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JP4821343B2 - Submount substrate and light emitting device including the same - Google Patents

Submount substrate and light emitting device including the same Download PDF

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JP4821343B2
JP4821343B2 JP2006027803A JP2006027803A JP4821343B2 JP 4821343 B2 JP4821343 B2 JP 4821343B2 JP 2006027803 A JP2006027803 A JP 2006027803A JP 2006027803 A JP2006027803 A JP 2006027803A JP 4821343 B2 JP4821343 B2 JP 4821343B2
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substrate
submount substrate
bent piece
submount
mounting surface
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JP2007208150A (en
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武夫 栗本
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Nichia Corp
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Nichia Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48463Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • H01L2224/48465Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/13Discrete devices, e.g. 3 terminal devices
    • H01L2924/1301Thyristor

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  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
  • Led Device Packages (AREA)
  • Die Bonding (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To mount a submount substrate on a surface while making the submount substrate of a material with conductivity, and to improve heat radiation. <P>SOLUTION: The submount substrate 10 is made of the material having conductivity and has a first bent piece 11 and second bent piece 12 that form an L-sectioned shape. The first bent piece 11 has a mounted surface 13 to be mounted on a base substrate 20, and the second bent piece 12 has an element mounted surface 14 where a wiring part for mounting a semiconductor element 30 is formed. Consequently, the submount substrate 10 made of the material having conductivity such as a conductive substrate can be mounted on the surface, and handling property is improved. <P>COPYRIGHT: (C)2007,JPO&amp;INPIT

Description

本発明は、半導体素子を支持基板等に対してダイボンディングする際に介在させて使用するサブマウント基板、及び発光ダイオード等の発光素子をサブマウント基板に実装した発光装置に関するものである。   The present invention relates to a submount substrate used by interposing a semiconductor element when die-bonding to a support substrate or the like, and a light emitting device in which a light emitting element such as a light emitting diode is mounted on the submount substrate.

発光素子に半導体素子を用いた発光装置は、小型で電力効率が良く鮮やかな色の発光をする。また、半導体素子である発光素子は球切れ等の心配がない。さらに初期駆動特性が優れ、振動やオン・オフ点灯の繰り返しに強いという特徴を有する。このような優れた特性を有するため、発光ダイオード(LED)、レーザーダイオード(LD)等の半導体発光素子を用いる発光装置は、各種の光源として利用されている。特に、GaN系化合物半導体を利用した高輝度の青色発光のLEDが開発され、その輝度性を活用して白色発光の発光装置が実現されている。この白色発光の発光装置は、青色に発光する発光素子の周りを黄緑色に発光する蛍光物質を含む樹脂で被覆して、白色光を得るというものである。   A light-emitting device using a semiconductor element as a light-emitting element emits light with a small color, high power efficiency, and vivid colors. In addition, a light emitting element which is a semiconductor element does not have a concern about a broken ball. Further, it has excellent initial driving characteristics and is strong against vibration and repeated on / off lighting. Because of such excellent characteristics, light-emitting devices using semiconductor light-emitting elements such as light-emitting diodes (LEDs) and laser diodes (LDs) are used as various light sources. In particular, a high-luminance blue light-emitting LED using a GaN-based compound semiconductor has been developed, and a white light-emitting device has been realized by utilizing the luminance. In this white light emitting device, a light emitting element that emits blue light is covered with a resin containing a fluorescent material that emits yellow green light to obtain white light.

また半導体素子には、このような発光素子以外にも、スイッチング用途や電力制御等のため、トランジスタやサイリスタ等が利用されている。このような半導体素子の実装においては、作業性を高めるために、小型の基板であるサブマウント基板に一旦実装した上で、より大きな支持基板に実装する構成が採用されている。   In addition to such a light emitting element, a transistor, a thyristor, or the like is used as a semiconductor element for switching applications, power control, and the like. In mounting such a semiconductor element, in order to improve workability, a configuration in which the semiconductor device is once mounted on a submount substrate which is a small substrate and then mounted on a larger support substrate is employed.

半導体素子は、出力を大きくするためには、入力電流を大きくする必要がある。特に近年の高出力化の要求に伴い、大出力のLEDが開発され、また一方ではこのような半導体素子を複数組み合わせて使用することも行われており、例えば一パッケージにRGBのLEDチップを配置してフルカラーに発光可能とした発光素子が開発されている。このような半導体素子の高出力化、あるいは使用個数の増加に伴って、発熱量も増大している。半導体素子の発熱により、半導体の素子機能が低下するのを防止するため、何らかの放熱対策を講じる必要がある。
特開2002−368280号公報
In order to increase the output of the semiconductor element, it is necessary to increase the input current. In particular, in response to the demand for higher output in recent years, high-power LEDs have been developed, and on the other hand, a plurality of such semiconductor elements are used in combination. For example, RGB LED chips are arranged in one package. Thus, light emitting elements capable of emitting full color have been developed. As the output of such semiconductor elements is increased or the number of used semiconductor devices is increased, the amount of heat generation is also increasing. In order to prevent the semiconductor element function from deteriorating due to heat generation of the semiconductor element, it is necessary to take some heat dissipation measures.
JP 2002-368280 A

従来、電子回路基板の材料としてはガラスエポキシ、エポキシ、ポリイミド、BTレジン等の樹脂が使用されてきた。ガラスエポキシ基板等は、絶縁性のガラスエポキシ表面に導電パターンを実装できる上、多層構造とすることができるので、多層構造の内部で配線を交差させることができ、実装基板としては好都合である。しかしながら、ガラスエポキシ基板は、熱伝導性が悪く、放熱性に劣るという欠点を有していた。そこで、熱伝導性の高いアルミニウムや銅などで構成した放熱体であるヒートシンク部材を熱伝導状態で接続し、熱を外部に放散させる構成が知られている。ヒートシンクは、半導体素子に直接装着し、熱膨張差を緩和するための緩衝材としてサブマウントを介して半導体素子に装着し、半導体素子の熱を熱伝導の作用により除去する。   Conventionally, resins such as glass epoxy, epoxy, polyimide, and BT resin have been used as materials for electronic circuit boards. A glass epoxy substrate or the like can mount a conductive pattern on an insulating glass epoxy surface and can have a multilayer structure. Therefore, wiring can be crossed inside the multilayer structure, which is convenient as a mounting substrate. However, the glass epoxy substrate has the disadvantages of poor thermal conductivity and poor heat dissipation. Therefore, a configuration is known in which a heat sink member, which is a heat radiator made of aluminum, copper, or the like having high thermal conductivity, is connected in a thermally conductive state to dissipate heat to the outside. The heat sink is directly attached to the semiconductor element, and is attached to the semiconductor element via a submount as a buffer material for reducing the thermal expansion difference, and the heat of the semiconductor element is removed by the action of heat conduction.

しかしながら、これらの樹脂材料基板はそれ自体の熱伝導性が劣るため、熱伝導リードなどを介在させてヒートシンク部材を接続しても、十分な放熱性を発揮できるものでない。また別部材のヒートシンク部材を熱伝導状態に接続することで、構成が複雑になり工数やコストが余計にかかるという問題もある。   However, since these resin material substrates themselves are inferior in thermal conductivity, even if a heat sink member is connected via a heat conductive lead or the like, sufficient heat dissipation cannot be exhibited. In addition, connecting the heat sink member, which is a separate member, to the heat conducting state has a problem that the configuration becomes complicated and man-hours and costs are excessive.

一方、熱伝導性に優れたAl等の金属基板も開発されているが、これらの基板では基板自体が導電性を備えるため、配線を交差できず、また仮に多層基板を構成してスルーホールで接続しても端面で短絡するおそれがあり、両面基板のような多層化ができず、表面実装が困難であるという問題があった。   On the other hand, metal substrates such as Al having excellent thermal conductivity have also been developed. However, since these substrates have conductivity, the wiring itself cannot be crossed, and it is assumed that a multilayer substrate is formed and a through hole is formed. Even if connected, there is a possibility of short-circuiting at the end face, and there is a problem that it is difficult to make a multi-layer like a double-sided board and surface mounting is difficult.

本発明は、このような問題点に鑑みてなされたものである。本発明の主な目的は、導電性を備える材質で構成しつつ表面実装が可能なサブマウント基板及びこれを備える発光装置を提供することにある。   The present invention has been made in view of such problems. A main object of the present invention is to provide a submount substrate that can be surface-mounted while being made of a material having conductivity, and a light-emitting device including the submount substrate.

以上の目的を達成するために本発明の第1のサブマウント基板は、半導体素子を実装可能であり、さらに該半導体素子を実装した状態で支持基板に実装可能なサブマウント基板であって、サブマウント基板が導電性を備える材質で構成されており、サブマウント基板は第1の折曲片と第2の折曲片とを有し、第1の折曲片と第2の折曲片とが折曲されて連結されており、第1の折曲片が支持基板に実装される被実装面を有し、第2の折曲片が、半導体素子を実装するための配線部を形成した素子実装面を有しており、被実装面と素子実装面とが、折曲前の状態で前記サブマウント基板の同一面に位置するように構成している。これにより、導電性基板などの導電性を有する材質で構成されたサブマウント基板の表面実装が可能となり、ハンドリング性が向上する。 In order to achieve the above object, a first submount substrate of the present invention is a submount substrate on which a semiconductor element can be mounted and can be mounted on a support substrate in a state where the semiconductor element is mounted. The mount substrate is made of a conductive material, the submount substrate has a first bent piece and a second bent piece, and the first bent piece and the second bent piece are Are bent and connected, the first bent piece has a mounting surface mounted on the support substrate, and the second bent piece forms a wiring portion for mounting the semiconductor element. An element mounting surface is provided, and the mounting surface and the element mounting surface are positioned on the same surface of the submount substrate before being bent . Thereby, the surface mounting of the submount board | substrate comprised with the material which has electroconductivity, such as an electroconductive board | substrate, becomes possible, and handling property improves.

また、第2のサブマウント基板は、第1の折曲片と第2の折曲片とが一体に構成されており、折曲することによって第1の折曲片と第2の折曲片とで断面L字状を構成している。これにより、容易にかつ安価に断面L字状のサブマウント基板を構成できる。   In the second submount substrate, the first bent piece and the second bent piece are integrally formed, and the first bent piece and the second bent piece are formed by bending. And a cross-sectional L-shape. Thereby, a submount substrate having an L-shaped cross section can be configured easily and inexpensively.

さらに第3のサブマウント基板は、被実装面と素子実装面が、折曲前のサブマウント基板の同一面に位置する。これにより、サブマウント基板を片面基板とし、配線等の作業を同一面に対して行えば足りるので、作業性を向上できる。   Further, in the third submount substrate, the mounting surface and the element mounting surface are located on the same surface of the submount substrate before bending. Accordingly, it is sufficient to use a single-sided substrate as the submount substrate and perform operations such as wiring on the same surface, so that workability can be improved.

なおサブマウント基板は、好ましくは表面を平滑に加工した基板とする。これにより、半導体素子の実装を確実に行うことができる。またサブマウント基板を熱伝導性に優れた基板とすることで、サブマウント基板をヒートシンク等に熱伝導状態に接続して放熱性を向上でき、半導体素子の安定駆動を図ることができる。さらに金属製の導電基板をサブマウント基板として利用しつつ、表面実装可能とできる。特に半導体素子にLEDやLED等の半導体発光素子を利用し、これらの実装に適したサブマウント基板を提供できる。 The submount substrate is preferably a substrate whose surface is processed smoothly. Thereby, a semiconductor element can be mounted reliably. Further, by making the submount substrate a substrate having excellent thermal conductivity, the submount substrate can be connected to a heat sink or the like in a thermally conductive state to improve heat dissipation, and the semiconductor element can be stably driven. Moreover, while utilizing a metallic conductive substrate as a submount substrate, it is possible surface mounting. In particular, a semiconductor light emitting element such as LED or LED can be used as a semiconductor element, and a submount substrate suitable for mounting these can be provided.

さらにまた、第4のサブマウント基板は、サブマウント基板が、Al、Fe又はCu−W製の基板である。これにより、Al、Fe、Cu−W製の導電基板をサブマウント基板として表面実装可能とすることができる。   Furthermore, the fourth submount substrate is a substrate made of Al, Fe, or Cu—W. As a result, it is possible to mount the conductive substrate made of Al, Fe, or Cu-W as a submount substrate.

さらにまた、第5のサブマウント基板はさらに、サブマウント基板と熱伝導状態に接続されたヒートシンク部材を備える。これにより、サブマウント基板に実装された半導体素子で発生した熱を、サブマウント基板を介してヒートシンク部材に熱伝導でき、特に高出力化の際にも放熱性を発揮できるので、半導体素子の安定動作が図られる。   Furthermore, the fifth submount substrate further includes a heat sink member connected to the submount substrate in a heat conductive state. As a result, the heat generated in the semiconductor element mounted on the submount substrate can be conducted to the heat sink member via the submount substrate, and heat dissipation can be exhibited especially when the output is increased. Operation is planned.

さらにまた、第6のサブマウント基板は、ヒートシンク部材が、サブマウント基板を載置した筐体である。これにより、別部材のヒートシンクを用意することなく筐体自体をヒートシンクとして機能させ、コスト低減と構成の簡素化を図ることができる。   Furthermore, the sixth submount substrate is a housing in which the heatsink member places the submount substrate. Thus, the housing itself can function as a heat sink without preparing a separate heat sink, thereby reducing costs and simplifying the configuration.

さらにまた、第7の発光装置は、半導体発光素子と、発光発光素子を実装したサブマウント基板と、サブマウント基板を実装するための支持基板とを備える発光装置であって、サブマウント基板がアルミニウム基板で構成され、アルミニウム基板は第1の折曲片と第2の折曲片を有し、第1の折曲片は支持基板に実装される被実装面を有し、第2の折曲片は半導体素子を実装するための配線部を形成した素子実装面を有し、第1の折曲片と第2の折曲片との間で折曲して断面をL字状に形成しており、被実装面と素子実装面とが、折曲前の状態で前記サブマウント基板の同一面に位置するように構成している。これにより、導電性基板などの導電性を有する材質で構成されたサブマウント基板の表面実装が可能となり、ハンドリング性が向上する。 Furthermore, a seventh light emitting device is a light emitting device including a semiconductor light emitting element, a submount substrate on which the light emitting light emitting element is mounted, and a support substrate for mounting the submount substrate, and the submount substrate is made of aluminum. The aluminum substrate has a first bent piece and a second bent piece, the first bent piece has a mounting surface mounted on the support substrate, and the second bent piece. The piece has an element mounting surface on which a wiring portion for mounting a semiconductor element is formed, and is bent between the first bent piece and the second bent piece to form an L-shaped cross section. The mounting surface and the device mounting surface are configured to be located on the same surface of the submount substrate before being bent . Thereby, the surface mounting of the submount board | substrate comprised with the material which has electroconductivity, such as an electroconductive board | substrate, becomes possible, and handling property improves.

本発明のサブマウント基板及びこれを備える発光装置によれば、導電性基板などの導電性を有する材質で構成されたサブマウント基板の表面実装が可能となり、ハンドリング性を向上できる。   According to the submount substrate and the light-emitting device including the same of the present invention, surface mounting of the submount substrate made of a conductive material such as a conductive substrate is possible, and handling properties can be improved.

以下、本発明の実施の形態を図面に基づいて説明する。ただし、以下に示す実施の形態は、本発明の技術思想を具体化するためのサブマウント基板及びこれを備える発光装置を例示するものであって、本発明はサブマウント基板及びこれを備える発光装置を以下のものに特定しない。また、本明細書は特許請求の範囲に示される部材を、実施の形態の部材に特定するものでは決してない。特に実施の形態に記載されている構成部品の寸法、材質、形状、その相対的配置等は特に特定的な記載がない限りは、本発明の範囲をそれのみに限定する趣旨ではなく、単なる説明例にすぎない。なお、各図面が示す部材の大きさや位置関係等は、説明を明確にするため誇張していることがある。さらに以下の説明において、同一の名称、符号については同一もしくは同質の部材を示しており、詳細説明を適宜省略する。さらに、本発明を構成する各要素は、複数の要素を同一の部材で構成して一の部材で複数の要素を兼用する態様としてもよいし、逆に一の部材の機能を複数の部材で分担して実現することもできる。
(実施の形態1)
Hereinafter, embodiments of the present invention will be described with reference to the drawings. However, the embodiment described below exemplifies a submount substrate for embodying the technical idea of the present invention and a light emitting device including the same, and the present invention is a submount substrate and a light emitting device including the same. Is not specified as below. Further, the present specification by no means specifies the members shown in the claims to the members of the embodiments. In particular, the dimensions, materials, shapes, relative arrangements, and the like of the component parts described in the embodiments are not intended to limit the scope of the present invention unless otherwise specified, and are merely explanations. It is just an example. Note that the size, positional relationship, and the like of the members shown in each drawing may be exaggerated for clarity of explanation. Furthermore, in the following description, the same name and symbol indicate the same or the same members, and detailed description thereof will be omitted as appropriate. Furthermore, each element constituting the present invention may be configured such that a plurality of elements are constituted by the same member and the plurality of elements are shared by one member, and conversely, the function of one member is constituted by a plurality of members. It can also be realized by sharing.
(Embodiment 1)

図1A及び図1Bに、本発明の実施の形態1に係るサブマウント基板10に、半導体素子30を実装したサブマウント構造体を、さらに支持基板20に実装した状態を示す。図1Aは正面から見た図、図1Bは図1AのB−B線における断面図を、それぞれ示している。これらの図に示すサブマウント基板10は、断面をL字状に折曲しており、第1の折曲片11と第2の折曲片12とでL字状を構成する。第1の折曲片11は支持基板20に実装される被実装面13を有し、第2の折曲片12は半導体素子30を実装するための配線部を形成した素子実装面14を有している。これらの第1の折曲片11と第2の折曲片12とは、基板を折曲して構成されるが、別部材とすることも可能である。   1A and 1B show a state where a submount structure in which a semiconductor element 30 is mounted on a submount substrate 10 according to Embodiment 1 of the present invention is further mounted on a support substrate 20. FIG. 1A is a front view, and FIG. 1B is a cross-sectional view taken along line BB in FIG. 1A. The submount substrate 10 shown in these drawings is bent in an L shape in cross section, and the first bent piece 11 and the second bent piece 12 constitute an L shape. The first bent piece 11 has a mounting surface 13 mounted on the support substrate 20, and the second bent piece 12 has an element mounting surface 14 on which a wiring portion for mounting the semiconductor element 30 is formed. is doing. The first bent piece 11 and the second bent piece 12 are formed by bending the substrate, but may be separate members.

サブマウント基板10は、熱伝導性に優れた部材で構成し、好ましくは金属製基板とする。金属材料としては、Al、Fe、Cu−W等が利用でき、中でも安価で軽量であり、導電率、放熱性にも優れたアルミニウム基板が特に好ましい。またサブマウント基板10の表面には絶縁層15を設け、この上に被実装面13と素子実装面14を各々形成している。絶縁層15で被覆することにより、導電性サブマウント基板10による短絡を防止する。   The submount substrate 10 is composed of a member having excellent thermal conductivity, and is preferably a metal substrate. As the metal material, Al, Fe, Cu-W and the like can be used, and among them, an aluminum substrate that is inexpensive and lightweight, and excellent in conductivity and heat dissipation is particularly preferable. An insulating layer 15 is provided on the surface of the submount substrate 10, and a mounting surface 13 and an element mounting surface 14 are formed thereon. By covering with the insulating layer 15, a short circuit due to the conductive submount substrate 10 is prevented.

半導体素子30を搭載する素子実装面14には、銅製のヒートスプレッダ等をハンダ付けする。素子実装面14には、半導体素子30等の電子部品を実装する。また、配線のため、配線部から銅パターンなどの配線パターン16を被実装面13まで延長する。   A copper heat spreader or the like is soldered to the element mounting surface 14 on which the semiconductor element 30 is mounted. An electronic component such as the semiconductor element 30 is mounted on the element mounting surface 14. For wiring, a wiring pattern 16 such as a copper pattern is extended from the wiring portion to the mounting surface 13.

従来、Al等の金属基板では、基板自体が導電性を備えるため、配線を交差できず回路構成上不利であった。また仮に多層基板を構成してスルーホールで接続しても端面で短絡するおそれがあり、多層化が困難であった。このため両面基板とできず、表面実装し辛いという問題があった。これに対し、本実施の形態によれば、支持基板20に実装される被実装面13と、半導体素子30を実装する素子実装面14とを物理的に分離しているため、このような短絡を回避できる。また、アルミニウム基板を折曲することで、被実装面13と同一面上から素子実装面14を排除し、半導体素子30を実装するための空間を確保している。図1Bの例では、第1の折曲片11と第2の折曲片12との連結部分の断面形状をL字状に折曲させることで、被実装面13と略直交する素子実装面14は支持基板20の面から離間されて、半導体素子30の実装空間を確保している。   Conventionally, in a metal substrate such as Al, since the substrate itself has conductivity, wiring cannot be crossed, which is disadvantageous in terms of circuit configuration. Further, even if a multilayer substrate is configured and connected through through holes, there is a risk of short-circuiting at the end face, making it difficult to make multilayers. For this reason, there was a problem that it could not be a double-sided board and was difficult to mount on the surface. On the other hand, according to the present embodiment, the mounting surface 13 mounted on the support substrate 20 and the element mounting surface 14 on which the semiconductor element 30 is mounted are physically separated. Can be avoided. Further, by bending the aluminum substrate, the element mounting surface 14 is removed from the same surface as the mounting surface 13, and a space for mounting the semiconductor element 30 is secured. In the example of FIG. 1B, the element mounting surface that is substantially orthogonal to the mounting surface 13 is formed by bending the cross-sectional shape of the connecting portion of the first bent piece 11 and the second bent piece 12 into an L shape. 14 is separated from the surface of the support substrate 20 to secure a mounting space for the semiconductor element 30.

また、被実装面13と素子実装面14が、折曲前の状態でサブマウント基板10の同一面に位置するようにすることが好ましい。これによりサブマウント基板10を片面基板とでき、片面基板に被実装面13と素子実装面14とをサブマウント基板10の同一面に形成した後、被実装面13と素子実装面14との境界部分で折曲することにより支持基板20上に実装できるので、これらの作業を容易に行うことができる。   Further, it is preferable that the mounting surface 13 and the element mounting surface 14 be positioned on the same surface of the submount substrate 10 before being bent. Thus, the submount substrate 10 can be a single-sided substrate, and the mounting surface 13 and the element mounting surface 14 are formed on the same surface of the submount substrate 10 on the single-sided substrate, and then the boundary between the mounted surface 13 and the element mounting surface 14 Since it can be mounted on the support substrate 20 by bending at a portion, these operations can be easily performed.

図1Bの例では、アルミニウム基板の絞り加工やフォーミングによって、折曲された第1の折曲片11と第2の折曲片12とを構成する。サブマウント基板10にアルミニウム基板を使用する場合は、基板表面の段差を低減するために、表面を平滑化することが好ましい。   In the example of FIG. 1B, the bent first bent piece 11 and the second bent piece 12 are formed by drawing or forming an aluminum substrate. When an aluminum substrate is used for the submount substrate 10, it is preferable to smooth the surface in order to reduce the level difference on the substrate surface.

このようにして支持基板20上にサブマウント基板10を実装した後、サブマウント基板10を筐体やアース等に熱伝導可能な状態に接続する。筐体は一般に外部に表出する表面積が広いので、ヒートシンクとして機能させることができる。これにより、別部材のヒートシンクを用意することなく筐体自体をヒートシンクとして機能させ、コスト低減と構成の簡素化を図ることができる。   After mounting the submount substrate 10 on the support substrate 20 in this manner, the submount substrate 10 is connected to a case or a ground so as to be able to conduct heat. Since the housing generally has a large surface area exposed to the outside, it can function as a heat sink. Thus, the housing itself can function as a heat sink without preparing a separate heat sink, thereby reducing costs and simplifying the configuration.

なお本明細書において、熱伝導可能な状態で固定するとは、接合面が直接接触している状態のみならず、必要に応じて間に絶縁層等を介在させた状態も包含する意味で使用する。
(半導体素子30)
In the present specification, the term “fixed in a state where heat conduction is possible” is used to include not only a state in which the joint surfaces are in direct contact but also a state in which an insulating layer or the like is interposed as required. .
(Semiconductor element 30)

半導体素子30は、LEDやLD(半導体レーザ)などの半導体発光素子が利用できる。これらの半導体発光素子は、入力に対する出力のリニアリティが良く、効率に優れ、長寿命で安定して使用できる利点が得られる。特にLEDは安価で入手容易であり、好ましい。また半導体発光素子は、表面実装型(SMD)の他、砲弾型(ランプタイプ)等が好適に利用できる。   The semiconductor element 30 may be a semiconductor light emitting element such as an LED or an LD (semiconductor laser). These semiconductor light emitting devices have the advantage that the linearity of the output with respect to the input is good, the efficiency is excellent, and the long life can be used stably. In particular, LEDs are preferable because they are inexpensive and readily available. Further, as the semiconductor light emitting element, a bullet type (lamp type) or the like can be suitably used in addition to the surface mount type (SMD).

半導体発光素子の材料として、BN、SiC、ZnSeやGaN、InGaN、InAlGaN、AlGaN、BAlGaN、BInAlGaNなど種々の半導体を挙げることができる。同様に、これらの元素に不純物元素としてSiやZnなどを含有させ発光中心とすることもできる。発光層の材料として、窒化物半導体(例えば、AlやGaを含む窒化物半導体、InやGaを含む窒化物半導体としてInXAlYGa1-X-YN(0<X<1、0<Y<1、X+Y≦1)等が利用できる。また、半導体の構造としては、MIS接合、PIN接合やpn接合などを有するホモ構造、ヘテロ構造あるいはダブルへテロ構成のものが好適に挙げられる。半導体層の材料やその混晶比によって発光波長を種々選択することができる。また、半導体活性層を量子効果が生ずる薄膜に形成させた単一量子井戸構造や多重量子井戸構造とすることでより出力を向上させることもできる。 Examples of the material of the semiconductor light emitting device include various semiconductors such as BN, SiC, ZnSe, GaN, InGaN, InAlGaN, AlGaN, BAlGaN, and BInAlGaN. Similarly, these elements may contain Si, Zn, or the like as an impurity element to serve as a light emission center. As a material of the light emitting layer, a nitride semiconductor (for example, a nitride semiconductor containing Al or Ga, a nitride semiconductor containing In or Ga, In X Al Y Ga 1-XY N (0 <X <1, 0 <Y < 1, X + Y ≦ 1), etc. The semiconductor structure is preferably a homostructure having a MIS junction, PIN junction or pn junction, heterostructure, or double heterostructure. The emission wavelength can be selected in various ways depending on the material and its mixed crystal ratio, and the output can be increased by adopting a single quantum well structure or a multiple quantum well structure in which the semiconductor active layer is formed in a thin film that produces a quantum effect. It can also be improved.

図1A、Bの例は、半導体発光素子をサイドビュータイプのLEDとしている。この例では、中央を凹状に形成したリフレクタ17の底面にLEDチップを固定している。LEDチップの周囲をリフレクタ17で囲むことにより、LEDチップの側面から放出される光をリフレクタ17で上面に反射させることで、光出力を増すと共に指向性を高める。リフレクタ17は、中央部分を貫通開口し、開口部内面の反射効率が高くなるようにコーティング等を施したものとし、LEDチップと別部材として実装する他、予め開口されたリフレクタの底面にLEDチップを配置したパッケージを利用しても良い。   In the example of FIGS. 1A and 1B, the semiconductor light emitting element is a side view type LED. In this example, the LED chip is fixed to the bottom surface of the reflector 17 having a concave center. By surrounding the periphery of the LED chip with the reflector 17, the light emitted from the side surface of the LED chip is reflected on the upper surface by the reflector 17, thereby increasing the light output and the directivity. The reflector 17 has a through-opening at the central portion and is coated so as to increase the reflection efficiency of the inner surface of the opening. The reflector 17 is mounted as a separate member from the LED chip. You may use the package which arranged.

従来より、サイドビュータイプのものはパッケージそのものの放熱経路が確保し難いため、高出力化が困難であるという問題があったが、本実施の形態ではサブマウント基板10に熱伝導性基板を使用し、また放熱経路を確保することで、高出力化にも対応可能とできる。これにより、信号用、プロジェクタ用、大型ディスプレイ用など、比較的大型のパワー系の素子にも適用可能となる。また強指向としてコントラストを向上できるという副次的な効果も得られる。   Conventionally, the side view type has a problem that it is difficult to increase the output because it is difficult to secure the heat dissipation path of the package itself. In this embodiment, a heat conductive substrate is used as the submount substrate 10. In addition, by securing a heat radiation path, it is possible to cope with high output. As a result, it can be applied to relatively large power elements such as signals, projectors, and large displays. In addition, a secondary effect that contrast can be improved as a strong directivity can be obtained.

なお上記の例では、LEDチップはn電極とp電極を基板の同一面側に設け、これらを上面とする姿勢でサブマウント基板10に実装した後ワイヤボンディングによって配線しているが、電極面を下面の姿勢としてバンプ等で実装するフリップチップ型あるいはフェイスダウン型とすることもできる。また成長基板にGaN基板等の導電性基板を使用し、成長基板の対向する面にn電極とp電極とを形成する構成とすることもできる。   In the above example, the LED chip is provided with an n-electrode and a p-electrode on the same surface side of the substrate, mounted on the submount substrate 10 in a posture with these as the upper surface, and then wired by wire bonding. A flip chip type or a face down type in which the lower surface is mounted with bumps or the like can also be used. Alternatively, a conductive substrate such as a GaN substrate may be used as the growth substrate, and an n electrode and a p electrode may be formed on the opposing surfaces of the growth substrate.

このようにして得られたサブマウント基板10は、導電性、熱伝導性に優れた金属基板を利用して確実な放熱経路が形成できるので、放熱性を大幅に向上でき安定した動作が得られる。またサブマウント基板10は両面基板とせず、片面のみに素子実装面14と被実装面13を形成しているため面積が相対的に広くなり、小型化には不向きであるが、反面十分な機械的強度を有し、実装時に把持しやすいという利点も得られる。
(実施の形態2)
Since the submount substrate 10 thus obtained can form a reliable heat dissipation path using a metal substrate having excellent conductivity and thermal conductivity, the heat dissipation can be greatly improved and a stable operation can be obtained. . Further, the submount substrate 10 is not a double-sided substrate, and the element mounting surface 14 and the mounted surface 13 are formed only on one side, so the area becomes relatively large and is not suitable for miniaturization. There is also an advantage that it has an appropriate strength and is easy to grip during mounting.
(Embodiment 2)

サブマウント基板の放熱性をさらに向上させるために、さらにヒートシンク部材を備えることもできる。図2A及び図2Bに、本発明の実施の形態2に係るサブマウント基板10Bとして、ヒートシンク部材40を固定した状態を示す。図2Aは正面から見た図、図2Bは図2AのB−B線における断面図を、それぞれ示している。これらの図に示すサブマウント基板10Bは、図1A〜図1Bに示すサブマウント基板10と同様のタイプを使用しており、参照符号を同じとする部材については、図1A〜図1Bと同様であるから、詳細説明を省略する。   In order to further improve the heat dissipation of the submount substrate, a heat sink member can be further provided. 2A and 2B show a state where the heat sink member 40 is fixed as the submount substrate 10B according to Embodiment 2 of the present invention. 2A is a front view, and FIG. 2B is a cross-sectional view taken along line BB in FIG. 2A. The submount substrate 10B shown in these drawings uses the same type as the submount substrate 10 shown in FIGS. 1A to 1B, and members having the same reference numerals are the same as those in FIGS. 1A to 1B. Therefore, detailed description is omitted.

このサブマウント基板10Bは、第1の折曲片11Bと第2の折曲片12Bとを折曲した状態で、被実装面13Bと素子実装面14Bとを設けた面と反対側の対向面に、ヒートシンク部材40を固定している。ヒートシンク部材40は、少なくとも素子実装面14Bの反対面でサブマウント基板10Bと熱伝導可能な状態に固定される。主な発熱源は半導体素子30Bであるため、半導体素子30Bが実装される素子実装面14Bのほぼ裏側の空間を利用してヒートシンク部材40を配置することにより、半導体素子30Bで発生した熱をサブマウント基板10Bを介してヒートシンク部材40に熱伝導できるので、熱の伝導経路を短縮でき、放熱効果を高めることができる。   The submount substrate 10B is an opposing surface opposite to the surface on which the mounted surface 13B and the element mounting surface 14B are provided in a state where the first bent piece 11B and the second bent piece 12B are bent. Further, the heat sink member 40 is fixed. The heat sink member 40 is fixed at least on the surface opposite to the element mounting surface 14B so as to be able to conduct heat with the submount substrate 10B. Since the main heat source is the semiconductor element 30B, the heat generated by the semiconductor element 30B can be sublimated by arranging the heat sink member 40 using the space almost on the back side of the element mounting surface 14B on which the semiconductor element 30B is mounted. Since heat can be conducted to the heat sink member 40 via the mount substrate 10B, the heat conduction path can be shortened and the heat radiation effect can be enhanced.

また図2Bの例では素子実装面14Bの反対面に加えて、被実装面13Bの反対面でもサブマウント基板10Bに熱伝導可能な状態で固定されている。このように1カ所でなく複数箇所で接続することにより、より均一な熱伝導が図られ、より確実な放熱効果が期待できる。   Further, in the example of FIG. 2B, in addition to the surface opposite to the element mounting surface 14B, the surface opposite to the mounting surface 13B is fixed to the submount substrate 10B in a state capable of conducting heat. Thus, by connecting not at one place but at multiple places, more uniform heat conduction can be achieved, and a more reliable heat radiation effect can be expected.

ヒートシンク部材40の固定は、ダイボンディング等によって行える。サブマウント基板10Bの上面には、チタン、プラチナ、金あるいはこれらを組み合わせた多層構造等によるダイボンディング用電極膜を形成する。なおヒートシンク部材40の固定は、素子実装面14Bへのリフロー等の実装作業を行った後に行う。
(ヒートシンク部材40)
The heat sink member 40 can be fixed by die bonding or the like. On the upper surface of the submount substrate 10B, an electrode film for die bonding is formed by titanium, platinum, gold, or a multilayer structure combining these. The heat sink member 40 is fixed after performing a mounting operation such as reflow on the element mounting surface 14B.
(Heat sink member 40)

ヒートシンク部材40は、例えばCuまたはAlなど、熱伝導性に優れた金属で構成する。また放熱フィンを設けることで表面積を大きくして、空気との接触面積を増やして放熱性を向上できる。このようなヒートシンク部材40を設けることで放熱性が向上される結果、半導体素子30Bを高出力としても安定して動作でき、動作の信頼性向上と素子の長寿命化を図ることができる。   The heat sink member 40 is made of a metal having excellent thermal conductivity, such as Cu or Al. Further, by providing the radiation fins, the surface area can be increased, the contact area with the air can be increased, and the heat dissipation can be improved. By providing such a heat sink member 40, the heat dissipation is improved. As a result, the semiconductor element 30B can be stably operated even at a high output, and the reliability of the operation can be improved and the life of the element can be extended.

またヒートシンク部材40を、上記と同様に筐体やアース等に熱伝導可能な状態に接続することもでき、これによってさらに確実な放熱経路を形成して放熱性を一層向上できる。
(変形例)
Further, the heat sink member 40 can also be connected to a housing, ground, or the like in the same manner as described above, thereby forming a more reliable heat dissipation path and further improving heat dissipation.
(Modification)

図2A、Bの例では、図1A、Bと同様にサブマウント基板10Bの表面に絶縁層15Bを被覆している。ただ、絶縁層15Bを部分的に除去して、サブマウント基板上に直接半導体素子30Bを固定し、これらを導通させることもできる。例えば図3A、Bの例では、LEDチップである半導体素子30Cの載置面の絶縁層15Cを部分的に除去して露出させ、アルミニウム製サブマウント基板10C上にダイレクトボンディングしている。間に絶縁層を介在させないことにより、この部分でのヒートシンク部材40Cとの熱伝導性を高めてさらなる放熱性が図られる。また、上記の例とは逆にLEDチップの下面をアルミニウム基板と意図的に導通させて、サブマウント基板10Cを配線に利用することができる。
(実施の形態3)
In the example of FIGS. 2A and 2B, the surface of the submount substrate 10B is covered with the insulating layer 15B as in FIGS. 1A and 1B. However, it is also possible to remove the insulating layer 15B partially, fix the semiconductor element 30B directly on the submount substrate, and conduct these. For example, in the example of FIGS. 3A and 3B, the insulating layer 15C on the mounting surface of the semiconductor element 30C, which is an LED chip, is partially removed and exposed, and is directly bonded onto the aluminum submount substrate 10C. By not interposing an insulating layer between them, the heat conductivity with the heat sink member 40C in this part is improved, and further heat dissipation is achieved. In contrast to the above example, the lower surface of the LED chip is intentionally connected to the aluminum substrate, and the submount substrate 10C can be used for wiring.
(Embodiment 3)

また上記の例では半導体素子として一のチップのみを実装する例を示したが、複数の半導体素子をサブマウント基板上に実装することもできる。図4A、Bに、本発明の実施の形態3として、RGBに各々発光するLEDチップを実装して、これらの発光の組み合わせによってフルカラーに発光可能な発光装置とした例を示す。このように、一のサブマウント基板10D上に複数の半導体素子30Dを実装し、半導体素子30Dの使用数に応じて発熱量が多くなる態様において、ヒートシンク部材40D等で放熱性を高めた本実施の形態は好適に適用できる。   In the above example, only one chip is mounted as a semiconductor element. However, a plurality of semiconductor elements can be mounted on a submount substrate. FIGS. 4A and 4B show an example of a light emitting device capable of emitting full color light by combining LED light emitting elements as a third embodiment of the present invention. As described above, in the embodiment in which a plurality of semiconductor elements 30D are mounted on one submount substrate 10D and the amount of heat generated increases according to the number of semiconductor elements 30D used, the heat sink member 40D or the like improves heat dissipation. This form can be suitably applied.

図4A、Bの例では、各LEDチップの端子をサブマウント基板10Dと電気的に接続するために、銀などで配線パターン16Dを構成する。また、配線パターン16Dに応じてサブマウント基板10D上の素子実装面にも、配線部が形成される。この例では、配線パターン16Dとして5つの端子を形成し、左右をカソード、中央の3つをRGB各々のアノードと、それぞれ配線している。
(変形例)
4A and 4B, the wiring pattern 16D is made of silver or the like in order to electrically connect the terminals of the LED chips to the submount substrate 10D. A wiring portion is also formed on the element mounting surface on the submount substrate 10D according to the wiring pattern 16D. In this example, five terminals are formed as the wiring pattern 16D, and the left and right are respectively connected to the cathode, and the center three are connected to the RGB anodes.
(Modification)

さらにこの例においても、上記図3と同様に、サブマウント基板表面に被覆した絶縁層の一部を除去して、半導体素子をサブマウント基板上にダイレクトボンディングすることもできる。特に使用する半導体素子が多くなるにつれて発熱量も多くなるため、サブマウント基板と直接接続する半導体素子を増やして、熱伝導をより向上させることは意義がある。図5A、Bに、このようなダイレクトボンディングを行うサブマウント基板10Eの例を示す。ダイレクトボンディングにより、ヒートシンク部材40Eから効率よく放熱できる。   Further, in this example as well, the semiconductor element can be directly bonded onto the submount substrate by removing a part of the insulating layer coated on the surface of the submount substrate, as in FIG. In particular, since the amount of heat generation increases as the number of semiconductor elements used increases, it is meaningful to increase the number of semiconductor elements that are directly connected to the submount substrate to further improve the heat conduction. 5A and 5B show an example of a submount substrate 10E that performs such direct bonding. By direct bonding, heat can be efficiently radiated from the heat sink member 40E.

以上の例では、第1の折曲片と第2の折曲片との連結部分の断面形状をL字状とする構成について説明した。ただ、本発明はこのような断面L字状に限られず、図6に示すように断面V字状のサブマウント基板10Vや図7に示すように断面U字状(あるいはコ字状)のサブマウント基板10Uとすることもできる。このように、サブマウント基板の同一面に被実装面と素子実装面とを形成し、且つサブマウント基板を折曲することで被実装面の水平面上から素子実装面を除くことができれば、表面実装が可能となる。したがって本発明は、サブマウント基板の断面をL字状に限定するものでなく、他の形状も適宜利用できる。さらに、一のサブマウント基板を折曲して第1の折曲片と第2の折曲片とを形成する構成のみならず、これらを別部材で構成し、溶接や接着、ねじ止めなどによってこれらを連結する構成でも、同様に被実装面と素子実装面とを物理的に離間しつつ、表面実装を可能とできるので、適宜採用し得る。   In the above example, the configuration in which the cross-sectional shape of the connecting portion between the first bent piece and the second bent piece is L-shaped has been described. However, the present invention is not limited to such an L-shaped cross section, and a submount substrate 10V having a V-shaped cross section as shown in FIG. 6 or a sub-mount substrate having a U-shaped (or U-shaped) cross section as shown in FIG. The mounting substrate 10U can also be used. In this way, if the mounting surface and the device mounting surface are formed on the same surface of the submount substrate, and the device mounting surface can be removed from the horizontal surface of the mounted surface by bending the submount substrate, the surface Implementation is possible. Therefore, the present invention does not limit the cross-section of the submount substrate to an L shape, and other shapes can be used as appropriate. Furthermore, not only the structure which bends one submount board | substrate but forms the 1st bending piece and the 2nd bending piece, these are comprised by another member, welding, adhesion | attachment, screwing, etc. Even in the configuration in which these are connected, similarly, the surface to be mounted can be mounted while physically separating the mounting surface and the element mounting surface, so that they can be appropriately employed.

また上記では、半導体素子としてLEDを実装したサブマウント基板の例を説明しているが、このような半導体発光素子に限られず、フォトダイオード等の受光素子、トランジスタ、サイリスタ等のスイッチング素子など、他の半導体素子にも本発明を適用できる。特に、発熱量の多いパワー系の半導体素子に対して、効果的に放熱性を向上して安定動作させ長寿命化を図ることが可能となる。   In the above, an example of a submount substrate on which an LED is mounted as a semiconductor element has been described. However, the present invention is not limited to such a semiconductor light emitting element, and other elements such as a light receiving element such as a photodiode, a switching element such as a transistor and a thyristor, etc. The present invention can also be applied to these semiconductor elements. In particular, it is possible to effectively improve the heat dissipation and stably operate a power semiconductor element having a large amount of heat generation to extend its life.

本発明のサブマウント基板及びこれを備える発光装置は、信号用、プロジェクタ用等、比較的大型のパワー系の素子に好適に利用できる。   The submount substrate of the present invention and the light emitting device including the same can be suitably used for relatively large power elements such as signals and projectors.

図1Aは、本発明の実施の形態1に係るサブマウント基板を支持基板に実装した状態を示す正面図、図1Bは図1AのB−B線における断面図である。1A is a front view showing a state in which a submount substrate according to Embodiment 1 of the present invention is mounted on a support substrate, and FIG. 1B is a cross-sectional view taken along line BB in FIG. 1A. 図2Aは、本発明の実施の形態2に係るサブマウント基板を示す正面図、図2Bは図2AのB−B線における断面図である。2A is a front view showing a submount substrate according to Embodiment 2 of the present invention, and FIG. 2B is a cross-sectional view taken along line BB in FIG. 2A. 図3Aは、図2Aに示すサブマウント基板の変形例を示す正面図、図3Bは図3AのB−B線における断面図である。3A is a front view showing a modification of the submount substrate shown in FIG. 2A, and FIG. 3B is a cross-sectional view taken along line BB of FIG. 3A. 図4Aは、本発明の実施の形態3に係るサブマウント基板を示す正面図、図4Bは図4AのB−B線における断面図である。4A is a front view showing a submount substrate according to Embodiment 3 of the present invention, and FIG. 4B is a cross-sectional view taken along line BB in FIG. 4A. 図5Aは、図4Aに示すサブマウント基板の変形例を示す正面図、図5Bは図5AのB−B線における断面図である。5A is a front view showing a modification of the submount substrate shown in FIG. 4A, and FIG. 5B is a cross-sectional view taken along line BB of FIG. 5A. 他の変形例に係るサブマウント基板の変形例を示す断面図である。It is sectional drawing which shows the modification of the submount board | substrate which concerns on another modification. さらに他の変形例に係るサブマウント基板の変形例を示す断面図である。It is sectional drawing which shows the modification of the submount board | substrate which concerns on another modification.

10、10B、10C、10D、10E、10V、10U…サブマウント基板
11、11B…第1の折曲片
12、12B…第2の折曲片
13、13B…被実装面
14、14B…素子実装面
15、15B、15C…絶縁層
16、16D…配線パターン
17…リフレクタ
20…支持基板
30、30B、30C、30D…半導体素子
40、40C、40D、40E…ヒートシンク部材
10, 10B, 10C, 10D, 10E, 10V, 10U ... Submount substrate 11, 11B ... First bent piece 12, 12B ... Second bent piece 13, 13B ... Mounted surface 14, 14B ... Element mounted Surface 15, 15B, 15C ... Insulating layer 16, 16D ... Wiring pattern 17 ... Reflector 20 ... Support substrate 30, 30B, 30C, 30D ... Semiconductor element 40, 40C, 40D, 40E ... Heat sink member

Claims (7)

半導体素子を実装可能であり、さらに該半導体素子を実装した状態で支持基板に実装可能なサブマウント基板であって、
前記サブマウント基板が導電性を備える材質で構成されており、
前記サブマウント基板は第1の折曲片と第2の折曲片とを有し、前記第1の折曲片と第2の折曲片とが折曲されて連結されており、
第1の折曲片が支持基板に実装される被実装面を有し、
第2の折曲片が、半導体素子を実装するための配線部を形成した素子実装面を有しており、
前記被実装面と素子実装面とが、折曲前の状態で前記サブマウント基板の同一面に位置するように構成してなることを特徴とするサブマウント基板。
A submount substrate that can be mounted on a support substrate in a state where the semiconductor element can be mounted and the semiconductor element is mounted,
The submount substrate is made of a conductive material,
The submount substrate has a first bent piece and a second bent piece, and the first bent piece and the second bent piece are bent and connected,
The first bent piece has a mounting surface to be mounted on the support substrate;
The second bent piece has an element mounting surface on which a wiring portion for mounting a semiconductor element is formed ;
The submount substrate is configured such that the mounting surface and the element mounting surface are positioned on the same surface of the submount substrate before being bent .
請求項1に記載のサブマウント基板であって、
第1の折曲片と第2の折曲片とが一体に構成されており、折曲することによって前記第1の折曲片と第2の折曲片とで断面L字状を構成してなることを特徴とするサブマウント基板。
The submount substrate according to claim 1,
The first bent piece and the second bent piece are integrally formed, and the first bent piece and the second bent piece form an L-shaped cross section by bending. A submount substrate characterized by comprising:
請求項2に記載のサブマウント基板であって、
前記被実装面と素子実装面が、折曲前のサブマウント基板の同一面に位置することを特徴とするサブマウント基板。
The submount substrate according to claim 2,
The submount substrate, wherein the mounting surface and the device mounting surface are located on the same surface of the submount substrate before bending.
請求項1から3のいずれか一に記載のサブマウント基板であって、
前記サブマウント基板が、Al、Fe又はCu−W製の基板であることを特徴とするサブマウント基板。
A submount substrate according to any one of claims 1 to 3 ,
The submount substrate is a substrate made of Al, Fe or Cu-W.
請求項1から4のいずれか一に記載のサブマウント基板であって、さらに
前記サブマウント基板と熱伝導状態に接続されたヒートシンク部材を備えることを特徴とするサブマウント基板。
A submount substrate as claimed in any one of 4, the submount substrate, characterized in that it further comprises the sub-mount substrate and the thermally conductive heat sink connected member state.
請求項1から5のいずれか一に記載のサブマウント基板であって、
前記ヒートシンク部材が、前記サブマウント基板を載置した筐体であることを特徴とするサブマウント基板。
A submount substrate according to any one of claims 1 to 5 ,
A submount substrate, wherein the heat sink member is a casing on which the submount substrate is placed.
半導体発光素子と、
前記発光発光素子を実装したサブマウント基板と、
前記サブマウント基板を実装するための支持基板と、
を備える発光装置であって、
前記サブマウント基板がアルミニウム基板で構成され、
前記アルミニウム基板は第1の折曲片と第2の折曲片を有し、
前記第1の折曲片は支持基板に実装される被実装面を有し、
前記第2の折曲片は半導体素子を実装するための配線部を形成した素子実装面を有し、
前記第1の折曲片と第2の折曲片との間で折曲して断面をL字状に形成しており、
前記被実装面と素子実装面とが、折曲前の状態で前記サブマウント基板の同一面に位置するように構成してなることを特徴とする発光装置。
A semiconductor light emitting device;
A submount substrate on which the light emitting element is mounted;
A support substrate for mounting the submount substrate;
A light emitting device comprising:
The submount substrate is made of an aluminum substrate;
The aluminum substrate has a first bent piece and a second bent piece,
The first bent piece has a mounting surface to be mounted on a support substrate;
The second bent piece has an element mounting surface on which a wiring portion for mounting a semiconductor element is formed,
The first bent piece and the second bent piece are bent to form a cross section in an L shape ,
The light emitting device, wherein the mounting surface and the element mounting surface are configured to be positioned on the same surface of the submount substrate before being bent .
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