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JP2599454Y2 - Light source setting device - Google Patents

Light source setting device

Info

Publication number
JP2599454Y2
JP2599454Y2 JP1993055511U JP5551193U JP2599454Y2 JP 2599454 Y2 JP2599454 Y2 JP 2599454Y2 JP 1993055511 U JP1993055511 U JP 1993055511U JP 5551193 U JP5551193 U JP 5551193U JP 2599454 Y2 JP2599454 Y2 JP 2599454Y2
Authority
JP
Japan
Prior art keywords
jig
annular
illumination
virtual
virtual hemisphere
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1993055511U
Other languages
Japanese (ja)
Other versions
JPH0720551U (en
Inventor
武文 渡部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lossev Technology Corp
Original Assignee
Lossev Technology Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lossev Technology Corp filed Critical Lossev Technology Corp
Priority to JP1993055511U priority Critical patent/JP2599454Y2/en
Publication of JPH0720551U publication Critical patent/JPH0720551U/en
Application granted granted Critical
Publication of JP2599454Y2 publication Critical patent/JP2599454Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Description

【考案の詳細な説明】[Detailed description of the invention]

【0001】[0001]

【産業上の利用分野】本考案は、たとえば、半田付け部
の良否を外観検査する検査機に使用される照明源設定装
置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an illumination source setting device used for an inspection machine for inspecting the appearance of a soldered portion.

【0002】[0002]

【従来の技術】発光ダイオードは、光量の長期安定性、
高速切換性に優れた長所を有するため画像処理用の照明
源に多用されている。しかし、発光ダイオード1個は点
光源であるので、光量が少なく、照明源としては、多数
個の発光ダイオードを同時使用せざるを得ない。その
際、問題になるのは、発光ダイオードは完全無指向性光
源ではないので、発光ダイオードを多数個ドーム状に設
置するとき、それらの光軸を被検査面の1点に集束させ
る必要がある。そこで、従来の照明装置は、被検査面の
画像を見ながら発光ダイオードの取り付け方向を個々に
調整する構造となっていた。
2. Description of the Related Art Light-emitting diodes have long-term stability of light quantity,
Since it has an advantage of high-speed switching, it is often used as an illumination source for image processing. However, since one light emitting diode is a point light source, the amount of light is small, and a large number of light emitting diodes must be used simultaneously as an illumination source. At that time, the problem is that the light emitting diode is not a completely omni-directional light source. Therefore, when installing a large number of light emitting diodes in a dome shape, it is necessary to focus their optical axes at one point on the surface to be inspected. . Therefore, the conventional lighting device has a structure in which the mounting directions of the light emitting diodes are individually adjusted while viewing the image of the inspection surface.

【0003】[0003]

【考案が解決しようとする課題】しかし、前記照明装置
では、被検査面の画像を見ながら発光ダイオードの取り
付け方向を個々に調整しなければならず、このため、発
光ダイオード個々の調整に長時間を要し、それらの光軸
の集束度が悪いという問題があった。
However, in the above-mentioned lighting device, the mounting direction of the light emitting diodes must be individually adjusted while viewing the image of the surface to be inspected. And the degree of convergence of those optical axes is poor.

【0004】[0004]

【考案の目的】本考案の目的は、従来、問題となってい
た照明源個々の調整を不要にし、それらの光軸の集束度
を向上させることのできる照明源設定装置を提供するこ
とにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide an illumination source setting device which can eliminate the need for adjusting individual illumination sources, which has been a problem in the past, and improve the degree of convergence of their optical axes. .

【0005】[0005]

【課題を解決するための手段】本考案は、仮想半球の表
面に多数の照明源を仮想半球底の中心に向けて配置し、
すべての照明源の光軸を中心に集束させる照明装置にお
いて、高さに応じて半径の異なる多数の円環状治具を仮
想半球の球面に沿い、かつ仮想半球底の基準面に対して
平行な状態で設け、この円環状治具の内周面に、入射角
と等しい傾斜角の取り付け用の治具傾斜面を形成し、こ
の治具傾斜面に照明源を取り付ける構造としたものであ
る。
According to the present invention, a number of illumination sources are arranged on the surface of the virtual hemisphere toward the center of the bottom of the virtual hemisphere,
In an illumination device that focuses on the optical axes of all illumination sources, a number of annular jigs having different radii according to the height are arranged along the spherical surface of the virtual hemisphere and parallel to the reference plane at the bottom of the virtual hemisphere. A jig inclined surface for attachment having an inclination angle equal to the incident angle is formed on the inner peripheral surface of the annular jig, and an illumination source is attached to the jig inclined surface.

【0006】[0006]

【作用】多数の円環状治具の治具傾斜面に、例えば仮想
半球表面の仮想経線および仮想緯線の交点に一致させて
照明源を取り付けると、それらの光軸を基準面上の被検
査面の1点、つまり、仮想半球底の中心に集束させるこ
とができる。また、円環状治具は、事前の加工が可能で
あり、複数台の照明装置の製作においても、同一の精度
のものを短時間に成しとげることができる。したがっ
て、従来、問題となっていた照明源個々の調整を不要に
し、それらの光軸の集束度を向上させることができる。
When an illumination source is mounted on a jig inclined surface of a large number of annular jigs, for example, at the intersection of a virtual meridian and a virtual parallel on the surface of a virtual hemisphere, their optical axes are aligned with a surface to be inspected on a reference surface. At the center of the virtual hemisphere bottom. In addition, the annular jig can be processed in advance, and even when a plurality of lighting devices are manufactured, the same jig with the same accuracy can be achieved in a short time. Therefore, it is not necessary to adjust individual illumination sources, which has been a problem in the past, and the convergence of the optical axes can be improved.

【0007】[0007]

【実施例】図1および図2に示すように、本実施例に係
る照明源設定装置1は、検査機2に組み込まれる。この
検査機2は、配線基板の導電パッドにディスクリート部
品のリード線をはんだ付けしたときに形成されるはんだ
付け部の良否を画像処理により外観検査するものであ
る。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS As shown in FIGS. 1 and 2, an illumination source setting device 1 according to the present embodiment is incorporated in an inspection machine 2. This inspection machine 2 performs an appearance inspection by image processing on the quality of a soldered portion formed when a lead wire of a discrete component is soldered to a conductive pad of a wiring board.

【0008】前記照明源設定装置1は、仮想半球22の
表面で、例えば経緯線の交点に照明源としての発光ダイ
オード5を仮想半球底の中心Oに向けて多数配置し、す
べての発光ダイオード5の光軸8を中心Oに集束させた
構成とし、ある仮想経線上のすべての発光ダイオード5
をオンにする指定、ある仮想緯線上のすべての発光ダイ
オード5をオンにする指定、およびこれらの指定経緯線
の特定の交点群の発光ダイオード5をオンにする指定を
与えることによって、各種の光束で任意の方向からの照
明を可能にし、各種の照明条件の下で各種検査を行う。
The illumination source setting device 1 arranges a large number of light emitting diodes 5 as an illumination source on the surface of the virtual hemisphere 22, for example, at the intersection of the graticules, toward the center O of the virtual hemisphere bottom. The optical axis 8 is focused on the center O, and all the light emitting diodes 5 on a certain virtual meridian
, Turning on all the light-emitting diodes 5 on a certain virtual latitude line, and turning on the light-emitting diodes 5 at a specific intersection group of these designated latitude lines. Enables illumination from any direction and performs various inspections under various illumination conditions.

【0009】本考案の要旨は、前記照明源設定装置1に
おいて、発光ダイオード5の取り付け高さHに応じて半
径rの異なる多数の円環状治具4を仮想半球22の球面
に沿い、かつ仮想半球底の基準面7に対して平行な状態
で設け、この円環状治具4の内周面に、入射角iと等し
い傾斜角αの取り付け用の治具傾斜面3を形成し、この
治具傾斜面3に発光ダイオード5を所定の間隔で取り付
ける構造としたものである。
The gist of the present invention is that, in the illumination source setting device 1, a large number of annular jigs 4 having different radii r according to the mounting height H of the light emitting diodes 5 are arranged along the spherical surface of the virtual hemisphere 22 and virtual. A jig inclined surface 3 for attachment having an inclination angle α equal to the incident angle i is formed on the inner peripheral surface of the annular jig 4. The structure is such that the light emitting diodes 5 are attached to the component inclined surface 3 at predetermined intervals.

【0010】すなわち、前記仮想半球22は、中心Oを
通る平面で半径Rなる球を2分した半球(ドーム)を仮
想したものである。前記発光ダイオード5は、高さHが
大きくなるにしたがって小さくなる半径rの円周上に等
配され、これらの発光ダイオード5は、14段重ね、各
段最大16ブロック、総計約2000個使用され、光軸
8に対して直角な底面9を有している。
That is, the virtual hemisphere 22 is a virtual hemisphere (dome) obtained by bisecting a sphere having a radius R on a plane passing through the center O. The light-emitting diodes 5 are equally arranged on a circumference having a radius r which decreases as the height H increases. These light-emitting diodes 5 are stacked in 14 stages, each stage has a maximum of 16 blocks, and a total of about 2,000 pieces are used. , A bottom surface 9 perpendicular to the optical axis 8.

【0011】前記円環状治具4は、機械的強度の大きい
アセタール樹脂で成形され、配置位置に応じて1個また
は複数個の治具傾斜面3と、この治具傾斜面3に対して
傾斜角αをなす治具取付面21とを有しており、この治
具取付面21を介して基準面7に対して平行な複数の円
環状照明基板6の内周部の上下両面または片面に固定さ
れている。
The annular jig 4 is formed of acetal resin having high mechanical strength, and has one or more jig inclined surfaces 3 depending on the arrangement position, and is inclined with respect to the jig inclined surfaces 3. A jig mounting surface 21 forming an angle α, and on the upper and lower surfaces or on one surface of the inner peripheral portion of the plurality of annular illumination substrates 6 parallel to the reference surface 7 via the jig mounting surface 21. Fixed.

【0012】前記円環状治具4の治具傾斜面3には、底
面9を当接した状態で発光ダイオード5が固定され、そ
のリード線12は円環状治具4内の配線孔13を通って
円環状照明基板6の部品孔14の導電パターンにはんだ
付けにより接続されている。このように発光ダイオード
5を円環状治具4を介して取り付けた円環状照明基板6
の外周部は、例えば二つ割りの円筒体16のテーパ溝1
7に差し込まれ、これに楔18をボルト19で差し込む
ことにより、固定され、これにより円筒体16内に円環
状照明基板6が基準面7に対して平行に配置される構造
となっている。
The light emitting diode 5 is fixed to the jig inclined surface 3 of the annular jig 4 with the bottom surface 9 in contact with the jig. The lead wire 12 passes through the wiring hole 13 in the annular jig 4. It is connected to the conductive pattern of the component hole 14 of the annular illumination board 6 by soldering. The annular lighting board 6 on which the light emitting diodes 5 are mounted via the annular jig 4 as described above.
Is formed, for example, in a tapered groove 1 of a split cylindrical body 16.
7 and is fixed by inserting a wedge 18 with bolts 19 therein, whereby the annular illumination substrate 6 is arranged in the cylindrical body 16 in parallel with the reference plane 7.

【0013】図2に示すように、半径Rなる仮想半球2
2の表面に外接した治具傾斜面3に固定される発光ダイ
オード5に高さHが与えられると、発光ダイオード5の
半径rと、仮想半球22の中心Oに集束する発光ダイオ
ード5の光軸8が基準面7に対してなす角θと、入射角
iとが決定される。基準面7、つまり治具取付面21に
対する治具傾斜面3の傾斜角αは、鋭角をなし、α=9
0°−θの式より決定され、入射角iと等しい。
As shown in FIG. 2, a virtual hemisphere 2 having a radius R
When the height H is given to the light-emitting diode 5 fixed to the jig inclined surface 3 circumscribing the surface of the light-emitting diode 2, the radius r of the light-emitting diode 5 and the optical axis of the light-emitting diode 5 focused on the center O of the virtual hemisphere 22 8 and the incident angle i are determined. The inclination angle α of the jig inclined surface 3 with respect to the reference surface 7, that is, the jig mounting surface 21, forms an acute angle, and α = 9.
It is determined by the equation of 0 ° -θ and is equal to the incident angle i.

【0014】なお、最上段の円環状治具4の上面は、円
環状のカバー10で覆われている。また、円筒体16の
開口部20は、遮光用のカバー15で覆われている。そ
して検査機2(カメラ)は、カバー15の中心の窓11
から中心Oの位置に置かれた検査対象のはんだ部を撮像
する。
The upper surface of the uppermost annular jig 4 is covered with an annular cover 10. The opening 20 of the cylindrical body 16 is covered with a light-shielding cover 15. The inspection machine 2 (camera) is connected to the window 11 at the center of the cover 15.
The solder part to be inspected placed at the position of the center O is imaged.

【0015】次に、本実施例の作用を説明する。照明源
設定装置1の組付けに際し、まず、円環状照明基板6の
内周部の両面または片面に治具取付面21を当接した状
態で円環状治具4を取り付ける。その後、円環状治具4
の治具傾斜面3に発光ダイオード5をその底面9を当接
した状態で固定する。円環状治具4を介して発光ダイオ
ード5を固定した円環状照明基板6を基準面7に対して
平行に円筒体16内に楔18およびボルト19を介して
配置する。
Next, the operation of this embodiment will be described. When assembling the illumination source setting device 1, first, the annular jig 4 is attached in a state where the jig attachment surface 21 is in contact with both surfaces or one surface of the inner peripheral portion of the annular illumination substrate 6. Then, the annular jig 4
The light emitting diode 5 is fixed to the jig inclined surface 3 with the bottom surface 9 in contact therewith. An annular lighting board 6 to which the light emitting diode 5 is fixed via an annular jig 4 is arranged in a cylindrical body 16 via a wedge 18 and a bolt 19 in parallel with the reference plane 7.

【0016】このように、多数の円環状治具4の治具傾
斜面3に、仮想半球22表面の仮想経線および仮想緯線
の交点に一致させて発光ダイオード5を取り付けると、
それらの光軸8を基準面7上の1点、つまり、仮想半球
底の中心Oに集束させることができる。したがって、中
心Oの位置に検査対象のはんだ付け部を置けば、すべて
の発光ダイオード5からの照明光がはんだ付け部に集中
することになる。
As described above, when the light-emitting diodes 5 are attached to the jig inclined surfaces 3 of the large number of annular jigs 4 so as to coincide with the intersections of the virtual meridian and the virtual parallel on the surface of the virtual hemisphere 22,
These optical axes 8 can be focused at one point on the reference plane 7, that is, at the center O of the virtual hemisphere bottom. Therefore, if the soldering part to be inspected is placed at the position of the center O, the illumination light from all the light emitting diodes 5 is concentrated on the soldering part.

【0017】また、円環状治具4は、事前の加工が可能
であり、複数台の照明装置1の製作においても、同一の
精度のものを短時間に成しとげることができる。したが
って従来、問題となっていた発光ダイオード5個々の調
整を不要にし、それらの光軸8の集束度を向上させるこ
とができる。これらの発光ダイオード5群の点灯状態の
制御により、各種の照明条件が設定できる。
In addition, the annular jig 4 can be processed in advance, and even when manufacturing a plurality of lighting devices 1, it is possible to achieve the same accuracy in a short time. Therefore, it is not necessary to adjust each of the light emitting diodes 5 which has conventionally been a problem, and the convergence of the optical axis 8 can be improved. Various lighting conditions can be set by controlling the lighting state of the group of light emitting diodes 5.

【0018】[0018]

【他の実施例】前記実施例では、14段重ね、各段16
ブロック、総計約2000個使用した発光ダイオード5
の場合について説明したが、これに限らず、段数、各段
のブロック数、発光ダイオード5の総計数は必要に応じ
て変更することもできる。また前記実施例では、二つ割
りの円筒体内に円環状照明基板を配置した場合について
説明したが、これに限らず、ハウジング内にステイを設
け、このステイを介して円環状照明基板を配置すること
もできる。
[Other Embodiments] In the above embodiment, 14 stages are stacked, and 16
Light-emitting diodes 5 using a total of about 2,000 blocks
However, the number of stages, the number of blocks in each stage, and the total count of the light emitting diodes 5 can be changed as necessary. Further, in the above-described embodiment, the case where the annular illumination substrate is arranged in the split cylinder is described.However, the invention is not limited thereto, and a stay may be provided in the housing, and the annular illumination substrate may be arranged via the stay. it can.

【0019】[0019]

【考案の効果】以上の説明から明らかなように、本考案
によれば、以下の効果が得られる。すなわち、多数の円
環状治具の治具傾斜面に、仮想半球表面の仮想経線およ
び仮想緯線の交点に一致させて照明源を取り付けると、
それらの光軸を基準面上の被検査面の1点、つまり、仮
想半球底の中心に集束させることができる。また、円環
状治具は、事前の加工が可能であり、複数台の照明装置
の製作においても、同一の精度のものを短時間に成しと
げることができる。したがって、従来、問題となってい
た照明源個々の調整を不要にし、それらの光軸の集束度
を向上させることができる。
[Effects of the Invention] As is apparent from the above description, the present invention has the following effects. That is, when the illumination source is attached to jig inclined surfaces of a large number of annular jigs, at the intersection of the virtual meridian and the virtual parallel of the virtual hemisphere surface,
These optical axes can be focused at one point on the surface to be inspected on the reference plane, that is, at the center of the virtual hemisphere bottom. In addition, the annular jig can be processed in advance, and even when a plurality of lighting devices are manufactured, the same jig with the same accuracy can be achieved in a short time. Therefore, it is not necessary to adjust individual illumination sources, which has been a problem in the past, and the convergence of the optical axes can be improved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】実施例に係る照明装置を示す断面図である。FIG. 1 is a cross-sectional view illustrating a lighting device according to an embodiment.

【図2】照明装置の一部を拡大して示す断面図である。FIG. 2 is an enlarged cross-sectional view showing a part of the lighting device.

【符号の説明】[Explanation of symbols]

1 照明源設定装置 2 検査機 3 治具傾斜面 4 円環状治具 5 発光ダイオード(照明源) 6 円環状照明基板 7 基準面 8 光軸 9 底面 10 カバー 11 窓 12 リード線 13 配線孔 14 部品孔 15 カバー 16 円筒体 17 テーパ溝 18 楔 19 ボルト 20 開口部 21 治具取付面 22 仮想半球 O 中心 H 高さ R 半径 r 半径 α 傾斜角 θ 角 i 入射角 DESCRIPTION OF SYMBOLS 1 Illumination source setting apparatus 2 Inspection machine 3 Jig inclined surface 4 Annular jig 5 Light emitting diode (illumination source) 6 Annular illumination board 7 Reference plane 8 Optical axis 9 Bottom 10 Cover 11 Window 12 Lead wire 13 Wiring hole 14 Parts Hole 15 Cover 16 Cylindrical body 17 Tapered groove 18 Wedge 19 Bolt 20 Opening 21 Jig mounting surface 22 Virtual hemisphere O Center H Height R Radius r Radius α Incline angle θ angle i Incident angle

フロントページの続き (56)参考文献 特開 平5−231837(JP,A) 特開 平3−218407(JP,A) 特開 昭60−25405(JP,A) 特開 平4−212047(JP,A) 特開 平5−52534(JP,A) 特開 平5−226447(JP,A) 実開 平5−45511(JP,U) 実開 平6−78856(JP,U) (58)調査した分野(Int.Cl.6,DB名) G01N 21/84 - 21/91 Continuation of the front page (56) References JP-A-5-231837 (JP, A) JP-A-3-218407 (JP, A) JP-A-60-25405 (JP, A) JP-A-4-212047 (JP) JP-A-5-52534 (JP, A) JP-A-5-226447 (JP, A) JP-A-5-45511 (JP, U) JP-A-6-78856 (JP, U) (58) Surveyed field (Int.Cl. 6 , DB name) G01N 21/84-21/91

Claims (1)

(57)【実用新案登録請求の範囲】(57) [Scope of request for utility model registration] 【請求項1】 仮想半球(22)の表面に多数の照明源
(5)を仮想半球底の中心に向けて配置し、すべての照
明源(5)の光軸(8)を中心に集束させる照明装置
(1)において、高さ(H)に応じて半径(r)の異な
る多数の円環状治具(4)を仮想半球(22)の球面に
沿い、かつ仮想半球底の基準面(7)に対して平行な状
態で設け、この円環状治具(4)の内周面に、入射角
(i)と等しい傾斜角(α)の取り付け用の治具傾斜面
(3)を形成し、この治具傾斜面(3)に照明源(5)
を取り付けることを特徴とする照明源設定装置(1)。
1. A plurality of illumination sources (5) are arranged on the surface of a virtual hemisphere (22) toward the center of the bottom of the virtual hemisphere, and are focused around the optical axes (8) of all the illumination sources (5). In the illumination device (1), a large number of annular jigs (4) having different radii (r) according to the height (H) are arranged along the spherical surface of the virtual hemisphere (22) and at the reference surface (7) at the bottom of the virtual hemisphere. ), And a jig inclined surface (3) for attachment having an inclination angle (α) equal to the incident angle (i) is formed on the inner peripheral surface of the annular jig (4). The illumination source (5) is attached to the jig inclined surface (3).
An illumination source setting device (1), characterized in that:
JP1993055511U 1993-09-20 1993-09-20 Light source setting device Expired - Lifetime JP2599454Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1993055511U JP2599454Y2 (en) 1993-09-20 1993-09-20 Light source setting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1993055511U JP2599454Y2 (en) 1993-09-20 1993-09-20 Light source setting device

Publications (2)

Publication Number Publication Date
JPH0720551U JPH0720551U (en) 1995-04-11
JP2599454Y2 true JP2599454Y2 (en) 1999-09-06

Family

ID=13000718

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1993055511U Expired - Lifetime JP2599454Y2 (en) 1993-09-20 1993-09-20 Light source setting device

Country Status (1)

Country Link
JP (1) JP2599454Y2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2775411B2 (en) * 1995-07-25 1998-07-16 名古屋電機工業株式会社 Lighting equipment for printed wiring board inspection equipment
EP2194846A4 (en) * 2007-09-13 2013-05-22 Univ Missouri Optical device components
EP3222216B1 (en) 2008-05-22 2019-07-17 St. Louis Medical Devices, Inc. Method and system for non-invasive optical blood glucose detection utilizing spectral data analysis

Also Published As

Publication number Publication date
JPH0720551U (en) 1995-04-11

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