JPH04101777A - Blasting abrasive and barrier rib forming method using it - Google Patents
Blasting abrasive and barrier rib forming method using itInfo
- Publication number
- JPH04101777A JPH04101777A JP2215634A JP21563490A JPH04101777A JP H04101777 A JPH04101777 A JP H04101777A JP 2215634 A JP2215634 A JP 2215634A JP 21563490 A JP21563490 A JP 21563490A JP H04101777 A JPH04101777 A JP H04101777A
- Authority
- JP
- Japan
- Prior art keywords
- thick film
- film layer
- abrasive material
- ribs
- rib
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000004888 barrier function Effects 0.000 title claims abstract description 42
- 238000005422 blasting Methods 0.000 title claims abstract description 18
- 238000000034 method Methods 0.000 title claims description 25
- 238000005530 etching Methods 0.000 claims abstract description 30
- 239000011347 resin Substances 0.000 claims abstract description 13
- 229920005989 resin Polymers 0.000 claims abstract description 13
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 7
- 238000010438 heat treatment Methods 0.000 claims abstract description 7
- 229910052799 carbon Inorganic materials 0.000 claims abstract description 6
- 239000003082 abrasive agent Substances 0.000 claims description 43
- 238000010304 firing Methods 0.000 claims description 14
- 238000002485 combustion reaction Methods 0.000 claims description 6
- 238000010030 laminating Methods 0.000 claims 1
- 238000007599 discharging Methods 0.000 abstract 1
- 239000010408 film Substances 0.000 description 67
- 239000010410 layer Substances 0.000 description 63
- 230000002265 prevention Effects 0.000 description 12
- 230000015572 biosynthetic process Effects 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 7
- 239000011241 protective layer Substances 0.000 description 7
- 239000011521 glass Substances 0.000 description 6
- 239000000758 substrate Substances 0.000 description 6
- 238000001035 drying Methods 0.000 description 5
- 239000003795 chemical substances by application Substances 0.000 description 4
- 239000011248 coating agent Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000000843 powder Substances 0.000 description 3
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 239000007921 spray Substances 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 239000001856 Ethyl cellulose Substances 0.000 description 1
- ZZSNKZQZMQGXPY-UHFFFAOYSA-N Ethyl cellulose Chemical compound CCOCC1OC(OC)C(OCC)C(OCC)C1OC1C(O)C(O)C(OC)C(CO)O1 ZZSNKZQZMQGXPY-UHFFFAOYSA-N 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 235000010724 Wisteria floribunda Nutrition 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 239000001569 carbon dioxide Substances 0.000 description 1
- 229910002092 carbon dioxide Inorganic materials 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229920001249 ethyl cellulose Polymers 0.000 description 1
- 235000019325 ethyl cellulose Nutrition 0.000 description 1
- 239000010419 fine particle Substances 0.000 description 1
- 239000003112 inhibitor Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000002931 mesocarbon microbead Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 229910000029 sodium carbonate Inorganic materials 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 239000004575 stone Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Landscapes
- Gas-Filled Discharge Tubes (AREA)
- Manufacturing Of Printed Circuit Boards (AREA)
Abstract
Description
【発明の詳細な説明】
(産業上の利用分野)
この発明はブラスト用研磨材及びそれを用いたバリアリ
ブ形成方法に関する。DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to an abrasive material for blasting and a barrier rib forming method using the abrasive material.
(従来の技術)
従来より、ガス放電表示パネルのバリアリブ形成では、
量産に適した厚膜印刷法が用いられている。以下、第4
図を参照し、ガス放電表示パネルの製造工程の説明と共
に厚膜印刷法によるバリアリブ形成につき説明する。第
4図はガス放電表示パネルの一構成例を示す要部断面図
である。(Prior art) Conventionally, barrier rib formation for gas discharge display panels has been
A thick film printing method suitable for mass production is used. Below, the fourth
With reference to the drawings, the manufacturing process of the gas discharge display panel will be explained, as well as the formation of barrier ribs by the thick film printing method. FIG. 4 is a sectional view of essential parts showing an example of the configuration of a gas discharge display panel.
まず、背面板10上に厚膜印刷法により陰極12を形成
する。陰極]2はNi厚膜から成り、複数のストライブ
状の陰極12を並列配lする。First, the cathode 12 is formed on the back plate 10 by a thick film printing method. The cathode] 2 is made of a thick Ni film, and a plurality of striped cathodes 12 are arranged in parallel.
次に陰極12及び陽極14のギャップを一定に保持する
ためのバリアリブ16を厚膜印刷法により形成する。バ
リアリブ16はガラス厚膜から成り、バリアリブ16を
平面的にみて陰極12と直交させるようにして複数のス
トライブ状のバリアリブ16を並列配置する。印刷及び
乾燥wr繰り返し所定の高ざまで所定のパターン形状で
ガラス厚膜を積層したのち、ガラス厚膜を焼成しバリア
リブ16を完成する。Next, barrier ribs 16 for maintaining a constant gap between the cathode 12 and the anode 14 are formed by a thick film printing method. The barrier ribs 16 are made of a thick glass film, and a plurality of striped barrier ribs 16 are arranged in parallel so that the barrier ribs 16 are orthogonal to the cathode 12 when viewed from above. After printing and drying are repeated to stack glass thick films in a predetermined pattern shape to a predetermined height, the glass thick films are fired to complete the barrier ribs 16.
また、前面板18上には陽極14を薄膜形成技術により
形成する。llI極14は透明導電膜(ITO: in
dium Tin Qxide)から成り、複数ノスト
ライブ状の陽極14を並列配置する。Further, the anode 14 is formed on the front plate 18 by a thin film forming technique. The IlI pole 14 is made of a transparent conductive film (ITO: in
A plurality of nostrive-shaped anodes 14 are arranged in parallel.
次に表示セル形成領域の陽極14に厚膜印刷法により蛍
光体層20を形成する。Next, a phosphor layer 20 is formed on the anode 14 in the display cell forming area by a thick film printing method.
次に陰極12及び陽極]4が平面的にみたとき互いに直
交するようにして背面板1o及び前面板18の電極形成
面を向き合せ、これら10.18の周囲7&船ガラスで
封止する。陰極12及び陽極14の相交差する91!域
に表示セルが形成される。Next, the electrode forming surfaces of the back plate 1o and the front plate 18 are faced to each other so that the cathode 12 and the anode 4 are orthogonal to each other when viewed in plan, and the peripheries 10 and 18 are sealed with glass. The cathode 12 and the anode 14 intersect 91! A display cell is formed in the area.
次いで、封着した背面板10及び前面板18の間のガス
封入領域を真空排気してこの封入領域内に放電ガスを封
入し、パネルを完成する。Next, the gas-filled area between the sealed back plate 10 and front plate 18 is evacuated to fill the sealed area with discharge gas, thereby completing the panel.
(発明が解決しようとする課l1)
一方、近年においては、ガス放電表示パネルの画素密度
を高精細化することへの要求が高まっている。高精細化
のためにはバリアリブを微細に形成する必要があり例え
ば高ざ160〜200um及び幅50〜60um程度の
微細なバリアリブを形成しなければならない、具体的に
例を挙げて説明すると、640X480画素のパネルを
1mmあたり8画素の画素密度で12インチサイズに作
成する場合、表示セルの開口率を50%以上とするため
にはバリアリブの幅を62.5um以下とする必要があ
る。(Issue 11 to be Solved by the Invention) On the other hand, in recent years, there has been an increasing demand for increasing the pixel density of gas discharge display panels. In order to achieve high definition, barrier ribs must be formed finely, for example, with a height of 160 to 200 um and a width of 50 to 60 um.To give a specific example, 640 x 480 When creating a pixel panel in a 12-inch size with a pixel density of 8 pixels per 1 mm, the width of the barrier rib needs to be 62.5 um or less in order to make the aperture ratio of the display cell 50% or more.
しかしながら上述した従来のバリアリブ形成方法では、
厚膜ペーストを所定の高さに積層するまで印刷を繰返し
従って微細なバリアリブを形成するには印刷の度に微細
なツブ形成禦域に精度良く厚膜ペーストを積み上げてゆ
く必要がある。これは技術的に非常に困難な作業であり
、微細なバリアリブの形成に適さない。However, in the conventional barrier rib formation method described above,
Printing is repeated until the thick film paste is laminated to a predetermined height. Therefore, in order to form fine barrier ribs, it is necessary to pile up the thick film paste precisely in the fine protrusion formation area each time printing is performed. This is a technically very difficult task and is not suitable for forming fine barrier ribs.
そこでこの出願人は、この出願とは別の出願にあいで、
厚膜印刷法よりも微細なバリアリブの形成に適した方法
としてブラストによるエツチングを用いたバリアリブ形
成方法を提案している。この形成方法につき概略的に説
明すれば、電極例えば陰極を形成した基板上にリブ用厚
膜層を積層し、乾1させたリブ用厚膜層上に溝形成領域
を露出するレジストパターンを設け、リブ用厚膜層の露
出部分に研磨材例えばアルミナ粉末を噴き付ゆで露出部
分を工・ンチング除去し、エツチングを終えた厚膜層を
焼成してバリアリブを完成する。残存するリブ用厚膜層
がバリアリブを構成する。Therefore, this applicant filed an application separate from this application,
We have proposed a barrier rib formation method using blast etching as a method more suitable for forming fine barrier ribs than the thick film printing method. To roughly explain this formation method, a thick film layer for ribs is laminated on a substrate on which an electrode, such as a cathode, is formed, and a resist pattern is provided on the dried thick film layer for ribs to expose the groove forming area. Then, an abrasive such as alumina powder is sprayed onto the exposed portions of the thick film layer for ribs and the exposed portions are removed by etching and etching, and the etched thick film layer is fired to complete the barrier ribs. The remaining rib thick film layer constitutes barrier ribs.
第5図(A)及び(B)に、エツチングを終えたリブ用
厚膜層の焼成前後のバリアリブの状態を断面図で示す、
同図において22は陰極12のエツチングを防止するた
めのエツチング防止層、24はリブ用厚膜層、26はリ
ブ用厚膜層24の溝形成領域を露出するレジストパター
ン、及び28は研磨材を示す、尚、厚膜層24の焼成時
に、エツチング防止層22及びレジスト26は燃焼して
なくなる。FIGS. 5A and 5B are cross-sectional views showing the state of barrier ribs before and after firing the etched thick film layer for ribs.
In the figure, 22 is an etching prevention layer for preventing etching of the cathode 12, 24 is a thick film layer for ribs, 26 is a resist pattern that exposes the groove forming area of the thick film layer for ribs 24, and 28 is an abrasive. It should be noted that when the thick film layer 24 is fired, the etching prevention layer 22 and the resist 26 are burned away.
この出願人の提案による形成方法の実施に当っては篤5
図(A)にも示すように、厚膜層24のエツチング終了
後にエツチング防止層22、基板10、或は厚膜層24
に付着しでいる研磨材28をエアガン等で除去する必要
があるが、エアガンを用いて完全に除去することは非常
に難しく、従って研磨材28が焼成前の厚膜層24やレ
ジストパターン26に付着した状態或はエツチング防止
層22上に吸着した状態で厚膜層24の焼成を行なうこ
ととなる。その結果、第5図(B)にも示すように、厚
膜層24(バリアリブ16)には厚膜層24及び研磨材
28の熱膨張係数の差に起因してひびや欠けを生じたり
或は陰極12上に研磨材が付着して陰極12の放電面積
の減少による放電特性の劣化を招くという問題点があっ
た。In implementing the forming method proposed by this applicant,
As shown in Figure (A), after the thick film layer 24 is etched, the etching prevention layer 22, the substrate 10, or the thick film layer 24 is
It is necessary to remove the abrasive material 28 adhering to the thick film layer 24 or the resist pattern 26 before firing because it is very difficult to completely remove it using an air gun. The thick film layer 24 is fired while it is attached or adsorbed onto the etching prevention layer 22. As a result, as shown in FIG. 5(B), the thick film layer 24 (barrier rib 16) may crack or chip due to the difference in thermal expansion coefficient between the thick film layer 24 and the abrasive material 28. However, there is a problem in that the abrasive adheres to the cathode 12, resulting in a decrease in the discharge area of the cathode 12, resulting in deterioration of discharge characteristics.
この発明の目的は上述した問題点を解決するため、加熱
或は燃焼によりガス化するブラスト用研磨材及びそれを
用いたバリアリブ形成方法を提供することにある。SUMMARY OF THE INVENTION In order to solve the above-mentioned problems, an object of the present invention is to provide a blasting abrasive material that is gasified by heating or combustion, and a barrier rib forming method using the abrasive material.
(課題を解決するための手段)
この目的の達成を図るため、第一発明のブラスト用研磨
材は加熱或は燃焼によりガス化する性質を有する有機樹
脂又はカーボンから成ることを特徴とする。(Means for Solving the Problems) In order to achieve this object, the blasting abrasive material of the first invention is characterized by being made of an organic resin or carbon that has the property of being gasified by heating or combustion.
また第二発明のバリアリブ形成方法は、第一発明のブラ
スト用研磨材を用いてガス放電表示パネルのバリアリブ
を形成するものであって、その形成に当り、下地上にリ
ブ用厚膜層を積層する工程と、リブ用厚膜層の溝形成領
域を露出するレジストパターンを形成する工程と、溝形
成領域のリブ用厚膜層を前記研磨材を用いてブラストに
よりエツチング除去する工程と、リブ用厚膜層を焼成し
て前記研磨材をガス化する工程とを含むことを特徴とす
る。Further, the barrier rib forming method of the second invention is for forming barrier ribs of a gas discharge display panel using the blasting abrasive material of the first invention, and in forming the barrier ribs, a thick film layer for the ribs is laminated on the base. a step of forming a resist pattern exposing the groove forming region of the thick film layer for ribs; a step of etching away the thick film layer for ribs in the groove forming region by blasting using the abrasive material; The method is characterized in that it includes a step of firing the thick film layer and gasifying the abrasive material.
(作用)
第一発明のブラスト用研磨材によれば、研磨材は加熱或
は燃焼によりガス化する。従って被エツチング物にこの
研磨材を噴き付けてエツチングを終了したのち、被エツ
チング物に付着している研磨材を燃焼させ或は加熱すれ
ば、研磨材はガス化し被エツチング物から飛んでなくな
る。(Function) According to the abrasive material for blasting of the first invention, the abrasive material is gasified by heating or combustion. Therefore, after the abrasive material is sprayed onto the object to be etched and etching is completed, the abrasive material adhering to the object to be etched is burned or heated, and the abrasive material is gasified and blown away from the object to be etched.
また第二発明のバリアリブ形成方法によれば、第一発明
の研磨材を用いるが、この場合研磨材にはリブ用厚膜層
の焼成温度以下の任意好適な温度でガス化するものを用
いる。従ってエツチング終了後にガス放電表示パネルの
電極、リブ形成用厚膜層等に研磨材が付着しでいる状態
でリブ形成用厚膜層の焼成を行なっても、研磨材はガス
化し飛んでなくなるので、研磨材を電極からW寅に除去
することかできるしまたリブ形成用厚膜層の欠けやひび
の発生を著しく減少させることができる。Further, according to the barrier rib forming method of the second invention, the abrasive material of the first invention is used, but in this case, the abrasive material is one that is gasified at any suitable temperature below the firing temperature of the thick film layer for ribs. Therefore, even if the thick film layer for forming ribs is fired with the abrasive still attached to the electrodes of the gas discharge display panel, the thick film layer for forming ribs, etc. after etching, the abrasive will gasify and disappear. In addition, the abrasive material can be removed from the electrode quickly, and the occurrence of chips and cracks in the thick film layer for forming ribs can be significantly reduced.
(実施例)
以下、−例として第4図に示すガス放電パネルの背面板
側にバリアリブを形成する場合に第−及び第二発明を適
用した例につき説明する。尚、図面はこの発明が理解で
きる程度に概略的に示しであるにすぎない。(Example) Hereinafter, as an example, an example will be described in which the first and second inventions are applied when barrier ribs are formed on the back plate side of a gas discharge panel shown in FIG. It should be noted that the drawings are only schematic representations to the extent that the invention can be understood.
第1図及び第2図(A)〜(H)は第二発明の実施例の
製造工程フロー及び製造工程図である。第2図(A)〜
(C)は陰極が延びる方向と直交する方向に取った断面
及び第2図(D)〜(G)は陰極か延びる方向に沿って
取った断面を表す。1 and 2 (A) to (H) are a manufacturing process flow and a manufacturing process diagram of an embodiment of the second invention. Figure 2 (A) ~
(C) represents a cross section taken in a direction perpendicular to the direction in which the cathode extends, and FIGS. 2(D) to (G) represent cross sections taken along the direction in which the cathode extends.
*ステップ1:まずバリアリブ形成用の下地として陰極
12及びエツチング防止層22を備える背面板]Oを形
成する。*Step 1: First, a back plate [O] comprising a cathode 12 and an etching prevention layer 22 is formed as a base for forming barrier ribs.
ステップ]では、背面板10としてガラス基板を用意し
、第2図(A)にも示すように、背面板10上に複数の
ストライブ状の陰極12を並列させて形成する。この形
成ではNi厚膜ペースト(DuPont社製$9535
)!印刷して複数のストライブ状の陰極パターンを形成
し、このパターンを乾燥温度150’Cで1時間の間乾
燥させ、乾燥させたパターンを焼成と−ク温!580°
Cに10分の間保持して焼成する。In step], a glass substrate is prepared as the back plate 10, and a plurality of striped cathodes 12 are formed in parallel on the back plate 10, as shown in FIG. 2(A). For this formation, Ni thick film paste (manufactured by DuPont, $9535) was used.
)! A plurality of striped cathode patterns are formed by printing, this pattern is dried at a drying temperature of 150'C for 1 hour, and the dried pattern is fired at a temperature of -150°C. 580°
C. for 10 minutes and bake.
次に第2図(8)にも示すように、陰極12そブラスト
によるエツチングから守るためのエツチング防止層22
を陰極12上に形成する。エツチング防止層22は1層
構造及び多層構造のいずれでもよいが、この実施例では
陰極12上に順次に設けた耐ブラスト性樹脂及び保護層
から成る2層構造とする。Next, as shown in FIG. 2 (8), an etching prevention layer 22 is formed to protect the cathode 12 from etching caused by blasting.
is formed on the cathode 12. The etching prevention layer 22 may have either a single-layer structure or a multi-layer structure, but in this embodiment, it has a two-layer structure consisting of a blast-resistant resin and a protective layer sequentially provided on the cathode 12.
耐ブラスト性樹脂はブラストによりエツチングされにく
い或はエツチングされない性質を有する。耐ブラスト性
樹脂には東京応化社製バッファ膜用レジストを使用し、
この樹脂を、バリアリブ形成領域にスピンコーターによ
り膜厚15〜2゜umで塗布する。レジストの塗布条件
は、スどンコーターの回転数を、回転開始から5秒がけ
て500r、p、m、としてから500r、p、m。The blast-resistant resin has a property that it is difficult to be etched or not etched by blasting. The blast-resistant resin uses Tokyo Ohka Co., Ltd.'s buffer film resist.
This resin is applied to the barrier rib forming area using a spin coater to a thickness of 15 to 2 um. The resist coating conditions were as follows: The number of revolutions of the stone coater was set to 500 r, p, m for 5 seconds from the start of rotation, and then 500 r, p, m.
に]5秒の間保持し、そののち1500r、p。] Hold for 5 seconds, then 1500r, p.
m、としでがら1500 r、p、m、に1秒の間保持
し、そののち5秒かけてOr−pom、まで落すという
条件とする。レジスト塗布後、レジストを温/170°
Cで15分の間乾燥させ、乾燥させたレジストを露光量
15〜20 m J / c m 2で露光して硬化さ
せる。The condition is that the temperature is maintained at 1500 r, p, m for 1 second, and then lowered to Or-pom over 5 seconds. After applying the resist, heat the resist to 170°.
C for 15 minutes, and the dried resist is exposed to light at an exposure dose of 15-20 mJ/cm2 to cure.
また保護層は、印刷されたリブ用厚膜層24が含む溶剤
成分が耐ブラスト性樹脂に浸透し耐ブラスト性樹脂を膨
潤させで剥Mさせるのを防止するためのものである。保
護層には東京応化社製しみ出し防止剤を使用し、この防
止剤を、スピンコーターにより耐ブラスト性樹脂に塗布
する。保護層の塗布条件はレジストの場合と同様の条件
とする。保護層塗布後、保護層を温度40″Cで5〜1
0分の闇乾燥させる。Moreover, the protective layer is for preventing the solvent component contained in the printed thick film layer 24 for ribs from penetrating into the blast-resistant resin and causing the blast-resistant resin to swell and be peeled off. For the protective layer, an anti-bleeding agent manufactured by Tokyo Ohka Co., Ltd. is used, and this anti-bleeding agent is applied to the blast-resistant resin using a spin coater. The coating conditions for the protective layer are the same as those for the resist. After applying the protective layer, apply the protective layer at a temperature of 40″C for 5 to 1
Dry in the dark for 0 minutes.
*ステップ2:次に陰極12及びエツチング防止層22
を形成した背面板10をバリアリブ形成用の下地とし、
この下地上にツブ用厚膜層24を積層する。*Step 2: Next, the cathode 12 and the etching prevention layer 22
The back plate 10 formed with is used as a base for forming barrier ribs,
A thick film layer 24 for the bulge is laminated on this base.
ステップ2では、ガラス厚膜ペースト(DuPont社
製$9741)lFrエツチング防止層22上にベタ印
刷し、印刷を繰返して160〜200μmの高さまで積
層する。所定の高ざまで積層していないときには印刷し
た厚膜ペーストを乾燥温度150″Cで10分の間乾燥
させてから次の印刷を行ない、また所定の高ざまで積層
したら印刷した厚膜ペーストを乾燥温度150’Cて1
時間の間乾燥させ、第2図(C)にも示すように所定の
高ざまで積層させた厚膜ペーストから成るリブ用厚膜層
24を得る。In step 2, glass thick film paste (manufactured by DuPont, $9741) is printed all over the lFr etching prevention layer 22, and printing is repeated until the layer is stacked to a height of 160 to 200 μm. If the printed thick film paste is not laminated to the predetermined height, dry the printed thick film paste at a drying temperature of 150"C for 10 minutes before printing the next print, and once the predetermined height is laminated, the printed thick film paste should be dried. Drying temperature 150'C1
After drying for a certain period of time, a thick film layer 24 for ribs is obtained, which is made of a thick film paste laminated to a predetermined height as shown in FIG. 2(C).
*ステップ3:次にリブ用厚膜層24の溝形成領域30
を露出するレジストパターン26を形成する。*Step 3: Next, groove forming area 30 of thick film layer 24 for ribs
A resist pattern 26 is formed that exposes.
ステップ3では、まず第2図(D)にも示すように、レ
ジスト32を、リブ用厚膜層24上にスどンコーターを
用いて15〜20umの膜厚で塗布する。レジスト32
の塗布条件は、スピンコーターの回転数を、回転開始か
ら5秒かりて500r、 p、m、とじてから500r
、p、m、に60秒の間保持し、そののち1500r、
pom。In step 3, first, as shown in FIG. 2(D), a resist 32 is coated on the rib thick film layer 24 to a thickness of 15 to 20 um using a suton coater. resist 32
The coating conditions were as follows: the spin coater rotation speed was 500 r, p, m after 5 seconds from the start of rotation, and 500 r after closing.
, p, m, for 60 seconds, then 1500r,
pom.
とじてから1500r、p、m、に1秒の間保持し、そ
ののち5秒かけてOr、p、m、まで落すという条件と
する。レジスト32塗布猾、レジスト32を温度70゛
Cで15分の間乾燥させる。The conditions are that after closing, it is held at 1500 r, p, m for 1 second, and then lowered to Or, p, m over 5 seconds. After applying the resist 32, the resist 32 is dried at a temperature of 70° C. for 15 minutes.
レジスト32として東京応化社製○5BR−82B!使
用するが、これはネガ型であるのでバリアリブとして残
存させたい厚膜層24の領域を露光できるマスクを用い
る。レジスト32の露光では等倍のネガフィルムを用い
従ってマスクをレジスト32に密着させるようにして使
用するのでマスクへのレジスト32の付tV防止する目
的でレジスト32上に東京応化社製のタック防止剤(図
示せず)を塗布し室温で2〜3分の間装置する。○5BR-82B manufactured by Tokyo Ohkasha as resist 32! However, since this is a negative type, a mask is used that can expose the region of the thick film layer 24 that is desired to remain as a barrier rib. In exposing the resist 32, a negative film of the same size is used, and therefore the mask is used in close contact with the resist 32, so in order to prevent the resist 32 from being attached to the mask, an anti-tack agent manufactured by Tokyo Ohka Co., Ltd. is applied on the resist 32. (not shown) and incubate for 2-3 minutes at room temperature.
次にレジスト32の露光、現像、定着及び乾燥を行なっ
て、第2図(E)にも示すように、溝形成領域3oを露
出するレジストパターン26を得る。露光では露光量を
膜厚xo、7mJ/cm2とし、露光後0.2重量%炭
酸ナトリウム水溶液を低圧スプレーで吹きかけで現像し
、そののち純水5β及びIccの0.5%塩酸の混合液
を吹きかけて定着する。尚、タック防止剤もまたレジス
トパターン26と同様の形状にパターニングされる。Next, the resist 32 is exposed, developed, fixed, and dried to obtain a resist pattern 26 exposing the groove forming regions 3o, as shown in FIG. 2(E). In the exposure, the exposure amount was set to a film thickness of xo and 7 mJ/cm2, and after the exposure, development was carried out by spraying a 0.2% by weight aqueous sodium carbonate solution with a low-pressure spray, and then a mixture of pure water 5β and 0.5% Icc of hydrochloric acid was applied. Spray on it and let it settle. Note that the anti-tack agent is also patterned in the same shape as the resist pattern 26.
*ステ・シブ4:次に溝形成領域3oのリブ用厚膜層2
4をブラスト用研磨材を用いてブラストによりエツチン
グ除去する。*Step 4: Next, thick film layer 2 for ribs in groove forming area 3o
4 is removed by etching by blasting using an abrasive for blasting.
ステ・ツブ4において、ブラストに用いる研磨材は加熱
或は燃焼によりガス化する性質を有する有機樹脂又はカ
ーボンから成る。しかも研磨材はツブ用厚膜層24の焼
成温度以下の任意好適な温度で分解し或は燃焼しく研磨
材は焼成工程以前の工程で発火或は燃焼しない)、この
ような研磨材として例えばエチルセルロース粉末(東京
応化社製、粒径約5um)又はカーボン粉末(大阪ガス
社製球状炭素微粒子(メソカーボンマイクロビーズ)、
粒径約5um)を用いる。@磨材は加熱により分解して
ガス化し、或は燃焼により酸化して水蒸気、炭酸ガス、
酸化窯素等になってガス化する。In the step tube 4, the abrasive material used for blasting is made of organic resin or carbon that has the property of being gasified by heating or combustion. In addition, the abrasive material decomposes or burns at any suitable temperature below the firing temperature of the thick film layer 24 for the whelk, and the abrasive material does not ignite or burn in the process before the firing process), such as ethyl cellulose. Powder (manufactured by Tokyo Ohka Co., Ltd., particle size: approximately 5 um) or carbon powder (spherical carbon fine particles (mesocarbon microbeads), manufactured by Osaka Gas Co., Ltd.)
(particle size of about 5 um) is used. @Abrasive material decomposes and gasifies when heated, or oxidizes when burned, producing water vapor, carbon dioxide,
It becomes gasified as silicon oxide etc.
そしてブラストマシーン(不二製作所製微粉タイプ5C
−3)!用い、研磨材をレジストパターン26で覆われ
ていない溝形成領域30に噴きつけ、第2図(F)にも
示すように、溝形成領域30のリブ用厚膜層24をエツ
チング除去する。And a blast machine (fine powder type 5C manufactured by Fuji Seisakusho)
-3)! Then, as shown in FIG. 2(F), the thick film layer 24 for ribs in the groove forming area 30 is removed by etching.
リブ用厚膜層24は乾燥状態なのでそのエツチングを容
易に行なえる。Since the rib thick film layer 24 is in a dry state, it can be easily etched.
工・ンチングを終了したら、リブ用厚膜層24やエツチ
ング防止層22等に付着している研磨材を例えばエアガ
ンを用いて除去する。この除去は完全に行なう必要はな
い。またここで研磨材の除去を行なわなくともよい。After finishing the etching and etching, the abrasive material adhering to the rib thick film layer 24, etching prevention layer 22, etc. is removed using, for example, an air gun. This removal does not have to be complete. Further, it is not necessary to remove the abrasive material here.
*ステップ51次にリブ用厚膜層24を焼成してプラス
ト用研磨材をガス化する。*Step 51 Next, the thick film layer 24 for the ribs is fired and the abrasive material for the plastic is gasified.
ステップ5では、リブ用厚膜層24を焼成温度530°
Cに10分の間保持して焼成する。この焼成により、研
磨材を好ましくは完全燃焼させてガス化し除去し、これ
と同様にレジストパターン26、タック防止剤、耐ブラ
スト牲樹脂及び保護層をも燃焼させて好ましくは完全燃
焼させてガス化し除去し、第2図(G)にも示すように
、ガス放電表示パネルのバリアリブ]6を完成する。In step 5, the rib thick film layer 24 is fired at a temperature of 530°.
C. for 10 minutes and bake. By this baking, the abrasive material is preferably completely combusted, gasified, and removed, and the resist pattern 26, tack inhibitor, blast-resistant resin, and protective layer are also combusted and preferably completely combusted and gasified. As shown in FIG. 2(G), the barrier rib 6 of the gas discharge display panel is completed.
第3図(A)及び(B)にエツチングを終了したバリア
リブの焼成前襖の状@を、第2図と同様の断面で示す。FIGS. 3(A) and 3(B) show the state of the pre-fired sliding door of the barrier rib after etching is shown in a cross section similar to that shown in FIG. 2.
第3図(A)にも示すように、エアガンによる研磨材2
8の除去が不完全で研磨材28がリブ用厚膜層24ヤ工
ツチング防止層22等に付着して残存していたとしでも
、研磨材28は分解或は燃焼してガス化するので第3図
(B)にも示すように、リブ用厚膜層24(バリアリブ
16)の欠けや割れが焼成により生しるのを防止できま
た研磨材28が陰極12に焼成後残存するのを防止した
りすることができる。As shown in FIG. 3(A), the abrasive material 2 is
Even if the removal of 8 is incomplete and the abrasive 28 remains attached to the rib thick film layer 24, anti-jabbing layer 22, etc., the abrasive 28 will decompose or burn and gasify. As shown in FIG. 3(B), chipping and cracking of the rib thick film layer 24 (barrier ribs 16) can be prevented from occurring due to firing, and the abrasive material 28 can be prevented from remaining on the cathode 12 after firing. You can do it.
第−及び第二発明は上述した実施例のみに限定されるも
のではなく、従って各構成成分の形状、寸法、配置位置
、構成、形成材料、形成方法、数値的条件及びそのほか
の条件を任意好適に変更することができる。The first and second inventions are not limited to the above-described embodiments, and therefore, the shapes, dimensions, arrangement positions, configurations, forming materials, forming methods, numerical conditions, and other conditions of each component may be adjusted as desired. can be changed to .
第一発明では、例えば研磨材の形状を球状、多角柱状及
びそのほかの任意好適な形状とすることができる。また
研磨材をガス化するための温度を研磨材の用途に応じた
任意好適な温度に設定することができる。In the first invention, the shape of the abrasive material can be, for example, spherical, polygonal columnar, or any other suitable shape. Further, the temperature for gasifying the abrasive can be set to any suitable temperature depending on the use of the abrasive.
ざらに第二発明では、例えばエツチング防止層を陰極上
面のみに全面にわたり設は基板面上には設けないように
してもよいし、或はエツチング防止層をバリアリブ形成
方法の陽極上面のみに設は基板面上と溝形成領域の陰極
上面とには設けないようにしでもよい。またバリアリブ
形成用の下地の構成は任意好適な構成に変更することが
できる。Furthermore, in the second invention, for example, the etching prevention layer may be provided only on the entire upper surface of the cathode, but not on the substrate surface, or the etching prevention layer may be provided only on the upper surface of the anode in the barrier rib forming method. It may be arranged so that it is not provided on the substrate surface and the cathode upper surface in the groove forming region. Further, the structure of the base for forming barrier ribs can be changed to any suitable structure.
(発明の効果)
上述した説明からも明らかなように、第一発明のブラス
ト用研磨材は加熱或は燃焼によりガス化するので、被エ
ツチング物にこの′@磨材を噴き付けてエラチングラ終
了したのち、被エツチング物に付着している研磨材を加
熱すれば、研磨材は分解或は燃焼してガス化し被エツチ
ング物から飛んでなくなる。従って被エツチング物に付
着して残存する研磨材を従来よりもW笑に除去すること
ができる。(Effects of the Invention) As is clear from the above explanation, the abrasive material for blasting of the first invention is gasified by heating or combustion, so the etching process was completed by spraying this abrasive material onto the object to be etched. Afterwards, when the abrasive material adhering to the object to be etched is heated, the abrasive material decomposes or burns, becomes gas, and flies away from the object to be etched. Therefore, the abrasive material remaining on the object to be etched can be removed more easily than before.
また第二発明のバリアリブ形成方法によれば、第一発明
の研磨材を用いるが、この場合研磨材にはリブ用厚膜層
の焼成温度以下の任意好適な温度で分解或は!焼するも
のを用いる。従ってエツチング終了後にガス放電表示パ
ネルの電極、リブ用厚膜層等に研磨材が付着して残存し
ている状態でリブ用厚膜層の焼成を行なっても、研磨材
はガス化し飛んでなくなるので、研磨材を電極からより
確実に除去することができるしまた焼成によるリブ用厚
膜層の欠けやひびの発生を著しく減少させることかでき
る。その結果、放電特性の劣化を回避しまたバリアリブ
リプの歩留りを向上することができる。またリブ形成用
厚層層を焼成すれば研磨材の除去を行なえるので研磨材
を燃焼させて除去する工程を簡略に済ませることができ
る。Further, according to the barrier rib forming method of the second invention, the abrasive material of the first invention is used, but in this case, the abrasive material is decomposed or treated at any suitable temperature below the firing temperature of the thick film layer for the ribs. Use something that will be baked. Therefore, even if the thick film layer for ribs is fired with the abrasive remaining attached to the electrodes of the gas discharge display panel, the thick film layer for ribs, etc. after etching, the abrasive will gasify and disappear. Therefore, the abrasive material can be removed from the electrode more reliably, and the occurrence of chips and cracks in the thick film layer for ribs due to firing can be significantly reduced. As a result, it is possible to avoid deterioration of discharge characteristics and improve the yield of barrier ribs. Furthermore, since the abrasive material can be removed by firing the thick rib-forming layer, the step of burning and removing the abrasive material can be completed simply.
第1図は第二発明の詳細な説明に供するバリアリブの製
造工程フロー
第2図(A)〜(G)は第二発明の詳細な説明に供する
製造工程図、
第3図(A)〜(B)は笥−及び第二発明の実施例にお
けるリブ用厚膜層の焼成前後の状態を示す断面図、
第4図はガス放電表示パネルの一構成例を示す図、
第5図(A)〜(B)は従来方法におけるリブ用厚膜層
の焼成前後の状態を示す断面図である。
16−・・バリアツブ、 24・・・リブ用厚膜層26
・・・レジストパターン
28−・・研磨材、
30・・・溝形成領域。
特
許
出
願
人
沖電気工業株式会社
10a−基板面
第2
因
バリアリブの製造工程フロー
ガス放電表示パネルの一構成例
第4
図
へ0
〜へ0
へ −−FIG. 1 is a manufacturing process flow of barrier ribs, which provides a detailed explanation of the second invention. FIGS. 2(A) to (G) are manufacturing process diagrams, which provide a detailed explanation of the second invention. B) is a cross-sectional view showing the state before and after firing of the thick film layer for ribs in the embodiment of the second invention; FIG. 4 is a diagram showing an example of the configuration of a gas discharge display panel; FIG. 5(A) - (B) are cross-sectional views showing the state of the thick film layer for ribs before and after firing in the conventional method. 16--Barrier tube, 24--Thick film layer 26 for ribs
...Resist pattern 28--Abrasive material, 30... Groove formation region. Patent applicant Oki Electric Industry Co., Ltd. 10a - Substrate surface 2nd factor Barrier rib manufacturing process Flow Example of one configuration of gas discharge display panel 4 Figures 0 to 0 ---
Claims (2)
樹脂又はカーボンから成ることを特徴とするブラスト用
研磨材。(1) An abrasive material for blasting characterized by being made of organic resin or carbon that has the property of being gasified by heating or combustion.
放電表示パネルのバリアリブを形成するに当り、 下地上にリブ用厚膜層を積層する工程と、 リブ用厚膜層の溝形成領域を露出するレジストパターン
を形成する工程と、 溝形成領域のリブ用厚膜層を前記研磨材を用いてブラス
トによりエッチング除去する工程と、前記リブ用厚膜層
を焼成して前記研磨材をガス化する工程とを含むことを
特徴とするバリアリブ形成方法。(2) In forming barrier ribs of a gas discharge display panel using the blasting abrasive material according to claim 1, the steps include: laminating a thick film layer for ribs on a base; and forming grooves in the thick film layer for ribs. forming a resist pattern that exposes the region; etching away the rib thick film layer in the groove forming region by blasting with the abrasive material; and firing the rib thick film layer to remove the abrasive material. A method for forming barrier ribs, comprising the step of gasifying.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2215634A JPH04101777A (en) | 1990-08-15 | 1990-08-15 | Blasting abrasive and barrier rib forming method using it |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2215634A JPH04101777A (en) | 1990-08-15 | 1990-08-15 | Blasting abrasive and barrier rib forming method using it |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04101777A true JPH04101777A (en) | 1992-04-03 |
Family
ID=16675656
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2215634A Pending JPH04101777A (en) | 1990-08-15 | 1990-08-15 | Blasting abrasive and barrier rib forming method using it |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH04101777A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08163389A (en) * | 1994-12-07 | 1996-06-21 | Nec Corp | Horizontal pincushion distortion correction circuit |
EP0890417A1 (en) * | 1997-07-10 | 1999-01-13 | Tokyo Ohka Kogyo Co., Ltd. | Plastic abrasive for sandblasting, method for sandblast processing plasma display panel substrate using the same and method for treating sandblasting waste matters |
GB2330943A (en) * | 1997-10-31 | 1999-05-05 | Sony Corp | A method of manufacturing a flat display panel device |
CN115805520A (en) * | 2022-12-26 | 2023-03-17 | 西安奕斯伟材料科技有限公司 | Polishing apparatus and polishing pad removing method |
WO2024029234A1 (en) * | 2022-08-04 | 2024-02-08 | 日清紡ケミカル株式会社 | Air-blast abrasion material and fuel cell separator |
-
1990
- 1990-08-15 JP JP2215634A patent/JPH04101777A/en active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08163389A (en) * | 1994-12-07 | 1996-06-21 | Nec Corp | Horizontal pincushion distortion correction circuit |
EP0890417A1 (en) * | 1997-07-10 | 1999-01-13 | Tokyo Ohka Kogyo Co., Ltd. | Plastic abrasive for sandblasting, method for sandblast processing plasma display panel substrate using the same and method for treating sandblasting waste matters |
GB2330943A (en) * | 1997-10-31 | 1999-05-05 | Sony Corp | A method of manufacturing a flat display panel device |
GB2330943B (en) * | 1997-10-31 | 1999-09-29 | Sony Corp | Amethod of manufacturing a flat display panel device |
US6024619A (en) * | 1997-10-31 | 2000-02-15 | Sony Corporation | Method for manufacturing a flat display panel device |
WO2024029234A1 (en) * | 2022-08-04 | 2024-02-08 | 日清紡ケミカル株式会社 | Air-blast abrasion material and fuel cell separator |
CN115805520A (en) * | 2022-12-26 | 2023-03-17 | 西安奕斯伟材料科技有限公司 | Polishing apparatus and polishing pad removing method |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPH04101777A (en) | Blasting abrasive and barrier rib forming method using it | |
JPH08212929A (en) | Ac type plasma display panel and manufacture thereof | |
JP2999526B2 (en) | Barrier rib forming method | |
JP2001236890A (en) | Gas discharge display panel and its manufacturing method | |
US7563146B2 (en) | Unbaked laminate for producing front plate of plasma display device, and method for producing front plate of plasma display device | |
JP3306511B2 (en) | Rear substrate of plasma display panel and method of manufacturing the same | |
JP2814557B2 (en) | Method of manufacturing gas discharge panel | |
JPH08212928A (en) | Ac type plasma display panel and manufacture thereof | |
JP2999530B2 (en) | Barrier rib forming method | |
JP2750243B2 (en) | Method of forming partition wall of gas discharge display panel | |
JP3614592B2 (en) | Method for forming partition wall of display panel | |
JP3521995B2 (en) | Method for forming barrier of plasma display panel | |
JP2999531B2 (en) | Thick film layer etching method | |
JP3411229B2 (en) | Method of forming partition wall of plasma display panel | |
JPH04249033A (en) | Gas discharge type display panel and manufacture thereof | |
JP3025317B2 (en) | Method of manufacturing gas discharge type display panel | |
JP2702589B2 (en) | Method of manufacturing gas discharge type display panel | |
KR100925093B1 (en) | Plasma display panel manufacturing method | |
JPH07272632A (en) | Gas electric discharge panel and its manufacture | |
JP3429933B2 (en) | Method for forming partition of display panel | |
JPH10199420A (en) | Forming method of phosphor layer of plasma display panel | |
JP3903440B2 (en) | Gas discharge display panel and partition wall forming method thereof | |
KR100433220B1 (en) | Method of Fabricating Back Plate in Plasma Display Panel | |
JPH05135694A (en) | Manufacture of color gas electric discharge display panel | |
JPH06310033A (en) | Formation of barrier rib |