JP4520224B2 - Method and apparatus for applying sealant to liquid crystal panel - Google Patents
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Description
本発明は、液晶パネルに係り、特に当該液晶パネルを構成する2枚の基板を封止するためのシール剤塗布方法とその装置に関する。 The present invention relates to a liquid crystal panel, and more particularly to a sealing agent coating method and apparatus for sealing two substrates constituting the liquid crystal panel.
液晶表示装置には種々の形式が実用化されているが、現在主流となっているアクティブ・マトリクス型の液晶表示装置は、画素選択回路を形成した薄膜トランジスタ基板(TFT基板)と複数色のカラーフィルタを形成したカラーフィルタ基板(CF基板)の間に液晶層を挟持して構成される。TFT基板は、その大部分の面積を占める画素領域(表示領域)と、この画素領域の外側に配置される駆動回路領域およびその他の回路領域を有する。 Various types of liquid crystal display devices have been put into practical use. Currently, active matrix liquid crystal display devices, which are the mainstream, include a thin film transistor substrate (TFT substrate) on which a pixel selection circuit is formed and a color filter of multiple colors. A liquid crystal layer is sandwiched between color filter substrates (CF substrates) on which are formed. The TFT substrate has a pixel region (display region) that occupies most of the area, and a drive circuit region and other circuit regions arranged outside the pixel region.
画素領域には、通常は3色(赤:R、緑:G、青:B)の副画素(サブピクセル)で構成される1カラー画素(ピクセル)がマトリクス状に配置されている。各副画素は薄膜トランジスタ回路(画素回路)で構成される。一方、CF基板には、TFT基板に有する画素領域を構成する通常は3色の各副画素に対向して配置された赤:R、緑:G、青:Bのカラーフィルタが形成されている。 In the pixel area, normally, one color pixel (pixel) composed of sub-pixels (sub-pixels) of three colors (red: R, green: G, blue: B) is arranged in a matrix. Each subpixel is composed of a thin film transistor circuit (pixel circuit). On the other hand, on the CF substrate, color filters of red: R, green: G, and blue: B, which are arranged to face each of the sub-pixels of the three colors that constitute the pixel region of the TFT substrate, are formed. .
CF基板には、ガラスを好適とする透明絶縁基板の主面に隣接するフィルタ間の光色を防止して色純度とコントラストを向上させるための遮光膜(ブラックマトリクス)と各色のカラーフィルタが形成される。その後、表面に有機材料からなる保護膜(平坦化膜、またはオーバーコート膜とも称する)を形成している。そして、所謂IPS型では保護膜の上に直接配向膜を成膜するが、TN型では、この保護膜の上にITOなどの透明電極を形成している。 On the CF substrate, a light-shielding film (black matrix) and color filters for each color are formed to prevent light color between the filters adjacent to the main surface of the transparent insulating substrate, preferably made of glass, to improve color purity and contrast. Is done. Thereafter, a protective film (also referred to as a planarization film or an overcoat film) made of an organic material is formed on the surface. In the so-called IPS type, an alignment film is formed directly on the protective film. In the TN type, a transparent electrode such as ITO is formed on the protective film.
このような電極あるいはカラーフィルタ等を含む各種機能膜を形成した2枚の基板を張り合わせ、貼り合わせ間隙に液晶を封入して液晶パネルが形成される。2枚の基板の貼り合わせは、一方の基板(例えばTFT基板)の前記の画素領域の外側を周回してシール剤を畝状に塗布し、他方の基板(例えばCF基板)を所定の位置関係で貼り合わせ、シール剤を硬化させて封止する。なお、シール剤を塗布する際に、周回して塗布するシール剤の畝の一部に液晶を注入するための不連続部を設けて、これを液晶注入口とするのが一般的である。しかし、所謂ポッティング(液晶滴下方式)を採用するものでは、原理的にはシール剤に不連続部を設ける必要はない。この様なシール剤の基板への塗布はディスペンサで自動的に行われる。そして、その塗布幅、塗布高さ、塗布位置を含む塗布寸法は、スポット光源を持つレーザ変位計を用いている。 A liquid crystal panel is formed by laminating two substrates on which various functional films including such electrodes or color filters are formed and enclosing liquid crystal in a bonding gap. The two substrates are bonded together by applying a sealant around the outside of the pixel region of one substrate (for example, TFT substrate) and applying the other substrate (for example, CF substrate) to a predetermined positional relationship. Then, the sealant is cured and sealed. In general, when applying the sealing agent, a discontinuous portion for injecting liquid crystal is provided in a part of the sealing agent ridge that is circulated and used as a liquid crystal injection port. However, in the case of adopting so-called potting (liquid crystal dropping method), in principle, it is not necessary to provide discontinuous portions in the sealing agent. Application of such a sealing agent to the substrate is automatically performed by a dispenser. A laser displacement meter having a spot light source is used for coating dimensions including the coating width, coating height, and coating position.
図8は、基板に塗布したシール剤の断面とその寸法をレーザ変位計を用いて測定したときの測定波形の説明図である。図8(a)は基板SUBの表面に畝状に塗布したシール剤SLを当該畝状塗布シールを横断する方向の断面図、図8(b)は図8(a)のシール剤をレーザ変位計で測定したときの測定波形を示す図である。一般に、塗布されたシール剤SLの畝と交差する方向の断面形状は図8(a)に示したように略凸状となる。 FIG. 8 is an explanatory diagram of measurement waveforms when the cross section of the sealing agent applied to the substrate and the dimensions thereof are measured using a laser displacement meter. FIG. 8A is a cross-sectional view of the sealing agent SL applied in a bowl shape on the surface of the substrate SUB, and FIG. 8B is a laser displacement of the sealing agent in FIG. 8A. It is a figure which shows a measurement waveform when it measures with a meter. In general, the cross-sectional shape in the direction intersecting with the wrinkles of the applied sealing agent SL is substantially convex as shown in FIG.
このシール剤SLの寸法をレーザ変位計を用いて測定する場合は、そのレーザのスポット光がシール剤SLの畝と交差する方向になるようにレーザ変位計を移動させる。そして、基板面と塗布されたシール剤から反射するレーザ光量の変化を図8(b)に示したような波形電気信号として取得し、その信号の波形を利用して測定する。 When measuring the dimension of the sealant SL using a laser displacement meter, the laser displacement meter is moved so that the spot light of the laser is in a direction intersecting with the edge of the sealant SL. Then, a change in the amount of laser light reflected from the substrate surface and the applied sealant is acquired as a waveform electrical signal as shown in FIG. 8B, and is measured using the waveform of the signal.
この種のシール剤の塗布に関する特許文献は多数あるが、塗布したシール剤の幅寸法の測定に関するものとしては、基板に塗布したシール剤の幅を基板に形成した目盛により測定するものが特許文献1に開示されている。
レーザ変位計を用いたシール剤の塗布寸法に関して、図8(b)の波形SIGから塗布されたシール剤の塗布高さHは正確に測定できる。しかし、レーザ変位計の測定信号は基板の面とシール剤の境界すなわちシール剤の立ち上がり位置と立ち下がり位置で波形SIGは図8(b)に示したように広がりΔD1、ΔD2を持つため、シール剤の塗布幅Wを正確に測定することが難しい。シール剤の塗布寸法の高さと幅のばらつきはシール剤の過不足、所定位置からの塗布ずれが原因である場合があり、基板を貼り合わせたときにシール剤の画素領域への侵入、基板の端縁へのシール剤のだれ、あるいは液晶パネルのセルギャップ(2枚の基板間の間隙)の不均一に起因する表示品質の劣化の原因ともなる。 With respect to the application size of the sealant using the laser displacement meter, the application height H of the sealant applied from the waveform SIG in FIG. 8B can be accurately measured. However, the measurement signal of the laser displacement meter is the boundary between the substrate surface and the sealing agent, that is, the rising and falling positions of the sealing agent, and the waveform SIG has spreads ΔD1 and ΔD2 as shown in FIG. It is difficult to accurately measure the coating width W of the agent. Variations in the height and width of the sealant application dimensions may be due to excess or insufficient sealant and application deviation from the specified position. When the substrates are bonded together, the sealant may enter the pixel area, It also causes deterioration of display quality due to dripping of the sealing agent at the edge or non-uniformity of the cell gap (gap between the two substrates) of the liquid crystal panel.
本発明の目的は、シール剤の塗布寸法の高さと幅を正確に測定することにより、所定の位置に正確な塗布量でシール剤を塗布するための測定方法とその装置を提供することにある。 An object of the present invention is to provide a measuring method and an apparatus for applying a sealing agent at a predetermined position with an accurate application amount by accurately measuring the height and width of the sealing agent application dimension. .
本発明による液晶パネルのシール剤塗布方法は、塗布部と塗布制御部を有するシール剤塗布装置を用いて該シール剤を畝状に塗布した一方の基板に他方の基板を貼り合わせて液晶パネルとして一体化するための方法である。すなわち、
前記畝状に塗布したシール剤の長手方向に撮像装置とレーザ変位計とを併設し、
前記レーザ変位計により前記塗布された畝状シール剤の塗布高さを計測し、
前記撮像装置により前記塗布された畝状シール剤の塗布幅と前記基板上の塗布位置とを計測し、
前記計測した塗布高さのデータと塗布幅のデータとから塗布されたシール剤の塗布量データを計算し、
前記計算された塗布位置により塗布位置のずれ量データを計算し、
前記計算で得られたシール剤の塗布量のデータと塗布位置のずれ量のデータを前記シール剤塗布装置の前記塗布制御部にフィードバックして、基板上の所定位置に所定量のシール剤を連続して塗布することを特徴とする。
The method for applying a sealant to a liquid crystal panel according to the present invention comprises a sealant application device having an application part and an application control part. It is a method for integrating. That is,
An image pickup device and a laser displacement meter are provided in the longitudinal direction of the sealant applied in a bowl shape,
Measure the application height of the applied bowl-shaped sealant by the laser displacement meter,
Measure the application width and application position on the substrate of the coating-like sealant applied by the imaging device,
Calculate application amount data of the applied sealant from the measured application height data and application width data,
Calculate the deviation data of the application position by the calculated application position,
The sealant application amount data and the application position shift amount data obtained by the calculation are fed back to the application controller of the sealant application device, and a predetermined amount of sealant is continuously applied to a predetermined position on the substrate. And is applied.
また、本発明による液晶パネルのシール剤塗布装置は、シール剤を畝状に塗布した一方の基板に他方の基板を貼り合わせて液晶パネルとして一体化するための装置である。すなわち、
前記シール剤塗布装置は、塗布部と塗布制御部を有するシール剤塗布系と、
前記基板に塗布された畝状のシール剤の長手方向に配置したレーザ変位計と撮像装置、および該レーザ変位計の計測出力信号を処理して前記畝状シール剤の塗布高さデータを計算する変位計算部と、該撮像装置の撮像出力信号を処理して畝状シール剤の塗布幅データと前記基板上の塗布位置のデータを計算して、シール剤の塗布量データと塗布位置のずれ量データを生成し、生成した前記シール剤の塗布量データと塗布位置のずれ量データを前記シール剤塗布系の塗布制御部にフィードバックする検査制御部を有する塗布シール剤検査系とを有することを特徴とする。
In addition, the liquid crystal panel sealant application device according to the present invention is an apparatus for bonding the other substrate to one substrate on which the sealant is applied in a bowl shape and integrating the other substrate as a liquid crystal panel. That is,
The sealant application device includes a sealant application system having an application part and an application control part;
A laser displacement meter and an imaging device arranged in the longitudinal direction of the bowl-shaped sealant applied to the substrate, and a measurement output signal of the laser displacement meter are processed to calculate the application height data of the bowl-shaped sealant. Displacement calculation unit, processing the imaging output signal of the imaging device to calculate the application width data of the bowl-shaped sealant and the application position data on the substrate, and the deviation amount between the application amount of the sealant and the application position An application sealant inspection system having an inspection control unit that generates data and feeds back the generated application amount data of the sealant and application position shift amount data to the application control unit of the sealant application system. And
前記検査制御部は、レーザ変位計により計測された前記塗布高さ×前記撮像装置により計測された塗布幅に所定の係数を乗じて前記塗布量データ生成する。なお、前記撮像装置は、CCDカメラとするのが好適である。 The inspection control unit generates the coating amount data by multiplying the coating height measured by the laser displacement meter × the coating width measured by the imaging device by a predetermined coefficient. The imaging device is preferably a CCD camera.
前記レーザ変位計による前記塗布された畝状シール剤の塗布高さの計測時には、前記塗布された畝状シール剤の立ち上がり領域と立ち下がり領域の信号をマスクする。 When measuring the application height of the applied saddle-shaped sealant by the laser displacement meter, the rising area and falling area signals of the applied saddle-shaped sealant are masked.
本発明は、上記の構成および後述する実施の形態に記載の構成に限定されるものではなく、本発明の技術思想を逸脱することなく、種々の変更が可能であることは言うまでもない。 The present invention is not limited to the above-described configuration and the configuration described in the embodiments described later, and it goes without saying that various modifications can be made without departing from the technical idea of the present invention.
本発明の液晶パネルのシール剤塗布方法と装置により、シール剤の立ち上がり部(基板とシール剤の一方の塗布境界)と立ち下がり部(基板とシール剤の他方の塗布境界)が正確に測定できることで塗布幅データと基準位置とのずれ量データを高精度で得ることができる。そして、この塗布幅データと塗布高さデータからその塗布量データを正確に得ることができる。これらのデータをシール塗布系の制御部にフィードバックすることで、所定の位置に所定の幅のシール剤を正確に塗布することが可能となり、シール剤の塗布むら(幅や位置、高さのばらつき)に起因する表示不良を低減することができる。 With the method and apparatus for applying the sealant of the liquid crystal panel of the present invention, the rising portion (one application boundary between the substrate and the sealant) and the falling portion (the other application boundary between the substrate and the sealant) can be accurately measured. Thus, deviation data between the application width data and the reference position can be obtained with high accuracy. The application amount data can be accurately obtained from the application width data and application height data. By feeding back these data to the control unit of the seal application system, it becomes possible to accurately apply a seal agent of a predetermined width to a predetermined position, and uneven application of the seal agent (variation in width, position, and height). ) Can be reduced.
以下、本発明の実施の形態について、実施例により詳細に説明する。 Hereinafter, embodiments of the present invention will be described in detail with reference to examples.
図1は、本発明のシール剤塗布装置の全体構成を説明する図である。このシール剤塗布装置は、シール剤塗布系(図1には塗布系と表記)と塗布シール剤検査系(図1には検査系と表記)とで構成される。シール剤塗布系は液晶パネルの基板SUBの表面にシール剤SLを吐出するノズルとシール剤供給機構を有する塗布部PLTと、塗布部PLTを制御する塗布制御部CTL−Aで構成される。 FIG. 1 is a diagram illustrating the overall configuration of the sealing agent application apparatus of the present invention. This sealant application device is composed of a sealant application system (indicated as an application system in FIG. 1) and an application sealant inspection system (indicated as an inspection system in FIG. 1). The sealant application system includes a nozzle that discharges the sealant SL onto the surface of the substrate SUB of the liquid crystal panel, an application unit PLT having a sealant supply mechanism, and an application control unit CTL-A that controls the application unit PLT.
また、塗布シール剤検査系は、基板SUBに塗布された畝状のシール剤SLの長手方向に配置したレーザ変位計LDMと撮像装置としてのCCDカメラCAM、および該レーザ変位計LDMの計測出力信号を処理して塗布された畝状シール剤SLの塗布高さデータを計算する変位計算部DMCと、該撮像装置の撮像出力信号を処理して畝状シール剤の塗布幅データと前記基板上の塗布位置のデータを計算する画像処理部IPRを有して、基板SUB上に塗布されたシール剤SLの塗布量データと塗布位置のずれ量データを生成して、生成した前記シール剤の塗布量データと塗布位置のずれ量データを前記シール剤塗布系の塗布制御部CTL−Aにフィードバックする検査制御部CTL−Iを有する。 Further, the coating sealant inspection system includes a laser displacement meter LDM arranged in the longitudinal direction of the bowl-shaped sealant SL applied to the substrate SUB, a CCD camera CAM as an imaging device, and a measurement output signal of the laser displacement meter LDM. Displacement calculation unit DMC for calculating application height data of cocoon-shaped sealing agent SL applied by processing, and imaging output signal of the imaging device to process application width data of cocoon-like sealing agent and on the substrate The image processing unit IPR that calculates application position data is used to generate application amount data and application position deviation data of the sealant SL applied on the substrate SUB, and the generated application amount of the sealant An inspection control unit CTL-I that feeds back data and application position deviation amount data to the application control unit CTL-A of the sealant application system is provided.
図2は、図1に示したレーザ変位計LDMとCCDカメラCAMの配置例の説明図である。基板SUBに塗布された畝状のシール剤SLの直上に図1のようにレーザ変位計LDMとCCDカメラCAMを配置する。符号FLDはCCDカメラCAMの視野、符号SGTはレーザ変位計LDMの測定領域を示す。この例では、シール剤SLの塗布幅を200μm乃至400μm、レーザ変位計LDMとCCDカメラCAMの配置間隔は70mmとしたが、これはあくまで一例に過ぎない。なお、C−C’はシール剤SLが塗布される基準位置を示す。 FIG. 2 is an explanatory diagram of an arrangement example of the laser displacement meter LDM and the CCD camera CAM shown in FIG. As shown in FIG. 1, a laser displacement meter LDM and a CCD camera CAM are arranged immediately above the bowl-shaped sealant SL applied to the substrate SUB. Reference symbol FLD indicates the field of view of the CCD camera CAM, and reference symbol SGT indicates the measurement region of the laser displacement meter LDM. In this example, the application width of the sealant SL is 200 μm to 400 μm, and the arrangement interval between the laser displacement meter LDM and the CCD camera CAM is 70 mm, but this is only an example. C-C 'indicates a reference position where the sealant SL is applied.
図3は、CCDカメラCAMが撮像した画像の説明図である。CCDカメラCAMで撮像された画像は図2の検査制御部CTL−Iの画像処理部IPRで微分処理等の輪郭強調、あるいはデジタルデータ処理により、シール剤SLの塗布幅Wを計算する。これと同時に、所定の塗布位置の中心C−C’との位置ずれ量を算出する。 FIG. 3 is an explanatory diagram of an image captured by the CCD camera CAM. The image picked up by the CCD camera CAM calculates the coating width W of the sealant SL by contour enhancement such as differentiation processing or digital data processing by the image processing unit IPR of the inspection control unit CTL-I in FIG. At the same time, the amount of positional deviation from the center C-C ′ of the predetermined application position is calculated.
図4は、レーザ変位計LDMの出力信号の説明図である。レーザ変位計LDMで計測された信号SIGは図8(b)で説明したように、シール剤の立ち上がり部(基板とシール剤の一方の塗布境界)と立ち下がり部(基板とシール剤の他方の塗布境界)に広がりΔD1、ΔD2を持つため、シール剤の塗布幅Wを正確に測定することが難しい。そこで、本実施例ではこの立ち上がり部と立ち下がり部の信号をマスクすることで、立ち上がり部と立ち下がり部の波形に影響されることなく信号SIGの高さHを求める。図中、M−M’はマスクされた信号SIGの最大高さ位置を示し、「0」は基板面に対応する基準レベルを示す。 FIG. 4 is an explanatory diagram of an output signal of the laser displacement meter LDM. As described with reference to FIG. 8B, the signal SIG measured by the laser displacement meter LDM has a rising portion (one application boundary between the substrate and the sealing agent) and a falling portion (the other of the substrate and the sealing agent). It is difficult to accurately measure the coating width W of the sealant because it has spread ΔD1 and ΔD2 on the coating boundary. Therefore, in this embodiment, the signal H at the rising edge and the falling edge is masked to obtain the height H of the signal SIG without being affected by the waveforms at the rising edge and the falling edge. In the figure, M-M ′ indicates the maximum height position of the masked signal SIG, and “0” indicates a reference level corresponding to the substrate surface.
なお、信号のマスクは、レーザ走査領域に物理的なマスクMSL、MKRを設置してもよいし、信号処理段階で当該立ち上がり部と立ち下がり部の信号をカットする方法を採用してもよい。 For signal masking, physical masks MSL and MKR may be provided in the laser scanning region, or a method of cutting the signals of the rising and falling portions in the signal processing stage may be employed.
図5は、図1に示したシール剤塗布装置の制御手順の説明図である。先ず、基板にシール剤を塗布する(ステップ0、以下S−0のように表記する)。塗布したシール剤の高さをレーザ変位計で計測する(S−1)。また、CCDカメラの撮像信号からシール剤の塗布幅と塗布位置を計測する(S−2)。計測したシール剤の高さ及び幅のデータからシール剤の塗布量を計算する(S−3)。塗布量の計算式は、以下のとおりである。すなわち、
塗布量=シール剤の高さ×シール剤の幅×所定係数
所定係数は、シール剤の塗布方向の単位長さである。
FIG. 5 is an explanatory diagram of a control procedure of the sealant application device shown in FIG. First, a sealing agent is applied to the substrate (step 0, hereinafter referred to as S-0). The height of the applied sealant is measured with a laser displacement meter (S-1). Further, the application width and application position of the sealing agent are measured from the image pickup signal of the CCD camera (S-2). The amount of sealant applied is calculated from the measured height and width data of the sealant (S-3). The formula for calculating the coating amount is as follows. That is,
Application amount = height of sealant x width of sealant x predetermined coefficient
The predetermined coefficient is a unit length in the application direction of the sealant.
次に、位置データから基準位置からの位置ずれ量を計算する(S−4)。そして、(S−3)で計算したシール剤の塗布量データと(S−4)で計算した位置ずれ量のデータを塗布系の塗布制御部CTL−Aにフィードバックする(S−5)。塗布制御部CTL−Aは、フィードバックされた塗布量データと位置ずれ量のデータに基づいて、塗布部PLTでのシール剤の塗布量と塗布位置を調整して(S−6)、シール剤を基板に塗布する(S−7)。以降、これを繰り返すことで、基板上の所定の位置に所定の幅のシール剤を正確に塗布することが可能となり、シール剤の塗布むら(幅や位置、高さのばらつき)に起因する表示不良を低減することができる。 Next, the amount of displacement from the reference position is calculated from the position data (S-4). Then, the sealant coating amount data calculated in (S-3) and the positional deviation amount data calculated in (S-4) are fed back to the coating system coating control unit CTL-A (S-5). The application control unit CTL-A adjusts the application amount and application position of the sealant in the application unit PLT based on the fed back application amount data and positional deviation amount data (S-6), and applies the sealant. It is applied to the substrate (S-7). Thereafter, by repeating this, it becomes possible to accurately apply a sealing agent having a predetermined width to a predetermined position on the substrate, and display caused by uneven application of the sealing agent (variation in width, position, and height). Defects can be reduced.
図6は、本発明のシール剤塗布方法と装置を用いて作製した液晶パネルの模式断面図である。また、図7は、本発明のシール剤塗布方法と装置を用いて作製する液晶パネルの薄膜トランジスタ基板の模式平面図である。この液晶パネルPNLは、図6に示したように、薄膜トランジスタ基板SUB1とカラーフィルタ基板SUB2をシール剤SLで貼り合わせて一体化される。薄膜トランジスタ基板SUB1の内面には画素を構成する薄膜トランジスタTFTが形成されている。一方、カラーフィルタ基板SUB2の内面にはカラーフィルタCFが各画素対応で形成されている。また、薄膜トランジスタ基板SUB1の端部でカラーフィルタ基板SUB2で覆われない部分には走査線駆動回路チップGDと信号線駆動回路チップDD(図7参照)が搭載されている。なお、符号LCは液晶層である。 FIG. 6 is a schematic cross-sectional view of a liquid crystal panel manufactured using the sealing agent coating method and apparatus of the present invention. FIG. 7 is a schematic plan view of a thin film transistor substrate of a liquid crystal panel manufactured using the sealing agent coating method and apparatus of the present invention. As shown in FIG. 6, the liquid crystal panel PNL is integrated by bonding the thin film transistor substrate SUB1 and the color filter substrate SUB2 with a sealant SL. A thin film transistor TFT constituting a pixel is formed on the inner surface of the thin film transistor substrate SUB1. On the other hand, a color filter CF is formed on the inner surface of the color filter substrate SUB2 corresponding to each pixel. Further, a scanning line driving circuit chip GD and a signal line driving circuit chip DD (see FIG. 7) are mounted on the end portion of the thin film transistor substrate SUB1 that is not covered with the color filter substrate SUB2. Reference numeral LC denotes a liquid crystal layer.
薄膜トランジスタ基板SUB1には、図7に示したように、走査線駆動回路チップGDで駆動される走査線GLと信号線駆動回路チップDDで駆動される信号線DLとの交差部に薄膜トランジスタで構成される多数の画素PXがマトリクス状に配置されている。このマトリクス状に配置された画素領域の外側を周回してシール剤Slが塗布され、その上にカラーフィルタ基板SUBを貼りあわせて固定される。 As shown in FIG. 7, the thin film transistor substrate SUB1 includes thin film transistors at intersections between the scanning lines GL driven by the scanning line driving circuit chip GD and the signal lines DL driven by the signal line driving circuit chip DD. Many pixels PX are arranged in a matrix. A sealant Sl is applied around the outside of the pixel regions arranged in a matrix, and the color filter substrate SUB is bonded and fixed thereon.
本発明は、上記した液晶パネルに限らず、他の形式の液晶パネル、あるいは液晶パネルと同様のフラットパネル表示装置、その他の同様の電子機器の封止に適用することができる。 The present invention is not limited to the liquid crystal panel described above, and can be applied to sealing of other types of liquid crystal panels, flat panel display devices similar to the liquid crystal panels, and other similar electronic devices.
SUB・・・・液晶パネルの基板、SL・・・・シール剤、PLT・・・・塗布部、CTL−A・・・・塗布制御部、LDM・・・・レーザ変位計、CAM・・・・撮像装置(CCDカメラ)、DMC・・・・変位計算部、IPR画像処理部、CTL−A・・・・塗布制御部、CTL−I・・・・検査制御部。
SUB ... Liquid crystal panel substrate, SL ... Sealing agent, PLT ... Application unit, CTL-A ... Application control unit, LDM ... Laser displacement meter, CAM ... -Imaging device (CCD camera), DMC ... Displacement calculation unit, IPR image processing unit, CTL-A ... Application control unit, CTL-I ... Inspection control unit.
Claims (6)
前記畝状に塗布したシール剤の長手方向に撮像装置とレーザ変位計とを併設し、
前記レーザ変位計により前記塗布された畝状シール剤の塗布高さを計測し、
前記撮像装置により前記塗布された畝状シール剤の塗布幅と前記基板上の塗布位置とを計測し、
前記計測した塗布高さのデータと塗布幅のデータとから塗布されたシール剤の塗布量データを計算し、
前記計算された塗布位置により塗布位置のずれ量データを計算し、
前記計算で得られたシール剤の塗布量のデータと塗布位置のずれ量のデータを前記シール剤塗布装置の前記塗布制御部にフィードバックして、基板上の所定位置に所定量のシール剤を連続して塗布することを特徴とする液晶パネルのシール剤塗布方法。 Sealing agent coating method for liquid crystal panel for laminating one substrate to one substrate coated with the sealing agent in a bowl shape using a sealing agent coating apparatus having a coating unit and a coating control unit and integrating them as a liquid crystal panel Because
An image pickup device and a laser displacement meter are provided in the longitudinal direction of the sealant applied in a bowl shape,
Measure the application height of the applied bowl-shaped sealant by the laser displacement meter,
Measure the application width and application position on the substrate of the coating-like sealant applied by the imaging device,
Calculate application amount data of the applied sealant from the measured application height data and application width data,
Calculate the deviation data of the application position by the calculated application position,
The sealant application amount data and the application position shift amount data obtained by the calculation are fed back to the application controller of the sealant application device, and a predetermined amount of sealant is continuously applied to a predetermined position on the substrate. And applying the sealing agent for a liquid crystal panel.
前記シール剤塗布装置は、塗布部と塗布制御部を有するシール剤塗布系と、
前記基板に塗布された畝状のシール剤の長手方向に配置したレーザ変位計と撮像装置、および該レーザ変位計の計測出力信号を処理して前記畝状シール剤の塗布高さデータを計算する変位計算部と、該撮像装置の撮像出力信号を処理して畝状シール剤の塗布幅データと前記基板上の塗布位置のデータを計算して、シール剤の塗布量データと塗布位置のずれ量データを生成し、生成した前記シール剤の塗布量データと塗布位置のずれ量データを前記シール剤塗布系の塗布制御部にフィードバックする検査制御部を有する塗布シール剤検査系とを有することを特徴とする液晶パネルのシール剤塗布装置。 A sealant coating device for a liquid crystal panel for laminating one substrate to one substrate coated with a sealant in a bowl shape and integrating it as a liquid crystal panel,
The sealant application device includes a sealant application system having an application part and an application control part;
A laser displacement meter and an imaging device arranged in the longitudinal direction of the bowl-shaped sealant applied to the substrate, and a measurement output signal of the laser displacement meter are processed to calculate the application height data of the bowl-shaped sealant. Displacement calculation unit, processing the imaging output signal of the imaging device to calculate the application width data of the bowl-shaped sealant and the application position data on the substrate, and the deviation amount between the application amount of the sealant and the application position An application sealant inspection system having an inspection control unit that generates data and feeds back the generated application amount data of the sealant and application position shift amount data to the application control unit of the sealant application system. Liquid crystal panel sealant coating device.
The liquid crystal panel sealant coating apparatus according to claim 4, wherein the imaging device is a CCD camera.
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