JP6313975B2 - ワイヤーの気相合成 - Google Patents
ワイヤーの気相合成 Download PDFInfo
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- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical compound [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 description 1
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- 229910052740 iodine Inorganic materials 0.000 description 1
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- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 1
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/005—Growth of whiskers or needles
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/42—Gallium arsenide
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/60—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape characterised by shape
- C30B29/62—Whiskers or needles
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
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- Crystals, And After-Treatments Of Crystals (AREA)
Description
− AlivisatosらによるUS2005/0054004に例示されているような、例えばコロイド化学の方法による液相合成、
− WO2004/004927A2およびWO2007/10781A1にそれぞれ提示されているSamuelsonらの研究に例示されているような、触媒粒子有り、または無しでの、基材からのエピタキシャル成長、または、
− LieberらによるWO2004/038767A2に例示されているような、レーザーを利用した触媒成長プロセスの方法による気相合成。
− 気体中に浮遊する触媒種晶粒子を供給すること、
− 形成しようとするワイヤーの構成物質を含む気体状前駆物質を供給すること、
− 気体−粒子−前駆物質の混合物を、反応器、典型的にはチューブ炉に通すこと、および、
− 上記の触媒種晶粒子が上記の気体中に浮遊している間に、上記の気体状前駆物質を含む気相合成において、上記の触媒種晶粒子からワイヤーを成長させること、
からなる基本的ステップを含む。
− 気体中に浮遊する触媒種晶粒子2を供給すること、
− 形成しようとするワイヤー1の構成物質を含む気体状前駆物質3、4を供給すること、および、
− 触媒種晶粒子が気体中に浮遊している間に、気体状前駆物質3、4を含む気相合成において、触媒種晶粒子2からワイヤー1を成長させること、
を含む。
− InAs、InP、GaAs、GaPおよびそれらの合金(InxGa1-xAsyP1-y)
− InSb、GaSbおよびそれらの合金(InxGa1-xSb)
− AlP、AlAs、AlSbおよびそれらの合金、例えばAlP1-xAsx
− Alと合金化したInGaAsP、例えばAlxGa1-xAs
− Sbと合金化したInGaAsP、例えばGaAsySb1-y
− InN、GaN、AlNおよびそれらの合金(InxGa1-xN)
− Si、Geおよびそれらの合金、すなわち(SixGe1-x)
− CdSe、CdS、CdTe、ZnO、ZnS、ZnSe、ZnTe、MgSe、MgTeおよびそれらの合金
− SiOx、C(ダイヤモンド)、C(カーボンナノチューブ)SiC、BN
が含まれるが、これらに限定されない。
− Au、Cu、Ag
− In、Ga、Al
− Fe、Ni、Pd、Pt
− Sn、Si、Ge、Zn、Cd
− 上記のものの合金、例えばAu−In、Au−Ga、Au−Si
が含まれるが、これらに限定されない。
− InGaAl−AsPSbシステムでは、nドーパントとしてS、Se、Si、C、Sn、pドーパントとしてZn、Si、C、Be
− AlInGaNシステムでは、nドーパントとしてSi、pドーパントとしてMg
− Siでは、nドーパントとしてP、As、Sb、pドーパントとしてB、Al、Ga、In
− CdZn−OSSeTeシステムでは、pドーパントとしてLi、Na、K、N、P、As、nドーパントとしてAl、Ga、In、Cl、I
が含まれるが、これらに限定されない。
Claims (11)
- 半導体ナノワイヤー(1)を形成する方法であって、
− 気体中に浮遊する触媒種晶粒子(2)を供給すること、
− 形成しようとする前記半導体ナノワイヤー(1)の構成物質を含む気体状前駆物質(3、4)を供給すること、
− 少なくとも1つの触媒粒子の表面に少なくとも1つの種結晶を形成すること、および、
− 前記触媒種晶粒子が前記気体中に浮遊している間に、前記気体状前駆物質(3、4)を含む気相合成において、前記形成された種結晶の少なくとも1つから、少なくとも1つの単結晶の半導体ナノワイヤー(1)を、高温にされた反応器の中でエピタキシャルに成長させること、を含み、
前記半導体ナノワイヤー(1)は、GaとAsを構成元素とする組成式GaAsyP1-y(yは0.5以上であり、y=1の場合を含む)で標記されるIII−V族半導体ナノワイヤーであり、
前記触媒種晶粒子(2)が、前記気体状前駆物質(3、4)と混合されたエアロゾルとして供給され、
前記半導体ナノワイヤーが、前記反応器内部の全圧が50〜1100mbarの範囲にあり、前記反応器の温度が380〜700℃の範囲にある条件での化学気相成長プロセス中に形成される、
方法。 - 前記半導体ナノワイヤー(1)が連続プロセスで形成される、請求項1に記載の方法。
- 形成される前記半導体ナノワイヤー(1)が、GaAsナノワイヤーからなる、請求項1または2に記載の方法。
- 少なくとも1つの前記半導体ナノワイヤーの直径が、前記触媒種晶粒子の大きさおよび/または前記種結晶の大きさによって決定される、請求項1から3のいずれかに記載の方法。
- 前記半導体ナノワイヤー(1)は第1の部位と第2の部位を有しており、前記第1の部位は第1の組成または第1の導電型を有し、前記第2の部位は第2の組成または第2の導電型を有しており、前記第1の組成または第1の導電型は前記第2の組成または第2の導電型と異なる半導体ナノワイヤー(1)であり、
前駆物質の組成、前駆物質のモル流量、キャリアガスの流量、温度、圧力、またはドーパントと関係する、1つまたは複数のパラメータを制御することによって、各半導体ナノワイヤー(1)の成長中の成長条件を変化させ、その結果、半導体ナノワイヤー片が、先行形成された半導体ナノワイヤー部分の上で、その縦方向に軸方向成長するか、または、シェルが、前記の先行形成された半導体ナノワイヤー部分の上で、その半径方向に半径方向成長するか、または、材料が、軸方向成長と半径方向成長との組み合わせとして付加されるようにし、さらに、前記成長条件を変化させて、各半導体ナノワイヤー(1)内で組成、ドーピング、導電型に関してヘテロ構造を得る、請求項1から4のいずれかに記載の方法。 - 前駆物質の組成、前駆物質のモル流量、キャリアガスの流量、温度、圧力、もしくはドーパントと関係する1つまたは複数のパラメータを制御することによって、前記成長条件を経時的に変化させるか、あるいは、前記触媒種晶粒子(2)の粒度分布を変化させ、その結果、異なる特性の半導体ナノワイヤー(1)が形成されるようにする、請求項5に記載の方法。
- 前記触媒種晶粒子(2)を含む気体が、1つまたは複数の反応区間を通って連続的に流れ、各反応区間は、前記半導体ナノワイヤーに材料を付加することによって、前記半導体ナノワイヤー成長に寄与し、各反応区間の通過後に成長した半導体ナノワイヤーが前記気体によって搬送される、もしくは、前記触媒種晶粒子(2)が帯電される、請求項1から6のいずれかに記載の方法。
- 形成される半導体ナノワイヤー(1)のその場分析をさらに含む、請求項1から7のいずれかに記載の方法。
- 前記半導体ナノワイヤー形成プロセスを妨害することなく、その場分析パラメータからのフィードバックによって、前記半導体ナノワイヤー成長を制御することをさらに含む、請求項1から8のいずれかに記載の方法。
- 前記その場分析が、前記半導体ナノワイヤー(1)の光学特性を明らかにするために、形成される半導体ナノワイヤー(1)を照射すること、および前記半導体ナノワイヤー(1)からの発光を検出することを含む、請求項8または9に記載の方法。
- 前記半導体ナノワイヤー(1)を、基材に沿った連続的なプロセスで、前記基材上に付着させることおよび/または整列させることをさらに含む、請求項1に記載の方法。
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