JP6732213B2 - ガラス基板の製造方法 - Google Patents
ガラス基板の製造方法 Download PDFInfo
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- JP6732213B2 JP6732213B2 JP2016223260A JP2016223260A JP6732213B2 JP 6732213 B2 JP6732213 B2 JP 6732213B2 JP 2016223260 A JP2016223260 A JP 2016223260A JP 2016223260 A JP2016223260 A JP 2016223260A JP 6732213 B2 JP6732213 B2 JP 6732213B2
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- glass substrate
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- processing device
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- 239000000758 substrate Substances 0.000 title claims description 135
- 239000011521 glass Substances 0.000 title claims description 134
- 238000004519 manufacturing process Methods 0.000 title claims description 24
- 238000012545 processing Methods 0.000 claims description 154
- 238000000034 method Methods 0.000 claims description 44
- 238000005530 etching Methods 0.000 claims description 32
- 238000012546 transfer Methods 0.000 claims description 21
- 239000007789 gas Substances 0.000 description 90
- 238000010926 purge Methods 0.000 description 29
- 230000008569 process Effects 0.000 description 25
- 238000011144 upstream manufacturing Methods 0.000 description 22
- 238000002347 injection Methods 0.000 description 19
- 239000007924 injection Substances 0.000 description 19
- 229910000831 Steel Inorganic materials 0.000 description 8
- 239000010959 steel Substances 0.000 description 8
- 238000004140 cleaning Methods 0.000 description 7
- 239000000428 dust Substances 0.000 description 7
- 230000006866 deterioration Effects 0.000 description 4
- 230000002093 peripheral effect Effects 0.000 description 4
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 230000005611 electricity Effects 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 229910000040 hydrogen fluoride Inorganic materials 0.000 description 3
- 230000003068 static effect Effects 0.000 description 3
- 230000002411 adverse Effects 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 2
- 238000005452 bending Methods 0.000 description 2
- 238000009833 condensation Methods 0.000 description 2
- 230000005494 condensation Effects 0.000 description 2
- 238000007599 discharging Methods 0.000 description 2
- 230000003014 reinforcing effect Effects 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 230000008859 change Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000011143 downstream manufacturing Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 238000007788 roughening Methods 0.000 description 1
- 238000013022 venting Methods 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C15/00—Surface treatment of glass, not in the form of fibres or filaments, by etching
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
- B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
- B65G49/063—Transporting devices for sheet glass
- B65G49/064—Transporting devices for sheet glass in a horizontal position
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3105—After-treatment
- H01L21/311—Etching the insulating layers by chemical or physical means
- H01L21/31105—Etching inorganic layers
- H01L21/31111—Etching inorganic layers by chemical means
- H01L21/31116—Etching inorganic layers by chemical means by dry-etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G2201/00—Indexing codes relating to handling devices, e.g. conveyors, characterised by the type of product or load being conveyed or handled
- B65G2201/02—Articles
- B65G2201/0214—Articles of special size, shape or weigh
- B65G2201/022—Flat
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Geochemistry & Mineralogy (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Inorganic Chemistry (AREA)
- Surface Treatment Of Glass (AREA)
- Cleaning In General (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Drying Of Semiconductors (AREA)
Description
2a 下面
4 処理ガス
5 処理器
5a 本体部(下部構成体)
5b 天板部(上部構成体)
8 チャンバー
8aa 搬入口
8ab 搬出口
10 第一ダミー処理器
11 第二ダミー処理器
12 吸引ノズル
12a 吸引口
13 処理空間
14 給気口
Claims (4)
- 搬入口からチャンバー内に搬入したガラス基板を平置き姿勢で搬送経路に沿って搬送しつつ、前記搬送経路上に配置した処理器が給気する処理ガスにより下面にエッチング処理を施した後、処理後の前記ガラス基板を搬出口から前記チャンバー外に搬出するガラス基板の製造方法であって、
前記チャンバー内における前記搬送経路よりも上方側で且つ前記処理器よりも前記ガラス基板の搬送方向の下流側に配置された吸引口から、該チャンバー外に排気を行うことを特徴とするガラス基板の製造方法。 - 前記処理器として、前記搬送経路を上下に挟んで対向する上部構成体と下部構成体とを備え、且つ、両構成体の相互間に形成される処理空間に前記処理ガスを給気する給気口が前記下部構成体に備わった処理器を用いると共に、
前記搬送経路の下方から前記チャンバー外に連なる排気口を有し、且つ、搬送方向に沿った方向から視て前記処理器と同一の外形を有する第一ダミー処理器を、前記搬送経路上における前記処理器と前記搬出口との間に配置することを特徴とする請求項1に記載のガラス基板の製造方法。 - 前記第一ダミー処理器よりも前記ガラス基板の搬送方向の下流側で、前記吸引口から前記チャンバー外に排気を行うことを特徴とする請求項2に記載のガラス基板の製造方法。
- 前記搬送経路の下方から前記チャンバー外に連なる排気口を有し、且つ、搬送方向に沿った方向から視て前記処理器と同一の外形を有する第二ダミー処理器を、前記搬送経路上における前記処理器と前記搬入口との間に配置することを特徴とする請求項2又は3に記載のガラス基板の製造方法。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016223260A JP6732213B2 (ja) | 2016-11-16 | 2016-11-16 | ガラス基板の製造方法 |
KR1020197009972A KR102423339B1 (ko) | 2016-11-16 | 2017-10-30 | 유리 기판의 제조 방법 |
PCT/JP2017/039063 WO2018092560A1 (ja) | 2016-11-16 | 2017-10-30 | ガラス基板の製造方法 |
CN201780064645.3A CN109843822B (zh) | 2016-11-16 | 2017-10-30 | 玻璃基板的制造方法 |
TW106138542A TWI735697B (zh) | 2016-11-16 | 2017-11-08 | 玻璃基板之製造方法 |
Applications Claiming Priority (1)
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---|---|---|---|
JP2016223260A JP6732213B2 (ja) | 2016-11-16 | 2016-11-16 | ガラス基板の製造方法 |
Publications (2)
Publication Number | Publication Date |
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JP2018080082A JP2018080082A (ja) | 2018-05-24 |
JP6732213B2 true JP6732213B2 (ja) | 2020-07-29 |
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JP2016223260A Active JP6732213B2 (ja) | 2016-11-16 | 2016-11-16 | ガラス基板の製造方法 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP6732213B2 (ja) |
KR (1) | KR102423339B1 (ja) |
CN (1) | CN109843822B (ja) |
TW (1) | TWI735697B (ja) |
WO (1) | WO2018092560A1 (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110429053B (zh) * | 2019-08-19 | 2021-03-23 | 江阴江化微电子材料股份有限公司 | 一种具有活动盖板的湿蚀刻设备及湿蚀刻方法 |
KR20220106954A (ko) * | 2019-12-10 | 2022-08-01 | 니폰 덴키 가라스 가부시키가이샤 | 유리판의 제조 방법 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4451952B2 (ja) * | 1999-12-24 | 2010-04-14 | キヤノンアネルバ株式会社 | 基板処理装置 |
JP4044047B2 (ja) * | 2002-02-04 | 2008-02-06 | 住友精密工業株式会社 | 搬送式基板処理装置 |
JP4398262B2 (ja) * | 2004-01-08 | 2010-01-13 | 大日本スクリーン製造株式会社 | 基板処理装置 |
JP4641168B2 (ja) * | 2004-09-22 | 2011-03-02 | 芝浦メカトロニクス株式会社 | 基板の処理装置 |
US20100212832A1 (en) * | 2005-12-28 | 2010-08-26 | Sharp Kabushiki Kaisha | Stage device and plasma treatment apparatus |
JP2008159663A (ja) * | 2006-12-21 | 2008-07-10 | Tokyo Electron Ltd | 基板処理装置 |
JP4681640B2 (ja) * | 2008-09-30 | 2011-05-11 | 積水化学工業株式会社 | 表面処理方法 |
KR101353525B1 (ko) * | 2010-02-09 | 2014-01-21 | 주식회사 엘지화학 | 유리판 제조 시스템용 레이-아웃 및 유리판 처리 방법 및 그에 따른 유리판 |
JP5103631B2 (ja) * | 2010-03-24 | 2012-12-19 | 国立大学法人 熊本大学 | 加工方法 |
JP5176007B2 (ja) * | 2011-03-03 | 2013-04-03 | パナソニック株式会社 | 半導体基板の表面エッチング装置、およびそれを用いて表面に凹凸形状が形成された半導体基板を製造する方法 |
JP6048817B2 (ja) * | 2012-12-27 | 2016-12-21 | 日本電気硝子株式会社 | 板状ガラスの表面処理装置及び表面処理方法 |
WO2015159927A1 (ja) * | 2014-04-16 | 2015-10-22 | 旭硝子株式会社 | エッチング装置、エッチング方法、基板の製造方法、および基板 |
-
2016
- 2016-11-16 JP JP2016223260A patent/JP6732213B2/ja active Active
-
2017
- 2017-10-30 KR KR1020197009972A patent/KR102423339B1/ko active IP Right Grant
- 2017-10-30 CN CN201780064645.3A patent/CN109843822B/zh active Active
- 2017-10-30 WO PCT/JP2017/039063 patent/WO2018092560A1/ja active Application Filing
- 2017-11-08 TW TW106138542A patent/TWI735697B/zh active
Also Published As
Publication number | Publication date |
---|---|
KR102423339B1 (ko) | 2022-07-21 |
TWI735697B (zh) | 2021-08-11 |
CN109843822B (zh) | 2022-08-26 |
TW201830515A (zh) | 2018-08-16 |
KR20190084031A (ko) | 2019-07-15 |
CN109843822A (zh) | 2019-06-04 |
WO2018092560A1 (ja) | 2018-05-24 |
JP2018080082A (ja) | 2018-05-24 |
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