JPH0514216Y2 - - Google Patents
Info
- Publication number
- JPH0514216Y2 JPH0514216Y2 JP1986127032U JP12703286U JPH0514216Y2 JP H0514216 Y2 JPH0514216 Y2 JP H0514216Y2 JP 1986127032 U JP1986127032 U JP 1986127032U JP 12703286 U JP12703286 U JP 12703286U JP H0514216 Y2 JPH0514216 Y2 JP H0514216Y2
- Authority
- JP
- Japan
- Prior art keywords
- terminals
- terminal
- holder
- passive element
- chip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005259 measurement Methods 0.000 claims description 9
- 239000011347 resin Substances 0.000 description 7
- 229920005989 resin Polymers 0.000 description 7
- 239000004809 Teflon Substances 0.000 description 6
- 229920006362 Teflon® Polymers 0.000 description 6
- 238000000576 coating method Methods 0.000 description 6
- 239000011248 coating agent Substances 0.000 description 5
- 239000000843 powder Substances 0.000 description 5
- 238000000691 measurement method Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 238000009413 insulation Methods 0.000 description 3
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000005461 lubrication Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 235000013372 meat Nutrition 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Description
【考案の詳細な説明】
〔産業上の利用分野〕
本考案はチツプ部品に対して４端子測定法によ
る精密な定数測定を多数箇取りで行うことのでき
る測定治具に関する。[Detailed Description of the Invention] [Industrial Field of Application] The present invention relates to a measuring jig that can accurately measure constants of chip parts using a four-terminal measurement method.
４端子測定法は、第４図に示すように４本の端
子をバネ４０によつて被測定物４３に当接させ両
端の端子４１，４１間に定電流４４を流し、中央
の２端子４２，４２間にて電圧を測定することに
より中央２端子間の部分の測定値を読み取る精密
測定の方法である。そしてチツプ抵抗の場合は、
電圧値により抵抗値を、又チツプコンデンサの場
合は、電圧値により容量値を測定して定数測定を
行うものである。
In the four-terminal measurement method, as shown in FIG. , 42 to read the measured value between the two central terminals. And in case of chip resistance,
Constants are measured by measuring the resistance value based on the voltage value, and in the case of chip capacitors, the capacitance value based on the voltage value.
このような４端子測定法でのチツプ受動素子５
１の測定は、チツプ受動素子５１の電極部５２，
５２の側面５３，５３にホルダ５４，５４の孔５
７，５７に支持された端子５５，５５，５６，５
６，をバネ５０，５０にて押し付け当接させて行
つていた。ホルダ５４の孔５７は各端子５６，５
７についてそれぞれ１箇ずつあいている。ホルダ
５４の孔５７は２個あけるために、その孔５７，
５７間及び孔５７から外側の部分に肉部が必要で
あり、ホルダを小さく作ることができず、寸法的
にはチツプ受動素子の幅方向より大きくなつてし
まう。 Chip passive element 5 in such a four-terminal measurement method
Measurement 1 is performed using the electrode portion 52 of the chip passive element 51,
The holes 5 of the holders 54, 54 are formed on the sides 53, 53 of the 52.
Terminals 55, 55, 56, 5 supported by 7, 57
6, were pressed against each other by springs 50, 50. The hole 57 of the holder 54 is connected to each terminal 56,5.
There is one hole in each of the 7. In order to make two holes 57 in the holder 54, the holes 57,
57 and outside the hole 57, the holder cannot be made small, and its dimensions are larger than the width of the chip passive element.
上記従来法によるとホルダ５４，５４は夫々２
箇のガイド用孔５７，５７を有しているため、両
孔５７，５７間は所定の間隔が必要で又両孔５
７，５７から外方の部分にも肉部が必要で、ホル
ダ自体が大きくなり、特に多数箇取り用の測定治
具を作る場合、測定治具自体が大きくなり装置自
体を大きくしてしまうという欠点があつた。
According to the above conventional method, the holders 54 and 54 each have two
Since there are guide holes 57, 57, a predetermined interval is required between both holes 57, 57.
7, 57 requires a meat part on the outer part, which makes the holder itself large, and especially when making a measuring jig for multiple spots, the measuring jig itself becomes large and the device itself becomes large. There were flaws.
本考案の目的は、測定治具のホルダのチツプ受
動素子の幅方向を小さくし結果として装置自体を
小さくする測定治具を提供するものである。 An object of the present invention is to provide a measuring jig in which the width direction of the chip passive element of the holder of the measuring jig is reduced, and as a result, the device itself is made smaller.
この目的を達成するために本考案は第１図，第
２図に示すごとく、チツプ受動素子３において４
端子測定する場合に、測定治具Ａは両端の測定用
端子１，１′に夫々少なくとも端子１，１′に絶縁
コートを被覆形成し、該絶縁コートを介して前記
端子１，１′を当接させ、なおかつ端子１，１′の
端子の先端部７，７′の当接面側には凹部９，
９′を設けた。
In order to achieve this purpose, the present invention has developed a passive chip device 3 with four
When measuring terminals, the measuring jig A coats at least the measurement terminals 1 and 1' at both ends with an insulating coat, and connects the terminals 1 and 1' to each other through the insulating coat. In addition, there are recesses 9 on the abutment surfaces of the terminal tips 7 and 7' of the terminals 1 and 1'.
9' was provided.
上記の技術的手段は次のように作用する。 The above technical means works as follows.
１対の端子１，１′を１箇の丸孔１４で支持す
るようにしたため従来のように孔５７，５７間の
間隔が必要なくなり、その分だけホルダ１１のチ
ツプ受動素子３の幅方向が小さくなり、多数箇取
りにした場合測定治具全体が小さくなり、装置自
体も小さくコンパクトになるという効果を奏す
る。 Since the pair of terminals 1 and 1' are supported by one round hole 14, there is no need for a gap between the holes 57 and 57 as in the conventional case, and the width direction of the chip passive element 3 of the holder 11 is reduced accordingly. This has the effect of making the entire measuring jig smaller and making the device itself smaller and more compact if it is made into multiple pieces.
更に、端子１，１′の先端部７，７′の当接面側
には凹部９，９′を設けているので、先端部７，
７′がチツプ受動素子３と接触して磨耗し導電粉
をだしても、その導電粉による端子１，１′間の
シヨートを防ぐ。 Furthermore, since the recesses 9, 9' are provided on the contact surfaces of the tips 7, 7' of the terminals 1, 1', the tips 7, 7' of the terminals 1, 1'
Even if the chip 7' comes into contact with the chip passive element 3 and wears out and releases conductive powder, the conductive powder prevents the terminals 1 and 1' from being shot.
本考案の一実施例を第１図，第２図を参照して
詳細に説明する。
An embodiment of the present invention will be described in detail with reference to FIGS. 1 and 2.
Ａはチツプ受動素子の測定治具で、この測定治
具Ａは、チツプ受動素子３の両端の電極部４に、
端子１，１′がそれぞれ備えられている。この各
端子１，１′はガイド部２，２′と、電極部４に当
接される端子部５，５′と、測定装置へのリード
を引き出すために用いられるリード端子部６，
６′とから一体的に形成されている。この輌端子
部５，５′は当接され、一方両リード端子部６，
６′は離されるように形成されるとともにリード
端子部６，６′には端子部５，５′を電極部４に押
圧するためのバネ１５が巻回されている。端子部
５，５′の先端部７，７′は両端子部５，５′の当
接面側に凹部９，９′が形成されて絶縁性を良く
している。この凹部９，９′は先端部７，７′とチ
ツプ受動素子３の電極部４とが摩耗して金属粉を
出しそれによるシヨートをも防ぐ役割りもある。
一方リード端子６，６′の末端にはリード線をは
んだ付等で接続し易いように凹部１０，１０′が
設けられている。 A is a measurement jig for a chip passive element, and this measurement jig A has electrode parts 4 at both ends of the chip passive element 3
Terminals 1 and 1' are provided, respectively. Each terminal 1, 1' has a guide part 2, 2', a terminal part 5, 5' that comes into contact with the electrode part 4, a lead terminal part 6, which is used to draw out a lead to the measuring device.
6'. The terminal portions 5 and 5' are brought into contact with each other, while the terminal portions 6 and 5' are brought into contact with each other.
6' are formed so as to be separated from each other, and a spring 15 is wound around the lead terminal parts 6, 6' for pressing the terminal parts 5, 5' against the electrode part 4. The tip ends 7, 7' of the terminal parts 5, 5' have recesses 9, 9' formed on the abutment surfaces of both the terminal parts 5, 5' to improve insulation. The recesses 9, 9' also serve to prevent the tip portions 7, 7' and the electrode portion 4 of the chip passive element 3 from being worn out and causing metal powder to be shot.
On the other hand, recesses 10, 10' are provided at the ends of the lead terminals 6, 6' to facilitate connection of lead wires by soldering or the like.
この端子１，１′は先端部７，７′と凹部１０，
１０′を除いて全面がテフロン樹脂により絶縁コ
ートされかつ潤滑も良くされている。したがつて
この両端子１，１′の端子部５，５′はテフロン樹
脂による絶縁コートを介して当接されていること
になる。更に両端子１，１′のガイド部２，２′は
その外周面が第２図Ｂに示すように円Ｂに当接す
るように形成されている。尚、端子１は電流用
で、端子１′は電圧測定用である。 These terminals 1, 1' have tip portions 7, 7', recesses 10,
The entire surface, except for 10', is insulatingly coated with Teflon resin and is well lubricated. Therefore, the terminal portions 5, 5' of both terminals 1, 1' are brought into contact with each other through an insulating coating made of Teflon resin. Further, the guide portions 2, 2' of both terminals 1, 1' are formed so that their outer circumferential surfaces abut against a circle B as shown in FIG. 2B. Note that terminal 1 is for current measurement, and terminal 1' is for voltage measurement.
１１はホルダで、このホルダ１１は直方体１２
に丸孔１３，１３，１３……が連設されて構成さ
れている。この丸孔１３は直径を円Ｂの直径と略
同じくされ組合わせた端子１，１′のガイド部２，
２′が摺動自在に内接されている。この丸孔１３
の内周面１４にもテフロン樹脂による絶縁コート
が施されており、潤滑もよくしている。この時端
子部１，１′がホルダ１１内で回転しないように
端子６，６′の先端は夫々リード線をつけられて
回転止め体１６の小孔１７に挿入されている。 11 is a holder, and this holder 11 is a rectangular parallelepiped 12
The round holes 13, 13, 13, . . . are arranged in series. This round hole 13 has a diameter approximately equal to the diameter of the circle B, and the guide portion 2 of the combined terminals 1, 1'.
2' is slidably inscribed therein. This round hole 13
The inner circumferential surface 14 is also coated with an insulating coating of Teflon resin to provide good lubrication. At this time, in order to prevent the terminal portions 1 and 1' from rotating within the holder 11, the tips of the terminals 6 and 6' are each attached with a lead wire and inserted into the small hole 17 of the rotation stopper 16.
このように端子１，１′は潤滑性は良いので仮
にチツプ受動素子３が傾いて装着された場合にも
充分な接触を保つておくことができる。この測定
治具Ａである端子１，１′並びにホルダ１２は、
チツプ受動素子３の両電極部４，４にそれぞれ備
えられているものである。 Since the terminals 1 and 1' have good lubricity as described above, sufficient contact can be maintained even if the chip passive element 3 is mounted at an angle. The terminals 1, 1' and holder 12, which are this measuring jig A, are as follows:
Both electrode portions 4, 4 of the chip passive element 3 are provided respectively.
次に本考案の作用を説明すると、１対の端子
１，１′を１箇の丸孔１３で支持するようにした
ため従来のように孔５７，５７間の間隔（肉部）
が必要なくなり、その分だけホルダのチツプ受動
素子の幅方向が小さくなり、多数箇取りにした場
合に測定治具全体が小さくなり装置自体も小さく
コンパクトになる効果を奏する。 Next, to explain the operation of the present invention, since the pair of terminals 1 and 1' are supported by one round hole 13, the gap between the holes 57 and 57 (the flesh part)
is no longer required, the width direction of the chip passive element of the holder is reduced accordingly, and when multiple pieces are used, the entire measuring jig becomes smaller and the device itself becomes smaller and more compact.
本実施例においては絶縁コートとしてテフロン
樹脂を用いたが必らずしもテフロン樹脂に限定す
るものではなく絶縁が可能ならば他のコート材で
もよい。又本実施例では絶縁コートを、リード線
取り付け部８と測定先端部７を除いた全ての部分
に施こしたが、場合によつては端子１と端子１′
の接触面のみでもよい。又、ホルダ１１の内周面
１４にもテフロン樹脂をコートしなくてもかまわ
ない。 In this embodiment, Teflon resin is used as the insulating coat, but it is not necessarily limited to Teflon resin, and other coating materials may be used as long as insulation is possible. Furthermore, in this embodiment, an insulating coat was applied to all parts except the lead wire attachment part 8 and the measurement tip part 7, but in some cases, the insulation coating was applied to the terminal 1 and the terminal 1'.
Only the contact surface may be used. Further, the inner circumferential surface 14 of the holder 11 does not need to be coated with Teflon resin either.
コーテイング方法は塗布したくない部分をレジ
ストで覆い樹脂液をスプレーコートしその後レジ
ストを剥離する方法やその他の方法があるが、所
望の位置に絶縁コートができればその方法は問わ
ない。 Coating methods include covering areas that are not desired to be coated with a resist, spray-coating a resin liquid, and then peeling off the resist, and other methods, but any method may be used as long as an insulating coating can be applied to a desired position.
以上説明したように本考案によればホルダと、
該ホルダに形成された孔と該孔に摺動自在に挿入
される導電性の２本の端子とを備えるチツプ受動
素子の４端子測定用測定治具において、前記２本
の端子にはそれぞれ絶縁コートが被覆形成され、
該絶縁コートを介して前記２本の端子は当接し、
なおかつ前記２本の端子のすくなくともいずれか
一方の端子先端部の当接面側には凹部を設けてい
るので、従来必要だつた孔間の肉部がなくなるの
で、ホルダ部が従来に比べて小さくなり、従つて
測定治具並びに装置自体も小さくすることができ
る。更に、端子の先端部がチツプ受動素子と接触
して磨耗し導電粉をだしても、その導電粉による
端子間のシヨートを防ぐ。
As explained above, according to the present invention, the holder and
A measuring jig for measuring four terminals of a chip passive element, which includes a hole formed in the holder and two conductive terminals slidably inserted into the hole, the two terminals each having an insulated A coat is formed,
The two terminals are in contact with each other through the insulating coat,
Furthermore, since a concave portion is provided on the abutting surface side of the tip of at least one of the two terminals, there is no need for a fleshy part between the holes that was previously required, so the holder portion is smaller than before. Therefore, the measuring jig and the device itself can be made smaller. Furthermore, even if the tips of the terminals come into contact with chip passive elements and wear out and emit conductive powder, the conductive powder prevents the terminals from being shot.
第１図Ａは本考案の一実施例を示す平面図、第
１図Ｂは同正面図、第２図Ａは同端子部の平面
図、第２図Ｂは同側面図、第３図は同ホルダの斜
視図、第４図は４端子測定法の説明図、第５図Ａ
は従来例の平面図、第５図Ｂは同正面図である。
１……電流用端子、１′……電圧測定用端子、
２……ガイド部、３……チツプ受動素子、４……
電極部、７，７′……先端部、９，９′，１０，１
０′……凹部、１１……ホルダ、１２……直方体、
１３……丸孔、１４……内周面、１５……バネ、
１６……回転止め体、１７……小孔。
Fig. 1A is a plan view showing one embodiment of the present invention, Fig. 1B is a front view of the same, Fig. 2A is a plan view of the terminal section, Fig. 2B is a side view of the same, and Fig. 3 is a A perspective view of the holder, Figure 4 is an explanatory diagram of the 4-terminal measurement method, Figure 5A
is a plan view of the conventional example, and FIG. 5B is a front view thereof. 1... Current terminal, 1'... Voltage measurement terminal,
2... Guide portion, 3... Chip passive element, 4...
Electrode part, 7, 7'...Tip part, 9, 9', 10, 1
0'... recess, 11... holder, 12... rectangular parallelepiped,
13...Round hole, 14...Inner peripheral surface, 15...Spring,
16... Rotation stopper, 17... Small hole.
Claims (1)
自在に挿入される導電性の２本の端子とを備える
チツプ受動素子の４端子測定用測定治具におい
て、 前記２本の端子にはそれぞれ絶縁コートが被覆
形成され、該絶縁コートを介して前記２本の端子
は当接し、なおかつ前記２本の端子のすくなくと
もいずれか一方の端子先端部の当接面側には凹部
を設けたことを特徴とするチツプ受動素子の４端
子測定用測定治具。[Claims for Utility Model Registration] In a measuring jig for four-terminal measurement of a chip passive element, comprising a holder, a hole formed in the holder, and two conductive terminals slidably inserted into the hole. , each of the two terminals is coated with an insulating coat, the two terminals are in contact with each other through the insulating coat, and the contact surface of the tip of at least one of the two terminals is A measuring jig for measuring four terminals of a chip passive element, characterized by having a recessed portion on the side.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986127032U JPH0514216Y2 (en) | 1986-08-20 | 1986-08-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986127032U JPH0514216Y2 (en) | 1986-08-20 | 1986-08-20 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6333472U JPS6333472U (en) | 1988-03-03 |
| JPH0514216Y2 true JPH0514216Y2 (en) | 1993-04-15 |
Family
ID=31021395
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1986127032U Expired - Lifetime JPH0514216Y2 (en) | 1986-08-20 | 1986-08-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0514216Y2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4562122B2 (en) * | 2004-03-30 | 2010-10-13 | 有限会社清田製作所 | Two-probe Kelvin probe for solder ball inspection |
| JP5190943B2 (en) * | 2008-06-25 | 2013-04-24 | 有限会社清田製作所 | 2 probe Kelvin probe |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4842210U (en) * | 1971-09-21 | 1973-05-30 |
-
1986
- 1986-08-20 JP JP1986127032U patent/JPH0514216Y2/ja not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4842210U (en) * | 1971-09-21 | 1973-05-30 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6333472U (en) | 1988-03-03 |
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