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JPH05124863A - Production of high purity silicon carbide body - Google Patents

Production of high purity silicon carbide body

Info

Publication number
JPH05124863A
JPH05124863A JP3311346A JP31134691A JPH05124863A JP H05124863 A JPH05124863 A JP H05124863A JP 3311346 A JP3311346 A JP 3311346A JP 31134691 A JP31134691 A JP 31134691A JP H05124863 A JPH05124863 A JP H05124863A
Authority
JP
Japan
Prior art keywords
silicon carbide
substrate
base material
purity silicon
chemical vapor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3311346A
Other languages
Japanese (ja)
Inventor
Toshiyasu Ohashi
俊安 大橋
Yoshihiro Kubota
芳宏 久保田
Kesaji Harada
今朝治 原田
Kazuyoshi Tamura
和義 田村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shin Etsu Chemical Co Ltd
Original Assignee
Shin Etsu Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shin Etsu Chemical Co Ltd filed Critical Shin Etsu Chemical Co Ltd
Priority to JP3311346A priority Critical patent/JPH05124863A/en
Publication of JPH05124863A publication Critical patent/JPH05124863A/en
Pending legal-status Critical Current

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  • Carbon And Carbon Compounds (AREA)
  • Ceramic Products (AREA)
  • Manufacturing Of Tubular Articles Or Embedded Moulded Articles (AREA)

Abstract

PURPOSE:To increase production efficiency by forming an SiC film on the surface of an Al2O3 substrate by chemical vapor deposition and then removing the substrate. CONSTITUTION:An Si-contg. compd. such as SiCl4 a C-contg. compd. such as CH4 and H2 are fed at prescribed flow rates to the surface of an Al2O3 substrate formed into a pipe shape, etc., and an SiC film is formed on the surface of the substrate by chemical vapor deposition at a high temp. of <=1,000 deg.c under reduced pressure in 100-2,000Xm thickness. After cooling to ordinary temp., the substrate is easily separated and a high purity SiC body is obtd.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、金属溶解用ルツボ、熱
電対用保護管、発熱体、半導体拡散炉用部材、光ファイ
バー焼結用炉芯管等に使用される高純度炭化珪素体の製
造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to the production of high-purity silicon carbide bodies used for crucibles for melting metals, thermocouple protection tubes, heating elements, semiconductor diffusion furnace members, optical fiber sintering furnace core tubes, etc. Regarding the method.

【0002】[0002]

【従来の技術】従来より、金属溶解用ルツボ、熱電対用
保護管、発熱体、半導体拡散炉用部材、光ファイバー焼
結用炉芯管等は、黒鉛、焼結炭化珪素又は反応焼結炭化
珪素基体上に高純度炭化珪素をコーティングすることに
より、表面を高純度炭化珪素層としたものが使用されて
いる。
2. Description of the Related Art Conventionally, crucibles for melting metals, thermocouple protection tubes, heating elements, semiconductor diffusion furnace members, optical fiber sintering furnace core tubes, etc. have been made of graphite, sintered silicon carbide or reaction sintered silicon carbide. A high purity silicon carbide layer is formed on the surface of a substrate by coating the substrate with high purity silicon carbide.

【0003】また、黒鉛基材上に高純度炭化珪素膜を形
成した後、黒鉛基材を酸化雰囲気で焼き抜くことによ
り、高純度炭化珪素体を得る方法も知られている。
Also known is a method of obtaining a high-purity silicon carbide body by forming a high-purity silicon carbide film on a graphite base material and then baking the graphite base material in an oxidizing atmosphere.

【0004】[0004]

【発明が解決しようとする課題】しかし、黒鉛、焼結炭
化珪素、反応焼結炭化珪素基体上に高純度炭化珪素をコ
ーティングすることにより得られた高純度炭化珪素体
は、繰り返し使用により熱サイクルを受けると、基体と
コーティング面が剥離したり、クラックの発生により基
体面が露出するなどの問題点がある。従って、黒鉛基体
の場合は耐酸化性が著しく低下するし、焼結炭化珪素、
反応焼結炭化珪素基体の場合には基体中の不純物が外表
面に拡散してしまう問題がある。
However, a high-purity silicon carbide body obtained by coating high-purity silicon carbide on a graphite, sintered silicon carbide or reaction-sintered silicon carbide substrate is subjected to thermal cycling by repeated use. When receiving, there are problems that the substrate and the coating surface are separated, and that the substrate surface is exposed due to the generation of cracks. Therefore, in the case of a graphite substrate, the oxidation resistance is significantly reduced, and the sintered silicon carbide,
In the case of the reaction sintered silicon carbide substrate, there is a problem that impurities in the substrate diffuse to the outer surface.

【0005】また、黒鉛基材を焼き抜くことにより高純
度炭化珪素体を得る方法は、黒鉛基材を焼き抜くのに長
時間を有する上、基材を焼き抜いてしまうため基材の繰
り返し利用ができないなどの問題点を残している。
Further, the method of obtaining a high-purity silicon carbide body by quenching a graphite base material requires a long time for the graphite base material to be burned out, and since the base material is burned out, the base material is repeatedly used. There are problems such as not being able to do it.

【0006】本発明は上記問題を解決するためになされ
たもので、短時間で効率よくしかも経済的に化学気相蒸
着炭化珪素のみからなる高純度炭化珪素体を製造する方
法を提供することを目的とする。
The present invention has been made to solve the above problems, and it is an object of the present invention to provide a method for producing a high-purity silicon carbide body consisting only of chemical vapor deposited silicon carbide in a short time, efficiently and economically. To aim.

【0007】[0007]

【課題を解決するための手段及び作用】本発明者らは上
記目的を達成すべく鋭意検討を重ねた結果、基材として
アルミナ基材を用いることによって上記問題を解決し得
ることを見い出した。即ち、本発明の高純度炭化珪素の
製造方法は、予め坩堝形状、ヒーター形状、炉芯管形状
等に成形したアルミナ基材の表面、特に好適には外表面
に化学気相蒸着法で炭化珪素膜を形成した後、アルミナ
基材を除去することによって高純度炭化珪素体を製造す
るものである。
Means and Actions for Solving the Problems As a result of intensive studies to achieve the above object, the present inventors have found that the above problems can be solved by using an alumina base material as the base material. That is, the method for producing high-purity silicon carbide according to the present invention is carried out by chemical vapor deposition on the surface of an alumina base material, which is previously formed into a crucible shape, a heater shape, a furnace core tube shape, or the like, particularly preferably the outer surface. After forming the film, the alumina base material is removed to produce a high-purity silicon carbide body.

【0008】このようにアルミナ基材表面に炭化珪素膜
を化学気相蒸着することにより、化学気相蒸着後、温度
を降下させればアルミナ基材と炭化珪素膜とは容易に分
離する。つまり、アルミナの線膨張率は1000℃で約
0.79%であるのに対し、炭化珪素の線膨張率は10
00℃で約0.35%であるから、温度降下によりアル
ミナ基材と炭化珪素膜との接合面には剪断応力が加わ
り、この作用応力により、基材のアルミナと炭化珪素膜
とが容易に分離するものである。
As described above, by chemically vapor-depositing the silicon carbide film on the surface of the alumina substrate, the alumina substrate and the silicon carbide film are easily separated by lowering the temperature after the chemical vapor deposition. That is, the linear expansion coefficient of alumina is about 0.79% at 1000 ° C., while the linear expansion coefficient of silicon carbide is 10%.
Since it is about 0.35% at 00 ° C., shear stress is applied to the joint surface between the alumina base material and the silicon carbide film due to the temperature drop, and this working stress facilitates the formation of the base material alumina and the silicon carbide film. To separate.

【0009】従って、本発明によれば、黒鉛を焼き抜く
というような操作を必要とせず、炭化珪素膜を化学気相
蒸着により形成した後、温度降下により容易にアルミナ
基材を除去し得るので、工程時間の短縮が図れ、短時間
で効率よく高純度炭化珪素体を製造することができる
上、基材アルミナは繰り返し使用が可能であるため、製
造コストの削減が達成される。
Therefore, according to the present invention, it is possible to easily remove the alumina base material by lowering the temperature after forming the silicon carbide film by chemical vapor deposition without the need for an operation such as punching out graphite. In addition, the process time can be shortened, a high-purity silicon carbide body can be efficiently manufactured in a short time, and the base alumina can be repeatedly used, so that the manufacturing cost can be reduced.

【0010】また、上記方法により製造した炭化珪素体
は、化学気相蒸着法により形成されたもののみであるた
め、緻密質であると同時に極めて高純度である。従って
例えば光ファイバー用炉芯管に使用した場合、ファイバ
ーへの不純物の混入の心配がなくなるものである。
Further, since the silicon carbide body produced by the above method is only one formed by the chemical vapor deposition method, it is dense and at the same time extremely high in purity. Therefore, for example, when it is used in a furnace core tube for an optical fiber, there is no concern that impurities will be mixed into the fiber.

【0011】以下、本発明につき更に詳述すると、本発
明の高純度炭化珪素体の製造方法は、アルミナにより所
望の形状に成形した基材表面に化学気相蒸着法により炭
化珪素膜を形成した後、アルミナ基材を温度降下により
除去するものである。
The present invention will be described in more detail below. In the method for producing a high-purity silicon carbide body of the present invention, a silicon carbide film is formed on a surface of a base material formed into a desired shape by alumina by a chemical vapor deposition method. After that, the alumina base material is removed by lowering the temperature.

【0012】ここで、炭化珪素の化学気相蒸着は常法に
よって行なうことができ、通常、1000℃以上の高温
及び減圧下で珪素含有化合物、例えばSiCl4,Si
HCl3,SiH2Cl2,SiH4等と炭素含有化合物C
4,C38等を反応させる方法、或いは珪素、炭素を
同時に含有する化合物CH3SiCl3,(CH32Si
Cl2,(CH33SiCl,(CH34Si等の熱分
解によってなされる。
Here, the chemical vapor deposition of silicon carbide can be carried out by a conventional method, and is usually a silicon-containing compound such as SiCl 4 , Si at a high temperature of 1000 ° C. or higher and under reduced pressure.
HCl 3 , SiH 2 Cl 2 , SiH 4, etc. and carbon-containing compound C
Method of reacting H 4 , C 3 H 8 or the like, or compound CH 3 SiCl 3 , (CH 3 ) 2 Si containing silicon and carbon at the same time
It is made by thermal decomposition of Cl 2 , (CH 3 ) 3 SiCl, (CH 3 ) 4 Si and the like.

【0013】この場合、炭化珪素膜の膜厚は適宜選定さ
れるが、一般に100〜2000μm程度である。
In this case, the thickness of the silicon carbide film is appropriately selected, but is generally about 100 to 2000 μm.

【0014】次に、このように化学気相蒸着により炭化
珪素膜を形成した後は、通常の方法で温度降下させるこ
とにより、炭化珪素膜とアルミナ基材との熱膨張係数差
に基づく応力の作用で、特に他の操作を加えることなく
容易に炭化珪素膜とアルミナ基材とが脱離するものであ
る。
Next, after the silicon carbide film is formed by chemical vapor deposition in this way, the temperature is lowered by a usual method to reduce the stress caused by the difference in the thermal expansion coefficient between the silicon carbide film and the alumina base material. By the action, the silicon carbide film and the alumina base material are easily desorbed without adding any other operation.

【0015】[0015]

【実施例】以下、実施例を示して本発明を具体的に説明
するが、本発明は下記の実施例に制限されるものではな
い。
EXAMPLES The present invention will be specifically described below with reference to examples, but the present invention is not limited to the following examples.

【0016】[実施例]アルミナによりパイプ(外形1
50mm、長さ300mm)を成形し、このアルミナパ
イプ外面に対し、反応温度1300℃下でSiCl4
0.5リットル/分(SLM)、C38を0.5リット
ル/分(SLM)、H2を4リットル/分(SLM)で
供給し、反応系をポンプで排気することにより反応圧力
を10Torrに保って、炭化珪素膜を1500μm堆
積させた。
[Example] A pipe (outer shape 1) made of alumina
50 mm, length 300 mm) was molded, and at the reaction temperature of 1300 ° C., SiCl 4 was 0.5 liter / min (SLM) and C 3 H 8 was 0.5 liter / min (SLM) on the outer surface of the alumina pipe. , H 2 was supplied at a rate of 4 liters / minute (SLM), and the reaction system was evacuated by a pump to keep the reaction pressure at 10 Torr and deposit a silicon carbide film at 1500 μm.

【0017】次に、温度を常温に戻すことにより、炭化
珪素膜はアルミナパイプと容易に分離し、これにより化
学気相蒸着SiC無垢の高純度炭化珪素体を製造した。
Next, by returning the temperature to room temperature, the silicon carbide film was easily separated from the alumina pipe, whereby a high purity silicon carbide body without chemical vapor deposition SiC was manufactured.

【0018】また、上記方法の後、炭化珪素膜と脱離さ
れたアルミナパイプを再度使用し、上記と同様にして繰
り返し30個の高純度炭化珪素体を製造したが、アルミ
ナパイプの破損は生じなかった。
Further, after the above method, the alumina pipe desorbed from the silicon carbide film was used again, and 30 high-purity silicon carbide bodies were repeatedly manufactured in the same manner as above, but the alumina pipe was damaged. There wasn't.

【0019】[0019]

【発明の効果】本発明によれば、化学気相蒸着法による
高純度の炭化珪素のみからなる炭化珪素体を短時間で効
率よくしかも経済的に製造することができる。
According to the present invention, a silicon carbide body made of only high-purity silicon carbide can be produced efficiently and economically in a short time by a chemical vapor deposition method.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 田村 和義 群馬県安中市磯部2丁目13番1号 信越化 学工業株式会社精密機能材料研究所内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Kazuyoshi Tamura 2-13-1, Isobe, Annaka-shi, Gunma Shin-Etsu Chemical Co., Ltd. Precision Materials Research Laboratory

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 アルミナ基材の表面に化学気相蒸着法で
炭化珪素膜を形成した後、アルミナ基材を除去すること
を特徴とする高純度炭化珪素体の製造方法。
1. A method for producing a high-purity silicon carbide body, which comprises forming a silicon carbide film on the surface of an alumina base material by a chemical vapor deposition method and then removing the alumina base material.
JP3311346A 1991-10-31 1991-10-31 Production of high purity silicon carbide body Pending JPH05124863A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3311346A JPH05124863A (en) 1991-10-31 1991-10-31 Production of high purity silicon carbide body

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3311346A JPH05124863A (en) 1991-10-31 1991-10-31 Production of high purity silicon carbide body

Publications (1)

Publication Number Publication Date
JPH05124863A true JPH05124863A (en) 1993-05-21

Family

ID=18016044

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3311346A Pending JPH05124863A (en) 1991-10-31 1991-10-31 Production of high purity silicon carbide body

Country Status (1)

Country Link
JP (1) JPH05124863A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020174724A1 (en) * 2019-02-28 2020-09-03 株式会社アドマップ SiC FILM SINGLE BODY STRUCTURE
JP2021095319A (en) * 2019-12-19 2021-06-24 イビデン株式会社 Mold for forming nonoxide-based vapor-phase deposited ceramic material, nonoxide-based vapor-phase deposited ceramic material, and method for manufacturing mold for forming nonoxide-based vapor-phase deposited ceramic material

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020174724A1 (en) * 2019-02-28 2020-09-03 株式会社アドマップ SiC FILM SINGLE BODY STRUCTURE
JP2020141073A (en) * 2019-02-28 2020-09-03 株式会社アドマップ Sic single film structure
US11049747B2 (en) 2019-02-28 2021-06-29 Admap Inc. SiC freestanding film structure
JP2021095319A (en) * 2019-12-19 2021-06-24 イビデン株式会社 Mold for forming nonoxide-based vapor-phase deposited ceramic material, nonoxide-based vapor-phase deposited ceramic material, and method for manufacturing mold for forming nonoxide-based vapor-phase deposited ceramic material

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