered with a silicone resin, and a hollow layer is formed as an upper layer in the sealing member. 2. The hybrid integrated circuit according to claim 1, wherein an insulating resin film having a low coefficient of thermal expansion is formed on an upper surface of the chip-shaped circuit element. 3. The hybrid integrated circuit according to claim 1, wherein both substrates are aluminum substrates.