JP7452317B2 - Sockets, socket units, inspection jigs and inspection jig units - Google Patents

Description

The present disclosure relates to a socket, a socket unit, an inspection jig, and an inspection jig unit.

2. Description of the Related Art Electronic component modules such as cameras or liquid crystal panels are generally subjected to continuity tests, operating characteristic tests, etc. during their manufacturing process. These tests are performed by using probe pins to connect terminals for connection to the main body board installed in the electronic component module and terminals of the testing device.

A socket for accommodating such a probe pin is described in Patent Document 1. This socket includes a pair of housings having storage recesses and a positioning member that positions the pair of housings independently of each other.

JP2017-223630A

In recent years, with the diversification of inspection devices and electronic component modules, the number of probe pins required for inspection has also diversified. The socket of Patent Document 1 does not take into consideration the diversification of the number of accommodated probe pins.

An object of the present disclosure is to provide a socket in which the number of accommodated probe pins can be easily changed.

The socket of one aspect of the present disclosure includes:
A socket capable of accommodating a probe pin having a first contact and a second contact,
a first wall member and a second wall member spaced apart in a first direction;
a housing laminate disposed between the first wall member and the second wall member,
Each of the first wall member and the second wall member is separably connected to the housing laminate, and
The housing stack includes a plurality of housings arranged along the first direction and separably connected to each other,
Each of the plurality of housings has a first opening provided at one end in a second direction intersecting the first direction, a second opening provided at the other end in the second direction, and a second opening provided at the other end in the second direction. an accommodating portion provided inside each of the housings and connected to the first opening and the second opening;
The accommodating portion is configured to be able to accommodate the probe pin in a state where the first contact is exposed to the outside from the first opening and the second contact is exposed to the outside from the second opening.

A socket unit according to one embodiment of the present disclosure includes:
The present invention includes a plurality of sockets according to the above aspect and a base housing that integrally holds each of the plurality of sockets while positioning each of the plurality of sockets independently of each other.

An inspection jig according to one embodiment of the present disclosure includes:
The socket of the above aspect;
and a probe pin accommodated in the accommodation section.

An inspection jig unit according to one embodiment of the present disclosure includes:
The socket unit of the above aspect,
and a probe pin accommodated in the accommodation section.

According to the socket, the socket includes a first wall member and a second wall member that are spaced apart from each other in the first direction, and a housing laminate that is arranged between the first wall member and the second wall member. Each of the first wall member and the second wall member is separably connected to the housing stack. The housing stack includes a plurality of housings arranged along the first direction and separably connected to each other. Each of the plurality of housings has an accommodating portion capable of accommodating a probe pin. With such a configuration, it is possible to realize a socket in which the number of accommodated probe pins can be easily changed by changing the number of housings.

According to the socket unit, it is possible to realize a socket unit in which the number of accommodated probe pins can be easily changed by the socket.

According to the inspection jig, it is possible to realize an inspection jig in which the number of contact poles can be easily changed using the socket.

According to the inspection jig unit, the socket unit can realize an inspection jig unit in which the number of contact poles can be easily changed.

FIG. 1 is a perspective view showing an inspection jig including a socket according to an embodiment of the present disclosure. A sectional view taken along the II-II line in FIG. 1. A cross-sectional view taken along the III-III line in FIG. 1. FIG. 2 is a plan view of two sockets shown in FIG. 1 arranged side by side. FIG. 2 is a perspective view for explaining a method for removing one housing from the housing stack of the socket shown in FIG. 1; FIG. 2 is a perspective view showing a first modification of the socket of FIG. 1; FIG. 2 is a perspective view showing a second modification of the socket of FIG. 1; FIG. 2 is a perspective view showing a third modification of the socket of FIG. 1; FIG. 2 is an enlarged perspective view showing a fourth modification of the socket of FIG. 1; FIG. 2 is a sectional view showing a fifth modification of the socket of FIG. 1; FIG. 2 is a perspective view showing a sixth modification of the socket of FIG. 1; FIG. 2 is an enlarged perspective view showing a seventh modification of the socket of FIG. 1; FIG. 2 is a perspective view showing an inspection jig unit including a plurality of inspection jigs shown in FIG. 1;

An example of the present disclosure will be described below with reference to the accompanying drawings. In the following explanation, terms indicating specific directions or positions (for example, terms including "top," "bottom," "right," and "left") will be used as necessary. These terms are intended to facilitate understanding of the present disclosure with reference to the drawings, and the technical scope of the present disclosure is not limited by the meanings of these terms. Further, the following description is essentially only an example, and is not intended to limit the present disclosure, its applications, or its uses. Furthermore, the drawings are schematic, and the ratio of each dimension does not necessarily match the reality.

A socket 1 according to an embodiment of the present disclosure has, for example, an insulating, substantially rectangular parallelepiped shape, and as shown in FIG. 1, first wall members 10 are arranged at intervals in a first direction (for example, the X direction). and a second wall member 20, and a housing laminate 30 disposed between the first wall member 10 and the second wall member 20. The socket 1 has a substantially rectangular shape with the first direction X being the longitudinal direction when viewed along a second direction (for example, the Z direction) intersecting the first direction. Note that FIG. 1 shows, as an example, an inspection jig 100 in which a plurality of probe pins 40 are housed in a socket 1.

Each of the first wall member 10 and the second wall member 20 has a substantially L-shaped plate shape, and is connected to the housing laminate 30 in a separable manner. Specifically, each of the first wall member 10 and the second wall member 20 includes a first member 11, 21 connected to the housing laminate 30, and a second member 12, 22 connected to the first member 11, 21. It is made up of.

The first members 11 and 21 have a substantially rectangular plate shape, the first direction X is the plate thickness direction, and one surface facing the first direction 30.

The second members 12 and 22 have a substantially rectangular plate shape and are arranged so that the second direction Z is the thickness direction. The second members 12 and 22 have the other surface of the first members 11 and 21 facing the first direction X (in other words, the first surfaces 111 and 211 facing the housing laminate 30 in the first direction extends from the opposite second surface 112, 212) in the first direction X and away from the housing stack 30. The second members 12 and 22 are provided with through holes 13 and 23, which are examples of attachment portions. The through holes 13 and 23 are configured to accommodate a screw member (not shown), and the socket 1 can be attached to another member such as the base housing 60 (see FIG. 13) via the screw member.

As shown in FIG. 2, the first member 11 of the first wall member 10 has a first recess 14 provided on a first surface 111 facing the housing laminate 30. As shown in FIG. The first member 21 of the second wall member 20 has a second recess 24 provided on a first surface 211 facing the housing laminate 30 . In this embodiment, the first member 11 of the first wall member 10 has two first recesses 14 arranged at intervals in the second direction Z, and the first member 21 of the second wall member 20 has two first recesses 14 spaced apart from each other in the second direction Z. , has two second recesses 24 spaced apart in the second direction Z. Each first recess 14 is configured to accommodate one end of a connection member 50 described later, and each second recess 24 is configured to accommodate the other end of the connection member 50.

The housing stack 30 includes a plurality of housings 31 arranged along the first direction X and separably connected to each other.

As shown in FIG. 3, each housing 31 has a first opening 32 provided at one end in the second direction Z, a second opening 33 provided at the other end in the second direction Z, and It has a accommodating part 34 provided inside. The first opening 32 is arranged at the end of each housing 31 that is far from the center in the third direction Y. The first opening 32 has a width in the third direction Y that is smaller than the width of the accommodating portion 34 . The second opening 33 has substantially the same width in the third direction Y as the accommodating portion 34 . The accommodating portion 34 is connected to the first opening 32 and the second opening 33, and is configured to be able to accommodate the probe pin 40.

As an example, the probe pin 40 is an elongated thin plate formed by electroforming using a conductive material, and has contacts at both ends in the direction in which the probe pin 40 extends (hereinafter, the first contact 41 and a second contact 42). The accommodating part 34 has a probe pin 40 such that the first contact 41 is exposed to the outside of the accommodating part 34 from the first opening 32 and the second contact 42 is exposed to the outside of the accommodating part 34 from the second opening 33. It is configured to accommodate. In addition, in this embodiment, as shown in FIG. arranged at intervals. That is, the housing laminate 30 is configured to be able to accommodate the plurality of probe pins 40 in a mutually electrically independent state.

Each housing 31 has a notch 35 that penetrates each housing 31 in the first direction X and opens at an end of each housing 31 in the second direction Z. In this embodiment, each housing 31 has a notch 35 at both ends in the second direction Z. Each notch 35 is provided adjacent to the accommodating portion 34 in a third direction (for example, the Y direction) intersecting the first direction X and the second direction Z, and a connecting member 50 described later is arranged. .

As shown in FIG. 3, the probe pin 40 housed in the housing part 34 has a meandering elastic part 43 that expands and contracts along the second direction Z, and a meandering elastic part 43 that extends and contracts along the second direction Z. It has contact portions 44 and 45 provided therein. The elastic portion 43 and the contact portions 44 and 45 are arranged in series along the second direction Z and are integrally configured.

The elastic portion 43 is composed of a plurality of elastic pieces (in this embodiment, two elastic pieces 431 and 432). A through hole 433 is provided between the adjacent elastic pieces 431 and 432, passing through the elastic portion 43 in the thickness direction (in other words, the first direction X).

One contact portion 44 includes a substantially rectangular main body portion 441 that extends from the inside of the housing portion 34 to the outside along the second direction Z, and a support that extends from the main body portion 441 in the third direction Y inside the housing portion 34. 442. The first contact point 41 is provided at the end of the main body portion 441 located outside the housing portion 34 . The support portion 442 is in contact with the inner surface of the housing 31 that constitutes the accommodating portion 34 . The other contact portion 45 includes a main body portion 451 extending along the third direction Y inside the housing 31, and two protruding portions 452 extending from the main body portion 451 along the second direction Z toward the outside of the housing portion 34. It has A second contact 42 is provided at the tip of each protrusion 452 .

As shown in FIG. 2, the socket 1 further includes a connecting member 50 that extends along the first direction X and connects each of the plurality of housings 31 in a separable manner. For example, as shown in FIG. 3, the connecting member 50 has a substantially cylindrical shape and is disposed in the notch 35 of each housing 31. In this embodiment, the notch 35 has a substantially semicircular bottom surface along the outer surface of the connecting member 50.

Let L1N (N=number of housings 31) be the distance in the first direction The distance in the first direction X from the housing 31 to the accommodating portion 34 is assumed to be L2N (N=number of housings 31). The socket 1 is configured such that the distance L1N and the distance L2N are equal. In this embodiment, the thicknesses of the first wall member 10 and the second wall member 20 in the first direction X are adjusted so that the distance L1N and the distance L2N are equal. Specifically, the thickness of the first wall member 10 in the first direction .

Note that the distance from the second surface 112 of the first wall member 10 to the center of the accommodating portion 34 in the first direction X in the case along the second direction Z is defined as the distance L1N. Similarly, the distance from the second surface 212 of the second wall member 20 to the center of the accommodating portion 34 in the first direction X when viewed along the second direction Z is defined as the distance L2N.

FIG. 4 shows a case where two sockets 1 are arranged so that the first openings 32 are adjacent to each other in the third direction Y. As described above, the socket 1 is configured such that the distance L1N and the distance L2N are equal, and the adjacent first openings 32 are arranged in a straight line in the third direction Y. Further, in FIG. 4, the first wall member 10 of one socket 1 faces the second wall member 20 of the other socket 1, and the second surface 112 of the first wall member 10 of one socket 1 and the other socket The second surface 212 of the first second wall member 20 constitutes substantially the same plane.

According to the socket 1, the following effects can be achieved.

In the socket 1, a first wall member 10 and a second wall member 20 are arranged at intervals in the first direction, and a housing laminate 30 is arranged between the first wall member 10 and the second wall member 20. Equipped with Each of the first wall member 10 and the second wall member 20 is separably connected to the housing laminate 30. The housing stack 30 includes a plurality of housings 31 arranged along the first direction and separably connected to each other. Each of the plurality of housings 31 has an accommodating portion 34 that can accommodate the probe pin 40. With such a configuration, by changing the number of housings 31, it is possible to realize a socket 1 in which the number of accommodated probe pins 40 can be easily changed.

Each of the plurality of housings 31 has a notch 35 passing through each of the plurality of housings 31 in the first direction and opening at an end of each of the plurality of housings 31 in the second direction, and the connecting member 50 has a notch 35 that extends through the plurality of housings 31 in the first direction. It is located in With such a configuration, the plurality of housings 31 can be easily separated and connected by the connecting member 50. For example, as shown in FIG. 5, by separating the first wall member 10 from the housing laminate 30 and removing one of the connecting members 50, it is possible to create an intermediate structure with housings 31 disposed on both sides of the first direction X. Even the housing 31 can be easily separated from the housing stack 30. As a result, for example, even if one of the plurality of probe pins 40 housed in the housing stack 30 fails, the housing 31 housing the failed probe pin 40 can be separated from the housing stack 30. can be exchanged.

The first wall member 10 has a first recess 14 that accommodates one end of the connection member 50 in the first direction, and the second wall member 20 has a second recess that accommodates the other end of the connection member 50 in the first direction. It has 24. With such a configuration, the position of the connecting member 50 in the first direction It can be easily attached to the wall member 10 or the second wall member 20.

The socket 1 has a distance L1N in the first direction The distance L2N in the first direction X to each accommodating portion 34 of 31 is configured to be equal. With such a configuration, a highly versatile socket 1 can be realized.

According to the inspection jig 100, the socket 1 can realize an inspection jig 100 in which the number of contact poles can be easily changed.

The socket 1 can also be configured as follows.

The number of housings 31 constituting the housing stack 30 can be set arbitrarily. Further, the housing stack may be composed of housings all having the same shape and configuration, or may include housings having different shapes and configurations.

The first wall member 10 and the second wall member 20 can adopt any configuration that can be separably connected to the housing laminate 30. For example, as shown in FIG. 6, the through hole 13 of the first wall member 10 and the through hole 23 of the second wall member 20 may be configured to accommodate a pin instead of a screw member. Further, for example, as shown in FIGS. 7 and 8, the second members 12 and 22 of the first wall member 10 and the second wall member 20 may be omitted. In this case, the first members 11 and 21 of each of the first wall member 10 and the second wall member 20 may be provided with a protrusion 15 as a mounting portion. In the socket 1 of FIG. 7, each of the first wall member 10 and the second wall member 20 has a pair of protrusions 15 provided on one surface in the second direction Y and spaced apart in the third direction Y. are doing. Each protrusion 15 has a substantially cylindrical shape and is configured to be press fit into a hole or recess provided in another member such as the base housing 60 (see FIG. 13), for example. In the socket 1 of FIG. 8, each of the first wall member 10 and the second wall member 20 is provided on the second surface 112, 212 in the first direction have. The protrusion 16 has a substantially rectangular parallelepiped shape, and is configured to be press fit into a groove or slit provided in another member such as the base housing 60 (see FIG. 13), for example.

The accommodating portion 34 of each housing 31 can be configured to accommodate not only one probe pin 40 but also a plurality of probe pins 40 as shown in FIG. 9 . The socket 1 in FIG. 9 includes the same first wall member 10 as the socket 1 in FIG.

The number of connection members 50 is not limited to two, and may be one, for example, as shown in FIG. 10. In the socket 1 of FIG. 10, the connecting member 50 and the notch 35 both have a substantially T-shaped cross section. Note that in the socket 1 of FIG. 10, the second opening 33 is closed with a lid member 36. The lid member 36 is provided with a through hole 361 that penetrates the lid member 36 in its thickness direction, and the protruding portion 452 of the probe pin 40 is exposed to the outside of the housing portion 34 through the through hole 361. The socket 1 in FIG. 10 includes the same second wall member 20 as the socket 1 in FIG.

The connecting member 50 and the notch 35 can also be omitted. In this case, for example, as shown in FIG. 11, each housing 31 has a protrusion 37 provided on one surface in the first direction X, and a recess 38 provided on the other surface in the first direction X. are doing. In the socket 1 of FIG. 11, the housings 31 are connected to each other by fitting the protrusions 37 of the housings 31 adjacent to the recesses 38. For example, each of the protrusion 37 and the recess 38 has a substantially rectangular shape when viewed along the first direction X. The socket 1 in FIG. 11 includes the same first wall member 10 as the socket 1 in FIG.

As shown in FIG. 12, each housing 31 can be configured to accommodate not only one probe pin 40 but also a plurality of probe pins 40. In the socket 1 of FIG. 12, the housing laminate 30 includes a housing 31 that accommodates two probe pins 40 and a housing 31 that accommodates three probe pins 40. The socket 1 in FIG. 12 includes the same second wall member 20 as the socket 1 in FIG. Further, the probe pin 40 accommodated in the socket 1 of FIG. 12 has a different shape of the first contact 41 from the probe pin 40 accommodated in the socket 1 of FIG.

The socket unit 2 can be configured by a plurality of sockets 1 and a base housing 60 that integrally holds each socket 1 while positioning each socket 1 independently. FIG. 13 shows, as an example, an inspection jig unit 200 in which a plurality of probe pins 40 are housed in a socket unit 2. According to the socket unit 2, the socket 1 can realize a socket unit 2 in which the number of accommodated probe pins 40 can be easily changed. Further, according to the inspection jig unit 200, the socket unit 2 can realize an inspection jig unit 200 in which the number of contact poles can be easily changed. By adjusting the pitch between the probe pins 40 in the third direction Y, the inspection jig unit 200 shown in FIG. 13 can be applied to various types of terminals of inspection devices or objects to be inspected.

The first recess 14 of the first wall member 10 and the second recess 24 of the second wall member 20 may be through holes.

The socket 1 is not limited to the case where the distance L1N and the distance L2N are equal, but it is also possible to configure the socket 1 so that the distance L1N and the distance L2N are different.

The probe pin 40 is not limited to the above embodiment, but may have any shape and structure that can be accommodated in the housing portion 34 of the housing 31 and that allows the contacts to be exposed from the first opening 32 and the second opening 33. Can be adopted.

Various embodiments of the present disclosure have been described above in detail with reference to the drawings, and finally, various aspects of the present disclosure will be described. Note that in the following description, reference numerals are also included as an example.

The socket 1 of the first aspect of the present disclosure includes:
A socket 1 capable of accommodating a probe pin 40 having a first contact 41 and a second contact 42,
A first wall member 10 and a second wall member 20 spaced apart in a first direction;
a housing laminate 30 disposed between the first wall member 10 and the second wall member 20;
Each of the first wall member 10 and the second wall member 20 is separably connected to the housing laminate 30, and
The housing stack 30 includes a plurality of housings 31 arranged along the first direction and separably connected to each other,
Each of the plurality of housings 31 has a first opening 32 provided at one end in a second direction intersecting the first direction, and a second opening 33 provided at the other end in the second direction. an accommodating portion 34 provided inside each of the plurality of housings 31 and connected to the first opening 32 and the second opening 33;
The accommodating portion 34 is capable of accommodating the probe pin 40 with the first contact 41 exposed to the outside from the first opening 32 and the second contact 42 exposed to the outside from the second opening 33. It is configured.

The socket 1 according to the second aspect of the present disclosure includes:
further comprising a connecting member 50 extending in the first direction and connecting each of the plurality of housings 31 in a separable manner;
Each of the plurality of housings 31
a notch 35 passing through each of the plurality of housings 31 in the first direction and opening at an end of each of the plurality of housings 31 in the second direction;
The connecting member 50 is arranged in the notch 35.

The socket 1 according to the third aspect of the present disclosure includes:
The first wall member 10 is
a first recess 14 for accommodating one end of the connection member 50 in the first direction;
The second wall member 20 is
It has a second recess 24 that accommodates the other end of the connection member 50 in the first direction.

The socket 1 according to the fourth aspect of the present disclosure includes:
Each of the plurality of housings 31 is configured to be able to accommodate a plurality of probe pins 40.

The socket 1 according to the fifth aspect of the present disclosure includes:
Each of the first wall member 10 and the second wall member 20 has a first surface 111, 211 facing the housing laminate 30, and a side opposite to the first surface 111, 211 in the first direction. and a second surface 112, 212 arranged therein.
The distance in the first direction from the second surface 112 of the first wall member 10 to the accommodating portion 34 of each of the plurality of housings 31, and the distance from the second surface 212 of the second wall member 20 to the plurality of housings 34. The distances in the first direction from each of the housings 31 to the accommodating portion 34 are equal to each other.

The socket unit 2 of the sixth aspect of the present disclosure includes:
The present invention includes a plurality of sockets 1 of the above embodiments and a base housing 60 that integrally holds each of the plurality of sockets 1 while positioning each of the plurality of sockets 1 independently of each other.

The socket unit 2 of the seventh aspect of the present disclosure includes:
Each of the plurality of sockets 1
At least one of the first wall member 10 and the second wall member 20 has attachment parts 13 , 23 , 15 , and 16 for attaching each of the plurality of sockets 1 to the base housing 60 .

The inspection jig 100 of the eighth aspect of the present disclosure includes:
The socket 1 of the above aspect,
and a probe pin 40 accommodated in the accommodation section 34.

The inspection jig unit 200 of the ninth aspect of the present disclosure includes:
The socket unit 2 of the above aspect,
and a probe pin 40 accommodated in the accommodation section 34.

Note that by appropriately combining any of the various embodiments or modifications described above, the effects of each can be achieved. In addition, combinations of embodiments, combinations of examples, or combinations of embodiments and examples are possible, and combinations of features in different embodiments or examples are also possible.

The socket of the present disclosure is applicable to, for example, a module including a BtoB (Business-to-Business) connector as a connection medium, such as a camera module, and a SOP (Small Outline Package), a QFP (Quad Flat Package), and a BGA (Ball grid array). It can be applied to inspection jigs used for inspection of semiconductor packages such as.

1 Socket 2 Socket unit 10 First wall member 11 First member 111 First surface 112 Second surface 12 Second member 13 Through hole 14 First recess 15, 16 Projection 20 Second wall member 21 First member 211 First surface 212 Second surface 22 Second member 23 Through hole 24 Second recess 30 Housing laminate 31 Housing 32 First opening 33 Second opening 34 Receiving portion 35 Notch 36 Cover member 361 Through hole 37 Projection 38 Recess 40 Probe pin 41 First contact 42 Second contact 43 Elastic parts 431, 432 Elastic pieces 44, 45 Contact parts 441, 451 Main body part 442 Support part 452 Projection part 50 Connection member 60 Base housing 100 Inspection jig 200 Inspection jig unit

Claims (9)

A socket capable of accommodating a probe pin having a first contact and a second contact,
a first wall member and a second wall member spaced apart in a first direction;
a housing laminate disposed between the first wall member and the second wall member,
Each of the first wall member and the second wall member is separably connected to the housing laminate, and
The housing stack includes a plurality of housings each arranged along the first direction and separably connected to each other,
Each of the plurality of housings has a first opening provided at one end in a second direction intersecting the first direction, a second opening provided at the other end in the second direction, and a second opening provided at the other end in the second direction. an accommodating portion provided inside each of the housings and connected to the first opening and the second opening;
The accommodating portion is configured to be able to accommodate the probe pin in a state in which the first contact is exposed to the outside from the first opening and the second contact is exposed to the outside from the second opening. . further comprising a connecting member extending in the first direction and connecting each of the plurality of housings in a separable manner;
Each of the plurality of housings includes:
a notch passing through each of the plurality of housings in the first direction and opening at an end of each of the plurality of housings in the second direction;
2. The socket of claim 1, wherein the connecting member is located in the notch. The first wall member is
a first recess for accommodating one end of the connection member in the first direction;
The second wall member is
The socket according to claim 2, further comprising a second recess for accommodating the other end of the connecting member in the first direction. 4. The socket according to claim 1, wherein each of the plurality of housings is configured to accommodate a plurality of probe pins. Each of the first wall member and the second wall member has a first surface facing the housing laminate, and a second surface disposed on a side opposite to the first surface in the first direction. death,
the distance in the first direction from the second surface of the first wall member to the accommodating portion of each of the plurality of housings; The socket according to any one of claims 1 to 4, wherein the socket is configured such that the distance in the first direction to the accommodating portion is equal. A socket unit comprising: a plurality of sockets according to any one of claims 1 to 5; and a base housing that integrally holds each of the plurality of sockets while positioning each of the plurality of sockets independently of each other. Each of the plurality of sockets is
7. The socket unit according to claim 6, further comprising a mounting portion provided on at least one of the first wall member and the second wall member for mounting each of the plurality of sockets to the base housing. A socket according to any one of claims 1 to 5,
An inspection jig comprising: a probe pin accommodated in the accommodation section. The socket unit according to claim 6 or 7;
An inspection jig unit comprising: a probe pin accommodated in the accommodation section.

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