JP5991823B2 - 電気的接続装置及びその組立方法 - Google Patents
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- 238000000034 method Methods 0.000 title claims description 15
- 239000000523 sample Substances 0.000 claims description 131
- 125000006850 spacer group Chemical group 0.000 claims description 129
- 230000003014 reinforcing effect Effects 0.000 claims description 63
- 239000000758 substrate Substances 0.000 claims description 51
- 230000008878 coupling Effects 0.000 claims description 5
- 238000010168 coupling process Methods 0.000 claims description 5
- 238000005859 coupling reaction Methods 0.000 claims description 5
- 230000000149 penetrating effect Effects 0.000 claims description 3
- 230000002093 peripheral effect Effects 0.000 claims description 2
- 241000255925 Diptera Species 0.000 claims 1
- 230000005611 electricity Effects 0.000 claims 1
- 239000000919 ceramic Substances 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 6
- 230000007547 defect Effects 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 230000002950 deficient Effects 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000012811 non-conductive material Substances 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/7082—Coupling device supported only by cooperation with PCB
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/71—Coupling devices for rigid printing circuits or like structures
- H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
- H01R12/714—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/62—Means for facilitating engagement or disengagement of coupling parts or for holding them in engagement
- H01R13/621—Bolt, set screw or screw clamp
- H01R13/6215—Bolt, set screw or screw clamp using one or more bolts
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49204—Contact or terminal manufacturing
- Y10T29/49208—Contact or terminal manufacturing by assembling plural parts
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
前記した標準筒状スペーサ64の高さ寸法に基づいて選択される。
14 配線基板
16 補強板
18 プローブ基板
20 弾性接続器(ポゴピン組立体)
22、24 電気接続部
30 プローブ
30a 針先
32 アンカ部
34 アンカ部のねじ穴
42 基準プレート
42a 基準プレートの基準面
46 ボルト
50 筒状スペーサ
52 シム
54 ねじ部材
62A 配線基板集合部
62B プローブ基板集合部
Claims (10)
- 相対する一方の面及び他方の面を有する補強板と、一方の面が前記補強板の前記一方の面に当接すべく前記補強板と結合され、また他方の面に複数の第1の電気接続部が設けられた配線基板と、該配線基板の前記他方の面に対向する一方の面に、前記第1の電気接続部に対応する第2の電気接続部が設けられ、他方の面に、前記第2の電気接続部のそれぞれに電気的に接続された多数のプローブが設けられたプローブ基板と、前記プローブ基板の前記一方の面の前記第2の電気接続部が設けられていない領域にそれぞれ形成され、頂部に開放するねじ穴がそれぞれ設けられた複数のアンカ部と、各アンカ部に対応して前記配線基板及び補強板のそれぞれに、それらの板厚方向へ互いに整合して形成された複数の貫通孔と、一端が対応する各アンカ部の前記頂部に取り外し可能にねじ結合され、他端の内周面にねじ溝が形成され、前記配線基板及び補強板の前記貫通孔内に配置された複数の筒状スペーサと、各筒状スペーサに対応して前記補強板の前記他方の面に配置される複数の基準プレートであって対応する各筒状スペーサの他端を受ける基準面を前記補強板の前記他方の面に対向する面に有し、それぞれが前記補強板にねじ部材を介して取り外し可能に結合される複数の基準プレートと、各基準プレートと前記補強板との間に挿入された複数のシムと、前記基準プレートの他方の面に載る頭部及び該頭部から前記基準プレート及び対応する前記シムを貫通し、先端部が前記筒状スペーサの前記ねじ溝に螺合する軸部を有するボルトとを含む、電気的接続装置。
- 前記シムは、前記配線基板の前記一方の面から前記プローブの針先が位置する仮想平面までの間隔の微調整のために厚さ寸法又は積み重ね枚数を選択される、請求項1に記載の電気的接続装置。
- 前記筒状スペーサの前記一端には、その端面から当該筒状スペーサの軸線方向へ突出する雄ねじ部が形成され、該雄ねじ部がその対応する前記アンカ部の前記ねじ穴へ螺合されることにより、前記端面が対応する前記アンカ部の前記頂部に当接する、請求項1に記載の電気的接続装置。
- 前記配線基板の前記他方の面と前記プローブ基板の前記一方の面との間には互いに対応する前記第1の電気接続部および前記第2の電気接続部を電気的に接続する弾性接続器が挿入されている、請求項1に記載の電気的接続装置。
- 前記プローブ基板には、その厚さ方向への変形が導入されており、該プローブ基板の変形を保持した状態で前記プローブはその針先を前記仮想平面上に配置されており、前記筒状スペーサは、前記アンカ部と共同して、前記プローブの針先を前記仮想平面に保持すべく前記プローブ基板の前記変形を保持する、請求項2に記載の電気的接続装置。
- 請求項1に記載の電気的接続装置の組立方法であって、前記配線基板に前記補強板及び前記基準プレートを結合した後、前記筒状スペーサを前記配線基板及び補強板の前記貫通孔に適用して該筒状スペーサに前記ボルトを螺合するに先立ち、所定の長さ寸法を有する筒状の標準スペーサ部材を前記配線基板及び補強板の各貫通孔に適用して各標準スペーサ部材の一端に形成されたねじ穴に対応する前記ボルトを螺合して該ボルトを締め付けること、
前記ボルトの締め付け後、各標準スペーサ部材の他端の高さ位置を測定すること、
各標準スペーサ部材の前記他端の高さ位置について測定値に適正値からばらつきがあったとき、このばらつきを無くすように前記補強板と前記基準プレートとの間に適正な厚さ寸法の前記シムを適用すること、
前記シムを適用した後、前記補強板と前記基準プレートとを前記ねじ部材により結合すること、
前記標準スペーサ部材に代えて、該標準スペーサ部材の長さから対応する前記アンカ部の高さを差し引いた長さを有する前記筒状スペーサの前記一端を対応する前記アンカ部に結合すること、
前記筒状スペーサの他端を対応する前記基準プレートの前記基準面に当接させるように前記ボルトを前記基準プレート及び対応する前記シムを貫通させて該ボルトの前記軸部を対応する前記筒状スペーサの前記他端の前記ねじ溝に螺合して前記補強板、前記配線基板及び前記プローブ基板を結合することを含む、電気的接続装置の組立方法。 - 前記標準スペーサ部材を適用するに先立ち、前記補強板及び前記基準プレート間に前記シムを介在させ、前記標準スペーサ部材の適用後、該標準スペーサ部材の前記他端の高さ位置についての適正値からばらつきがあったとき、このばらつきを無くすように前記シムの厚さ寸法の選択のために少なくとも一部の前記シムを取り替えることを含む、請求項6に記載の組立方法。
- 前記標準スペーサ部材の前記他端の高さ位置についての各測定値にばらつきがあったとき、各標準スペーサ部材の前記他端の最も高い高さ位置に各標準スペーサ部材の前記他端の高さ位置が揃うように各シムの厚さ寸法が選択される、請求項6に記載の組立方法。
- 前記プローブ基板の取り替えのために該プローブ基板の前記アンカ部に結合された前記筒状スペーサと前記ボルトとの結合を解除した後、新たなプローブ基板のための筒状スペーサとして、前記標準スペーサ部材の所定の長さから前記新たなプローブ基板のアンカ部の高さを差し引いた長さの筒状スペーサを適用する、請求項6に記載の組立方法。
- 前記プローブ基板の取り替えは、ユーザが行うことを特徴とする請求項9に記載の組立方法。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012029211A JP5991823B2 (ja) | 2012-02-14 | 2012-02-14 | 電気的接続装置及びその組立方法 |
TW102100865A TWI460433B (zh) | 2012-02-14 | 2013-01-10 | 電性連接裝置及其組立方法 |
US13/739,897 US9116174B2 (en) | 2012-02-14 | 2013-01-11 | Electrical connecting apparatus and method for assembling the same |
KR1020130007983A KR101399032B1 (ko) | 2012-02-14 | 2013-01-24 | 전기적 접속 장치 및 그 조립 방법 |
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JP2012029211A JP5991823B2 (ja) | 2012-02-14 | 2012-02-14 | 電気的接続装置及びその組立方法 |
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JP2013167461A JP2013167461A (ja) | 2013-08-29 |
JP5991823B2 true JP5991823B2 (ja) | 2016-09-14 |
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US (1) | US9116174B2 (ja) |
JP (1) | JP5991823B2 (ja) |
KR (1) | KR101399032B1 (ja) |
TW (1) | TWI460433B (ja) |
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SG11201607222RA (en) * | 2014-03-06 | 2016-09-29 | Technoprobe Spa | High-planarity probe card for a testing apparatus for electronic devices |
TWI560454B (en) * | 2014-11-07 | 2016-12-01 | Primax Electronics Ltd | Testing base |
TWI664130B (zh) * | 2016-01-29 | 2019-07-01 | 旺矽科技股份有限公司 | 晶圓匣 |
CN206096201U (zh) * | 2016-07-21 | 2017-04-12 | 梁永焯 | 用于半导体晶圆测试的系统、切线探针卡及其探头组件 |
JP6842985B2 (ja) * | 2017-05-01 | 2021-03-17 | 株式会社日本マイクロニクス | 電気的接続装置及びその製造方法 |
JP7075725B2 (ja) * | 2017-05-30 | 2022-05-26 | 株式会社日本マイクロニクス | 電気的接続装置 |
TWI663407B (zh) * | 2018-06-06 | 2019-06-21 | 中華精測科技股份有限公司 | 探針卡裝置及其立體式信號轉接結構 |
CN113167813B (zh) * | 2018-11-29 | 2024-10-18 | 株式会社村田制作所 | 探针嵌合构造以及探针 |
JP2021120924A (ja) * | 2020-01-30 | 2021-08-19 | 株式会社ヨコオ | 検査用ソケット |
WO2023112315A1 (ja) * | 2021-12-17 | 2023-06-22 | 日本電子材料株式会社 | プローブカード基板用接続台座 |
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JP3343541B2 (ja) | 2000-02-18 | 2002-11-11 | 日本電子材料株式会社 | プローブカード |
AU2001250876A1 (en) * | 2000-03-17 | 2001-10-03 | Formfactor, Inc. | Method and apparatus for planarizing a semiconductor contactor |
US7295279B2 (en) * | 2002-06-28 | 2007-11-13 | Lg.Philips Lcd Co., Ltd. | System and method for manufacturing liquid crystal display devices |
WO2004007138A1 (en) * | 2002-07-17 | 2004-01-22 | Shell Internationale Research Maatschappij B.V. | Electromagnetic acoustic transducer (emat) weld inspection |
WO2004102207A1 (ja) * | 2003-05-13 | 2004-11-25 | Kabushiki Kaisha Nihon Micronics | 通電試験用プローブ |
JP2006010629A (ja) * | 2004-06-29 | 2006-01-12 | Tokyo Electron Ltd | 平行調整機構を備えたプローブカード |
EP2615160A1 (en) * | 2004-10-06 | 2013-07-17 | Universal Bio Research Co., Ltd. | Reaction vessel and reaction controller |
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JP2008216060A (ja) * | 2007-03-05 | 2008-09-18 | Micronics Japan Co Ltd | 電気的接続装置 |
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- 2013-01-10 TW TW102100865A patent/TWI460433B/zh active
- 2013-01-11 US US13/739,897 patent/US9116174B2/en active Active
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TWI460433B (zh) | 2014-11-11 |
TW201346271A (zh) | 2013-11-16 |
KR20130093537A (ko) | 2013-08-22 |
KR101399032B1 (ko) | 2014-06-27 |
US20130207683A1 (en) | 2013-08-15 |
JP2013167461A (ja) | 2013-08-29 |
US9116174B2 (en) | 2015-08-25 |
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