JP7396824B2 - 超音波水噴射装置 - Google Patents
超音波水噴射装置 Download PDFInfo
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- JP7396824B2 JP7396824B2 JP2019123614A JP2019123614A JP7396824B2 JP 7396824 B2 JP7396824 B2 JP 7396824B2 JP 2019123614 A JP2019123614 A JP 2019123614A JP 2019123614 A JP2019123614 A JP 2019123614A JP 7396824 B2 JP7396824 B2 JP 7396824B2
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 title claims description 219
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- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
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- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
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- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
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- B05B17/00—Apparatus for spraying or atomising liquids or other fluent materials, not covered by the preceding groups
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- B05B17/06—Apparatus for spraying or atomising liquids or other fluent materials, not covered by the preceding groups operating with special methods using ultrasonic or other kinds of vibrations
- B05B17/0607—Apparatus for spraying or atomising liquids or other fluent materials, not covered by the preceding groups operating with special methods using ultrasonic or other kinds of vibrations generated by electrical means, e.g. piezoelectric transducers
- B05B17/0638—Apparatus for spraying or atomising liquids or other fluent materials, not covered by the preceding groups operating with special methods using ultrasonic or other kinds of vibrations generated by electrical means, e.g. piezoelectric transducers spray being produced by discharging the liquid or other fluent material through a plate comprising a plurality of orifices
- B05B17/0646—Vibrating plates, i.e. plates being directly subjected to the vibrations, e.g. having a piezoelectric transducer attached thereto
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- B08B3/10—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration
- B08B3/12—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration by sonic or ultrasonic vibrations
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- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
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- H—ELECTRICITY
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- H01L21/68764—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating caroussel
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- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
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- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Cleaning By Liquid Or Steam (AREA)
- Reciprocating Pumps (AREA)
- Special Spraying Apparatus (AREA)
- Apparatuses For Generation Of Mechanical Vibrations (AREA)
Description
図1に示すスピンナ洗浄機構1は、例えば、被加工物Wを保持するスピンナテーブル10と、スピンナテーブル10で保持された被加工物Wに洗浄水を噴射する本発明に係る超音波水噴射装置2と、スピンナテーブル10を囲繞する図示しないケースとを備えている。
スピンナテーブル10の下側にはモータ及び軸方向がZ軸方向(鉛直方向)であるスピンドル等からなるスピンナテーブル回転手段103が配設されており、スピンナテーブル回転手段103によってスピンナテーブル10は水平面内において回転可能となっている。
水供給パイプ12は、水平方向に延在しており、その後端側にはポンプ等からなり洗浄水(例えば、純水)を送出可能な水供給源19が樹脂チューブや継手を介して連通している。
水供給パイプ12の後端側には、軸方向がZ軸方向である旋回軸18が連結されており、旋回軸18はその下端に連結された旋回モータ17によって回転可能となっている。なお、水供給パイプ12は、旋回軸18の上端から少なくともスピンナテーブル10の中心まで届く長さを有している。これにより、旋回軸18は、水供給パイプ12の先端に配設された超音波水噴射装置2を、スピンナテーブル10で保持された被加工物Wの外周縁から中心まで移動させることが可能となっている。
溜められる。
例えば、ツバ部31の外周縁から径方向に外側に張り出した環状板32は、その外周部分が水溜部20の側壁202に支持されていて、ドーム部30を水溜部20内で中空固定している。環状板32は、その厚みが例えば、0.1mmから0.2mmであり、環状幅(リング幅)は、例えば、3.0mmであり、材質は、例えばステンレスであると好ましい。また、環状板32は、外周部分の2.0mm幅が側壁202で支持されていて、ドーム部30の外周と側壁202との間が1.0mmである。そして、環状板32は、その1.0mmの部分で超音波振動を増幅させている。なお、ドーム部30は、輻射面302bの直径が16mmでツバ部31の直径が20mmで形成されている。
まず、被加工物Wの中心がスピンナテーブル10の保持面100aの中心におおよそ合致するようにして、被加工物Wが保持面100a上に載置される。そして、図示しない吸引源が作動して生み出された吸引力が、保持面100aに伝達されることで、スピンナテーブル10が被加工物Wを吸引保持する。
波水噴射装置2が、スピンナテーブル10の外側の退避位置から被加工物Wの上方に移動され、噴射口205aが被加工物Wの上面Waに対向する。
水溜部20の第二室20B内に水が所定量溜められていき、第二室20B内の水圧が上昇し、噴射口205aから洗浄水が下方に向かって噴射される。なお、水供給源19から水が供給され続けることで、水は第二室20B内に所定量常に溜められる。
ここで、図2に示す環状板32によって、超音波振動を発生させるドーム部30が水溜部20の側壁202に直接保持されていない状態となっているため、圧電振動板3に高周波電力を供給した際にドーム部30が振動しやすくなり、洗浄水に効果的に環状板32で増幅された振幅の大きな超音波振動を伝播させることができる。
振動板3から洗浄水に超音波振動を伝播させた超音波洗浄水は、被加工物Wの被洗浄面である上面Waが凸凹であっても、超音波振動により凹んだ部分に溜まった汚れを掻き出して洗浄を行うことが可能となる。
本発明に係る超音波水噴射装置2は、図3に示すように、保持手段40に保持された被加工物W1に対して切削手段42によって切削加工を施す切削装置4に配設されていてもよい。
切削装置4の保持手段40は、例えば、その外形が円形板状であり、ポーラス部材等からなり図示しない吸引源に連通する平坦な保持面40a上で被加工物W1を吸引保持することができる。保持手段40は、X軸方向に往復移動可能であると共に、軸方向がZ軸方向である図示しない回転軸を軸に回転可能である。
部を刃厚方向(Y軸方向)両側から挟むようにしてX軸方向に互いに平行に延びている。一対の切削水ノズル425のそれぞれの上端は、水供給源49に樹脂チューブ490等を介して連通している。一対の切削水ノズル425は切削ブレード423の側面に対面する内側面に複数のスリットを備えており、スリットから噴射される切削水によって、切削ブレード423と被加工物W1との接触部位である加工点が冷却及び洗浄される。
まず、被加工物W1が、表面W1aが上側になるように保持手段40の保持面40a上に載置される。そして、図示しない吸引源により生み出される吸引力が保持面40aに伝達されることにより、保持手段40が保持面40a上で被加工物W1を吸引保持する。また、被加工物W1の中心と保持面40aの中心とは略合致した状態になる。
加工物W1との接触部位である加工点に供給される。なお、水供給源49から水が供給され続けることで、水は第二室20B内に所定量常に溜められる。
図5に示す超音波分割装置7は、本発明に係る超音波振動ホーン8から発生させた超音波振動を一点に集中させ例えば水を介して被加工物W2に付与することで、被加工物W2を分割する装置である。
なお、分割起点Nは、レーザビームの照射により被加工物W2の内部が改質されて周囲よりも強度が低下した領域である。分割起点Nからは、被加工物W2の表面W2a又は裏面W2bにそれぞれクラックが伸長していてもよい。また、本実施形態においては、分割起点Nは被加工物W2の厚み方向(Z軸方向)にも複数段形成されているが、被加工物W2の厚み方向においては1段形成されているだけでもよい。
水槽75をX軸方向に移動させるX軸移動手段73は、例えば、X軸方向に延びるX軸ベース730と、X軸方向の軸心を有しX軸ベース730上に配設されるボールネジ731と、ボールネジ731と平行に配設された一対のガイドレール732と、ボールネジ731を回動させるモータ733と、を備えている。
水槽75の底板751の下面中央には、ボールネジ731に螺合するナット750aが配設されており、底板751の下面のY軸方向両側の領域には、一対のガイドレール732に緩嵌合するスライダー750bが配設されている。そして、モータ733がボールネジ731を回動させると、これに伴い水槽75が一対のガイドレール732にガイドされてX軸方向に直動する。
持するハウジング80とを備えている。
また、Z軸移動手段78がZ軸方向に超音波振動ホーン8を昇降させて、圧電振動板3の超音波を集中させる焦点が被加工物W2内部に形成された分割起点Nの高さに略合致するように、超音波振動ホーン8が所定の高さに位置付けられる。なお、圧電振動板3の超音波を集中させる焦点の高さが、被加工物W2の裏面W2bの高さに合わせられてもよい。
1:スピンナ洗浄機構
10:スピンナテーブル 103:スピンナテーブル回転手段
12:水供給パイプ 17:旋回モータ 18:旋回軸 19:水供給源
2:超音波水噴射装置
20:水溜部 20A:第一室 20B:第二室 200:底板 201:天板 202:側壁 202a:水供給口 205:ノズル部 205a:噴射口
3:圧電振動板 30:ドーム部 301:第1電極板 302:第2電極板 304:圧電素材
31:ツバ部 32:環状板 39:高周波電源 390:配線
W1:被加工物 S:分割予定ライン D:デバイス T:ダイシングテープ M:切削溝
4:切削装置
40:保持手段 40a:保持面
42:切削手段 420:スピンドル 423:切削ブレード
424:ブレードカバー 425:切削水ノズル
426:支持ブロック 428:回転軸 49:水供給源
W2:被加工物 S2:分割予定ライン D2:デバイス N:分割起点 T2:テープ
7:超音波分割装置
75:水槽 750:側壁 751:底板
72:載置テーブル 73:X軸移動手段 77:Y軸移動手段 78:Z軸移動手段
79:アライメント手段
8:超音波振動ホーン 80:ハウジング
Claims (1)
- 超音波振動を伝播させた水を被加工物に噴射する超音波水噴射装置であって、
底板と該底板に連結された側壁とを備え、水供給源から供給される水を一時的に溜める水溜部と、
該水溜部に溜められた水を噴射する噴射口と、
該噴射口に対向して該水溜部に配設され該水溜部に溜められた水に超音波振動を伝播する圧電振動板と、を備え、
該圧電振動板は、高周波電源に電気的に接続されたドーム部と、該ドーム部の外周縁から径方向に外側に張り出したツバ部と、該ツバ部の外周縁から径方向に外側に張り出した環状板と、を備え、
該圧電振動板の前記ドーム部の凹んでいる面側は該噴射口に向けられており、該圧電振動板の前記環状板の外周部分が該水溜部の該側壁に支持されていて、該ドーム部は該環状板を介して中空固定され、
該圧電振動板に供給される高周波電力によって該圧電振動板から発生する超音波振動を該噴射口に向かって集中させ、該水溜部で該超音波振動が伝播された水を該噴射口から噴射する超音波水噴射装置。
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TW109119955A TWI845705B (zh) | 2019-07-02 | 2020-06-12 | 壓電振動板、超音波水噴射裝置、及超音波振動喇叭 |
US16/910,444 US11872581B2 (en) | 2019-07-02 | 2020-06-24 | Ultrasonic water jet apparatus including piezoelectric vibration plate |
KR1020200078300A KR20210003675A (ko) | 2019-07-02 | 2020-06-26 | 압전 진동판, 초음파수 분사 장치 및 초음파 진동 혼 |
CN202010621744.0A CN112170325B (zh) | 2019-07-02 | 2020-07-01 | 压电振动板、超声波水喷射装置以及超声波振动变幅器 |
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