JP4768699B2 - 電力導入装置及び成膜方法 - Google Patents
電力導入装置及び成膜方法 Download PDFInfo
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- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/50—Substrate holders
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6831—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68792—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the construction of the shaft
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
- H01J2237/2001—Maintaining constant desired temperature
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T279/00—Chucks or sockets
- Y10T279/23—Chucks or sockets with magnetic or electrostatic means
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- Microelectronics & Electronic Packaging (AREA)
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- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
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- Physical Vapour Deposition (AREA)
- Hall/Mr Elements (AREA)
- Drying Of Semiconductors (AREA)
Description
基板を保持するための吸着力を発生させる静電チャックを有する基板ホルダと、
前記基板ホルダを回転可能に支持する支柱と、
前記支柱を介して前記基板ホルダを回転させる回転駆動機構と、
前記支柱を支持する筐体部と、
前記静電チャックに供給するための電力を外部電源から導入する電力導入機構と、を備え、
前記電力導入機構は、
前記支柱の端部に固定され、当該支柱とともに回転が可能な第1の導電性環状部材と、
前記筐体部に固定され、前記第1の導電性環状部材と面接触する第2の導電性環状部材と、
供給された第1電圧を前記第2の導電性環状部材及び前記第1の導電性環状部材を介して、前記静電チャックの電極に導入するための第1電力導入部材と、を備えることを特徴とする。
図1、図2A乃至Cを参照して本発明に係る電力導入装置の第1実施形態を説明する。図1は電力導入装置の全体構成を示す縦断面図を示し、図2Aは電力導入機構の拡大縦断面図を示す。
図1において、電力導入装置10は、真空室11に、内部を所要の減圧状態にする排気装置12と、プラズマ発生に用いられるガスを導入するガス供給装置13とターゲット14と、ターゲット14に電力を供給する電源15(直流電源等)を備える。ターゲット14には成膜物質に応じた材料が用いられる。排気装置12の前段にはバルブ12aが付されている。またターゲット14と電源15は例えば整合器16を介して接続される。
次に、図1を参照して、電力導入装置10を用いたスパッタ成膜方法について説明する。本処理は、コントローラ100の全体的な制御の下に実行される。まず、第1ステップ(S1)として、基板21は、搬送ロボット(不図示)により搬送され、バルブ(不図示)を通して真空室11内に搬送される。そして、真空室11内に搬送された基板21は、基板ホルダ17のステージ22の載置面上の保持位置に保持される。
次に図2Aを参照して電力導入機構30の内部構造を詳細に説明する。図2Aは、電力導入機構30における要部であるロータリジョイント部34の詳細構造を示している。図2Aでは、電力導入装置の上側部分は、適宜な箇所で切断して示している。参照番号18は前述した回転支柱であって、その下端部のみが示されている。参照番号41は電力導入機構30における回転支柱18を支持するための筐体部であり、導電性部材で作られている。
次に図3、図4、図5を参照して本発明に係る電力導入装置の第2の実施形態を説明する。
11 真空室
12 排気装置
13 ガス供給装置
14 ターゲット
15 電源
16 整合器
23 静電チャック
30 電力導入機構
Claims (6)
- 基板を保持するための吸着力を発生させる静電チャックを有する基板ホルダと、
前記基板ホルダを回転可能に支持する支柱と、
前記支柱を介して前記基板ホルダを回転させる回転駆動機構と、
前記支柱を支持する筐体部と、
前記静電チャックに供給するための電力を外部電源から導入する電力導入機構と、を備え、
前記電力導入機構は、
前記支柱の端部に固定され、当該支柱とともに回転が可能な第1の導電性環状部材と、
前記筐体部に固定され、前記第1の導電性環状部材と面接触する第2の導電性環状部材と、
供給された第1電圧を前記第2の導電性環状部材及び前記第1の導電性環状部材を介して、前記静電チャックの電極に導入するための第1電力導入部材と、を備えることを特徴とする電力導入装置。 - 加熱部材の加熱により前記基板ホルダを加熱する加熱機構と、
供給された冷媒の循環により前記基板ホルダを冷却する冷却機構と、
前記筐体部、前記第2の導電性環状部材、前記第1の導電性環状部材、及び前記支柱の内部を連通し、前記冷却機構に前記冷媒を供給するための第1流路と、
前記支柱、前記第1の導電性環状部材、前記第2の導電性環状部材及び前記筐体部の内部を連通し、前記冷却機構から前記冷媒を排出するための第2流路と、
更に有することを特徴とする請求項1に記載の電力導入装置。 - 前記電力導入機構は、
前記第1の導電性環状部材と同心円状に設けられた第3の導電性環状部材と、
前記第3の導電性環状部材と面接触し、前記第2の導電性環状部材と同心円状に設けられた第4の導電性環状部材と、
供給された第2電圧を前記第4の導電性環状部材及び前記第3の導電性環状部材を介して、前記静電チャックの電極に導入するための第2電力導入部材と、を備えることを特徴とする請求項1に記載の電力導入装置。 - 前記静電チャックは、正負双極型の第1電極と、第2電極と、を有し、
前記第1電力導入部材は、供給された第1電圧を、前記第2の導電性環状部材及び前記第1の導電性環状部材を介して、前記第1電極に導入し、
前記第2電力導入部材は、供給された第2電圧を、前記第4の導電性環状部材及び前記第3の導電性環状部材を介して、前記第2電極に導入することを特徴とする請求項3に記載の電力導入装置。 - 真空室内におけるプラズマの発生を検出する検出手段と、
前記検出手段による検出結果に基づき、前記第1電圧及び前記第2電圧を制御するコントローラと、を更に備えることを特徴とする請求項4に記載の電力導入装置。 - 基板に成膜する成膜方法であって、
真空室内に搬送された基板を、ステージ上に載置するステップと、
請求項1に記載の電力導入装置により、外部電源ら供給される電圧を静電チャックの電極に導入して、当該静電チャックが発生する吸着力により前記ステージ上に載置された前記基板を固定するステップと、
前記基板ホルダを回転させるステップと、
前記真空室内に予め定められた流量のガスを導入するステップと、
前記ガスを放電することにより、ターゲットからスパッタされた材料を前記基板上に蒸着するステップと、
を有することを特徴とする成膜方法。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
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JP2007275635A JP4768699B2 (ja) | 2006-11-30 | 2007-10-23 | 電力導入装置及び成膜方法 |
US11/945,256 US8182660B2 (en) | 2006-11-30 | 2007-11-26 | Power supply apparatus and deposition method using the power supply apparatus |
EP07121902A EP1928019B1 (en) | 2006-11-30 | 2007-11-29 | Power supply apparatus and deposition method using the power supply apparatus |
AT07121902T ATE529890T1 (de) | 2006-11-30 | 2007-11-29 | Stromversorgungsgerät und auftragungsverfahren unter verwendung des stromversorgungsgeräts |
CN200710196055.4A CN100552913C (zh) | 2006-11-30 | 2007-11-30 | 电源设备和利用电源设备的沉积方法 |
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JP2006322747 | 2006-11-30 | ||
JP2006322747 | 2006-11-30 | ||
JP2007275635A JP4768699B2 (ja) | 2006-11-30 | 2007-10-23 | 電力導入装置及び成膜方法 |
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JP2008156746A JP2008156746A (ja) | 2008-07-10 |
JP4768699B2 true JP4768699B2 (ja) | 2011-09-07 |
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US (1) | US8182660B2 (ja) |
EP (1) | EP1928019B1 (ja) |
JP (1) | JP4768699B2 (ja) |
CN (1) | CN100552913C (ja) |
AT (1) | ATE529890T1 (ja) |
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CN101882568B (zh) * | 2010-07-07 | 2012-07-04 | 无锡华晶电子设备制造有限公司 | 分割机构 |
WO2012011149A1 (ja) * | 2010-07-21 | 2012-01-26 | キヤノンアネルバ株式会社 | 電力導入装置及び電力導入装置を用いた真空処理装置 |
US9398796B2 (en) * | 2011-03-22 | 2016-07-26 | The Beachwaver Co. | Hair styling device |
WO2013088603A1 (ja) * | 2011-12-13 | 2013-06-20 | キヤノンアネルバ株式会社 | 電力導入装置及び電力導入装置を用いた真空処理装置 |
KR20140108267A (ko) * | 2011-12-15 | 2014-09-05 | 캐논 아네르바 가부시키가이샤 | 기판 홀더 장치 및 진공 처리 장치 |
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- 2007-11-29 AT AT07121902T patent/ATE529890T1/de not_active IP Right Cessation
- 2007-11-29 EP EP07121902A patent/EP1928019B1/en active Active
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EP1928019A3 (en) | 2010-06-02 |
EP1928019B1 (en) | 2011-10-19 |
JP2008156746A (ja) | 2008-07-10 |
US8182660B2 (en) | 2012-05-22 |
EP1928019A2 (en) | 2008-06-04 |
CN100552913C (zh) | 2009-10-21 |
CN101192557A (zh) | 2008-06-04 |
ATE529890T1 (de) | 2011-11-15 |
US20080258411A1 (en) | 2008-10-23 |
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