JPH04176557A - Holding device for member to be polished - Google Patents
Holding device for member to be polishedInfo
- Publication number
- JPH04176557A JPH04176557A JP2302357A JP30235790A JPH04176557A JP H04176557 A JPH04176557 A JP H04176557A JP 2302357 A JP2302357 A JP 2302357A JP 30235790 A JP30235790 A JP 30235790A JP H04176557 A JPH04176557 A JP H04176557A
- Authority
- JP
- Japan
- Prior art keywords
- polished
- screw
- movable plate
- fixed
- movable part
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000003780 insertion Methods 0.000 claims abstract description 3
- 230000037431 insertion Effects 0.000 claims abstract description 3
- 238000005498 polishing Methods 0.000 claims description 25
- 238000005452 bending Methods 0.000 claims description 2
- 239000010410 layer Substances 0.000 description 14
- 238000010586 diagram Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000004026 adhesive bonding Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 2
- 230000005489 elastic deformation Effects 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- GNFTZDOKVXKIBK-UHFFFAOYSA-N 3-(2-methoxyethoxy)benzohydrazide Chemical compound COCCOC1=CC=CC(C(=O)NN)=C1 GNFTZDOKVXKIBK-UHFFFAOYSA-N 0.000 description 1
- FGUUSXIOTUKUDN-IBGZPJMESA-N C1(=CC=CC=C1)N1C2=C(NC([C@H](C1)NC=1OC(=NN=1)C1=CC=CC=C1)=O)C=CC=C2 Chemical compound C1(=CC=CC=C1)N1C2=C(NC([C@H](C1)NC=1OC(=NN=1)C1=CC=CC=C1)=O)C=CC=C2 FGUUSXIOTUKUDN-IBGZPJMESA-N 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 239000012790 adhesive layer Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000001186 cumulative effect Effects 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
Landscapes
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は1例えばラップ盤等の研摩盤において、試料台
上に被研摩物を装着するための保持装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a holding device for mounting an object to be polished on a sample stage in a polishing machine such as a lapping machine.
この種の技術に関しては、特開昭57−96767号公
報が公知である。Regarding this type of technology, Japanese Patent Laid-Open No. 57-96767 is known.
この公知技術は、接着剤を塗布した基板に薄板状の被研
摩部材を押圧して接着した後、研摩装置によって加工を
行なうものである。In this known technique, a thin plate-like member to be polished is pressed and bonded to a substrate coated with an adhesive, and then processed by a polishing device.
前記の公知技術によれば、底面と頂面とが平行で、−様
な厚さ寸法の被研摩物の頂面を、底面と平行に研摩する
ことは容易である。According to the above-mentioned known technology, the bottom surface and the top surface are parallel, and it is easy to polish the top surface of the object to be polished, which has a thickness of -, parallel to the bottom surface.
しかし、底面と頂面とが平行でない被研摩物の頂面を研
摩するには不遇である。However, this is inconvenient when polishing the top surface of an object to be polished, where the bottom surface and the top surface are not parallel.
更に、被研摩物が層状の部材であり、その中の表層では
なく中間層を研摩することは容易でない。Furthermore, the object to be polished is a layered member, and it is not easy to polish the intermediate layer instead of the surface layer.
特に、研摩目標である層が底面に対して平行でない場合
は、研摩目標層を研摩することは不可能である。In particular, if the layer to be polished is not parallel to the bottom surface, it is impossible to polish the layer to be polished.
ここで、研摩目標である層が底面に対して平行でない場
合であるが、被研摩物単体の形状を意図的にそのように
することもあるが、一般には、被研摩物単体での加工誤
差により、平行でない場合が多く、更には、被研摩物を
、基板に接着する際の接着層厚のばらつきにより、研摩
目標層が傾く。Here, when the layer that is the polishing target is not parallel to the bottom surface, the shape of the object to be polished may be intentionally made that way, but in general, it is due to machining errors in the object to be polished. Therefore, they are often not parallel, and furthermore, the target layer to be polished is tilted due to variations in the adhesive layer thickness when bonding the object to be polished to the substrate.
従って、従来技術では、研摩目標層に溢って正確に研摩
することができない。特に、近年、高精度化の要請に伴
い、サブミクロンオーダの精度で研摩をする必要がある
場合も多く、このような場合、従来技術では、対応不可
である。Therefore, in the prior art, the polishing target layer is overflowed and cannot be polished accurately. In particular, in recent years, with the demand for higher precision, it is often necessary to perform polishing with precision on the order of submicrons, and conventional techniques cannot handle such cases.
本発明の目的は、被研摩物が層状構造をもつ部材であっ
て、その中の特定の研摩目標層が底面と平行でなくても
、容易に高精度で、研摩目標層に沿って研摩を施し得る
ように改良した、被研摩部材の安価な保持装置を提供す
ることにある。An object of the present invention is to easily and accurately polish a member having a layered structure, even if a specific target layer therein is not parallel to the bottom surface. It is an object of the present invention to provide an inexpensive holding device for a member to be polished, which is improved so that it can be easily applied.
(1!IMを解決するための手段〕
上記の目的を達成するために、創作した本発明に係る保
持装置の基本的原理を略述する。(1!Means for solving IM) In order to achieve the above object, the basic principle of the holding device according to the present invention created will be briefly described.
すなわち、被研摩物を、従来のように固定構造の試料台
に直接的に接着するのではなく、試料台を、固定部と可
動部に大別し、固定部に対して、可動部を上下方向、傾
動方向のいずれにも調節、固定可能な構造とし、可動部
に対して、被研摩部材を接着する。In other words, instead of directly bonding the object to be polished to a sample stand with a fixed structure as in the past, the sample stand is roughly divided into a fixed part and a movable part, and the movable part is placed above and below the fixed part. It has a structure that can be adjusted and fixed in both the direction and the tilting direction, and the member to be polished is bonded to the movable part.
この原理に基づき、保持装置を具現化する際の基本方針
を、次のように定める。Based on this principle, the basic policy for realizing the holding device is determined as follows.
■ 被研摩部材を、上下方向、傾動方向に、高精度に調
整でき、かつ、調整駆動外力を取り去る際、位置ずれが
生じない構造であること。■ The member to be polished must be able to be adjusted with high accuracy in the vertical and tilting directions, and the structure must be such that no displacement occurs when the external adjustment driving force is removed.
■ 安価な保持装置であること、一般に、前記試料台は
、複数個、研摩装置にセットし用いることが多く、かつ
、前後1糧を含めて、平列作業として、タクトの短縮を
図ることが多い、このため試料台が多数個、必要となる
。そこで、前記保持機構を構成要素が少なく、かつ、簡
単な構造として、低価格化を図る必要がある。■ It is an inexpensive holding device. In general, multiple sample stands are often set in a polishing device, and it is possible to shorten the takt time by performing parallel work including one sample in front and one in front. Therefore, a large number of sample stands are required. Therefore, it is necessary to reduce the cost by making the holding mechanism have a small number of components and a simple structure.
このj[31及び方針に基づく具体的な構成として、本
発明の装置は、被研摩部材を取付けた試料台を装着して
研摩を行なう構造の研摩装置において、上記試料台を、
固定プレートと可動プレートに大別し、この両者を、一
端部で連結、固定し、他端部側面の両者の隙間に、駆動
用部材を挿入し、この個所に設けたねじの回転送り動作
により、駆動用部材を出し入れすることにより、くさび
の原理を応用して、可動プレートを片持はりのように、
弾性変形させて、可動プレートの平面部に接着された被
研摩部材の位置を調節する構造とし、かつ、ねじ及び駆
動用部材を、可動プレートのあおり方向に対して直角方
向に、二対、配置し、二個の駆動用部材の挿入量を異な
らせることにより、被研摩部部材の高さを調節するとと
もに、傾きの調節も可能な構成とし、一対のねじの一方
を右ねじとし、片方を左ねじとしてねじ残留応力を対称
化することにより、ねじ駆動外力を取り去る際の被研摩
部材の位置ずれを極小とする構造とした・
本発明を実施する場合、固定プレートと可動プレートを
円周に沿って配列することが望ましい。As a specific configuration based on this j[31 and policy, the apparatus of the present invention is a polishing apparatus having a structure in which a sample table with a member to be polished attached is attached to perform polishing, in which the sample table is attached to the polishing apparatus.
Roughly divided into a fixed plate and a movable plate, both are connected and fixed at one end, a driving member is inserted into the gap between the two on the side of the other end, and the screw provided at this location is rotated and fed. By moving the driving member in and out, the movable plate can be moved like a cantilever by applying the wedge principle.
It has a structure that adjusts the position of the polished member bonded to the flat surface of the movable plate by elastic deformation, and two pairs of screws and driving members are arranged in a direction perpendicular to the tilting direction of the movable plate. By changing the insertion amount of the two driving members, the height of the member to be polished can be adjusted, and the inclination can also be adjusted. One of the pair of screws is a right-hand thread, and the other is By symmetricalizing the screw residual stress as a left-handed screw, the structure minimizes the positional shift of the polished member when removing the screw drive external force. When implementing the present invention, the fixed plate and the movable plate are arranged circumferentially. It is desirable to arrange them along the same line.
この構成によれば、被研摩部材を直接的に、試料台に固
着(例えば接着)するのではなく、被研摩部材を可動グ
レートに固着(例えば接着)し、この可動プレートを固
定プレートに対して取り付け、かつ、被研摩部材を固着
した可動プレートを。According to this configuration, instead of directly fixing (for example, gluing) the member to be polished to the sample stage, the member to be polished is fixed (e.g., by gluing) to the movable grate, and the movable plate is attached to the fixed plate. A movable plate with attached and fixed part to be polished.
固定プレートに対し、二個の駆動用部材により、高さ方
向にも傾斜方向にも、その取付状態を調節し、被研摩部
材を位置決めできるとともに、駆動外方を取り去る際の
位置ずれも防ぐことができる。To adjust the mounting state of the fixed plate in both the height direction and the inclination direction using the two driving members, to position the member to be polished, and also to prevent positional shift when removing the driving outer part. I can do it.
このため、各可動プレートに固着されている被研摩部材
ごとに、被研摩面の高さ、傾きを調節することができ、
かつ、被研摩部材の研摩目標層を試料台の底面と平行に
、かつ、所定の高さに研摩することができる。Therefore, the height and inclination of the surface to be polished can be adjusted for each member to be polished that is fixed to each movable plate.
In addition, the target layer of the member to be polished can be polished parallel to the bottom surface of the sample stage and to a predetermined height.
第1図は、本発明に係る被研摩部材の保持装置の一実施
例を示す斜視図である。FIG. 1 is a perspective view showing an embodiment of a holding device for a member to be polished according to the present invention.
1は試料台であって、固定プレート2.可動グレート3
、駆動用のテーパビン4、送りねじ5などからなり、可
動プレート5の上面に、多数の被研摩部材6を取り付け
、位置調節後、この試料台1を図宗しない研摩装置に装
着して、研摩が行われる。1 is a sample stage, and a fixed plate 2. Movable grate 3
, a tapered bottle 4 for driving, a feed screw 5, etc., and a large number of members to be polished 6 are attached to the upper surface of the movable plate 5. After adjusting the position, the sample stage 1 is attached to an unconventional polishing device and polished. will be held.
試料台1は、円板状をなし、その中央部で、可動プレー
ト3を、固定プレート2へ、止めねじ7で締結している
。The sample stage 1 has a disk shape, and a movable plate 3 is fastened to a fixed plate 2 at the center thereof with a set screw 7.
第2図、第3図は、それぞれ試料台1の平面図、側面図
を示しており、可動プレートは、中央部から円周方向に
向けて、子穴個の切欠8により子穴分割している。但し
、各分割要素5′、3“は、中央部で連結され、一体構
造部品としている。各分割要素3′、3″などの先端平
面部に、被研摩部材6が、それぞれ、ワックス9で貼着
されている。Figures 2 and 3 show a plan view and a side view of the sample stage 1, respectively, and the movable plate is divided into small holes by notches 8 for each small hole from the center in the circumferential direction. There is. However, each divided element 5', 3'' is connected at the center to form an integral structural component.A member to be polished 6 is coated with wax 9 on the flat end of each divided element 3', 3'', etc. It is pasted.
又、被研摩部材6は、位置決めピン10により位置決め
される。Further, the member to be polished 6 is positioned by a positioning pin 10.
固定プレート2および可動グレートlの外周部は、第2
図、第5図の断面図である纂4図に示すように、テーパ
形状になっている。このテーパ部には、各分割!!累3
′、5“ごとに、二個のテーパビン4.4′が、ねじ5
m、15によって、固定プレート2に組み付けられてい
る。又、テーパピン40貫通孔4aはねじ5aに対して
ばか穴寸法にしている。The outer periphery of the fixed plate 2 and the movable grate l is
As shown in Figure 4, which is a cross-sectional view of Figure 5, it has a tapered shape. This tapered part has each division! ! Cumulative 3
', 5'', two tapered pins 4.4'
It is assembled to the fixed plate 2 by m, 15. Further, the through hole 4a of the taper pin 40 has a diameter that is slightly larger than that of the screw 5a.
固定プレート2と可動プレート5のテーパ部の間隔は、
テーパビン4の外径寸法より、小さくなるように設定し
ている。ここで、可動プレート3の板厚は、弾性的にた
わみ得る程度に薄くし、−万、固定プレート2は、たわ
みが無視できる程度に、板厚を厚くしている。このため
、ねじ5aを回動してテーパピン4を進退させると、(
さびの原理により、可動プレート3の先端部が、弾性的
に変位し、かつ、各分割要素3′、5″ごとに配置した
二個のテーパビンの進退量を異ならせることにより、被
研摩部材6の位置を上下方向のみならず、傾斜方向にも
調節することができる。The distance between the tapered parts of the fixed plate 2 and the movable plate 5 is
It is set to be smaller than the outer diameter of the tapered bin 4. Here, the thickness of the movable plate 3 is made thin enough to allow elastic deflection, and the thickness of the fixed plate 2 is made thick enough to allow negligible deflection. Therefore, when the screw 5a is rotated to advance or retreat the taper pin 4, (
Due to the principle of rust, the tip of the movable plate 3 is elastically displaced, and by varying the amount of advance and retreat of the two taper bins arranged for each dividing element 3', 5'', the member to be polished 6 is The position can be adjusted not only in the vertical direction but also in the tilt direction.
ここで、ねじ5畠の回動動作は、第4図においてビット
16をねじ5aの頭部にかみ合わせ、図示しない駆動ユ
ニットにより、ビット16を回転させることにより行な
う。被研摩部材6の位置調整ラミクロンオーダの精度で
行なうには、ねじ5aとねじ穴部のがた5’a及びビッ
ト駆動ユニットのがたを片寄せする必要上、テーパビン
4を押し込む方向に、ねじを一方向に回転し、可動プレ
ート5を、漸次、あおっていく。Here, the rotation of the screw 5 is performed by engaging the bit 16 with the head of the screw 5a in FIG. 4 and rotating the bit 16 by a drive unit (not shown). In order to adjust the position of the member to be polished 6 with Lamicron order accuracy, it is necessary to shift the backlash 5'a between the screw 5a and the screw hole and the backlash of the bit drive unit. By rotating the screw in one direction, the movable plate 5 is gradually agitated.
そして、被研摩部材6が、所定の高さに到達したら、ビ
ット16をねじ5aの頭部から離脱する。Then, when the member to be polished 6 reaches a predetermined height, the bit 16 is removed from the head of the screw 5a.
次に、ビット離脱時、被研摩部材6が位置ずれしない案
出方法について述べる。Next, a method of devising a method that prevents the member to be polished 6 from shifting when the bit is removed will be described.
一般に、メカニズムの各構成要素が完全剛体でないかぎ
り、外力を取り去ると、建クロンオーダで見た場合、必
らず位置ずれが発生する。In general, unless each component of a mechanism is a completely rigid body, when an external force is removed, a positional shift will inevitably occur on the Cron order.
第5図において、被研摩部材6の調整時右ねじ、5m、
5bを時計方向に回転していくと菖4図において、ねじ
頭部下面とテーパビン4(7)m面間5”aの摩擦力に
より、テーパビン4も時計方向に回転し、更に、テーパ
ビン4と可動プレート3の境界部4 、//の摩擦力に
より、 可動プレート3には11[力のみならず、惰力
も作用する。この結果。In Fig. 5, when adjusting the member to be polished 6, the right-hand thread is 5 m,
As the screw 5b is rotated clockwise, the friction force between the lower surface of the screw head and the surface 5"a of the taper pin 4 (7) causes the taper pin 4 to rotate clockwise, and furthermore, the taper pin 4 and the Due to the frictional force at the boundary 4 of the movable plate 3, not only a force of 11 but also an inertial force acts on the movable plate 3. This result.
可動部グレート5は、その固定端3bを支点として、第
5図に示すように、曲げ変形のみならず、ねじり変形を
伴いながら、イ方向に変位していく。The movable portion grate 5 is displaced in the A direction with its fixed end 3b as a fulcrum, as shown in FIG. 5, with not only bending deformation but also torsional deformation.
そして、目標位置に達したら、次にビットを離脱するが
、この際、ねじ残留応力Pにより、可動プレート3及び
その上に固着させた被研摩部材6は点線で示したように
位置ずれし、この結果、高さ方向にも位置ずれAが発生
する。すなわち、第7図に示すように、ビット16を離
脱する直前では、ねじ5aのストレート部5a“は、
ねじ駆動トルク〒により、ねじり弾性変形、0を生じて
おり。When the target position is reached, the bit is then removed, but at this time, due to the screw residual stress P, the movable plate 3 and the member to be polished 6 fixed thereon are displaced as shown by the dotted line. As a result, a positional deviation A also occurs in the height direction. That is, as shown in FIG. 7, immediately before the bit 16 is removed, the straight portion 5a'' of the screw 5a is
The screw driving torque 〒 causes torsional elastic deformation, 0.
ビット部からの反力により、この状態が保持されている
。ところが、ビット16を離脱すると、反力が無くなる
ため、ねじ残留応力Pにより、ねじは、反時計方向に戻
ろうとする。すると、第5図で、テーパピンチ4.4′
を介して、可動プレート5には、調整時とは、逆方向の
側力が作用し、この結果、可動グレート5は、口方向に
位置ずれする。このため、被研摩部材6の目標層6−も
位置ずれAしてしまう。また、仮に試行錯誤を繰り返し
て、かろうじて目標公差内に位置決めできたとしても、
第5図において、可動プレートには、イ方向の逆向きに
戻ろうとする力が内在しているため、研摩時の加工外力
が作用すると内在力が解放され、位置ずれし正しく研摩
することができない。This state is maintained by the reaction force from the bit part. However, when the bit 16 is removed, the reaction force disappears, and the screw tends to return counterclockwise due to the screw residual stress P. Then, in Fig. 5, taper pinch 4.4'
A side force in the opposite direction to that during adjustment is applied to the movable plate 5 via the movable plate 5, and as a result, the movable grate 5 is displaced in the direction of the mouth. For this reason, the target layer 6- of the member to be polished 6 is also displaced A. Also, even if you are able to position within the target tolerance through repeated trial and error,
In Figure 5, the movable plate has an inherent force that tries to return in the opposite direction of A, so when an external force is applied during polishing, the inherent force is released, causing the plate to shift position and prevent proper polishing. .
そこで、本発明では、第6図に示すように、−対の右ね
じ5m、左ねじ15により、テーパビン4.4′をそれ
ぞれ駆動する構造とした。Therefore, in the present invention, as shown in FIG. 6, a structure is adopted in which the taper bins 4 and 4' are driven by a pair of right-hand screws 5m and a left-hand screw 15, respectively.
すなわち、調整時、右ねじ5aを時計方向に、左ねじ1
5を反時計方向に回転させて、可動プレート3をあおっ
ていくが、この際、それぞれのテーパビン4.4′から
可動グレート3に作用する摩擦力(側力)は、左右対称
であるため、可動プレート5は、真直に(イ′方向)上
昇する。そして、目標位置に達した後、ビットを離脱す
る際も、ねじ残留応力が、右ねじ5m、左ねじ15を用
いているため、第6図に示すように、左右対称(p、p
’)である、この結果、可動プレート3にねじ残留応力
が作用しても、打ち消し合わすため目標層6aは位置ず
れせず、極めて高精度に(サブミクロンオーダ)被研摩
部材6を位置決めできる。かつ、可動プレート5には、
内在力が残っていないため、研摩外力が作用しても、位
置ずれすることがない。That is, when adjusting, turn the right-hand screw 5a clockwise and turn the left-hand screw 1.
5 in the counterclockwise direction to fan the movable plate 3. At this time, the frictional force (side force) acting on the movable grate 3 from each taper bin 4, 4' is symmetrical, so The movable plate 5 rises straightly (in the A' direction). Even when the bit is removed after reaching the target position, the screw residual stress is left-right symmetrical (p, p
As a result, even if screw residual stress acts on the movable plate 3, the target layer 6a does not shift because it cancels out the stress, and the member to be polished 6 can be positioned with extremely high precision (on the order of submicrons). And, the movable plate 5 has
Since there is no residual force, there will be no displacement even if an external polishing force is applied.
本実施例によれば、被研摩部材6の位置調節かつ固定保
持が実現できる。According to this embodiment, the position of the member to be polished 6 can be adjusted and fixedly held.
いま、第8図に示すように、被研摩部材6の研摩目標層
6aが底面6bに対して角αの傾斜をもっているとする
。このような場合は、可動プレート5を図の左回り方向
に角αだけ、その頂面を5a(仮想線で示す)のように
傾ける。これにより、研摩目標6aが水平になる。Now, as shown in FIG. 8, it is assumed that the polishing target layer 6a of the member to be polished 6 has an inclination of an angle α with respect to the bottom surface 6b. In such a case, the movable plate 5 is tilted counterclockwise in the drawing by an angle α, with its top surface tilted as shown by 5a (indicated by a virtual line). As a result, the polishing target 6a becomes horizontal.
@9図は本実施例の装置を用いて研摩を行う場合の工程
を示すフローチャートである。@9 Figure is a flowchart showing the steps when polishing is performed using the apparatus of this embodiment.
可動プレートの頂面にワックスを塗布しくステップa)
、加熱しくステップb)、被研摩部材を貼着し、(ステ
ップo)s強制冷却しつつ加圧して接着する(ステップ
d)。Step a) Apply wax to the top surface of the movable plate.
In Step b), the member to be polished is adhered by heating (Step o). While being forcedly cooled, it is pressed and bonded (Step d).
次いで、篤4図、第6図について説明したような操作に
より、個々の可動プレートについて高さと傾きの調整を
行う(ステップ・)。Next, the height and inclination of each movable plate are adjusted by the operations described with reference to FIGS. 4 and 6 (step).
この段階で、多数の可動グレート、及び、これに接着さ
れた被研摩部材の上面は一つの水平面に揃っていないの
で、ロータリ研摩盤によって平面出し研摩を行い(ステ
ップf)、その後、試料台1をラップ盤に象り付け(ス
テップg)、仕上げにラッピングを行う(ステップh)
。At this stage, since the upper surfaces of the many movable grates and the members to be polished bonded thereto are not aligned in one horizontal plane, they are polished to flatten them using a rotary polishing machine (step f), and then the sample stage Place it on the lapping machine (step g) and finish with wrapping (step h)
.
実施例では研摩目標層の検出は、被研摩部材の両端部を
高倍率カメラで撮影しつつモニタTVに映し出して行っ
た。In the example, the target layer to be polished was detected by photographing both ends of the member to be polished using a high-magnification camera and displaying the images on a TV monitor.
本実施例によれば、被研摩部材が成層物であり、その研
摩目標層の位置と傾きとが不定であっても、研摩目標層
に泊った研摩を容易に、かつ、高精度で行なうことがで
きる。すなわち、
試料台に貼着した被研摩部材を、上下方向、傾動方向く
、高精度に、位置決めでき、かつ、駆動外力を取り去っ
ても位置ずれせず、更に研摩外力が作用しても、lll
後後被研摩部材の位置が、全くずれないため、@めで、
高精度に% (サブミクロンオーダの精度)、研摩を行
なうことができる。According to this embodiment, even if the member to be polished is a layered object and the position and inclination of the polishing target layer are uncertain, polishing that remains on the polishing target layer can be performed easily and with high precision. I can do it. In other words, the member to be polished attached to the sample stage can be positioned with high precision in the vertical and tilting directions, and the position will not shift even when the external driving force is removed, and even when external polishing force is applied, it will not shift.
Since the position of the part to be polished does not shift at all,
Polishing can be performed with high accuracy (accuracy on the order of submicrons).
更に、本試料台は、被研摩部材の高精度な調節、固定保
持を、可動プレート、固定プレート、テーパビン、右ね
じ、左ねじという、極めて少ない構成要素で実現してい
るため、安価な保持装置を提供することができる。Furthermore, this sample stage achieves high-precision adjustment and fixed holding of the workpiece to be polished using extremely few components: a movable plate, a fixed plate, a taper bin, a right-hand screw, and a left-hand screw, making it possible to use an inexpensive holding device. can be provided.
本発明によれば、被研摩部材の散村位置、及び、敗付姿
勢を容易に、かつ、高精度で規制することができるので
、被研摩部材の研摩目標面が不揃いであったり、または
、被研摩部材の接着誤差が大きくても、これらのばらつ
きを吸収して所定高さに、所定方向(一般に水平)に、
迅速、かつ、容易に修正することができる。According to the present invention, it is possible to easily and accurately control the dispersion position and defeated posture of the member to be polished, so that the target surface to be polished of the member to be polished is irregular or Even if there are large adhesion errors in the part to be polished, these variations can be absorbed and the polishing can be performed at a specified height and in a specified direction (generally horizontally).
Can be fixed quickly and easily.
さらに、本発明では、被研摩部材の位置、姿勢の調節及
び固定保持機能を、可動グレート、固定プレート、テー
パビン、右ねじ、左ねじという。Furthermore, in the present invention, the functions of adjusting the position and posture of the member to be polished and fixing and holding the member to be polished are referred to as a movable grate, a fixed plate, a tapered bin, a right-handed screw, and a left-handed screw.
極めて少ない構成要素の複合により実現しているため、
安価な保持装置を提供することができる。Because it is realized by combining extremely few components,
An inexpensive holding device can be provided.
第1図は本発明の一実施例の斜視図、@2図は第1図の
平面図、第5図は第1図の側面図、第4図は篤1図の要
部断面図、第5図は従来の位置決め時の挙動を示す説明
図、第6図は本実施例の右ねじ、左ねじ部の挙動を示す
説明図、第7図はねじストレート部の説明図、第8図は
、上記実施例の操作方法及び効果の説明図、第9図は、
実施例における操作の一例を示す工程の70−チャート
である。
1・・・・・・試料台、2・・・・・・固定プレート、
3・・・・・・可動プレート、4・・・・・・テーパピ
ン、5m・・・・・・右ねじ、15・・・・・・左ねじ
、6・・・・・・被研摩部材。Fig. 1 is a perspective view of one embodiment of the present invention, Fig. 2 is a plan view of Fig. 1, Fig. 5 is a side view of Fig. 1, Fig. 4 is a sectional view of main parts of Fig. 1, Fig. 5 is an explanatory diagram showing the behavior during conventional positioning, Fig. 6 is an explanatory diagram showing the behavior of the right-handed and left-handed thread parts of this embodiment, Fig. 7 is an explanatory diagram of the thread straight part, and Fig. 8 is an explanatory diagram showing the behavior of the right-hand thread and left-hand thread parts of this embodiment. , FIG. 9 is an explanatory diagram of the operation method and effects of the above embodiment,
It is a 70-chart of the process which shows an example of operation in an Example. 1... Sample stage, 2... Fixed plate,
3... Movable plate, 4... Taper pin, 5m... Right-hand thread, 15... Left-hand thread, 6... Member to be polished.
Claims (1)
装置において、 前記試料台を固定部と可動部に二分割し、この両者を一
端部で連結、固定し、他端部側面をテーパ形状とし、前
記テーパ部に駆動用部材を挿入し、その個所に設けたね
じの回転送り動作で前記駆動用部材を移動させることに
より、くさびの原理を応用して、前記可動部を片持はり
のように弾性変形させて、前記可動部の平面部に接着し
た前記被研摩部材の位置を調節する構造とし、 かつ、前記ねじ及び前記駆動用部材を、前記可動部のあ
おり方向に対して直角方向に二対、配置し、二個の前記
駆動用部材の各挿入量を、適宜、設定し、前記可動部を
弾性的に、曲げ変形及びねじり変形させ、前記被研摩部
材の高さのみならず、傾きも調節可能な構造とし、 更に、ねじ駆動外力を取り去る際の被研摩部材の位置ず
れを無くすように、前記一対のねじの一方を右ねじ、他
方を左ねじとして、ねじ残留応力を対称化したことを特
徴とする被研摩部材の保持装置。[Scope of Claims] 1. A polishing apparatus having a structure in which a sample stage with a member to be polished is mounted, the sample stage being divided into a fixed part and a movable part, both of which are connected and fixed at one end, The side surface of the other end is tapered, a driving member is inserted into the tapered part, and the driving member is moved by the rotational feeding action of a screw provided at that location, thereby applying the wedge principle. The structure is such that the movable part is elastically deformed like a cantilever beam to adjust the position of the member to be polished bonded to the flat part of the movable part, and the screw and the driving member are attached to the movable part. Two pairs are arranged in a direction perpendicular to the tilting direction, the insertion amount of each of the two drive members is set appropriately, and the movable part is elastically deformed by bending and torsion, and the polished part is The structure is such that not only the height but also the inclination of the member can be adjusted, and one of the pair of screws has a right-hand thread, and the other has a left-hand thread, so as to eliminate the positional shift of the member to be polished when removing the external screw driving force. A holding device for a member to be polished, characterized in that screw residual stress is made symmetrical.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2302357A JPH04176557A (en) | 1990-11-09 | 1990-11-09 | Holding device for member to be polished |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2302357A JPH04176557A (en) | 1990-11-09 | 1990-11-09 | Holding device for member to be polished |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04176557A true JPH04176557A (en) | 1992-06-24 |
Family
ID=17907935
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2302357A Pending JPH04176557A (en) | 1990-11-09 | 1990-11-09 | Holding device for member to be polished |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH04176557A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6257971B1 (en) * | 1994-10-07 | 2001-07-10 | Seikoh Giken Co., Ltd | Apparatus for polishing end surface of optical fibers |
-
1990
- 1990-11-09 JP JP2302357A patent/JPH04176557A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6257971B1 (en) * | 1994-10-07 | 2001-07-10 | Seikoh Giken Co., Ltd | Apparatus for polishing end surface of optical fibers |
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