JPH0536661A - Cleaning method - Google Patents
Cleaning methodInfo
- Publication number
- JPH0536661A JPH0536661A JP3186721A JP18672191A JPH0536661A JP H0536661 A JPH0536661 A JP H0536661A JP 3186721 A JP3186721 A JP 3186721A JP 18672191 A JP18672191 A JP 18672191A JP H0536661 A JPH0536661 A JP H0536661A
- Authority
- JP
- Japan
- Prior art keywords
- liquid chemical
- viscosity liquid
- water
- low
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、半導体装置の製造工程
において高粘性薬液により処理された半導体基板のよう
な被処理物の洗浄方法の改良に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an improvement in a method for cleaning an object to be processed such as a semiconductor substrate processed by a highly viscous chemical in a semiconductor device manufacturing process.
【0002】近年の半導体装置の製造工程においてはウ
エーハの大径化、高集積化に伴い、高粘性薬液により処
理された半導体基板の洗浄工程には加熱された純水によ
る洗浄や大量の純水による洗浄が行われているが、この
ためには純水加熱装置や大型の純水製造装置が必要とな
る。In the recent semiconductor device manufacturing process, with the increase in the diameter and integration of wafers, in the cleaning process of a semiconductor substrate treated with a highly viscous chemical solution, cleaning with heated pure water and a large amount of pure water are carried out. However, a pure water heating device and a large-sized pure water producing device are required for this purpose.
【0003】以上のような状況から、加熱純水や大量の
純水を用いないで洗浄処理を効率良く行うことが可能な
洗浄方法が要望されている。Under the circumstances as described above, there is a demand for a cleaning method capable of efficiently performing the cleaning process without using heated pure water or a large amount of pure water.
【0004】[0004]
【従来の技術】従来の洗浄方法を複数の槽を用いる半導
体基板の場合について図4により詳細に説明する。2. Description of the Related Art A conventional cleaning method for a semiconductor substrate using a plurality of tanks will be described in detail with reference to FIG.
【0005】図4は従来の洗浄方法を工程順に示す図で
ある。まず図に示すように高粘性薬液槽31の高粘性薬液
中に半導体基板をディップする。この高粘性薬液槽31に
て処理された半導体基板の表面には高粘性薬液が付着し
ているが、従来はこの半導体基板を直接水洗槽33の純水
中にディップし、この高粘性薬液を加熱した純水や大量
の純水により溶解させて除去した後、乾燥室34内で乾燥
させている。FIG. 4 is a diagram showing a conventional cleaning method in the order of steps. First, as shown in the figure, the semiconductor substrate is dipped in the highly viscous chemical solution in the highly viscous chemical solution tank 31. The high-viscosity chemical is attached to the surface of the semiconductor substrate processed in the high-viscosity chemical bath 31, but conventionally, this semiconductor substrate is directly dipped in pure water in the washing bath 33, and the high-viscosity chemical is applied. After being dissolved and removed with heated pure water or a large amount of pure water, it is dried in the drying chamber 34.
【0006】[0006]
【発明が解決しようとする課題】以上説明した従来の半
導体基板の洗浄方法においては、高粘性薬液にて処理し
た半導体基板の表面には高粘性薬液が付着しており、こ
の半導体基板を直接水洗槽の純水中にディップし、純水
に溶解しにくい高粘性薬液を完全に除去するためには水
洗処理に長時間が必要になるから加熱した純水を用いる
か、或いは大量の純水により高粘性薬液を溶解させて除
去しているので、純水加熱装置や大型の純水製造装置が
必要になるという問題点があった。In the conventional method for cleaning a semiconductor substrate described above, the highly viscous chemical liquid adheres to the surface of the semiconductor substrate treated with the highly viscous chemical liquid, and this semiconductor substrate is directly washed with water. To completely remove highly viscous chemicals that are difficult to dissolve in pure water by dipping them in pure water in the tank, it will take a long time to wash water, so use heated pure water or use a large amount of pure water. Since the highly viscous chemical liquid is dissolved and removed, there is a problem that a pure water heating device and a large-sized pure water production device are required.
【0007】本発明は以上のような状況から、高粘性薬
液処理を行った被処理物の洗浄を簡単且つ短時間に行う
ことが可能となる洗浄方法の提供を目的とするものであ
る。Under the circumstances as described above, the present invention has an object to provide a cleaning method capable of easily and quickly cleaning an object to be processed which has been treated with a highly viscous chemical solution.
【0008】[0008]
【課題を解決するための手段】本発明の洗浄方法は、高
粘性薬液により処理された被処理物の洗浄方法であっ
て、この高粘性薬液により処理され、高粘性薬液が付着
している被処理物を低粘性薬液により処理する工程と、
この低粘性薬液が付着している被処理物を水洗処理する
工程とを含むように構成する。The cleaning method of the present invention is a method for cleaning an object to be processed which has been treated with a highly viscous chemical liquid, which is processed by this highly viscous chemical liquid and to which the highly viscous chemical liquid is attached. A step of treating the treated material with a low-viscosity chemical,
And a step of washing the object to which the low-viscosity chemical liquid is attached with water.
【0009】[0009]
【作用】即ち本発明においては、図1に示すように高粘
性薬液槽1内で高粘性薬液処理を行った半導体基板を低
粘性薬液槽2内の低粘性薬液中にディップし、この高粘
性薬液を低粘性薬液に置換した後、この純水に溶解し易
い低粘性薬液が付着した半導体基板を水洗槽3内の純水
中にディップすることにより除去するので高粘性薬液処
理した被処理物を極めて短時間に純水により洗浄するこ
とが可能となる。That is, in the present invention, as shown in FIG. 1, the semiconductor substrate that has been subjected to the high-viscosity chemical solution treatment in the high-viscosity chemical solution tank 1 is dipped in the low-viscosity chemical solution in the low-viscosity chemical solution tank 2 to obtain the high-viscosity chemical solution. After the chemical solution is replaced with a low-viscosity chemical solution, the semiconductor substrate to which the low-viscosity chemical solution, which is easily dissolved in pure water, adheres is removed by dipping it in pure water in the washing tank 3. It becomes possible to wash the product with pure water in an extremely short time.
【0010】[0010]
【実施例】以下複数の槽を用いる半導体基板の場合につ
いて、図2により窒化膜を除去する本発明の第1の実施
例を、図3によりレジスト膜を剥離する本発明の第2の
実施例を工程順に詳細に説明する。EXAMPLE In the case of a semiconductor substrate using a plurality of tanks, a first embodiment of the present invention for removing a nitride film will be described with reference to FIG. 2 and a second embodiment of the present invention for removing a resist film according to FIG. Will be described in detail in the order of steps.
【0011】図2は本発明による第1の実施例の洗浄方
法を工程順に示す図、図3は本発明による第2の実施例
の洗浄方法を工程順に示す図である。窒化膜を除去する
場合には、まず図2に示すような高温燐酸槽11内で高粘
性薬液である高温燐酸で半導体基板を処理すると、半導
体基板の表面の窒化膜は除去されて高温燐酸が付着す
る。FIG. 2 is a diagram showing the cleaning method of the first embodiment according to the present invention in process order, and FIG. 3 is a diagram showing the cleaning method of the second embodiment according to the present invention in process order. When removing the nitride film, first, the semiconductor substrate is treated with high temperature phosphoric acid, which is a highly viscous chemical, in the high temperature phosphoric acid tank 11 as shown in FIG. 2, and the nitride film on the surface of the semiconductor substrate is removed to remove the high temperature phosphoric acid. Adhere to.
【0012】つぎに硝酸槽12内の低粘性薬液である硝酸
に半導体基板をディップにして高温燐酸を硝酸で置換す
ると、半導体基板の表面には硝酸が付着する。ついで硝
酸が表面に付着している半導体基板を水洗槽13内の純水
にディップすると、低粘性薬液である硝酸は純水に容易
に溶解するので、短時間内に少量の純水により水洗する
ことが可能となる。Next, when the semiconductor substrate is dipped into nitric acid, which is a low-viscosity chemical in the nitric acid tank 12, and high temperature phosphoric acid is replaced with nitric acid, nitric acid adheres to the surface of the semiconductor substrate. Then, dip the semiconductor substrate with nitric acid adhering to the surface in pure water in the washing tank 13, because nitric acid, which is a low-viscosity chemical, is easily dissolved in pure water, so that it is washed with a small amount of pure water within a short time. It becomes possible.
【0013】レジスト膜を剥離する場合には、まず図3
に示すような高温硫酸・過酸化水素槽21(以下、高温硫
酸・H2O2槽21と略称する。)で高粘性薬液である高温
硫酸・H2O2で半導体基板を処理すると、半導体基板の
表面のレジスト膜は剥離されて高温硫酸・H2O2が付着
する。When the resist film is peeled off, first, as shown in FIG.
When a semiconductor substrate is treated with high-temperature sulfuric acid / H 2 O 2 which is a highly viscous chemical in a high-temperature sulfuric acid / hydrogen peroxide tank 21 (hereinafter abbreviated as high-temperature sulfuric acid / H 2 O 2 tank 21) as shown in Fig. The resist film on the surface of the substrate is peeled off and high temperature sulfuric acid / H 2 O 2 is attached.
【0014】つぎに硝酸槽22内の低粘性薬液である硝酸
に半導体基板をディップにして高温硫酸・H2O2を硝酸
で置換すると、半導体基板の表面には硝酸が付着する。
ついで硝酸が表面に付着している半導体基板を水洗槽23
内の純水にディップすると、低粘性薬液である硝酸は純
水に容易に溶解するので、短時間内に少量の純水により
水洗することが可能となる。Next, when the semiconductor substrate is dipped in nitric acid, which is a low-viscosity chemical in the nitric acid tank 22, and high temperature sulfuric acid / H 2 O 2 is replaced with nitric acid, nitric acid adheres to the surface of the semiconductor substrate.
Next, wash the semiconductor substrate with nitric acid on the surface with a water bath 23
When dipping in pure water, nitric acid, which is a low-viscosity chemical, is easily dissolved in pure water, so that it is possible to wash with a small amount of pure water within a short time.
【0015】このように硝酸により処理を行うので、拡
散工程或いはCVD工程の前にこのレジスト剥離・洗浄
を行えば、前処理なしに拡散或いはCVD工程に半導体
基板を投入することができ、スループット向上に寄与す
ることが可能となる。Since the treatment with nitric acid is performed in this manner, if the resist stripping / cleaning is performed before the diffusion step or the CVD step, the semiconductor substrate can be put into the diffusion or the CVD step without the pretreatment, and the throughput is improved. It is possible to contribute to.
【0016】なお、本発明の第1及び第2の実施例にお
いては低粘性薬液として硝酸を用いたが、塩酸と過酸化
水素の混合液を用いても同様に短時間内に少量の純水に
より水洗することが可能である。Although nitric acid was used as the low-viscosity chemical in the first and second embodiments of the present invention, even if a mixed solution of hydrochloric acid and hydrogen peroxide is used, a small amount of pure water can be obtained within a short time. It is possible to wash with water.
【0017】本実施例は複数の槽を用いる多槽方式の洗
浄方法であるが、一槽のみを用いて処理薬液を順次交換
して行う一槽方式の洗浄方法も可能である。Although the present embodiment is a multi-tank cleaning method using a plurality of tanks, a single-tank cleaning method in which the treatment chemicals are sequentially exchanged using only one tank is also possible.
【0018】[0018]
【発明の効果】以上の説明から明らかなように、本発明
によれば極めて簡単な工程の追加により高粘性薬液によ
り処理された被処理物に付着した高粘性薬液を低粘性薬
液と置換するので、この低粘性薬液を純水により容易に
溶解することが可能となる利点があり、著しい経済的及
び、信頼性向上の効果が期待できる洗浄方法の提供が可
能である。As is clear from the above description, according to the present invention, the highly viscous chemical liquid adhered to the object to be treated treated with the highly viscous chemical liquid is replaced with the low viscous chemical liquid by adding an extremely simple process. However, there is an advantage that this low-viscosity chemical solution can be easily dissolved in pure water, and it is possible to provide a cleaning method that can be expected to be significantly economical and to improve reliability.
【図1】 本発明の原理図、FIG. 1 is a principle diagram of the present invention,
【図2】 本発明による第1の実施例の洗浄方法を工程
順に示す図、FIG. 2 is a diagram showing a cleaning method according to a first embodiment of the present invention in process order,
【図3】 本発明による第2の実施例の洗浄方法を工程
順に示す図、FIG. 3 is a diagram showing a cleaning method according to a second embodiment of the present invention in process order,
【図4】 従来の洗浄方法を工程順に示す図、FIG. 4 is a diagram showing a conventional cleaning method in order of steps,
1は高粘性薬液槽、2は低粘性薬液槽、3は水洗槽、11
は高温燐酸槽、12は硝酸槽、13は水洗槽、14は乾燥室、
21は高温硫酸・H2O2槽、22は硝酸槽、23は水洗槽、24
は乾燥室、1 is a high-viscosity chemical solution tank, 2 is a low-viscosity chemical solution tank, 3 is a water washing tank, 11
Is a high temperature phosphoric acid tank, 12 is a nitric acid tank, 13 is a water washing tank, 14 is a drying room,
21 is a high temperature sulfuric acid / H 2 O 2 tank, 22 is a nitric acid tank, 23 is a water washing tank, 24
Is a drying room,
Claims (1)
洗浄方法であって、 前記高粘性薬液により処理され、前記高粘性薬液が付着
している前記被処理物を低粘性薬液により処理する工程
と、 前記低粘性薬液が付着している前記被処理物を水洗処理
する工程と、 を含むことを特徴とする洗浄方法。Claim: What is claimed is: 1. A method of cleaning an object to be processed, which has been treated with a highly viscous chemical liquid, comprising: A cleaning method comprising: a step of treating with a low-viscosity chemical solution; and a step of washing the object to which the low-viscosity chemical solution adheres with water.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3186721A JP2626324B2 (en) | 1991-07-26 | 1991-07-26 | Cleaning method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3186721A JP2626324B2 (en) | 1991-07-26 | 1991-07-26 | Cleaning method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0536661A true JPH0536661A (en) | 1993-02-12 |
JP2626324B2 JP2626324B2 (en) | 1997-07-02 |
Family
ID=16193477
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3186721A Expired - Lifetime JP2626324B2 (en) | 1991-07-26 | 1991-07-26 | Cleaning method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2626324B2 (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2014109038A (en) * | 2012-11-30 | 2014-06-12 | Fuji Heavy Ind Ltd | Metal surface cleaning device and metal surface cleaning method |
JP2014109036A (en) * | 2012-11-30 | 2014-06-12 | Fuji Heavy Ind Ltd | Metal surface cleaning device and metal surface cleaning method |
JP2014109035A (en) * | 2012-11-30 | 2014-06-12 | Fuji Heavy Ind Ltd | Metal surface cleaning device and metal surface cleaning method |
US8765002B2 (en) | 2011-03-04 | 2014-07-01 | Mitsubishi Gas Chemical Company, Inc. | Substrate processing apparatus and substrate processing method |
JP2015041727A (en) * | 2013-08-23 | 2015-03-02 | 東京エレクトロン株式会社 | Substrate processing method and substrate processing device |
WO2019058667A1 (en) * | 2017-09-19 | 2019-03-28 | 株式会社Screenホールディングス | Substrate processing device and substrate processing method |
WO2022014181A1 (en) * | 2020-07-14 | 2022-01-20 | 株式会社Screenホールディングス | Substrate processing method and substrate processing device |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58132934A (en) * | 1982-02-03 | 1983-08-08 | Nec Corp | Method of washing semiconductor wafer |
JPS63250131A (en) * | 1987-04-07 | 1988-10-18 | Nec Corp | Manufacture of semiconductor device |
JPH02134820A (en) * | 1988-11-16 | 1990-05-23 | Hitachi Ltd | Cleaning and drying device |
-
1991
- 1991-07-26 JP JP3186721A patent/JP2626324B2/en not_active Expired - Lifetime
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58132934A (en) * | 1982-02-03 | 1983-08-08 | Nec Corp | Method of washing semiconductor wafer |
JPS63250131A (en) * | 1987-04-07 | 1988-10-18 | Nec Corp | Manufacture of semiconductor device |
JPH02134820A (en) * | 1988-11-16 | 1990-05-23 | Hitachi Ltd | Cleaning and drying device |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8765002B2 (en) | 2011-03-04 | 2014-07-01 | Mitsubishi Gas Chemical Company, Inc. | Substrate processing apparatus and substrate processing method |
JP2014109038A (en) * | 2012-11-30 | 2014-06-12 | Fuji Heavy Ind Ltd | Metal surface cleaning device and metal surface cleaning method |
JP2014109036A (en) * | 2012-11-30 | 2014-06-12 | Fuji Heavy Ind Ltd | Metal surface cleaning device and metal surface cleaning method |
JP2014109035A (en) * | 2012-11-30 | 2014-06-12 | Fuji Heavy Ind Ltd | Metal surface cleaning device and metal surface cleaning method |
JP2015041727A (en) * | 2013-08-23 | 2015-03-02 | 東京エレクトロン株式会社 | Substrate processing method and substrate processing device |
WO2019058667A1 (en) * | 2017-09-19 | 2019-03-28 | 株式会社Screenホールディングス | Substrate processing device and substrate processing method |
JP2019054198A (en) * | 2017-09-19 | 2019-04-04 | 株式会社Screenホールディングス | Substrate processing apparatus and substrate processing method |
US11501984B2 (en) | 2017-09-19 | 2022-11-15 | SCREEN Holdings Co., Ltd. | Substrate processing device and substrate processing method |
WO2022014181A1 (en) * | 2020-07-14 | 2022-01-20 | 株式会社Screenホールディングス | Substrate processing method and substrate processing device |
Also Published As
Publication number | Publication date |
---|---|
JP2626324B2 (en) | 1997-07-02 |
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