JP3234183B2 - Light scattering intensity measuring device - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a light scattering intensity measuring device capable of measuring the intensity of scattered light from a sample as a function of the scattering angle.

[0002]

2. Description of the Related Art The size, shape, and size of particles are measured by irradiating a sample with light and measuring the angle dependence and time change of scattered light.
Information on molecular weight, thermal motion, etc. can be obtained.
The device that measures the angle dependence of the scattered light is called a light scattering intensity measurement device, which irradiates the sample with light from one direction and places a detector that detects the scattered light on a goniometer that rotates around the sample. Install and rotate the goniometer to detect at various angles.

[0003]

However, in the light scattering intensity measuring apparatus described above, if it is desired to measure scattered light in a wide angle range, the measurement takes more than several tens of minutes and the time efficiency is low, and the measurement time is reduced. There is a disadvantage that a sample which causes a change with time such as association or aggregation cannot be measured. If the measurement time is to be shortened, it is necessary to reduce the number of angle points to be measured, thereby sacrificing data accuracy.

Further, there is a problem that it is necessary to design a machine with extremely high precision so that the observation point does not shift when the goniometer is rotated, and it takes time to manufacture the apparatus. Therefore, an apparatus for detecting scattered light by fixing a plurality of detectors in an annular shape around a sample has been developed. However, with this device, the number of measured angles is limited.

According to the present invention, there is provided a light scattering intensity measuring apparatus capable of measuring the intensity of scattered light from a sample as a function of the scattering angle, and extremely detects scattered light in a wide angle range up to 360 °. It is an object of the present invention to realize a light scattering intensity measuring device that can be performed in a short time.

[0006]

A light scattering intensity measuring apparatus according to the present invention comprises an irradiation light source for irradiating a sample with light, a reflecting mirror for reflecting and collecting scattered light from the sample, and a reflecting mirror. An imaging lens arranged at the focal point of the reflected light of the image forming an image on the surface of the reflector, and a diaphragm arranged at the focal point ,
Those comprising an imaging means for recording the image formed by said image forming lens (Claim 1).

According to the above configuration, since the imaging lens can form an image formed on the mirror surface of the reflecting mirror on the imaging surface, the imaging means can record the intensity pattern of the scattered light. . Thus, in that it has an imaging lens and the imaging device, JP-2- 223845 discloses merely utilized as a kind of the reflector simply integrating sphere, especially HirakiAkira 64-2
This is different from the invention described in Japanese Patent No. 9737.

[0008] The reflecting mirror may be an elliptical mirror constituted by a part of a spheroidal surface. In this case, an image formed on the mirror surface of the elliptical mirror can be formed on the imaging surface without aberration. The reflecting mirror may be a spherical mirror composed of a part of a spherical surface or a triangular pyramid mirror composed of a part of a triangular pyramid surface.
In this case, the mirror can be easily manufactured as compared with the elliptical mirror.

[0009]

Embodiments of the present invention will be described below in detail with reference to the accompanying drawings. FIG. 1 is a schematic diagram of a light scattering intensity measuring device according to the present invention. The light scattering intensity measuring device is a glass sample cell 1 for accommodating a measurement sample.
And mirrors 2a and 2b and a condenser lens 3 in this sample cell 1.
a, 3b, a laser device 5 for projecting a laser beam through a pinhole 4, an elliptical mirror 6 for condensing scattered light from a sample on an imaging lens 12, and a reflection from the elliptical mirror 6. An aperture 11 for transmitting light, an imaging lens 12, and a CCD camera 13 are arranged. The imaging lens 12 converts the image formed on the mirror surface of the ellipsoidal mirror 6 into C
The image is formed on the imaging surface of the CD camera 13. Reference numeral 7 denotes an absorption plate that absorbs a laser beam transmitted straight through the sample cell 1 and transmits the transmitted laser beam to a glass window 8.
Prevents reflection and scattering when hitting. The pinhole 4 and the aperture 11 play a role of cutting extra stray light around the laser beam and creating a clean laser beam profile.

In FIG. 1, the position of the laser device 5 is
Although it is above the sample cell 1 for the sake of plan drawing, it is not limited to this position as long as light can enter the sample cell 1. For example, it can be placed at the same height as the sample cell 1. Good (in this case the mirror placement will of course change). As shown in FIG. 2 (a), the ellipsoidal mirror 6 has a spheroidal surface whose section is cut into a circle and whose inner surface is a mirror surface. Due to the nature of the spheroid, the light emitted from one focal point 61 hits the elliptical mirror 6 and is focused on the other focal point 62. Note that the elliptical mirror 6 does not necessarily have to be formed in an annular shape with one round, and may be partially missing as shown in FIG. 2 (b). In short, it is only necessary that the mirror exists over the range of the scattering angle to be measured.

In the light scattering intensity measuring apparatus according to the present invention, one focal point is placed on the sample cell 1 and the other focal point is placed on the imaging lens 12 by utilizing the properties of the spheroid. Therefore, the scattered light from the sample cell 1 that hits the elliptical mirror 6 is reflected by the elliptical mirror 6, condensed on the imaging lens 12, and enters the CCD camera 13.

FIG. 3 is a diagram showing a specific structure of the light scattering intensity measuring device. In FIG. 3, illustration of a laser device for projecting a laser beam onto the sample cell 1, a mirror, and a condenser lens is omitted. The sample cell 1 is set in a constant temperature immersion bath filled with a liquid having a high refractive index, and scattered light emitted from the sample cell 1 passes through the glass window 8 and is reflected by the elliptical mirror 6. A flat mirror 10 that folds the light reflected by the elliptical mirror 6 is disposed immediately below the sample cell 1. The flat mirror 10 has an effect of suppressing the height of the entire device by folding the reflected light.

The light turned back by the plane mirror 10 is
The light enters the CCD camera 13 through the aperture 11 and the imaging lens 12. The CCD camera 13 uses a light receiving element having a very high positional resolution (for example, 512 × 512 pixels), and as a result, a scattering angle of 1 as a measurement angle resolution.
It is possible to obtain high-resolution data of less than °.

FIG. 4 shows an intensity pattern of scattered light generated on the imaging surface of the CCD camera 13. This pattern of scattered light is imaged pattern of the mirror surface of the ellipsoidal mirror 6 of about half missing ring shown in FIG. 2 (b), the scattering angle φ
Cover an angle range of 5 ° to 175 °.
Those of the pattern scattering angle φ and the horizontal axis and the rig rough is FIG.

As described above, it is possible to acquire scattered light intensity data at a wide angle at a time without moving the constituent elements of the optical system. Note that the present invention is not limited to the above embodiment of the present invention. For example, in order to focus the scattered light from the sample on the imaging lens 12, besides the elliptical mirror, a mirror 6b in which a part of a triangular pyramid is sliced as shown in FIG. A mirror 6c in which a part of the spherical surface is cut into a circle as shown in b) may be used. When these mirrors 6b and 6c are used, the light coming out of one focal point and hitting the elliptical mirror 6 like the elliptical mirror 6 does not converge on the other focal point without aberration, but the width of the ring W It is possible to collect light that has come out of one focal point and hits the mirrors 6b and 6c at almost one point by reducing. Therefore, even if these mirrors 6b and 6c are used, scattered light data can be obtained with an accuracy comparable to that of using the elliptical mirror 6.

[0016]

As described above, according to the light scattering intensity measuring apparatus of the present invention, the angle dependence of the scattered light can be measured at a time in a very wide angle range without moving the components constituting the optical system. Since the measurement can be performed, the time efficiency of the measurement can be significantly improved. Therefore, it is possible to measure a sample that causes a temporal change, which has been difficult to measure conventionally.

Further, since there are no moving parts in the components of the optical system, the stability and reliability of the measurement are improved, and the life of the apparatus is prolonged. Since there are few optical system components, there are advantages in terms of cost and manufacturing.

[Brief description of the drawings]

FIG. 1 is a schematic diagram of a light scattering intensity measuring device according to the present invention.

FIG. 2 is a diagram showing an ellipsoidal mirror in which the surface of a spheroid is sliced and the inner surface is a mirror surface.

FIG. 3 is a diagram showing a specific structure of a light scattering intensity measuring device.

FIG. 4 is a diagram showing an intensity pattern of scattered light generated on an imaging surface of a CCD camera.

FIG. 5 is a graph showing the scattered light intensity pattern as a function of the scattering angle φ .

FIG. 6 is a diagram showing a mirror 6b in which a part of a triangular pyramid is sliced, and a mirror 6c in which a part of a spherical surface is sliced.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 Sample cell 2a, 2b Mirror 3a, 3b Condensing lens 4 Pinhole 5 Laser device 6 Ellipsoidal mirror 10 Planar mirror 11 Aperture 12 Imaging lens 13 CCD camera

──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-59-122931 (JP, A) JP-A-63-243840 (JP, A) JP-A-2-96636 (JP, A) JP-A-62-263 172242 (JP, A) Special Table Hei 5-500815 (JP, A) (58) Fields investigated (Int. Cl. ⁷ , DB name) G01N 15/14 G01J 1/04 G01N 21/47

Claims (3)

(57) [Claims] 1. A light scattering intensity measuring apparatus capable of measuring the intensity of scattered light from a sample as a function of a scattering angle, comprising: an irradiation light source for irradiating the sample with light; and a scattered light from the sample reflected. A reflecting mirror for condensing, an imaging lens arranged at a condensing point of the reflected light from the reflecting mirror, and an image forming an image on the surface of the reflecting mirror, and an aperture arranged at the condensing point , The imaging
A light scattering intensity measuring device, comprising: an imaging unit that records an image formed by a lens . 2. The light scattering intensity measuring apparatus according to claim 1, wherein the reflecting mirror is an ellipsoidal mirror constituted by a part of a spheroidal surface. 3. The light scattering intensity measuring apparatus according to claim 1, wherein the reflecting mirror is a spherical mirror composed of a part of a spherical surface or a triangular pyramid mirror composed of a part of a triangular pyramid surface.