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JP3185516B2 - Method for manufacturing multilayer wiring board - Google Patents

Method for manufacturing multilayer wiring board

Info

Publication number
JP3185516B2
JP3185516B2 JP2220894A JP2220894A JP3185516B2 JP 3185516 B2 JP3185516 B2 JP 3185516B2 JP 2220894 A JP2220894 A JP 2220894A JP 2220894 A JP2220894 A JP 2220894A JP 3185516 B2 JP3185516 B2 JP 3185516B2
Authority
JP
Japan
Prior art keywords
treatment
solution
wiring board
multilayer wiring
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2220894A
Other languages
Japanese (ja)
Other versions
JPH06275952A (en
Inventor
清智 中村
明良 村木
利三郎 吉田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toppan Inc
Original Assignee
Toppan Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toppan Inc filed Critical Toppan Inc
Priority to JP2220894A priority Critical patent/JP3185516B2/en
Publication of JPH06275952A publication Critical patent/JPH06275952A/en
Application granted granted Critical
Publication of JP3185516B2 publication Critical patent/JP3185516B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Manufacturing Of Printed Wiring (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、接着性絶縁層を介し積
層された複数枚の内層用回路板を備える多層配線板の製
造方法に係り、特に、内層用回路板に設けられた銅箔製
の配線層と上記接着性絶縁層との接着不良が防止できる
と共に、製造工程途上で適用された適宜処理剤が上記配
線層と接着性絶縁層との界面に残留し難い簡便な多層配
線板の製造方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of manufacturing a multilayer wiring board having a plurality of inner circuit boards laminated via an adhesive insulating layer, and more particularly to a copper foil provided on an inner circuit board. A simple multi-layer wiring board that can prevent poor adhesion between a wiring layer made of a metal and the above-mentioned adhesive insulating layer, and in which an appropriate treating agent applied during the manufacturing process hardly remains at the interface between the above-mentioned wiring layer and the adhesive insulating layer. And a method for producing the same.

【0002】[0002]

【従来の技術】この種の多層配線板は、例えば、図13
〜図19に示すような各工程を経て製造されている。以
下その概略を説明すると、図13に示すように銅箔によ
り構成された配線層を有する複数枚の内層用回路板aを
外層用銅箔a1と共に接着性絶縁層(プリプレグ)bを
介し積層して一体化し、かつ、適宜穿設手段により図1
4に示すようなスルーホールcを穿設(ドリリング)し
た後、このスルーホールcの内壁面を銅めっきにて覆う
ためスルーホールの化学銅めっき処理を施して図15に
示すようなめっき層dを積層体表面とスルーホールc内
壁面にそれぞれ形成する。
2. Description of the Related Art A multilayer wiring board of this type is, for example, shown in FIG.
19 are manufactured through the steps shown in FIG. The outline will be described below. As shown in FIG. 13, a plurality of inner-layer circuit boards a having a wiring layer made of copper foil are laminated together with an outer-layer copper foil a1 via an adhesive insulating layer (prepreg) b. FIG. 1
After drilling (drilling) a through hole c as shown in FIG. 4, chemical plating of the through hole is performed to cover the inner wall surface of the through hole c with copper plating, and a plating layer d as shown in FIG. Is formed on the surface of the laminate and the inner wall surface of the through hole c.

【0003】次いで、この化学銅めっき層dの面上にス
ルーホールc周辺の一部と配線層形成部位を除きフォト
レジスト層eをパターン状に形成する(図16参照)と
共に、このフォトレジスト層eから露出する部位に順次
銅の電解めっき層fとはんだめっき層gを形成(図17
参照)し、かつ、上記フォトレジスト層eを除去した
後、この銅の電解めっき層fとはんだめっき層gをマス
クにして図18に示すように化学銅めっき層d等をエッ
チングにより除去し、更にこれ等面上にソルダー・レジ
スト層hを成膜して図19に示すような多層配線板iを
製造する方法が採られている。
Then, a photoresist layer e is formed in a pattern on the surface of the chemical copper plating layer d except for a part around the through hole c and a wiring layer forming portion (see FIG. 16). e, a copper electroplating layer f and a solder plating layer g are sequentially formed on portions exposed from e.
Then, after removing the photoresist layer e, using the copper electrolytic plating layer f and the solder plating layer g as a mask, the chemical copper plating layer d and the like are removed by etching as shown in FIG. Further, a method is employed in which a solder resist layer h is formed on these surfaces to manufacture a multilayer wiring board i as shown in FIG.

【0004】ところで、上記複数枚の内層用回路板aを
接着性絶縁層(プリプレグ)bを介して積層する際、内
層用回路板aに設けられた配線層が表面平滑な銅箔によ
り構成されているため、上記接着性絶縁層bとの接着強
度が不十分となり配線層と接着性絶縁層bとが経時的に
剥離し易い欠点があった。
When the plurality of inner circuit boards a are laminated via an adhesive insulating layer (prepreg) b, the wiring layers provided on the inner circuit boards a are made of copper foil having a smooth surface. Therefore, the adhesive strength with the adhesive insulating layer b was insufficient, and there was a disadvantage that the wiring layer and the adhesive insulating layer b were easily separated with time.

【0005】このため、従来においては図20(A)〜
(B)に示すように銅箔より成る配線層jの表面を、例
えば、水酸化ナトリウム(NaOH)が15〜25g/
l程度溶解されたアルカリ性亜塩素酸ナトリウム水溶液
等で表面処理して黒色で針状結晶のCuOより成る酸化
膜kを形成し、針状結晶の酸化膜kを介在させることに
より接着性絶縁層bとの接着強度の向上を図る方法(黒
化処理)が採られている。
For this reason, in the prior art, FIG.
As shown in (B), the surface of the wiring layer j made of copper foil is coated with, for example, sodium hydroxide (NaOH) at 15 to 25 g /
The surface is treated with an aqueous solution of about 1 l of alkaline sodium chlorite to form an oxide film k of black needle-like crystals of CuO, and the adhesive insulating layer b is formed by interposing the needle-like crystal oxide film k. (Blackening treatment) for improving the adhesive strength with the adhesive.

【0006】そして、このような方法を採ることで全体
的には配線層jと接着性絶縁層bとの接着強度の向上が
図れる利点を有していたが、その反面、CuOで構成さ
れた酸化膜kはアルカリ溶液に対し耐性を有するものの
酸には比較的容易に溶解されてしまうため、上述したス
ルーホールの化学銅めっき処理の際において化学銅めっ
きに対する触媒性を付与するため塩酸酸性のパラジウム
・錫水溶液にて処理するような場合、図21(A)に示
すようにスルーホールcの内壁面から露出する積層面が
この酸性のパラジウム・錫水溶液に触れその接触部位の
酸化膜kが図21(B)に示すように溶解して上記配線
層jの金属銅が露出し、図22に示すようにピンク色の
リングrがスルーホールcの周縁に沿って形成される
“ハローイング”と称される現象が発生することがあっ
た。
[0006] By adopting such a method, there is an advantage that the adhesive strength between the wiring layer j and the adhesive insulating layer b can be improved as a whole, but on the other hand, it is made of CuO. Although the oxide film k has resistance to an alkaline solution, it is relatively easily dissolved in an acid. In the case of treatment with a palladium / tin aqueous solution, as shown in FIG. 21 (A), the laminated surface exposed from the inner wall surface of the through hole c comes into contact with this acidic palladium / tin aqueous solution, and the oxide film k at the contact portion is exposed. As shown in FIG. 21B, the metal copper of the wiring layer j is exposed by melting, and a pink ring r is formed along the periphery of the through hole c as shown in FIG. When Phenomenon that is had to occur.

【0007】更に、上記塩酸酸性のパラジウム・錫水溶
液処理に加えてフォトレジスト層eから露出する部位に
銅の電解めっき層fを形成する際、このめっき液にはア
ルカリ性のピロ燐酸銅溶液と酸性の硫酸銅溶液が知られ
ているが、前者のピロ燐酸銅溶液は廃液処理の問題を生
じることから後者の硫酸銅溶液が多用される傾向にあ
る。従って、この酸性の硫酸銅溶液を使用した電解めっ
き処理によって上記酸化膜kが溶解しピンク色のリング
が更に拡大してしまうこともあった。
Further, in addition to the above-described hydrochloric acid acidic palladium / tin aqueous solution treatment, when forming a copper electrolytic plating layer f at a portion exposed from the photoresist layer e, an alkaline copper pyrophosphate solution and an acidic copper pyrophosphate solution are added to the plating solution. The copper sulfate solution of the former is known, but the former copper pyrophosphate solution causes a problem of waste liquid treatment, and therefore the latter copper sulfate solution tends to be frequently used. Therefore, the electrolytic plating using the acidic copper sulfate solution may dissolve the oxide film k and further enlarge the pink ring.

【0008】そして、これ等塩酸酸性のパラジウム・錫
水溶液による処理や硫酸銅溶液を使用した電解めっき処
理によって発生するピンク色リングの幅(L)は、スル
ーホールcの径が小さくなる程拡大する傾向にあり、例
えば、直径0.8mmのスルーホールでは100μm以下
であるのに対し、直径0.4mm以下のスルーホールでは
200〜400μm程度になることもあった。
The width (L) of the pink ring generated by the treatment with the hydrochloric acid acidic palladium / tin aqueous solution or the electrolytic plating treatment using the copper sulfate solution increases as the diameter of the through hole c decreases. For example, a through hole with a diameter of 0.8 mm has a tendency to be 100 μm or less, while a through hole with a diameter of 0.4 mm or less has a tendency to be about 200 to 400 μm.

【0009】このような現象が発生すると、図23に示
すようにスルーホールc内壁面の配線層jと接着性絶縁
層bとの界面に空隙sが形成されてしまうためこれ等間
の接着強度の低下が起こって経時的に剥離し易く、か
つ、この空隙s内に製造工程中の処理液が残留し易くな
るため多層配線板としての信頼性を低下させてしまう問
題があった。
When such a phenomenon occurs, a void s is formed at the interface between the wiring layer j on the inner wall surface of the through hole c and the adhesive insulating layer b, as shown in FIG. Therefore, there is a problem that the reliability of the multilayer wiring board is reduced because the processing liquid during the manufacturing process is easily left in the voids s due to a decrease in the thickness of the multilayer wiring board.

【0010】尚、上記アルカリ性亜塩素酸ナトリウム水
溶液等アルカリ性酸化処理液による黒化処理の条件を適
宜調整し、針状結晶のCuOと共に耐酸性を有するCu
2Oが混在された酸化膜を配線層の表面に形成してこれ
等弊害を防止する方法も考えられているが、未だ十分な
結果を得るまでには至っていない。
The conditions of the blackening treatment with an alkaline oxidizing solution such as the above-mentioned aqueous solution of alkaline sodium chlorite are appropriately adjusted, so that the acid-resistant CuO having acicular crystals can be obtained together with the needle-like crystals.
Although a method of preventing such adverse effects by forming an oxide film containing 2O on the surface of the wiring layer has been considered, sufficient results have not yet been obtained.

【0011】このような技術的背景の下、特開平2−5
8898号公報においては上述した黒化処理にて形成さ
れた銅の酸化膜の一部について1/30〜1/10規定
の硫酸により溶解処理を施し上記酸化膜の表面状態を改
質して上述したハローイング現象を回避する方法が開示
されている。
Under such technical background, Japanese Patent Laid-Open No.
In JP-A-8898, a part of a copper oxide film formed by the above-described blackening treatment is subjected to a dissolving treatment with 1/30 to 1/10 normal sulfuric acid to modify the surface state of the above-mentioned oxide film. A method for avoiding the haloing phenomenon described above is disclosed.

【0012】[0012]

【発明が解決しようとする課題】そして、この方法によ
れば上記ハローイング現象を確かに抑制することが可能
になるため配線層と接着性絶縁層との接着不良が防止で
き、かつ、上記配線層と接着性絶縁層との界面に酸処理
剤等が残留し難くなるため多層配線板としての信頼性の
向上も図れる利点を有している。
According to this method, the above-described haloing phenomenon can be surely suppressed, so that a poor adhesion between the wiring layer and the adhesive insulating layer can be prevented, and the above-mentioned wiring can be prevented. Since an acid treatment agent or the like hardly remains at the interface between the layer and the adhesive insulating layer, there is an advantage that the reliability as a multilayer wiring board can be improved.

【0013】しかし、1/30〜1/10規定の硫酸処
理液が収容された同一浴を用いて複数枚の回路板を連続
的に処理した場合、浴内におけるCuOの溶解量が増え
るに従い処理液のpHが変動し、これに伴い上記回路板
における酸化膜表面の改質程度が低下して多層配線板と
しての信頼性がばらつき易い問題点があった。
However, when a plurality of circuit boards are continuously treated using the same bath containing a 1/30 to 1/10 normal sulfuric acid treatment solution, the treatment is carried out as the amount of CuO dissolved in the bath increases. The pH of the solution fluctuates, and accordingly, the degree of modification of the surface of the oxide film on the circuit board is reduced, so that there is a problem that the reliability as the multilayer wiring board tends to vary.

【0014】尚、上記浴内の硫酸処理液を新しい処理液
と頻繁に交換することにより上記酸化膜表面の改質程度
を揃えることは可能であるが、かかる方法を採った場
合、作業効率が悪くなると共に処理コストが割高となる
問題点があった。
It is possible to make the degree of modification of the surface of the oxide film uniform by frequently replacing the sulfuric acid treatment solution in the bath with a new treatment solution. There is a problem that the processing cost becomes higher as well as worsening.

【0015】本発明はこのような問題点に着目してなさ
れたもので、その課題とするところは上記ハローイング
現象を抑制することにより内層用回路板に設けられた銅
箔製の配線層と接着性絶縁層との接着不良が防止できる
と共に、製造工程途上で適用された適宜処理剤が上記配
線層と接着性絶縁層との界面に残留し難い簡便な多層配
線板の製造方法を提供することにある。
The present invention has been made in view of such a problem, and an object of the present invention is to suppress the above-mentioned haloing phenomenon and thereby to reduce the wiring layer made of copper foil provided on the inner layer circuit board. Provided is a simple method for manufacturing a multilayer wiring board, which can prevent poor adhesion to an adhesive insulating layer and can prevent an appropriate treating agent applied during a manufacturing process from remaining at an interface between the wiring layer and the adhesive insulating layer. It is in.

【0016】[0016]

【課題を解決するための手段】すなわち請求項1に係る
発明は、銅箔により構成された配線層を有する内層用回
路板の上記配線層を表面処理し、この表面処理された複
数枚の内層用回路板を接着性絶縁層を介し積層して多層
配線板を製造する方法を前提とし、上記表面処理が、ア
ルカリ性酸化処理液による黒化処理とこれに続くリン酸
リン酸水素二ナトリウム又はリン酸三ナトリウムを含
有するpH0〜3の緩衝液が収容された処理浴内に浸漬
する酸処理とで構成されていることを特徴とするもので
ある。
That is, according to the first aspect of the present invention, the wiring layer of the inner layer circuit board having a wiring layer made of copper foil is subjected to a surface treatment, and a plurality of the surface-treated inner layers are provided. Assuming a method for manufacturing a multilayer wiring board by laminating circuit boards for use with an adhesive insulating layer interposed therebetween, the above-mentioned surface treatment is performed by a blackening treatment with an alkaline oxidizing solution and subsequent phosphoric acid and disodium hydrogen phosphate or An acid treatment in which a buffer solution having a pH of 0 to 3 containing trisodium phosphate is immersed in a treatment bath.

【0017】このような技術的手段において、上記黒化
処理とは配線層表面をアルカリ性酸化処理液により酸化
してCuOにより構成される黒色の針状結晶を生成さ
せ、この針状結晶に基づく微細な凹凸を生じさせる表面
粗面化処理を意味し、この処理には上述したアルカリ性
亜塩素酸ナトリウム水溶液等の周知の黒化処理液が適用
できる。また、これに続く酸処理とは、上記処理面を
衝液により処理してCuOの針状結晶を溶解除去しこの
CuOが除去された表面をより一層微細に粗面化する処
理を意味している。尚、酸処理直後の上記配線層は赤色
(Cu又はCu2Oの色)を呈しているがこれを加熱乾
燥若しくは室温乾燥すると黒色に近い灰色に変色する。
但し、このように変色した後の配線層表面に上記針状結
晶は観察されず酸処理直後の極めて微細な凹凸がそのま
ま維持されている。
In the above technical means, the blackening treatment means that the surface of the wiring layer is oxidized with an alkaline oxidizing solution to produce black needle-like crystals composed of CuO, and fine particles based on the needle-like crystals are formed. This means a surface roughening treatment for generating unevenness, and a well-known blackening treatment liquid such as the above-mentioned aqueous solution of alkaline sodium chlorite can be applied to this treatment. Further, the subsequent acid treatment means that the treated surface is moderated.
It means a treatment for dissolving and removing the needle-like crystals of CuO by treating with an impingement liquid, and further finely roughening the surface from which the CuO has been removed. The wiring layer immediately after the acid treatment exhibits a red color (the color of Cu or Cu 2 O), but when it is heated and dried or dried at room temperature, the wiring layer turns into a gray color close to black.
However, the needle-like crystals were not observed on the surface of the wiring layer after such discoloration, and extremely fine irregularities immediately after the acid treatment were maintained.

【0018】そして、このような微細な凹凸を備える配
線層に対し接着性絶縁層を重合して加熱加圧すると、上
記接着性絶縁層は微細な凹凸に沿って変形して密着しそ
の接着強度が向上する。従って、その後の酸性処理液
(例えば、化学銅めっき処理の前の塩酸酸性のパラジウ
ム・錫水溶液や電解めっき処理の際の酸性硫酸銅溶液
等)による処理の際に上記酸性処理液が配線層と接着性
絶縁層との間に浸透し難くなり上述したハローイングの
発生や接着強度の低下が防止される。
When the adhesive insulating layer is superimposed on the wiring layer having such fine irregularities and heated and pressed, the adhesive insulating layer is deformed and adhered along the fine irregularities, and has an adhesive strength. Is improved. Therefore, in the subsequent treatment with an acidic treatment solution (for example, an aqueous solution of palladium tin containing hydrochloric acid before the chemical copper plating treatment or an acidic copper sulfate solution during the electrolytic plating treatment), the above-mentioned acid treatment solution is combined with the wiring layer. It hardly penetrates into the adhesive insulating layer, and the above-described occurrence of haloing and reduction in adhesive strength are prevented.

【0019】尚、上記酸処理にはリン酸とリン酸水素二
ナトリウム又はリン酸三ナトリウムを含有するpH0〜
3の緩衝液が適用される。すなわち、pH0未満の強い
酸を適用すると上記微細な凹凸が形成されることなく表
面が平滑化されてしまい配線層と接着性絶縁層との接着
強度の向上が図れなくなるからである。一方、pH3を
越える弱い酸を適用することは可能であるが、CuOの
溶解除去と微細な凹凸の形成に長時間を要してしまい処
理効率が極端に低下してしまうからである。従って、p
H0〜3の上記緩衝液を適用することを要する。
Incidentally, the above-mentioned acid treatment includes phosphoric acid and hydrogen phosphate.
PH 0 containing sodium or trisodium phosphate
3 buffers are applied. That is, when a strong acid having a pH of less than 0 is applied, the surface is smoothed without forming the above-mentioned fine irregularities, so that it is impossible to improve the adhesive strength between the wiring layer and the adhesive insulating layer. On the other hand, it is possible to apply a weak acid exceeding pH 3, but it takes a long time to dissolve and remove CuO and to form fine irregularities, resulting in extremely low treatment efficiency. Therefore, p
It is necessary to apply the above buffers H0-3.

【0020】また、このpH0〜3の上記緩衝液は、従
来技術において例示した1/30〜1/10規定の硫酸
処理液に較べてpHの安定性が良好なため、この緩衝液
が収容された同一浴を用いて複数枚の回路板を連続的に
処理してもpHの変動が少ない利点を有している。そし
て、pH0〜3の上記緩衝液としては、リン酸水溶液に
適量のリン酸水素二ナトリウム、リン酸三ナトリウム等
を添加した緩衝液が挙げられる。また、酸溶液の解離度
は温度に依存して変化しそのpHも温度に依存して変化
するため、上記pHの調整に当たっては酸処理を行う際
の温度条件に留意することを要する。尚、配線層の酸処
理は室温〜80℃程度の温度で行うことができ、また、
この酸処理の処理時間は上記緩衝液と配線層との反応が
平衡状態に達するまで行うことが望ましく、通常15秒
〜5分程度である。また、リン酸は、以下に述べるクエ
ン酸に較べて解離度が高いため、クエン酸処理液を用い
る請求項4〜6に係る発明より低温の処理液温度で酸処
理が行える利点を有している。
Further, the buffer of the pH0~3 because the stability of the pH compared to the sulfuric acid treatment solution of the illustrated 1 / 30-1 / 10 defined in the prior art is good, the buffer <br / Even if a plurality of circuit boards are continuously processed using the same bath containing>, there is an advantage that the fluctuation of pH is small. Examples of the buffer having a pH of 0 to 3 include a buffer obtained by adding an appropriate amount of disodium hydrogen phosphate or trisodium phosphate to a phosphoric acid aqueous solution. In addition, the degree of dissociation of the acid solution changes depending on the temperature, and its pH also changes depending on the temperature. Therefore, in adjusting the pH, it is necessary to pay attention to the temperature conditions when performing the acid treatment. Note that the acid treatment of the wiring layer can be performed at a temperature of about room temperature to about 80 ° C.
The acid treatment is preferably performed until the reaction between the buffer solution and the wiring layer reaches an equilibrium state, and is usually about 15 seconds to 5 minutes. Further, since phosphoric acid has a higher degree of dissociation than citric acid described below, it has an advantage that the acid treatment can be performed at a lower treatment liquid temperature than the invention according to claims 4 to 6 using a citric acid treatment liquid. I have.

【0021】次に、上記配線層表面を酸処理する際、そ
の酸処理中のpHの変動がより少ない処理液を適用する
と有利である。すなわち、酸処理中、適用された処理液
が経時的に疲労してそのpHが3以上になると上記Cu
Oの溶解除去と微細な凹凸の形成に長時間を要する結果
になり、かつ、この処理時間が短いと微細な凹凸の形成
が困難となり多層配線板としての信頼性が低下する問題
を生ずるからである。請求項2に係る発明は上記処理液
としての緩衝液を特定した発明に関する
Next, when the surface of the wiring layer is subjected to the acid treatment, it is advantageous to use a treatment liquid having less pH fluctuation during the acid treatment. That is, during the acid treatment, when the applied treatment liquid fatigues with time and its pH becomes 3 or more, the Cu
Since it takes a long time to dissolve and remove O and form fine irregularities, and if the treatment time is short, it is difficult to form fine irregularities, which causes a problem that reliability as a multilayer wiring board is reduced. is there. The invention according to claim 2 is the treatment liquid
The present invention relates to an invention in which a buffer solution is specified .

【0022】すなわち、請求項2に係る発明は、請求項
1記載の発明に係る多層配線板の製造方法を前提とし、
上記緩衝液が、リン酸とリン酸三ナトリウムを含む水溶
液により構成されていることを特徴とするものである。
That is, the invention according to claim 2 is based on the method for manufacturing a multilayer wiring board according to the invention described in claim 1,
The buffer is composed of an aqueous solution containing phosphoric acid and trisodium phosphate.

【0023】かかる緩衝液を使用する請求項1〜2に係
る発明によれば、多数枚の内層用回路板を一度に処理し
てもpHの変動が少ないため工場内で大量の内層用回路
板を安定して処理することが可能となり、また、処理さ
れた内層用回路板の部位によって処理の程度が異なるこ
ともなく、更に、緩衝液のpHが安定しているためこの
緩衝液の管理も容易となる利点を有している。
[0023] according According to buffer according to claim 1 or 2 for the use of the inventive, large amounts of the inner layer circuit board in the factory for even a small variation in pH by processing a large number of internal layer circuit board at a time Can be stably processed, and the degree of processing does not vary depending on the portion of the processed inner layer circuit board. Further, since the pH of the buffer is stable, the management of the buffer is also difficult. It has the advantage of being easy.

【0024】尚、上記緩衝液のリン酸濃度は、以下に述
べる確認試験の結果から理解されるように3重量%〜1
2重量%の場合に処理液のpH安定性と処理コストの低
減とを共に図ることが可能となる。請求項に係る発明
はこのような試験結果からなされたものである。
Incidentally, the phosphate concentration of the above buffer solution is 3% by weight to 1% as understood from the results of the confirmation test described below.
In the case of 2% by weight, it is possible to achieve both the pH stability of the processing solution and the reduction of the processing cost. The invention according to claim 3 has been made based on such test results.

【0025】すなわち、請求項に係る発明は、請求項
1又は2記載の発明に係る多層配線板の製造方法を前提
とし、上記緩衝液のリン酸濃度が3重量%〜12重量%
であることを特徴とするものである。
That is, the third aspect of the present invention provides
Assuming that the method for manufacturing a multilayer wiring board according to the invention described in 1 or 2, the phosphoric acid concentration of the buffer is 3% by weight to 12% by weight.
It is characterized by being.

【0026】次に、請求項4〜6に係る発明は、リン酸
リン酸水素二ナトリウム又はリン酸三ナトリウムを含
有するpH0〜3の緩衝液に代えてクエン酸処理液を適
用する多層配線板の製造方法に関する。
Next, the invention according to claims 4 to 6 is a multilayer wiring in which a citrate treatment solution is used in place of a buffer solution of pH 0 to 3 containing phosphoric acid and disodium hydrogen phosphate or trisodium phosphate. The present invention relates to a method for manufacturing a plate.

【0027】すなわち、請求項に係る発明は、銅箔に
より構成された配線層を有する内層用回路板の上記配線
層を表面処理し、この表面処理された複数枚の内層用回
路板を接着性絶縁層を介し積層して多層配線板を製造す
る方法を前提とし、上記表面処理が、アルカリ性酸化処
理液による黒化処理とこれに続くpH0〜3のクエン酸
処理液が収容された処理浴内に浸漬する酸処理とで構成
されていることを特徴とするものである。
That is, according to a fourth aspect of the present invention, the wiring layer of the inner layer circuit board having the wiring layer made of copper foil is surface-treated, and the plurality of surface-treated inner layer circuit boards are bonded. The surface treatment is performed by a blackening treatment with an alkaline oxidizing treatment solution, followed by a treatment bath containing a citric acid treatment solution having a pH of 0 to 3; And acid treatment immersed in the inside .

【0028】この請求項に係る発明においてpH0〜
3のクエン酸処理液としては、クエン酸の水溶液あるい
はクエン酸水溶液に燐酸水素二ナトリウム又はクエン酸
カリウムを適量添加した緩衝液等が適用できる。また、
リン酸三ナトリウムの水溶液に(クエン酸+リン酸二水
素カリウム+ホウ酸+ジエチルパルビツル酸)又は(ホ
ウ酸+クエン酸)を適量添加した緩衝液等を適用するこ
とも可能である。
[0028] In the invention according to claim 4 , pH 0
As the citric acid treatment solution 3, an aqueous solution of citric acid or a buffer solution obtained by adding an appropriate amount of disodium hydrogen phosphate or potassium citrate to an aqueous solution of citric acid can be used. Also,
It is also possible to apply a buffer solution in which (citrate + potassium dihydrogen phosphate + boric acid + diethyl parbituric acid) or an appropriate amount of (boric acid + citrate) is added to an aqueous solution of trisodium phosphate.

【0029】そして、請求項に係る発明に適用される
クエン酸処理液は、請求項1に係る発明と同様に1/3
0〜1/10規定の硫酸処理液に較べてpHの安定性が
良好なため、このクエン酸処理液が収容された同一浴を
用いて複数枚の回路板を連続的に処理してもpHの変動
が少ない利点を有している。
The citric acid treatment solution applied to the invention according to claim 4 is 1/3 as in the invention according to claim 1.
Since the pH stability is better than that of the sulfuric acid-treated solution of 0 to 1/10 normal, even if a plurality of circuit boards are continuously treated using the same bath containing the citric acid-treated solution, This has the advantage that the fluctuation of is small.

【0030】また、請求項並びに請求項に係る発明
は、請求項及び請求項に係る発明と同様の目的から
なされた発明に関する。
Further, the inventions according to claims 5 and 6 relate to the inventions made for the same purpose as the inventions according to claims 1 and 3 .

【0031】すなわち、請求項に係る発明は、請求項
記載の発明に係る多層配線板の製造方法を前提とし、
上記クエン酸処理液が緩衝液により構成されていること
を特徴とし、また、請求項に係る発明は、請求項
記載の発明に係る多層配線板の製造方法を前提と
し、上記クエン酸処理液のクエン酸濃度が1.5重量%
〜10重量%であることを特徴とするものである。
That is, the invention according to claim 5 is the same as the claim 1.
Assuming a method for manufacturing a multilayer wiring board according to the invention described in 4 ,
The citric acid treatment solution is constituted by a buffer solution, and the invention according to claim 6 relates to the method for manufacturing a multilayer wiring board according to claim 4 or 5. Assuming that the citric acid concentration of the citric acid treatment solution is 1.5% by weight
-10% by weight.

【0032】尚、上記クエン酸あるいは緩衝液等により
構成された処理液はその酸処理により経時的に疲労する
が、疲労したこれ等処理液を電気分解することにより再
利用が可能となり経済的に有利な利点を有している。
The treatment solution composed of the citric acid or the buffer solution is fatigued with time due to the acid treatment, but can be reused by electrolyzing the exhausted treatment solution, thereby economically. It has advantageous advantages.

【0033】また、一連の処理が施された内層用回路板
を積層した後における多層配線板の製造工程は任意であ
り、例えば、上述した従来法と同様な工程を経て製造し
てもよいし他の工程を経てもよい。
The process of manufacturing the multilayer wiring board after laminating the inner-layer circuit boards subjected to the series of processes is optional. For example, the multilayer wiring board may be manufactured through the same process as the above-described conventional method. Other steps may be performed.

【0034】また、適用される内層用回路板については
その一面側にのみ配線層を有するものでもあるいは両面
側にそれぞれ配線層を有するものでもよく任意である。
The circuit board for the inner layer to be applied may be one having a wiring layer only on one side thereof or one having a wiring layer on both sides thereof.

【0035】[0035]

【作用】請求項1〜2に係る発明によれば、配線層に対
する表面処理が、アルカリ性酸化処理液による黒化処理
とこれに続くリン酸とリン酸水素二ナトリウム又はリン
酸三ナトリウムを含有するpH0〜3の緩衝液が収容さ
れた処理浴内に浸漬する酸処理とで構成されているた
め、配線層表面に微細な凹凸が形成され上記配線層に対
する接着性絶縁層の接着強度の向上が図れる。従って、
多層配線板の製造工程途上において塩酸酸性のパラジウ
ム・錫水溶液による処理や硫酸銅溶液が適用された電解
めっき処理等適宜酸処理を施しても、これ等処理液が配
線層と接着性絶縁層との間に浸透し難くなるため上述し
たハローイング現象を極力抑制することが可能となる。
According to the first and second aspects of the present invention, the surface treatment of the wiring layer is performed by blackening treatment with an alkaline oxidizing solution, followed by phosphoric acid and disodium hydrogen phosphate or phosphorous.
And an acid treatment of immersing in a treatment bath containing a buffer solution of pH 0 to 3 containing trisodium acid, so that fine irregularities are formed on the surface of the wiring layer, and the adhesive insulating layer for the wiring layer is formed. Can be improved in adhesive strength. Therefore,
During the manufacturing process of the multilayer wiring board, even if an appropriate acid treatment such as a treatment with a hydrochloric acid acidic palladium / tin aqueous solution or an electrolytic plating treatment using a copper sulfate solution is applied, the treatment liquid is used to form the wiring layer and the adhesive insulating layer. This makes it difficult to penetrate into the space, so that the above-described haloing phenomenon can be suppressed as much as possible.

【0036】また、リン酸とリン酸水素二ナトリウム又
はリン酸三ナトリウムを含有するpH0〜3の緩衝液は
従来技術において適用されていた硫酸処理液に較べpH
安定性が良好なためこの緩衝液が収容された同一浴を用
いて複数枚の回路板を連続的に処理することが可能とな
り、かつ、以下に述べるクエン酸に較べてリン酸の解離
度が高いため低温の処理液温度条件で酸処理が可能とな
る。
Also, phosphoric acid and disodium hydrogen phosphate or
The pH of the buffer solution containing 0 to 3 containing trisodium phosphate is higher than that of the sulfuric acid treatment solution applied in the prior art.
Because of its good stability, it is possible to continuously process a plurality of circuit boards using the same bath containing this buffer solution, and the dissociation degree of phosphoric acid is lower than that of citric acid described below. Since it is high, acid treatment can be performed at a low temperature of the processing solution.

【0037】[0037]

【0038】また、請求項に係る発明によれば、上記
緩衝液のリン酸濃度が3重量%〜12重量%に設定され
ているため処理液のpH安定性と処理コストの低減とを
共に図ることが可能となる。
Further, according to the invention according to claim 3, said
Since the phosphate concentration of the buffer solution is set to 3% by weight to 12% by weight, it is possible to achieve both pH stability of the processing solution and reduction of the processing cost.

【0039】次に、請求項に係る発明によれば、配線
層に対する表面処理が、アルカリ性酸化処理液による黒
化処理とこれに続くpH0〜3のクエン酸処理液が収容
された処理浴内に浸漬する酸処理とで構成されているた
め配線層表面に微細な凹凸が形成され、請求項1に係る
発明と同様、上記配線層に対する接着性絶縁層の接着強
度の向上が図れる。従って、多層配線板の製造工程途上
において塩酸酸性のパラジウム・錫水溶液による処理や
硫酸銅溶液が適用された電解めっき処理等適宜酸処理を
施しても、これ等処理液が配線層と接着性絶縁層との間
に浸透し難くなるため上述したハローイング現象を極力
抑制することが可能となる。
According to the fourth aspect of the present invention, the surface treatment for the wiring layer includes a blackening treatment with an alkaline oxidizing treatment solution and a subsequent citric acid treatment solution having a pH of 0 to 3.
And an acid treatment immersed in the treated bath, so that fine irregularities are formed on the surface of the wiring layer, and as in the invention according to claim 1, the adhesion strength of the adhesive insulating layer to the wiring layer is improved. Can be achieved. Therefore, even if an appropriate acid treatment such as treatment with hydrochloric acid acidic palladium / tin aqueous solution or electrolytic plating treatment using a copper sulfate solution is applied during the production process of the multilayer wiring board, the treatment liquid is not adhesively insulated from the wiring layer. Since it becomes difficult to penetrate between the layers, the above-described haloing phenomenon can be suppressed as much as possible.

【0040】また、上記クエン酸処理液は硫酸処理液に
較べpH安定性が良好なためこのリン酸処理液が収容さ
れた同一浴を用いて複数枚の回路板を連続的に処理する
ことが可能となる。
Since the citric acid-treated solution has better pH stability than the sulfuric acid-treated solution, it is possible to continuously treat a plurality of circuit boards using the same bath containing the phosphating solution. It becomes possible.

【0041】また、請求項に係る発明によれば、上記
クエン酸処理液が溶液のpHを略一定に維持する緩衝液
により構成されており同一の処理液により大量の内層用
回路板を一度に処理してもpHの変動が少ないため、請
求項に係る方法に較べて上記酸処理における処理液管
理をより簡便にすることが可能となる。
According to the fifth aspect of the present invention, the citric acid treatment solution is constituted by a buffer solution for maintaining the pH of the solution at a substantially constant value, and a large amount of the circuit board for the inner layer is formed by the same treatment solution once. Therefore, the treatment liquid management in the acid treatment can be more simplified than in the method according to the fourth aspect of the present invention, even if the treatment is carried out at a low temperature.

【0042】更に、請求項に係る発明によれば、クエ
ン酸処理液のリン酸濃度が1.5重量%〜10重量%に
設定されているため処理液のpH安定性と処理コストの
低減とを共に図ることが可能となる。
Further, according to the invention of claim 6 , since the concentration of phosphoric acid in the citric acid treatment liquid is set to 1.5% by weight to 10% by weight, the pH stability of the treatment liquid and the reduction of the treatment cost are reduced. Can be achieved together.

【0043】[0043]

【実施例】次に、主にリン酸処理液(リン酸溶液および
リン酸とリン酸三ナトリウムを含有する緩衝液の両方を
含む)についてその処理特性を確認するため以下の確認
試験を行った。 『リン酸濃度とpH』 まず、水100ccに、リン酸[85%、関東化学
(株)製]を加えていきそのpH変化を確認した。この
結果を図8に示す。 『リン酸のpH安定性(1)』 次に、上記結果を参考にして水溶液のpHが略1.8に
なるように下記の通り6種(a〜f)の処理液を調製し
た。 a.リン酸0.36%…pH=1.78 b.リン酸3.4% + リン酸三ナトリウム33.0g
/l…pH=1.70 c.リン酸5.95% + リン酸三ナトリウム74.5
g/l…pH=1.67 d.リン酸8.50% + リン酸三ナトリウム110g
/l…pH=1.62 e.リン酸17.0% + リン酸三ナトリウム293g
/l…pH=1.82 f.クエン酸40g/l…pH=1.49 これ等6種の処理液(水溶液:40℃)300ccに1
N−NaOHを加えていき、そのpH変化を調べた。こ
の結果を図9に示す。
Next, the following confirmation tests were carried out to confirm the treatment characteristics of a phosphating solution (including both a phosphoric acid solution and a buffer containing phosphoric acid and trisodium phosphate ). . "Phosphoric acid concentration and pH" First, phosphoric acid [85%, manufactured by Kanto Chemical Co., Ltd.] was added to 100 cc of water, and the pH change was confirmed. The result is shown in FIG. [PH Stability of Phosphoric Acid (1)] Next, referring to the above results, the following six treatment liquids (a to f) were prepared so that the pH of the aqueous solution became approximately 1.8. a. Phosphoric acid 0.36% pH = 1.78 b. 3.4% phosphoric acid + 33.0 g of trisodium phosphate
/L...pH=1.70 c. 5.95% phosphoric acid + 74.5% trisodium phosphate
g / l pH = 1.67 d. 8.50% phosphoric acid + 110 g of trisodium phosphate
/L...pH=1.62 e. Phosphoric acid 17.0% + Trisodium phosphate 293g
/L...pH=1.82 f. Citric acid 40 g / l pH = 1.49 These 6 kinds of treatment liquids (aqueous solution: 40 ° C.)
N-NaOH was added and the pH change was examined. The result is shown in FIG.

【0044】そして、この図9に示されたグラフ図か
ら、ある濃度以上のリン酸緩衝液はクエン酸(f)より
もpHの安定性が良好であることが確認できた。 『リン酸のpH安定性(2)』次に、pH安定性と建浴
コストのバランスを考慮したリン酸処理液の最適濃度を
求めた。尚、クエン酸処理液を用いた実験結果よりハロ
ーレス処理に適したpH値は2.3以下であることが既
に確認されていることから、図9のグラフ図についてp
H1.8〜2.3の範囲を拡大して再度プロットした。
この結果を図10に示す。そして、これ等(a〜fの処
理液)について回帰式を求め微分した結果を以下に示
す。尚、この数値が小さい程pHは変動し難いことを意
味する。
From the graph shown in FIG. 9, it was confirmed that the phosphate buffer at a certain concentration or more had better pH stability than citric acid (f). [PH Stability of Phosphoric Acid (2)] Next, the optimum concentration of the phosphating solution in consideration of the balance between the pH stability and the bathing cost was determined. The pH value suitable for haloless treatment was already confirmed to be 2.3 or less from the experimental results using the citric acid treatment solution.
The range of H1.8 to 2.3 was enlarged and plotted again.
The result is shown in FIG. The results of differentiating the regression formulas for these (the processing liquids a to f) are shown below. It should be noted that a smaller value means that the pH is less likely to fluctuate.

【0045】a. Y’= 1.648 × 10-1 b. Y’= 3.118 × 10-2 c. Y’= 1.919 × 10-2 d. Y’= 1.313 × 10-2 e. Y’= 1.021 × 10-2 f. Y’= 1.018 × 10-1 『リン酸のpH安定性(3)』そこで、リン酸処理液の
リン酸濃度を横軸にしてグラフを作成し上記微分値の変
化を調べた。この結果を図11に示す。
A. Y ′ = 1.648 × 10 −1 b. Y ′ = 3.118 × 10 −2 c. Y ′ = 1.919 × 10 −2 d. Y ′ = 1.313 × 10 −2 e. Y ′ = 1.021 × 10 −2 f. Y ′ = 1.018 × 10 −1 “pH Stability of Phosphoric Acid (3)” Therefore, a graph was prepared with the phosphoric acid concentration of the phosphating solution as the horizontal axis, and the change in the differential value was examined. The result is shown in FIG.

【0046】そして、図11に示されたグラフ図から、
リン酸処理液のリン酸濃度10%付近からほとんどpH
の安定性が向上していないことが確認される。この結
果、リン酸濃度は10%付近で使用することが最も効率
がよく(すなわちpH安定性と処理コストの低減とを共
に図れる)、今回のサンプルではリン酸8.50% +
リン酸三ナトリウム110g/l(d)の処理液が最も
効率のよい組成であることが確認できた。 『CuOの溶解量と各処理液のpH安定性』次に、以下
の4種の処理液について酸化銅粉を加えて疑似的に処理
液を疲労させ錯体の析出時期を調査した。すなわち、以
下処理液1000ccにCuO粉を加えていき、pHの
変化と沈殿物発生の有無を調べた。尚、この試験結果か
ら同一浴により処理液を交換することなく連続的に何枚
の配線板が処理可能であるか(処理可能枚数)が確認で
きる。
Then, from the graph shown in FIG.
Almost pH from 10% phosphoric acid concentration of phosphating solution
Is not improved. As a result, it is most efficient to use a phosphoric acid concentration of around 10% (that is, both pH stability and processing cost can be reduced). In this sample, phosphoric acid is 8.50% +
It was confirmed that the treatment liquid of trisodium phosphate 110 g / l (d) had the most efficient composition. "Dissolution amount of CuO and pH stability of each processing solution" Next, copper oxide powder was added to the following four processing solutions to artificially fatigue the processing solutions to investigate the precipitation time of the complex. That is, CuO powder was added to 1000 cc of the treatment liquid, and the change in pH and the occurrence of precipitates were examined. It should be noted that from the test results, it is possible to confirm how many wiring boards can be processed continuously (the number of sheets that can be processed) without changing the processing liquid in the same bath.

【0047】 (1)硫酸処理液:0.1体積%(液温…室温) (2)酒石酸処理液:酒石酸14.409g/l (液温…65℃) +酒石酸ナトリウム0.3451g/l (3)クエン酸処理液:クエン酸41.187g/l (液温…65℃) +Na2HPO4 0.5678g/l (4)リン酸処理液:リン酸8.50% (液温…40℃) +リン酸三ナトリウム110g/l(上述のd) この結果を図12及び下記表1に示す。(1) Sulfuric acid-treated solution: 0.1% by volume (liquid temperature: room temperature) (2) Tartaric acid-treated solution: 14.409 g / l tartaric acid (liquid temperature: 65 ° C.) + Sodium tartrate 0.3451 g / l ( 3) citric acid treatment solution: citric acid 41.187g / l (solution temperature ... 65 ℃) + Na 2 HPO 4 0.5678g / l (4) phosphating solution: 8.50% phosphoric acid (solution temperature ... 40 ° C. ) + Trisodium phosphate 110 g / l (d above) The results are shown in FIG. 12 and Table 1 below.

【0048】[0048]

【表1】 この結果から、リン酸処理液とクエン酸処理液は硫酸処
理液と酒石酸処理液に較べてCuOの溶解量が多くかつ
pH安定性が良好であることが確認できる。 『処理可能枚数』また、これ等の結果から各処理液につ
いてその処理可能枚数を計算により求めた。
[Table 1] From this result, it can be confirmed that the phosphating solution and the citric acid treating solution have a larger amount of dissolved CuO and better pH stability than the sulfuric acid treating solution and the tartaric acid treating solution. "Processable number" The processable number of each processing liquid was calculated from these results.

【0049】尚、比較的大型の配線板に相当する510
mm×609mmサイズの両面ベタ銅箔1枚の配線板に
ついて黒化処理によりCuOを形成し、処理された両面
ベタ銅箔から溶解するCuOの量は、Cuに換算(C
u:分子量63.5、CuO:分子量79.5)すると
2.678gとなり、また、CuOの量に換算すると、 2.67:63.5 = x:79.5 より、x=3.34gとなる。
It should be noted that 510 corresponding to a relatively large wiring board
A single-sided solid copper foil having a size of mm × 609 mm is formed with CuO by blackening treatment, and the amount of CuO dissolved from the treated double-sided solid copper foil is converted to Cu (C
u: molecular weight 63.5, CuO: molecular weight 79.5), it becomes 2.678 g, and when converted to the amount of CuO, 2.67: 63.5 = x: 79.5, x = 3.34 g. Become.

【0050】また処理浴の容量は100(リットル)と
する。 (1)硫酸処理液の処理可能枚数 CuO溶解量とpHとの関係を示した図12のグラフ図
から、CuO溶解量が0.85(g/l)程度でpHが
3を越えてしまうことが確認できる。
The capacity of the processing bath is set to 100 (liter). (1) Number of treatable sulfuric acid-treated solutions From the graph of FIG. 12 showing the relationship between the amount of dissolved CuO and the pH, the pH exceeded 3 when the amount of dissolved CuO was about 0.85 (g / l). Can be confirmed.

【0051】そして、100(リットル)の処理浴にお
いてはCuOが85gでpH3を越えることになるため
その処理可能枚数は85÷3.34=25.4枚とな
る。
In a 100 (liter) treatment bath, 85 g of CuO exceeds pH 3, so that the number of sheets that can be treated is 85 ÷ 3.34 = 25.4 sheets.

【0052】従って、硫酸処理液を適用した場合、25
枚程度で処理液を交換することが必要になるためその処
理液管理が繁雑となることが理解される。 (2)酒石酸処理液の処理可能枚数 CuO溶解量とpHとの関係を示した図12のグラフ図
から、CuO溶解量が0.5(g/l)程度で沈殿が発
生しその後の処理が困難となることが確認できる。そし
て100(リットル)の処理浴においてはCuOが50
gでその後の処理が困難となることからその処理可能枚
数は50÷3.34=15枚となる。
Therefore, when a sulfuric acid treatment solution is applied, 25%
It is understood that since it is necessary to exchange the processing liquid for each sheet, the processing liquid management becomes complicated. (2) Number of treatable tartaric acid treatment solutions From the graph of FIG. 12 showing the relationship between the amount of dissolved CuO and the pH, precipitation occurs when the amount of dissolved CuO is about 0.5 (g / l), and the subsequent treatment is not performed. It can be confirmed that it becomes difficult. In a 100 (liter) treatment bath, CuO is 50
Since the subsequent processing becomes difficult in g, the number of sheets that can be processed is 50 / 3.34 = 15.

【0053】従って、硫酸処理液を適用した場合と同様
にその処理液管理が繁雑となることが理解される。 (3)クエン酸処理液の処理可能枚数 CuO溶解量とpHとの関係を示した図12のグラフ図
から、CuO溶解量が略1.5(g/l)で沈殿が発生
しその後の処理が困難となることが確認できる。そし
て、100(リットル)の処理浴においてはCuOが1
50gでその後の処理が困難となることからその処理可
能枚数は150÷3.34=44.9枚となる。
Therefore, it is understood that the treatment liquid management becomes complicated as in the case where the sulfuric acid treatment liquid is applied. (3) Number of treatable citric acid treatment solutions From the graph of FIG. 12 showing the relationship between the amount of dissolved CuO and the pH, precipitation occurs when the amount of dissolved CuO is approximately 1.5 (g / l), and the subsequent treatment is performed. It can be confirmed that it becomes difficult. In a 100 (liter) treatment bath, CuO is 1
Since subsequent processing becomes difficult with 50 g, the number of sheets that can be processed is 150 ÷ 3.34 = 44.9 sheets.

【0054】従って、硫酸処理液等を適用した場合に較
べて処理液管理が簡便となることが理解される。 (4)リン酸処理液の処理可能枚数 CuO溶解量とpHとの関係を示した図12のグラフ図
から、CuO溶解量が略4.5(g/l)で沈殿が発生
しその後の処理が困難となることが確認できる。そし
て、100(リットル)の処理浴においてはCuOが4
50gでその後の処理が困難となることからその処理可
能枚数は450÷3.34=134.7枚となる。
Therefore, it is understood that the management of the treatment liquid is simpler than the case where the sulfuric acid treatment liquid or the like is applied. (4) Number of treatable phosphoric acid treatment liquids From the graph of FIG. 12 showing the relationship between the amount of dissolved CuO and the pH, precipitation occurs when the amount of dissolved CuO is approximately 4.5 (g / l), and subsequent treatment is performed. It can be confirmed that it becomes difficult. In a 100 (liter) treatment bath, CuO is 4
Since the subsequent processing becomes difficult with 50 g, the number of sheets that can be processed is 450 ÷ 3.34 = 134.7 sheets.

【0055】従って、硫酸処理液等を適用した場合に較
べて処理液管理が簡便となることが理解される。
Therefore, it is understood that the treatment liquid management becomes simpler than when a sulfuric acid treatment liquid or the like is applied.

【0056】尚、これ等試験においては両面ベタ銅箔の
配線板について行っているが、実際の処理は上記銅箔を
パターニングしたもの(パターニング処理の結果、銅の
残存率は40%程度と考えられる)について行うことか
ら、実際の上記処理可能枚数はその2.5倍程度の枚数
となる。
In these tests, a double-sided solid copper foil wiring board was used. However, the actual processing was performed by patterning the copper foil (the patterning processing indicated that the residual ratio of copper was about 40%). ), The actual number of sheets that can be processed is about 2.5 times that number.

【0057】以下、本発明の実施例について図面を参照
して詳細に説明する。 [実施例1]まず、内層用回路板として表裏両面に銅箔
が貼着されたガラス・エポキシ銅張積層板(340mm×
510mm×0.3mm)を適用し、この銅箔についてニュ
ウトラル・クリーン68(商標、シップレー社製)の2
5%溶液を用い60℃の条件でまず脱脂処理し、かつ、
水洗した後、エッチ(Etch)746(商標、シップ
レー社製)を15%及びH22を10%含む処理液を用
いて60秒間のソフトエッチング処理を施すと共に水洗
し、更に、硫酸を主成分とする固形酸(44g/l)を
用いて酸洗しかつ水洗した。
Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. Example 1 First, a glass-epoxy copper-clad laminate (340 mm ×
510 mm × 0.3 mm), and this copper foil is coated with Neutral Clean 68 (trademark, manufactured by Shipley).
First, a degreasing treatment is performed at 60 ° C. using a 5% solution, and
After washing with water, a soft etching treatment is performed for 60 seconds using a treatment solution containing 15% of Etch 746 (trademark, manufactured by Shipley) and 10% of H 2 O 2, and then washed with water. The solid acid (44 g / l) as a component was pickled and washed with water.

【0058】このように前処理された内層用回路板を以
下の黒化処理液内に浸漬しその配線層を黒化処理した。
The circuit board for the inner layer pretreated as described above was immersed in the following blackening solution to blacken the wiring layer.

【0059】 黒化処理液の組成:NaOH 21g/l NaClO2 43g/l Na3PO4・12H2O 17g/l 処理液温度:95℃ 処理時間:4.5分 こうして処理された配線層の表面はCuOの針状結晶と
みられる黒色を帯びていた。次に、この黒色の内層用回
路板を以下のクエン酸処理液内に浸漬しその配線層表面
を酸処理した。
Composition of blackening treatment liquid: NaOH 21 g / l NaClO 2 43 g / l Na 3 PO 4 .12H 2 O 17 g / l Treatment liquid temperature: 95 ° C. Processing time: 4.5 minutes The surface was blackish which was considered to be needle-like crystals of CuO. Next, the black inner layer circuit board was immersed in a citric acid treatment solution described below to acid-treat the surface of the wiring layer.

【0060】 クエン酸処理液の組成:クエン酸 41.187g/l Na2HPO4 0.5678g/l クエン酸処理液のpH:約2.0 処理液温度:65℃ 処理時間:2.5分 こうして酸処理された配線層表面は赤色(Cu又はCu
2Oの色)を示していたが、水洗し、加熱乾燥したとこ
ろ黒色に近い灰色に変化した。この配線層表面を走査型
電子顕微鏡で撮影した。
Composition of citric acid treatment liquid: citric acid 41.187 g / l Na 2 HPO 4 0.5678 g / l citric acid treatment liquid pH: about 2.0 treatment liquid temperature: 65 ° C. treatment time: 2.5 minutes The surface of the wiring layer thus treated with acid is red (Cu or Cu
2 O showed color), but was washed with water and turns gray close to black was dried by heating. The surface of this wiring layer was photographed with a scanning electron microscope.

【0061】この写真を図2〜図3に示す。尚、図2は
倍率2000倍、図3は20000倍の走査型電子顕微
鏡写真である。
This photograph is shown in FIGS. FIG. 2 is a scanning electron microscope photograph at a magnification of 2000 times, and FIG. 3 is a scanning electron microscope photograph at a magnification of 20000 times.

【0062】尚、以下に述べる比較例1の走査型電子顕
微鏡写真(図4〜図5参照)との比較から、黒化処理直
後の比較例1においては比較的大きい針状結晶が観察さ
れるのに対し黒化処理後酸処理を施した実施例1におい
てはこのような針状結晶が見当たらず、針状結晶より更
に微細な凹凸が生成されていることが確認できた。
From comparison with a scanning electron micrograph (see FIGS. 4 and 5) of Comparative Example 1 described below, relatively large needle-like crystals are observed in Comparative Example 1 immediately after the blackening treatment. On the other hand, in Example 1 in which the acid treatment was performed after the blackening treatment, such needle-like crystals were not found, and it was confirmed that finer irregularities were generated than the needle-like crystals.

【0063】次いで、上記酸処理された内層用回路板を
乾燥させた後、複数枚の内層用回路板を外層用銅箔と共
に接着性絶縁層を介し加熱加圧して重合し、これ等を積
層した。
Next, after drying the acid-treated inner layer circuit board, a plurality of inner layer circuit boards are polymerized together with the outer layer copper foil by heating and pressing through an adhesive insulating layer, and these are laminated. did.

【0064】そして、従来と同様にこの積層体をドリル
により孔開け加工して直径0.35mmのスルーホールを
形成した後、スルーホール内壁を塩酸酸性のパラジウム
・錫水溶液で処理すると共に化学銅めっきし、更に水
洗、酸洗等の常套処理を施し、かつ、従来同様のフォト
レジスト層を形成した後、下記条件で電解銅めっき処理
を施した。
Then, in the same manner as before, this laminate is drilled to form a through hole having a diameter of 0.35 mm. Then, the inner wall of the through hole is treated with a hydrochloric acid acidic palladium / tin aqueous solution and chemically copper plated. Then, a conventional treatment such as water washing and pickling was performed, and a photoresist layer similar to the conventional one was formed. Thereafter, electrolytic copper plating was performed under the following conditions.

【0065】 めっき液の組成:CuSO4・5H2O 60〜70g/l H2SO4 200〜210g/l めっき温度:常温 電流密度:およそ1.8A/dm2 めっき厚み:約15μm 次に、従来同様、はんだめっき処理、フォトレジスト層
剥離処理、エッチング処理、ソルダー・レジスト層形成
処理等を経て多層配線板を製造した。
Composition of plating solution: CuSO 4 .5H 2 O 60 to 70 g / l H 2 SO 4 200 to 210 g / l Plating temperature: normal temperature Current density: about 1.8 A / dm 2 Plating thickness: about 15 μm As in the prior art, a multilayer wiring board was manufactured through a solder plating process, a photoresist layer stripping process, an etching process, a solder / resist layer forming process, and the like.

【0066】この様にして求めた多層配線板について図
1に示すようにその配線層1に生じたピンクリングの幅
Lを測定したところその幅Lは0μmでありピンクリン
グは確認されなかった。
When the width L of the pink ring generated in the wiring layer 1 of the multilayer wiring board thus obtained was measured as shown in FIG. 1, the width L was 0 μm, and no pink ring was confirmed.

【0067】一方、上記内層用回路板についてその銅箔
をパターニングすることなく上記黒化処理液とクエン酸
処理液内に順次浸漬して銅箔を表面処理し、かつ、これ
を乾燥させた後、これ等複数枚の内層用回路板を接着性
絶縁層を介し加熱加圧して重合し、上記多層配線板とは
異なる積層体を製造した。そして、これ等の積層体につ
いてその表面処理された銅箔と接着性絶縁層間のピール
強度(接着強度)を測定したところ0.91kg/cm
の好結果を示しており、従って、この実施例1に係る多
層配線板においてはその配線層と接着性絶縁層との間の
接着強度が充分であることを確認している。
On the other hand, the copper foil of the inner layer circuit board is sequentially immersed in the above-mentioned blackening treatment solution and citric acid treatment solution without patterning the copper foil, and the copper foil is subjected to a surface treatment. A plurality of these circuit boards for an inner layer were polymerized by heating and pressing through an adhesive insulating layer to produce a laminate different from the multilayer wiring board. The peel strength (adhesive strength) between the surface-treated copper foil and the adhesive insulating layer of these laminates was measured to be 0.91 kg / cm.
Therefore, it has been confirmed that the multilayer wiring board according to Example 1 has a sufficient adhesive strength between the wiring layer and the adhesive insulating layer.

【0068】次に、溶融したはんだ浴槽に上記積層体を
浸漬すると共にこれを引上げた後、上記配線層と接着性
絶縁層との間の接着強度を測定したところ、0.91k
g/cmを示しはんだ処理に基づく接着強度の劣化がな
いことも確認できた。 [比較例]上記酸処理が施されていない点を除き実施例
1と同一の処理を行った。
Next, after immersing the laminate in a molten solder bath and pulling it up, the adhesive strength between the wiring layer and the adhesive insulating layer was measured.
g / cm, and it was also confirmed that there was no deterioration in adhesive strength due to soldering. Comparative Example The same treatment as in Example 1 was performed except that the above-mentioned acid treatment was not performed.

【0069】そして、黒化処理後の配線層表面を走査型
電子顕微鏡で撮影した。この顕微鏡写真を図4〜図5に
示す。図4は倍率2000倍、図5は20000倍の走
査型電子顕微鏡写真である。
Then, the surface of the wiring layer after the blackening treatment was photographed with a scanning electron microscope. The micrographs are shown in FIGS. FIG. 4 is a scanning electron micrograph at 2000 × magnification and FIG. 5 is a 2000 × magnification scanning electron micrograph.

【0070】次に、実施例1と同様に複数枚の内層用回
路板を外層用銅箔と共に接着性絶縁層を介して積層し、
孔開け加工して直径0.35mmのスルーホールを形成
し、塩酸酸性のパラジウム・錫水溶液で処理すると共に
化学銅めっきし、電解銅めっき処理を施し、更にはんだ
めっき処理、フォトレジスト層剥離処理、エッチング処
理、ソルダー・レジスト層形成処理等を経て多層配線板
を製造した。
Next, a plurality of inner-layer circuit boards were laminated together with an outer-layer copper foil via an adhesive insulating layer in the same manner as in Example 1.
Drilled to form a through hole with a diameter of 0.35 mm, treated with hydrochloric acid acidic palladium / tin aqueous solution, chemically copper plated, electrolytic copper plated, further solder plated, photoresist layer peeled, A multilayer wiring board was manufactured through an etching process, a solder / resist layer forming process, and the like.

【0071】この様にして求めた多層配線板について図
1に示すようにその配線層1に生じたピンクリングの幅
Lを測定したところその幅Lは220μmであった。
As shown in FIG. 1, the width L of the pink ring formed on the wiring layer 1 of the multilayer wiring board thus obtained was measured and found to be 220 μm.

【0072】一方、実施例1と同様に上記内層用回路板
についてその銅箔をパターニングすることなく上記黒化
処理液内に浸漬して銅箔を表面処理し、かつ、これを乾
燥させた後、これ等複数枚の内層用回路板を接着性絶縁
層を介し加熱加圧して重合し、上記多層配線板とは異な
る積層体を製造した。そして、これ等の積層体について
その表面処理された銅箔と接着性絶縁層間のピール強度
(接着強度)を測定したところ0.15kg/cmであ
った。
On the other hand, in the same manner as in Example 1, the copper foil of the inner layer circuit board was immersed in the above-mentioned blackening treatment solution without patterning the copper foil, and the copper foil was subjected to a surface treatment and dried. A plurality of these circuit boards for an inner layer were polymerized by heating and pressing through an adhesive insulating layer to produce a laminate different from the multilayer wiring board. The peel strength (adhesive strength) between the surface-treated copper foil and the adhesive insulating layer of these laminates was measured to be 0.15 kg / cm.

【0073】次に、溶融したはんだ浴槽に上記積層体を
浸漬すると共にこれを引上げた後、上記配線層と接着性
絶縁層との間の接着強度を測定したところ0.2kg/
cmであった。 [実施例2]実施例1と同一条件で黒化処理を行った。
Next, after immersing the laminate in a molten solder bath and pulling it up, the adhesive strength between the wiring layer and the adhesive insulating layer was measured.
cm. Example 2 A blackening process was performed under the same conditions as in Example 1.

【0074】次に、この黒色の内層用回路板を以下のリ
ン酸処理液内に浸漬しその配線層を酸処理した。
Next, the black inner layer circuit board was immersed in the following phosphating solution to acid-treat the wiring layer.

【0075】 リン酸処理液の組成:リン酸 (リン酸濃度8.50重
量%) リン酸三ナトリウム 110g/l リン酸処理液のpH:略1.62 処理液温度:40℃ 処理時間:2.0分 こうして酸処理された配線層の表面は赤色(Cu又はC
2Oの色)を示していたが、水洗し、加熱乾燥したと
ころ、黒色に近い灰色に変化した。この配線層表面を走
査型電子顕微鏡で撮影した。この写真を図6〜図7に示
す。尚、図6は倍率2000倍、図7は20000倍の
走査型電子顕微鏡写真である。そして、この図6〜図7
の写真から実施例1と類似した微細な凹凸を備えている
ことが確認できた。
Composition of phosphating solution: phosphoric acid (phosphoric acid concentration: 8.50% by weight) Trisodium phosphate 110 g / l pH of phosphating solution: approximately 1.62 Temperature of treating solution: 40 ° C. Treatment time: 2 The surface of the wiring layer thus treated with acid is red (Cu or C
u 2 O), but after being washed with water and dried by heating, the color changed to gray close to black. The surface of this wiring layer was photographed with a scanning electron microscope. This photograph is shown in FIGS. FIG. 6 is a scanning electron microscope photograph at a magnification of 2000 times, and FIG. 7 is a photograph at a magnification of 20000 times. 6 and FIG.
It was confirmed from the photograph that the fine unevenness similar to that of Example 1 was provided.

【0076】次に、実施例1と同様に複数枚の内層用回
路板を外層用銅箔と共に接着性絶縁層を介して積層し、
孔開け加工して直径0.35mmのスルーホールを形成
し、塩酸酸性のパラジウム・錫水溶液で処理すると共に
化学銅めっきし、電解銅めっき処理を施し、更にはんだ
めっき処理、フォトレジスト層剥離処理、エッチング処
理、ソルダー・レジスト層形成処理等を経て多層配線板
を製造した。
Next, in the same manner as in Example 1, a plurality of circuit boards for the inner layer were laminated together with the copper foil for the outer layer via an adhesive insulating layer.
Drilled to form a through hole with a diameter of 0.35 mm, treated with hydrochloric acid acidic palladium / tin aqueous solution, chemically copper plated, electrolytic copper plated, further solder plated, photoresist layer peeled, A multilayer wiring board was manufactured through an etching process, a solder / resist layer forming process, and the like.

【0077】この様にして求めた多層配線板について図
1に示すようにその配線層1に生じたピンクリングの幅
Lを測定したところ、実施例1と同様にその幅Lは0μ
mであった。
When the width L of the pink ring generated in the wiring layer 1 of the multilayer wiring board thus obtained was measured as shown in FIG. 1, the width L was 0 μm as in the first embodiment.
m.

【0078】一方、実施例1と同様に上記内層用回路板
についてその銅箔をパターニングすることなく上記黒化
処理液とリン酸処理液内に順次浸漬して銅箔を表面処理
し、かつ、これを乾燥させた後、これ等複数枚の内層用
回路板を接着性絶縁層を介し加熱加圧して重合し、上記
多層配線板とは異なる積層体を製造した。そして、これ
等の積層体についてその表面処理された銅箔と接着性絶
縁層間のピール強度(接着強度)を測定したところ0.
90kg/cmの好結果を示しており、この実施例2に
係る多層配線板においてはその配線層と接着性絶縁層と
の間の接着強度が充分であることを確認している。
On the other hand, in the same manner as in Example 1, the copper foil was surface-treated by sequentially immersing the copper foil in the blackening treatment solution and the phosphoric acid treatment solution without patterning the copper foil for the inner layer circuit board, and After drying, a plurality of these inner-layer circuit boards were polymerized by heating and pressing through an adhesive insulating layer to produce a laminate different from the multilayer wiring board. The peel strength (adhesive strength) between the surface-treated copper foil and the adhesive insulating layer of these laminates was measured.
A good result of 90 kg / cm is shown, confirming that the multilayer wiring board according to Example 2 has sufficient adhesive strength between the wiring layer and the adhesive insulating layer.

【0079】また、溶融したはんだ浴槽に上記積層体を
浸漬すると共にこれを引上げた後、上記配線層と接着性
絶縁層との間の接着強度を測定したところ、0.90k
g/cmを示しはんだ処理に基づく接着強度の劣化がな
いことも確認できた。 [実施例3]実施例1と同一条件で黒化処理を行った。
After immersing the laminate in a molten solder bath and pulling it up, the adhesive strength between the wiring layer and the adhesive insulating layer was measured.
g / cm, and it was also confirmed that there was no deterioration in adhesive strength due to soldering. Example 3 A blackening process was performed under the same conditions as in Example 1.

【0080】次に、この黒色の内層用回路板を以下のク
エン酸処理液内に浸漬しその配線層を酸処理した。
Next, this black inner layer circuit board was immersed in the following citric acid treatment solution to acid-treat the wiring layer.

【0081】 クエン酸処理液の組成:クエン酸 41.187g/l Na2HPO4 1.1358g/l クエン酸処理液のpH:約2.30 処理液温度:65℃ 処理時間:2.5分 こうして酸処理された配線層の表面は赤色(Cu又はC
2Oの色)を示していたが、水洗し、加熱乾燥したと
ころ、黒色に近い灰色に変化した。この配線層表面を走
査型電子顕微鏡で撮影したところ、図2〜図3の写真に
類似した微細な凹凸を備えていることが確認できた。
Composition of citric acid treatment liquid: citric acid 41.187 g / l Na 2 HPO 4 1.1358 g / l citric acid treatment liquid pH: about 2.30 treatment liquid temperature: 65 ° C. treatment time: 2.5 minutes The surface of the wiring layer thus treated with acid is red (Cu or C
u 2 O), but after being washed with water and dried by heating, the color changed to gray close to black. When the surface of the wiring layer was photographed with a scanning electron microscope, it was confirmed that the wiring layer had fine irregularities similar to the photographs of FIGS.

【0082】次に、実施例1と同様に複数枚の内層用回
路板を外層用銅箔と共に接着性絶縁層を介して積層し、
孔開け加工して直径0.35mmのスルーホールを形成
し、塩酸酸性のパラジウム・錫水溶液で処理すると共に
化学銅めっきし、電解銅めっき処理を施し、更にはんだ
めっき処理、フォトレジスト層剥離処理、エッチング処
理、ソルダー・レジスト層形成処理等を経て多層配線板
を製造した。
Next, a plurality of inner-layer circuit boards were laminated together with an outer-layer copper foil via an adhesive insulating layer in the same manner as in Example 1.
Drilled to form a through hole with a diameter of 0.35 mm, treated with hydrochloric acid acidic palladium / tin aqueous solution, chemically copper plated, electrolytic copper plated, further solder plated, photoresist layer peeled, A multilayer wiring board was manufactured through an etching process, a solder / resist layer forming process, and the like.

【0083】この様にして求めた多層配線板について図
1に示すようにその配線層1に生じたピンクリングの幅
Lを測定したところ、実施例1と同様にその幅Lは0μ
mであった。
The width L of the pink ring generated in the wiring layer 1 of the multilayer wiring board thus obtained was measured as shown in FIG.
m.

【0084】一方、実施例1と同様に上記内層用回路板
についてその銅箔をパターニングすることなく上記黒化
処理液とクエン酸処理液内に順次浸漬して銅箔を表面処
理し、かつ、これを乾燥させた後、これ等複数枚の内層
用回路板を接着性絶縁層を介し加熱加圧して重合し、上
記多層配線板とは異なる積層体を製造した。そして、こ
れ等の積層体についてその表面処理された銅箔と接着性
絶縁層間のピール強度(接着強度)を測定したところ
0.93kg/cmの好結果を示しており、この実施例
3に係る多層配線板においてはその配線層と接着性絶縁
層との間の接着強度が充分であることを確認している。
On the other hand, in the same manner as in Example 1, the copper foil was subjected to the surface treatment by sequentially immersing the copper foil in the blackening treatment solution and the citric acid treatment solution without patterning the copper foil for the inner layer circuit board, and After drying, a plurality of these inner-layer circuit boards were polymerized by heating and pressing through an adhesive insulating layer to produce a laminate different from the multilayer wiring board. When the peel strength (adhesive strength) between the surface-treated copper foil and the adhesive insulating layer of these laminates was measured, a good result of 0.93 kg / cm was shown. In a multilayer wiring board, it has been confirmed that the adhesive strength between the wiring layer and the adhesive insulating layer is sufficient.

【0085】また、溶融したはんだ浴槽に上記積層体を
浸漬すると共にこれを引上げた後、上記配線層と接着性
絶縁層との間の接着強度を測定したところ、0.87k
g/cmを示しはんだ処理に基づく接着強度の劣化がな
いことも確認できた。
After immersing the laminate in a molten solder bath and pulling it up, the adhesive strength between the wiring layer and the adhesive insulating layer was measured.
g / cm, and it was also confirmed that there was no deterioration in adhesive strength due to soldering.

【0086】[0086]

【発明の効果】請求項1〜2に係る発明によれば、銅箔
により構成された配線層表面に微細な凹凸が形成され上
記配線層に対する接着性絶縁層の接着強度の向上が図れ
る。従って、多層配線板の製造工程途上において塩酸酸
性のパラジウム・錫水溶液による処理や硫酸銅溶液が適
用された電解めっき処理等適宜酸処理を施しても、これ
等処理液が配線層と接着性絶縁層との間に浸透し難くな
るため上述したハローイング現象を極力抑制することが
可能となり、配線層と接着性絶縁層との接着不良が防止
できると共に上記配線層と接着性絶縁層との界面に酸処
理剤等が残留し難くなり多層配線板としての信頼性を著
しく向上できる効果を有している。
Effects of the Invention According to the invention according to claim 21 to, fine irregularities on the configured surface of the wiring layer of copper foil is formed can be improved adhesive strength of the adhesive insulating layer for the wiring layer. Therefore, even if an appropriate acid treatment such as treatment with hydrochloric acid acidic palladium / tin aqueous solution or electrolytic plating treatment using a copper sulfate solution is applied during the production process of the multilayer wiring board, the treatment liquid is not adhesively insulated from the wiring layer. It becomes difficult to penetrate between the wiring layer and the adhesive insulating layer, so that the above-mentioned haloing phenomenon can be suppressed as much as possible, and the poor adhesion between the wiring layer and the adhesive insulating layer can be prevented and the interface between the wiring layer and the adhesive insulating layer can be prevented The acid treatment agent and the like hardly remain, and the reliability as a multilayer wiring board can be remarkably improved.

【0087】また、リン酸とリン酸水素二ナトリウム又
はリン酸三ナトリウムを含有するpH0〜3の緩衝液は
従来技術において適用されていた硫酸処理液に較べpH
安定性が良好なためこの緩衝液が収容された同一浴を用
いて複数枚の回路板を連続的に処理することが可能とな
り、かつ、以下に述べるクエン酸に較べてリン酸の解離
度が高いため低温の処理液温度条件で酸処理が可能とな
る。従って、硫酸処理液を適用した従来技術に較べて酸
処理の簡便化が図れる効果を有している。
Further, phosphoric acid and disodium hydrogen phosphate or
The pH of the buffer solution containing 0 to 3 containing trisodium phosphate is higher than that of the sulfuric acid treatment solution applied in the prior art.
Because of its good stability, it is possible to continuously process a plurality of circuit boards using the same bath containing this buffer solution, and the dissociation degree of phosphoric acid is lower than that of citric acid described below. Since it is high, acid treatment can be performed at a low temperature of the processing solution. Therefore, there is an effect that the acid treatment can be simplified as compared with the prior art using the sulfuric acid treatment liquid.

【0088】[0088]

【0089】更に、請求項3に係る発明によれば、上記
緩衝液のリン酸濃度が3重量%〜12重量%に設定され
ているため処理液のpH安定性と処理コストの低減とを
共に図れる効果を有している。
[0089] Further, according to the invention according to claim 3, said
Since the phosphoric acid concentration of the buffer solution is set to 3% by weight to 12% by weight, it has an effect that both pH stability of the processing solution and reduction of the processing cost can be achieved.

【0090】他方、請求項に係る発明によれば、請求
項1に係る発明と同様に、ハローイング現象を極力抑制
することが可能となり、配線層と接着性絶縁層との接着
不良が防止できると共に配線層と接着性絶縁層との界面
に酸処理剤等が残留し難くなり多層配線板としての信頼
性を著しく向上できる効果を有している。
On the other hand, according to the invention of claim 4 , similarly to the invention of claim 1, it becomes possible to suppress the haloing phenomenon as much as possible, and to prevent poor adhesion between the wiring layer and the adhesive insulating layer. As a result, the acid treatment agent or the like hardly remains at the interface between the wiring layer and the adhesive insulating layer, so that the reliability as a multilayer wiring board can be significantly improved.

【0091】また、クエン酸処理液はリン酸とリン酸水
素二ナトリウム又はリン酸三ナトリウムを含有するpH
0〜3の緩衝液と同様に従来技術において適用されてい
た硫酸処理液に較べpH安定性が良好なためこのクエン
酸処理液が収容された同一浴を用いて複数枚の回路板を
連続的に処理することが可能となる。従って、従来技術
に較べて酸処理の簡便化が図れる効果を有している。
The citric acid treatment solution is composed of phosphoric acid and phosphoric acid aqueous solution.
PH containing disodium or trisodium phosphate
Similar to the buffer solutions 0 to 3, the pH stability is better than the sulfuric acid treatment solution used in the prior art, so that a plurality of circuit boards are continuously connected using the same bath containing the citrate treatment solution. Can be processed. Therefore, it has the effect of simplifying the acid treatment as compared with the prior art.

【0092】更に、請求項に係る発明によれば、上記
クエン酸処理液が溶液のpHを略一定に維持する緩衝液
により構成されており同一の処理液により大量の内層用
回路板を一度に処理してもpHの変動が少ないため、請
求項に係る方法に較べて上記酸処理における処理液管
理をより簡便にできる効果を有している。
Further, according to the fifth aspect of the present invention, the citric acid treatment solution is constituted by a buffer solution for maintaining the pH of the solution at a substantially constant value, and a large amount of the inner layer circuit board is formed by the same treatment solution once. Thus, since the fluctuation of pH is small even if the treatment is carried out, there is an effect that the treatment liquid management in the acid treatment can be more easily performed as compared with the method according to claim 4 .

【0093】また、請求項に係る発明によれば、クエ
ン酸処理液のクエン酸濃度が1.5重量%〜10重量%
に設定されているため、請求項に係る発明と同様に処
理液のpH安定性と処理コストの低減とを共に図れる効
果を有している。
According to the invention of claim 6 , the citric acid treatment solution has a citric acid concentration of 1.5% by weight to 10% by weight.
Therefore, similarly to the invention according to claim 3 , there is an effect that both the pH stability of the processing solution and the reduction of the processing cost can be achieved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】実施例に係る多層配線板の一部拡大斜視図。FIG. 1 is a partially enlarged perspective view of a multilayer wiring board according to an embodiment.

【図2】実施例1に係る黒化処理と酸処理後における配
線層の表面形状を示す2000倍の走査型電子顕微鏡写
真。
FIG. 2 is a 2000 × scanning electron microscope photograph showing the surface shape of a wiring layer after blackening treatment and acid treatment according to Example 1.

【図3】実施例1に係る黒化処理と酸処理後における配
線層の表面形状を示す20000倍の走査型電子顕微鏡
写真。
FIG. 3 is a scanning electron micrograph (magnification: 20,000) showing a surface shape of a wiring layer after blackening treatment and acid treatment according to Example 1.

【図4】比較例に係る黒化処理後における配線層の表面
形状を示す2000倍の走査型電子顕微鏡写真。
FIG. 4 is a 2000 × scanning electron microscope photograph showing the surface shape of a wiring layer after a blackening process according to a comparative example.

【図5】比較例に係る黒化処理後における配線層の表面
形状を示す20000倍の走査型電子顕微鏡写真。
FIG. 5 is a scanning electron micrograph (magnification: 20,000) showing a surface shape of a wiring layer after blackening processing according to a comparative example.

【図6】実施例2に係る黒化処理と酸処理後における配
線層の表面形状を示す2000倍の走査型電子顕微鏡写
真。
FIG. 6 is a scanning electron micrograph (× 2000) showing the surface shape of a wiring layer after blackening treatment and acid treatment according to Example 2.

【図7】実施例2に係る黒化処理と酸処理後における配
線層の表面形状を示す20000倍の走査型電子顕微鏡
写真。
FIG. 7 is a scanning electron micrograph (magnification: 20,000) showing the surface shape of a wiring layer after blackening treatment and acid treatment according to Example 2.

【図8】確認試験により求められたリン酸(85%)滴
下量(ml)とpHとの関係を示すグラフ図。
FIG. 8 is a graph showing the relationship between the dropping amount (ml) of phosphoric acid (85%) and pH determined by a confirmation test.

【図9】確認試験により求められた各処理液における1
N−NaOH滴下量(ml)とpHとの関係を示すグラ
フ図。
FIG. 9 shows the results of 1 in each processing solution obtained by the confirmation test
The graph which shows the relationship between the amount (ml) of N-NaOH dripping, and pH.

【図10】図9のグラフ図の一部拡大図。FIG. 10 is a partially enlarged view of the graph of FIG. 9;

【図11】確認試験により求められたリン酸処理液にお
けるリン酸濃度と微分値との関係を示すグラフ図。
FIG. 11 is a graph showing a relationship between a phosphoric acid concentration in a phosphating solution and a differential value obtained by a confirmation test.

【図12】確認試験により求められた各処理液における
CuO溶解量(g/l)とpHとの関係を示すグラフ
図。
FIG. 12 is a graph showing the relationship between the amount of CuO dissolved (g / l) and pH in each processing solution obtained by the confirmation test.

【図13】従来の多層配線板の製造工程途上の斜視図。FIG. 13 is a perspective view of a conventional multilayer wiring board during a manufacturing process.

【図14】従来の多層配線板の製造工程途上の斜視図。FIG. 14 is a perspective view of a conventional multilayer wiring board during a manufacturing process.

【図15】従来の多層配線板の製造工程途上の斜視図。FIG. 15 is a perspective view of a conventional multilayer wiring board during a manufacturing process.

【図16】従来の多層配線板の製造工程途上の斜視図。FIG. 16 is a perspective view of a conventional multilayer wiring board during a manufacturing process.

【図17】従来の多層配線板の製造工程途上の斜視図。FIG. 17 is a perspective view of a conventional multilayer wiring board during a manufacturing process.

【図18】従来の多層配線板の製造工程途上の斜視図。FIG. 18 is a perspective view of a conventional multilayer wiring board during a manufacturing process.

【図19】製造された従来の多層配線板の概略斜視図。FIG. 19 is a schematic perspective view of a manufactured conventional multilayer wiring board.

【図20】図20(A)〜(B)は従来の配線層表面を
黒化処理する工程説明図。
FIGS. 20A and 20B are explanatory views of a conventional process for blackening the surface of a wiring layer.

【図21】図21(A)〜(B)はスルーホール形成後
における従来の多層配線板の一部拡大断面図。
FIGS. 21A and 21B are partially enlarged cross-sectional views of a conventional multilayer wiring board after through holes are formed.

【図22】スルーホール形成後における従来の多層配線
板の一部拡大斜視図。
FIG. 22 is a partially enlarged perspective view of a conventional multilayer wiring board after through holes are formed.

【図23】図22のW−W面の部分断面図。FIG. 23 is a partial cross-sectional view taken along the line WW of FIG. 22;

【符号の説明】[Explanation of symbols]

1 配線層 1 Wiring layer

フロントページの続き (56)参考文献 特開 平2−306695(JP,A) 特開 平4−247691(JP,A) 特公 昭58−2476(JP,B2) (58)調査した分野(Int.Cl.7,DB名) H05K 3/10 - 3/46 Continuation of front page (56) References JP-A-2-306955 (JP, A) JP-A-4-247691 (JP, A) JP-B-58-2476 (JP, B2) (58) Fields investigated (Int) .Cl. 7 , DB name) H05K 3/10-3/46

Claims (6)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】銅箔により構成された配線層を有する内層
用回路板の上記配線層を表面処理し、この表面処理され
た複数枚の内層用回路板を接着性絶縁層を介し積層して
多層配線板を製造する方法において、 上記表面処理が、アルカリ性酸化処理液による黒化処理
とこれに続くリン酸とリン酸水素二ナトリウム又はリン
酸三ナトリウムを含有するpH0〜3の緩衝液が収容さ
れた処理浴内に浸漬する酸処理とで構成されていること
を特徴とする多層配線板の製造方法。
An inner circuit board having a wiring layer made of copper foil is subjected to a surface treatment, and a plurality of the surface treated inner circuit boards are laminated via an adhesive insulating layer. In the method for producing a multilayer wiring board, the surface treatment is performed by a blackening treatment with an alkaline oxidizing solution, followed by phosphoric acid and disodium hydrogen phosphate or phosphorus.
A method for producing a multilayer wiring board, comprising: immersing in a treatment bath containing a buffer solution having a pH of 0 to 3 containing trisodium acid .
【請求項2】上記緩衝液がリン酸とリン酸三ナトリウム
を含む水溶液により構成されていることを特徴とする請
求項記載の多層配線板の製造方法。
Wherein said buffer is a method for manufacturing a multilayer wiring board according to claim 1, characterized in that it is constituted by an aqueous solution containing trisodium phosphate and phosphoric acid.
【請求項3】上記緩衝液のリン酸濃度が3重量%〜12
重量%であることを特徴とする請求項1又は2記載の多
層配線板の製造方法。
3. The buffer solution according to claim 1, wherein the phosphate concentration is 3% by weight to 12%.
3. The method for producing a multilayer wiring board according to claim 1, wherein the content is% by weight. 4.
【請求項4】銅箔により構成された配線層を有する内層
用回路板の上記配線層を表面処理し、この表面処理され
た複数枚の内層用回路板を接着性絶縁層を介し積層して
多層配線板を製造する方法において、 上記表面処理が、アルカリ性酸化処理液による黒化処理
とこれに続くpH0〜3のクエン酸処理液が収容された
処理浴内に浸漬する酸処理とで構成されていることを特
徴とする多層配線板の製造方法。
4. A surface treatment of the wiring layer of an inner layer circuit board having a wiring layer made of a copper foil, and laminating a plurality of the surface treated inner layer circuit boards via an adhesive insulating layer. In the method for manufacturing a multilayer wiring board, the surface treatment includes a blackening treatment with an alkaline oxidation treatment solution and a subsequent acid treatment immersion in a treatment bath containing a citric acid treatment solution having a pH of 0 to 3. A method for producing a multilayer wiring board.
【請求項5】上記クエン酸処理液が緩衝液であることを
特徴とする請求項4記載の多層配線板の製造方法。
5. The method for producing a multilayer wiring board according to claim 4, wherein said citric acid treatment solution is a buffer solution.
【請求項6】上記クエン酸処理液のクエン酸濃度が1.
5重量%〜10重量%であることを特徴とする請求項4
又は5記載の多層配線板の製造方法。
6. The citric acid treatment solution having a citric acid concentration of 1.
5. The composition according to claim 4, wherein the content is 5% by weight to 10% by weight.
Or the method for producing a multilayer wiring board according to 5.
JP2220894A 1993-01-22 1994-01-21 Method for manufacturing multilayer wiring board Expired - Fee Related JP3185516B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2220894A JP3185516B2 (en) 1993-01-22 1994-01-21 Method for manufacturing multilayer wiring board

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP5-27578 1993-01-22
JP2757893 1993-01-22
JP2220894A JP3185516B2 (en) 1993-01-22 1994-01-21 Method for manufacturing multilayer wiring board

Publications (2)

Publication Number Publication Date
JPH06275952A JPH06275952A (en) 1994-09-30
JP3185516B2 true JP3185516B2 (en) 2001-07-11

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2220894A Expired - Fee Related JP3185516B2 (en) 1993-01-22 1994-01-21 Method for manufacturing multilayer wiring board

Country Status (1)

Country Link
JP (1) JP3185516B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008021942A (en) * 2006-07-14 2008-01-31 Rohm & Haas Electronic Materials Llc Method for manufacturing composite of copper and resin

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JPH06275952A (en) 1994-09-30

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