JP3883514B2 - Card impact test method and apparatus - Google Patents

Description

[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a card impact test method and apparatus capable of quantitatively performing an impact test of an IC card.
[0002]
[Prior art]
Conventionally, as shown in FIG. 5, the card impact test method includes dropping the card 1 from a certain height onto the ground 2, causing the IC card 1 to collide with the ground, and visually observing the damaged state of the IC card. An impact test has been performed. As a method for performing a more quantitative test, there is an impact test method shown in FIG. This impact test method is a test method in which the IC card 1 is slid on the plane 3 and made to collide with the wall 4 at a fixed angle with a constant force 5 (see Patent Document 1).
[0003]
As another conventional example, as shown in FIG. 7, a card 1 is placed on a rubber base 6 and an indenter 7 is placed on the card 1, and a weight M is applied on the indenter 7 from a predetermined drop height h. There is an impact load analysis device that allows a free fall and calculates an impact from the sinking amount (see Patent Document 2).
[0004]
Also, as a simple impact test method, after bending the card appropriately by hand, let go of the card and hit the card against a flat surface to give an impact to the card to check the IC function, and the card's impact resistance There was a test method to evaluate the sex.
[0005]
[Patent Document 1]
Japanese Patent Application Laid-Open No. 64-9338 (full text, FIGS. 1 and 2)
[Patent Document 2]
Japanese Patent Laid-Open No. 2001-330521 (paragraph number [0013] of FIG. 2, FIG. 2)
[0006]
[Problems to be solved by the invention]
As is well known, an IC card is laminated with an IC module and its wiring sheet interposed between the sheets, which may cause an electrical connection failure between the IC module and the wiring sheet. The test is an important test item.
[0007]
However, in the conventional impact test method (Patent Document 1), an impact is applied to the edge of the card by gravitational acceleration, but the IC module is interposed between the sheets. Since sufficient impact could not be applied, the impact test was insufficient. In another conventional example (Patent Document 2), an impact load analysis device that applies an indenter with a weight on a card on a rubber base and gives an impact with a weight, and measures and analyzes the impact load with the sinking amount of the rubber base. However, there is a possibility that the rubber base absorbs the vibration of the card itself due to the impact and a sufficient impact test cannot be performed, or it is relatively complicated and is not suitable for use at the manufacturing site. Furthermore, the impact test that can be easily performed in the sampling test is a method in which the card is impacted by hitting the card against a flat surface by bending the card appropriately by hand. There are cases where the degree of impact differs and the reliability is insufficient.
[0008]
The present invention has been made in view of the above-described problems, and an object of the present invention is to provide a card impact test method and apparatus capable of quantitatively performing a card impact test.
[0009]
[Means for Solving the Problems]
The present invention achieves the above-mentioned problems, and the invention according to claim 1 holds the card placed on the fixed base plane and lifts the end of the card to curve the card. The card impact test method is characterized in that an impact is applied to the card by hitting the side of the card facing the fixed base plane against the fixed base plane by the elasticity of the card itself.
[0010]
According to the first aspect of the present invention, the card is held on the fixed base plane, the end of the card is lifted to bend the card, and then the card is struck against the fixed base plane by the elasticity of the card itself to give an impact to the card. This is an impact test method, and has an effect that an impact test can be performed under a certain condition by lifting the end of the card and hitting the plane of the card against the fixed base plane at a predetermined lifting angle. For example, the card can know the impact resistance characteristics of the IC module by lifting the side on which the IC module is stored. Also, even if the side opposite to the side where the IC module part is stored is lifted and struck, it is possible to know the adhesion state of the sheet constituting the card, and the impact of shock vibration on the IC module part and its wiring sheet Can know. Further, since the card lifting portion applies an impact using the elasticity of the card itself, the corner of the card is the best, but the edge of the short side of the card may be lifted. Further, by placing the card obliquely on the fixed base plane, lifting the leading edge of the card, curving the card and releasing it at a predetermined lifting angle, the degree of impact applied to the card can be increased.
[0011]
According to a second aspect of the present invention, there is provided a fixed base for holding the placed card and hitting it by the elasticity of the card itself, and for lifting and bending the end of the card placed on the fixed base. A card impact test apparatus comprising a lifting mechanism having a hook for hooking a card.
[0012]
According to the second aspect of the present invention, there is provided a fixing base for holding the card and a lifting mechanism for hooking the end of the card to the hook and lifting and curving the end of the card. The base is a fixed base that gives an impact by the elasticity of the card itself, and the lifting mechanism lifts the end of the card held by the fixed base by hooking it onto a hook or the like, and the end of the card is moved at a predetermined lifting angle. By sliding down from the hook or the like, the card plane is hit against the fixed base plane by the elasticity of the card itself. According to such a test apparatus, there is an effect that an operator can be given an impact under a certain condition without causing a difference in test conditions depending on an operator.
[0013]
According to a third aspect of the present invention, the lifting mechanism fixes the first and second inner ring portions of the first and second bearing members to both side portions of the fixed base, and is fixed to the respective outer ring portions. A lifting bar,
A bridging member in which the first and second lifting bars are inserted and the hook is provided;
3. The card impact test apparatus according to claim 2, further comprising a driven gear provided with an outer ring portion of the second bearing member and meshing with the driven gear.
[0014]
In the invention of claim 3, the lifting mechanism supports the one end of the card by inserting the first and second lifting bars connected to the first and second bearing members and the first and second lifting bars. By rotating the drive gear manually or by a motor or the like by providing a bridging member provided with a hook and a drive gear that is provided with a driven gear that meshes with the driven gear by providing a driven gear on the outer ring portion of the second bearing member. The card has a predetermined lifting angle, and when the angle is exceeded, the card slides down from the hook, and the card can be struck against the fixed base plane under a certain condition to give an impact.
[0015]
According to a fourth aspect of the present invention, there is provided the card impact testing apparatus according to the second or third aspect, wherein a pressure sensor is provided on the fixed base.
[0016]
According to the fourth aspect of the present invention, since the pressure sensor is provided on the fixing base, the impact given by the elasticity of the card itself can be expressed by a numerical value, so that the impact can be measured quantitatively. The installation position of the pressure sensor is provided, for example, on the bottom surface of the fixed base that receives an impact by a card. In this case, although the impact is not directly measured, the actual impact value can be accurately measured by comparing the actual impact with the impact transmitted to the bottom surface of the fixed base. Further, the thickness of the fixed base at the installation position where the pressure sensor is provided may be reduced to increase the impact sensitivity.
[0017]
According to a fifth aspect of the present invention, there is provided the card impact test apparatus according to the second, third or fourth aspect, wherein a scale for indicating the lifting angle of the card is provided.
[0018]
In the invention of claim 5, the card lifting angle can be quantitatively measured by providing a scale, the relationship between the lifting angle and the impact value can be known, and the impact strength is quantitatively measured. And has an action that can also serve as a bending test for the card.
[0019]
According to a sixth aspect of the present invention, there is provided the card impact testing apparatus according to the third, fourth or fifth aspect, further comprising a motor for rotating the drive gear.
[0020]
According to the sixth aspect of the present invention, the drive bar interlocked with the gear of the motor is interlocked with the driven gear for rotating the lift bar, whereby the lift bar can be rotated at a constant speed by the rotational force of the motor. It is possible to apply a bending force to the card with a constant force, it is possible to bend without applying an abnormal force to the card itself, and an effect that the impact test of the card can be accurately performed.
[0021]
DETAILED DESCRIPTION OF THE INVENTION
Embodiments of a card impact test method and apparatus according to the present invention will be described below with reference to the drawings. 1 is a perspective view of the present embodiment, FIG. 2 is a schematic side view thereof, and FIGS. 3 and 4 are side views showing other embodiments of the present invention.
[0022]
In the card impact test apparatus of this embodiment, as shown in FIG. 1, a fixed base 8 is fixed on a base 8 a by screws, and an IC that is an object of impact test is placed on the plane of the fixed base 8. A stopper 8 b for positioning a card (hereinafter abbreviated as “card”) A is provided, a card clamping member 9 is provided on the plane of the fixed base 8, and the lifting mechanism 10 is rotatable at the approximate center of the fixed base 8. Is attached.
[0023]
The card holding member 9 holds and holds the card A placed on the plane of the fixed base 8, and the card A is placed on the plane of the fixed base 8 with its edge contacting the stopper 8 b. The card A is sandwiched between the card holding member 9 and the fixed base 8 and is tightened by screwing a screw 9a to a screw rod protruding from the flat surface of the fixed base 8, so that the plane of the card holding member 9 and the fixed base 8 is , And the card A is held on the plane of the fixing base 8. The card holding member 9 is slightly curved at the edge that may come into contact with the card A, and when the card A is bent, the card A is overstressed by the edge of the card holding member 9. Do not. The shape of the screw 9a may be any shape. Furthermore, you may provide the press member (illustration omitted) which presses and fixes the card | curd clamping member 9 immediately above the card | curd A mounted in the fixing stand 8. FIG.
[0024]
Support plates 8c (only one side is shown) are provided at substantially the center of both side edges in the longitudinal direction of the fixing base 8, and a lifting mechanism 10 is rotatably attached to these support plates 8c. Each support plate 8c is provided with bearing members 11a, 11b such as bearings, and the end portions of the lifting bars 12a, 12b are fixed to these bearing members 11a, 11b to constitute the lifting mechanism 10. Yes. The lifting bars 12a and 12b are preferably rod-shaped members, but are not limited to this form.
[0025]
The inner ring portion of the bearing member 11a is fixed to the support plate 8c, one end portion of the lifting bar 12a is fixed to the outer ring portion, and the inner ring portion of the other bearing member 11b is similarly fixed to the support plate and lifted to the outer ring portion. One end of the bar 12b is fixed. The lifting bars 12a and 12b are rotatably provided with the rotation center of the bearing members 11a and 11b as a rotation axis. The lifting bars 12a and 12b are provided with a bridging member 13 having both end edges inserted therein, and a reinforcing member 14 is incorporated at these ends. A hook 16 is provided at the center of the bridging member 13. The lifting bars 12a and 12b are inserted into the bridging member 13, and the bridging member 13 can be fixed with screws 13a and 13b at an arbitrary position, and can be adjusted according to the size of the card A. Further, locking members 15a and 15b for stopping the bridging member 13 are provided on the lifting bars 12a and 12b.
[0026]
On the other hand, as shown in FIG. 2A, a driven gear 17 is provided on the outer ring portion of the bearing member 11b, the drive gear 18 is engaged with the driven gear 17, and a handle 19 is provided integrally with the drive gear 18. ing. For example, the gear ratio between the driven gear 17 and the drive gear 18 is set to 1: 1. The bearing member 11b, the driven gear 17 and the drive gear 18 are covered with a protective cover 20. The maximum lifting angle α of the lifting bars 12a and 12b can be regulated by the notch 20a (see FIG. 1) of the protective cover 20. In addition, you may provide the angle control mechanism (not shown) which provided the contact member which controls the predetermined lift angle of the lift bars 12a and 12b.
[0027]
Next, the test method of this embodiment will be described with reference to FIGS. First, the lifting mechanism 10 is laid on the plane of the fixing base 8 and is positioned so that the hook 16 does not touch the plane of the fixing base 8, and the card 9 is loosened by loosening the screw 9 a of the card holding member 9. Allow insertion. The card A is inserted between the card holding member 9 and the fixed base 8, and the edge of the card A is brought into contact with the stopper 8 b provided on the flat surface of the fixed base 8 and placed on the flat surface of the fixed base 8. And place the end of the card A on the hook 16 claw. The card A is held by the card holding member 9 and the fixing base 8 by tightening the screw 9 a of the card holding member 9.
[0028]
Subsequently, when the handle 19 is rotated clockwise, the lifting mechanism 10 is pivoted and lifted around the rotation axis stop of the bearing member 11b. The card A is curved as shown in FIG. Further, when the handle 19 is rotated clockwise, the angle increases from the lifting angle β, the end of the card A slides from the claw of the hook 16, and the back surface of the card A is hit against the plane of the fixed base 8. . In this way, the end of the card A is lifted to a certain lifting angle by the lifting mechanism 10, and the back surface of the card A can be hit against the plane of the fixed base 8 by the elasticity of the card A itself. The impact applied to the back side of the card A is transmitted to the entire card. Such an impact test does not cause breakage or electrical disconnection of the IC module, and if it has sufficient strength, such a defect will not occur, so it is effective for quality inspection of the card. .
[0029]
Next, another embodiment of the present invention will be described with reference to FIGS. In the embodiment of FIG. 3, a pressure sensor 21 is provided on the back surface of the fixed base 8. The pressure sensor 21 is provided on the back surface directly below the fixed base 8 that receives an impact from the card A. The pressure sensor 21 can detect the pressure transmitted through the fixed base 8 due to the impact of the card A, and can digitize the impact pressure. In addition, in order to raise the detection sensitivity of the pressure sensor 21, you may make the thickness of the fixing stand 8 of the part in which the pressure sensor 21 is installed thin.
[0030]
Further, a gear that meshes with the drive gear 18 is provided on the rotation shaft of the motor 22, the motor 22 is kept at a constant rotational speed, and the driven gear 17 that meshes with the drive gear 18 is rotated at a constant speed, so that the lifting mechanism 10 is kept constant. It can also be rotated at a speed. When there is variation in the rotation speed of the lifting mechanism 10, the force applied to the card A varies, but the force applied to the card A can be made constant, and a more reliable impact test. Is possible. Therefore, the card impact test apparatus may be provided with both the pressure sensor 21 and the motor 22, or any one may be installed as necessary.
[0031]
Next, the card impact test apparatus according to the embodiment shown in FIG. 4 will be described. In the present embodiment, the handle 19 is provided with a scale 24 indicating the lifting angle, and the handle 19 is provided with a pointer 25. When the lifting mechanism 10 is laid on the fixed base 8, the lifting angle is 0 degree, and when the handle 19 is rotated, the pointer 25 moves and the angle can be measured by the scale 24. In FIG. 4, the maximum lifting angle is 90 degrees, but the angle is not limited thereto. Of course, the position of the scale 24 may be provided on the handle 19 side and the pointer 25 may be provided on the protective cover 20 side.
[0032]
This embodiment may be an embodiment including all of the pressure sensor 21 and the motor 22 in FIG. 3 and the scale 24 indicating the lifting angle in FIG. 4, or may include one form thereof. .
[0033]
In the card impact test method according to the embodiment of the present invention, the device shown in FIGS. 1 to 3 is used to hold the one end of the card A on the plane of the fixed base 8 and lift the end of the card A. Is the impact test method in which the card A is impacted by hitting the back surface of the card A against the plane of the fixed base 8 by the elasticity of the card A itself. The card A placed on the plane of the fixed base 8 is held by the clamping member 9 so that the card A protrudes toward the lifting mechanism 10 along the rotation center axis of the lifting mechanism 10. Note that the stopper 8b that supports the edge of the card A may be configured to be movable on the plane of the fixed base 8, and the placement position of the card A on the plane of the fixed base 8 may be adjusted.
[0034]
3 and 4, the impact value with respect to the lifting angle is graphed by quantitatively measuring with the pressure sensor 21 or the scale 24, and the strength of the IC module is determined based on the quantitative impact value. Etc. can be evaluated. Further, by providing a scale for measuring the lifting angle, it is possible to analyze the bending characteristics of the card.
[0035]
【The invention's effect】
As described above, according to the card impact test method of the present invention, it is possible to apply an impact to the card using the elasticity of the card itself, and the card lifting angle is easily set to a certain condition. Since the variation due to the difference in how the impact is applied by the operator can be eliminated, there is an advantage that the impact test can be surely performed to guarantee the quality of the card. Further, if the card is poorly laminated, the elasticity of the card itself is also changed, and different impact test results can be obtained, which is effective for inspecting defective products.
[0036]
In addition, according to the card impact test apparatus of the present invention, it is possible to easily make the condition when the card is bent and hit against the fixed base easily, so there is an advantage that the variation by the operator can be eliminated, The card lifting mechanism is rotated with respect to the holding part of the card, and the end of the card is slid by the elasticity of the card from the hook provided in the lifting mechanism and is hit against the fixed base plane. Therefore, there is an advantage that an impact test is possible even under the same conditions.
[0037]
In addition, according to the present invention, by providing a pressure sensor on the fixed base, it is possible to quantify the degree of impact, and there is an advantage that a highly reliable impact test can be performed.
[0038]
Further, according to the present invention, by providing a scale that indicates the card lifting angle, it is possible to quantify the degree of impact with respect to the lifting angle, and this is effective for analyzing the impact resistance characteristics of the card. There is an advantage that it can correspond to a bending test.
[0039]
Further, according to the present invention, the card lifting mechanism can be rotated at a constant speed using the rotation of the motor, so that the card can be bent with a constant force without applying an abnormal force to the card. There is an advantage that a highly reliable impact test is possible.
[Brief description of the drawings]
FIG. 1 is a perspective view of a card impact test apparatus according to the present invention.
2A is a schematic side view of the present embodiment, and FIG. 2B is a schematic side view showing a state in which a card is curved.
FIG. 3 is a side view showing another embodiment of the present invention.
FIG. 4 is a side view showing another embodiment of the present invention.
FIG. 5 is a schematic view showing a conventional card impact test method;
FIG. 6 is a schematic view showing another conventional card impact test method.
FIG. 7 is a schematic view showing another conventional card impact test method.
[Explanation of symbols]
A card 8 fixed base 9 clamping member 10 lifting mechanism 11a, 11b bearing member 12a, 12b lifting bar 13 bridging member 14 reinforcing member 15a, 15b locking member 16 hook 17 driven gear 18 driving gear 19 handle 20 protective cover 21 pressure sensor 22 Motor 23 Gear 24 Scale 25 Pointer

Claims (6)

The card placed on the fixed base plane is held, the end of the card is lifted to bend the card, and then the side of the card facing the fixed base plane is elasticated by the card itself. A card impact test method comprising hitting a flat surface to give an impact to the card. A fixed base for holding the placed card and hitting it by the elasticity of the card itself; and a lifting mechanism having a hook for hooking the card to lift and curve the end of the card placed on the fixed base A card impact testing apparatus comprising: The lifting mechanism is
First and second lifting bars fixed to the respective outer ring portions, the inner ring portions of the first and second bearing members being fixed to both sides of the fixed base, respectively;
A bridging member in which the first and second lifting bars are inserted and the hook is provided;
The card impact test apparatus according to claim 2, further comprising a driven gear provided with an outer ring portion of the second bearing member and meshing with the driven gear. 4. The card impact test apparatus according to claim 2, wherein a pressure sensor is provided on the fixed base. 5. The card impact test apparatus according to claim 2, further comprising a scale for indicating a lifting angle of the card. 6. The card impact test apparatus according to claim 3, further comprising a motor for rotating the drive gear.

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