JP6529059B1 - 電子ビーム照射装置 - Google Patents
電子ビーム照射装置 Download PDFInfo
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- JP6529059B1 JP6529059B1 JP2018242052A JP2018242052A JP6529059B1 JP 6529059 B1 JP6529059 B1 JP 6529059B1 JP 2018242052 A JP2018242052 A JP 2018242052A JP 2018242052 A JP2018242052 A JP 2018242052A JP 6529059 B1 JP6529059 B1 JP 6529059B1
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- Prior art keywords
- electron beam
- hydrogen gas
- water
- irradiation port
- irradiation apparatus
- Prior art date
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- 238000010894 electron beam technology Methods 0.000 title claims abstract description 110
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims abstract description 66
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 51
- 230000001133 acceleration Effects 0.000 claims abstract description 36
- 239000007789 gas Substances 0.000 claims description 10
- 239000007788 liquid Substances 0.000 claims description 6
- 230000001678 irradiating effect Effects 0.000 abstract description 8
- 230000005540 biological transmission Effects 0.000 description 5
- 230000004927 fusion Effects 0.000 description 5
- YZCKVEUIGOORGS-OUBTZVSYSA-N Deuterium Chemical compound [2H] YZCKVEUIGOORGS-OUBTZVSYSA-N 0.000 description 3
- YZCKVEUIGOORGS-NJFSPNSNSA-N Tritium Chemical compound [3H] YZCKVEUIGOORGS-NJFSPNSNSA-N 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 3
- 229910052805 deuterium Inorganic materials 0.000 description 3
- 239000001301 oxygen Substances 0.000 description 3
- 229910052760 oxygen Inorganic materials 0.000 description 3
- 238000010248 power generation Methods 0.000 description 3
- 229910052722 tritium Inorganic materials 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 2
- 238000011084 recovery Methods 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 125000004429 atom Chemical group 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 239000012466 permeate Substances 0.000 description 1
- 238000001020 plasma etching Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/3002—Details
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K5/00—Irradiation devices
- G21K5/04—Irradiation devices with beam-forming means
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K5/00—Irradiation devices
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21B—FUSION REACTORS
- G21B3/00—Low temperature nuclear fusion reactors, e.g. alleged cold fusion reactors
- G21B3/006—Fusion by impact, e.g. cluster/beam interaction, ion beam collisions, impact on a target
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J33/00—Discharge tubes with provision for emergence of electrons or ions from the vessel; Lenard tubes
- H01J33/02—Details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/06—Electron sources; Electron guns
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H9/00—Linear accelerators
- H05H9/04—Standing-wave linear accelerators
- H05H9/048—Lepton LINACS
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/006—Details of gas supplies, e.g. in an ion source, to a beam line, to a specimen or to a workpiece
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/04—Means for controlling the discharge
- H01J2237/047—Changing particle velocity
- H01J2237/0473—Changing particle velocity accelerating
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E30/00—Energy generation of nuclear origin
- Y02E30/10—Nuclear fusion reactors
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Plasma & Fusion (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Particle Accelerators (AREA)
- Plasma Technology (AREA)
Abstract
Description
図1乃至図3は、本発明の実施の形態の電子ビーム照射装置を示している。
図1に示すように、電子ビーム照射装置10は、加速管11と電子銃12と水素ガス供給手段13とを有している。
電子ビーム照射装置10は、電子銃12で生成され、加速管11の加速空間21で加速された電子ビーム31により、水素ガス供給手段13から加速空間21に供給された水素ガスのうち、電子ビーム31が通過する部分の水素ガスを次々に電離して、プラズマ化することができる。このとき、水素ガスの電離により電子ビーム31の運動エネルギーが吸収されるが、各電極23間に電圧が印加されているため、電子ビーム31は加速され続ける。発生したプラズマ33に継続して電子ビーム31を照射することにより、プラズマ33を加熱することができるため、同じ圧力の下では、プラズマ33を膨張させて密度を低下させることができる。これにより、電子ビーム31の運動エネルギーの吸収を小さくすることができ、電子ビーム透過距離を長くすることができる。
10 電子ビーム照射装置
11 加速管
11a 一方の端面
11b 他方の端面
11c 側壁
21 加速空間
22 照射口
23 電極
23a 穴
24 高圧電源
25 ガス供給口
12 電子銃
13 水素ガス供給手段
14 水流発生手段
14a モータ
15 供給回収管
31 電子ビーム
32 (照射口から放出された)水素ガス
33 プラズマ
51 超臨界水
52 高圧容器
53 熱交換器
54 タービン
Claims (3)
- 電子ビームを生成する電子銃と、
前記電子銃で生成された前記電子ビームを加速するよう設けられた加速空間と、前記加速空間で加速された前記電子ビームを外部に照射可能に設けられた照射口とを有する加速管と、
前記加速空間に、所定の圧力の水素ガスを供給可能に設けられた水素ガス供給手段とを有し、
前記水素ガス供給手段から前記加速空間に供給された前記水素ガスを前記照射口から放出すると共に、前記照射口から照射される前記電子ビームが前記照射口から放出される前記水素ガス中を通過するよう構成されていることを
特徴とする電子ビーム照射装置。 - 前記照射口を水中に配置したとき、水中の所定の位置に配置された対象物に向かって、前記水素ガスを放出し、前記電子ビームを照射可能に設けられていることを特徴とする請求項1記載の電子ビーム照射装置。
- 水流を発生可能に設けられた水流発生手段を有し、
前記対象物は液体、気体またはプラズマから成り、
前記水流発生手段で発生した水流により、前記対象物を水中の前記所定の位置に留めるよう構成されていることを
特徴とする請求項2記載の電子ビーム照射装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018242052A JP6529059B1 (ja) | 2018-12-26 | 2018-12-26 | 電子ビーム照射装置 |
CN201911070879.6A CN111383789A (zh) | 2018-12-26 | 2019-11-05 | 电子束照射装置 |
US16/675,353 US20200211821A1 (en) | 2018-12-26 | 2019-11-06 | Electron beam irradiation device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018242052A JP6529059B1 (ja) | 2018-12-26 | 2018-12-26 | 電子ビーム照射装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP6529059B1 true JP6529059B1 (ja) | 2019-06-12 |
JP2020106279A JP2020106279A (ja) | 2020-07-09 |
Family
ID=66821527
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2018242052A Expired - Fee Related JP6529059B1 (ja) | 2018-12-26 | 2018-12-26 | 電子ビーム照射装置 |
Country Status (3)
Country | Link |
---|---|
US (1) | US20200211821A1 (ja) |
JP (1) | JP6529059B1 (ja) |
CN (1) | CN111383789A (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6489080B2 (ja) | 2016-08-04 | 2019-03-27 | トヨタ自動車株式会社 | 車両制御装置 |
JP7005069B1 (ja) * | 2021-08-19 | 2022-02-14 | 株式会社センリョウ | プラズマ加熱装置 |
-
2018
- 2018-12-26 JP JP2018242052A patent/JP6529059B1/ja not_active Expired - Fee Related
-
2019
- 2019-11-05 CN CN201911070879.6A patent/CN111383789A/zh active Pending
- 2019-11-06 US US16/675,353 patent/US20200211821A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
US20200211821A1 (en) | 2020-07-02 |
JP2020106279A (ja) | 2020-07-09 |
CN111383789A (zh) | 2020-07-07 |
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