JP4437672B2 - 頭部付きネジの検査方法 - Google Patents
頭部付きネジの検査方法 Download PDFInfo
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- JP4437672B2 JP4437672B2 JP2004035348A JP2004035348A JP4437672B2 JP 4437672 B2 JP4437672 B2 JP 4437672B2 JP 2004035348 A JP2004035348 A JP 2004035348A JP 2004035348 A JP2004035348 A JP 2004035348A JP 4437672 B2 JP4437672 B2 JP 4437672B2
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- JP
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- Prior art keywords
- screw
- head
- inspection
- ccd camera
- hole
- Prior art date
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- Expired - Fee Related
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- 238000007689 inspection Methods 0.000 title claims description 83
- 238000000034 method Methods 0.000 title claims description 17
- 230000007547 defect Effects 0.000 claims description 23
- 238000005286 illumination Methods 0.000 claims description 10
- 230000001678 irradiating effect Effects 0.000 claims description 2
- 238000005259 measurement Methods 0.000 claims description 2
- 230000000007 visual effect Effects 0.000 claims description 2
- 230000002950 deficient Effects 0.000 description 12
- 238000012545 processing Methods 0.000 description 11
- 238000004519 manufacturing process Methods 0.000 description 10
- 230000002093 peripheral effect Effects 0.000 description 7
- 238000010586 diagram Methods 0.000 description 3
- 238000007664 blowing Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000003754 machining Methods 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 238000012790 confirmation Methods 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000001936 parietal effect Effects 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 238000011282 treatment Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/954—Inspecting the inner surface of hollow bodies, e.g. bores
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
前記CCDカメラと前記検査部との間にCCDカメラの視野を取り囲む状態に配置した環状光源から前記検査部に位置決めしたネジの頭部に照明光を照射し、
その照射を、ネジの頭頂部に設けられた操作穴の外周のエッジ部の全周に光が差し込むように行って穴底に欠陥の凸部があるときその凸部による影を生じさせ、
この状態で前記CCDカメラにより前記検査部に位置決めした前記ネジの頭頂部を写し、
得られた画像を判別装置で処理し、処理後の画像情報に基づいて前記操作穴の穴底に欠陥があるか否かを判定する頭部付きネジの検査方法を提供する。
この方法の実施には、検査対象のネジを頭部がCCDカメラの側を向く姿勢にして位置決め保持する検査部と、この検査部に保持されたネジの頭部に対面させるCCDカメラと、前記検査部とCCDカメラとの間にCCDカメラの視野を取り囲むように配置する環状光源と、CCDカメラの画像を処理し、処理画像に基づいて良否判定を行う判別装置とを有し、前記環状光源から検査部に置かれたネジの頭部に斜め前方から光を照射してネジの頭頂部を前記CCDカメラで写す検査装置を用いる。
放射状に伸びる周方向に定ピッチで配置された溝を上面の外周部に有し、その溝に検査対象の頭部付きネジを水平向きに、かつ、頭部が外周側になる姿勢にして受け入れ、垂直軸を支点に回転して前記溝に受け入れた頭部付きネジを検査部に搬送するターンテーブルと、前記判別装置により良否判定がなされた頭部付きネジを、良品、不良品に分けて前記切り欠溝から取り出す払出し部とをさらに備えさせたものなどが、効率的な検査を行えて好ましい。
2 CCDカメラ
3 環状光源
4 判別装置
5、25 回転テーブル
6 供給部
7 長さ検査部
8 払出し部
9 ガイドプレート
10、20 検査装置
W 頭部付きネジ
A 操作穴
B 欠陥
C センターライン
a 検査エリア
Claims (1)
- ネジの頭部がCCDカメラに対向する状態で検査対象の頭部付きネジを検査部に位置決め保持し、
前記CCDカメラと前記検査部との間にCCDカメラの視野を取り囲む状態に配置した環状光源から前記検査部に位置決めしたネジの頭部に照明光を照射し、
その照射を、ネジの頭頂部に設けられた操作穴の外周のエッジ部の全周に光が差し込むように行って穴底に欠陥の凸部があるときその凸部による影を生じさせ、
この状態で前記CCDカメラにより前記検査部に位置決めした前記ネジの頭頂部を写し、
得られた画像を判別装置で処理し、処理後の画像情報に基づいて前記操作穴の穴底に欠陥があるか否かを判定する頭部付きネジの検査方法。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004035348A JP4437672B2 (ja) | 2003-05-06 | 2004-02-12 | 頭部付きネジの検査方法 |
US10/837,714 US7173692B2 (en) | 2003-05-06 | 2004-05-04 | Device and method for optically inspecting operating holes formed in heads of screws |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003127940 | 2003-05-06 | ||
JP2004035348A JP4437672B2 (ja) | 2003-05-06 | 2004-02-12 | 頭部付きネジの検査方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2004354367A JP2004354367A (ja) | 2004-12-16 |
JP4437672B2 true JP4437672B2 (ja) | 2010-03-24 |
Family
ID=33422097
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004035348A Expired - Fee Related JP4437672B2 (ja) | 2003-05-06 | 2004-02-12 | 頭部付きネジの検査方法 |
Country Status (2)
Country | Link |
---|---|
US (1) | US7173692B2 (ja) |
JP (1) | JP4437672B2 (ja) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7154080B1 (en) * | 2005-01-13 | 2006-12-26 | Dick Rauth | System and method for detecting the efficacy of machined parts |
KR100804318B1 (ko) * | 2006-04-26 | 2008-02-15 | 한전케이피에스 주식회사 | 스터드 홀 자동화 크리닝, 검사 및 이력 관리 시스템 |
TWM323343U (en) * | 2007-03-12 | 2007-12-11 | Wu Jiun Nan | Improvement for imaging apparatus of device examination |
KR100775033B1 (ko) * | 2007-03-15 | 2007-11-08 | 주식회사 엠비젼 | 휴대용 보안인쇄물 진위 식별기 |
CN101342537B (zh) * | 2007-07-10 | 2010-06-30 | 韩电Kps株式会社 | 用于自动清洁和检查柱螺栓孔并管理柱螺栓孔历史的系统 |
CN102713506B (zh) * | 2009-12-17 | 2014-09-17 | 新日铁住金株式会社 | 管状物的检查装置及其检查方法 |
EP2545361A1 (en) * | 2010-03-09 | 2013-01-16 | Federal-Mogul Corporation | Bore inspection system and method of inspection therewith |
KR101038739B1 (ko) * | 2010-11-30 | 2011-06-02 | 주식회사 서울금속 | 나사 검사 장비 |
KR101039099B1 (ko) | 2010-11-30 | 2011-06-03 | 주식회사 서울금속 | 나사 이송 장치 |
CN103328958B (zh) * | 2010-11-25 | 2015-10-14 | (株)首尔金属 | 零件供应装置和零件检查设备 |
US9047657B2 (en) | 2011-05-17 | 2015-06-02 | Gii Acquisition, Lcc | Method and system for optically inspecting outer peripheral surfaces of parts |
US10088431B2 (en) | 2011-05-17 | 2018-10-02 | Gii Acquisition, Llc | Method and system for optically inspecting headed manufactured parts |
US10209200B2 (en) | 2012-03-07 | 2019-02-19 | Gil Acquisition, LLC | High-speed, 3-D method and system for optically inspecting parts |
US10094785B2 (en) | 2011-05-17 | 2018-10-09 | Gii Acquisition, Llc | Method and system for optically inspecting headed manufactured parts |
US8570504B2 (en) * | 2011-05-17 | 2013-10-29 | Gii Acquisition, Llc | Method and system for optically inspecting parts |
US9697596B2 (en) | 2011-05-17 | 2017-07-04 | Gii Acquisition, Llc | Method and system for optically inspecting parts |
US9575013B2 (en) | 2011-05-17 | 2017-02-21 | Gii Acquisition, Llc | Non-contact method and system for inspecting a manufactured part at an inspection station having a measurement axis |
US9370799B2 (en) | 2011-05-17 | 2016-06-21 | Gii Acquisition, Llc | Method and system for optically inspecting a manufactured part at a single inspection station having a measurement axis |
JP5964642B2 (ja) * | 2012-04-19 | 2016-08-03 | 第一高周波工業株式会社 | 鉄筋端部測定装置及び鉄筋端部測定方法 |
WO2014171020A1 (ja) | 2013-04-18 | 2014-10-23 | 株式会社ユタカ | 軸体搬送装置 |
US10207297B2 (en) | 2013-05-24 | 2019-02-19 | GII Inspection, LLC | Method and system for inspecting a manufactured part at an inspection station |
US10300510B2 (en) | 2014-08-01 | 2019-05-28 | General Inspection Llc | High speed method and system for inspecting a stream of parts |
CN104209272B (zh) * | 2014-08-28 | 2016-10-19 | 深圳市天麟精密模具有限公司 | 一种根据图像信息进行产品分拣的设备 |
CN107741606B (zh) * | 2017-08-31 | 2019-02-22 | 江苏宜润智能装备产业创新研究院有限公司 | 一种塑料热铆接组装监测方法及装置 |
WO2020046963A1 (en) * | 2018-08-27 | 2020-03-05 | Ascend Robotics LLC | Automated construction robot systems and methods |
CN110595745B (zh) * | 2019-04-26 | 2021-05-07 | 深圳市豪视智能科技有限公司 | 针对设备的固定螺丝异常的检测方法及相关产品 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5165551A (en) * | 1990-03-30 | 1992-11-24 | Automation Associates, Inc. | Apparatus and method for detecting defects in an article |
US6228169B1 (en) * | 1999-05-18 | 2001-05-08 | Nd Industries, Inc. | Method and apparatus for application of 360° coatings to articles |
JP3184183B2 (ja) * | 1999-06-04 | 2001-07-09 | 株式会社ユタカ | 扁平ワークの検査装置 |
US6761126B2 (en) * | 2001-05-21 | 2004-07-13 | Nylok Corporation | Apparatus for application of polymer resin onto threaded fasteners |
US20020180959A1 (en) * | 2001-05-30 | 2002-12-05 | Hiroshi Nakajima | Optical system for detecting surface defects and disk tester and disk testing method utilizing the same optical system |
US6620246B2 (en) * | 2001-06-14 | 2003-09-16 | Nylok Corporation | Process controller for coating fasteners |
US7364043B2 (en) * | 2003-12-30 | 2008-04-29 | Zen Voce Manufacturing Pte Ltd | Fastener inspection system |
-
2004
- 2004-02-12 JP JP2004035348A patent/JP4437672B2/ja not_active Expired - Fee Related
- 2004-05-04 US US10/837,714 patent/US7173692B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
JP2004354367A (ja) | 2004-12-16 |
US20040223143A1 (en) | 2004-11-11 |
US7173692B2 (en) | 2007-02-06 |
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