JP6214133B2 - Salt, resist composition and method for producing resist pattern - Google Patents

Description

  The present invention relates to a salt useful as an acid generator, a resist composition containing the salt as an acid generator, and a method for producing a resist pattern.

  A chemically amplified resist composition used for microfabrication of a semiconductor using a lithography technique contains an acid generator composed of a salt.

For example, Patent Document 1 describes the following salts useful as an acid generator, and further describes a resist composition containing the salt as an acid generator.

JP 2008-13551 A

  A resist pattern obtained by using a conventionally known resist composition containing the above-described acid generator may not always have sufficient line edge roughness (LER).

［式（Ｉ）中、
Ｑ^１、Ｑ^２、Ｑ^３及びＱ^４は、それぞれ独立に、フッ素原子又は炭素数１〜６のペルフルオロアルキル基を表す。
Ｌ^１及びＬ^２は、それぞれ独立に、炭素数１〜１７の２価の飽和炭化水素基を表し、該２価の飽和炭化水素基を構成するメチレン基は、酸素原子又はカルボニル基に置き換わっていてもよい。
Ｒ^１は、水素原子又は炭素数１〜６のアルキル基を表す。
Ｒ^２は、ヒドロキシ基又は炭素数１〜６のヒドロキシアルキル基を表す。
Ｚ^ａ＋及びＺ^ｂ＋は、それぞれ独立に、有機対イオンを表す。］
〔２〕前記式（Ｉ）のＬ^１及びＬ^２が、それぞれ独立に、以下の式（ｂ１−１）で表される基である、前記〔１〕記載の塩。

（式（ｂ１−１）中、
Ｌ^b2は、単結合又は炭素数１〜１５の脂肪族飽和炭化水素基を表す。
＊は、結合手であり、左側の＊は、−Ｃ（Ｑ^１）（Ｑ^２）−又は−Ｃ（Ｑ^３）（Ｑ^４）−の炭素原子との結合手を表す。）
〔３〕前記式（Ｉ）のＲ^２が、ヒドロキシメチル基である、前記〔１〕又は〔２〕記載の塩。
〔４〕前記式（Ｉ）のＲ^１が、水素原子又は炭素数１〜３のアルキル基である、前記〔１〕〜〔３〕のいずれか記載の塩。
〔５〕前記式（Ｉ）のＺ^ａ＋及びＺ^ｂ＋は、それぞれ独立に、アリールスルホニウムカチオンである、前記〔１〕〜〔４〕のいずれか記載の塩。
〔６〕前記〔１〕〜〔５〕のいずれか記載の塩を有効成分として含む酸発生剤。
〔７〕前記〔６〕記載の酸発生剤と、アルカリ水溶液に不溶又は難溶であり、酸の作用によりアルカリ水溶液に溶解し得る樹脂とを含有するレジスト組成物。
〔８〕さらに、塩基性化合物を含有する、前記〔７〕記載のレジスト組成物。
〔９〕（１）前記〔７〕又は〔８〕記載のレジスト組成物を基板上に塗布する工程、
（２）塗布後の組成物を乾燥して組成物層を形成する工程、
（３）組成物層に露光機を用いて露光する工程、
（４）露光後の組成物層を加熱する工程、及び
（５）加熱後の組成物層を現像する工程
を含むレジストパターンの製造方法。 The present invention includes the following inventions.
[1] A salt represented by the formula (I).

[In the formula (I),
Q ¹ , Q ² , Q ³ and Q ⁴ each independently represent a fluorine atom or a C 1-6 perfluoroalkyl group.
L ¹ and L ² each independently represent a divalent saturated hydrocarbon group having 1 to 17 carbon atoms, and the methylene group constituting the divalent saturated hydrocarbon group is replaced with an oxygen atom or a carbonyl group. May be.
R ¹ represents a hydrogen atom or an alkyl group having 1 to 6 carbon atoms.
R ² represents a hydroxy group or a hydroxyalkyl group having 1 to 6 carbon atoms.
Z ^{a +} and Z ^{b +} each independently represent an organic counter ion. ]
[2] The salt according to [1], wherein L ¹ and L ^{2 in} the formula (I) are each independently a group represented by the following formula (b1-1).

(In the formula (b1-1),
L ^b2 represents a single bond or an aliphatic saturated hydrocarbon group having 1 to 15 carbon atoms.
* Is a bond, and * on the left side represents a bond with a carbon atom of —C (Q ¹ ) (Q ² ) — or —C (Q ³ ) (Q ⁴ ) —. )
[3] The salt according to [1] or [2], wherein R ^{2 in the} formula (I) is a hydroxymethyl group.
[4] The salt according to any one of [1] to [3], wherein R ^{1 in the} formula (I) is a hydrogen atom or an alkyl group having 1 to 3 carbon atoms.
[5] The salt according to any one of [1] to [4], wherein Z ^{a +} and Z ^{b +} in the formula (I) are each independently an arylsulfonium cation.
[6] An acid generator containing the salt according to any one of [1] to [5] as an active ingredient.
[7] A resist composition comprising the acid generator according to [6] above and a resin that is insoluble or hardly soluble in an alkaline aqueous solution and can be dissolved in an alkaline aqueous solution by the action of an acid.
[8] The resist composition according to [7], further containing a basic compound.
[9] (1) A step of applying the resist composition according to [7] or [8] on a substrate,
(2) A step of drying the composition after application to form a composition layer,
(3) a step of exposing the composition layer using an exposure machine;
(4) A method for producing a resist pattern, comprising: a step of heating the composition layer after exposure; and (5) a step of developing the composition layer after heating.

  If the resist composition containing the salt of the present invention is used, a resist pattern excellent in line edge roughness (LER) can be formed.

In the present specification, unless otherwise specified, the following examples of substituents are applied to any chemical structural formula having the same substituents while appropriately selecting the number of carbon atoms. Among the aliphatic hydrocarbon groups, those that can be linear or branched, such as an alkyl group, include any of them. When stereoisomers exist, all stereoisomers are included. In the following examples of substituents, the numerical value attached to “C” indicates the number of carbon atoms of each group.
Further, in the present specification, "(meth) acrylic monomer", "CH ₂ = CH-CO-" or _{"CH 2 = C (CH 3)} -CO- " at least one monomer having the structure Means. Similarly, “(meth) acrylate” and “(meth) acrylic acid” mean “at least one of acrylate and methacrylate” and “at least one of acrylic acid and methacrylic acid”, respectively.

The hydrocarbon group includes an aliphatic hydrocarbon group and an aromatic hydrocarbon group.
The aliphatic hydrocarbon group includes both a chain type and a cyclic type, and includes a combination of a chain type and an alicyclic aliphatic hydrocarbon group unless otherwise defined. Further, these aliphatic hydrocarbon groups may contain a carbon-carbon double bond in a part thereof, but a saturated group (aliphatic saturated hydrocarbon group) is preferable.

Of the chain aliphatic hydrocarbon groups, the monovalent one typically includes an alkyl group. Specific examples of the alkyl group include a methyl group (C ₁ ), an ethyl group (C ₂ ), a propyl group (C ₃ ), a butyl group (C ₄ ), a pentyl group (C ₅ ), a hexyl group (C ₆ ), heptyl _(C 7), octyl _(C 8), decyl (C _10), dodecyl (C _12), hexadecyl (C _14), pentadecyl (C _15), hexyl decyl group (C _16), A heptadecyl group (C ₁₇ ) and an octadecyl group (C ₁₈ ).
Examples of the divalent group of chain aliphatic hydrocarbon groups include alkanediyl groups in which one hydrogen atom has been removed from an alkyl group. Specific examples of the alkanediyl group include methylene group, ethylene group, propane-1,3-diyl group, propane-1,2-diyl group, butane-1,4-diyl group, pentane-1,5-diyl group, Hexane-1,6-diyl group, heptane-1,7-diyl group, octane-1,8-diyl group, nonane-1,9-diyl group, decane-1,10-diyl group, undecane-1,11 -Diyl group, dodecane-1,12-diyl group, tridecane-1,13-diyl group, tetradecane-1,14-diyl group, pentadecane-1,15-diyl group, hexadecane-1,16-diyl group, heptadecane -1,17-diyl group, ethane-1,1-diyl group, propane-1,1-diyl group, propane-2,2-diyl group, butane-1,3-diyl group, 2-methylpropane-1 , 3- Yl group, 2-methylpropane-1,2-diyl, pentane-1,4-diyl group and 2-methylbutane-1,4-diyl group and the like.

  The cyclic aliphatic hydrocarbon group (hereinafter sometimes referred to as “alicyclic hydrocarbon group” in some cases) is typically a cycloalkyl group, and any of the monocyclic and polycyclic groups shown below can be used. Is also included.

As a monovalent alicyclic hydrocarbon group, a monocyclic aliphatic hydrocarbon group represents 1 hydrogen atom of a cycloalkane represented by the following formulas (KA-1) to (KA-7). It is a group that has been removed.

The polycyclic aliphatic hydrocarbon group is a group in which one hydrogen atom of a cycloalkane represented by the following formulas (KA-8) to (KA-22) is removed.

  Examples of the divalent alicyclic hydrocarbon group include groups in which two hydrogen atoms have been removed from the alicyclic hydrocarbon of formula (KA-1) to formula (KA-22).

  The aliphatic hydrocarbon group may have a substituent. The substituent is defined each time, and examples thereof include a halogen atom, a hydroxy group, an alkoxy group, an acyl group, an acyloxy group, an aryl group, an aralkyl group, and an aryloxy group.

Examples of alkoxy groups include methoxy group (C ₁ ), ethoxy group (C ₂ ), propoxy group (C ₃ ), butoxy group (C ₄ ), pentyloxy group (C ₅ ), hexyloxy group (C ₆ ), heptyl Examples thereof include an oxy group (C ₇ ), an octyloxy group (C ₈ ), a decyloxy group (C ₁₀ ), and a dodecyloxy group (C ₁₂ ).
Examples of the acyl group include acetyl group (C ₂ ), propionyl group (C ₃ ), butyryl group (C ₄ ), valeryl group (C ₅ ), hexanoyl group (C ₆ ), heptanoyl group (C ₇ ), octanoyl group ( Examples include those in which an alkyl group such as C ₈ ), decanoyl group (C ₁₀ ) and dodecanoyl group (C ₁₂ ) and a carbonyl group are bonded, and those in which an aryl group such as benzoyl group (C ₇ ) and a carbonyl group are bonded. It is done.
Examples of the acyloxy group include an acetyloxy group, a propionyloxy group, a butyryloxy group, and an isobutyryloxy group.
Examples of the aralkyl group include benzyl group (C ₇ ), phenethyl group (C ₈ ), phenylpropyl group (C ₉ ), naphthylmethyl group (C ₁₁ ), and naphthylethyl group (C ₁₂ ).
Aryloxy groups include phenyloxy group (C ₆ ), naphthyloxy group (C ₁₀ ), anthryloxy group (C ₁₄ ), biphenyloxy group (C ₁₂ ), phenanthryloxy group (C ₁₄ ) and full A combination of an aryl group such as an oleenyloxy group (C ₁₃ ) and an oxygen atom is exemplified.

The monovalent aromatic hydrocarbon group typically includes an aryl group.
Examples of the aryl group include a phenyl group (C ₆ ), a naphthyl group (C ₁₀ ), an anthryl group (C ₁₄ ), a biphenyl group (C ₁₂ ), a phenanthryl group (C ₁₄ ), and a fluorenyl group (C ₁₃ ). . Examples of the divalent aromatic hydrocarbon group include an arylene group in which one hydrogen atom is further removed from the aryl group exemplified here.

  The aromatic hydrocarbon group may also have a substituent. Examples of such a substituent include a halogen atom, an alkoxy group, an acyl group, an alkyl group, and an aryloxy group. Among these, the alkyl group is the same as those exemplified as the chain aliphatic hydrocarbon group, and among the substituents optionally present in the aromatic hydrocarbon group, those other than the alkyl group are aliphatic hydrocarbon groups. The same thing as what was illustrated as a substituent of is included.

Further, "(meth) acrylic monomer" means at least one monomer having a structure of "CH ₂ = CH-CO-" or _{"CH 2 = C (CH 3)} -CO- ". Similarly, “(meth) acrylate” and “(meth) acrylic acid” mean “at least one of acrylate and methacrylate” and “at least one of acrylic acid and methacrylic acid”, respectively.

The present invention
A salt represented by the formula (I) (hereinafter sometimes referred to as “salt (I)”);
A resist composition containing the salt (I) and a resin that is insoluble or hardly soluble in an alkaline aqueous solution and can be dissolved in an alkaline aqueous solution by the action of an acid (hereinafter sometimes referred to as “resin (A)”). Hereinafter, sometimes referred to as “the present resist composition”);
A method for producing a resist pattern using the present resist composition is provided.
Hereinafter, the salt (I) will be mainly described, and the constituent components of the resist composition other than the salt (I) and the method for preparing the resist composition using them will be described. Finally, a method for producing a resist pattern using the present resist composition will be described.

［式（Ｉ）中、
Ｑ^１、Ｑ^２、Ｑ^３及びＱ^４は、それぞれ独立に、フッ素原子又は炭素数１〜６のペルフルオロアルキル基を表す。
Ｌ^１及びＬ^２は、それぞれ独立に、炭素数１〜１７の２価の飽和炭化水素基を表し、該２価の飽和炭化水素基を構成するメチレン基は、酸素原子又はカルボニル基に置き換わっていてもよい。
Ｒ^１は、水素原子又は炭素数１〜６のアルキル基を表す。
Ｒ^２は、ヒドロキシ基又は炭素数１〜６のヒドロキシアルキル基を表す。
Ｚ^ａ＋及びＺ^ｂ＋は、それぞれ独立に、有機対イオンを表す。］
なお、以下の説明において、塩（Ｉ）から、有機対イオン（Ｚ^ａ＋及びＺ^ｂ＋）を除去してなる負電荷を有するものを、場合により「スルホン酸アニオン」という。 <Salt (I)>
The salt (I) is represented by the formula (I) as described above.

[In the formula (I),
Q ¹ , Q ² , Q ³ and Q ⁴ each independently represent a fluorine atom or a C 1-6 perfluoroalkyl group.
L ¹ and L ² each independently represent a divalent saturated hydrocarbon group having 1 to 17 carbon atoms, and the methylene group constituting the divalent saturated hydrocarbon group is replaced with an oxygen atom or a carbonyl group. May be.
R ¹ represents a hydrogen atom or an alkyl group having 1 to 6 carbon atoms.
R ² represents a hydroxy group or a hydroxyalkyl group having 1 to 6 carbon atoms.
Z ^{a +} and Z ^{b +} each independently represent an organic counter ion. ]
In the following description, those having a negative charge obtained by removing organic counter ions (Z ^{a +} and Z ^{b +} ) from the salt (I) are sometimes referred to as “sulfonate anions”.

First, the sulfonate anion contained in the salt (I) will be described.
Q ¹ , Q ² , Q ³ and Q ⁴ each independently represent a fluorine atom or a C 1-6 perfluoroalkyl group. Examples of the perfluoroalkyl group include those in which all the hydrogen atoms contained in the alkyl group in the alkyl group having 1 to 6 carbon atoms already exemplified are replaced with fluorine atoms. Specific examples include a trifluoromethyl group, a perfluoroethyl group, a perfluoropropyl group, a perfluoroisopropyl group, a perfluorobutyl group, a perfluorosec-butyl group, a perfluorotert-butyl group, a perfluoropentyl group, and a perfluorohexyl group. The perfluoroalkyl group has been described above with specific examples. Q ¹ , Q ² , Q ³ and Q ⁴ are each independently preferably a fluorine atom or a trifluoromethyl group, and Q ¹ , Q ² , Q ³ and More preferably, both Q ⁴ are fluorine atoms.

L ¹ and L ² each independently represent a divalent saturated hydrocarbon group having 1 to 17 carbon atoms. In the range of 1 to 17 carbon atoms, the divalent saturated hydrocarbon group is an alkanediyl group exemplified above or an alicyclic hydrocarbon of any one of the above formulas (KA-1) to (KA-22). For example, a divalent alicyclic hydrocarbon group in which two hydrogen atoms are removed. The alkanediyl group may be linear or branched. In addition, the divalent saturated hydrocarbon group of L ¹ and L ^{2 is} a divalent combination of any combination of an alkanediyl group and a divalent alicyclic hydrocarbon group as long as it has a carbon number of 17 or less. The base of

As described above, the methylene group constituting the saturated hydrocarbon group of L ¹ and L ² may be replaced with an oxygen atom or a carbonyl group. Thus, the salt (I) having a group in which a methylene group is replaced with an oxygen atom or a carbonyl group as L ¹ and L ² is preferable in view of the ease of production of the salt (I). In addition, the manufacturing method of salt (I) is mentioned later.
Examples of the group in which the methylene group constituting the saturated hydrocarbon group is replaced with an oxygen atom or a carbonyl group include groups represented by any of the following formulas (b1-1) to (b1-7). . L ¹ and L ² are preferably groups represented by any one of formulas (b1-1) to (b1-4), and more preferably represented by formula (b1-1) or formula (b1-3). Group. Note that two * 's in formulas (b1-1) to (b1-7) are a bond, and * on the left side is -C (Q ¹ ) (Q ² )-or -C (Q ³ ) (Q ⁴ ) Bonded to-carbon atom. The same applies to specific examples of the following formulas (b1-1) to (b1-7). The same applies to specific examples of the following formulas (b1-1) to (b1-7).

式（ｂ１−１）〜式（ｂ１−７）中、
Ｌ^b2は、単結合又は炭素数１〜１５の飽和炭化水素基を表す。
Ｌ^b3は、単結合又は炭素数１〜１２の飽和炭化水素基を表す。
Ｌ^b4は、炭素数１〜１３の飽和炭化水素基を表す。但しＬ^b3及びＬ^b4の合計炭素数の上限は１３である。
Ｌ^b５は、単結合又は炭素数１〜１４の飽和炭化水素基を表す。
Ｌ^b６は、炭素数１〜１５の飽和炭化水素基を表す。但しＬ^b5及びＬ^b6の合計炭素数の上限は１５である。
Ｌ^b７は、単結合又は炭素数１〜１５の飽和炭化水素基を表す。
Ｌ^b８は、炭素数１〜１５の飽和炭化水素基を表す。但しＬ^b７及びＬ^b８の合計炭素数の上限は１６である。
Ｌ^b9は、単結合又は炭素数１〜１３の飽和炭化水素基を表す。
Ｌ^b10は、炭素数１〜１４の飽和炭化水素基を表す。但しＬ^b9及びＬ^b10の合計炭素数の上限は１４である。
Ｌ^b11及びＬ^b12は、単結合又は炭素数１〜１１の飽和炭化水素基を表す。
Ｌ^b13は、炭素数１〜１２の飽和炭化水素基を表す。但しＬ^b11、Ｌ^b12及びＬ^b13の合計炭素数の上限は１２である。
Ｌ^b14及びＬ^b15は、それぞれ独立に、単結合又は炭素数１〜１３の飽和炭化水素基を表す。
Ｌ^b16は、炭素数１〜１４の飽和炭化水素基を表す。但しＬ^b14、Ｌ^b15及びＬ^b16の合計炭素数の上限は１４である。

In formula (b1-1) to formula (b1-7),
L ^b2 represents a single bond or a saturated hydrocarbon group having 1 to 15 carbon atoms.
L ^b3 represents a single bond or a saturated hydrocarbon group having 1 to 12 carbon atoms.
L ^b4 represents a saturated hydrocarbon group having 1 to 13 carbon atoms. However, the upper limit of the total carbon number of L ^b3 and L ^b4 is 13.
L ^b5 represents a single bond or a saturated hydrocarbon group having 1 to 14 carbon atoms.
L ^b6 represents a saturated hydrocarbon group having 1 to 15 carbon atoms. However, the upper limit of the total carbon number of L ^b5 and L ^b6 is 15.
L ^b7 represents a single bond or a saturated hydrocarbon group having 1 to 15 carbon atoms.
L ^b8 represents a saturated hydrocarbon group having 1 to 15 carbon atoms. However, the upper limit of the total carbon number of L ^b7 and L ^b8 is 16.
L ^b9 represents a single bond or a saturated hydrocarbon group having 1 to 13 carbon atoms.
L ^b10 represents a saturated hydrocarbon group having 1 to 14 carbon atoms. However, the upper limit of the total carbon number of L ^b9 and L ^b10 is 14.
L ^b11 and L ^b12 represent a single bond or a saturated hydrocarbon group having 1 to 11 carbon atoms.
L ^b13 represents a saturated hydrocarbon group having 1 to 12 carbon atoms. However, the upper limit of the total carbon number of L ^b11 , L ^b12 and L ^b13 is 12.
L ^b14 and L ^b15 each independently represent a single bond or a saturated hydrocarbon group having 1 to 13 carbon atoms.
L ^b16 represents a saturated hydrocarbon group having 1 to 14 carbon atoms. However, the upper limit of the total carbon number of L ^b14 , L ^b15 and L ^b16 is 14.

Examples of the divalent group represented by the formula (b1-1) include the following.

Examples of the divalent group represented by the formula (b1-2) include the following.

Examples of the divalent group represented by the formula (b1-3) include the following.

Examples of the divalent group represented by the formula (b1-4) include the following.

Examples of the divalent group represented by the formula (b1-5) include the following.

Examples of the divalent group represented by the formula (b1-6) include the following.

Examples of the divalent group represented by the formula (b1-7) include the following.

Considering the ease of production of the salt (I), among these, L ¹ and L ² are each preferably a group represented by the formula (b1-1), and L ^b2 is a saturated group having 1 to 6 carbon atoms. It is more preferably a divalent group represented by the formula (b1-1) which is a hydrocarbon group, and * —CO—O—CH ₂ — (* represents C (Q ¹ ) (Q ² ) or C (Q ³ ) (represents a bond with a carbon atom of (Q ⁴ )). Even more preferably, L ¹ and L ² are the same group.

R ¹ represents a hydrogen atom or an alkyl group having 1 to 6 carbon atoms, preferably a hydrogen atom or an alkyl group having 1 to 4 carbon atoms, more preferably a hydrogen atom or an alkyl group having 1 to 3 carbon atoms, methyl More preferably an ethyl group.
R ² represents a hydroxy group or a hydroxyalkyl group having 1 to 6 carbon atoms, and among them, a hydroxymethyl group is preferable. Here, the hydroxyalkyl group refers to a group in which at least one of hydrogen atoms contained in the alkyl group is replaced with a hydroxy group.

Specific examples of the sulfonate anion constituting the salt (I) will be given.

Next, the organic counter ion constituting the salt (I) will be described.
Examples of the organic counter ion represented by Z ^{a +} and Z ^{b +} include organic onium cations such as organic sulfonium cation, organic iodonium cation, organic ammonium cation, benzothiazolium cation, and organic phosphonium cation. Among these, an organic sulfonium cation and an organic iodonium cation are preferable, and an arylsulfonium cation is more preferable. More preferably, Z ^{a +} and Z ^{b +} are the same organic counter ion.

  More preferably, an organic counter ion represented by any of the following formulas (b2-1) to (b2-4) [hereinafter referred to as “cation (b2-1)”, “ Sometimes referred to as “cation (b2-2)”, “cation (b2-3)” and “cation (b2-4)”. ].

In formula (b2-1) to formula (b2-4),
R ^b4 , R ^b5 and R ^b6 each independently represent an alkyl group having 1 to 30 carbon atoms, an alicyclic hydrocarbon group having 3 to 18 carbon atoms, or an aromatic hydrocarbon group having 6 to 18 carbon atoms. The hydrogen atom contained in the alkyl group may be substituted with a hydroxy group, an alkoxy group having 1 to 12 carbon atoms or an aromatic hydrocarbon group having 6 to 18 carbon atoms, and is included in the alicyclic hydrocarbon group. The hydrogen atom may be substituted with a halogen atom, an acyl group having 2 to 4 carbon atoms or a glycidyloxy group, and the hydrogen atom contained in the aromatic hydrocarbon group is a halogen atom, a hydroxy group, or a carbon number of 1 It may be substituted with an aliphatic hydrocarbon group having 18 to 18 carbon atoms, an alicyclic hydrocarbon group having 3 to 18 carbon atoms, or an alkoxy group having 1 to 12 carbon atoms. R ^b4 and R ^b5 may be combined to form a ring containing a sulfur atom.

The ring containing a sulfur atom which R ^b4 and R ^b5 may form together may be any of monocyclic, polycyclic, aromatic, non-aromatic, saturated and unsaturated rings. If it contains one or more sulfur atoms, it may further contain one or more sulfur atoms and / or one or more oxygen atoms. As the ring, a ring having 3 to 18 carbon atoms is preferable, and a ring having 4 to 13 carbon atoms is more preferable.

R ^b7 and R ^b8 each independently represent a hydroxy group, an alkyl group having 1 to 12 carbon atoms, or an alkoxy group having 1 to 12 carbon atoms.
m2 and n2 each independently represent an integer of 0 to 5. When m2 is 2 or more, all or some of the plurality of R ^b7 may be the same. When n2 is 2 or more, all or some of the plurality of R ^b8 may be the same.

R ^b9 and R ^b10 each independently represent an alkyl group having 1 to 18 carbon atoms or an alicyclic hydrocarbon group having 3 to 18 carbon atoms.
R ^b11 represents a hydrogen atom, an alkyl group having 1 to 18 carbon atoms, an alicyclic hydrocarbon group having 3 to 18 carbon atoms, or an aromatic hydrocarbon group having 6 to 18 carbon atoms.
R ^b12 represents an alkyl group having 1 to 12 carbon atoms, an alicyclic hydrocarbon group having 3 to 18 carbon atoms, or an aromatic hydrocarbon group having 6 to 18 carbon atoms. The hydrogen atom contained in the aromatic hydrocarbon group is an alkyl group having 1 to 12 carbon atoms, an alkoxy group having 1 to 12 carbon atoms, an alicyclic hydrocarbon group having 3 to 18 carbon atoms, or an alkyl group having 1 to 12 carbon atoms. It may be substituted with an alkylcarbonyloxy group.
R ^b9 and R ^b10 may be bonded to each other together with the sulfur atom to which they are bonded to form a 3- to 12-membered ring (preferably a 3- to 7-membered ring), and R ^b11 and R ^b12 are , And -CH-CO- to which they are bonded may form a 3- to 12-membered ring (preferably a 3- to 7-membered ring).

R ^{b13 to} R ^b18 each independently represent a hydroxy group, an alkyl group having 1 to 12 carbon atoms, or an alkoxy group having 1 to 12 carbon atoms.
L ^b11 represents an oxygen atom or a sulfur atom.
o2, p2, s2, and t2 each independently represents an integer of 0 to 5.
q2 and r2 each independently represents an integer of 0 to 4.
u2 represents 0 or 1.
When o2 is 2 or more, all or some of the plurality of R ^b13 may be the same. When p2 is 2 or more, all or some of the plurality of R ^b14 may be the same. When q2 is 2 or more, all or some of the plurality of R ^b15 may be the same. When r2 is 2 or more, all or some of the plurality of R ^b16 may be the same. When s2 is 2 or more, all or some of the plurality of R ^b15 may be the same. When t2 is 2 or more, all or some of the plurality of R ^b18 may be the same.

芳香族炭化水素基としては、フェニル基、ナフチル基、アントリル基、ｐ−メチルフェニル基、ｐ−ｔｅｒｔ−ブチルフェニル基、ｐ−アダマンチルフェニル基、トリル基、キシリル基、クメニル基、メシチル基、ビフェニル基、フェナントリル基、２，６−ジエチルフェニル基、２−メチル−６−エチルフェニル等のアリール基等が挙げられる。 Examples of the alkyl group include methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, sec-butyl group, tert-butyl group, pentyl group, hexyl group, octyl group and 2-ethylhexyl group. .
The alicyclic hydrocarbon group may be monocyclic or polycyclic. Examples of the monocyclic alicyclic hydrocarbon group include a cyclopentyl group, a cyclohexyl group, a methylcyclohexyl group, and dimethylcyclohexane. Examples thereof include a cycloalkyl group such as a hexyl group, a cycloheptyl group, and a cyclooctyl group. Examples of the polycyclic saturated hydrocarbon group include decahydronaphthyl group, adamantyl group, norbornyl group, methylnorbornyl group, and the following groups. * Represents a bond with an adamantane ring or a cyclohexane ring.

Aromatic hydrocarbon groups include phenyl, naphthyl, anthryl, p-methylphenyl, p-tert-butylphenyl, p-adamantylphenyl, tolyl, xylyl, cumenyl, mesityl, biphenyl Groups, phenanthryl groups, 2,6-diethylphenyl groups, aryl groups such as 2-methyl-6-ethylphenyl, and the like.

Examples of the alkoxy group include methoxy group, ethoxy group, propoxy group, butoxy group, pentyloxy group, hexyloxy group, heptyloxy group, octyloxy group, decyloxy group and dodecyloxy group.
Examples of the halogen atom include a fluorine atom, a chlorine atom, a bromine atom and an iodine atom.
Examples of the acyl group include an acetyl group, a propionyl group, and a butyryl group.
Examples of the alkylcarbonyloxy group include a methylcarbonyloxy group, an ethylcarbonyloxy group, an n-propylcarbonyloxy group, an isopropylcarbonyloxy group, an n-butylcarbonyloxy group, a sec-butylcarbonyloxy group, a tert-butylcarbonyloxy group, Examples thereof include a pentylcarbonyloxy group, a hexylcarbonyloxy group, an octylcarbonyloxy group, and a 2-ethylhexylcarbonyloxy group.

The alkyl group of R ^{b9 to} R ^b12 preferably has 1 to 12 carbon atoms, and in particular, a methyl group, ethyl group, n-propyl group, isopropyl group, n-butyl group, sec-butyl group, tert-butyl group , A pentyl group, a hexyl group, an octyl group and a 2-ethylhexyl group are preferred.
The alicyclic hydrocarbon group of R ^{b9 to} R ^b11 preferably has 3 to 18 carbon atoms, more preferably 4 to 12 carbon atoms, and includes a cyclopropyl group, a cyclobutyl group, a cyclopentyl group, a cyclohexyl group, a cycloheptyl group, A cyclodecyl group, a 2-alkyladamantan-2-yl group, a 1- (adamantan-1-yl) alkane-1-yl group, and an isobornyl group are more preferable.
The aromatic hydrocarbon group for R ^b12 includes a phenyl group, a 4-methylphenyl group, a 4-ethylphenyl group, a 4-tert-butylphenyl group, a 4-cyclohexylphenyl group, a 4-methoxyphenyl group, a biphenylyl group, and A naphthyl group is preferred.
A group in which an aromatic hydrocarbon group of R ^b12 and an alkyl group are bonded is typically an aralkyl group.

Examples of the ring formed together with the sulfur atom to which R ^b9 and R ^b10 are bonded include, for example, a thiolane-1-ium ring (tetrahydrothiophenium ring), a thian-1-ium ring, and 1,4-oxathian-4-ium. A ring etc. are mentioned.
Examples of the ring formed with —CH—CO— in which R ^b11 and R ^b12 are bonded include an oxocycloheptane ring, an oxocyclohexane ring, an oxonorbornane ring, and an oxoadamantane ring.

Specific examples of the organic counter ion represented by each of formula (b2-1) to formula (b2-4) include cations described in JP 2010-204646 A.
Among these, a cation (b2-1) is preferable, an organic counter ion represented by the following formula (b2-1-1) [hereinafter sometimes referred to as “cation (b2-1-1)]” is more preferable, Triphenylsulfonium cation (in formula (b2-1-1), v2 = w2 = x2 = 0) or tolylsulfonium cation (in formula (b2-1-1), v2 = w2 = x2 = 1 And R ^b19 , R ^b20 and R ^b21 are all methyl groups).

式（ｂ２−１−１）中、
Ｒ^b19、Ｒ^b20及びＲ^b21は、それぞれ独立に、ハロゲン原子（より好ましくはフッ素原子）、ヒドロキシ基、炭素数１〜１８のアルキル基、炭素数３〜１８の脂環式炭化水素基又は炭素数１〜１２のアルコキシ基を表す。該アルキル基に含まれる水素原子は、ヒドロキシ基、炭素数１〜１２のアルコキシ基又は炭素数６〜１８の芳香族炭化水素基で置換されていてもよく、該脂環式炭化水素基に含まれる水素原子は、ハロゲン原子、炭素数２〜４のアシル基又はグリシジルオキシ基で置換されていてもよく、Ｒ^b19〜Ｒ^b21から選ばれる２つが一緒になってヘテロ原子を有してもよい環を形成してもよい。
ｖ２、ｗ２及びｘ２は、それぞれ独立に０〜５の整数（好ましくは０又は１）を表す。
ｖ２が２以上のとき、複数のＲ^b19の全部又は一部は同じであってもよい。ｗ２が２以上のとき、複数のＲ^b20の全部又は一部は同じであってもよい。ｘ２が２以上のとき、複数のＲ^b21の全部又は一部は同じであってもよい。

In formula (b2-1-1),
R ^b19 , R ^b20 and R ^b21 each independently represent a halogen atom (more preferably a fluorine atom), a hydroxy group, an alkyl group having 1 to 18 carbon atoms, an alicyclic hydrocarbon group having 3 to 18 carbon atoms, or carbon. The number 1-12 alkoxy group is represented. The hydrogen atom contained in the alkyl group may be substituted with a hydroxy group, an alkoxy group having 1 to 12 carbon atoms or an aromatic hydrocarbon group having 6 to 18 carbon atoms, and is included in the alicyclic hydrocarbon group. hydrogen atom a halogen atom, may be substituted with an acyl group or a glycidyloxy group having 2 to 4 carbon atoms, they may have two of hetero atoms together selected from R ^b19 to R ^b21 A ring may be formed.
v2, w2 and x2 each independently represent an integer of 0 to 5 (preferably 0 or 1).
When v2 is 2 or more, all or some of the plurality of R ^b19 may be the same. When w2 is 2 or more, all or some of the plurality of R ^b20 may be the same. When x2 is 2 or more, all or some of the plurality of R ^b21 may be the same.

The alkyl group of R ^{b19 to} R ^b21 preferably has 1 to 12 carbon atoms.
The alicyclic hydrocarbon group preferably has 4 to 18 carbon atoms.
Among them, R ^b19 , R ^b20 and R ^b21 are preferably each independently a halogen atom (more preferably a fluorine atom), a hydroxy group, an alkyl group having 1 to 12 carbon atoms or an alkoxy group having 1 to 12 carbon atoms. It is.

Specific examples of the organic counter ion include the following.

The salt (I) is a combination of a sulfonate anion and an organic counter ion, and the sulfonate anion and the organic counter ion can be arbitrarily combined.
As salt (I), the salt of following Table 1, Table 2, and Table 3 is mentioned, for example.

Of these, the salts shown below are preferred.

（式中、Ｑ^１〜Ｑ^４、Ｒ^１、Ｚ^ａ＋及びＺ^ｂ＋は、それぞれ前記と同義である。） Here, in the production method of the salt (I), L ¹ and L ² are * —CO—O—CH ₂ — (* is C (Q ¹ ) (Q ² ) or C (Q ³ ) (Q ⁴ ). And a method for producing the salt (I) will be briefly described with reference to a salt (I) in which R ² is a hydroxymethyl group. Such a salt (b1) is produced, for example, by reacting the compound represented by the formula (b1-a1) with the compound represented by the formula (b1-a2) in a solvent. be able to. In addition, monochlorobenzene etc. are mentioned as a solvent used for this manufacturing method.

(Wherein Q ^{1 to} Q ⁴ , R ¹ , Z ^{a +} and Z ^{b +} are as defined above.)

The compound represented by the formula (b1-a1) can be produced, for example, by the method described in JP2011-246439A.
The compound represented by the formula (b1-a2) can be produced, for example, by the method described in JP 2008-127367 A.

<Acid generator>
The acid generator of the present invention contains a salt (I). The acid generator of the present invention may contain one or more salts (I).
In addition, the acid generator of the present invention is a salt other than the salt (I) known as an acid generator (for example, an organic counter ion contained in the salt (I) and a known anion (included in the salt (I)). Or a salt composed of an anion other than the sulfonate anion). Salts other than the salt (I) contained in the acid generator may be referred to as “acid generator (B)”.

As an acid generator (B) used together with salt (I), the compound which consists of a sulfonate anion and organic sulfonium cation contained in salt (I) is mentioned. For example, what is respectively represented by Formula (B1-1)-Formula (B1-20) is mentioned. Among these, those containing a triarylsulfonium cation are preferable, and those containing a triphenylsulfonium cation or those containing a tolylsulfonium cation are more preferable. Formula (B1-1), Formula (B1-2), Formula (B1-3), Formula (B1-6), Formula (B1-7), Formula (B1-11), Formula (B1-12), Formula A salt selected from (B1-13) and formula (B1-14) is more preferred.

  The content of the salt (I) is preferably 10 parts by mass or more, more preferably 30 parts by mass or more, preferably 100 parts by mass or less, more preferably 90 parts by mass with respect to 100 parts by mass of the total amount of the acid generator. Or less. Substantially only the salt (I) may be used as the acid generator. Moreover, in order to adjust the characteristic which concerns on this resist composition, you may use an acid generator (B) as mentioned above.

<This resist composition>
The resist composition contains an acid generator containing a salt (I) as an active ingredient and a resin (A). Further, if necessary, additives such as a basic compound called quencher in the art (hereinafter sometimes referred to as “basic compound (C)”) or a solvent (hereinafter sometimes referred to as “solvent (D)”. ) ”))). Hereinafter, in addition to the acid generator, the resin (A) and the additive such as the basic compound (C) and the solvent (D) contained in the resist composition will be sequentially described. In the following description, in describing the composition of the present resist composition, the composition obtained by removing the solvent from the present resist composition may be defined as “solid content” of the present resist composition. The content ratio of the solid content to the total mass of the resist composition can be measured by a known analysis means such as liquid chromatography and gas chromatography.

<Resin (A)>
The resin (A) contained in the resist composition of the present invention is a resin having an acid labile group and insoluble or hardly soluble in an alkaline aqueous solution, and becomes soluble in an alkaline aqueous solution by the action of an acid. It is a resin having characteristics (hereinafter referred to as “acid action characteristics” in some cases). The resin (A) is a monomer having an acid labile group (hereinafter sometimes referred to as “acid labile group”) (hereinafter referred to as “monomer (a1)”), and the structural unit derived from the monomer (a1) "Structural unit (a1)") can be produced by polymerizing and becomes alkali-soluble by the action of an acid. “Can be dissolved in an alkaline aqueous solution by the action of an acid” means “insoluble or hardly soluble in an alkaline aqueous solution before contact with an acid, but soluble in an alkaline aqueous solution after contact with an acid”. means. A monomer (a1) may be used individually by 1 type, and may use 2 or more types together.

［式（１）中、
Ｒ^a1、Ｒ^ａ２及びＲ^a3（Ｒ^a1〜Ｒ^a3）は、それぞれ独立に、炭素数１〜８のアルキル基又は炭素数３〜２０の脂環式炭化水素基を表すか、Ｒ^a1及びＲ^a2は互いに結合して炭素数２〜２０の２価の炭化水素基を形成する。＊は結合手を表す。］ <Acid labile group>
The “acid labile group” means a group that forms a hydrophilic group (for example, a hydroxy group or a carboxy group) by leaving the leaving group upon contact with an acid. Examples of the acid labile group include a group represented by the formula (1) (acid labile group (1)) and a group represented by the formula (2) (acid labile group (2)). .

[In Formula (1),
Or which R ^{a1, R a2} and a R ^a3 (R ^a1 ~R ^a3) each independently represents an alicyclic hydrocarbon group of the alkyl group or 3 to 20 carbon atoms having 1 to 8 carbon atoms, R ^a1 and R ^a2 combine with each other to form a divalent hydrocarbon group having 2 to 20 carbon atoms. * Represents a bond. ]

［式（２）中、
Ｒ^a1’及びＲ^a2’は、それぞれ独立に、水素原子又は炭素数１〜１２の１価の炭化水素基を表し、Ｒ^a3’は、炭素数１〜２０の１価炭化水素基を表すか、Ｒ^a2’及びＲ^a3’は互いに結合して炭素数２〜２０の２価の炭化水素基を形成する。該１価の炭化水素基及び該２価の炭化水素基を構成するメチレン基は、酸素原子又は硫黄原子に置き換わってもよい。＊は結合手を表す。］

[In Formula (2),
R ^{a1 ′} and R ^{a2 ′} each independently represent a hydrogen atom or a monovalent hydrocarbon group having 1 to 12 carbon atoms, and R ^{a3 ′} represents a monovalent hydrocarbon group having 1 to 20 carbon atoms. , R ^{a2 ′} and R ^{a3 ′} combine with each other to form a divalent hydrocarbon group having 2 to 20 carbon atoms. The monovalent hydrocarbon group and the methylene group constituting the divalent hydrocarbon group may be replaced with an oxygen atom or a sulfur atom. * Represents a bond. ]

The alkyl groups and alicyclic hydrocarbon groups represented by R ^{a1 to} R ^a3 of the acid labile group (1) include those already exemplified in each carbon number range. However, carbon number of this alicyclic hydrocarbon group becomes like this. Preferably it is the range of 3-16.

When R ^a1 and R ^a2 are bonded to each other to form a divalent hydrocarbon group, the group represented by —C (R ^a1 ) (R ^a2 ) (R ^a3 ) is any of the following groups: This is the case. The carbon number of the divalent hydrocarbon group is preferably in the range of 3-12.

Examples of the acid labile group (1) include a 1,1-dialkylalkoxycarbonyl group (in the formula (1), groups in which R ^{a1 to} R ^a3 are alkyl groups, preferably tert-butyl groups), 2-alkyl An adamantane-2-yloxycarbonyl group (in formula (1), R ^a1 and R ^a2 combine to form an adamantyl ring, and R ^a3 is an alkyl group) and 1- (adamantan-1-yl ) -1-alkylalkoxycarbonyl group (in the formula (1), R ^a1 and R ^a2 are alkyl groups, and R ^a3 is an adamantyl group).

Examples of the R ^{a1 ′} and R ^{a2 ′} hydrocarbon groups of the acid labile group (2) include an alkyl group, an alicyclic hydrocarbon group, and an aromatic hydrocarbon group. Among these groups, the same groups are included in the range having 20 or less carbon atoms. However, at least one of R ^{a1 ′} and R ^{a2 ′} is preferably a hydrogen atom.

Specific examples of the acid labile group (2) include the following groups.

  The monomer (a1) is preferably a monomer having an acid labile group and a carbon-carbon double bond, and more preferably a (meth) acrylic monomer having an acid labile group.

  Among them, the monomer (a1) having an acid labile group (1) and / or an acid labile group (2) is preferable, and having an acid labile group (1) and / or an acid labile group (2). A (meth) acrylic monomer is particularly preferred.

  Of the (meth) acrylic monomers having an acid labile group, the monomer (a1) having an alicyclic hydrocarbon group having 5 to 20 carbon atoms is preferred. Since the resin (A) obtained using such a monomer (a1) has a bulky structure such as an alicyclic hydrocarbon group, the resist composition containing the resin (A) The resolution tends to be better.

［式（ａ１−１）及び式（ａ１−２）中、
Ｌ^a1及びＬ^a2は、それぞれ独立に、酸素原子又は＊−Ｏ−（ＣＨ₂）_k1−ＣＯ−Ｏ−を表し、ｋ１は１〜７の整数を表し、＊は−ＣＯ−との結合手を表す。
Ｒ^a4及びＲ^a5は、それぞれ独立に、水素原子又はメチル基を表す。
Ｒ^a6及びＲ^a7は、それぞれ独立に、炭素数１〜８のアルキル基又は炭素数３〜１０の脂環式炭化水素基を表す。
ｍ１は０〜１４の整数を表す。
ｎ１は０〜１０の整数を表す。
ｎ１’は０〜３の整数を表す。］ <Preferred structural unit (a1)>
The resin (A) having a suitable structural unit (a1) obtained by using the monomer (a1) having such an alicyclic hydrocarbon group will be further described in detail. Among the resins (A), a structural unit represented by the formula (a1-1) (hereinafter sometimes referred to as “structural unit (a1-1)”) or a structural unit represented by the formula (a1-2) A resin (A) having (hereinafter referred to as “structural unit (a1-2)” in some cases) is preferable. Such resin (A) may have the structural unit (a1-1) as a single species, may have a plurality of types, or may have the structural unit (a1-2) as a single species. In addition, a plurality of types may be included, and the structural unit (a1-1) and the structural unit (a1-2) may be combined.

[In Formula (a1-1) and Formula (a1-2),
L ^a1 and L ^a2 each independently represent an oxygen atom or * —O— (CH ₂ ) _k1 —CO—O—, k1 represents an integer of 1 to 7, and * represents a bond to —CO—. Represents.
R ^a4 and R ^a5 each independently represent a hydrogen atom or a methyl group.
R ^a6 and R ^a7 each independently represent an alkyl group having 1 to 8 carbon atoms or an alicyclic hydrocarbon group having 3 to 10 carbon atoms.
m1 represents the integer of 0-14.
n1 represents an integer of 0 to 10.
n1 ′ represents an integer of 0 to 3. ]

L ^a1 and L ^a2 are preferably an oxygen atom or * —O— (CH ₂ ) _k1 —CO—O—, more preferably an oxygen atom or k— is an integer of 1 to 4. It is a group represented by — (CH ₂ ) _k1 —CO—O—, more preferably an oxygen atom or * —O—CH ₂ —CO—O—, and still more preferably an oxygen atom.
R ^a4 and R ^a5 are preferably methyl groups.
Of the aliphatic hydrocarbon groups of R ^a6 and R ^a7 , preferably an alkyl group having 1 to 8 carbon atoms or an alicyclic hydrocarbon group having 3 to 10 carbon atoms, and within the range of the upper limit of the carbon number, Includes the same as those already exemplified. The aliphatic hydrocarbon groups for R ^a6 and R ^a7 are each independently more preferably an alkyl group having 8 or less carbon atoms or an alicyclic hydrocarbon group having 8 or less carbon atoms, and more preferably an alkyl having 6 or less carbon atoms. Or an alicyclic hydrocarbon group having 6 or less carbon atoms.
m1 is preferably an integer of 0 to 3, more preferably 0 or 1.
n1 is preferably an integer of 0 to 3, more preferably 0 or 1.
n1 ′ is preferably 0 or 1.

As the structural unit (a1-1), a structural unit (a1-1) represented by any of the following formulas (a1-1-1) to (a1-1-8) is preferable, and the formula (a1- The structural unit (a1-1) represented by any of (1-1) to (a1-1-4) is more preferable.

  Examples of the monomer (a1) from which these structural units (a1-1) can be derived include those described in JP-A No. 2010-204646.

On the other hand, as the structural unit (a1-2), those represented by any of the following formulas (a1-2-1) to (a1-2-12) are preferable. Among these, the structural unit (a1-2) represented by formula (a1-2-3), (a1-2-4), formula (a1-2-9) or (a1-2-10) is The structural unit (a1-2) represented by the formula (a1-2-3) or the formula (a1-2-9) is more preferable.

  Examples of the monomer (a1) capable of deriving the structural unit (a1-2) include 1-ethylcyclopentan-1-yl (meth) acrylate, 1-ethylcyclohexane-1-yl (meth) acrylate, and 1-ethyl. Examples include cycloheptan-1-yl (meth) acrylate, 1-methylcyclopentan-1-yl (meth) acrylate, and 1-isopropylcyclopentan-1-yl (meth) acrylate.

  When the resin (A) has the structural unit (a1-1) and / or the structural unit (a1-2), the total content thereof is based on the total structural unit (100 mol%) of the resin (A). The range of 10-95 mol% is preferable, the range of 15-90 mol% is more preferable, the range of 20-85 mol% is further more preferable, and the range of 20-60 mol% is still more preferable. When the structural unit (a1) has a structural unit (a1) having an adamantyl group (preferably the structural unit (a1-1)), the total of structural units (a1) in the resin (A) ( 100 mol%), the structural unit (a1) having an adamantyl group is preferably 15 mol% or more. With such a content ratio, the resin (A) having the structural unit (a1) having an adamantyl group tends to have good dry etching resistance of a resist pattern produced from the resist composition containing the resin (A). There is. In addition, in order to make the total content rate of a structural unit (a1-1) and / or a structural unit (a1-2) into the above-mentioned range, when manufacturing resin (A), it is with respect to the usage-amount of all monomers. What is necessary is just to adjust the usage-amount of the monomer which induces | guides | derives a structural unit (a1-1) and / or a structural unit (a1-2).

  Among the structural units of the resin (A), the structural unit (a1-1) and the structural unit (a1-2) that are preferable for the resin (A) to have acid action characteristics are described in detail. It is particularly preferable that the resin (A) has the unit (a1-1).

  The resin (A) may have a structural unit (a1) other than the structural unit (a1-1) and the structural unit (a1-2) which are suitable structural units (a1). Hereinafter, the structural unit (a1) other than the structural unit (a1-1) and the structural unit (a1-2) will be described by showing a monomer (a1) that derives the structural unit (a1).

［式（ａ１−３）中、
Ｒ^a9は、水素原子、置換基（例えばヒドロキシ基）を有していてもよい炭素数１〜３の脂肪族炭化水素基、カルボキシ基、シアノ基、又は−ＣＯＯＲ^a13で表される基を表し、Ｒ^a13は、炭素数１〜８の脂肪族炭化水素基を表し、該脂肪族炭化水素基に含まれる水素原子はヒドロキシ基などで置換されていてもよく、該脂肪族炭化水素基を構成するメチレン基は、酸素原子又はカルボニル基に置き換わっていてもよい。Ｒ^a10、Ｒ^a11及びＲ^a12は、それぞれ独立に、炭素数１〜１２の脂肪族炭化水素基を表すか、或いはＲ^a10及びＲ^a11は互いに結合して環を形成している。該脂肪族炭化水素基及に含まれる水素原子はヒドロキシ基などで置換されていてもよく、該脂肪族炭化水素基を構成するメチレン基は、酸素原子又はカルボニル基に置き換わっていてもよい。］ The resin (A) may have a structural unit (a1) derived from a monomer represented by the following formula (a1-3) (hereinafter sometimes referred to as “monomer (a1-3)”). . Since the resin (A) having the structural unit (a1) derived from the monomer (a1-3) contains a rigid norbornane ring in its main chain, the present resist containing such a resin (A) The composition tends to produce a resist pattern having excellent dry etching resistance.

[In the formula (a1-3),
R ^a9 represents a hydrogen atom, an aliphatic hydrocarbon group having 1 to 3 carbon atoms which may have a substituent (for example, a hydroxy group), a carboxy group, a cyano group, or a group represented by —COOR ^a13. , R ^a13 represents an aliphatic hydrocarbon group having 1 to 8 carbon atoms, and a hydrogen atom contained in the aliphatic hydrocarbon group may be substituted with a hydroxy group or the like, and constitutes the aliphatic hydrocarbon group The methylene group may be replaced by an oxygen atom or a carbonyl group. R ^a10 , R ^a11 and R ^a12 each independently represents an aliphatic hydrocarbon group having 1 to 12 carbon atoms, or R ^a10 and R ^a11 are bonded to each other to form a ring. The hydrogen atom contained in the aliphatic hydrocarbon group may be substituted with a hydroxy group or the like, and the methylene group constituting the aliphatic hydrocarbon group may be replaced with an oxygen atom or a carbonyl group. ]

The aliphatic hydrocarbon group which may have a substituent of R ^a9 is typically an alkyl group which may have a substituent, and among these alkyl groups, an alkyl having no substituent The group includes those already exemplified in the range of 1 to 8 carbon atoms. Examples of the substituent, particularly the aliphatic hydrocarbon group (alkyl group) having a hydroxy group include a hydroxymethyl group and a 2-hydroxyethyl group. ^Examples of R ^a13 include a methyl group, an ethyl group, a propyl group, a 2-oxo-oxolan-3-yl group, and a 2-oxo-oxolan-4-yl group.

The aliphatic hydrocarbon groups of R ^{a10 to} R ^a12 are also typically alkyl groups, and specific examples thereof are the same as those of R ^a9 . The ring formed by combining R ^a10 and R ^a11 together with the carbon atom to which they are bonded includes a cyclohexane ring and an adamantane ring.

As a monomer (a1-3), what was described in Unexamined-Japanese-Patent No. 2010-204646 is used, for example. Among these, a monomer represented by any of the following formula (a1-3-1), formula (a1-3-2), formula (a1-3-3) and formula (a1-3-4) ( a1-3) is preferred, the monomer (a1-3) represented by formula (a1-3-2) or (a1-3-4) is more preferred, and the monomer represented by formula (a1-3-2) (A1-3) is more preferable.

  When the resin (A) has a structural unit derived from the monomer (a1-3), the content ratio is in the range of 10 to 95 mol% with respect to the total structural unit (100 mol%) of the resin (A). Is preferable, the range of 15-90 mol% is more preferable, and the range of 20-85 mol% is further more preferable.

［式（ａ１−４）中、
Ｒ¹⁰は、ハロゲン原子を有してもよい炭素数１〜６のアルキル基、水素原子又はハロゲン原子を表す。
ｌ^ａは０〜４の整数を表す。
Ｒ¹¹は、ハロゲン原子、ヒドロキシ基、炭素数１〜６のアルキル基、炭素数１〜６のアルコキシ基、炭素数２〜４のアシル基、炭素数２〜４のアシルオキシ基、アクリロイル基又はメタクリロイル基を表し、ｌ^ａが２以上である場合、複数のＲ¹¹の全部又は一部は同じであってもよい。
Ｒ¹²及びＲ¹³はそれぞれ独立に、水素原子又は炭素数１〜１２の炭化水素基を表す。
Ｘ^a2は、置換基を有していてもよい炭素数１〜１７の脂肪族炭化水素基又は単結合を表し、該脂肪族炭化水素基を構成するメチレン基は、酸素原子、硫黄原子、カルボニル基、スルホニル基又は−Ｎ（Ｒ^ｃ）−（ただし、Ｒ^ｃは、水素原子又は炭素数１〜６のアルキル基を表す）で表される基に置き換わっていてもよい。
Ｙ^a3は、置換基を有していてもよい炭素数１〜１８の炭化水素基を表す。］ The resin (A) may have a structural unit (a1) derived from a monomer represented by the following formula (a1-4) (hereinafter sometimes referred to as “monomer (a1-4)”).

[In the formula (a1-4),
R ¹⁰ represents an alkyl group having 1 to 6 carbon atoms which may have a halogen atom, a hydrogen atom or a halogen atom.
l ^a represents an integer of 0 to 4;
R ¹¹ is a halogen atom, a hydroxy group, an alkyl group having 1 to 6 carbon atoms, an alkoxy group having 1 to 6 carbon atoms, an acyl group having 2 to 4 carbon atoms, an acyloxy group having 2 to 4 carbon atoms, an acryloyl group, or methacryloyl. In the case where l ^a is 2 or more, all or a part of the plurality of R ¹¹ may be the same.
R ¹² and R ¹³ each independently represent a hydrogen atom or a hydrocarbon group having 1 to 12 carbon atoms.
X ^a2 represents an ^optionally substituted aliphatic hydrocarbon group having 1 to 17 carbon atoms or a single bond, and the methylene group constituting the aliphatic hydrocarbon group includes an oxygen atom, a sulfur atom, a carbonyl A group, a sulfonyl group, or a group represented by —N (R ^c ) — (wherein R ^c represents a hydrogen atom or an alkyl group having 1 to 6 carbon atoms) may be substituted.
Y ^a3 represents an ^optionally substituted hydrocarbon group having 1 to 18 carbon atoms. ]

Among “an alkyl group having 1 to 6 carbon atoms which may have a halogen atom”, the alkyl group includes those already exemplified in the range of 1 to 6 carbon atoms. As the alkyl group having a halogen atom, an alkyl group having a fluorine atom is preferable. For example, a trifluoromethyl group, a perfluoroethyl group, a perfluoropropyl group, a perfluoroisopropyl group, a perfluorobutyl group, a perfluorosec-butyl group, a perfluorotert- Examples thereof include a butyl group, a perfluoropentyl group, and a perfluorohexyl group. Among these, as R < ¹⁰ >, a C1-C4 alkyl group is preferable, a methyl group and an ethyl group are more preferable, and a methyl group is further more preferable.
The alkoxy group of R ¹¹ includes those already exemplified in the range of 1 to 6 carbon atoms. Among them, an alkoxy group having 1 to 4 carbon atoms is preferable, a methoxy group and an ethoxy group are more preferable, and a methoxy group is further included. preferable.
The acyl group and acyloxy group of R ¹¹ include those already exemplified in the range of 2 to 4 carbon atoms.
The hydrocarbon groups of R ¹² and R ¹³ are those having 1 to 12 carbon atoms, and the hydrocarbon group of Y ^a3 is the aliphatic hydrocarbon group exemplified above in the range of 1 to 18 carbon atoms. Contains any of the aromatic hydrocarbon groups.
The aliphatic hydrocarbon group of X ^a2 is a divalent chain hydrocarbon group, a divalent alicyclic hydrocarbon group, or a divalent group in which a chain hydrocarbon group and an alicyclic hydrocarbon group are combined. And groups obtained by appropriately combining the groups already exemplified in the range of 1 to 17 carbon atoms.

As a monomer (a1-4), the monomer described in Unexamined-Japanese-Patent No. 2010-204646 is mentioned, for example. Among these, monomers represented by any of the following formulas (a1-4-1) to (a1-4-7) are preferable, and those represented by formulas (a1-4-1) to (a1-4-5) are preferable. A monomer represented by any one is more preferable.

  When the resin (A) has a structural unit derived from the monomer (a1-4), the content ratio thereof is in the range of 10 to 95 mol% with respect to the total structural unit (100 mol%) of the resin (A). The range of 15 to 90 mol% is more preferable, and the range of 20 to 85 mol% is particularly preferable.

式（ａ１−５）中、
Ｒ^３１は、ハロゲン原子を有してもよい炭素数１〜６のアルキル基、水素原子又はハロゲン原子を表す。
Ｌ^３〜Ｌ^５は、それぞれ独立に、酸素原子、硫黄原子又は＊−Ｏ−（ＣＨ₂）_k4−ＣＯ−Ｏ−で表される基を表す。ここで、ｋ４は１〜７の整数を表し、＊はカルボニル基（−ＣＯ−）との結合手である。
Ｚ^１’は、単結合又は炭素数１〜６のアルカンジイル基であり、該アルカンジイル基を構成するメチレン基は、酸素原子又はカルボニル基に置き換わっていてもよい。
ｓ１及びｓ１’は、それぞれ独立して、０〜４の整数を表す。 The resin (A) may have a structural unit (a1) derived from a monomer represented by the following formula (a1-5) (hereinafter sometimes referred to as “monomer (a1-5)”).

In formula (a1-5),
R ³¹ represents a C 1-6 alkyl group which may have a halogen atom, a hydrogen atom or a halogen atom.
L ^{3 to} L ⁵ each independently represent an oxygen atom, a sulfur atom or a group represented by * —O— (CH ₂ ) _k4 —CO—O—. Here, k4 represents an integer of 1 to 7, and * is a bond with a carbonyl group (—CO—).
Z ^{1 ′} is a single bond or an alkanediyl group having 1 to 6 carbon atoms, and the methylene group constituting the alkanediyl group may be replaced with an oxygen atom or a carbonyl group.
s1 and s1 ′ each independently represents an integer of 0 to 4.

In formula (a1-5), R ³¹ is preferably a hydrogen atom, a methyl group, or a trifluoromethyl group.
L ⁵ is preferably an oxygen atom.
One of L ³ and L ⁴ is preferably an oxygen atom and the other is a sulfur atom.
s1 is preferably 1.
s1 ′ is preferably an integer of 0 to 2.
Z ^{1 ′} is preferably a single bond or * —CH ₂ —CO—O— (* represents a bond to L ⁵ ).

Examples of the monomer (a1-5) include the following monomers.

  When the resin (A) has a structural unit derived from the monomer (a1-5), the content thereof is in the range of 1 to 95 mol% with respect to all the structural units (100 mol%) of the resin (A). Is preferable, the range of 3-90 mol% is more preferable, and the range of 5-85 mol% is further more preferable.

<Acid stable structural unit>
Resin (A) is a structural unit having no acid labile group in addition to the structural unit (a1) containing an acid labile group (hereinafter referred to as “acid stable structural unit” in some cases). The derivatizable monomer is preferably referred to as “acid-stable monomer”). In the resin (A), the acid stable structural unit may have only one type, or may have a plurality of types.

  When the resin (A) has an acid stable structural unit, the content ratio of the acid stable structural unit may be determined based on the content ratio of the structural unit (a1). The ratio of the content ratio of the structural unit (a1) and the content ratio of the acid-stable structural unit is represented by [structural unit (a1)] / [acid-stable structural unit], and preferably 10 to 80 mol% / 90 to It is 20 mol%, More preferably, it is 20-60 mol% / 80-40 mol%. If it does in this way, there exists a tendency for the dry etching tolerance of the resist pattern obtained from this resist composition containing resin (A) to become still better.

Next, a preferable thing is demonstrated among an acid stable structural unit.
The acid stable structural unit is preferably a structural unit having a hydroxy group or a lactone ring. An acid stable structural unit having a hydroxy group (hereinafter sometimes referred to as “acid stable structural unit (a2)”) and / or an acid stable structural unit having a lactone ring (hereinafter sometimes referred to as “acid stable structural unit (a3)”) When the resist composition containing the resin (A) is applied to a substrate, a coating film formed on the substrate or a composition layer obtained from the coating film is a substrate. The resist composition can easily produce a resist pattern with good resolution. In addition, the manufacturing method of the resist pattern using this resist composition here is mentioned later. First, the acid stable structural unit (a2) and the acid stable structural unit (a3) suitable as the acid stable structural unit will be described with specific examples.

<Acid stable structural unit (a2)>
When the acid-stable structural unit (a2) is introduced into the resin (A), a suitable acid-stable structure is used depending on the type of exposure source when producing a resist pattern from the resist composition containing the resin (A). The unit (a2) can be selected. That is, when this resist composition is used for exposure using a KrF excimer laser (wavelength: 248 nm) as an exposure source, or exposure using a high energy beam such as an electron beam or EUV light as an exposure source, an acid stable structural unit ( As a2), it is preferable to introduce an acid stable structural unit (a2-0) having a phenolic hydroxy group into the resin (A). When using exposure using a short wavelength ArF excimer laser (wavelength: 193 nm) as an exposure source, an acid stable structural unit represented by the formula (a2-1) described later is used as a resin ( It is preferable to introduce into A). Thus, each of the acid stable structural units (a2) possessed by the resin (A) can be selected according to the exposure source used for producing the resist pattern, but the acid stable structural units possessed by the resin (A) ( a2) may have only one type of acid stable structural unit (a2) suitable for the type of exposure source, and two or more types of acid stable structural unit (a2) suitable for the type of exposure source. Or an acid stable structural unit (a2) suitable for the type of exposure source and a combination of other acid stable structural units (a2).

式（ａ２−１）中、
Ｌ^a3は、酸素原子又は＊−Ｏ−（ＣＨ₂）_k2−ＣＯ−Ｏ−（ｋ２は１〜７の整数を表し、＊はカルボニル基（−ＣＯ−）との結合手を表す。）で表される基を表す。
Ｒ^a14は、水素原子又はメチル基を表す。
Ｒ^a15及びＲ^a16は、それぞれ独立に、水素原子、メチル基又はヒドロキシ基を表す。
ｏ１は、０〜１０の整数を表す。 One specific example of the acid stable structural unit (a2) is one represented by the following formula (a2-1) (hereinafter sometimes referred to as “acid stable structural unit (a2-1)”).

In formula (a2-1),
L ^a3 is an oxygen atom or * —O— (CH ₂ ) _k2 —CO—O— (k2 represents an integer of 1 to 7, and * represents a bond to a carbonyl group (—CO—)). Represents the group represented.
R ^a14 represents a hydrogen atom or a methyl group.
R ^a15 and R ^a16 each independently represent a hydrogen atom, a methyl group or a hydroxy group.
o1 represents an integer of 0 to 10.

L ^a3 is preferably an oxygen atom or a group represented by * —O— (CH ₂ ) _k2 —CO—O—, wherein k2 is an integer of 1 to 4, and more preferably an oxygen atom or * —O—CH ₂ —CO—O—, and more preferably an oxygen atom.
R ^a14 is preferably a methyl group.
R ^a15 is preferably a hydrogen atom.
R ^a16 is preferably a hydrogen atom or a hydroxy group.
o1 is preferably an integer of 0 to 3, more preferably 0 or 1.

As an acid stable structural unit (a2-1), the following are mentioned, for example.

  As described above, the exemplified acid stable structural unit (a2-1) is derived from, for example, an acid stable monomer described in JP 2010-204646 A. Among these, the acid stable structural unit (a2-1) represented by any of the formulas (a2-1-1) to (a2-1-4) is more preferable, and the formula (a2-1-1) or The acid stable structural unit (a2-1) represented by (a2-1-3) is more preferable.

  When the resin (A) has an acid stable structural unit (a2-1), the content ratio is preferably in the range of 3 to 45 mol% with respect to the total structural unit (100 mol%) of the resin (A). The range of 3-40 mol% is more preferable, and the range of 3-35 mol% is more preferable.

式（ａ２−０）中、
Ｒ^a30は、ハロゲン原子を有してもよい炭素数１〜６のアルキル基、水素原子又はハロゲン原子を表す。
Ｒ^a31は、ハロゲン原子、ヒドロキシ基、炭素数１〜６のアルキル基、炭素数１〜６のアルコキシ基、炭素数２〜４のアシル基、炭素数２〜４のアシルオキシ基、アクリロイル基又はメタクリロイル基を表す。
ｍａは０〜４の整数を表す。ｍａが２以上の整数である場合、複数のＲ^a31の全部又は一部は同じであってもよい。 Next, the acid stable structural unit which has a phenolic hydroxy group among the acid stable structural units which have a hydroxy group is demonstrated. The acid stable structural unit is preferably one represented by the following formula (a2-0) (hereinafter sometimes referred to as “acid stable structural unit (a2-0)”).

In formula (a2-0),
R ^a30 represents a C 1-6 alkyl group which may have a halogen atom, a hydrogen atom or a halogen atom.
R ^a31 is a halogen atom, a hydroxy group, an alkyl group having 1 to 6 carbon atoms, an alkoxy group having 1 to 6 carbon atoms, an acyl group having 2 to 4 carbon atoms, an acyloxy group having 2 to 4 carbon atoms, an acryloyl group, or methacryloyl. Represents a group.
ma represents an integer of 0 to 4. When ma is an integer of 2 or more, all or some of the plurality of R ^a31 may be the same.

Specific examples of the “alkyl group having 1 to 6 carbon atoms” in the “alkyl group having 1 to 6 carbon atoms which may have a halogen atom” for R ^a30 include those already exemplified in this range. . The “C 1-6 alkyl group having a halogen atom” is one in which at least a part of the hydrogen atoms contained in the C 1-6 alkyl group is substituted with a halogen atom. The specific example of the halogen atom is as already described. Among these, R ^a30 is preferably an alkyl group having 1 to 4 carbon atoms, more preferably a methyl group and an ethyl group, and further preferably a methyl group.
Specific examples of the alkoxy group of R ^a31 include those already exemplified in the range of 1 to 6 carbon atoms. Among these, R ^a31 is preferably an alkoxy group having 1 to 4 carbon atoms, more preferably a methoxy group and an ethoxy group, and further preferably a methoxy group.
ma is preferably 0, 1 or 2, more preferably 0 or 1, and still more preferably 0.

Among the acid stable structural units (a2-0), those represented by any of the following formulas (a2-0-1) to (a2-0-4) are preferable. An acid stable monomer capable of deriving such a structural unit is described in, for example, JP 2010-204634 A.

  Acid-stable monomer capable of deriving acid-stable structural unit (a2-0) such as p-hydroxystyrene and p-hydroxy-α-methylstyrene [hereinafter referred to as “acid-stable monomer (a2)” in some cases. ] In the production of the resin (A), the acid stable structural unit (a2-0) represented by the formula (a2-0-1) or the formula (a2-0-2) is converted into the resin (A). After the phenolic hydroxy group in the acid stable monomer (a2) is protected with a protecting group such as an acetyl group to form a protected acid stable monomer (a2), the protected acid Resin (A) can also be manufactured using a stable monomer (a2). A resin (A) having an acid-stable structural unit (a2-0) can be produced by deprotecting a resin having a structural unit derived from the protected acid-stable monomer (a2) and removing the protecting group. . However, when carrying out the deprotection treatment, it is necessary to carry out the deprotection treatment without significantly damaging the other structural unit (a1).

  When the resin (A) has an acid stable structural unit (a2-0), the content ratio is preferably in the range of 5 to 90 mol% with respect to the total structural unit (100 mol%) of the resin (A). The range of 10-85 mol% is more preferable, and the range of 15-80 mol% is further more preferable.

<Acid stable structural unit (a3)>
The lactone ring possessed by the acid stable structural unit (a3) may be monocyclic such as β-propiolactone ring, γ-butyrolactone ring and δ-valerolactone ring, monocyclic lactone ring and other rings. Or a condensed ring. Among these lactone rings, a γ-butyrolactone ring and a condensed ring of a γ-butyrolactone ring and another ring are preferable.

［式（ａ３−１）中、
Ｌ^a4は、酸素原子又は＊−Ｏ−（ＣＨ₂）_k3−ＣＯ−Ｏ−（ｋ３は１〜７の整数を表す。）で表される基を表す。＊はカルボニル基との結合手を表す。
Ｒ^a18は、水素原子又はメチル基を表す。
ｐ１は０〜５の整数を表す。
Ｒ^a21は炭素数１〜４の脂肪族炭化水素基を表し、ｐ１が２以上の場合、複数のＲ^a21の全部又は一部は同じであってもよい。
式（ａ３−２）中、
Ｌ^a5は、酸素原子又は＊−Ｏ−（ＣＨ₂）_k3−ＣＯ−Ｏ−（ｋ３は１〜７の整数を表す。）で表される基を表す。＊はカルボニル基との結合手を表す。
ｑ１は、０〜３の整数を表す。
Ｒ^a22は、カルボキシ基、シアノ基又は炭素数１〜４の脂肪族炭化水素基を表し、ｑ１が２以上の場合、複数のＲ^a22の全部又は一部は同じであってもよい。
式（ａ３−３）中、
Ｌ^a6は、酸素原子又は＊−Ｏ−（ＣＨ₂）_k3−ＣＯ−Ｏ−（ｋ３は１〜７の整数を表す。）で表される基を表す。＊はカルボニル基との結合手を表す。
Ｒ^a20は、水素原子又はメチル基を表す。
ｒ１は、０〜３の整数を表す。
Ｒ^a23は、カルボキシ基、シアノ基又は炭素数１〜４の脂肪族炭化水素基を表し、ｒ１が２以上の場合、複数のＲ^a23の全部又は一部は同じであってもよい。］ The acid stable structural unit (a3) is preferably one represented by the following formula (a3-1), formula (a3-2) or formula (a3-3). Resin (A) may have only 1 type among these, and may have 2 or more types. In the following description, what is represented by the formula (a3-1) is referred to as “acid-stable structural unit (a3-1)”, and what is represented by the formula (a3-2) is “acid-stable structural unit ( a3-2) ”, and the compound represented by formula (a3-3) is referred to as“ acid-stable structural unit (a3-3) ”.

[In the formula (a3-1),
L ^a4 represents an oxygen atom or a group represented by * —O— (CH ₂ ) _k3 —CO—O— (k3 represents an integer of 1 to 7). * Represents a bond with a carbonyl group.
R ^a18 represents a hydrogen atom or a methyl group.
p1 represents an integer of 0 to 5.
R ^a21 represents an aliphatic hydrocarbon group having 1 to 4 carbon atoms, and when p1 is 2 or more, all or some of the plurality of R ^a21 may be the same.
In formula (a3-2),
L ^a5 represents an oxygen atom or a group represented by * —O— (CH ₂ ) _k3 —CO—O— (k3 represents an integer of 1 to 7). * Represents a bond with a carbonyl group.
q1 represents an integer of 0 to 3.
R ^a22 represents a carboxy group, a cyano group, or an aliphatic hydrocarbon group having 1 to 4 carbon atoms, and when q1 is 2 or more, all or some of the plurality of R ^a22 may be the same.
In formula (a3-3),
L ^a6 represents an oxygen atom or a group represented by * —O— (CH ₂ ) _k3 —CO—O— (k3 represents an integer of 1 to 7). * Represents a bond with a carbonyl group.
R ^a20 represents a hydrogen atom or a methyl group.
r1 represents an integer of 0 to 3.
R ^a23 represents a carboxy group, a cyano group, or an aliphatic hydrocarbon group having 1 to 4 carbon atoms. When r1 is 2 or more, all or some of the plurality of R ^a23 may be the same. ]

In formula (a3-1) to formula (a3-3), L ^{a4 to} L ^a6 are the same as those described for L ^a3 in formula (a2-1).
L ^{a4 to} L ^a6 are each independently an oxygen atom or a group represented by * —O— (CH ₂ ) _k3 —CO—O— in which k3 is an integer of 1 to 4, preferably an oxygen atom and * —O—CH ₂ —CO—O— is more preferable, and an oxygen atom is more preferable.
R ^{a18 to} R ^a21 are preferably methyl groups.
R ^a22 and R ^a23 are each independently preferably a carboxy group, a cyano group or a methyl group.
p1, q1 and r1 are preferably integers of 0 to 2, more preferably 0 or 1. When p1 is 2, two R ^a21 may be the same as or different from each other. When q1 is 2, two R ^a22 may be the same as or different from each other, and r1 is 2. Two R ^a23 may be the same or different from each other.

  Hereinafter, preferred examples of the acid stable structural unit (a3-1), the acid stable structural unit (a3-2), and the acid stable structural unit (a3-3) will be shown.

Preferable examples of the acid stable structural unit (a3-1) are those represented by any of the following formulas (a3-1-1) to (a3-1-4).

Preferable examples of the acid stable structural unit (a3-2) are those represented by any of the following formulas (a3-2-1) to (a3-2-4).

Preferable examples of the acid stable structural unit (a3-3) are those represented by any of the following formulas (a3-3-1) to (a3-3-4).

  The acid stable structural unit (a3-1), the acid stable structural unit (a3-2), and the acid stable structural unit (a3-3) can be derived from an acid stable monomer described in JP 2010-204646 A. Among the specific examples of the acid stable structural unit (a3), the formula (a3-1-1) to the formula (a3-1-2), the formula (a3-2-3) to the formula (a3-2-4) The acid stable structural unit (a3) represented by the formula (a3) is more preferred, and the acid stable structural unit (a3) represented by the formula (a3-1-1) or the formula (a3-2-3) is more preferred.

  When the resin (A) has an acid stable structural unit (a3), the content ratio is preferably in the range of 5 to 70 mol% with respect to the total structural units (100 mol%) of the resin (A). The range of 10 to 65 mol% is more preferable, and the range of 10 to 60 mol% is more preferable.

<Other acid stable structural units>
The preferred acid stable structural unit (a2) and acid stable structural unit (a3) have been described as the acid stable structural unit possessed by the resin (A). However, the resin (A) contains the acid stable structural unit (a2) and the acid stable structural unit. It may have an acid stable structural unit other than the structural unit (a3). Here, the acid stable structural unit (a4) other than the acid stable structural unit (a2) and the acid stable structural unit (a3) is referred to. Hereinafter, the acid-stable structural unit (a4) will be described by showing an acid-stable monomer (hereinafter sometimes referred to as “acid-stable monomer (a4)”) from which the acid-stable structural unit (a4) can be derived.

式（ａ４−１）中、
Ｒ^a41は、炭素数１〜１２の１価の脂肪族炭化水素基又は炭素数６〜１２の１価の芳香族炭化水素基を表し、該１価の脂肪族炭化水素基を構成するメチレン基は、酸素原子又はカルボニル基に置き換わっていてもよい。Ａ^a41は、置換基を有していてもよい炭素数１〜６のアルカンジイル基又は式（ａ−ｇ１）

［式（ａ−ｇ１）中、
ｓは０又は１を表す。
Ａ^a42及びＡ^a44は、それぞれ独立に、置換基を有していてもよい炭素数１〜５の脂肪族炭化水素基を表す。
Ａ^a43は、置換基を有していてもよい炭素数１〜５の脂肪族炭化水素基又は単結合を表す。
Ｘ^a41及びＸ^a42は、それぞれ独立に、酸素原子、カルボニル基、カルボニルオキシ基又はオキシカルボニル基を表す。
ただし、Ａ^a42、Ａ^a43、Ａ^a44、Ｘ^a41及びＸ^a42の炭素数の合計は６以下である。］
で表される基を表す。
Ｒ^a42は、置換基を有していてもよい脂肪族炭化水素基を表す。該脂肪族炭化水素基は部分的に、炭素炭素不飽和結合を有していてもよいが、炭素炭素不飽和結合を有さない脂肪族飽和炭化水素基が好ましい。該脂肪族飽和炭化水素基としては、アルキル基（当該アルキル基は直鎖でも分岐していてもよい）及び脂環式炭化水素基、並びに、アルキル基及び脂環式炭化水素基を組み合わせた脂肪族炭化水素基などが挙げられる。 A specific example of the acid stable monomer (a4) is, for example, a monomer represented by the following formula (a4-1) (hereinafter sometimes referred to as “monomer (a4-1)”). As will be described later, this monomer (a4-1) preferably has a fluorine atom.

In formula (a4-1),
R ^a41 represents a monovalent aliphatic hydrocarbon group having 1 to 12 carbon atoms or a monovalent aromatic hydrocarbon group having 6 to 12 carbon atoms, and a methylene group constituting the monovalent aliphatic hydrocarbon group. May be replaced by an oxygen atom or a carbonyl group. A ^a41 is an alkanediyl group having 1 to 6 carbon atoms which may have a substituent or a formula (a-g1).

[In the formula (a-g1),
s represents 0 or 1.
A ^a42 and A ^a44 each independently represent an ^optionally substituted aliphatic hydrocarbon group having 1 to 5 carbon atoms.
A ^a43 represents an aliphatic hydrocarbon group having 1 to 5 carbon atoms which may have a substituent or a single bond.
X ^a41 and X ^a42 each independently represent an oxygen atom, a carbonyl group, a carbonyloxy group or an oxycarbonyl group.
However, the total number of carbon atoms of A ^a42 , A ^a43 , A ^a44 , X ^a41 and X ^a42 is 6 or less. ]
Represents a group represented by
R ^a42 represents an aliphatic hydrocarbon group which may have a substituent. The aliphatic hydrocarbon group may partially have a carbon-carbon unsaturated bond, but an aliphatic saturated hydrocarbon group having no carbon-carbon unsaturated bond is preferable. Examples of the aliphatic saturated hydrocarbon group include an alkyl group (the alkyl group may be linear or branched), an alicyclic hydrocarbon group, and an aliphatic combination of an alkyl group and an alicyclic hydrocarbon group. Group hydrocarbon group and the like.

^Among the aliphatic hydrocarbon groups ^represented by R ^a41 , the alkyl group and the aromatic hydrocarbon group include those already exemplified in the respective ranges of the carbon number.

［式（ａ−ｇ３）中、
Ｘ^a43は、酸素原子、カルボニル基、カルボニルオキシ基又はオキシカルボニル基を表す。
Ａ^a45は、ハロゲン原子を有していてもよい炭素数３〜１７の脂肪族炭化水素基を表す。］
つまり、Ｒ^a42は、以下の式（ａ−ｇ２）で表される基であることが好ましい。

［式（ａ−ｇ２）中、
Ａ^a46は、ハロゲン原子を有していてもよい炭素数３〜１７の脂肪族炭化水素基を表す。
Ｘ^a44は、カルボニルオキシ基又はオキシカルボニル基を表す。
Ａ^a47は、ハロゲン原子を有していてもよい炭素数３〜１７の脂肪族炭化水素基を表す。
ただし、Ａ^a46、Ａ^a47及びＸ^a44の炭素数の合計は１８以下である。］ Further, the aliphatic hydrocarbon group R ^a42 may not have have a substituent, but when R ^a42 is an aliphatic hydrocarbon group having a substituent group. Such a substituent is preferably a halogen atom or a group represented by the formula (a-g3).

[In the formula (a-g3),
X ^a43 represents an oxygen atom, a carbonyl group, a carbonyloxy group or an oxycarbonyl group.
A ^a45 represents an aliphatic hydrocarbon group having 3 to 17 carbon atoms which may have a halogen atom. ]
That is, R ^a42 is preferably a group represented by the following formula (a-g2).

[In the formula (a-g2),
A ^a46 represents an aliphatic hydrocarbon group having 3 to 17 carbon atoms which may have a halogen atom.
X ^a44 represents a carbonyloxy group or an oxycarbonyl group.
A ^a47 represents an aliphatic hydrocarbon group having 3 to 17 carbon atoms which may have a halogen atom.
However, the total number of carbon atoms of A ^a46 , A ^a47 and X ^a44 is 18 or less. ]

Preferred R ^a42 , an aliphatic hydrocarbon group having a substituent selected from the group consisting of a halogen atom and a group represented by formula (a-g3) (a group represented by formula (a-g2)) Detailed description.

  First, an aliphatic hydrocarbon group having a halogen atom will be described. Such an aliphatic hydrocarbon group is typically an alkyl group having a halogen atom and an alicyclic hydrocarbon group having a halogen atom (preferably a cycloalkyl group having a halogen atom). The alkyl group having a halogen atom is one in which part or all of the hydrogen atoms constituting the alkyl group are substituted with halogen atoms. Similarly, an alicyclic hydrocarbon group having a halogen atom is one in which part or all of the hydrogen atoms constituting the alicyclic hydrocarbon group are substituted with halogen atoms. The halogen atom contained in the alkyl group having a halogen atom and the alicyclic hydrocarbon group having a halogen atom is a fluorine atom, a chlorine atom, a bromine atom or an iodine atom, or a combination thereof, but a fluorine atom Is particularly preferred.

When the monomer (a4-1) in which R ^a42 is an aliphatic hydrocarbon group having a fluorine atom is shown as a specific example in the case where A ^a41 is a preferable ethylene group, the following formula (a4-1-1) to And a monomer (a4-1) represented by the formula (a4-1-22).

When R ^a42 is an aliphatic hydrocarbon group having a halogen atom, a perfluoroalkyl group in which all of the hydrogen atoms constituting the alkyl group are substituted with fluorine atoms, or all of the hydrogen atoms constituting the cycloalkyl group are fluorine atoms. A perfluorocycloalkyl group substituted with is more preferable. Among the specific examples described above, the monomer (a4-1) in which R ^a42 is a perfluoroalkyl group or a perfluorocycloalkyl group includes the formula (a4-1-3), the formula (a4-1-4), the formula ( a4-1-7), formula (a4-1-8), formula (a4-1-11), formula (a4-1-12), formula (a4-1-15), formula (a4-1-16) ), Formula (a4-1-19), formula (a4-1-20), formula (a4-1-21), and formula (a4-1-22). Further, R ² is preferably a perfluoroalkyl group, and examples of the perfluoroalkyl group include a perfluoromethyl group, a perfluoroethyl group, a perfluoropropyl group, a perfluorobutyl group, a perfluoropentyl group, a perfluorohexyl group, a perfluoroheptyl group, and a perfluorooctyl group. Is exemplified. More preferably, it is a C1-C6 perfluoroalkyl group, More preferably, it is a C1-C3 perfluoroalkyl group.

^Next , the ^case where R ^a42 is an aliphatic hydrocarbon group having a group represented by the formula (a-g3) will be described. The aliphatic hydrocarbon group may have one or a plurality of groups represented by the formula (a-g3), but the carbon atom contained in the group represented by the formula (a-g3) The total carbon number of the aliphatic hydrocarbon group including the number of is preferably 15 or less, and more preferably 12 or less. In order to satisfy such a preferable total number of carbon atoms, a group having one group represented by the formula (a-g3) is preferable as R ^a42 .

［式（ａ４−１’）中、すべての符号はいずれも、前記と同義である。］ The monomer (a4-1) in which R ^a42 is an aliphatic hydrocarbon group having one group represented by the formula (a-g2) is specifically represented by the following formula (a4-1 ′). (Hereinafter referred to as “monomer (a4-1 ′)” in some cases).

[In the formula (a4-1 ′), all symbols are as defined above. ]

In the monomer (a4-1 ′), both A ^a46 and A ^a47 may have a halogen atom, but A ^a46 is an aliphatic hydrocarbon group having a halogen atom, or A ^a47 is a halogen atom. The aliphatic hydrocarbon group having Furthermore, A ^a46 is preferably an aliphatic hydrocarbon group having a halogen atom, and among them, A ^a46 is more preferably an alkanediyl group having a fluorine atom, and further preferably a perfluoroalkanediyl group. The “perfluoroalkanediyl group” refers to an alkanediyl group in which all of the hydrogen atoms are substituted with fluorine atoms.

When the compound (a4-1 ′) in which R ^a42 is a perfluoroalkanediyl group is exemplified when A ^a41 is an ethylene group, the following formulas (a4-1′-1) to (a4-1′-22) ) Each represented by a monomer (a4-1 ′).

A ^a46 and A ^a47 are arbitrarily selected in the range where the total number of carbon atoms is 17 or less, and the carbon number of A ^a46 is preferably in the range of 1-6, more preferably in the range of 1-3.
On the other hand, the carbon number of A ^a47 is preferably in the range of 4-15, more preferably in the range of 5-12. Further preferred A ¹⁴ is an alicyclic hydrocarbon group having 6 to 12 carbon atoms, and as the alicyclic hydrocarbon group, a cyclohexyl group and an adamantyl group are still more preferred.

このような構造を有するモノマー（ａ４−１’）は、前記の具体例の中では、式（ａ４−１’−９）〜式（ａ４−１’−２０）でそれぞれ表される化合物が該当する。 Among the combinations of A ^a46 and A ^a47, the more preferable, * - is represented by the partial structure represented by A ^a46 -X ^a44 -A ^a47 (* represents a bond to a carbonyl group), the following structure Is mentioned.

The monomer (a4-1 ′) having such a structure is a compound represented by the formula (a4-1′-9) to the formula (a4-1′-20) in the above specific examples. To do.

  When the resin (A) has a structural unit derived from the monomer (a4-1), the content ratio is in the range of 1 to 20 mol% with respect to the total structural unit (100 mol%) of the resin (A). Is preferable, the range of 2-15 mol% is more preferable, and the range of 3-10 mol% is further more preferable.

Moreover, resin which has a structural unit derived from the monomer (a4-1) shown here can also be contained in this resist composition separately from resin (A). In other words, the resin (A) having an acid labile group [structural unit (a1)] in the molecule and the structural unit derived from the monomer (a4-1) having no acid labile group in the molecule. A resin (hereinafter, sometimes referred to as “resin (X)”) may be combined and contained in the resist composition.
In this case, the content ratio of the structural unit derived from the monomer (a4-1) in the resin (X) is preferably 80 mol% or more with respect to all the structural units (100 mol%) of the resin (X). 85 mol% or more is more preferable, and 90 mol% or more is further more preferable.

  In the resist composition, a resin (A) having acid action characteristics and a resin (X) not having acid action characteristics may be used in combination. In this case, as the resin (X), a monomer ( A resin having a structural unit derived from a4-1) can be used. More specifically, the resin (X) preferably has a structural unit derived from the monomer (a4-1 ′) among the structural units derived from the monomer (a4-1). The content ratio of the structural unit derived from the monomer (a4-1) [monomer (a4-1 ′)] with respect to the total structural unit of the resin (X) is, for example, preferably 80 mol% or more, and more preferably 85 mol% or more. 90 mol% or more is more preferable. Resin (X) may consist essentially of a structural unit derived from monomer (a4-1) [monomer (a4-1 ′)]. In addition, as the structural unit that the resin (X) may have other than the structural unit derived from the monomer (a4-1), the above-mentioned acid stable structural unit (a2), acid stable structural unit (a3), and the like Can be mentioned.

  As described above, the structural unit (a1-1), the structural unit (a1-2), the other structural unit (a1), and the acid stable structural unit suitable as the structural unit (a1) of the resin (A). Although the acid stable structural unit (a2), the acid stable structural unit (a3), and the acid stable structural unit (a4) have been described in detail, the structural unit other than these may be included. Mention may be made of structural units well known in the art. Although the resin (A) having an acid labile group in the molecule has been described here, the resist composition contains a resin having no acid labile group in addition to the resin (A). May be.

<Method for producing resin (A)>
The resin (A) is a monomer (a1) that derives the structural unit (a1), preferably a copolymer of the monomer (a1) and an acid stable monomer, and more preferably the structural unit ( Copolymerization of monomer (a1) for deriving a1-1) and / or structural unit (a1-2) with acid-stable monomer for deriving acid-stable structural unit (a2) and / or acid-stable structural unit (a3) It has been made. For example, when the resist composition is used for EUV exposure, the monomer (a1) that induces the structural unit (a1-1) and / or the structural unit (a1-2), and the acid stable structural unit (a2- And an acid-stable monomer derived from 0).
The resin (A) further preferably has a structural unit (a1-1) having an adamantyl group as the structural unit (a1). The resin (A) can be produced by subjecting the monomer as described above to a known polymerization method (for example, radical polymerization method) and polymerizing (copolymerizing) it.

  The weight average molecular weight of the resin (A) is preferably 2,500 or more (more preferably 3,000 or more) and 50,000 or less (more preferably 30,000 or less). In addition, the weight average molecular weight here is calculated | required as a conversion value of a standard polystyrene reference | standard by gel permeation chromatography analysis. Detailed analysis conditions for this analysis are described in the Examples of the present application.

<Basic compound (C)>
This resist composition preferably further contains a basic compound (C). Such a basic compound (C) is what is called a quencher in this technical field. The basic compound (C) is preferably a basic nitrogen-containing organic compound, and examples thereof include amines and ammonium salts. Examples of amines include aliphatic amines and aromatic amines. Aliphatic amines include primary amines, secondary amines and tertiary amines. The basic compound (C) is preferably a compound represented by the formula (C1) to a compound represented by the formula (C8), more preferably a compound represented by the formula (C1-1). It is done.

［式（Ｃ１）中、
Ｒ^c1、Ｒ^c2及びＲ^c3は、それぞれ独立に、水素原子、炭素数１〜６のアルキル基、炭素数５〜１０の脂環式炭化水素基又は炭素数６〜１０の芳香族炭化水素基を表し、該アルキル基及び該脂環式炭化水素基に含まれる水素原子は、ヒドロキシ基、アミノ基又は炭素数１〜６のアルコキシ基で置換されていてもよく、該芳香族炭化水素基に含まれる水素原子は、炭素数１〜６のアルキル基、炭素数１〜６のアルコキシ基、炭素数５〜１０の脂環式炭化水素又は炭素数６〜１０の芳香族炭化水素基で置換されていてもよい。］

[In the formula (C1),
R ^c1 , R ^c2 and R ^c3 are each independently a hydrogen atom, an alkyl group having 1 to 6 carbon atoms, an alicyclic hydrocarbon group having 5 to 10 carbon atoms or an aromatic hydrocarbon group having 6 to 10 carbon atoms. The hydrogen atom contained in the alkyl group and the alicyclic hydrocarbon group may be substituted with a hydroxy group, an amino group, or an alkoxy group having 1 to 6 carbon atoms, and the aromatic hydrocarbon group The hydrogen atom contained is substituted with an alkyl group having 1 to 6 carbon atoms, an alkoxy group having 1 to 6 carbon atoms, an alicyclic hydrocarbon having 5 to 10 carbon atoms, or an aromatic hydrocarbon group having 6 to 10 carbon atoms. It may be. ]

［式（Ｃ１−１）中、
Ｒ^c2及びＲ^c3は、前記と同義である。
Ｒ^c4は、炭素数１〜６のアルキル基、炭素数１〜６のアルコキシ基、炭素数５〜１０の脂環式炭化水素又は炭素数６〜１０の芳香族炭化水素基を表す。
ｍ３は０〜３の整数を表し、ｍ３が２以上のとき、複数のＲ^c4の全部又は一部は同じであってもよい。］

[In the formula (C1-1),
R ^c2 and R ^c3 are as defined above.
R ^c4 represents an alkyl group having 1 to 6 carbon atoms, an alkoxy group having 1 to 6 carbon atoms, an alicyclic hydrocarbon having 5 to 10 carbon atoms, or an aromatic hydrocarbon group having 6 to 10 carbon atoms.
m3 represents an integer of 0 to 3, and when m3 is 2 or more, all or some of the plurality of R ^c4 may be the same. ]

［式（Ｃ２）、式（Ｃ３）及び式（Ｃ４）中、
Ｒ^c5、Ｒ^c6、Ｒ^c7及びＲ^c8は、それぞれ独立に、Ｒ^c1と同義である。
Ｒ^c9は、炭素数１〜６のアルキル基、炭素数３〜６の脂環式炭化水素基又は炭素数２〜６のアルカノイル基を表す。
ｎ３は０〜８の整数を表し、ｎ３が２以上のとき、複数のＲ^c9の全部又は一部は同じであってもよい。］

[In Formula (C2), Formula (C3) and Formula (C4),
R ^c5 , R ^c6 , R ^c7 and R ^c8 are each independently synonymous with R ^c1 .
R ^c9 represents an alkyl group having 1 to 6 carbon atoms, an alicyclic hydrocarbon group having 3 to 6 carbon atoms, or an alkanoyl group having 2 to 6 carbon atoms.
n3 represents an integer of 0 to 8, and when n3 is 2 or more, all or some of the plurality of R ^c9 may be the same. ]

［式（Ｃ５）及び式（Ｃ６）中、
Ｒ^c10、Ｒ^c11、Ｒ^c12、Ｒ^c13及びＲ^c16は、それぞれ独立に、Ｒ^c1と同義である。
Ｒ^c14、Ｒ^c15及びＲ^c17は、それぞれ独立に、Ｒ^c4と同義である。
ｏ３及びｐ３は、それぞれ独立に０〜３の整数を表し、ｏ３が２以上であるとき、複数のＲ^c14の全部又は一部は同じであってもよい。ｐ３が２以上であるとき、複数のＲ^c15の全部又は一部は同じであってもよい。
Ｌ^c1は、炭素数１〜６のアルカンジイル基、−ＣＯ−、−Ｃ（＝ＮＨ）−、−Ｓ−又はこれらを組合せた２価の基を表す。］

[In Formula (C5) and Formula (C6),
R ^c10 , R ^c11 , R ^c12 , R ^c13 and R ^c16 are each independently synonymous with R ^c1 .
R ^c14 , R ^c15 and R ^c17 each independently have the same ^meaning as R ^c4 .
o3 and p3 each independently represent an integer of 0 to 3, and when o3 is 2 or more, all or some of the plurality of R ^c14 may be the same. When p3 is 2 or more, all or some of the plurality of R ^c15 may be the same.
L ^c1 represents an alkanediyl group having 1 to 6 carbon atoms, —CO—, —C (═NH) —, —S—, or a divalent group obtained by combining these. ]

［式（Ｃ７）及び式（Ｃ８）中、
Ｒ^c18、Ｒ^c19及びＲ^c20は、それぞれ独立に、Ｒ^c4と同義である。
ｑ３、ｒ３及びｓ３は、それぞれ独立に０〜３の整数を表し、ｑ３が２以上であるとき、複数のＲ^c18の全部又は一部は同じであってもよい。ｒ３が２以上であるとき、複数のＲ^c19の全部又は一部は同じであってもよい。ｓ３が２以上であるとき、複数のＲ^c20の全部又は一部は同じであってもよい。
Ｌ^c2は、単結合又は炭素数１〜６のアルカンジイル基、−ＣＯ−、−Ｃ（＝ＮＨ）−、−Ｓ−又はこれらを組合せた２価の基を表す。］

[In Formula (C7) and Formula (C8),
R ^c18, R ^c19 and R ^c20 in each occurrence independently has the same meaning as R ^c4.
q3, r3 and s3 each independently represents an integer of 0 to 3, and when q3 is 2 or more, all or some of the plurality of R ^c18 may be the same. When r3 is 2 or more, all or some of the plurality of R ^c19 may be the same. When s3 is 2 or more, all or some of the plurality of R ^c20 may be the same.
L ^c2 represents a single bond or an alkanediyl group having 1 to 6 carbon atoms, —CO—, —C (═NH) —, —S—, or a divalent group obtained by combining these. ]

  Examples of the compound represented by the formula (C1) include 1-naphthylamine, 2-naphthylamine, aniline, diisopropylaniline, 2-, 3- or 4-methylaniline, 4-nitroaniline, N-methylaniline, N, N- Dimethylaniline, diphenylamine, hexylamine, heptylamine, octylamine, nonylamine, decylamine, dibutylamine, dipentylamine, dihexylamine, diheptylamine, dioctylamine, dinonylamine, didecylamine, triethylamine, trimethylamine, tripropylamine, tributylamine, tri Pentylamine, trihexylamine, triheptylamine, trioctylamine, trinonylamine, tridecylamine, methyldibutylamine, methyldipentylamine, methyl Hexylamine, methyldicyclohexylamine, methyldiheptylamine, methyldioctylamine, methyldinonylamine, methyldidecylamine, ethyldibutylamine, ethyldipentylamine, ethyldihexylamine, ethyldiheptylamine, ethyldioctylamine, ethyldinonyl Amine, ethyldidecylamine, dicyclohexylmethylamine, tris [2- (2-methoxyethoxy) ethyl] amine, triisopropanolamine, ethylenediamine, tetramethylenediamine, hexamethylenediamine, 4,4′-diamino-1,2- Examples thereof include diphenylethane, 4,4′-diamino-3,3′-dimethyldiphenylmethane, and 4,4′-diamino-3,3′-diethyldiphenylmethane. Propyl aniline, and more preferably include include 2,6-diisopropylaniline.

Examples of the compound represented by the formula (C2) include piperazine.
Examples of the compound represented by the formula (C3) include morpholine.
Examples of the compound represented by the formula (C4) include piperidine and hindered amine compounds having a piperidine skeleton described in JP-A No. 11-52575.
Examples of the compound represented by the formula (C5) include 2,2′-methylenebisaniline.
Examples of the compound represented by the formula (C6) include imidazole and 4-methylimidazole.
Examples of the compound represented by the formula (C7) include pyridine and 4-methylpyridine.
Examples of the compound represented by the formula (C8) include 1,2-di (2-pyridyl) ethane, 1,2-di (4-pyridyl) ethane, 1,2-di (2-pyridyl) ethene, 1, 2-di (4-pyridyl) ethene, 1,3-di (4-pyridyl) propane, 1,2-di (4-pyridyloxy) ethane, di (2-pyridyl) ketone, 4,4′-dipyridyl sulfide 4,4′-dipyridyl disulfide, 2,2′-dipyridylamine, 2,2′-dipiconylamine, bipyridine and the like.

  As ammonium salts, tetramethylammonium hydroxide, tetraisopropylammonium hydroxide, tetrabutylammonium hydroxide, tetrahexylammonium hydroxide, tetraoctylammonium hydroxide, phenyltrimethylammonium hydroxide, 3- (trifluoromethyl) phenyltrimethyl Examples include ammonium hydroxide, tetra-n-butylammonium salicylate, and choline.

<Solvent (D)>
The resist composition preferably further contains a solvent (D). The solvent (D) depends on the type and amount of the salt represented by the formula (I) and the resin (A), and in the production of a resist pattern described later, the resist composition is applied on the substrate. From the viewpoint of good coating properties, an optimum one can be selected as appropriate.

  Examples of the solvent (D) include glycol ether esters such as ethyl cellosolve acetate, methyl cellosolve acetate and propylene glycol monomethyl ether acetate; glycol ethers such as propylene glycol monomethyl ether; ethyl lactate, butyl acetate, amyl acetate and Examples thereof include esters such as ethyl pyruvate; ketones such as acetone, methyl isobutyl ketone, 2-heptanone and cyclohexanone; cyclic esters such as γ-butyrolactone. A solvent (D) may be used individually by 1 type, and may use 2 or more types together.

<Other ingredients>
The resist composition comprises an acid generator and a resin (A) containing a salt represented by the formula (I), preferably an acid generator containing a salt represented by the formula (I), a resin (A) and a necessary The basic compound (C) and the solvent (D) used according to the above are contained, but other components may be contained. This component is referred to as “component (F)”. Such component (F) is an additive widely used in the present technical field, such as a sensitizer, a dissolution inhibitor, a surfactant, a stabilizer, and a dye.

<Preparation method of the present resist composition>
Then, the preparation method of this resist composition is demonstrated.
This resist composition is prepared by mixing an acid generator containing a salt represented by the formula (I), a resin (A), and a solvent (D).
Or
It can prepare by mixing the acid generator containing the salt represented by Formula (I), resin (A), basic compound (C), and solvent (D). Moreover, a component (F) may be mixed as needed. In such mixing, the mixing order is arbitrary and is not particularly limited. The temperature at the time of mixing can select the suitable temperature range from the range of 10-40 degreeC according to the solubility with respect to solvent (D), such as a kind (resin (A)), such as resin (A). An appropriate mixing time can be selected from 0.5 to 24 hours depending on the mixing temperature. The mixing means is not particularly limited, and stirring and mixing can be used.

  The content ratio of the acid generator in the resist composition is preferably 40% by mass or less, more preferably 35% by mass or less, and preferably 1% by mass or more, more preferably based on the solid content of the resist composition. Is 3% by mass or more. In addition, solid content here means the sum total of what remove | excluded the solvent (D) from this resist composition. The solid content can be determined by subjecting the resist composition to analysis such as liquid chromatography and gas chromatography.

  The content of the salt represented by the formula (I) is preferably 10 parts by mass or more, more preferably 30 parts by mass or more with respect to 100 parts by mass of the total amount of the acid generator. In the present resist composition, only a salt substantially represented by the formula (I) can be used as an acid generator. The acid generator (B) is preferable as the acid generator other than the salt represented by the formula (I).

  A preferable range of the content ratio of the resin (A) in the resist composition is determined based on the solid content of the resist composition. Specifically, the resin (A) is preferably 80% by mass or more based on the mass of the solid content.

  When the basic compound (C) is contained in the resist composition, the content ratio is preferably about 0.01 to 5% by mass with respect to the solid content of the resist composition, more preferably 0.8. It is about 01 to 3% by mass, particularly preferably about 0.01 to 1% by mass.

  The content ratio of the solvent (D) in the present resist composition is 90% by mass or more, preferably 92% by mass or more, more preferably 94% by mass or more, based on the total mass of the present resist composition. 0.9 mass% or less, preferably 99 mass% or less.

  When the resist composition contains the component (F), an appropriate content can be determined according to the type of the component (F).

  Thus, each of the acid generator containing the salt represented by the formula (I) and the resin (A) and the basic compound (C), the solvent (D) or the component (F) used as necessary is preferable. After mixing by content, this resist composition can be prepared by filtering using a filter having a pore size of about 0.003 to 0.2 μm.

<Method for producing resist pattern>
Specifically showing a method for producing a resist pattern using the present resist composition,
(1) a step of applying the resist composition on a substrate;
(2) The process of drying the composition after application | coating and forming a composition layer,
(3) a step of exposing the composition layer,
Examples of the method include (4) a step of heating the composition layer after exposure, and (5) a step of developing the composition layer after heating. Hereinafter, each of the steps shown here is referred to as “step (1)” to “step (5)”.

  Application of the resist composition on the substrate in the step (1) can be performed by a coating apparatus widely used for applying a resist material for semiconductor microfabrication, such as a spin coater. Thus, a coating film made of a resist composition is formed on the substrate. The film thickness of the coating film can be adjusted by variously adjusting the conditions (coating conditions) of the coating apparatus, and by applying an appropriate preliminary experiment, the coating film can be applied to have a desired film thickness. You can choose the conditions. Various substrates to be subjected to microfabrication can be selected as the substrate before applying the resist composition. The substrate may be washed or an antireflection film may be formed before applying the resist composition. For example, a commercially available composition for an organic antireflection film can be used for forming the antireflection film.

In the step (2), the solvent [solvent (D)] is removed from the resist composition coated on the substrate, that is, the coated film. Such solvent removal is performed by evaporating the solvent from the coating film by, for example, heating means using a heating device such as a hot plate (so-called pre-baking), decompressing means using a decompressing device, or a combination of these means. Is done. The conditions for the heating means and the decompression means can be selected according to the type of the solvent (D) contained in the resist composition. For example, in the case of a hot plate, the surface temperature of the hot plate is in the range of about 50 to 200 ° C. It is preferable to do. In the decompression means, after the substrate on which the coating film is formed is sealed in an appropriate decompressor, the internal pressure of the decompressor may be set to about 1 to 1.0 × 10 ⁵ Pa. Thus, the composition layer is formed on the substrate by removing the solvent from the coating film.

Step (3) is a step of exposing the composition layer, and preferably the composition layer is exposed using an exposure machine. At this time, exposure is performed through a mask (photomask) on which a desired pattern to be finely processed is formed. As an exposure light source of the exposure machine, an ultraviolet light source such as a KrF excimer laser (wavelength 248 nm), an ArF excimer laser (wavelength 193 nm), an F ₂ excimer laser (wavelength 157 nm), or a solid-state laser light source (YAG In addition, various lasers such as a laser beam from a laser beam from a semiconductor laser or the like to emit a harmonic laser beam in the far ultraviolet region or the vacuum ultraviolet region can be used. The exposure machine may be an immersion exposure machine. The exposure machine may irradiate an electron beam or extreme ultraviolet light (EUV).
As described above, by exposing through a mask, an exposed portion (exposed portion) and an unexposed portion (unexposed portion) are generated in the composition layer. In the composition layer of the exposed portion, the salt (I) and the acid generator (B) contained in the composition layer generate an acid upon receiving exposure energy, and further, by the action with the generated acid, “insoluble in an alkaline aqueous solution”. Alternatively, the acid labile group in the resin (A) of the resin which is hardly soluble and becomes soluble in an alkaline aqueous solution by the action of an acid generates a hydrophilic group by a deprotection reaction. As a result, the composition layer of the exposed portion The resin (A) in the above is soluble in an alkaline aqueous solution. On the other hand, since the exposure energy is not received in the unexposed area, the resin (A) remains insoluble or hardly soluble in the alkaline aqueous solution. Thus, since the composition layer in the exposed part and the composition layer in the unexposed part are remarkably different in solubility in the alkaline aqueous solution, a resist pattern can be formed by development with the alkaline aqueous solution.

  In the step (4), a heat treatment (so-called post-exposure baking) for further promoting the progress of the deprotecting group reaction that may occur in the exposed portion is performed. Such heat treatment is preferably the heating means using the hot plate shown in the step (2). In addition, when performing hot plate heating in a process (4), about 50-200 degreeC is preferable and the surface temperature of this hot plate has more preferable about 70-150 degreeC. The deprotection reaction is promoted by the heat treatment.

Step (5) is a step of developing the heated composition layer, and preferably the heated composition layer is developed with a developing device. The term “development” as used herein refers to removing the composition layer in the exposed area by dissolving it in the aqueous alkali solution by bringing the heated composition layer into contact with the aqueous alkali solution. Since the unexposed portion is insoluble or hardly soluble in the alkaline aqueous solution as described above, it remains on the substrate, and a resist pattern is produced on the substrate.
As the alkaline aqueous solution, those known in this technical field called “alkaline developer” can be used. Examples of the alkaline aqueous solution include an aqueous solution of tetramethylammonium hydroxide and an aqueous solution of (2-hydroxyethyl) trimethylammonium hydroxide (commonly called choline).

  After the development, it is preferable to perform a rinsing treatment with ultrapure water or the like, and to further remove water remaining on the substrate and the resist pattern.

  According to the resist pattern manufacturing method including the steps (1) to (5) as described above, a resist pattern can be manufactured with excellent CD uniformity due to the effect of the present resist composition.

<Application>
This resist composition is suitable as a resist composition for KrF excimer laser exposure, a resist composition for ArF excimer laser exposure, a resist composition for electron beam (EB) irradiation, or a resist composition for an EUV exposure machine. .

Hereinafter, the present invention will be described in detail by way of examples.
In Examples and Comparative Examples, “%” and “part” representing the content and the amount used are based on mass unless otherwise specified.
The weight average molecular weight is a value obtained by gel permeation chromatography (HLC-8120GPC, manufactured by Tosoh Corporation, three columns are “TSKgel Multipore HXL-M”, and the solvent is tetrahydrofuran) using polystyrene as a standard product.
Column: TSKgel Multipore H _XL -M x 3 + guardcolumn (manufactured by Tosoh Corporation)
Eluent: Tetrahydrofuran Flow rate: 1.0 mL / min
Detector: RI detector Column temperature: 40 ° C
Injection volume: 100 μl
Molecular weight standard: Standard polystyrene (manufactured by Tosoh Corporation)

  The structure of the compound was confirmed by measuring the molecular peak using mass spectrometry (LC is model 1100 manufactured by Agilent, and MASS is LC / MSD manufactured by Agilent). In the following examples, the value of this molecular peak is indicated by “MASS”.

式（Ｉ１−ａ）で表される化合物１０．００部、式（Ｉ１−ｂ）で表される化合物９．８１部及びモノクロロベンゼン８０．００部を仕込み、１３５℃で２２時間攪拌還流した。得られた反応混合物を、２３℃まで冷却した後、上澄液を除去し、回収された残渣に、クロロホルム１００部、アセトニトリル１０部及びイオン交換水３０部を仕込み、２３℃で３０分間攪拌した。その後、静置し、分液して有機層を得た。得られた有機層にイオン交換水３０部を仕込み、２３℃で３０分間攪拌した後、静置、分液することで有機層を回収するという水洗操作を６回繰り返した。水洗後の有機層を濃縮した後、得られた濃縮物に、ｔｅｒｔ−ブチルメチルエーテル６０部を加えて攪拌した。得られた上澄液を除去し、濃縮した。得られた濃縮物をアセトニトリルに溶解した後、濃縮することにより、式（Ｉ―１）で表される塩１５．４２部を得た。
ＭＡＳＳ（ＥＳＩ（＋）Ｓｐｅｃｔｒｕｍ）：Ｍ^＋ ２６３．１
ＭＡＳＳ（ＥＳＩ（−）Ｓｐｅｃｔｒｕｍ）：Ｍ⁻ ４４８．０ Example 1: Synthesis of salt (I) represented by formula (I1)

10.00 parts of the compound represented by the formula (I1-a), 9.81 parts of the compound represented by the formula (I1-b), and 80.00 parts of monochlorobenzene were charged, and the mixture was stirred and refluxed at 135 ° C. for 22 hours. The resulting reaction mixture was cooled to 23 ° C, the supernatant was removed, and the recovered residue was charged with 100 parts of chloroform, 10 parts of acetonitrile and 30 parts of ion-exchanged water, and stirred at 23 ° C for 30 minutes. . Then, it left still and liquid-separated and obtained the organic layer. The organic layer thus obtained was charged with 30 parts of ion-exchanged water, stirred at 23 ° C. for 30 minutes, then allowed to stand and separated, and the water washing operation of recovering the organic layer was repeated 6 times. After the organic layer after washing with water was concentrated, 60 parts of tert-butyl methyl ether was added to the resulting concentrate and stirred. The resulting supernatant was removed and concentrated. The obtained concentrate was dissolved in acetonitrile and then concentrated to obtain 15.42 parts of the salt represented by the formula (I-1).
MASS (ESI (+) Spectrum): M ⁺ 263.1
MASS (ESI (−) Spectrum): M ⁻ 448.0

式（ａ４−１−７−ｂ）で表される化合物８８．００部、メチルイソブチルケトン６１６．００部及びピリジン６０．９８部を、２３℃で３０分間攪拌混合し、０℃まで冷却した。同温度を保持したまま、得られた混合物に、式（ａ４−１−７−ａ）で表される化合物１９９．１７部を、１時間かけて添加した後、更に、１０℃程度まで温度を上げ、同温度で１時間攪拌した。得られた反応物に、ｎ−へプタン１４４６．２２部及び２％塩酸水溶液７０３．４１部を加え、２３℃で３０分間攪拌した。静置、分液することにより回収された有機層に、２％塩酸水溶液３３７．６４部を仕込み、２３℃で３０分間攪拌した。静置、分液することにより有機層を回収した。回収された有機層に、イオン交換水３６１．５６部を仕込み２３℃で３０分間攪拌し、静置、分液することにより有機層を水洗した。回収された有機層に、１０％炭酸カリウム水溶液４４３．９２部を仕込み、２３℃で３０分間攪拌し、静置、分液することにより有機層を回収した。このような洗浄操作を２回繰り返した。回収された有機層に、イオン交換水３６１．５６部を仕込み、２３℃で３０分間攪拌、静置した後、分液することにより有機層を水洗した。このような水洗操作を５回繰り返した。回収された有機層を濃縮し式（ａ４−１−７）で表される化合物１６３．６５部を得た。
ＭＡＳＳ：２７６．０ Synthesis Example 1: Synthesis of compound represented by formula (a4-1-7)

88.00 parts of the compound represented by the formula (a4-1-7-b), 616.00 parts of methyl isobutyl ketone and 60.98 parts of pyridine were stirred and mixed at 23 ° C. for 30 minutes and cooled to 0 ° C. While maintaining the same temperature, 199.17 parts of the compound represented by the formula (a4-1-7-a) was added to the obtained mixture over 1 hour, and the temperature was further increased to about 10 ° C. And stirred at the same temperature for 1 hour. To the resultant reaction product, 1446.22 parts of n-heptane and 703.41 parts of 2% aqueous hydrochloric acid were added, and the mixture was stirred at 23 ° C. for 30 minutes. The organic layer recovered by standing and liquid separation was charged with 337.64 parts of 2% aqueous hydrochloric acid and stirred at 23 ° C. for 30 minutes. The organic layer was recovered by standing and liquid separation. To the recovered organic layer, 361.56 parts of ion-exchanged water was charged, stirred at 23 ° C. for 30 minutes, allowed to stand, and separated to wash the organic layer with water. The recovered organic layer was charged with 443.92 parts of 10% aqueous potassium carbonate solution, stirred at 23 ° C. for 30 minutes, allowed to stand, and separated to recover the organic layer. Such washing operation was repeated twice. 361.56 parts of ion-exchanged water was added to the collected organic layer, stirred and left at 23 ° C. for 30 minutes, and then separated to wash the organic layer with water. Such washing operation was repeated 5 times. The collected organic layer was concentrated to obtain 163.65 parts of a compound represented by the formula (a4-1-7).
MASS: 276.0

以下、これらの化合物をその式番号に応じて、「モノマー（ａ１−１−２）」などという。 Synthesis of Resin (A) The compounds used for the synthesis of resin (A) are shown below.

Hereinafter, these compounds are referred to as “monomer (a1-1-2)” or the like according to the formula number.

Synthesis Example 2 [Synthesis of Resin A1]
As the monomer, using monomer (a1-1-2), monomer (a1-2-3), monomer (a2-1-1), monomer (a3-1-1) and monomer (a3-2-3), The molar ratio (monomer (a1-1-2): monomer (a1-2-3): monomer (a2-1-1): monomer (a3-1-1): monomer (a3-2-3)) It mixed so that it might be set to 30: 14: 6: 30: 20, and 1.5 mass times dioxane of the total monomer amount was added, and it was set as the solution. 1 mol% and 3 mol% of azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) as initiators are added to the solution, respectively, with respect to the total monomer amount, and these are heated at 75 ° C. for about 5 hours. did. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered. The resin thus obtained is again dissolved in dioxane, and a solution obtained by pouring the solution into a methanol / water mixed solvent is precipitated twice, and the resin is filtered twice to perform a reprecipitation operation twice. 2 × 10 ³ resin A1 (copolymer) was obtained with a yield of 78%. This resin A1 has the following structural units.

Synthesis Example 3 [Synthesis of Resin A2]
As the monomer, monomer (a1-1-2), monomer (a2-1-1) and monomer (a3-1-1) were used, and the molar ratio (monomer (a1-1-2): monomer (a2-1) -1): The monomer (a3-1-1)) was mixed so as to be 50:25:25, and 1.5 mass times dioxane of the total monomer amount was added to prepare a solution. 1 mol% and 3 mol% of azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) as initiators are added to the solution, respectively, based on the total monomer amount, and these are heated at 80 ° C. for about 8 hours. did. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered. The resin thus obtained was dissolved again in dioxane, and the resulting solution was poured into a methanol / water mixed solvent to precipitate the resin, followed by two reprecipitation operations of filtering the resin, and a weight average molecular weight of 9. 2 × 10 ³ resin A2 (copolymer) was obtained with a yield of 60%. This resin A2 has the following structural units.

Synthesis Example 4 [Synthesis of Resin A3]
As the monomer, using monomer (a1-1-2), monomer (a1-2-9), monomer (a2-1-1), monomer (a3-1-1) and monomer (a3-2-3), The molar ratio (monomer (a1-1-2): monomer (a1-2-9): monomer (a2-1-1): monomer (a3-1-1): monomer (a3-2-3)) , 30: 14: 6: 20: 30, and 1.5 mass times dioxane of the total monomer amount was added to make a solution. To this solution, 1 mol% and 3 mol% of azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) as initiators were added to the total monomer amount, respectively, and these were heated at 75 ° C. for about 5 hours. did. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered. The obtained resin was again dissolved in dioxane, and a solution obtained by pouring the solution into a methanol / water mixed solvent was precipitated, and the resin was filtered twice. The weight-average molecular weight was 8.4. × give 10 ³ of copolymer in 85% yield. This copolymer has the following structural units and is designated as resin A3.

Synthesis Example 5 [Synthesis of Resin A4]
As the monomer, using monomer (a1-1-2), monomer (a1-2-9), monomer (a2-1-3), monomer (a3-1-1) and monomer (a3-2-3), The molar ratio (monomer (a1-1-2): monomer (a1-2-9): monomer (a2-1-3): monomer (a3-1-1): monomer (a3-2-3)) , 35: 15: 3: 27: 20, and 1.5 mass times dioxane of the total monomer amount was added to obtain a solution. To this solution, 1 mol% and 3 mol% of azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile) as initiators were added to the total monomer amount, respectively, and these were heated at 75 ° C. for about 5 hours. did. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered. The obtained resin was again dissolved in dioxane, and the resulting solution was poured into a methanol / water mixed solvent to precipitate the resin, followed by two reprecipitation operations of filtering the resin, and a weight average molecular weight of 7.8. × give 10 ³ of copolymer in 81% yield. This copolymer has the following structural units and is designated as resin A4.

Synthesis Example 6 [Synthesis of Resin X1]
Monomer (a4-1-7) was used as a monomer, and 1.5 mass times dioxane of the total monomer amount was added to prepare a solution. To this solution, 0.7 mol% and 2.1 mol% of azobisisobutyronitrile and azobis (2,4-dimethylvaleronitrile), respectively, as initiators were added with respect to the total monomer amount, and these were added at 75 ° C. Heated for about 5 hours. The obtained reaction mixture was poured into a large amount of methanol / water mixed solvent to precipitate the resin, and this resin was filtered. The obtained resin was again dissolved in dioxane, and the resulting solution was poured into a methanol / water mixed solvent to precipitate the resin, followed by two reprecipitation operations of filtering the resin, and a weight average molecular weight of 1.8. A copolymer of × 10 ⁴ was obtained with a yield of 77%. This copolymer has the following structural units, and is designated as resin X1.

Examples 2 to 4 (Preparation / Evaluation of the Resist Composition) and Comparative Example The following components shown in Table 4 were mixed and dissolved in the following solvents, and further filtered through a fluororesin filter having a pore size of 0.2 μm. Thus, a resist solution was prepared.

Ｂ２：

＜樹脂（Ａ）＞
Ａ１：樹脂Ａ１
Ａ２：樹脂Ａ２
Ａ３：樹脂Ａ３
Ａ４：樹脂Ａ４
Ｘ１：樹脂Ｘ１
＜塩基性化合物（Ｃ）：クエンチャー＞
Ｃ１：２，６−ジイソプロピルアニリン
＜溶剤＞
プロピレングリコールモノメチルエーテルアセテート ２６５．０部
プロピレングリコールモノメチルエーテル ２０．０部
２−ヘプタノン ２０．０部
γ−ブチロラクトン ３．５部 <Acid generator>
I1: Salt B1: represented by formula (I1)

B2:

<Resin (A)>
A1: Resin A1
A2: Resin A2
A3: Resin A3
A4: Resin A4
X1: Resin X1
<Basic compound (C): quencher>
C1: 2,6-Diisopropylaniline <Solvent>
Propylene glycol monomethyl ether acetate 265.0 parts Propylene glycol monomethyl ether 20.0 parts 2-heptanone 20.0 parts γ-butyrolactone 3.5 parts

<Manufacture of resist pattern and its evaluation>
An organic antireflective coating composition [ARC-29; manufactured by Nissan Chemical Industries, Ltd.] was applied onto a 12-inch silicon wafer and baked at 205 ° C. for 60 seconds to obtain a thickness of 78 nm. An organic antireflection film was formed. On the organic antireflection film, the resist composition was spin-coated so that the film thickness after drying (pre-baking) was 85 nm.
The obtained silicon wafer was pre-baked (PB) for 60 seconds at a temperature described in the “PB” column of Table 4 on a direct hot plate to form a composition layer.
On the wafer on which the composition layer (resist composition film) was formed, using an ArF excimer laser stepper for immersion exposure [XT: 1900 Gi; manufactured by ASML, NA = 1.35, 3/4 Annular XY polarized light] The line and space pattern was subjected to immersion exposure by changing the exposure amount stepwise. Note that ultrapure water was used as the immersion medium.
After the exposure, post-exposure baking (PEB) was performed for 60 seconds on a hot plate at the temperature described in the “PEB” column of Table 4, and then with an aqueous 2.38 mass% tetramethylammonium hydroxide solution for 60 seconds. Paddle development was performed to obtain a resist pattern.

In forming a resist pattern from each resist composition, the exposure amount at which the line width of a 50 nm line-and-space pattern was 1: 1 was defined as effective sensitivity.
The following items were evaluated for the obtained resist pattern.

<Line edge roughness evaluation (LER)>
The wall surface of the resist pattern obtained with effective sensitivity is observed with a scanning electron microscope, and the unevenness fluctuation width (LER) of the side wall of the resist pattern is
○ that is 4.5 nm or less,
What exceeded 4.5 nm was set as x.
The result of the line edge roughness evaluation (LER) obtained as described above was expressed by the above-mentioned level evaluation, and the LER (nm) was indicated by a numerical value in parentheses. The results are shown in Table 5.

  If the resist composition of the present invention is used, a resist pattern can be produced with excellent line edge roughness, which is useful for fine processing of semiconductors.

Claims (7)

A salt represented by the formula (I).

[In the formula (I),
Q ^{1, Q} 2, ^{Q 3} and ^{Q 4} represent the full Tsu MotoHara child.
L ¹ and L ² each independently represent a group represented by the formula (b1-1).

(In the formula (b1-1),
L ^b2 represents —CH ₂ — .
* Is a bond, and * on the left side represents a bond with a carbon atom of —C (Q ¹ ) (Q ² ) — or —C (Q ³ ) (Q ⁴ ) —. )
R ¹ represents an alkyl group having 1 to 3 carbon atoms.
R ² represents a hydroxyalkyl group having 1 to 6 carbon atoms.
Z ^{a +} and Z ^{b +} each independently represent an organic counter ion. ] The salt according to claim 1, wherein R ^{2 in the} formula (I) is a hydroxymethyl group. The salt according to claim 1 or 2, wherein Z ^{a +} and Z ^{b +} in the formula (I) are each independently an arylsulfonium cation.   The acid generator which contains the salt in any one of Claims 1-3 as an active ingredient.   A resist composition comprising the acid generator according to claim 4 and a resin that is insoluble or hardly soluble in an alkaline aqueous solution and is soluble in an alkaline aqueous solution by the action of an acid.   Furthermore, the resist composition of Claim 5 containing a basic compound. (1) A step of applying the resist composition according to claim 5 or 6 on a substrate,
(2) A step of drying the composition after application to form a composition layer,
(3) a step of exposing the composition layer using an exposure machine;
(4) A method for producing a resist pattern, comprising a step of heating the composition layer after exposure, and (5) a step of developing the composition layer after heating.