JP4555664B2 - 粒子計数装置 - Google Patents
粒子計数装置 Download PDFInfo
- Publication number
- JP4555664B2 JP4555664B2 JP2004318142A JP2004318142A JP4555664B2 JP 4555664 B2 JP4555664 B2 JP 4555664B2 JP 2004318142 A JP2004318142 A JP 2004318142A JP 2004318142 A JP2004318142 A JP 2004318142A JP 4555664 B2 JP4555664 B2 JP 4555664B2
- Authority
- JP
- Japan
- Prior art keywords
- particle
- pulse
- output
- counting
- particles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000002245 particle Substances 0.000 title claims description 158
- 238000005259 measurement Methods 0.000 claims description 34
- 238000006243 chemical reaction Methods 0.000 claims description 12
- 238000001514 detection method Methods 0.000 description 5
- 238000002474 experimental method Methods 0.000 description 5
- 238000005070 sampling Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 239000004793 Polystyrene Substances 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 239000004816 latex Substances 0.000 description 3
- 229920000126 latex Polymers 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 229920002223 polystyrene Polymers 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 238000011109 contamination Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000000149 argon plasma sintering Methods 0.000 description 1
- 230000001174 ascending effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
Images
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
21…流路
21a…吸気口
21b…排気口
25…ヒータ(空気導入手段)
26…発光手段
28…受光手段
30…出力回路(出力手段)
31…電流電圧変換回路
32…増幅回路
33…電圧比較回路
34…矩形波発生回路
35…論理積回路
37…マイコン(計数手段)
R…測定領域
Claims (2)
- 導入した空気を測定領域に導くとともに、発光手段によって前記測定領域に光を照射し、空気中に含まれる粒子からの散乱光を受光手段により受光し、該受光手段からの出力を出力手段によってデジタルパルスに変換して出力する粒子計数用センサと、
前記粒子計数用センサからの出力パルスに基づいて粒子数を計数する計数手段とを備えた粒子計数装置において、
前記粒子計数用センサの出力手段は、
前記受光手段から出力されたパルス電流をパルス電圧に変換して出力する電流電圧変換回路と、
予め設定された計数対象粒子径以上の粒子の通過により、前記電流電圧変換回路から基準電圧値より大きなパルス電圧が入力されるとHighとなり、基準電圧値より小さなパルス電圧が入力されるとLowとなるデジタルパルスを出力する比較回路と、
最小の計数対象粒子径の粒子が通過した場合のデジタルパルスのHigh−Low間のパルス幅より小さいパルス幅の矩形波を出力する矩形波発生回路と、
これら比較回路と矩形波発生回路との論理積を出力する論理積回路とを備え、
前記計数手段は、前記出力手段の論理積回路から入力された矩形波のパルス数を計数して演算したパルス幅と、前記最小計数対象粒子径より径が大きい粒子が通過した場合の比較パルス幅とを比較し、出力パルス幅が比較パルス幅以下の場合には1個の粒子が通過したと計数し、出力パルス幅が比較パルス幅より大きい場合には2個の粒子が通過したと計数するようにしたことを特徴とする粒子計数装置。 - 最小の計数対象粒子径は0.3ミクロンであり、比較パルス幅とする計数対象粒子径は1ミクロンであることを特徴とする請求項1に記載の粒子計数装置。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004318142A JP4555664B2 (ja) | 2004-11-01 | 2004-11-01 | 粒子計数装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004318142A JP4555664B2 (ja) | 2004-11-01 | 2004-11-01 | 粒子計数装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006126137A JP2006126137A (ja) | 2006-05-18 |
JP4555664B2 true JP4555664B2 (ja) | 2010-10-06 |
Family
ID=36721007
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004318142A Expired - Lifetime JP4555664B2 (ja) | 2004-11-01 | 2004-11-01 | 粒子計数装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4555664B2 (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102383211B1 (ko) * | 2015-07-09 | 2022-04-07 | 코웨이 주식회사 | 먼지 구별 장치 및 공기 청정기 |
CN110895236A (zh) * | 2019-12-17 | 2020-03-20 | 苏州苏信环境科技有限公司 | 光学空气粒子计数传感器稳定性测试系统 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05306989A (ja) * | 1981-05-26 | 1993-11-19 | Technicon Instr Corp | 混在する粒子の重複検出による誤差の補正装置 |
JPH05322885A (ja) * | 1991-05-14 | 1993-12-07 | Toa Medical Electronics Co Ltd | 尿中の細胞分析装置 |
JPH08122252A (ja) * | 1994-10-26 | 1996-05-17 | Matsushita Electric Works Ltd | ダストセンサ |
JPH11237329A (ja) * | 1998-02-23 | 1999-08-31 | Rion Co Ltd | 粒子計数装置 |
JP2003177086A (ja) * | 2001-12-12 | 2003-06-27 | Horiba Ltd | 粒子計数装置の計数方法 |
-
2004
- 2004-11-01 JP JP2004318142A patent/JP4555664B2/ja not_active Expired - Lifetime
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05306989A (ja) * | 1981-05-26 | 1993-11-19 | Technicon Instr Corp | 混在する粒子の重複検出による誤差の補正装置 |
JPH05322885A (ja) * | 1991-05-14 | 1993-12-07 | Toa Medical Electronics Co Ltd | 尿中の細胞分析装置 |
JPH08122252A (ja) * | 1994-10-26 | 1996-05-17 | Matsushita Electric Works Ltd | ダストセンサ |
JPH11237329A (ja) * | 1998-02-23 | 1999-08-31 | Rion Co Ltd | 粒子計数装置 |
JP2003177086A (ja) * | 2001-12-12 | 2003-06-27 | Horiba Ltd | 粒子計数装置の計数方法 |
Also Published As
Publication number | Publication date |
---|---|
JP2006126137A (ja) | 2006-05-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN109791104B (zh) | 颗粒物传感器装置 | |
US20200011779A1 (en) | Highly integrated optical particle counter (opc) | |
KR102373164B1 (ko) | 유동 및 버블 검출 시스템을 가지는 자동 전력 제어 액체 입자 계수기 | |
CN101715550A (zh) | 紧凑型、低成本的粒子传感器 | |
JP6455470B2 (ja) | 粒子センサ、及びそれを備えた電子機器 | |
EP1975896B1 (en) | Smoke detector and sampling air supplying method for smoke detector | |
CN104266947A (zh) | 气溶胶粒子浓度传感器及其检测方法 | |
WO2018045768A1 (zh) | 家用电器、粉尘传感器及其标定方法、标定装置 | |
JP2011097861A (ja) | 微生物検出装置および検出方法 | |
JPWO2019167485A1 (ja) | 粒子検出センサ | |
JP4555664B2 (ja) | 粒子計数装置 | |
JP2008039735A (ja) | 粒子計測装置 | |
CN106442249B (zh) | 粉尘检测装置 | |
JP2006010353A (ja) | 微粒子測定装置 | |
CN207457013U (zh) | 一种双工作模式的光学粒子传感器 | |
JP2016212024A (ja) | 微粒子検知装置 | |
JP2012189492A (ja) | パーティクルカウンタ | |
CN204165870U (zh) | 气溶胶粒子浓度传感器 | |
JP3780701B2 (ja) | 煙感知装置 | |
CN106290096A (zh) | 一种家用电器、粉尘传感器及其标定方法、标定装置 | |
CN217385122U (zh) | 一种用于检测粉尘浓度的散射腔装置 | |
JP2004303266A (ja) | 煙感知装置 | |
WO2024157676A1 (ja) | 粒子計測装置 | |
JPH0743299A (ja) | 微粉粒子モニター | |
JPH08271424A (ja) | 微粒子検出センサ |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20070525 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20090708 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20090901 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20091019 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20100302 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20100331 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20100525 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20100528 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20100622 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20100716 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130723 Year of fee payment: 3 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 4555664 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |