JP3873586B2 - Circuit board inspection apparatus and circuit board inspection method - Google Patents

Description

[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a circuit board inspection apparatus for inspecting the operation of a circuit board, and more particularly to a circuit board inspection apparatus and a circuit board inspection method suitable for function inspection and evaluation of various types of circuit boards.
[0002]
[Prior art]
With respect to a circuit board inspection apparatus for inspecting the operation of a circuit board, for example, Japanese Patent Laid-Open No. 05-133992 (“Circuit Board Inspection Method and Inspection Board and Circuit Board Inspection Apparatus”) and Japanese Patent Application Laid-Open No. 08-32191 (“ There are technologies described in “Electronic circuit boards”).
[0003]
In the technique described in Japanese Patent Laid-Open No. 05-133992, a probe terminal on one surface of an inspection board is brought into contact with a measured land on the circuit board to be inspected, and a component to be mounted on the circuit board to be inspected. Are mounted on the other surface of the inspection substrate, and the probe terminals and the components are combined as if the components were mounted on the circuit substrate to be inspected, thereby inspecting the circuit substrate to be inspected.
[0004]
In addition, the technique described in Japanese Patent Application Laid-Open No. 08-32191 allows the automatic testing of the type of board when testing the electronic circuit board, so that the test apparatus automatically performs the test when testing the electronic circuit board. This is because the type of the board can be discriminated, the board identification and classification work is not required manually, and the cost required for the test is greatly reduced.
[0005]
In such a circuit board inspection apparatus for inspecting the operation of a circuit board, an inspection circuit for setting an input signal to the inspection board according to the contents of inspection and evaluating an output signal is provided. Must be connected to the circuit board.
[0006]
Usually, the inspection circuit is produced for each circuit board to be inspected. Therefore, a great amount of time and cost are required for production of the inspection circuit and circuit debugging.
[0007]
[Problems to be solved by the invention]
The problem to be solved is that in the conventional technique, an inspection circuit required for inspection / evaluation of a circuit board to be inspected must be separately produced for each different circuit board to be inspected.
[0008]
An object of the present invention is to provide a circuit board inspection apparatus and a circuit board inspection method that can solve the problems of the prior art and efficiently perform functional inspection and evaluation of various types of circuit boards to be inspected. It is.
[0009]
[Means for Solving the Problems]
In order to achieve the above object, the circuit board inspection apparatus of the present invention converts at least a part of an inspection circuit into a PLD and changes it to a PLD of an internal circuit corresponding to a difference for each circuit board to be inspected. It is possible to inspect various types of circuit boards to be inspected without changing the above.
[0010]
The PLD includes fuse type, ROM type, SRAM type, and the like, for example, circuit data transferred from the outside using SRAM type PLD or a circuit stored in a memory placed in an inspection circuit. The contents of a predetermined PLD are rewritten with data, and the inspection circuit is switched without replacing the PLD.
[0011]
In addition, the PLD internal circuit can be identified, the association with the circuit board to be inspected is confirmed, and malfunction due to mismatch between the circuit board to be inspected and the PLD internal circuit is prevented.
[0012]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.
FIG. 1 is a block diagram illustrating a configuration example of a circuit board inspection apparatus according to the present invention, and FIG. 4 is a block diagram illustrating a hardware configuration example of a control unit of the circuit board inspection apparatus in FIG.
[0013]
In FIG. 4, 51 is a display device such as a CRT (Cathode Ray Tube) or LCD (Liquid Crystal Display), 52 is an input device such as a keyboard or mouse, 53 is an external storage device such as an HDD (Hard Disk Drive) or the like. , 54 includes an information processing apparatus that includes a CPU (Central Processing Unit) 54a, a main memory 54b, and the like, and performs computer processing. 55 is a CD-ROM (Compact Disc-Read Only Memory) or DVD (Digital An optical disc made up of Video Disc / Digital Versatile Disc), 56 is a drive device for reading out programs and data recorded on the optical disc 55, and 57 is a communication device made up of a LAN (Local Area Network) card, modem or the like.
[0014]
After the program and data stored in the optical disk 55 are installed in the external storage device 53 by the information processing device 54 via the drive device 56, they are read from the external storage device 53 into the main memory 54b and processed by the CPU 54a. A control unit 1 that controls the circuit board inspection apparatus shown in FIG.
[0015]
As shown in FIG. 1, the circuit board inspection apparatus of this example includes a control unit 1, an inspection circuit unit 2, and a fixture unit 3 that are configured by a computer system having the configuration shown in FIG. 4. In the circuit unit 2, signals are transmitted to and received from the circuit board to be inspected (described as “circuit to be inspected” in the drawing) 4 through the fixture unit 3, and the operation of the circuit board 4 to be inspected is inspected.
[0016]
The circuit board 4 to be inspected usually has a plurality of function blocks (in this example, a function A block 43, a function B block 44, and a function C block 45), and signals necessary for the inspection for each function block are supplied to the fixture unit 3. Is connected to the inspection circuit unit 2.
[0017]
The control unit 1 controls the entire inspection apparatus and controls the inspection circuit 2 and the circuit board 4 to be inspected (via the CPU 41 and the jig ROM 42) according to the inspection purpose.
[0018]
The inspection circuit unit 2 has a hardware configuration necessary for inspection according to inspection contents of each functional block (the function A block 43, the function B block 44, and the function C block 45) of the circuit board 4 to be inspected. 4 signal input / output timing generation, result determination, and the like are performed.
[0019]
At this time, since the number and timing of signals vary depending on the type of circuit board 4 to be inspected, it is necessary to use an individual inspection circuit unit 2 for each type of circuit board 4 to be inspected, even if it has a similar function. .
[0020]
In the circuit board inspection apparatus of this example, the inspection circuit unit 2 or a part thereof is configured by a PLD (Programmable Logic Device). Then, by rewriting the internal circuit of the PLD or the like, a plurality of circuit boards 4 to be inspected having different varieties are inspected using one inspection circuit unit 2.
[0021]
In this example, a function A inspection circuit (PLD) 21 and a function B inspection circuit (PLD) 22 of a PLD internal circuit corresponding to each of the function A block 43, the function B block 44, and the function C block 45 of the circuit board 4 to be inspected. A function C inspection circuit (PLD) 23 is provided.
[0022]
Then, the circuit necessary for the inspection is modularized according to the function, the portion that needs to be changed for each type of the circuit board 4 to be inspected is constituted by the PLD, and the internal logic PLD corresponding to the difference for each circuit board to be inspected is changed. Thereby, it is possible to inspect a variety of circuit boards 4 to be inspected without changing the hardware configuration of the inspection circuit unit 2.
[0023]
As described above, at least a part of the inspection circuit unit 2 is converted into a PLD and changed to a PLD having an internal logic corresponding to a difference for each circuit board to be inspected, without changing the hardware configuration of the inspection circuit unit 2. It can cope with the inspection of the circuit board 4 to be inspected.
[0024]
As a result, the production and debugging of the circuit board inspection device can be greatly shortened, the inspection circuit unit can be made common, and a wide variety of circuit boards to be inspected can be inspected with one circuit board inspection device. Become.
[0025]
The PLD used in this example includes a fuse type, a ROM type, and an SRAM type. However, in the fuse type PLD and the ROM type PLD, it is necessary to replace the PLD corresponding to each model, which causes a storage problem of the PLD and a reliability problem due to a replacement error. Also, the time for setup change cannot be ignored.
[0026]
Therefore, in this example, an additionally recordable SRAM type PLD is used. As described above, when an SRAM type PLD that can be additionally written is used, circuit data from the outside is taken in using a signal line of a serial writing system and the PLD is rewritten.
[0027]
FIG. 2 is a block diagram showing a configuration example of a system for rewriting the PLD internal circuit of the inspection circuit unit in the circuit board inspection apparatus of FIG.
[0028]
In FIG. 2, reference numeral 26 denotes an SRAM type PLD (FIG. 2) constituting each function test circuit (function A test circuit 21, function B test circuit 22, function C test circuit 23) provided in the test circuit unit 2 in FIG. 5 is a rewrite circuit for writing circuit data from the outside to the PLD 26.
[0029]
Circuit data from the outside can be given using a memory such as a ROM, a FROM, an EEPROM, or an IC card. Of course, it may be stored as a file in the control unit 1 comprising the computer system in FIG.
[0030]
As described above, by providing the additionally recordable SRAM type PLD 26 and the rewriting circuit 25 for writing the internal logic to the PLD, it is possible to inspect a variety of circuit boards 4 to be inspected without replacing the PLD. There is no need to prepare a plurality of PLDs in accordance with the substrate, and the problem of lowering reliability due to storage and replacement of PLDs can be avoided, and the inspection circuit can be changed in a short time without time for setup change.
[0031]
However, even when the PLD internal circuit is configured to be rewritten with external data in this way, or even when the PLD is replaced for each circuit board to be inspected, when inspecting various types of circuit boards 4 to be inspected, If the circuit board 4 to be inspected and the PLD internal circuit in the inspection circuit unit 2 do not correspond to each other, the circuit board 4 does not operate correctly. Depending on the connection status, the circuit board 4 to be inspected may be destroyed.
[0032]
In order to cope with such a problem, the circuit board inspection apparatus of this example is configured to determine whether or not the internal circuit of the PLD corresponds to the circuit board to be inspected correctly.
[0033]
FIG. 3 is a block diagram illustrating a configuration example of a system for determining the validity of the PLD internal circuit of the inspection circuit unit in the circuit board inspection apparatus of FIG.
[0034]
In FIG. 3, 31 is a PLD of fuse type, ROM type, SRAM type or the like, 32 is a code generation circuit for generating a code for identifying the PLD 31 provided in the PLD 31, and 33 is a code generation circuit 32. This is an identification / determination circuit that determines whether or not the PLD 31 is valid corresponding to the circuit board to be inspected based on the generated code.
[0035]
In this example, it is assumed that the PLD in which circuit data is written from the outside described with reference to FIG. 2 (circuit data written in the PLD) is identified.
[0036]
Information for generating the code generation circuit 32 is provided in the circuit data to be written in the PLD, and after the circuit data is written to the PLD 31, the identification code generated from the code generation circuit 32 is read by the identification / determination circuit 33, It is determined whether the code corresponds to the circuit board to be inspected.
[0037]
The identification / determination circuit 33 performs, for example, a logical product operation of the identification code generated from the code generation circuit 32 and the code given in advance to the circuit board to be inspected, and the operation result is validated by an LED or the like. It is displayed as the result of pass / fail.
[0038]
Thus, after rewriting the internal circuit of the PLD, prior to the execution of the inspection, the internal circuit can be identified by the code generation circuit provided with the circuit data of the PLD, so that mistakes in replacement and rewriting can be prevented. It is possible to prevent malfunction due to mismatch between the circuit board and the PLD internal circuit.
[0039]
As described above with reference to FIGS. 1 to 4, in the circuit board inspection apparatus of this example, at least a part of the inspection circuit is converted into a PLD, so that the difference in each circuit board to be inspected can be obtained by changing the PLD. Therefore, it is possible to cope with the inspection of various kinds of circuit boards to be inspected without changing the hardware with one inspection circuit.
[0040]
As a result, the work time involved in the production and debugging of the circuit board inspection device can be greatly shortened, and the inspection circuit can be made common, and a wide variety of circuit boards to be inspected can be inspected by one circuit board inspection device. Become.
[0041]
Also, by using an externally rewritable SRAM type PLD as the PLD, the contents of a predetermined PLD can be rewritten with circuit data transferred from the outside, and the inspection circuit can be switched without replacing the PLD. It becomes. Thereby, it is not necessary to purchase a plurality of PLDs in accordance with the circuit board to be inspected, the reliability due to PLD replacement is not impaired, and the inspection circuit can be changed in a short time.
[0042]
Furthermore, the quality of the correspondence between the circuit board to be inspected and the PLD of the inspection circuit is determined by checking the identification code of the PLD internal circuit. Thus, prior to the inspection, it is possible to verify in advance a PLD replacement error or rewrite error in the inspection circuit, and it is possible to prevent malfunction due to a mismatch between the circuit board to be inspected and the PLD internal circuit.
[0043]
In addition, this invention is not limited to the example demonstrated using FIGS. 1-4, In the range which does not deviate from the summary, various changes are possible. For example, in the identification / determination circuit 33 shown in FIG. 3, the logical product operation result of the identification code generated from the code generation circuit 32 and the code given in advance to the circuit board to be inspected is displayed by the LED or the like. Although it is configured, the identification / determination circuit 33 may be configured in the control unit 1 including the computer system shown in FIG. 4 and the result may be displayed on the display device 51 or the like.
[0044]
In this example, as described with reference to FIG. 2, the contents of the PLD are rewritten with circuit data transferred from the outside. However, it is also possible to place a memory in the inspection circuit and use the circuit data stored in the memory. good. As the memory, for example, an IC card, ROM, HDD or the like can be used.
[0045]
【The invention's effect】
According to the present invention, at least a part of the inspection circuit in the circuit board inspection apparatus is configured by the PLD, and by using the PLD of the internal circuit corresponding to the circuit board to be inspected, Different circuit boards to be inspected can be inspected, and functional inspection and evaluation of various types of circuit boards to be inspected can be performed efficiently.
[0046]
In addition, by rewriting the internal circuit of the SRAM type PLD corresponding to the circuit board to be inspected with external data, the inspection circuit can be switched without replacing the PLD, and multiple PLDs are purchased according to the circuit board to be inspected. The inspection circuit can be changed in a short time without impairing the reliability due to the replacement of the PLD.
[0047]
Furthermore, by identifying the internal circuit of the PLD of the inspection circuit prior to the inspection, it is possible to verify in advance replacement or rewriting mistakes and prevent malfunction due to mismatch between the circuit board to be inspected and the PLD internal circuit. is there.
[Brief description of the drawings]
FIG. 1 is a block diagram showing a configuration example of a circuit board inspection apparatus according to the present invention.
2 is a block diagram illustrating a configuration example of a system for rewriting a PLD internal circuit of an inspection circuit unit in the circuit board inspection apparatus of FIG. 1;
3 is a block diagram showing a configuration example of a system for determining the validity of a PLD internal circuit of an inspection circuit unit in the circuit board inspection apparatus of FIG. 1;
4 is a block diagram showing a hardware configuration example of a control unit of the circuit board inspection apparatus in FIG. 1. FIG.
[Explanation of symbols]
1: control unit, 2: inspection circuit unit, 3: fixture unit, 4: circuit board to be inspected, 21: function A inspection circuit (PLD), 22: function B inspection circuit (PLD), 23: function C inspection circuit (PLD), 25: rewrite circuit, 26: SRAM type PLD, 31: PLD, 32: code generation circuit, 33: identification / determination circuit, 41: CPU, 42: jig ROM, 43: function A block, 44 : Function B block, 45: Function C block, 51: Display device, 52: Input device, 53: External storage device, 54: Information processing device, 54a: CPU, 54b: Main memory, 55: Optical disk, 56: Drive device 57: Communication device.

Claims (3)

A circuit board inspection apparatus for inspecting the operation of a circuit board,
A test circuit portion at least part of which is constituted by the PLD of the test circuit for checking the signal of the test circuit board to be inspected,
A code generation circuit section for generating an identification code corresponding to the circuit data of the PLD provided in the PLD;
Determining means for reading the identification code generated from the code generation circuit unit and determining whether or not the code circuit corresponds to a circuit board to be inspected;
Circuit board inspection apparatus characterized by having a. 2. The circuit board inspection apparatus according to claim 1, wherein the determination means performs a logical product operation of a code assigned to a circuit board to be inspected and the identification code . A circuit board inspection method for inspecting the operation of a circuit board,
Writing inspection circuit data into the PLD of an inspection circuit unit in which at least a part of the inspection circuit inspecting a signal of a circuit board to be inspected is formed of a PLD;
Writing code generation circuit data of a code generation circuit unit for generating an identification code corresponding to the inspection circuit data of the PLD into the PLD;
A step of reading the identification code generated from the code generation circuit unit to determine whether or not it corresponds to a circuit board to be inspected;
A circuit board inspection method comprising:

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