JP4303108B2 - リニアイオントラップ型質量分析計における空間電荷低減方法 - Google Patents
リニアイオントラップ型質量分析計における空間電荷低減方法 Download PDFInfo
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- JP4303108B2 JP4303108B2 JP2003522975A JP2003522975A JP4303108B2 JP 4303108 B2 JP4303108 B2 JP 4303108B2 JP 2003522975 A JP2003522975 A JP 2003522975A JP 2003522975 A JP2003522975 A JP 2003522975A JP 4303108 B2 JP4303108 B2 JP 4303108B2
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- mass spectrometer
- ion
- ion trap
- ions
- quadrupole
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- 238000005040 ion trap Methods 0.000 title claims abstract description 59
- 238000000034 method Methods 0.000 title claims abstract description 21
- 150000002500 ions Chemical class 0.000 claims abstract description 104
- 238000001228 spectrum Methods 0.000 claims description 3
- 230000000694 effects Effects 0.000 abstract description 7
- 230000005540 biological transmission Effects 0.000 abstract 1
- 238000005259 measurement Methods 0.000 description 11
- 230000004888 barrier function Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 239000012491 analyte Substances 0.000 description 4
- 238000004458 analytical method Methods 0.000 description 4
- 102000004881 Angiotensinogen Human genes 0.000 description 3
- 108090001067 Angiotensinogen Proteins 0.000 description 3
- 230000005684 electric field Effects 0.000 description 3
- 238000010884 ion-beam technique Methods 0.000 description 3
- 238000013459 approach Methods 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000011065 in-situ storage Methods 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 230000005405 multipole Effects 0.000 description 2
- 238000011144 upstream manufacturing Methods 0.000 description 2
- 230000008859 change Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000002939 deleterious effect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 238000002513 implantation Methods 0.000 description 1
- 238000001802 infusion Methods 0.000 description 1
- 238000004949 mass spectrometry Methods 0.000 description 1
- 238000001819 mass spectrum Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 230000000116 mitigating effect Effects 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 239000002243 precursor Substances 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 239000013557 residual solvent Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 230000036962 time dependent Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/426—Methods for controlling ions
- H01J49/4265—Controlling the number of trapped ions; preventing space charge effects
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/422—Two-dimensional RF ion traps
- H01J49/4225—Multipole linear ion traps, e.g. quadrupoles, hexapoles
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/143—Electron beam
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- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Description
12 イオン源
14 カーテンプレート
16 オリフィスプレート
18 カーテンチャンバ
20 スキマープレート
22 中間圧チャンバ
24 質量分析計第1チャンバ
26 主質量分析計チャンバ
28 ブルベーカーレンズ
30 衝突セル
32 出射レンズ
34 検出器
36,38 電源
40 衝突ガス
Claims (4)
- リニアイオントラップを備える質量分析計の充填時間の設定方法において、
(a) 前記質量分析計を通過モードで動作させる工程、
(b) 前記質量分析計にイオンを供給する工程、
(c) イオン電流を決定するために、あらかじめ設定された時間にわたり前記質量分析計の少なくとも一部を通過するイオンを検出する工程、
(d) 前記イオントラップに対して望ましい最大電荷密度及び前記イオン電流から、前記イオントラップに対する充填時間を決定する工程、
(e) 前記イオントラップにイオンをトラップするために、前記質量分析計をトラッピングモードで動作させ、前記工程(d)で決定された前記充填時間をかけて前記イオントラップを充填する工程、及び
(f) 前記イオントラップ内にトラップされたイオンから分析スペクトルを得る工程、
を含む方法であって、
前記方法が、第1、第2及び第3の四重極子ロッドセットを備える3連四重極子型質量分析計であって、前記第3の四重極子ロッドセットがイオントラップとして構成されているものにおいて実施されるもので、前記工程(a)に対して、前記第1、第2及び第3の四重極子ロッドセットの内の2つを通過モードで動作させる工程、及び、所望の範囲のm/z値を有するイオンを質量選択するために、前記第1,第2及び第3の四重極子ロッドセットの内の残る1つにRF及びDC電圧を印加する工程を含むことを特徴とする方法。 - 前記第1の四重極子ロッドセットに前記RF及びDC電圧が供給されることを特徴とする請求項1に記載の方法。
- 1つより多くの四重極子ロッドセットにRF及びDC電圧が供給されることを特徴とする請求項1または2に記載の方法。
- 所望のm/z比をもつイオンを質量選択するために、前記RF及びDC電圧を設定する工程を含むことを特徴とする請求項1または2に記載の方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US31571501P | 2001-08-30 | 2001-08-30 | |
PCT/CA2002/001257 WO2003019614A2 (en) | 2001-08-30 | 2002-08-14 | A method of reducing space charge in a linear ion trap mass spectrometer |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2005500662A JP2005500662A (ja) | 2005-01-06 |
JP2005500662A5 JP2005500662A5 (ja) | 2006-01-05 |
JP4303108B2 true JP4303108B2 (ja) | 2009-07-29 |
Family
ID=23225723
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003522975A Expired - Fee Related JP4303108B2 (ja) | 2001-08-30 | 2002-08-14 | リニアイオントラップ型質量分析計における空間電荷低減方法 |
Country Status (8)
Country | Link |
---|---|
US (2) | US20040238737A1 (ja) |
EP (1) | EP1421600B1 (ja) |
JP (1) | JP4303108B2 (ja) |
AT (1) | ATE298463T1 (ja) |
AU (1) | AU2002322895A1 (ja) |
CA (1) | CA2457631C (ja) |
DE (1) | DE60204785T2 (ja) |
WO (1) | WO2003019614A2 (ja) |
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US6720554B2 (en) * | 2000-07-21 | 2004-04-13 | Mds Inc. | Triple quadrupole mass spectrometer with capability to perform multiple mass analysis steps |
JP4303108B2 (ja) * | 2001-08-30 | 2009-07-29 | エムディーエス インコーポレイテッド ドゥーイング ビジネス アズ エムディーエス サイエックス | リニアイオントラップ型質量分析計における空間電荷低減方法 |
US6897438B2 (en) * | 2002-08-05 | 2005-05-24 | University Of British Columbia | Geometry for generating a two-dimensional substantially quadrupole field |
US7045797B2 (en) * | 2002-08-05 | 2006-05-16 | The University Of British Columbia | Axial ejection with improved geometry for generating a two-dimensional substantially quadrupole field |
WO2004068523A2 (en) * | 2003-01-24 | 2004-08-12 | Thermo Finnigan Llc | Controlling ion populations in a mass analyzer |
GB0312940D0 (en) * | 2003-06-05 | 2003-07-09 | Shimadzu Res Lab Europe Ltd | A method for obtaining high accuracy mass spectra using an ion trap mass analyser and a method for determining and/or reducing chemical shift in mass analysis |
WO2005029533A1 (en) * | 2003-09-25 | 2005-03-31 | Mds Inc., Doing Business As Mds Sciex | Method and apparatus for providing two-dimensional substantially quadrupole fields having selected hexapole components |
DE102004001514A1 (de) * | 2004-01-09 | 2005-08-04 | Marcus Dr.-Ing. Gohl | Verfahren und Vorrichtung zur Bestimmung des Schmierölgehalts in einem Abgasgemisch |
WO2006122412A1 (en) * | 2005-05-18 | 2006-11-23 | Mds Inc., Doing Business As Mds Sciex | Method and apparatus for mass selective axial transport using quadrupolar dc |
GB0511083D0 (en) | 2005-05-31 | 2005-07-06 | Thermo Finnigan Llc | Multiple ion injection in mass spectrometry |
DE102005025498B4 (de) | 2005-06-03 | 2008-12-24 | Bruker Daltonik Gmbh | Füllstandsregelung in Ionenzyklotronresonanz- Massenspetrometern |
JP4636943B2 (ja) * | 2005-06-06 | 2011-02-23 | 株式会社日立ハイテクノロジーズ | 質量分析装置 |
JP4369454B2 (ja) | 2006-09-04 | 2009-11-18 | 株式会社日立ハイテクノロジーズ | イオントラップ質量分析方法 |
US7633059B2 (en) | 2006-10-13 | 2009-12-15 | Agilent Technologies, Inc. | Mass spectrometry system having ion deflector |
GB0624679D0 (en) * | 2006-12-11 | 2007-01-17 | Shimadzu Corp | A time-of-flight mass spectrometer and a method of analysing ions in a time-of-flight mass spectrometer |
US8334506B2 (en) | 2007-12-10 | 2012-12-18 | 1St Detect Corporation | End cap voltage control of ion traps |
US7629575B2 (en) * | 2007-12-19 | 2009-12-08 | Varian, Inc. | Charge control for ionic charge accumulation devices |
US7973277B2 (en) | 2008-05-27 | 2011-07-05 | 1St Detect Corporation | Driving a mass spectrometer ion trap or mass filter |
US8822916B2 (en) | 2008-06-09 | 2014-09-02 | Dh Technologies Development Pte. Ltd. | Method of operating tandem ion traps |
US8766170B2 (en) * | 2008-06-09 | 2014-07-01 | Dh Technologies Development Pte. Ltd. | Method of operating tandem ion traps |
WO2009149550A1 (en) * | 2008-06-09 | 2009-12-17 | Mds Analytical Technologies | A multipole ion guide for providing an axial electric field whose strength increases with radial position, and a method of operating a multipole ion guide having such an axial electric field |
GB0810599D0 (en) | 2008-06-10 | 2008-07-16 | Micromass Ltd | Mass spectrometer |
US20100096544A1 (en) * | 2008-10-16 | 2010-04-22 | Battelle Memorial Institute | Surface Sampling Probe for Field Portable Surface Sampling Mass Spectrometer |
GB0900917D0 (en) * | 2009-01-20 | 2009-03-04 | Micromass Ltd | Mass spectrometer |
US20100237236A1 (en) * | 2009-03-20 | 2010-09-23 | Applera Corporation | Method Of Processing Multiple Precursor Ions In A Tandem Mass Spectrometer |
CN102422129B (zh) * | 2009-05-11 | 2015-03-25 | 萨莫芬尼根有限责任公司 | 在具有质量选择性传送光学器件的质谱仪中的离子布居控制 |
GB2511582B (en) * | 2011-05-20 | 2016-02-10 | Thermo Fisher Scient Bremen | Method and apparatus for mass analysis |
WO2013008086A2 (en) * | 2011-07-11 | 2013-01-17 | Dh Technologies Development Pte. Ltd. | Method to control space charge in a mass spectrometer |
WO2013081581A1 (en) * | 2011-11-29 | 2013-06-06 | Thermo Finnigan Llc | Method for automated checking and adjustment of mass spectrometer calibration |
US9202676B2 (en) | 2011-12-23 | 2015-12-01 | Dh Technologies Development Pte. Ltd. | Method and system for quantitative and qualitative analysis using mass spectrometry |
US8759752B2 (en) | 2012-03-12 | 2014-06-24 | Thermo Finnigan Llc | Corrected mass analyte values in a mass spectrum |
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JP4303108B2 (ja) * | 2001-08-30 | 2009-07-29 | エムディーエス インコーポレイテッド ドゥーイング ビジネス アズ エムディーエス サイエックス | リニアイオントラップ型質量分析計における空間電荷低減方法 |
-
2002
- 2002-08-14 JP JP2003522975A patent/JP4303108B2/ja not_active Expired - Fee Related
- 2002-08-14 US US10/486,360 patent/US20040238737A1/en not_active Abandoned
- 2002-08-14 EP EP02754034A patent/EP1421600B1/en not_active Expired - Lifetime
- 2002-08-14 AT AT02754034T patent/ATE298463T1/de not_active IP Right Cessation
- 2002-08-14 WO PCT/CA2002/001257 patent/WO2003019614A2/en active IP Right Grant
- 2002-08-14 DE DE60204785T patent/DE60204785T2/de not_active Expired - Lifetime
- 2002-08-14 CA CA2457631A patent/CA2457631C/en not_active Expired - Fee Related
- 2002-08-14 AU AU2002322895A patent/AU2002322895A1/en not_active Abandoned
- 2002-08-30 US US10/232,588 patent/US6627876B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE60204785T2 (de) | 2006-05-04 |
CA2457631A1 (en) | 2003-03-06 |
JP2005500662A (ja) | 2005-01-06 |
US20030042415A1 (en) | 2003-03-06 |
US20040238737A1 (en) | 2004-12-02 |
EP1421600A2 (en) | 2004-05-26 |
WO2003019614A2 (en) | 2003-03-06 |
CA2457631C (en) | 2010-04-27 |
AU2002322895A1 (en) | 2003-03-10 |
DE60204785D1 (de) | 2005-07-28 |
ATE298463T1 (de) | 2005-07-15 |
WO2003019614A3 (en) | 2003-06-19 |
US6627876B2 (en) | 2003-09-30 |
EP1421600B1 (en) | 2005-06-22 |
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