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JP3681856B2 - Resin-sealed electronic components - Google Patents

Resin-sealed electronic components Download PDF

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Publication number
JP3681856B2
JP3681856B2 JP8538997A JP8538997A JP3681856B2 JP 3681856 B2 JP3681856 B2 JP 3681856B2 JP 8538997 A JP8538997 A JP 8538997A JP 8538997 A JP8538997 A JP 8538997A JP 3681856 B2 JP3681856 B2 JP 3681856B2
Authority
JP
Japan
Prior art keywords
lead
resin
sealing resin
exposed
sealed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP8538997A
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Japanese (ja)
Other versions
JPH10284675A (en
Inventor
哲也 佐々木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohm Co Ltd
Original Assignee
Rohm Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Priority to JP8538997A priority Critical patent/JP3681856B2/en
Publication of JPH10284675A publication Critical patent/JPH10284675A/en
Application granted granted Critical
Publication of JP3681856B2 publication Critical patent/JP3681856B2/en
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components
    • H05K3/3421Leaded components
    • H05K3/3426Leaded components characterised by the leads

Landscapes

  • Lead Frames For Integrated Circuits (AREA)

Description

【0001】
【発明の属する技術分野】
本発明は、樹脂封止型電子部品に関する。
【0002】
【従来の技術】
従来、樹脂封止型電子部品は、半導体チップと、同半導体チップを搭載するアイランドと、半導体チップの電極に一端を接続したリードとを樹脂で封止し、封止樹脂から露出した延出したリードの露出部を屈折して、露出したリードを回路基板に接続している。
【0003】
【発明が解決しようとする課題】
ところが、打ち抜き形成されたリードであるため、周縁部分が未整形であり、上記リードの露出部を整形するために、リード間に張出したバリを取るためのタイバーポンチや、リードフレームのリードの外側端部につながるリードフレームを切断するための縁切りポンチを要し、これらのポンチは高精度を要して高価であり、更に、上記ポンチ作業に精密なワークの位置決め装置を要してコストが増大するという問題がある。
【0004】
また、リードの露出部が封止樹脂から外側方に延出しているため、樹脂封止型電子部品の外形が大きくなって、回路基板への実装密度を大きくできないばかりでなく、上記露出部が変形しやすいため、形状の維持管理に特別の注意を要し、包装費も高価になるという問題がある。
【0005】
更に、リードが封止樹脂から長く延出しているために、実装のためのハンダ付けの際に、端子部をセラミック製の押圧治具によってプリント基板等に押圧する必要があるが、この治具を媒介して隣接したリード間にハンダブリッジが形成されて、回路不良の原因となるという問題がある。
【0006】
また、樹脂封止型電子部品のテストの際に、テスタのプローブに対して縦横二方向の精密な位置決めを要してコストがかさみ、更に、リードが封止樹脂から長く延出しているために、リード先端の端子部と上記プローブとの接触不良を起こしてテストが不正確になる恐れがあり、接触不良を防止するために強圧するとリードが変形するという問題がある。
【0007】
【課題を解決するための手段】
そこで、本発明では、チップと、同チップに接続したリードとを封止樹脂にて封止し、リードの先端部を封止樹脂の外部に露出させ、リードの露出部を封止樹脂の側端面に沿って略垂直方向に切断して、残存したリードの露出部分を端子部としてなる樹脂封止型電子部品において、リードは、略直角に屈折した内側屈折部と外側屈折部とを介して封止リード部と、段差リード部と、前記封止リード部よりも一段低位置とした露出リード部とで構成し、外側屈折部はその屈折中心を封止樹脂の側端面近傍に位置させて、同屈折中心を中心としてリードを略直角上方向に屈折させることにより前記段差リード部を形成するとともに、露出リード部を封止樹脂の下底面から下方に突出させて樹脂封止し、封止樹脂の側端面と連続した面一となるように前記露出リード部を切断して、下面を略1/4円弧形状に湾曲させるとともに基板回路と線接触する端子部を形成したことを特徴とする樹脂封止型電子部品を提供せんとするものである。
【0008】
【発明の実施の形態】
このように、電子部品の樹脂封止工程に先だって、リードを、その封止部分と露出部分との境界近傍で屈折させ、樹脂封止後、封止樹脂の側端面に沿ってリードを切断して、封止樹脂側に残存したリードの先端部を端子部とすることにより、端子部が封止樹脂下底面から下方に突出しているが、同端子部が封止樹脂の側端面から外側方に突出していないように樹脂封止型電子部品を形成する。
【0009】
【実施例】
本発明の実施例について図面を参照して説明する。
【0010】
図1は、本発明に係る樹脂封止型電子部品としての半導体電子部品Aを反転させた状態で示しており、同電子部品Aは、略直方体形状の封止樹脂Rの下底面R1周縁部に、後述するリード32の先端に形成した端子部1を所定間隙を設けて多数突出させている。
【0011】
端子部1は、リード32の露出部を封止樹脂Rの側端面R2に沿って略垂直方向に切断して、残存したリード32の露出部分を端子部1としている。即ち、端子部1は、側面視略 1/4円弧形状に形成されており、端子部1の側端面2は、封止樹脂の側端面R2と連続した面一に形成されて、封止樹脂側端面R2から外側方には突出していない。
【0012】
また、端子部側端面2の先端縁3から、端子部1が封止樹脂Rの下底面R1と交差する内側縁4にかけて、略 1/4円弧形状の湾曲底面5を形成している。
【0013】
なお、端子部1の左右側面6は、封止樹脂Rの下底面R1、端子部側端面2及び湾曲底面5に略直交している。
【0014】
封止樹脂Rの内部には、後述する半導体チップ35、同半導体チップ35を支持するアイランド33及び内側端を半導体チップ35にボンディングワイヤ36を介して接続したリード32の内側部分とを内蔵しており、半導体チップ35と外部回路との接続は、上述した多数の端子部1を介して行われる。
【0015】
図2は、外部回路としてのプリント基板10上面に装着した樹脂封止型半導体部品Aを示しており、プリント基板10上面に多数形成した基板回路11と、樹脂封止型半導体部品Aの多数の端子部1とをそれぞれ接触させ、接触状態の各基板回路11と端子部1とをハンダ付けにより導通かつ固定している。図中、12はハンダである。
【0016】
上記のように、本発明の樹脂封止型半導体部品Aでは、リード32の端子部1が封止樹脂Rの側端面R2から外側方に突出せず下下底面R1のみ突出しているので、樹脂封止型半導体部品Aを小型化し、プリント基板10等への実装密度を大きくすることができる。
【0017】
また、端子部1が封止樹脂Rの下面から突出しているので、プリント基板10の基板回路11と樹脂封止型半導体部品Aとを隔離するためのスタンドオフ13を確保することができる。
【0018】
また、端子部1の突出量が小さいので、同端子部1の変形がなく、形状の維持管理が容易であり、包装費も廉価で済む。
【0019】
更に、端子部1の突出量が小さいので、剛性が高く、しかも、突出高さが揃い易く、更に、基板回路11に線接触するので、プリント基板10等へのハンダ付けの際に、端子部1を別途に押しつける必要がなく、そのため、押圧治具を媒体としてのリード32間のハンダブリッジの形成が防止される。
【0020】
また、上記ハンダ付けの際に、端子部1の下端部に湾曲底面5が形成されているので、同湾曲底面5とプリント基板10の基板回路11上面との間に丸みを帯びた略楔形状の間隙が生じて、毛細管現象により同間隙への溶融ハンダの流れ込みが良くなり、ハンダ付けの信頼性を高めることができる。
【0021】
図3は、樹脂封止型半導体部品Aのテスト状態を示しており、図示するように、両側に配置したガイド部材20,20 の間に封止樹脂側端面R2を挟持することで、封止樹脂側端面R2をガイドとして位置決めを行って、正確に各端子部1を各プローブ21の上面に位置させることができるので、高価な位置決め装置等を要せず、更に、端子部1の剛性が高いので、封止樹脂R部分をプローブ21方向に押圧するだけで、各端子部1を変形させることなく、各端子部1を各プローブ21に確実に接触させることができるので、テストの信頼性を向上させることができる。
【0022】
なお、上記プローブ21は、水平方向に開口した略U字形状に形成されて、上下方向に若干の弾力性を有しており、端子部1の下方突出量に多少の差異があっても、端子部1にプローブ21が確実に接触するようにしている。
【0023】
次に、図4〜図7を参照して、上記樹脂封止型半導体部品Aの製造について説明する。
【0024】
図4は、リードフレーム30を示しており、同リードフレーム30の外周部31から内側方向に多数のリード32を突設し、中央部に上記リード32と離隔してアイランド33を形成しており、各リード32の内側部とアイランド33とは、リードフレーム30外周よりも一段高位置に設定されている。
【0025】
各リード32は、図5で示すように、高位置の封止リード部32a と、一段低位置の露出リード部32b と、封止リード部32a と露出リード部32b との間の段差リード部32c とで形成されており、各リード部32a,32b,32c は、略直角に屈折した内外側屈折部32d,32e を介して連続しており、特に、上記外側屈折部32d は、その屈折中心34を後述する封止樹脂側端面R2近傍に位置させている。
【0026】
即ち、リードフレーム30からの突設基部からやや内側高位置に屈折中心34を設定し、同屈折中心34を中心としてリード32を略直角上方向に屈折させて段差リード部32c を形成し、次いで、リード32を略直角内側方向に屈折させて封止リード部32a を形成している。
【0027】
上記のように、リード32を屈折中心34を中心として略直角に屈折させているので、端子部1の下面が略 1/4円弧形状に湾曲して、別途加工をすることなく前述した湾曲底面5が形成されることになる。
【0028】
図5は、図4で示したアイランド33上面に半導体チップ35をマウントし、半導体チップ35の各電極パッドとリード32の内側端部とを、ボンディングワイヤ36で接続した半製品を示している。
【0029】
図6は、図5で示した半製品の半導体チップ35、リード32の内側部分及びボンディングワイヤ36等を略直方体形状の封止樹脂Rで封止した半製品を示しており、上記封止樹脂Rの下底面R1を各リード32の上面と略同一高さに設定し、封止樹脂側端面R2が前記屈折中心34の近傍を通過するようにして、同屈折中心34よりも外側のリード32とリードフレーム30の外周部31とを、封止樹脂Rから外部への露出させている。
【0030】
図7は、図6で示した半製品から、露出部37、即ち、リードフレーム30の外周部31と同外周部31近傍のリード32を、封止樹脂側端面R2と同一平面で切断して、残存したリード32を端子部1とし、上記切断面を端子部側端面2とした樹脂封止型半導体部品Aの完成品を示している。
【0031】
上記のように、リードフレーム30の外周部31と露出リード部32b とを、封止樹脂側端面R2と同一平面で切除するので、刃先が一直線の簡単な形状のポンチとダイとですみ、従来の樹脂封止型半導体のような複雑な形状のポンチとダイとを要せず、更に、封止樹脂Rからはみ出した樹脂を除去するタイバーカットを要しないので、製造コストを低減することができる。
【0032】
更には、端子部1が封止樹脂Rに近接しているので、リードフレーム30の変形の影響を受けにくく、樹脂封止工程後のリード形状中間検査や、リードのリフォーミングを要せず、更にコストを低減させることができる。
【0033】
【発明の効果】
本発明によれば次のような効果を得ることができる。
【0034】
請求項1記載の発明では、チップと、同チップに接続したリードとを封止樹脂にて封止し、リードの先端部を封止樹脂の外部に露出させ、リードの露出部を封止樹脂の側端面に沿って略垂直方向に切断して、残存したリードの露出部分を端子部としてなる樹脂封止型電子部品において、リードは、略直角に屈折した内側屈折部と外側屈折部とを介して封止リード部と、段差リード部と、前記封止リード部よりも一段低位置とした露出リード部とで構成し、外側屈折部はその屈折中心を封止樹脂の側端面近傍に位置させて、同屈折中心を中心としてリードを略直角上方向に屈折させることにより前記段差リード部を形成するとともに、露出リード部を封止樹脂の下底面から下方に突出させて樹脂封止し、封止樹脂の側端面と連続した面一となるように前記露出リード部を切断して、下面を略1/4円弧形状に湾曲させるとともに基板回路と線接触する端子部を形成したことを特徴とする樹脂封止型電子部品としたことによって、端子部の外側端は封止樹脂の側端面から外側方に突出せず、樹脂封止型電子部品が小型化し、プリント基板等への実装密度を大きくすることができる。
【0035】
また、端子部の変形がなく、形状の維持管理が容易であり、包装費も廉価で済む。
【0036】
また、樹脂封止型電子部品のテストに際して、封止樹脂側端面をガイドとした位置決めで、端子としての各端子部をテスタの各プローブ上面に正確に位置させることができ、更に、端子部の剛性が高いので、封止樹脂部分をプローブ方向に押圧するだけで、各端子部と各プローブとを確実に接触させてテストの信頼性を向上させることができ、しかも、各端子部の変形を防止することができる。
【0037】
上記リードの外側端部に、屈折中心が封止樹脂の下底面外周縁近傍に位置した端子部を形成し、同端子部の下端部は封止樹脂下底面から下方に突出し、しかも、同リードの露出部を封止樹脂側端面と同一平面で切除して製造するので、刃先が一直線の簡単な形状のポンチとダイとですみ、従来の樹脂封止型電子部品のような複雑な形状のポンチとダイとを要せず、更に、封止樹脂からはみ出した樹脂を除去するタイバーカットを要せず、製造コストを低減することができる。
【0038】
更には、端子部を基板回路に線接触させることができるので、プリント基板へのハンダ付けの際に端子部を別途に押しつける必要がなく、押圧治具を媒体として生じるリード間のハンダブリッジを防止でき、ハンダ付けの際には、端子部の下端部に湾曲底面が形成されているので、同湾曲底面とプリント基板の基板回路上面との間に丸みを帯びた略楔形状の間隙を形成でき、毛細管現象を生じさせて同間隙への溶融ハンダの流れ込みを良くすることができるので、ハンダ付けの信頼性を高めることができる。
【図面の簡単な説明】
【図1】本発明に係る樹脂封止型電子部品の斜視図である。
【図2】プリント基板に装着した樹脂封止型電子部品の側面図である。
【図3】樹脂封止型電子部品のテスト状況を示す説明図である。
【図4】リードフレームの側面図である。
【図5】ワイヤボンディング後の半製品の断面側面図である。
【図6】樹脂封止後の半製品の断面側面図である。
【図7】完成品の断面側面図である。
【符号の説明】
A 樹脂封止型半導体(樹脂封止型電子部品)
R 封止樹脂
1 端子部
32 リード
33 アイランド
34 屈折中心
35 半導体チップ
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a resin-sealed electronic component.
[0002]
[Prior art]
Conventionally, a resin-encapsulated electronic component has a semiconductor chip, an island on which the semiconductor chip is mounted, and a lead having one end connected to an electrode of the semiconductor chip sealed with a resin, and is exposed from the sealing resin. The exposed lead is refracted and the exposed lead is connected to the circuit board.
[0003]
[Problems to be solved by the invention]
However, since the lead is punched and formed, the peripheral part is unshaped, and the tie bar punch for removing the burr protruding between the leads and the outside of the lead of the lead frame are formed to shape the exposed part of the lead. Edge cutting punches for cutting the lead frame connected to the end are required. These punches require high precision and are expensive. Further, the punch work requires a precise workpiece positioning device, which increases the cost. There is a problem of doing.
[0004]
In addition, since the exposed portion of the lead extends outward from the sealing resin, the outer shape of the resin-encapsulated electronic component is increased, and not only the mounting density on the circuit board cannot be increased, but also the exposed portion is Since it is easily deformed, there is a problem that special care is required for maintenance of the shape and the packaging cost is also expensive.
[0005]
Furthermore, since the lead extends long from the sealing resin, it is necessary to press the terminal part against the printed circuit board with a ceramic pressing jig when soldering for mounting. There is a problem in that a solder bridge is formed between adjacent leads via the circuit, causing a circuit failure.
[0006]
In addition, when testing resin-encapsulated electronic components, precise positioning in two vertical and horizontal directions is required with respect to the tester probe, and the cost is high, and the leads extend from the sealing resin for a long time. There is a risk that the test may be inaccurate due to a contact failure between the terminal portion of the lead tip and the probe, and there is a problem that the lead is deformed when a strong pressure is applied to prevent the contact failure.
[0007]
[Means for Solving the Problems]
Therefore, in the present invention, the chip and the lead connected to the chip are sealed with a sealing resin, the leading end of the lead is exposed to the outside of the sealing resin, and the exposed portion of the lead is exposed to the sealing resin side. In a resin-encapsulated electronic component that is cut in a substantially vertical direction along the end surface and the exposed portion of the remaining lead is used as a terminal portion, the lead passes through an inner refracting portion and an outer refracting portion that are refracted substantially at right angles. It consists of a sealing lead part, a step lead part, and an exposed lead part that is one step lower than the sealing lead part, and the outer refracting part has its refracting center positioned near the side end face of the sealing resin. , thereby forming the stepped lead portion by refracting the lead around the same refractive centered substantially perpendicular upward direction, the exposed lead portion sealed with resin to protrude from the bottom surface of the sealing resin downward, sealing To be flush with the side edge of the resin That the exposed by cutting the lead unit, to St. provide a resin sealed electronic component, characterized in that the lower surface of the formed terminal portion for substantially 1/4 is brought Rutotomoni contact board circuit and line curved in an arc shape It is.
[0008]
DETAILED DESCRIPTION OF THE INVENTION
Thus, prior to the resin sealing process of the electronic component, the lead is refracted in the vicinity of the boundary between the sealing portion and the exposed portion, and after the resin sealing, the lead is cut along the side end surface of the sealing resin. Thus, by using the tip of the lead remaining on the sealing resin side as the terminal portion, the terminal portion protrudes downward from the bottom surface of the sealing resin, but the terminal portion extends outward from the side end surface of the sealing resin. A resin-encapsulated electronic component is formed so as not to protrude.
[0009]
【Example】
Embodiments of the present invention will be described with reference to the drawings.
[0010]
FIG. 1 shows a state in which a semiconductor electronic component A as a resin-encapsulated electronic component according to the present invention is inverted, and the electronic component A is a peripheral portion of a bottom surface R1 of a substantially rectangular parallelepiped sealing resin R. In addition, a large number of terminal portions 1 formed at the tips of leads 32 to be described later are projected with a predetermined gap.
[0011]
In the terminal portion 1, the exposed portion of the lead 32 is cut in a substantially vertical direction along the side end surface R 2 of the sealing resin R, and the exposed portion of the remaining lead 32 is used as the terminal portion 1. That is, the terminal portion 1 is formed in a substantially arc shape when viewed from the side, and the side end surface 2 of the terminal portion 1 is formed to be flush with the side end surface R2 of the sealing resin. It does not protrude outward from the side end face R2.
[0012]
A curved bottom surface 5 having a substantially 1/4 arc shape is formed from the leading edge 3 of the terminal portion side end surface 2 to the inner edge 4 where the terminal portion 1 intersects the lower bottom surface R1 of the sealing resin R.
[0013]
The left and right side surfaces 6 of the terminal portion 1 are substantially orthogonal to the lower bottom surface R1 of the sealing resin R, the terminal portion side end surface 2, and the curved bottom surface 5.
[0014]
Inside the sealing resin R, a semiconductor chip 35 to be described later, an island 33 for supporting the semiconductor chip 35, and an inner portion of a lead 32 whose inner end is connected to the semiconductor chip 35 via a bonding wire 36 are incorporated. In addition, the connection between the semiconductor chip 35 and the external circuit is made through the numerous terminal portions 1 described above.
[0015]
FIG. 2 shows a resin-encapsulated semiconductor component A mounted on the upper surface of the printed circuit board 10 as an external circuit. A large number of substrate circuits 11 formed on the upper surface of the printed circuit board 10 and a large number of resin-encapsulated semiconductor components A are shown. The terminal portion 1 is brought into contact with each other, and each substrate circuit 11 in contact and the terminal portion 1 are electrically connected and fixed by soldering. In the figure, 12 is solder.
[0016]
As described above, in the resin-encapsulated semiconductor component A of the present invention, since the terminal portion 1 of the lead 32 does not project outward from the side end surface R2 of the encapsulating resin R, only the lower lower bottom surface R1 projects. It is possible to reduce the size of the sealed semiconductor component A and increase the mounting density on the printed circuit board 10 or the like.
[0017]
Further, since the terminal portion 1 protrudes from the lower surface of the sealing resin R, a standoff 13 for isolating the substrate circuit 11 of the printed board 10 and the resin-encapsulated semiconductor component A can be secured.
[0018]
Further, since the protruding amount of the terminal portion 1 is small, the terminal portion 1 is not deformed, the shape can be easily maintained and the packaging cost can be reduced.
[0019]
Furthermore, since the protruding amount of the terminal portion 1 is small, the rigidity is high, and the protruding height is easy to align, and furthermore, the terminal portion 1 is in line contact with the circuit board 11, so that the terminal portion can be used when soldering to the printed circuit board 10 or the like. There is no need to press 1 separately, and therefore, the formation of a solder bridge between the leads 32 using the pressing jig as a medium is prevented.
[0020]
Further, since the curved bottom surface 5 is formed at the lower end portion of the terminal portion 1 during the soldering, a substantially wedge shape with a roundness between the curved bottom surface 5 and the upper surface of the substrate circuit 11 of the printed circuit board 10 is formed. Thus, the molten solder flows into the gap due to the capillary phenomenon, and the soldering reliability can be improved.
[0021]
FIG. 3 shows a test state of the resin-encapsulated semiconductor component A. As shown in the drawing, the encapsulating resin side end face R2 is sandwiched between the guide members 20 and 20 arranged on both sides, thereby encapsulating. Positioning is performed using the resin side end surface R2 as a guide so that each terminal portion 1 can be accurately positioned on the upper surface of each probe 21, so that an expensive positioning device or the like is not required, and the rigidity of the terminal portion 1 is further increased. Since it is high, each terminal part 1 can be brought into reliable contact with each probe 21 without deforming each terminal part 1 simply by pressing the sealing resin R part in the direction of the probe 21. Can be improved.
[0022]
The probe 21 is formed in a substantially U-shape that is open in the horizontal direction and has a slight elasticity in the vertical direction. Even if there is a slight difference in the downward protrusion amount of the terminal portion 1, The probe 21 is surely in contact with the terminal portion 1.
[0023]
Next, with reference to FIGS. 4-7, manufacture of the said resin-encapsulated semiconductor component A is demonstrated.
[0024]
FIG. 4 shows a lead frame 30, in which a large number of leads 32 project inward from the outer peripheral portion 31 of the lead frame 30, and an island 33 is formed at a central portion separated from the lead 32. The inner portion of each lead 32 and the island 33 are set at a position one step higher than the outer periphery of the lead frame 30.
[0025]
As shown in FIG. 5, each lead 32 includes a high-level sealed lead portion 32a, a one-step lower-level exposed lead portion 32b, and a stepped lead portion 32c between the sealed lead portion 32a and the exposed lead portion 32b. Each lead portion 32a, 32b, 32c is continuous through inner and outer refracting portions 32d, 32e that are refracted substantially at right angles, and in particular, the outer refracting portion 32d has its refracting center 34. Is positioned in the vicinity of the sealing resin side end surface R2 described later.
[0026]
That is, a refraction center 34 is set at a slightly inner high position from the projecting base portion from the lead frame 30, and the lead 32 is refracted substantially vertically upward with the refraction center 34 as a center to form a step lead portion 32c. The lead 32 is refracted in a substantially perpendicular inner direction to form a sealed lead portion 32a.
[0027]
As described above, since the lead 32 is refracted at a substantially right angle with the center of refraction 34 as the center, the bottom surface of the terminal portion 1 is curved into a substantially 1/4 arc shape, and the above-described curved bottom surface is processed without additional processing. 5 will be formed.
[0028]
FIG. 5 shows a semi-finished product in which a semiconductor chip 35 is mounted on the upper surface of the island 33 shown in FIG. 4 and each electrode pad of the semiconductor chip 35 and the inner end of the lead 32 are connected by a bonding wire 36.
[0029]
FIG. 6 shows a semi-finished product in which the semiconductor chip 35, the inner portion of the lead 32, the bonding wire 36, etc. of the semi-finished product shown in FIG. 5 are sealed with a sealing resin R having a substantially rectangular parallelepiped shape. The bottom surface R1 of R is set to be substantially the same height as the top surface of each lead 32, and the lead 32 outside the refraction center 34 so that the sealing resin side end surface R2 passes near the refraction center 34. The outer peripheral portion 31 of the lead frame 30 is exposed from the sealing resin R to the outside.
[0030]
7 shows that the exposed portion 37, that is, the outer peripheral portion 31 of the lead frame 30 and the lead 32 in the vicinity of the outer peripheral portion 31 are cut from the semi-finished product shown in FIG. 6 in the same plane as the sealing resin side end surface R2. The finished product of the resin-encapsulated semiconductor component A with the remaining lead 32 as the terminal portion 1 and the cut surface as the terminal portion side end surface 2 is shown.
[0031]
As described above, the outer peripheral part 31 and the exposed lead part 32b of the lead frame 30 are cut off in the same plane as the sealing resin side end face R2, so the cutting edge is simply aligned with a straight punch and die. This eliminates the need for a punch and die having a complicated shape as in the case of the resin-encapsulated semiconductor, and further eliminates the need for a tie bar cut for removing the resin protruding from the encapsulating resin R, thereby reducing the manufacturing cost. .
[0032]
Furthermore, since the terminal portion 1 is close to the sealing resin R, it is not easily affected by the deformation of the lead frame 30, and no lead shape intermediate inspection or lead reforming after the resin sealing process is required. Further, the cost can be reduced.
[0033]
【The invention's effect】
According to the present invention, the following effects can be obtained.
[0034]
According to the first aspect of the present invention, the chip and the lead connected to the chip are sealed with the sealing resin, the leading end portion of the lead is exposed to the outside of the sealing resin, and the exposed portion of the lead is sealed with the sealing resin. In a resin-encapsulated electronic component in which the exposed portion of the remaining lead is used as a terminal portion by cutting in a substantially vertical direction along the side end surface of the lead, the lead has an inner refracting portion and an outer refracting portion that are refracted substantially at right angles. And an exposed lead portion that is one step lower than the sealing lead portion, and the outer refractive portion is located near the side end face of the sealing resin. And forming the stepped lead portion by refracting the lead in a substantially right angle upward direction with the same refraction center as the center, and projecting the exposed lead portion downward from the bottom surface of the sealing resin, and resin sealing, It becomes flush with the side end face of the sealing resin. By cutting urchin the exposed lead portion, by which the resin sealed type electronic component, characterized in that the lower surface of the formed terminal portion for substantially 1/4 circular arc shape is curved Rutotomoni contact substrate circuit and the line, The outer end of the terminal portion does not protrude outward from the side end surface of the sealing resin, so that the resin-encapsulated electronic component can be miniaturized and the mounting density on a printed circuit board or the like can be increased.
[0035]
Further, there is no deformation of the terminal portion, the shape can be easily maintained and managed, and the packaging cost can be reduced.
[0036]
Also, when testing a resin-encapsulated electronic component, each terminal portion as a terminal can be accurately positioned on each probe upper surface of the tester by positioning using the end surface on the sealing resin side as a guide. Since the rigidity is high, simply pressing the sealing resin part in the direction of the probe can ensure that each terminal part and each probe are in contact with each other to improve the reliability of the test. Can be prevented.
[0037]
A terminal part whose refractive center is located in the vicinity of the outer peripheral edge of the bottom surface of the sealing resin is formed on the outer end portion of the lead, and the lower end portion of the terminal part projects downward from the bottom surface of the sealing resin. Since the exposed part is cut off in the same plane as the end face of the sealing resin side, it is only necessary to use a punch and die with a straight edge and a complicated shape like a conventional resin-sealed electronic component. A punch and a die are not required, and further, a tie bar cut for removing the resin protruding from the sealing resin is not required, and the manufacturing cost can be reduced.
[0038]
Furthermore, since the terminal part can be brought into line contact with the circuit board, there is no need to press the terminal part separately when soldering to the printed circuit board, and solder bridges between the leads generated using a pressing jig as a medium are prevented. When soldering, a curved bottom surface is formed at the lower end of the terminal portion, so that a substantially wedge-shaped gap with a round shape can be formed between the curved bottom surface and the top surface of the printed circuit board. In addition, it is possible to improve the soldering reliability because it is possible to improve the flow of the molten solder into the gap by causing a capillary phenomenon.
[Brief description of the drawings]
FIG. 1 is a perspective view of a resin-encapsulated electronic component according to the present invention.
FIG. 2 is a side view of a resin-sealed electronic component mounted on a printed board.
FIG. 3 is an explanatory diagram showing a test situation of a resin-encapsulated electronic component.
FIG. 4 is a side view of the lead frame.
FIG. 5 is a cross-sectional side view of a semi-finished product after wire bonding.
FIG. 6 is a cross-sectional side view of a semi-finished product after resin sealing.
FIG. 7 is a cross-sectional side view of a finished product.
[Explanation of symbols]
A Resin-sealed semiconductor (resin-sealed electronic components)
R Sealing resin 1 Terminal part
32 leads
33 Island
34 Center of refraction
35 Semiconductor chip

Claims (1)

チップと、同チップに接続したリードとを封止樹脂にて封止し、リードの先端部を封止樹脂の外部に露出させ、リードの露出部を封止樹脂の側端面に沿って略垂直方向に切断して、残存したリードの露出部分を端子部としてなる樹脂封止型電子部品において、
リードは、略直角に屈折した内側屈折部と外側屈折部とを介して封止リード部と、段差リード部と、前記封止リード部よりも一段低位置とした露出リード部とで構成し、
外側屈折部はその屈折中心を封止樹脂の側端面近傍に位置させて、同屈折中心を中心としてリードを略直角上方向に屈折させることにより前記段差リード部を形成するとともに、露出リード部を封止樹脂の下底面から下方に突出させて樹脂封止し、
封止樹脂の側端面と連続した面一となるように前記露出リード部を切断して、下面を略1/4円弧形状に湾曲させるとともに基板回路と線接触する端子部を形成したことを特徴とする樹脂封止型電子部品。
The chip and the lead connected to the chip are sealed with a sealing resin, the leading end of the lead is exposed to the outside of the sealing resin, and the exposed part of the lead is substantially vertical along the side end surface of the sealing resin. In a resin-encapsulated electronic component that is cut in the direction and the exposed portion of the remaining lead is used as a terminal portion,
The lead is composed of a sealed lead portion, a stepped lead portion, and an exposed lead portion positioned one step lower than the sealed lead portion through an inner refracted portion and an outer refracted portion refracted substantially at right angles,
The outer refracting portion has its refracting center positioned in the vicinity of the side end surface of the sealing resin, and the lead is refracted in a substantially right angle upward direction with the refracting center as a center. The resin is sealed by protruding downward from the bottom surface of the sealing resin,
The exposed by cutting the lead portion so that the side end face of the sealing resin and the flush continuous, that it has formed a terminal portion which is substantially 1/4 is brought Rutotomoni contact board circuit and line curved in an arc shape lower surface A resin-sealed electronic component.
JP8538997A 1997-04-03 1997-04-03 Resin-sealed electronic components Expired - Fee Related JP3681856B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8538997A JP3681856B2 (en) 1997-04-03 1997-04-03 Resin-sealed electronic components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8538997A JP3681856B2 (en) 1997-04-03 1997-04-03 Resin-sealed electronic components

Publications (2)

Publication Number Publication Date
JPH10284675A JPH10284675A (en) 1998-10-23
JP3681856B2 true JP3681856B2 (en) 2005-08-10

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP8538997A Expired - Fee Related JP3681856B2 (en) 1997-04-03 1997-04-03 Resin-sealed electronic components

Country Status (1)

Country Link
JP (1) JP3681856B2 (en)

Also Published As

Publication number Publication date
JPH10284675A (en) 1998-10-23

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