JPH0447419B2 - - Google Patents
Info
- Publication number
- JPH0447419B2 JPH0447419B2 JP57179791A JP17979182A JPH0447419B2 JP H0447419 B2 JPH0447419 B2 JP H0447419B2 JP 57179791 A JP57179791 A JP 57179791A JP 17979182 A JP17979182 A JP 17979182A JP H0447419 B2 JPH0447419 B2 JP H0447419B2
- Authority
- JP
- Japan
- Prior art keywords
- shadow mask
- mask material
- electron beam
- main surfaces
- impact force
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000463 material Substances 0.000 claims description 27
- 230000007797 corrosion Effects 0.000 claims description 20
- 238000005260 corrosion Methods 0.000 claims description 20
- 238000010894 electron beam technology Methods 0.000 claims description 19
- 229920002120 photoresistant polymer Polymers 0.000 claims description 18
- 238000005530 etching Methods 0.000 claims description 13
- 239000007788 liquid Substances 0.000 claims description 10
- 238000004519 manufacturing process Methods 0.000 claims description 9
- 239000007921 spray Substances 0.000 claims description 8
- 238000005507 spraying Methods 0.000 claims description 5
- 238000000034 method Methods 0.000 description 16
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- 229910021578 Iron(III) chloride Inorganic materials 0.000 description 2
- 239000005018 casein Substances 0.000 description 2
- BECPQYXYKAMYBN-UHFFFAOYSA-N casein, tech. Chemical compound NCCCCC(C(O)=O)N=C(O)C(CC(O)=O)N=C(O)C(CCC(O)=N)N=C(O)C(CC(C)C)N=C(O)C(CCC(O)=O)N=C(O)C(CC(O)=O)N=C(O)C(CCC(O)=O)N=C(O)C(C(C)O)N=C(O)C(CCC(O)=N)N=C(O)C(CCC(O)=N)N=C(O)C(CCC(O)=N)N=C(O)C(CCC(O)=O)N=C(O)C(CCC(O)=O)N=C(O)C(COP(O)(O)=O)N=C(O)C(CCC(O)=N)N=C(O)C(N)CC1=CC=CC=C1 BECPQYXYKAMYBN-UHFFFAOYSA-N 0.000 description 2
- 235000021240 caseins Nutrition 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 230000005484 gravity Effects 0.000 description 2
- RBTARNINKXHZNM-UHFFFAOYSA-K iron trichloride Chemical compound Cl[Fe](Cl)Cl RBTARNINKXHZNM-UHFFFAOYSA-K 0.000 description 2
- 238000005406 washing Methods 0.000 description 2
- 229910001209 Low-carbon steel Inorganic materials 0.000 description 1
- JOSWYUNQBRPBDN-UHFFFAOYSA-P ammonium dichromate Chemical compound [NH4+].[NH4+].[O-][Cr](=O)(=O)O[Cr]([O-])(=O)=O JOSWYUNQBRPBDN-UHFFFAOYSA-P 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000003628 erosive effect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 235000013336 milk Nutrition 0.000 description 1
- 239000008267 milk Substances 0.000 description 1
- 210000004080 milk Anatomy 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
- H01J9/02—Manufacture of electrodes or electrode systems
- H01J9/14—Manufacture of electrodes or electrode systems of non-emitting electrodes
- H01J9/142—Manufacture of electrodes or electrode systems of non-emitting electrodes of shadow-masks for colour television tubes
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- ing And Chemical Polishing (AREA)
Description
【発明の詳細な説明】
〔発明の技術分野〕
本発明はシヤドウマスクの製造方法に係り、特
に板厚が0.20〜0.40mmtと厚いシヤドウマスク素
材を使用し、蝕刻工程で塩化第2鉄溶液をスプレ
イ法により吹きつけて微細精密な電子ビーム通過
孔部を穿設するシヤドウマスクの製造方法に関す
るものである。[Detailed Description of the Invention] [Technical Field of the Invention] The present invention relates to a method for manufacturing a shadow mask, and in particular, a thick shadow mask material with a plate thickness of 0.20 to 0.40 mm is used, and a ferric chloride solution is sprayed in the etching process. The present invention relates to a method of manufacturing a shadow mask in which fine and precise electron beam passage holes are formed by blowing the hole.
近年、テレビジヨン受像機がビデオやオーデイ
オ機器のコンポーネントの1つとして利用され、
デザイン的にも簡素で機能的なものが要求されて
いる。そのため、テレビジヨン受像機に組み込ま
れるカラーブラウン管も画面が球面状からほぼ平
面状になり、かつ画面の4隅の画像の切れをなく
して、見易くしたものに移り変りつつある。
In recent years, television receivers have been used as one of the components of video and audio equipment.
A simple and functional design is also required. For this reason, the color cathode ray tubes incorporated in television receivers are also changing from spherical screens to nearly flat screens, with no cut-offs in the image at the four corners of the screen, making them easier to view.
一方、周知のようにカラーブラウン管に内装さ
れるシヤドウマスクの最も重要な特性は、電子銃
より射出された電子ビームがシヤドウマスクの電
子ビーム通過孔部を通過して、忠実に蛍光面を形
成する各色に発光する蛍光体層に正確に射突させ
ることである。しかしながら動作中のシヤドウマ
スクはスイツチオン後の時間の経過と共に、電子
ビームの射突による温度上昇を伴い、熱膨脹を起
し、その結果、電子ビームのスポツトと蛍光体層
との位置が合致しなくなり、所謂ミスランデイン
グを生じて、色ずれ現象を起す。 On the other hand, as is well known, the most important characteristic of the shadow mask built into a color cathode ray tube is that the electron beam emitted from the electron gun passes through the electron beam passage hole of the shadow mask, and each color faithfully forms a phosphor screen. The goal is to accurately hit the emitting phosphor layer. However, as time passes after the shadow mask is switched on, the temperature of the shadow mask increases due to the impact of the electron beam, causing thermal expansion.As a result, the positions of the electron beam spots and the phosphor layer no longer match, resulting in so-called Mislanding occurs, causing a color shift phenomenon.
この色ずれ現象は平面状カラーブラウン管の場
合は球面状カラーブラウン管に比較し、更に荷酷
になり、シヤドウマスクの微細な変形によつても
色ずれ現象が顕著に起り易いという問題がある。 This color shift phenomenon is more severe in the case of a flat color cathode ray tube than in a spherical color cathode ray tube, and there is a problem in that the color shift phenomenon is easily caused even by minute deformation of the shadow mask.
例えば従来の球面状、19V、ミニネツクタイプ
90゜偏向カラーブラウン管のフエースプレートの
内面が半径約800mmRに対して、平面状、20V、
ミニネツクタイプ90゜偏向カラーブラウン管のフ
エースプレートの内面は半径約1350mmRとなり、
シヤドウマスクの曲率もフエースプレートの内面
の半径に応じて決定され、前者では半径ほぼ760
mmR、後者ではほぼ1300mmRとなる。 For example, conventional spherical, 19V, mini-net type
The inner surface of the face plate of a 90° deflection color cathode ray tube is flat with a radius of approximately 800 mm, 20 V,
The inner surface of the face plate of the mini network type 90° deflection color cathode ray tube has a radius of approximately 1350mmR.
The curvature of the shadow mask is also determined according to the radius of the inner surface of the face plate, and the radius of the former is approximately 760.
mmR, the latter is approximately 1300mmR.
本発明者らの実験によれば、このようなシヤド
ウマスクについては従来のシヤドウマスク素材の
板厚約0.18mmtから約0.30±0.10mmtと大幅に厚
くすることにより、シヤドウマスクの熱膨脹に伴
う変形量を減少させ、また物理的な衝撃力に対し
ても強くすることが可能であることが裏づけされ
た。 According to experiments conducted by the present inventors, the thickness of such a shadow mask can be significantly increased from approximately 0.18 mm to approximately 0.30±0.10 mm to reduce the amount of deformation caused by thermal expansion of the shadow mask. It was also confirmed that it is possible to make the material strong against physical impact force.
しかしながらこのような板厚の厚いシヤドウマ
スク素材を腐蝕する際には次のような難問題があ
る。即ち、シヤドウマスク素材に微細な電子ビー
ム通過孔部を腐蝕貫通させるには従来より約2倍
の腐蝕時間を要するため、第1図乃至第4図に示
すようにシヤドウマスク素材1の両主面に被着形
成された感光膜2及び3にそれぞれ直径d1,d2の
露出部を設けたのち、腐蝕工程において、浅い孔
部41,51からやや深い孔部42,52、更に深い
孔部43,53を穿設し、直径D1,D2の開口径を
有する電子ビーム通過孔部6を穿設する場合、腐
蝕液による矢印7方向の側壁腐蝕が起り、その結
果D1−d1及びD2−d2の感光膜2,3の大きなひ
さし21,31が発生し、腐蝕液のスプレイによる
衝撃力でひさし21,31に変形部8や欠損部9な
どが発生し、最終的に電子ビーム通過孔部6の形
状を悪くし、シヤドウマスクとして不良になると
云う問題がある。 However, when corroding such a thick shadow mask material, there are the following difficulties. That is, since it takes approximately twice as long to corrode the fine electron beam passage holes through the shadow mask material as in the conventional method, both main surfaces of the shadow mask material 1 are coated as shown in FIGS. 1 to 4. After forming exposed portions with diameters d 1 and d 2 in the photoresist films 2 and 3, respectively, in an etching process, holes are formed from shallow holes 4 1 and 5 1 to slightly deeper holes 4 2 and 5 2 and even deeper. When the holes 4 3 and 5 3 are bored and the electron beam passing hole 6 having the opening diameters D 1 and D 2 is bored, side wall corrosion occurs in the direction of the arrow 7 due to the corrosive liquid, resulting in D Large eaves 2 1 , 3 1 of the photosensitive films 2 , 3 at 1 - d 1 and D 2 - d 2 are generated, and the eaves 2 1 , 3 1 are deformed or damaged by the impact force caused by the spray of the corrosive liquid. There is a problem in that the shape of the electron beam passage hole 6 is ultimately deteriorated and the shadow mask becomes defective.
本発明は前述の問題点に鑑みなされたものであ
り、平面状カラーブラウン管に使用して好適な
0.20〜0.40mmtの板厚を有し、品位の良好な微細
精密の電子ビーム通過孔部を穿設することが可能
なシヤドウマスクの製造方法を提供することを目
的としている。
The present invention was made in view of the above-mentioned problems, and is suitable for use in flat color cathode ray tubes.
The object of the present invention is to provide a method for manufacturing a shadow mask which has a plate thickness of 0.20 to 0.40 mm and is capable of forming fine and precise electron beam passage holes of good quality.
即ち、本発明は、両主面にそれぞれ小孔形成部
及び大孔形成部を除いて感光膜を残存してなる所
定板厚の長尺のシヤドウマスク素材を移動させな
がら腐蝕槽にてスプレイ法により腐蝕液を所定衝
撃力で吹きつけて電子ビーム通過孔部を穿設する
シヤドウマスクの製造方法において、板厚0.2〜
0.4mmのシヤドウマスク素材の両主面にそれぞれ
小孔形成部及び大孔形成部を除いて膜厚8〜12μ
mの感光膜を残存させ、腐蝕槽をシヤドウマスク
素材の進行方向から第1の腐蝕槽、第2の腐蝕槽
に分割し、第1の腐蝕槽においては感光膜に与え
る衝撃力を5〜10g/cm2としてシヤドウマスク素
材の両主面に腐蝕液を吹きつけ、第2の腐蝕槽に
おいては感光膜に与える衝撃力を2.5〜5g/cm2
としてシヤドウマスク素材の両主面に腐蝕液を吹
きつけて電子ビーム通過孔部を穿設することを特
徴としている。
That is, in the present invention, a long shadow mask material having a predetermined thickness and having a photoresist film remaining on both main surfaces except for the small hole forming part and the large hole forming part is moved and sprayed in an etching bath. In a method for manufacturing a shadow mask in which an electron beam passage hole is formed by spraying a corrosive liquid with a predetermined impact force,
The film thickness is 8 to 12 μm on both main surfaces of the 0.4 mm shadow mask material, excluding the small hole forming area and the large hole forming area.
The etching tank is divided into a first etching tank and a second etching tank from the traveling direction of the shadow mask material, and the impact force applied to the photoresist film in the first etching tank is set at 5 to 10 g/m. A corrosive liquid is sprayed on both main surfaces of the shadow mask material at a pressure of 2.5 to 5 g/cm 2 in the second corrosive bath .
The method is characterized in that electron beam passage holes are formed by spraying an etchant onto both main surfaces of the shadow mask material.
次に本発明の一実施例を第5図乃至第11図に
より説明する。
Next, one embodiment of the present invention will be described with reference to FIGS. 5 to 11.
先ずシヤドウマスク素材として0.3mmtの軟鋼
板の長尺物を用意し、両主面を清浄にしたのち、
このシヤドウマスク素材に牛乳カゼインを主成分
とした感光液、即ち増感剤として重クロム酸アン
モニウムをカゼインに対して重量%で約1%添加
し、比重1.040(従来は1.028)に調整した感光液
をデイツプ法による垂直引上げ方法で塗布し、約
100℃の雰囲気中で約10分間乾燥し、ほぼ10μm
(従来は5μm)厚の感光膜を形成する。次に露光
工程において、小孔部として第5図に示す孔幅d3
が0.060mm(従来は0.115mm)、ブリツヂ幅b1が
0.235mm(従来は0.200mm)の小孔側ネガパターン
101、大孔部として第6図に示す孔幅d4が0.410
mm(従来は0.405mm)、ブリツヂ幅b2が0.150mm(従
来は0.125mm)の大孔側ネガパターン102をそれ
ぞれ感光膜に密接し、約1mの距離から5KWの
水銀ランプで約1分間露光を行なう。次に約40℃
の温純水にて圧力1Kg/cm2のスプレイ圧で1分間
現像を行ない、150℃の雰囲気で2分間乾燥し、
200℃の雰囲気で1.5分間バーニングする。このよ
うにして第7図に示す両主面にそれぞれ孔幅d3の
小孔形成部及び孔幅d4の大孔形成部を除いて感光
膜12,13が残存してなるシヤドウマスク素材
11を製作する。 First, prepare a long piece of 0.3 mmt mild steel plate as a shadow mask material, and after cleaning both main surfaces,
To this shadow mask material, a photosensitive solution containing milk casein as a main component, that is, ammonium dichromate as a sensitizer was added to the casein in an amount of about 1% by weight, and the specific gravity was adjusted to 1.040 (previously 1.028). Apply by vertical pulling method using dip method, approx.
Dry for about 10 minutes in an atmosphere of 100℃, approximately 10μm
A photoresist film with a thickness (previously 5 μm) is formed. Next, in the exposure process, the hole width d 3 shown in FIG.
is 0.060mm (previously 0.115mm), bridge width b 1 is
The small hole side negative pattern 10 1 is 0.235 mm (previously 0.200 mm), and the hole width d 4 shown in Fig. 6 as the large hole is 0.410.
A large-hole side negative pattern 10 2 with a bridge width b 2 of 0.150 mm (previously 0.125 mm) and a bridge width b 2 of 0.150 mm (previously 0.405 mm) was brought into close contact with the photoresist film and heated from a distance of about 1 m using a 5KW mercury lamp for about 1 minute. Perform exposure. Then about 40℃
Developed with warm pure water for 1 minute at a spray pressure of 1 kg/ cm2 , dried for 2 minutes in an atmosphere of 150°C,
Burn in an atmosphere of 200℃ for 1.5 minutes. In this way, a shadow mask material 11 with the photoresist films 12 and 13 remaining on both main surfaces shown in FIG. 7 except for the small hole forming part with the hole width d 3 and the large hole forming part with the hole width d 4 is prepared. To manufacture.
次に腐蝕工程を第8図乃至第11図により説明
すると、腐蝕は長尺のシヤドウマスク素材11を
その長手方向に移動させながら行われる。腐蝕装
置はシヤドウマスク素材11の矢印20で示す進
行方向から第1の腐蝕槽21、第2の腐蝕槽2
2、水洗い槽23からなり、第1の腐蝕槽21で
は感光膜12,13に与える衝撃力を5〜10g/
cm2としてシヤドウマスク素材11の両主面にスプ
レイノズル21aからの腐蝕液を吹きつけ、第9
図に示す浅い孔部141,151から第10図に示
すやや深い孔部142,152迄穿設する。図を見
てもわかるように、この腐蝕工程では矢印171
方向の側壁腐蝕があまり進まず、感光膜12,1
3のひさし121,131があまり出ないので、ス
プレイノズル21aからスプレイされる腐蝕液が
感光膜12,13に与える衝撃力が5〜10g/cm2
でも、膜厚が約10μmの感光膜12,13は充分
に耐えられる。この5〜10g/cm2の衝撃力は新倉
工業製のEX−430でスプレイ圧1.5〜2.5Kg、ノズ
ル21aとシヤドウマスク素材11との間の距離
300mmで得られる。この場合の腐蝕は液温67℃、
比重1.467の塩化第2鉄溶液を使用して約6分間
行なう。 Next, the etching process will be explained with reference to FIGS. 8 to 11. Erosion is performed while moving the long shadow mask material 11 in its longitudinal direction. The corrosion equipment includes a first corrosion tank 21 and a second corrosion tank 2 from the direction of movement of the shadow mask material 11 shown by the arrow 20.
2. Consists of a water washing tank 23, and in the first corrosion tank 21, the impact force applied to the photoresist films 12, 13 is set at 5 to 10 g/
cm 2 and spray the corrosive liquid from the spray nozzle 21a onto both main surfaces of the shadow mask material 11.
The holes are drilled from shallow holes 14 1 and 15 1 shown in the figure to slightly deeper holes 14 2 and 15 2 shown in FIG. 10. As you can see from the figure, in this corrosion process, arrow 17 1
The side wall corrosion in the direction does not progress much, and the photoresist film 12,1
Since the eaves 12 1 and 13 1 of No. 3 do not come out much, the impact force exerted on the photoresist films 12 and 13 by the corrosive liquid sprayed from the spray nozzle 21a is 5 to 10 g/cm 2 .
However, the photoresist films 12 and 13 having a film thickness of about 10 μm can withstand the problem sufficiently. This impact force of 5 to 10 g/cm 2 was applied using EX-430 manufactured by Niikura Kogyo, with a spray pressure of 1.5 to 2.5 kg, and a distance between the nozzle 21a and the shadow mask material 11.
Obtained at 300mm. Corrosion in this case occurs at a liquid temperature of 67°C.
This is carried out for about 6 minutes using a ferric chloride solution with a specific gravity of 1.467.
次の第2の腐蝕槽22では第10図のやや深い
孔部142,152から第11図の更に深い孔部1
43,153まで穿設して電子ビーム通過孔部16
を形成する。この時には矢印172方向の側壁腐
蝕が進み、感光膜12,13のひさし122,1
32が次第に出てくるので、スプレイノズル22
aから腐蝕液が感光膜に与える衝撃力を第1の腐
蝕槽の約半分である2.5〜5g/cm2に下げ、シヤ
ドウマスク素材11の両主面に同一組成温度の腐
蝕液を約6分吹きつけて腐蝕工程を終了する。 In the next second corrosion tank 22, from the slightly deeper holes 14 2 and 15 2 shown in FIG. 10 to the even deeper hole 1 shown in FIG.
Drill up to 4 3 , 15 3 to form electron beam passage hole 16
form. At this time, the side wall corrosion progresses in the two directions of the arrow 17, and the eaves 12 2 , 1 of the photoresist films 12 , 13
3 2 will gradually come out, so spray nozzle 22
From a, the impact force exerted by the etchant on the photosensitive film was lowered to 2.5 to 5 g/cm 2 , which is about half of that in the first etch tank, and the etchant with the same composition and temperature was sprayed on both main surfaces of the shadow mask material 11 for about 6 minutes. to finish the corrosion process.
このようにして穿設された電子ビーム通過孔部
16の電子銃側即ち小孔側スロツト幅D3が0.200
mm(従来も同じ)、蛍光面側即ち大孔側スロツト
幅D4が0.580mm(従来は0.510mm)、ブリツジ幅が
0.120mm(従来も同じ)となり、側壁腐蝕量D3−
d3は0.140mm(従来は0.085mm)、D4−d4は0.170mm
(従来は0.105mm)となり、従来に比較して、ひさ
し122,132は長くなるが、第2の腐蝕槽22
では感光膜12,13が厚く、更に衝撃力を下げ
ているので、腐蝕工程の終了まで、ひさし122,
132の変形や欠損がなく、品位良好な電子ビー
ム通過孔部16を穿設することができた。 The slot width D 3 on the electron gun side, that is, on the small hole side of the electron beam passage hole 16 drilled in this way is 0.200.
mm (same as before), slot width D4 on the phosphor screen side, that is, large hole side, is 0.580mm (previously 0.510mm), bridge width is
0.120mm (same as conventional), side wall corrosion amount D 3 −
d 3 is 0.140mm (previously 0.085mm), D 4 − d 4 is 0.170mm
(previously 0.105 mm), the eaves 12 2 and 13 2 are longer than the conventional one, but the second corrosion tank 22
Since the photosensitive films 12 and 13 are thick and further reduce the impact force, the eaves 12 2 ,
It was possible to drill an electron beam passage hole 16 with good quality and no deformation or damage.
次に水洗槽23で洗い、感光膜を除去してフラ
ツトマスクが得られる。 Next, the mask is washed in a washing tank 23 to remove the photoresist film and a flat mask is obtained.
尚、本発明は板厚0.2〜0.4mmのシヤドウマスク
素材に対して膜厚8〜12μmの感光膜を形成した
場合に有効である。 The present invention is effective when a photoresist film having a thickness of 8 to 12 μm is formed on a shadow mask material having a thickness of 0.2 to 0.4 mm.
尚また前記実施例は矩形状の電子ビーム通過孔
部について述べたが、円形の電子ビーム通過孔部
でも同様であることは説明する迄もない。 Furthermore, although the above embodiment has been described with respect to a rectangular electron beam passage hole, it goes without saying that the same applies to a circular electron beam passage hole.
上述のように本発明によれば、シヤドウマスク
素材弐板厚を厚くした時でも感光膜を厚くし、更
に腐蝕を衝撃力の条件の異なる2つの腐蝕槽で行
なうと云う簡単な方法で平面状カラーブラウン管
に好適なシヤドウマスクを品位よく形成すること
が可能であり、その工業的価値は極めて大であ
る。
As described above, according to the present invention, even when the thickness of the shadow mask material is increased, the photoresist film is made thicker, and furthermore, the planar collar is etched using two etching baths with different impact force conditions. It is possible to form a shadow mask suitable for cathode ray tubes with good quality, and its industrial value is extremely large.
第1図乃至第4図は従来のシヤドウマスクの製
造方法を工程順に示す説明用断面図、第5図乃至
第11図は本発明のシヤドウマスクの製造方法の
一実施例を示す図であり、第5図は小孔側ネガパ
ターンの説明図、第6図は大孔側ネガパターンの
説明図、第7図は腐蝕工程前のシヤドウマスク素
材と感光膜の関係を示す説明用断面図、第8図は
腐蝕装置の線図、第9図乃至第11図は腐蝕工程
における腐蝕状態を工程順に示す説明用断面図で
ある。
1,11……シヤドウマスク素材、2,3,1
2,13……感光膜、21,31,121,131,
122,132……ひさし、41,51,141,15
1……浅い孔部、42,52,142,152……やや
深い孔部、43,53,143,153……更に深い
孔部、6,16……電子ビーム通過孔部、21…
…第1の腐蝕槽、22……第2の腐蝕槽、23…
…水洗い槽。
1 to 4 are explanatory cross-sectional views showing a conventional method for manufacturing a shadow mask in the order of steps, and FIGS. 5 to 11 are views showing an embodiment of the method for manufacturing a shadow mask according to the present invention. Figure 6 is an explanatory diagram of the negative pattern on the small hole side, Figure 6 is an explanatory diagram of the negative pattern on the large hole side, Figure 7 is an explanatory cross-sectional view showing the relationship between the shadow mask material and the photoresist film before the corrosion process, and Figure 8 is Diagrams of the corrosion apparatus and FIGS. 9 to 11 are explanatory cross-sectional views showing the corrosion state in the corrosion process in the order of the process. 1,11...Shadow mask material, 2,3,1
2, 13...photosensitive film, 2 1 , 3 1 , 12 1 , 13 1 ,
12 2 , 13 2 ...Eaves, 4 1 , 5 1 , 14 1 , 15
1 ... Shallow hole, 4 2 , 5 2 , 14 2 , 15 2 ... Slightly deep hole, 4 3 , 5 3 , 14 3 , 15 3 ... Deeper hole, 6, 16... Electron beam Passing hole section, 21...
...First corrosion tank, 22...Second corrosion tank, 23...
...Water tank.
Claims (1)
を除いて感光膜を残存してなる所定板厚の長尺の
シヤドウマスク素材を移動させながら腐蝕槽にて
スプレイ法により腐蝕液を所定衝撃力で吹きつけ
て電子ビーム通過孔部を穿設するシヤドウマスク
の製造方法において、 板厚0.2〜0.4mmのシヤドウマスク素材の両主面
にそれぞれ小孔形成部及び大孔形成部を除いて膜
厚8〜12μmの感光膜を残存させ、腐触槽をシヤ
ドウマスク素材の進行方向から第1の腐蝕槽、第
2の腐蝕槽に分割し、第1の腐触槽においては感
光膜に与える衝撃力を5〜10g/cm2としてシヤド
ウマスク素材の両主面に腐蝕液を吹きつけ、第2
の腐蝕槽においては感光膜に与える衝撃力を2.5
〜5g/cm2としてシヤドウマスク素材の両主面に
腐蝕液を吹きつけて電子ビーム通過孔部を穿設す
ることを特徴とするシヤドウマスクの製造方法。[Claims] 1. A spraying method in an etching tank while moving a long shadow mask material with a predetermined thickness, in which a photoresist film remains on both main surfaces except for small hole forming areas and large hole forming areas. In the method of manufacturing a shadow mask, in which electron beam passing holes are formed by spraying a corrosive liquid with a predetermined impact force, a small hole forming portion and a large hole forming portion are formed on both main surfaces of a shadow mask material having a thickness of 0.2 to 0.4 mm. The photoresist film with a thickness of 8 to 12 μm remains, and the etching tank is divided into a first etching tank and a second etching tank from the direction of movement of the shadow mask material. Spray the corrosive liquid on both main surfaces of the shadow mask material with an impact force of 5 to 10 g/ cm2 , and
In the corrosion bath, the impact force applied to the photoresist film is 2.5
A method for producing a shadow mask, which comprises: spraying a corrosive liquid on both main surfaces of a shadow mask material at a concentration of ~5 g/cm 2 to form electron beam passage holes.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17979182A JPS5971239A (en) | 1982-10-15 | 1982-10-15 | Production method of shadow mask |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17979182A JPS5971239A (en) | 1982-10-15 | 1982-10-15 | Production method of shadow mask |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5971239A JPS5971239A (en) | 1984-04-21 |
JPH0447419B2 true JPH0447419B2 (en) | 1992-08-03 |
Family
ID=16071951
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17979182A Granted JPS5971239A (en) | 1982-10-15 | 1982-10-15 | Production method of shadow mask |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5971239A (en) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5460853A (en) * | 1977-10-06 | 1979-05-16 | Rca Corp | Method of etching continuous articles from band metal plate |
JPS558591A (en) * | 1978-07-03 | 1980-01-22 | Garrett Corp | Method of and apparatus for regulating fluid |
JPS5772232A (en) * | 1980-10-22 | 1982-05-06 | Toshiba Corp | Production of shadow mask for color picture tube |
-
1982
- 1982-10-15 JP JP17979182A patent/JPS5971239A/en active Granted
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5460853A (en) * | 1977-10-06 | 1979-05-16 | Rca Corp | Method of etching continuous articles from band metal plate |
JPS558591A (en) * | 1978-07-03 | 1980-01-22 | Garrett Corp | Method of and apparatus for regulating fluid |
JPS5772232A (en) * | 1980-10-22 | 1982-05-06 | Toshiba Corp | Production of shadow mask for color picture tube |
Also Published As
Publication number | Publication date |
---|---|
JPS5971239A (en) | 1984-04-21 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4339528A (en) | Etching method using a hardened PVA stencil | |
KR940003742B1 (en) | Method of forming small through-holes in thin metal plate | |
US4061529A (en) | Method for making etch-resistant stencil with dichromate-sensitized casein coating | |
IE50906B1 (en) | Method and apparatus for etching a metallic sheet | |
CN1009142B (en) | Method for making shadow masks | |
US5326663A (en) | Method of manufacturing shadow mask | |
JPH0447419B2 (en) | ||
JPH0877922A (en) | Manufacture of shadow mask and shadow mask | |
JPH0519250B2 (en) | ||
US4401508A (en) | Method for removing insolubilized PVA from the surface of a body | |
US4339529A (en) | Etching method using a PVA stencil containing N-methylol acrylamide | |
JPH059755A (en) | Method for forming fine through-hole in metallic thin sheet | |
JP2001325881A (en) | Translucent hole forming method and translucent hole forming apparatus | |
KR890002845B1 (en) | Making method of shadowmask | |
US4865953A (en) | Method for making a stencil with a borax-free, low-dichromate, casein photoresist composition | |
JP4019539B2 (en) | High-definition shadow mask and manufacturing method thereof | |
JPH09324285A (en) | Formation of fine through hole onto metallic thin sheet | |
JPS6070186A (en) | Production of shadow mask | |
JPS58214252A (en) | Production method of shadow mask | |
JP3171061B2 (en) | Manufacturing method of shadow mask | |
JPS60187682A (en) | Manufacture of shadow mask | |
JP2000345373A (en) | Formation of fine through hole in thin metallic sheet, and manufacture of shadow mask | |
JPH1083758A (en) | Manufacture of shadow mask | |
JPH06280051A (en) | Production of shadow mask | |
JP3092468B2 (en) | Manufacturing method of shadow mask |