JPH04328344A - Magneto-optical recording disk - Google Patents
Magneto-optical recording diskInfo
- Publication number
- JPH04328344A JPH04328344A JP9892391A JP9892391A JPH04328344A JP H04328344 A JPH04328344 A JP H04328344A JP 9892391 A JP9892391 A JP 9892391A JP 9892391 A JP9892391 A JP 9892391A JP H04328344 A JPH04328344 A JP H04328344A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- magneto
- film
- optical recording
- protective layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000010410 layer Substances 0.000 claims abstract description 73
- 239000011241 protective layer Substances 0.000 claims abstract description 41
- 239000000758 substrate Substances 0.000 claims abstract description 25
- 229910052751 metal Inorganic materials 0.000 claims abstract description 22
- 150000004767 nitrides Chemical class 0.000 claims abstract description 8
- 229910044991 metal oxide Inorganic materials 0.000 claims abstract description 6
- 239000002184 metal Substances 0.000 claims description 15
- 150000004706 metal oxides Chemical class 0.000 claims description 5
- 230000007613 environmental effect Effects 0.000 abstract description 11
- 238000004544 sputter deposition Methods 0.000 description 14
- 239000011347 resin Substances 0.000 description 12
- 229920005989 resin Polymers 0.000 description 12
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 10
- 230000001681 protective effect Effects 0.000 description 9
- 239000011261 inert gas Substances 0.000 description 7
- 239000000463 material Substances 0.000 description 6
- 229910052786 argon Inorganic materials 0.000 description 5
- 239000007789 gas Substances 0.000 description 4
- 229910052771 Terbium Inorganic materials 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 239000003989 dielectric material Substances 0.000 description 3
- GZCRRIHWUXGPOV-UHFFFAOYSA-N terbium atom Chemical compound [Tb] GZCRRIHWUXGPOV-UHFFFAOYSA-N 0.000 description 3
- 229910002546 FeCo Inorganic materials 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- AYTAKQFHWFYBMA-UHFFFAOYSA-N chromium dioxide Chemical compound O=[Cr]=O AYTAKQFHWFYBMA-UHFFFAOYSA-N 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000000704 physical effect Effects 0.000 description 2
- 229920005668 polycarbonate resin Polymers 0.000 description 2
- 239000004431 polycarbonate resin Substances 0.000 description 2
- 229910052761 rare earth metal Inorganic materials 0.000 description 2
- 238000005546 reactive sputtering Methods 0.000 description 2
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- 229910052692 Dysprosium Inorganic materials 0.000 description 1
- 229910052691 Erbium Inorganic materials 0.000 description 1
- -1 EuOFe Inorganic materials 0.000 description 1
- 229910052693 Europium Inorganic materials 0.000 description 1
- 229910052688 Gadolinium Inorganic materials 0.000 description 1
- 230000005374 Kerr effect Effects 0.000 description 1
- 229910016629 MnBi Inorganic materials 0.000 description 1
- 229910002837 PtCo Inorganic materials 0.000 description 1
- 229910052772 Samarium Inorganic materials 0.000 description 1
- 229910052769 Ytterbium Inorganic materials 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- KBQHZAAAGSGFKK-UHFFFAOYSA-N dysprosium atom Chemical compound [Dy] KBQHZAAAGSGFKK-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- UYAHIZSMUZPPFV-UHFFFAOYSA-N erbium Chemical compound [Er] UYAHIZSMUZPPFV-UHFFFAOYSA-N 0.000 description 1
- OGPBJKLSAFTDLK-UHFFFAOYSA-N europium atom Chemical compound [Eu] OGPBJKLSAFTDLK-UHFFFAOYSA-N 0.000 description 1
- UIWYJDYFSGRHKR-UHFFFAOYSA-N gadolinium atom Chemical compound [Gd] UIWYJDYFSGRHKR-UHFFFAOYSA-N 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 229910052743 krypton Inorganic materials 0.000 description 1
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
- KZUNJOHGWZRPMI-UHFFFAOYSA-N samarium atom Chemical compound [Sm] KZUNJOHGWZRPMI-UHFFFAOYSA-N 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
- NAWDYIZEMPQZHO-UHFFFAOYSA-N ytterbium Chemical compound [Yb] NAWDYIZEMPQZHO-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B11/00—Recording on or reproducing from the same record carrier wherein for these two operations the methods are covered by different main groups of groups G11B3/00 - G11B7/00 or by different subgroups of group G11B9/00; Record carriers therefor
- G11B11/10—Recording on or reproducing from the same record carrier wherein for these two operations the methods are covered by different main groups of groups G11B3/00 - G11B7/00 or by different subgroups of group G11B9/00; Record carriers therefor using recording by magnetic means or other means for magnetisation or demagnetisation of a record carrier, e.g. light induced spin magnetisation; Demagnetisation by thermal or stress means in the presence or not of an orienting magnetic field
- G11B11/105—Recording on or reproducing from the same record carrier wherein for these two operations the methods are covered by different main groups of groups G11B3/00 - G11B7/00 or by different subgroups of group G11B9/00; Record carriers therefor using recording by magnetic means or other means for magnetisation or demagnetisation of a record carrier, e.g. light induced spin magnetisation; Demagnetisation by thermal or stress means in the presence or not of an orienting magnetic field using a beam of light or a magnetic field for recording by change of magnetisation and a beam of light for reproducing, i.e. magneto-optical, e.g. light-induced thermomagnetic recording, spin magnetisation recording, Kerr or Faraday effect reproducing
- G11B11/10582—Record carriers characterised by the selection of the material or by the structure or form
- G11B11/10584—Record carriers characterised by the selection of the material or by the structure or form characterised by the form, e.g. comprising mechanical protection elements
Abstract
Description
【0001】0001
【産業上の利用分野】本発明は光磁気記録ディスクに関
し、さらに詳しくは生産性および耐環境性に優れた光磁
気記録ディスクに関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a magneto-optical recording disk, and more particularly to a magneto-optical recording disk with excellent productivity and environmental resistance.
【0002】0002
【従来の技術】たとえば図4に示すように、基板100
上に誘電体層101、記録層102、誘電体保護層10
3がこの順に設けられたいわゆる3層膜構成の光磁気記
録ディスクが知られている。このような構成の光磁気記
録ディスクにおいて、誘電体層101は、カー効果エン
ハンス膜の機能と記録層の保護膜の機能を兼ね備え、た
とえばZnS膜、SiN膜、AlN膜、SiO膜、Si
O2 膜等の誘電体膜により形成されていた。また、記
録層102はたとえばTbFeCo膜等により形成され
ていた。そして、該記録層102を保護する目的で設け
られている誘電体保護層103は、通常、ZnS膜、S
iN膜等の上記誘電体層と同様の誘電体膜により形成さ
れていた。なお、図4中、110は樹脂製保護膜である
。2. Description of the Related Art For example, as shown in FIG.
A dielectric layer 101, a recording layer 102, and a dielectric protective layer 10 are provided on top.
A so-called magneto-optical recording disk having a so-called three-layer film structure in which 3 layers are provided in this order is known. In the magneto-optical recording disk having such a configuration, the dielectric layer 101 has both the function of a Kerr effect enhancement film and the function of a protective film for the recording layer, and is made of, for example, a ZnS film, a SiN film, an AlN film, a SiO film, or a SiO film.
It was formed from a dielectric film such as an O2 film. Further, the recording layer 102 was formed of, for example, a TbFeCo film. The dielectric protective layer 103 provided for the purpose of protecting the recording layer 102 is usually a ZnS film, an S
It was formed of a dielectric film similar to the dielectric layer described above, such as an iN film. In addition, in FIG. 4, 110 is a resin protective film.
【0003】0003
【発明が解決しようとする課題】しかしながら、上記の
ような従来のいわゆる3層膜構成の光磁気記録ディスク
においては、誘電体保護層を形成する例えばZnS膜等
の誘電体膜をスパッタリングにより成膜する際に、出力
を大きくすると、ターゲットが割れてしまうため出力を
上げることができず、したがって成膜に長時間を要し、
生産性が悪いと言う問題があった。[Problems to be Solved by the Invention] However, in the conventional magneto-optical recording disk having a so-called three-layer film structure as described above, a dielectric film such as a ZnS film, which forms a dielectric protective layer, is formed by sputtering. If you increase the output when doing this, the target will break, so you cannot increase the output, and therefore it takes a long time to form the film.
There was a problem with poor productivity.
【0004】また、ZnS膜等からなる誘電体保護層の
物性とTbFeCo膜等からなる記録層の物性とが大き
く異なるため、特に高温多湿環境下では誘電体保護層に
よる記録層の保護効果が充分に奏されず、耐環境性が充
分ではないという問題もあった。本発明はかかる事情に
基ずいてなされたものであり、本発明の目的は生産性お
よび耐環境性に優れた光磁気記録ディスクを提供するこ
とにある。Furthermore, since the physical properties of a dielectric protective layer made of a ZnS film or the like are significantly different from those of a recording layer made of a TbFeCo film or the like, the dielectric protective layer does not have a sufficient protective effect on the recording layer, especially in a high temperature and high humidity environment. There was also a problem that the environmental resistance was not sufficient. The present invention has been made based on such circumstances, and an object of the present invention is to provide a magneto-optical recording disk with excellent productivity and environmental resistance.
【0005】[0005]
【課題を解決するための手段】前記の目的を達成するた
めの本発明の要旨は、基板上に誘電体層、記録層、保護
層が前記基板側からこの順に設けらた光磁気記録ディス
クにおいて、上記保護層が上記記録層中に含有されてい
る金属元素のうち少なくとも一種と同様の金属元素を含
有する金属膜、金属酸化物膜および金属窒化物膜のいず
れかにより形成されていることを特徴とする光磁気記録
ディスクである。[Means for Solving the Problems] The gist of the present invention to achieve the above object is to provide a magneto-optical recording disk in which a dielectric layer, a recording layer, and a protective layer are provided on a substrate in this order from the substrate side. , the protective layer is formed of one of a metal film, a metal oxide film, and a metal nitride film containing at least one metal element similar to the metal element contained in the recording layer; This is a special magneto-optical recording disk.
【0006】[0006]
【作用】本発明の光磁気記録ディスクにおいては、基板
上に形成された誘電体層上に設けられた記録層上に形成
されている保護層が該記録層中に含有されている金属元
素のうち少なくとも一種と同様の金属元素を含有する金
属膜、金属酸化物膜および金属窒化物膜のいずれかによ
り形成されている。このような保護層を形成する金属膜
、金属酸化物膜および金属窒化物膜の成膜速度はいずれ
も従来の光磁気記録ディスクにおける誘電体保護層を形
成するZnS膜等の誘電体膜の成膜速度よりも高速であ
るため、成膜時間が短縮される。したがって、本発明の
光磁気記録ディスクは、従来のいわゆる3層膜構成の光
磁気記録ディスクに比較して生産性に優れている。また
、このような保護層は記録層との連続的な成膜が可能で
あり、記録層との間に明確な界面が生じないとともに、
その物性が記録層の物性と似ていることから高温多湿の
環境下でも保護層による記録層の保護効果が充分に奏さ
れる。したがって、本発明の光磁気記録ディスクは耐環
境性に優れている。[Operation] In the magneto-optical recording disk of the present invention, the protective layer formed on the recording layer provided on the dielectric layer formed on the substrate protects the metal element contained in the recording layer. It is formed of a metal film, a metal oxide film, or a metal nitride film containing at least one of the same metal elements. The deposition rate of the metal film, metal oxide film, and metal nitride film that form such a protective layer is the same as that of a dielectric film such as a ZnS film that forms a dielectric protective layer in a conventional magneto-optical recording disk. Since it is faster than the film speed, the film formation time is shortened. Therefore, the magneto-optical recording disk of the present invention has superior productivity compared to the conventional magneto-optical recording disk having a so-called three-layer structure. In addition, such a protective layer can be formed continuously with the recording layer, and there is no clear interface between the protective layer and the recording layer.
Since its physical properties are similar to those of the recording layer, the protective layer can sufficiently protect the recording layer even in a high temperature and humidity environment. Therefore, the magneto-optical recording disk of the present invention has excellent environmental resistance.
【0007】[0007]
【実施例】以下に本発明の一実施例について図面を参照
して説明する。図1は本発明の光磁気記録ディスクの層
構成を示す断面図である。図1に示すように、この光磁
気記録ディスクは光透過性を有する基板1上に、誘電体
層2、記録層3、保護層4がこの順に設けられ、さらに
、通常、保護層4上には樹脂製保護膜5が形成されてい
る。DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is a sectional view showing the layer structure of the magneto-optical recording disk of the present invention. As shown in FIG. 1, this magneto-optical recording disk has a dielectric layer 2, a recording layer 3, and a protective layer 4 provided in this order on a substrate 1 having optical transparency. A protective film 5 made of resin is formed.
【0008】基板1の形成材料としては、光透過性を有
しているものであればよく、たとえば光透過性のガラス
、あるいはポリカーボネート樹脂(PC)、アクリル樹
脂等の光透過性樹脂などが挙げられる。このような基板
1の厚さは、通常、0.5〜1.5mm程度である。
基板1の上に設けられる誘電体層2は、たとえばZnS
、SiN、AlN、SiO、SiO2 等の誘電体材料
から形成される。このような誘電体層2の厚さは、通常
、40〜100nm程度である。[0008] The material for forming the substrate 1 may be any material as long as it has light transmittance, such as light transmitting glass or light transmitting resin such as polycarbonate resin (PC) or acrylic resin. It will be done. The thickness of such a substrate 1 is usually about 0.5 to 1.5 mm. The dielectric layer 2 provided on the substrate 1 is made of, for example, ZnS.
, SiN, AlN, SiO, SiO2, or other dielectric material. The thickness of such dielectric layer 2 is usually about 40 to 100 nm.
【0009】このような誘電体層2の上に形成される記
録層3は、たとえばTbFeCo、GaTbCo、Gd
FeBi、DyFe、GdFe、GdCo、BiSmY
bCoGeIG、BiSmErGaIG、GdIG、C
oCr、CrO2 、PtCo、EuOFe、EuO、
MnCuBi、MnAlGe、MnBi等の光磁気記録
材料により形成される。そして、これらの光磁気記録材
料のなかでも、TbFeCoは特に好ましい。記録層3
の厚さは、通常、20〜90nm程度である。The recording layer 3 formed on the dielectric layer 2 is made of, for example, TbFeCo, GaTbCo, Gd
FeBi, DyFe, GdFe, GdCo, BiSmY
bCoGeIG, BiSmErGaIG, GdIG, C
oCr, CrO2, PtCo, EuOFe, EuO,
It is formed from a magneto-optical recording material such as MnCuBi, MnAlGe, or MnBi. Among these magneto-optical recording materials, TbFeCo is particularly preferred. Recording layer 3
The thickness is usually about 20 to 90 nm.
【0010】記録層3上には該記録層3中に含有されて
いる金属元素のうち少なくとも一種と同様の金属元素を
含有する金属膜、金属酸化物膜および金属窒化物膜のい
ずれかにより形成される保護層4が設けられる。このよ
うな保護層4の形成材料としては、記録層3中に含有さ
れている金属元素と同様の金属元素のなかでも、たとえ
ばテルビウム(Tb)、ガドリニウム(Gd)、ジスプ
ロシウム(Dy)、ユウロピウム(Eu)、エルビウム
(Er)、サマリウム(Sm)、イッテルビウム(Yb
)等の希土類元素;アルミニウム(Al)、コバルト(
Co)等の不動態化を起こす金属が好ましく、テルビウ
ム(Tb)は特に好ましい。また、保護層4はこれらの
金属の酸化物、窒化物により形成されていてもよい。
なお、記録層3中に2種類以上の希土類元素が含有され
ている場合には、保護層4の形成材料にそれらのうちの
少なくとも一種の希土類元素を用いればよい。A metal film, a metal oxide film, or a metal nitride film containing at least one of the same metal elements contained in the recording layer 3 is formed on the recording layer 3. A protective layer 4 is provided. Examples of materials for forming such a protective layer 4 include terbium (Tb), gadolinium (Gd), dysprosium (Dy), and europium (among metal elements similar to those contained in the recording layer 3). Eu), erbium (Er), samarium (Sm), ytterbium (Yb
); Rare earth elements such as aluminum (Al), cobalt (
Metals that cause passivation such as Co) are preferred, and terbium (Tb) is particularly preferred. Further, the protective layer 4 may be formed of oxides or nitrides of these metals. Note that when the recording layer 3 contains two or more kinds of rare earth elements, at least one of them may be used as the material for forming the protective layer 4.
【0011】このような保護層4の厚さは、通常、20
〜100mm程度である。保護層4の上には、通常、た
とえば紫外線硬化型の樹脂により樹脂製保護膜5が形成
される。この樹脂製保護膜5は、通常、図1に示すよう
に、保護層4の上部平坦面4aのみならず、誘電体層2
、記録層3および保護層4の側面の全面をも覆うことが
好ましい。これにより誘電体層2、記録層3および保護
層4の側面からの腐蝕が防止される。このような樹脂製
保護膜5の厚さは、通常、0.5〜50μm程度である
。The thickness of such a protective layer 4 is usually 20 mm.
~100mm. A resin protective film 5 is usually formed on the protective layer 4 using, for example, an ultraviolet curing resin. This resin protective film 5 usually covers not only the upper flat surface 4a of the protective layer 4 but also the dielectric layer 2, as shown in FIG.
, it is preferable to also cover the entire side surfaces of the recording layer 3 and the protective layer 4. This prevents corrosion from the sides of the dielectric layer 2, recording layer 3, and protective layer 4. The thickness of such a resin protective film 5 is usually about 0.5 to 50 μm.
【0012】次に本発明の光磁気記録ディスクを製造す
る場合の一例について、図2に基ずいて説明する。ここ
で、真空成膜法としては、スパッタ法が用いられる。ま
ず、真空成膜装置のベルジャ(図示せず)内の基板ホル
ダ20にディスク状の基板1を固定する。次いで、この
ディスク状の基板1の周縁上にリング状のマスク30を
載置し、その後、誘電体材料をターゲットとして基板1
上に誘電体層2を堆積させる。このとき、スパッタ条件
としての不活性ガス圧(スパッタ圧)は、1Pa以下、
特に、0.04〜0.7Paとすることが好ましい。不
活性ガスとしては、アルゴン(Ar)、ヘリウム(He
)、クリプトン(Kr)等が用いられるが、通常は経済
性を考慮してアルゴン(Ar)が好適に用いられる。Next, an example of manufacturing the magneto-optical recording disk of the present invention will be explained based on FIG. 2. Here, a sputtering method is used as the vacuum film forming method. First, a disk-shaped substrate 1 is fixed to a substrate holder 20 in a bell jar (not shown) of a vacuum film forming apparatus. Next, a ring-shaped mask 30 is placed on the periphery of this disk-shaped substrate 1, and then the substrate 1 is exposed using the dielectric material as a target.
A dielectric layer 2 is deposited on top. At this time, the inert gas pressure (sputtering pressure) as a sputtering condition is 1 Pa or less,
In particular, it is preferable to set it as 0.04-0.7Pa. Inert gases include argon (Ar), helium (He
), krypton (Kr), etc., but usually argon (Ar) is preferably used in consideration of economic efficiency.
【0013】次いで、この誘電体層2上に記録層3をス
パッタ法で成膜する。このとき、スパッタ条件としての
不活性ガス圧は0.1〜0.7Pa程度とされる。次い
で、この記録層3上に保護層4をスパッタ法で成膜する
。この場合、スパッタ条件としての不活性ガス圧(例え
ばアルゴンガス圧)は、通常、0.1〜3Pa程度であ
り、好ましくは0.5〜1Pa程度である。Next, a recording layer 3 is formed on this dielectric layer 2 by sputtering. At this time, the inert gas pressure as a sputtering condition is about 0.1 to 0.7 Pa. Next, a protective layer 4 is formed on this recording layer 3 by sputtering. In this case, the inert gas pressure (for example, argon gas pressure) as a sputtering condition is usually about 0.1 to 3 Pa, preferably about 0.5 to 1 Pa.
【0014】また、以上の3種類の膜を成膜するに際し
てのその他の条件は、電力が100〜1500w程度、
ターゲット電圧が0.2〜1.0kw程度、ターゲット
間隔が100〜300mm程度、ターゲット径が130
〜200mm程度、基板温度が20〜100℃程度であ
る。このようなスパッタ成膜工程が完了した後、基板1
上に誘電体層2、記録層3および保護層4がこの順に形
成されたものをベルジャから搬出し、しかる後、マスク
を外し、さらに保護層4の上部平坦面と該保護層4、記
録層3および誘電体層2の側面の全面とを例えば紫外線
硬化型樹脂等の樹脂で被覆して樹脂製保護膜5を形成す
る。[0014] Other conditions for forming the above three types of films are a power of about 100 to 1500 W;
Target voltage is about 0.2 to 1.0 kW, target spacing is about 100 to 300 mm, and target diameter is 130 mm.
~200 mm or so, and the substrate temperature is approximately 20~100°C. After completing such a sputter film formation process, the substrate 1
The dielectric layer 2, the recording layer 3, and the protective layer 4 formed in this order on top are carried out from the bell jar, and then the mask is removed, and the upper flat surface of the protective layer 4, the protective layer 4, and the recording layer are removed. 3 and the entire side surface of the dielectric layer 2 are coated with a resin such as an ultraviolet curable resin to form a resin protective film 5.
【0015】以下、具体的実験例に基づいて本発明をさ
らに詳細に説明する。
実験例−1
真空成膜装置のベルジャ内の基板ホルダに直径30cm
、厚さ1.2mmのディスク状のガラス基板を固定した
。次いで、このディスク状の基板の周縁上に外径45c
m、内径29.5cmのマスクを載置した。The present invention will be explained in more detail below based on specific experimental examples. Experimental example-1 A substrate holder with a diameter of 30 cm is placed inside the bell jar of a vacuum film deposition system.
, a disk-shaped glass substrate with a thickness of 1.2 mm was fixed. Next, an outer diameter of 45c is placed on the periphery of this disk-shaped substrate.
m, and a mask with an inner diameter of 29.5 cm was placed.
【0016】次いで、誘電体材料としてZnSをターゲ
ットとして誘電体層をスパッタ法で厚さ85nmに成膜
させた。このとき、不活性ガス圧(スパッタ圧)は0.
7Paとし、また不活性ガスにはアルゴン(Ar)を用
いた。その後、この誘電体層の上にTbFeCo膜から
なる記録層をスパッタ法で厚さ60nmに成膜させた。
このとき不活性ガス圧(アルゴンガス圧)は0.5Pa
とした。Next, a dielectric layer was formed to a thickness of 85 nm by sputtering using ZnS as a target as a dielectric material. At this time, the inert gas pressure (sputtering pressure) is 0.
The pressure was 7 Pa, and argon (Ar) was used as the inert gas. Thereafter, a recording layer made of a TbFeCo film was formed to a thickness of 60 nm on this dielectric layer by sputtering. At this time, the inert gas pressure (argon gas pressure) is 0.5 Pa.
And so.
【0017】続いて、この記録層の上にテルビウム(T
b)からなる保護層をスパッタ法で上記記録層の成膜と
連続して厚さ50nmに成膜させた。すなわち、Tbお
よびFeCoをターゲットとするスパッタリングにおい
て、Tbのシャッターのみを開き、FeCoのシャッタ
ーを閉じることにより、記録層の成膜と保護層の成膜と
を連続的に行った。Subsequently, terbium (T) is deposited on this recording layer.
A protective layer consisting of b) was formed to a thickness of 50 nm continuously with the formation of the recording layer by sputtering. That is, in sputtering using Tb and FeCo as targets, only the Tb shutter was opened and the FeCo shutter was closed, thereby forming the recording layer and the protective layer continuously.
【0018】その後、以上のようにしてディスク状の基
板上に誘電体層、記録層および保護層をこの順に成膜し
たものをベルジャから取り出し、保護層の上部平坦面と
該保護層、記録層および誘電体層の側面の全面に紫外線
硬化型樹脂をスピンコート法により塗布して厚さ0.0
5mmの樹脂製保護膜を形成した。得られた光磁気記録
ディスクについて温度80℃、湿度90%の条件で耐環
境性加速試験を行ったところ、図3に○印で示す結果を
得た。
実験例−2
前記実験例1と同様にして基板上に誘電体層および記録
層を、順次、成膜した後、アルゴン(Ar)ガスを供給
している真空成膜装置内にさらに窒素(N2)ガスを供
給し、Tbをターゲットとする反応性スパッタを行って
厚さ50nmのTb窒化物膜からなる保護層を成膜させ
た。以後、前記実験例1と同様にして光磁気記録ディス
クを作製した。
実験例−3
前記実験例1と同様にして基板上に誘電体層および記録
層を、順次、成膜した後、アルゴン(Ar)ガスを供給
している真空成膜装置内にさらに酸素(O2)ガスを供
給し、Tbをターゲットとする反応性スパッタを行って
厚さ50nmのTb酸化物膜からなる保護層を成膜させ
た。以後、前記実験例1と同様にして光磁気記録ディス
クを作製した。
比較実験例−1
前記実験例1と同様にして基板上に誘電体層および記録
層を、順次、成膜した後、ZnSをターゲットとするス
パッタ法を行って厚さ50nmのZnS膜からなる誘電
体保護層を成膜させた。このとき、該ZnS膜の成膜に
は前記実験例1におけるTb膜の成膜に要した時間の約
3倍の時間を要した。以後、前記実験例1と同様にして
光磁気記録ディスクを作製した。Thereafter, the dielectric layer, the recording layer, and the protective layer formed in this order on the disk-shaped substrate as described above are taken out of the bell jar, and the upper flat surface of the protective layer, the protective layer, and the recording layer are removed. Then, apply ultraviolet curable resin to the entire side surface of the dielectric layer by spin coating to a thickness of 0.0
A 5 mm resin protective film was formed. When the obtained magneto-optical recording disk was subjected to an accelerated environmental resistance test under the conditions of a temperature of 80° C. and a humidity of 90%, the results shown in FIG. 3 were obtained. Experimental Example 2 After sequentially forming a dielectric layer and a recording layer on a substrate in the same manner as in Experimental Example 1, nitrogen (N2 ) A protective layer consisting of a Tb nitride film having a thickness of 50 nm was formed by supplying gas and performing reactive sputtering using Tb as a target. Thereafter, a magneto-optical recording disk was produced in the same manner as in Experimental Example 1. Experimental Example 3 After sequentially forming a dielectric layer and a recording layer on a substrate in the same manner as in Experimental Example 1, oxygen (O2 ) A protective layer consisting of a Tb oxide film having a thickness of 50 nm was formed by supplying a gas and performing reactive sputtering using Tb as a target. Thereafter, a magneto-optical recording disk was produced in the same manner as in Experimental Example 1. Comparative Experimental Example 1 After sequentially forming a dielectric layer and a recording layer on a substrate in the same manner as in Experimental Example 1, a sputtering method using ZnS as a target was performed to form a dielectric layer made of a ZnS film with a thickness of 50 nm. A body protection layer was deposited. At this time, it took approximately three times as long to form the ZnS film as the time required to form the Tb film in Experimental Example 1. Thereafter, a magneto-optical recording disk was produced in the same manner as in Experimental Example 1.
【0019】得られた光磁気記録ディスクについて前記
実験例1におけるのと同様の条件で耐環境加速試験を行
ったところ、図3の●で示した結果が得られた。
実験例の検討
以上の実験例から、本発明の光磁気記録ディスクは比較
実験例1で作製した従来の光磁気記録ディスクに比較し
て保護層の成膜時間が約1/3に短縮されていて生産性
が大巾に向上しているとともに耐環境性も向上している
ことが確認された。When the obtained magneto-optical recording disk was subjected to an accelerated environment resistance test under the same conditions as in Experimental Example 1, the results shown by ● in FIG. 3 were obtained. Consideration of Experimental Examples From the above experimental examples, the time for forming the protective layer on the magneto-optical recording disk of the present invention was reduced to about 1/3 compared to the conventional magneto-optical recording disk produced in Comparative Experimental Example 1. It was confirmed that productivity was greatly improved and environmental resistance was also improved.
【0020】[0020]
【発明の効果】本発明によれば、以上の構成としたので
、保護層の成膜時間が大巾に短縮されて生産性が著しく
向上しているとともに耐環境性も向上していて生産性お
よび耐環境性のいずれにも優れた光磁気記録ディスクが
提供される。[Effects of the Invention] According to the present invention, with the above structure, the time for forming the protective layer is greatly shortened, and productivity is significantly improved, and environmental resistance is also improved, resulting in increased productivity. A magneto-optical recording disk having excellent environmental resistance and environmental resistance is provided.
【図1】本発明の光磁気記録ディスクの一例を示す断面
図である。FIG. 1 is a sectional view showing an example of a magneto-optical recording disk of the present invention.
【図2】本発明の光磁気記録ディスクの製造過程におけ
る状態の一例を示す断面説明図である。FIG. 2 is an explanatory cross-sectional view showing an example of a state during the manufacturing process of the magneto-optical recording disk of the present invention.
【図3】本発明の光磁気記録ディスクおよび従来の光磁
気記録ディスクについての耐環境性加速試験の試験結果
を示すグラフである。FIG. 3 is a graph showing test results of accelerated environmental resistance tests for the magneto-optical recording disk of the present invention and the conventional magneto-optical recording disk.
【図4】従来の光磁気記録ディスクの一例を示す断面図
である。FIG. 4 is a cross-sectional view showing an example of a conventional magneto-optical recording disk.
1…基板 2…誘電体層 3…記録層 4…保護層 1...Substrate 2...Dielectric layer 3...Recording layer 4...Protective layer
Claims (1)
前記基板側からこの順に設けらた光磁気記録ディスクに
おいて、上記保護層が上記記録層中に含有されている金
属元素のうち少なくとも一種と同様の金属元素を含有す
る金属膜、金属酸化物膜および金属窒化物膜のいずれか
により形成されていることを特徴とする光磁気記録ディ
スク。1. In a magneto-optical recording disk in which a dielectric layer, a recording layer, and a protective layer are provided on a substrate in this order from the substrate side, the protective layer comprises one of the metal elements contained in the recording layer. 1. A magneto-optical recording disk characterized in that it is formed of any one of a metal film, a metal oxide film, and a metal nitride film containing at least one of the same metal elements.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9892391A JPH04328344A (en) | 1991-04-30 | 1991-04-30 | Magneto-optical recording disk |
DE19914138108 DE4138108A1 (en) | 1991-04-30 | 1991-11-19 | Magneto=optical recording disc with improved environmental stability - has substrate, non-conducting material layer, recording layer and protective layer, pref. terbium |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9892391A JPH04328344A (en) | 1991-04-30 | 1991-04-30 | Magneto-optical recording disk |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04328344A true JPH04328344A (en) | 1992-11-17 |
Family
ID=14232650
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9892391A Pending JPH04328344A (en) | 1991-04-30 | 1991-04-30 | Magneto-optical recording disk |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPH04328344A (en) |
DE (1) | DE4138108A1 (en) |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3685649T2 (en) * | 1986-01-29 | 1993-01-21 | Fujitsu Ltd | APPARATUS WITH OPTICAL MEMORY AND METHOD FOR THE PRODUCTION THEREOF. |
-
1991
- 1991-04-30 JP JP9892391A patent/JPH04328344A/en active Pending
- 1991-11-19 DE DE19914138108 patent/DE4138108A1/en not_active Ceased
Also Published As
Publication number | Publication date |
---|---|
DE4138108A1 (en) | 1992-11-05 |
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