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JP6060722B2 - Electronic components - Google Patents

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Publication number
JP6060722B2
JP6060722B2 JP2013032491A JP2013032491A JP6060722B2 JP 6060722 B2 JP6060722 B2 JP 6060722B2 JP 2013032491 A JP2013032491 A JP 2013032491A JP 2013032491 A JP2013032491 A JP 2013032491A JP 6060722 B2 JP6060722 B2 JP 6060722B2
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substrate
conductive member
facing
external wiring
remote
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JP2014165215A (en
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勝呂 肇
肇 勝呂
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Denso Corp
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Denso Corp
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  • Structures For Mounting Electric Components On Printed Circuit Boards (AREA)

Description

本発明は、電子基板と多層基板とが導電部材によって電気的、及び、機械的に接続された電子部品に関するものである。   The present invention relates to an electronic component in which an electronic board and a multilayer board are electrically and mechanically connected by a conductive member.

従来、例えば特許文献1に示されるように、凹型バイアホールが設けられた複数の実装用パッドを有し、複数の半田ボールを介して表面実装デバイスが実装されるプリント基板が提案されている。このプリント基板では、以下に示す製造方法を経ることで、表面実装デバイスがプリント基板に実装される。先ず、実装用パッドにクリーム半田をスクリーン印刷する。次に、クリーム半田上に半田ボールを介して表面実装デバイスを載置する。最後に、加熱によるリフロー処理により、プリント基板を、クリーム半田が溶ける温度まで加熱する。これにより、表面実装デバイスが、半田ボール、クリーム半田の溶融によってプリント基板上の実装用パッドに接合され、プリント基板に実装される。   Conventionally, for example, as shown in Patent Document 1, a printed circuit board having a plurality of mounting pads provided with concave via holes and on which a surface-mounted device is mounted via a plurality of solder balls has been proposed. In this printed circuit board, the surface mounting device is mounted on the printed circuit board through the manufacturing method described below. First, cream solder is screen-printed on a mounting pad. Next, a surface mount device is mounted on the cream solder via a solder ball. Finally, the printed circuit board is heated to a temperature at which cream solder melts by a reflow process by heating. Thus, the surface mounting device is bonded to the mounting pad on the printed circuit board by melting the solder balls and cream solder, and mounted on the printed circuit board.

特開2009−218435号公報JP 2009-218435 A

ところで、特許文献1に示されるプリント基板では、凹型バイアホールの深さが、実装用パッドの厚さよりも深くなっている。そのため、凹型バイアホール内の空気が、気泡として、溶融させたクリーム半田と半田ボール(以下、半田ペーストと示す)に含まれる虞がある。半田ペーストに気泡が含まれたままで、半田ペーストが固化すると、局所的に強度の低い箇所が半田ボールや半田ペーストに形成される。そのため、プリント基板と表面実装デバイスとの電気的、及び、機械的な接続信頼性が低下する虞がある。   By the way, in the printed circuit board shown in Patent Document 1, the depth of the concave via hole is deeper than the thickness of the mounting pad. Therefore, there is a possibility that air in the concave via hole is contained as bubbles in melted cream solder and solder balls (hereinafter referred to as solder paste). When the solder paste is solidified while air bubbles are contained in the solder paste, locally low strength portions are formed in the solder balls and the solder paste. Therefore, there is a possibility that the electrical and mechanical connection reliability between the printed circuit board and the surface mount device is lowered.

そこで、本発明は上記問題点に鑑み、電気的、及び、機械的な接続信頼性の低下が抑制された電子部品を提供することを目的とする。   In view of the above problems, an object of the present invention is to provide an electronic component in which a decrease in electrical and mechanical connection reliability is suppressed.

上記した目的を達成するために、本発明は、電子基板(10)と、電子基板が搭載される多層基板(30)と、電子基板と多層基板とを電気的、及び、機械的に接続する導電部材(50)と、を有する電子部品であって、電子基板は、基板(11)と、基板における多層基板との対向面(11a)に形成された電極(12)と、を有し、多層基板は、絶縁層(31)と、該絶縁層の内部に形成された内部配線(32)と、絶縁層の外部に形成された外部配線(33)と、内部配線と外部配線とを接続するビア(34)と、を有し、導電部材は、導電ペーストに含まれる溶剤が気化して成り、電極と外部配線とが、導電部材を介して電気的、及び、機械的に接続され、外部配線には、導電部材の厚さを確保するために、局所的に凹んだ凹み部(35)がビアに対向する位置に形成され、凹み部には、導電部材の一部が設けられており、基板の対向面に直交する厚さ方向において、凹み部の深さ(T2)は、外部配線の厚さ(T1)よりも浅いことを特徴とする。 In order to achieve the above object, the present invention electrically and mechanically connects an electronic substrate (10), a multilayer substrate (30) on which the electronic substrate is mounted, and the electronic substrate and the multilayer substrate. An electronic component having a conductive member (50), the electronic substrate having a substrate (11) and an electrode (12) formed on a surface (11a) of the substrate facing the multilayer substrate; The multilayer substrate connects the insulating layer (31), the internal wiring (32) formed inside the insulating layer, the external wiring (33) formed outside the insulating layer, and the internal wiring and the external wiring. The conductive member is formed by vaporization of the solvent contained in the conductive paste, and the electrode and the external wiring are electrically and mechanically connected via the conductive member, In the external wiring, in order to secure the thickness of the conductive member, locally recessed dents ( 5) is formed in a position opposed to the via, the recessed portion, a portion of the conductive member is provided, in a thickness direction perpendicular to the opposing surface of the substrate, the depth of the recessed portion (T2) is It is characterized by being shallower than the thickness (T1) of the external wiring.

このように本発明によれば、厚さ方向において、凹み部(35)の深さ(T2)は、外部配線(33)の厚さ(T1)よりも浅く(短く)なっている。これによれば、凹み部の深さが、外部配線の厚さよりも深い(長い)構成と比べて、導電部材(50)に気泡が含まれ難くなる。また、本発明では、導電部材(50)として導電ペーストを用いている。これによれば、導電部材(50)として導電ペーストと半田ボールが用いられる構成と比べて、凹み部(35)の外に設けられる導電部材(50)の量が少なくなる。そのため、導電部材(50)に気泡が含まれ難くなる。以上により、導電部材(50)に局所的に強度の低い箇所が形成されることが抑制され、電子基板(10)と多層基板(30)との電気的、及び、機械的な接続信頼性が低下するこが抑制される。   Thus, according to the present invention, in the thickness direction, the depth (T2) of the recess (35) is shallower (shorter) than the thickness (T1) of the external wiring (33). According to this, bubbles are less likely to be included in the conductive member (50) compared to a configuration in which the depth of the recess is deeper (longer) than the thickness of the external wiring. In the present invention, a conductive paste is used as the conductive member (50). According to this, the amount of the conductive member (50) provided outside the recess (35) is reduced as compared with the configuration in which the conductive paste and the solder balls are used as the conductive member (50). Therefore, it becomes difficult for bubbles to be contained in the conductive member (50). As a result, the formation of locally low strength portions on the conductive member (50) is suppressed, and electrical and mechanical connection reliability between the electronic substrate (10) and the multilayer substrate (30) is improved. Decrease is suppressed.

更に言えば、凹み部の深さが、外部配線の厚さよりも深い(長い)構成とは異なり、ビア(34)の配置位置に依存せずに、凹み部(35)を外部配線(33)に形成することができる。また、ビア(34)の個数に依らずに、凹み部(35)の数を決定することができる。なお、凹み部(35)の深さとは、凹み部(35)の開口端から底までの距離である。   Furthermore, unlike the configuration in which the depth of the recess is deeper (longer) than the thickness of the external wiring, the recess (35) is connected to the external wiring (33) without depending on the arrangement position of the via (34). Can be formed. In addition, the number of recesses (35) can be determined without depending on the number of vias (34). The depth of the recess (35) is the distance from the open end of the recess (35) to the bottom.

第1実施形態に係る電子部品の概略構成を示す上面図である。It is a top view which shows schematic structure of the electronic component which concerns on 1st Embodiment. 図1のII−II線に沿う断面図である。It is sectional drawing which follows the II-II line | wire of FIG. 図1のIII−III線に沿う断面図である。It is sectional drawing which follows the III-III line of FIG. 凹み部の深さを説明するための拡大断面図である。It is an expanded sectional view for demonstrating the depth of a dent part. 凹み部の別形態を示す拡大断面図である。It is an expanded sectional view which shows another form of a dent part. 電子部品の変形例を示す断面図である。It is sectional drawing which shows the modification of an electronic component. 電子部品の変形例を示す断面図である。It is sectional drawing which shows the modification of an electronic component. 電子部品の変形例を示す断面図である。It is sectional drawing which shows the modification of an electronic component. 電子部品の変形例を示す断面図である。It is sectional drawing which shows the modification of an electronic component. 電子部品の変形例を示す断面図である。It is sectional drawing which shows the modification of an electronic component. 電子部品の変形例を示す断面図である。It is sectional drawing which shows the modification of an electronic component.

以下、本発明の実施の形態を図に基づいて説明する。
(第1実施形態)
図1〜図5に基づいて、本実施形態に係る電子部品を説明する。なお、図1では、導電部材50を省略し、電子基板10によって隠れた部位を破線で示している。以下においては、互いに直交の関係にある3方向を、x方向、y方向、及び、z方向と示す。z方向が、特許請求の範囲に記載の厚さ方向に相当し、x方向とy方向とによって規定されるx−y平面に平行な方向が、特許請求の範囲に記載の平面方向に相当する。
Hereinafter, embodiments of the present invention will be described with reference to the drawings.
(First embodiment)
The electronic component according to the present embodiment will be described with reference to FIGS. In FIG. 1, the conductive member 50 is omitted, and a portion hidden by the electronic substrate 10 is indicated by a broken line. In the following, three directions that are orthogonal to each other are referred to as an x direction, a y direction, and a z direction. The z direction corresponds to the thickness direction described in the claims, and the direction parallel to the xy plane defined by the x direction and the y direction corresponds to the plane direction described in the claims. .

図1〜図3に示すように、電子部品100は、電子基板10と、多層基板30と、導電部材50と、を有する。多層基板30に電子基板10が搭載され、電子基板10と多層基板30とが、導電部材50を介して電気的、及び、機械的に接続されている。   As shown in FIGS. 1 to 3, the electronic component 100 includes an electronic substrate 10, a multilayer substrate 30, and a conductive member 50. The electronic substrate 10 is mounted on the multilayer substrate 30, and the electronic substrate 10 and the multilayer substrate 30 are electrically and mechanically connected via the conductive member 50.

電子基板10は、基板11と、基板11に形成された電極12と、を有する。基板11は直方体を成し、基板11における多層基板30との対向面11aは矩形を成している。電極12は、図2に示すように、x方向とz方向とによって規定されるx−z平面における断面形状がコの字状を成し、基板11の対向面11a,その裏面11b、及び、面11a,11b間を連結する側面11cそれぞれに形成されている。電極12における対向面11aに形成された部位が、多層基板30と対向し、両者の間に導電部材50が設けられている。   The electronic substrate 10 includes a substrate 11 and an electrode 12 formed on the substrate 11. The substrate 11 has a rectangular parallelepiped shape, and a surface 11a of the substrate 11 facing the multilayer substrate 30 has a rectangular shape. As shown in FIG. 2, the electrode 12 has a U-shaped cross section in the xz plane defined by the x direction and the z direction, and the opposing surface 11 a of the substrate 11, its back surface 11 b, and It is formed on each of the side surfaces 11c that connect the surfaces 11a and 11b. A portion of the electrode 12 formed on the facing surface 11a faces the multilayer substrate 30, and a conductive member 50 is provided between the two.

多層基板30は、絶縁層31と、絶縁層31の内部に形成された内部配線32と、絶縁層31の外部に形成された外部配線33と、配線32,33間を接続するビア34と、を有するビルドアップ基板である。外部配線33には、導電部材50の厚さを確保するために、局所的に凹んだ凹み部35が形成されている。図1に示すように、x−y平面において、凹み部35は円形を成し、図4に示すように、z方向において、凹み部35の深さT2(凹み部35の開口端から底までの距離T2)は、外部配線33の厚さT1よりも浅く(短く)なっている。また、x−y平面に平行な方向における凹み部35の幅dは、電子基板10の中心CPと後述する遠隔部位との間の距離D(図1に示す電子基板10の幅D)と正比例の関係にある。   The multilayer substrate 30 includes an insulating layer 31, an internal wiring 32 formed inside the insulating layer 31, an external wiring 33 formed outside the insulating layer 31, a via 34 connecting the wirings 32, 33, A build-up board having The external wiring 33 is formed with a recessed portion 35 that is locally recessed in order to ensure the thickness of the conductive member 50. As shown in FIG. 1, in the xy plane, the recess 35 is circular, and as shown in FIG. 4, in the z direction, the depth T2 of the recess 35 (from the opening end to the bottom of the recess 35). The distance T2) is shallower (shorter) than the thickness T1 of the external wiring 33. Further, the width d of the recess 35 in the direction parallel to the xy plane is directly proportional to the distance D (the width D of the electronic substrate 10 shown in FIG. 1) between the center CP of the electronic substrate 10 and a remote part to be described later. Are in a relationship.

遠隔部位とは、対向面11aにおける中心CPから最も離れた部位である。また、上記対向面11aは、矩形を成している。したがって、遠隔部位は、対向面11aの4隅それぞれに相当し、電子基板10の幅Dは、対向面11aの対角線の半分の長さに相当する。本実施形態では、4つの遠隔部位と同数の凹み部35が外部配線33に形成されている。そして、4つの遠隔部位の全てと、対応する凹み部35とが導電部材50を介して対向している。   The remote site is a site farthest from the center CP on the facing surface 11a. Moreover, the said opposing surface 11a has comprised the rectangle. Therefore, the remote site corresponds to each of the four corners of the facing surface 11a, and the width D of the electronic substrate 10 corresponds to half the length of the diagonal line of the facing surface 11a. In the present embodiment, the same number of recesses 35 as the four remote parts are formed in the external wiring 33. All of the four remote parts are opposed to the corresponding recesses 35 with the conductive member 50 interposed therebetween.

図1に示すように、外部配線33の外面33aは、電子基板10との対向領域と、電子基板10との非対向領域とに分けられる。図2及び図3に示すよう、外面33aの対向領域と非対向領域それぞれに導電部材50が設けられ、電極12と外部配線33とが、導電部材50を介して電気的、及び、機械的に接続されている。また、図1に示すように、外部配線33の非対向領域における凹み部35の周囲の形状が半円を成し、凹み部35の周囲が囲まれている。これにより、対向領域における遠隔部位との対向部位が、非対向領域における遠隔部位からy方向に離れた領域と隣接している。   As shown in FIG. 1, the outer surface 33 a of the external wiring 33 is divided into a region facing the electronic substrate 10 and a region not facing the electronic substrate 10. As shown in FIGS. 2 and 3, the conductive member 50 is provided in each of the opposing region and the non-opposing region of the outer surface 33 a, and the electrode 12 and the external wiring 33 are electrically and mechanically connected via the conductive member 50. It is connected. As shown in FIG. 1, the shape of the periphery of the recess 35 in the non-facing region of the external wiring 33 forms a semicircle, and the periphery of the recess 35 is surrounded. Thereby, the opposing part with the remote part in an opposing area | region is adjacent to the area | region away from the remote part in a non-opposing area | region in the y direction.

導電部材50は、導電ペーストに含まれる溶剤が気化して成る。導電ペーストを外部配線33に塗布し、導電ペースト上に電子基板10を搭載する。そして、電子基板100の全体を熱する。これにより、導電ペーストが濡れ広がり、電極12における側面11cに形成された部位も導電ペーストによって覆われる。外部配線33の一部は半円を成し、凹み部35の周囲を囲んでいる。この半円を成す部位に設けられた導電ペーストが、図3に示すように、電極12における側面11cに形成された部位に濡れ広がる。この結果、導電部材50が形成され、導電部材50を介して、電子基板10と多層基板30とが電気的、及び、機械的に接続される。   The conductive member 50 is formed by vaporizing a solvent contained in the conductive paste. A conductive paste is applied to the external wiring 33, and the electronic substrate 10 is mounted on the conductive paste. Then, the entire electronic substrate 100 is heated. As a result, the conductive paste wets and spreads, and the portion formed on the side surface 11c of the electrode 12 is also covered with the conductive paste. A part of the external wiring 33 forms a semicircle and surrounds the periphery of the recess 35. As shown in FIG. 3, the conductive paste provided in the semicircular part wets and spreads on the part formed on the side surface 11 c of the electrode 12. As a result, the conductive member 50 is formed, and the electronic substrate 10 and the multilayer substrate 30 are electrically and mechanically connected via the conductive member 50.

次に、本実施形態に係る電子部品100の作用効果を説明する。上記したように、z方向において、凹み部35の深さT2は、外部配線33の厚さT1よりも浅く(短く)なっている。これによれば、凹み部の深さが、外部配線の厚さよりも深い(長い)構成と比べて、導電部材50に気泡が含まれ難くなる。また、導電部材50として導電ペーストを用いている。これによれば、導電部材50として導電ペーストと半田ボールが用いられる構成と比べて、凹み部35の外に設けられる導電部材50の量が少なくなる。そのため、導電部材50に気泡が含まれ難くなる。以上により、導電部材50に局所的に強度の低い箇所が形成されることが抑制され、電子基板10と多層基板30との電気的、及び、機械的な接続信頼性が低下することが抑制される。   Next, functions and effects of the electronic component 100 according to the present embodiment will be described. As described above, in the z direction, the depth T2 of the recess 35 is shallower (shorter) than the thickness T1 of the external wiring 33. According to this, bubbles are less likely to be contained in the conductive member 50 as compared with a configuration in which the depth of the recess is deeper (longer) than the thickness of the external wiring. Further, a conductive paste is used as the conductive member 50. According to this, the amount of the conductive member 50 provided outside the recessed portion 35 is reduced as compared with the configuration in which the conductive paste and the solder ball are used as the conductive member 50. Therefore, it is difficult for bubbles to be contained in the conductive member 50. As a result, the formation of locally low-strength portions on the conductive member 50 is suppressed, and the electrical and mechanical connection reliability between the electronic substrate 10 and the multilayer substrate 30 is suppressed from decreasing. The

更に言えば、凹み部の深さが、外部配線の厚さよりも深い(長い)構成とは異なり、図5に示すように、ビア34の配置位置に依存せずに、凹み部35を外部配線33に形成することができる。また、ビア34の個数に依らずに、凹み部35の数を決定することができる。   Further, unlike the configuration in which the depth of the recess is deeper (longer) than the thickness of the external wiring, the recess 35 is connected to the external wiring without depending on the arrangement position of the via 34 as shown in FIG. 33 can be formed. Further, the number of the recessed portions 35 can be determined without depending on the number of the vias 34.

環境温度の変動によって、電子基板10と多層基板30の熱膨張係数差に起因する応力が、導電部材50に作用される。そして、導電部材50にて発生する応力は、中心CPから離れるにしたがって大きくなる。このため、対向面11aにおける中心CPから最も離れた遠隔部位に、最も大きな応力が発生する。これに対して、本実施形態では、最も大きな応力が発生する遠隔部位が、導電部材50を介して凹み部35と対向している。これにより、最も大きな応力が発生する遠隔部位が、凹み部35の深さの分厚くなった導電部材50によって固定される。このように、導電部材50の強度が高まっているので、導電部材50の疲弊が抑制される。これにより、電子基板10と多層基板30との電気的、及び、機械的な接続信頼性が低下することが抑制される。   A stress caused by a difference in thermal expansion coefficient between the electronic substrate 10 and the multilayer substrate 30 is applied to the conductive member 50 due to a change in environmental temperature. The stress generated in the conductive member 50 increases as the distance from the center CP increases. For this reason, the greatest stress is generated in the remote part farthest from the center CP in the facing surface 11a. On the other hand, in this embodiment, the remote site where the greatest stress is generated is opposed to the recess 35 via the conductive member 50. Thereby, the remote site where the greatest stress is generated is fixed by the conductive member 50 having a thickness corresponding to the depth of the recess 35. As described above, since the strength of the conductive member 50 is increased, fatigue of the conductive member 50 is suppressed. Thereby, it is suppressed that the electrical and mechanical connection reliability between the electronic substrate 10 and the multilayer substrate 30 is lowered.

複数の遠隔部位の全てと、対応する凹み部35とが導電部材50を介して対向している。これによれば、複数ある遠隔部位の内の一つと、対応する一つの凹み部のみとが導電部材を介して対向される構成と比べて、導電部材50が疲弊し、電子基板10と多層基板30との電気的、及び、機械的な接続信頼性が低下することが抑制される。   All of the plurality of remote parts and the corresponding recesses 35 are opposed to each other through the conductive member 50. According to this, compared with the configuration in which one of a plurality of remote parts and only one corresponding recess are opposed to each other through the conductive member, the conductive member 50 is exhausted, and the electronic substrate 10 and the multilayer substrate are It is suppressed that the electrical and mechanical connection reliability with 30 decreases.

外部配線33の非対向領域における凹み部35の周囲の形状が半円を成し、凹み部35の周囲を囲んでいる。そして、この半円を成す部位に設けられた導電ペーストが、電極12における側面11cに形成された部位に濡れ広がる。これにより、電子基板10の遠隔部位の周囲に、導電部材50が設けられ、導電部材50の強度が高まる。この結果、導電部材50の疲弊が抑制され、電子基板10と多層基板30との電気的、及び、機械的な接続信頼性が低下することが抑制される。   The shape of the periphery of the recess 35 in the non-opposing region of the external wiring 33 forms a semicircle, and surrounds the periphery of the recess 35. Then, the conductive paste provided on the semicircular portion wets and spreads on the portion of the electrode 12 formed on the side surface 11c. Thereby, the conductive member 50 is provided around the remote part of the electronic substrate 10, and the strength of the conductive member 50 is increased. As a result, exhaustion of the conductive member 50 is suppressed, and a decrease in electrical and mechanical connection reliability between the electronic substrate 10 and the multilayer substrate 30 is suppressed.

x−y平面に平行な方向における凹み部35の幅dは、電子基板10の中心CPと遠隔部位との間の距離と正比例の関係にある。電子基板10の中心CPと遠隔部位との距離、すなわち、電子基板10の幅Dが長くなると、電子基板10と多層基板30の熱膨張係数差に起因して、遠隔部位にて発生する応力が大きくなる。そこで、上記のように、凹み部35の幅dを、電子基板10の幅Dと正比例の関係にする。これにより、導電部材50の強度が向上され、電子基板10と多層基板30との連結強度が向上される。この結果、電子基板10の体格(幅D)が増大したとしても、それに応じて導電部材50の強度も高まる。これにより、導電部材50の疲弊が抑制され、電子基板10と多層基板30との電気的、及び、機械的な接続信頼性が低下することが抑制される。   The width d of the recess 35 in the direction parallel to the xy plane is directly proportional to the distance between the center CP of the electronic substrate 10 and the remote part. When the distance between the center CP of the electronic substrate 10 and the remote portion, that is, the width D of the electronic substrate 10 is increased, the stress generated at the remote portion is caused by the difference in thermal expansion coefficient between the electronic substrate 10 and the multilayer substrate 30. growing. Therefore, as described above, the width d of the recess 35 is set to be in direct proportion to the width D of the electronic substrate 10. Thereby, the strength of the conductive member 50 is improved, and the connection strength between the electronic substrate 10 and the multilayer substrate 30 is improved. As a result, even if the physique (width D) of the electronic substrate 10 increases, the strength of the conductive member 50 increases accordingly. As a result, the fatigue of the conductive member 50 is suppressed, and the electrical and mechanical connection reliability between the electronic substrate 10 and the multilayer substrate 30 is suppressed from decreasing.

以上、本発明の好ましい実施形態について説明したが、本発明は上記した実施形態になんら制限されることなく、本発明の主旨を逸脱しない範囲において、種々変形して実施することが可能である。   The preferred embodiments of the present invention have been described above. However, the present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the spirit of the present invention.

本実施形態では、x−y平面において、凹み部35は円形を成す例を示した。しかしながら、凹み部35のx−y平面における形状としては、上記例に限定されない。例えば、図6〜図9に示すように、矩形、L字状、楕円、コの字状などを採用することができる。   In the present embodiment, an example in which the recessed portion 35 is circular in the xy plane is shown. However, the shape of the recess 35 in the xy plane is not limited to the above example. For example, as shown in FIGS. 6 to 9, a rectangle, an L shape, an ellipse, a U shape, or the like can be adopted.

図7に示す、遠隔部位と対向する4つの凹み部35それぞれは、第1凹み部36と第2凹み部37とがL字を成すように連結されて成る。第1凹み部36は、対向面11aを成す2つの長辺の内の1つに沿うように外部配線33の一部が局所的に凹んだ直線形状を成す。第2凹み部37は、対向面11aを成す2つの短辺の内の1つに沿うように外部配線33の一部が局所的に凹んだ直線形状を成す。第1凹み部36と第2凹み部37との連結点が、導電部材50を介して遠隔部位と対向している。   As shown in FIG. 7, each of the four recessed portions 35 facing the remote site is formed by connecting a first recessed portion 36 and a second recessed portion 37 so as to form an L shape. The first recess 36 has a linear shape in which a part of the external wiring 33 is locally recessed so as to be along one of the two long sides forming the facing surface 11a. The second recessed portion 37 has a linear shape in which a part of the external wiring 33 is locally recessed so as to be along one of the two short sides forming the facing surface 11a. A connection point between the first dent portion 36 and the second dent portion 37 faces the remote site via the conductive member 50.

これによれば、凹み部35が、遠隔部位のみと対向する構成とは異なり、電子基板10の4辺を多層基板30に連結する導電部材50の厚さを、第1凹み部36と第2凹み部37の分、厚くすることができる。そのため、導電部材50の強度が高まり、導電部材50の疲弊が抑制される。これにより、電子基板10と多層基板30との電気的、及び、機械的な接続信頼性が低下することが抑制される。   According to this, unlike the configuration in which the recessed portion 35 faces only the remote part, the thickness of the conductive member 50 that connects the four sides of the electronic substrate 10 to the multilayer substrate 30 is set to the first recessed portion 36 and the second recessed portion 35. The thickness can be increased by the amount of the recessed portion 37. Therefore, the strength of the conductive member 50 is increased, and fatigue of the conductive member 50 is suppressed. Thereby, it is suppressed that the electrical and mechanical connection reliability between the electronic substrate 10 and the multilayer substrate 30 is lowered.

更に言えば、電子基板10と多層基板30との連結強度を、凹み部35が、一辺の長さが凹み部36,37それぞれの長さと等しい矩形を成す構成と同程度にすることができる。また、上記した比較構成と比べて、凹み部35の形状が小さいため、凹み部35の形成工程が簡素化される。この結果、製造コストが低減される。   More specifically, the connection strength between the electronic substrate 10 and the multilayer substrate 30 can be set to the same level as that of the configuration in which the recessed portion 35 forms a rectangle whose length of one side is equal to the length of each of the recessed portions 36 and 37. Moreover, since the shape of the recessed part 35 is small compared with the above-mentioned comparative structure, the formation process of the recessed part 35 is simplified. As a result, the manufacturing cost is reduced.

本実施形態では、4つの遠隔部位と同数の凹み部35が外部配線33に形成され、4つの遠隔部位の全てと、対応する凹み部35とが導電部材50を介して対向している例を示した。しかしながら、図8に示すように、遠隔部位に対応する凹み部35とは別に、凹み部35が外部配線33に形成された構成を採用することもできる。図8では、対向面11aの縁に沿う方向において隣接する2つの遠隔部位の間の中間部位が、導電部材50を介して凹み部35と対向している。   In this embodiment, the same number of recesses 35 as the four remote parts are formed in the external wiring 33, and all four remote parts are opposed to the corresponding recesses 35 via the conductive member 50. Indicated. However, as shown in FIG. 8, a configuration in which the recessed portion 35 is formed in the external wiring 33 can be adopted separately from the recessed portion 35 corresponding to the remote site. In FIG. 8, an intermediate part between two remote parts adjacent in the direction along the edge of the opposing surface 11 a faces the recess 35 via the conductive member 50.

これによれば、凹み部35が遠隔部位のみと対向する構成とは異なり、電子基板10の中間部位を多層基板30に連結する導電部材50の厚さを、中間部位と対向する凹み部35の分、厚くすることができる。電子基板10と多層基板30の熱膨張係数差に起因する応力は、遠隔部位と対向する凹み部35に設けられた導電部材50と、中間部位と対向する凹み部35に設けられた導電部材50それぞれに印加される。そのため、遠隔部位と対向する凹み部35に設けられた導電部材50に印加される応力が弱くなる。これにより、導電部材50が疲弊し、電子基板10と多層基板30との電気的、及び、機械的な接続信頼性が低下することが抑制される。なお、図8に示す構成と同程度の作用効果を奏するには、図9に示す構成を採用することができる。図9では、図8に示す遠隔部位と対向する凹み部35と中間部位と対向する凹み部35とが互いに連結された構成と成っている。   According to this, unlike the configuration in which the recessed portion 35 faces only the remote portion, the thickness of the conductive member 50 that connects the intermediate portion of the electronic substrate 10 to the multilayer substrate 30 is set to the thickness of the recessed portion 35 that faces the intermediate portion. Minutes, can be thickened. The stress caused by the difference in thermal expansion coefficient between the electronic substrate 10 and the multilayer substrate 30 is caused by the conductive member 50 provided in the recess 35 facing the remote part and the conductive member 50 provided in the recess 35 facing the intermediate part. Applied to each. Therefore, the stress applied to the conductive member 50 provided in the recess 35 facing the remote site is weakened. Thereby, it is suppressed that the conductive member 50 is exhausted and the electrical and mechanical connection reliability between the electronic substrate 10 and the multilayer substrate 30 is reduced. Note that the configuration shown in FIG. 9 can be employed to achieve the same effects as the configuration shown in FIG. In FIG. 9, the dent part 35 facing the remote part shown in FIG. 8 and the dent part 35 facing the intermediate part are connected to each other.

本実施形態では、図1に示すように、多層基板30が2つの外部配線33を有する例を示した。しかしながら、外部配線33の数としては上記例に限定されない。例えば、図10及び図11に示すように、多層基板30が外部配線33を3つ有する構成を採用することもできる。   In the present embodiment, as shown in FIG. 1, an example in which the multilayer substrate 30 has two external wirings 33 is shown. However, the number of external wirings 33 is not limited to the above example. For example, as shown in FIGS. 10 and 11, a configuration in which the multilayer substrate 30 includes three external wirings 33 may be employed.

本実施形態では、特に基板11の形成材料について言及しなかった。しかしながら、基板11の形成材料としては、半導体、セラミックなどを採用することができる。   In the present embodiment, the material for forming the substrate 11 is not particularly mentioned. However, as a material for forming the substrate 11, a semiconductor, ceramic, or the like can be used.

本実施形態では、電極12は、x−z平面における断面形状がコの字状を成し、基板11の対向面11a,その裏面11b、及び、面11a,11b間を連結する側面11cそれぞれに形成された例を示した。しかしながら、電極12の形状としては、上記例に限定されず、少なくとも、対向面11aに形成されていれば良い。   In the present embodiment, the electrode 12 has a U-shaped cross-sectional shape in the xz plane, and the opposing surface 11a of the substrate 11, the back surface 11b thereof, and the side surface 11c connecting the surfaces 11a and 11b, respectively. The example formed is shown. However, the shape of the electrode 12 is not limited to the above example, and may be at least formed on the facing surface 11a.

本実施形態では、凹み部35が外部配線33に複数形成された例を示した。しかしながら、凹み部35の数としては上記例に限定されず、単数でも良い。   In this embodiment, the example in which the recessed part 35 was formed in multiple numbers by the external wiring 33 was shown. However, the number of the recessed portions 35 is not limited to the above example, and may be a single number.

10・・・電子基板、11・・・基板、11a・・・対向面、12・・・電極、30・・・多層基板、31・・・絶縁層、32・・・内部配線、33・・・外部配線、34・・・ビア、35・・・凹み部、50・・・導電部材、T1・・・外部配線の厚さ、T2・・・凹み部の深さ、100・・・電子部品 DESCRIPTION OF SYMBOLS 10 ... Electronic substrate, 11 ... Board | substrate, 11a ... Opposite surface, 12 ... Electrode, 30 ... Multilayer substrate, 31 ... Insulating layer, 32 ... Internal wiring, 33 ... External wiring, 34 ... via, 35 ... dent, 50 ... conductive member, T1 ... thickness of external wiring, T2 ... depth of recess, 100 ... electronic component

Claims (8)

電子基板(10)と、
前記電子基板が搭載される多層基板(30)と、
前記電子基板と前記多層基板とを電気的、及び、機械的に接続する導電部材(50)と、を有する電子部品であって、
前記電子基板は、基板(11)と、基板における前記多層基板との対向面(11a)に形成された電極(12)と、を有し、
前記多層基板は、絶縁層(31)と、該絶縁層の内部に形成された内部配線(32)と、前記絶縁層の外部に形成された外部配線(33)と、前記内部配線と前記外部配線とを接続するビア(34)と、を有し、
前記導電部材は、導電ペーストに含まれる溶剤が気化して成り、
前記電極と前記外部配線とが、前記導電部材を介して電気的、及び、機械的に接続され、
前記外部配線には、前記導電部材の厚さを確保するために、局所的に凹んだ凹み部(35)が前記ビアに対向する位置に形成され、
前記凹み部には、前記導電部材の一部が設けられており、
前記基板の対向面に直交する厚さ方向において、前記凹み部の深さ(T2)は、前記外部配線の厚さ(T1)よりも浅いことを特徴とする電子部品。
An electronic substrate (10);
A multilayer substrate (30) on which the electronic substrate is mounted;
An electronic component having a conductive member (50) for electrically and mechanically connecting the electronic substrate and the multilayer substrate,
The electronic substrate has a substrate (11) and an electrode (12) formed on a surface (11a) of the substrate facing the multilayer substrate,
The multilayer substrate includes an insulating layer (31), an internal wiring (32) formed inside the insulating layer, an external wiring (33) formed outside the insulating layer, the internal wiring, and the external wiring. A via (34) for connecting the wiring,
The conductive member is formed by vaporizing a solvent contained in a conductive paste,
The electrode and the external wiring are electrically and mechanically connected via the conductive member,
In the external wiring, in order to ensure the thickness of the conductive member, a locally recessed dent (35) is formed at a position facing the via ,
A part of the conductive member is provided in the recess,
In the thickness direction orthogonal to the facing surface of the substrate, the depth (T2) of the recess is shallower than the thickness (T1) of the external wiring.
前記基板の対向面における前記電子基板の中心(CP)から最も離れた遠隔部位が、前記導電部材を介して前記凹み部と対向していることを特徴とする請求項1に記載の電子部品。   2. The electronic component according to claim 1, wherein a remote part farthest from the center (CP) of the electronic substrate on the opposing surface of the substrate is opposed to the recess through the conductive member. 前記遠隔部位は複数あり、
前記凹み部は前記外部配線に複数形成されており、
複数の前記遠隔部位の全てと、対応する前記凹み部とが前記導電部材を介して対向していることを特徴とする請求項2に記載の電子部品。
There are a plurality of the remote parts,
A plurality of the recesses are formed in the external wiring,
3. The electronic component according to claim 2, wherein all of the plurality of remote parts are opposed to the corresponding recesses through the conductive member.
前記電極は、前記対向面だけではなく、前記基板における前記対向面とその裏面(11b)とを連結する側面(11c)にも形成され、
前記外部配線の外面は、前記電子基板との対向領域と、前記電子基板との非対向領域とで構成され、前記対向領域における前記遠隔部位との対向部位は、前記非対向領域と隣接しており、
前記導電部材は、前記対向領域、前記非対向領域、及び、前記側面に形成された電極それぞれに設けられていることを特徴とする請求項2又は請求項3に記載の電子部品。
The electrode is formed not only on the facing surface, but also on a side surface (11c) connecting the facing surface and the back surface (11b) of the substrate,
The outer surface of the external wiring is composed of a region facing the electronic substrate and a region not facing the electronic substrate, and the region facing the remote region in the facing region is adjacent to the non-facing region. And
The electronic component according to claim 2, wherein the conductive member is provided on each of the opposing region, the non-opposing region, and the electrode formed on the side surface.
前記厚さ方向に直交する平面方向における前記凹み部の幅(d)は、前記電子基板の中心と前記遠隔部位との間の距離(D)と正比例の関係にあることを特徴とする請求項2〜4いずれか1項に記載の電子部品。   The width (d) of the recess in a plane direction perpendicular to the thickness direction is directly proportional to a distance (D) between the center of the electronic substrate and the remote part. Electronic component of any one of 2-4. 前記基板は直方体を成し、
前記基板の対向面は矩形を成しており、
前記対向面の4隅それぞれが、前記遠隔部位に相当することを特徴とする請求項2〜5いずれか1項に記載の電子部品。
The substrate forms a rectangular parallelepiped,
The opposing surface of the substrate has a rectangular shape,
The electronic component according to claim 2, wherein each of the four corners of the facing surface corresponds to the remote part.
前記遠隔部位と対向する前記凹み部は、前記対向面を成す2つの長辺の内の1つに沿うように前記外部配線の一部が局所的に凹んだ第1凹み部と、前記対向面を成す2つの短辺の内の1つに沿うように前記外部配線の一部が局所的に凹んだ第2凹み部とが、L字を成すように連結されて成り、
前記第1凹み部と前記第2凹み部との連結点が、前記導電部材を介して前記遠隔部位と対向していることを特徴とする請求項6に記載の電子部品。
The recessed portion facing the remote part includes a first recessed portion in which a part of the external wiring is locally recessed so as to be along one of the two long sides forming the facing surface, and the facing surface A second recessed portion in which a part of the external wiring is locally recessed so as to be along one of the two short sides forming the shape.
The electronic component according to claim 6, wherein a connection point between the first dent portion and the second dent portion is opposed to the remote site via the conductive member.
前記遠隔部位に対応する前記凹み部とは別に、前記凹み部が前記外部配線に形成されており、
前記対向面の縁に沿う方向において隣接する2つの前記遠隔部位の間の中間部位が、前記導電部材を介して前記凹み部と対向していることを特徴とする請求項6又は請求項7に記載の電子部品。
Apart from the dent corresponding to the remote part, the dent is formed in the external wiring,
The intermediate part between two said remote parts adjacent in the direction along the edge of the said opposing surface is facing the said recessed part through the said electrically-conductive member, The Claim 6 or Claim 7 characterized by the above-mentioned. The electronic component described.
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JP2008159918A (en) * 2006-12-25 2008-07-10 Toshiba Corp Printed wiring board, printed circuit board, and electronic equipment equipped with printed circuit board
JP2008218605A (en) * 2007-03-02 2008-09-18 Epson Imaging Devices Corp Mounting structure and manufacturing method thereof
JP2011258794A (en) * 2010-06-10 2011-12-22 Denso Corp Electronic apparatus and method of manufacturing the same

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